Connector butting device for power semiconductor test
By combining the linkage structure of the clamping section and the pushing section with the elastic torsion component, the problems of inaccurate insertion and uneven force of power semiconductor test fixtures are solved, achieving precise positioning and stable insertion of the board, and improving insertion efficiency and test accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-16
- Publication Date
- 2026-04-07
AI Technical Summary
Existing power semiconductor testing fixtures lack sufficient insertion accuracy during the insertion process, resulting in low insertion efficiency. Furthermore, uneven force application during insertion can easily damage the circuit board and interface.
The device employs a coaxial linkage structure of a clamping section and a pushing section. It utilizes the thrust force when the test plate is inserted as the driving source. Through the coaxial linkage of the clamping section and the pushing section, the test plate is limited and clamped. Elastic potential energy is stored through an elastic torsion member to assist in the positioning and uniform force distribution of the test plate during insertion.
It achieves precise positioning and uniform force insertion of the test board, reduces the labor intensity of operation, avoids bending or breaking of the pins, improves the stability of the insertion and the accuracy of the test data, and extends the service life of the test board.
Smart Images
Figure CN121805810A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of connector technology, and in particular to a connector mating device for power semiconductor testing. Background Technology
[0002] There are many types of power semiconductors, and their testing requirements are completely different. Some require high-voltage drive, so the circuit board needs high-voltage resistant relays and isolation circuits. Some require high current, so the circuit board needs thickened copper busbars and special current sensors. Some have different pin definitions, so the circuit board's internal circuitry needs to switch signal routing.
[0003] The existing technology relates to a stable power semiconductor device test fixture, including a fixture housing, a pneumatic telescopic mechanism, an adapter, an assist mechanism, a test board, a first carrier board, and a second carrier board; the adapter includes an adapter plate, a rubber plug fixedly mounted on the rear end of the adapter plate, and a probe fixedly mounted on the adapter plate; the adapter plate is slidably connected to the second carrier board, and the probe is electrically connected to the banana plug; the test board is placed on the first carrier board; the assist mechanism is connected to the adapter and is used to provide assistance for pulling the adapter outward, so that the banana plug on the adapter plate is disconnected from the external signal connector.
[0004] In the aforementioned and existing testing work, guide mechanisms with a certain margin are generally set in different test plug insertion sockets to ensure smooth insertion. However, this can also lead to inaccurate mating between the plug and socket of the test plug. In particular, when users insert the plug, uneven force can easily cause damage to the pins inside the plug or socket, resulting in low insertion efficiency and poor insertion effect. Summary of the Invention
[0005] This application provides a connector mating device for power semiconductor testing, which can solve the problems of insufficient mating accuracy of existing test fixtures, resulting in low mating efficiency, and uneven force during mating, which can easily damage the plug board and interface.
[0006] The technical solution of this application is as follows: A connector mating device for power semiconductor testing, comprising: The box body has multiple placement strips on both sides, and the multiple placement strips are spaced apart along the height direction of the box body. A pressing and pushing component is provided above each placement strip of the box body. The pressing and pushing assembly includes a strip-shaped pressing section and a pushing section. The pressing section and the pushing section are arranged sequentially at intervals along the pushing direction of the test plate. The pressing section and the pushing section are coaxially connected and fixed, and rotatably assembled on the inner wall of the box. The inner wall of the box is provided with an arc-shaped track on one side of the pushing section. The pushing section includes an elastic torsion member. The clamping section is configured to press against the edge of the test insert when the test insert is inserted, thereby causing the pushing section to deflect and the elastic torsion member to rotate and store elastic potential energy through the transmission member, so as to use the elastic potential energy to push the test insert.
[0007] By adopting the above scheme, the thrust of the test insert during insertion is used as the driving source. Through the coaxial linkage structure of the clamping section and the pushing section, the test insert is limited and clamped, which makes it easy to insert the test insert into the box and achieve precise positioning. Specifically, when the test insert is inserted along the placement strip, it naturally pushes up the clamping section located on the path. Due to the lever effect, the pushing section is driven to deflect and press down in the direction of the test insert. In this process, in conjunction with the arc-shaped track on the inner wall of the box, the swing of the pushing section is converted into the rotation of the elastic torsion component. This not only achieves flexible clamping of the upper surface of the test insert, preventing the insert from vibrating or displacing during the test, but also provides mechanical energy reserves for subsequent auxiliary insertion actions, solving the problem of uneven force on the test insert during insertion in the prior art.
[0008] In one embodiment of this application, the clamping section includes a clamping rod, one end of which is fixedly connected to a rotating column, the rotating column being rotatably mounted on the inner wall of the housing, and the other end of the clamping rod being rotatably connected to a clamping wheel.
[0009] By adopting the above solution, a clamping wheel is set at the end of the clamping rod that contacts the test plate, which converts the sliding friction between the clamping rod and the test plate into rolling friction. On the one hand, this reduces the resistance when inserting the test plate, making the operation smoother; on the other hand, it avoids the hard rod from directly scratching the solder resist layer or components on the surface of the test plate, thus protecting the test plate.
[0010] In one embodiment of this application, the pushing section further includes a pushing rod, one end of which is fixedly mounted on the rotating column and coaxial with the pressing rod. The other end of the pushing rod is provided with the transmission member, and the elastic torsion member is provided below the transmission member. The length of the pushing rod is greater than the length of the pressing rod, and the inside of the pushing rod is hollow so that the mass of the pushing rod is less than the mass of the pressing rod.
[0011] By adopting the above scheme, the mass difference between the clamping rod and the push rod is utilized so that in the initial state before the test plate is inserted, the clamping rod, due to its larger mass, naturally droops under the action of gravity, keeping the entire assembly in an inclined state. When the test plate is inserted and pushes up the clamping rod, the lighter push rod can deflect downwards, thus eliminating the need for an additional return spring or electronic sensor, simplifying the structure and improving the reliability of the device in long-term use.
[0012] In one embodiment of this application, the transmission component includes: a drive rod and a transmission gear. A rectangular notch is provided at the other end of the push rod. One end of the drive rod is rotatably mounted on the side wall of the rectangular notch. A rotating roller is coaxially fixedly connected to the outside of the drive rod. One side of the rotating roller abuts against the arc-shaped track. A drive gear is coaxially fixedly connected to the other end of the drive rod. Two transmission gears are provided. Both transmission gears are rotatably mounted on the side wall of the rectangular notch and mesh with each other. One transmission gear meshes with the drive gear, and the other transmission gear is connected to the elastic torsion member.
[0013] By adopting the above scheme, when the rotating roller rolls on the arc track, the rotational torque it generates is transmitted to the elastic torsion member through the cascade meshing of the drive rod, drive gear and two transmission gears. This gear set not only transmits power, but also adjusts the transmission ratio through the design of the gear ratio, so that the device can drive the coil spring to accumulate sufficient elastic potential energy within a short pressing stroke, thereby making the subsequent push action on the test plate more stable and powerful.
[0014] In one embodiment of this application, the elastic torsion member includes: A rotating rod is provided, with a driven roller coaxially sleeved on its exterior via a coil spring. One end of the rotating rod is fixedly mounted on the side wall of the rectangular notch. A driven gear is coaxially fixedly connected to one side of the driven roller, and another transmission gear meshes with the driven gear. The coil spring is coaxially sleeved outside the rotating rod and located between the rotating rod and the driven roller. One end of the coil spring is connected and fixed to the driven roller, and the other end is connected and fixed to the outer wall of the rotating rod.
[0015] By adopting the above scheme, in the initial stage of the test plate insertion, the driven roller rotates with the gear set and drives the coil spring to tighten, accumulating elastic potential energy; when the driven roller finally presses against the surface of the test plate, the coil spring releases its accumulated torque, driving the driven roller to rotate in the opposite direction, applying a continuous thrust to the test plate in the insertion direction, thereby helping the operator overcome the resistance encountered when the plug and socket are connected, so as to achieve uniform force insertion at both ends of the test plate, effectively avoiding pin skewing or poor contact caused by uneven force application.
[0016] In one embodiment of this application, a plurality of arc-shaped elastic sheets are provided on the outer side of the driven roller along its circumference, and the arc-shaped elastic sheets are arranged tangentially along the outer wall of the driven roller.
[0017] By adopting the above scheme and setting a tangentially oriented arc-shaped elastic sheet, the arc-shaped elastic sheet, which bends to one side during the insertion of the test plate, will not increase the friction between the test plate and the rotating roller. When the driven roller abuts against the edge of the test plate, the arc-shaped elastic sheet is affected by torque and bends itself, thereby further increasing the friction coefficient between the driven roller and the arc track, preventing slippage during transmission, and ensuring that the rolling of the driven roller can drive the test plate to move horizontally.
[0018] In one embodiment of this application, two base plates are also included. Rectangular openings are respectively provided at both ends of the housing. The two base plates are detachably assembled into the rectangular openings. Each of the two base plates is provided with multiple sockets for connecting test plugs.
[0019] By adopting the above solution, and by setting up two base plates with sockets on them, when testing semiconductors of different power, only the base plate with the corresponding sockets needs to be replaced, without replacing the entire docking device. This significantly reduces equipment costs and facilitates the installation and removal of the test sockets.
[0020] In one embodiment of this application, a strip-shaped groove is formed on the upper surface of the placement strip, and rotating wheels are rotatably connected to both ends of the placement strip at the two ends of the strip-shaped groove. A transmission belt is sleeved on the outside of the two rotating wheels. Multiple support wheels are rotatably assembled on the placement strip at intervals along the length direction of the strip-shaped groove inside the strip-shaped groove. The multiple support wheels are located between the two rotating wheels and are disposed inside the transmission belt.
[0021] By adopting the above scheme, a transmission belt is set on the placement strip, and the support wheel provides multi-point support for the belt to prevent the belt from collapsing. The transmission belt carries the test plate forward smoothly. The rotation of the transmission belt reduces the frictional resistance at the bottom of the plate, making the insertion and removal operation easier. It also avoids wear caused by friction between the bottom wiring of the plate and the placement strip.
[0022] In one embodiment of this application, the box body is fixedly connected to guide posts at the four corners of the rectangular opening, and the guide posts are provided with threaded holes along their own length. The guide posts are threaded with clamping bolts at the threaded holes. Both base plates have perforations at their four corners for the guide posts to pass through.
[0023] By adopting the above scheme, the guide post and threaded hole are used to guide and position the bottom plates at both ends of the box when they are plugged in. When installing the second bottom plate, the guide post is first inserted into the through hole for rough positioning, which restricts the degree of freedom of the bottom plate and ensures that the plug on the bottom plate can be accurately aligned with the plug of the test plug plate. Then, the clamping bolts are tightened to ensure the structural rigidity and connection reliability of the overall assembly.
[0024] In one embodiment of this application, handles are provided on both sides of the box and on the two bottom plates, and a fixing seat is provided at the bottom of the box.
[0025] By adopting the above solution, handles are installed on both sides and the bottom plate of the box, making the installation of the bottom plates at both ends quicker and more convenient by holding the handles.
[0026] In summary, this application includes at least one of the following beneficial technical effects: by setting the linkage between the clamping section and the pushing section, the mechanical displacement during the insertion of the test plate is converted into the elastic potential energy of the coil spring through the gear set, and the potential energy is released at the end of the insertion of the test plate, converting the rotational torque into a linear auxiliary thrust along the insertion direction. This reduces the labor intensity of operators when manually inserting and unplugging high-current, high-density connectors, and ensures that the force on both sides of the plate is uniform, effectively solving the problem of connector pin bending, breakage, or excessive contact impedance caused by force skew in traditional manual operation.
[0027] By designing an asymmetric structure where the mass of the clamping rod is greater than that of the pushing rod, the device utilizes the difference in gravity to achieve natural reset and automatic triggering of the component. This eliminates the need for additional power drive or complex sensor control. Combined with the guidance of the arc-shaped track and the movement of the elastic torsion component, the device can automatically apply a flexible clamping force to the surface of the test plate after it is in place. This reduces the micro-movement of the test plate caused by equipment vibration or electromagnetic force during high-voltage and high-current testing of power semiconductors, reduces the occurrence of arc discharge or instantaneous circuit breakage, and helps improve the accuracy of test data.
[0028] By utilizing the transmission belt assembly installed within the placement strip, the sliding friction during test board insertion is converted into rolling friction, effectively avoiding the wear of the solder mask layer and precision circuitry on the bottom of the test board caused by traditional metal slide rails, thus extending the service life of the expensive test board. At the same time, combined with the design of the detachable base plates and guide posts at both ends of the housing, the guide posts enable precise blind insertion and locking of the back cover when changing test boards of different specifications, solving the problem of difficulty in aligning multiple boards at the same time, and greatly improving the maintenance efficiency of changing test models on the production line. Attached Figure Description
[0029] Figure 1This is an exploded perspective view of a connector mating device for power semiconductor testing provided in the embodiments of this application; Figure 2 This is a front sectional view of a connector mating device placement strip for power semiconductor testing provided in an embodiment of this application; Figure 3 This is a three-dimensional schematic diagram of the test insert board assembled in the housing of a connector docking device for power semiconductor testing provided in this application embodiment; Figure 4 This is a plan view of a connector docking device housing for power semiconductor testing provided in an embodiment of this application; Figure 5 This is a three-dimensional schematic diagram of a power semiconductor testing connector mating device housing without the test insert plate assembled, provided in the embodiments of this application; Figure 6 This is a planar schematic diagram of the push section of a connector mating device for power semiconductor testing provided in this application embodiment when it is inserted into the test insert plate; Figure 7 This is a planar schematic diagram of the push section of a connector docking device for power semiconductor testing provided in this application embodiment when the test plate is not inserted; Figure 8 yes Figure 7 An enlarged schematic diagram of part A in the middle; Figure 9 This is a side view of the rotating column of a connector docking device for power semiconductor testing provided in an embodiment of this application; Figure 10 This is a front sectional view of an elastic torsion member of a connector mating device for power semiconductor testing provided in an embodiment of this application; Figure 11 This is a plan view of the base plate of a connector mating device for power semiconductor testing provided in an embodiment of this application; Figure 12 This is a three-dimensional schematic diagram of a guide post for a connector docking device for power semiconductor testing provided in an embodiment of this application.
[0030] Explanation of reference numerals in the attached drawings: 1. Box body; 11. Placement bar; 111. Strip groove; 112. Rotating wheel; 113. Drive belt; 114. Support wheel; 12. Rectangular opening; 13. Guide post; 131. Threaded hole; 132. Clamping bolt; 2. Clamping and pushing assembly; 21. Clamping section; 211. Clamping rod; 212. Rotating post; 213. Clamping wheel; 22. Pushing section; 221. Elastic torsion element; 2211. Rotating rod; 2212. Coil spring; 2213. Driven roller; 2214. Driven gear; 2215. Arc-shaped elastic sheet; 222. Transmission component; 2221. Driving rod; 2222. Rotating roller; 2223. Driving gear; 2224. Drive gear; 223. Pushing rod; 3. Arc-shaped track; 4. Base plate; 41. Perforation; 42. Handle. Detailed Implementation
[0031] The following is in conjunction with the appendix Figures 1-12 This application provides a more detailed description of a connector mating device for power semiconductor testing.
[0032] An embodiment of this application provides a connector mating device for power semiconductor testing, comprising: a housing 1.
[0033] Please see Figure 1 and Figure 2 Multiple placement strips 11 are provided on both sides of the housing 1. The multiple placement strips 11 are spaced apart along the height direction of the housing 1. A strip-shaped groove 111 is formed on the upper surface of the placement strip 11. Rotating wheels 112 are rotatably connected to both ends of the placement strip 111. A transmission belt 113 is sleeved on the outside of the two rotating wheels 112. Multiple support wheels 114 are rotatably mounted on the placement strip 11 along the length direction of the strip-shaped groove 111. The multiple support wheels 114 are located between the two rotating wheels 112 and are set inside the transmission belt 113. By setting the transmission belt 113 on the placement strip 11 and using the rotation of the transmission belt 113, the frictional resistance at the bottom of the insertion plate is reduced, making the insertion and removal operation easier.
[0034] Please see Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 5 Each housing 1 is provided with a pressing and pushing assembly 2 above each placement strip 11. The pressing and pushing assembly 2 includes a strip-shaped pressing section 21 and a pushing section 22. The pressing section 21 and the pushing section 22 are arranged alternately along the pushing direction of the test plate. The pressing section 21 and the pushing section 22 are coaxially connected and fixed, and are rotatably assembled on the inner wall of the housing 1.
[0035] Please see Figure 6 and Figure 7The clamping section 21 includes a clamping rod 211. One end of the clamping rod 211 is fixedly connected to a rotating column 212, which is rotatably mounted on the inner wall of the housing 1. The other end of the clamping rod 211 is rotatably connected to a clamping wheel 213. The clamping wheel 213 is provided at the end of the clamping rod 211 that contacts the test plate. By converting the sliding friction between the clamping rod 211 and the test plate into rolling friction, the resistance when the test plate is inserted is reduced. At the same time, the hard rod body is prevented from directly scratching the solder resist layer or components on the surface of the test plate, thus protecting the test plate.
[0036] Please continue reading. Figure 6 and Figure 7 The pushing section 22 also includes a pushing rod 223. One end of the pushing rod 223 is fixedly mounted on the rotating column 212 and coaxial with the clamping rod 211. The other end of the pushing rod 223 is provided with a transmission component 222, and an elastic torsion component 221 is provided below the transmission component 222. The length of the pushing rod 223 is greater than the length of the clamping rod 211. The pushing rod 223 is hollow inside so that the mass of the pushing rod 223 is less than the mass of the clamping rod 211. By utilizing the mass difference between the clamping rod 211 and the pushing rod 223, the device maintains an inclined state when the test plate is not inserted, thereby eliminating the need for an additional return spring or electronic sensor, simplifying the structure and improving the reliability of the device in long-term use.
[0037] Please continue reading. Figure 6 and Figure 7 The inner wall of the housing 1 has an arc-shaped track 3 on one side of the pushing section 22. The pushing section 22 includes an elastic torsion member 221. The pressing section 21 is configured to press against the edge of the test plate when the test plate is inserted, so as to drive the pushing section 22 to deflect. The transmission member 222 causes the elastic torsion member 221 to rotate and store elastic potential energy until the elastic torsion member 221 presses against the test plate, so as to use the elastic potential energy to push the test plate. In this process, in conjunction with the arc-shaped track 3 on the inner wall of the housing 1, the swing of the pushing section 22 is converted into the rotation and movement of the elastic torsion member 221. This not only realizes the flexible pressing of the upper surface of the test plate to prevent the plate from vibrating or displacing during the test, but also provides mechanical energy for subsequent auxiliary insertion actions, solving the problem of uneven force on the test plate during insertion in the prior art.
[0038] Please see Figure 8 , Figure 9 and Figure 10The transmission component 222 includes a drive rod 2221 and a transmission gear 2224. A rectangular notch is provided at the other end of the push rod 223. One end of the drive rod 2221 is rotatably mounted on the side wall of the rectangular notch. A rotating roller 2222 is coaxially fixedly connected to the outside of the drive rod 2221. One side of the rotating roller 2222 abuts against the arc-shaped track 3. The other end of the drive rod 2221 is coaxially fixedly connected to the drive gear 2223. Two transmission gears 2224 are provided, both rotatably mounted on the side wall of the rectangular notch and meshing with each other. One transmission gear 2224 meshes with the drive gear 2223, and the other transmission gear 2224 is connected to the elastic torsion member 221. When the rotating roller 2222 rolls on the arc-shaped track 3, the rotational torque it generates can be transmitted to the elastic torsion member 221, enabling the device to operate at a relatively high speed. Within a short pressing stroke, the drive spring 2212 accumulates sufficient elastic potential energy to subsequently propel the test plate. Multiple arc-shaped elastic plates 2215 are arranged circumferentially on the outer side of the driven roller 2213. These arc-shaped elastic plates 2215 are tangentially arranged along the outer wall of the driven roller 2213. By setting the tangentially arranged arc-shaped elastic plates 2215, the bending of the arc-shaped elastic plates 2215 to one side during the insertion of the test plate does not increase the friction between the test plate and the driven roller 2213. When the driven roller 2213 abuts against the edge of the test plate, the arc-shaped elastic plates 2215 are affected by torque and bend, thereby further increasing the coefficient of friction between the driven roller 2213 and the arc-shaped track 3, preventing slippage during transmission, and ensuring that the rolling of the driven roller 2213 can drive the test plate to move horizontally.
[0039] Please continue reading. Figure 8 , Figure 9 and Figure 10 The elastic torsion member 221 includes a rotating rod 2211. A driven roller 2213 is coaxially sleeved on the outside of the rotating rod 2211 via a coil spring 2212, allowing the driven roller 2213 to rotate relative to the rotating rod 2211. One end of the rotating rod 2211 is fixedly mounted on the side wall of a rectangular notch. A driven gear 2214 is coaxially fixedly connected to one side of the driven roller 2213. Another transmission gear 2224 meshes with the driven gear 2214. The coil spring 2212... The spring 2212 is coaxially sleeved outside the rotating rod 2211 and located between the rotating rod 2211 and the driven roller 2213. One end of the spring 2212 is connected and fixed to the driven roller 2213, and the other end is connected and fixed to the outer wall of the rotating rod 2211. The spring 2212 releases the torque stored in it, thereby driving the driven roller 2213 to rotate in the opposite direction, applying a continuous thrust along the insertion direction to the test plate, so as to achieve uniform force insertion at both ends of the test plate and improve the stability of the insertion.
[0040] Please see Figure 1 and Figure 11It also includes two base plates 4. Rectangular openings 12 are provided at both ends of the housing 1. The two base plates 4 are detachably assembled into the rectangular openings 12. Both base plates 4 are provided with multiple sockets for connecting test plugs. This allows the device to only replace the base plate 4 with different corresponding sockets when testing different power semiconductors, without replacing the entire docking device, which facilitates the installation and removal of test plugs.
[0041] Please see Figure 1 and Figure 12 The box body 1 has guide posts 13 fixedly connected at the four corners of the rectangular opening 12. The guide posts 13 have threaded holes 131 along their own length. The guide posts 13 are threaded with clamping bolts 132 at the threaded holes 131. The two base plates 4 have through holes 41 at the four corners for the guide posts 13 to pass through. The guide posts 13 and the threaded holes 131 cooperate to guide and position the base plates 4 at both ends of the box body 1 when they are inserted. After positioning, the base plates 4 are clamped by clamping bolts 132. The box body 1 has handles 42 on both sides and on the two base plates 4. When installing the base plates 4 at both ends, the handles 42 can be held to make the installation work faster and more convenient. The bottom of the box body 1 has a fixed seat.
[0042] In summary, when the test plate is inserted, its lower surface is in close contact with the placement strip 11 and moves along the length of the placement strip 11 towards the bottom plate 4 on one side of the housing 1. The test plate first contacts the pressure roller 213 located on the pressure rod 211. Because the weight of the pressure rod 211 is greater than that of the push rod 223, the rotating wheel 112 rises under the pressure of the test plate, causing the push rod 223 to deflect. The rotating roller 2222 located at one end of the push rod 223 descends and moves along the side wall of the arc track 3. When the rotating roller 2222 rotates, it can drive the drive gear 2223 to rotate. The drive gear 2223 drives the two transmission gears 22 The rotation of 24 eventually drives the driven gear 2214 to rotate, which in turn drives the driven roller 2213 connected to it to rotate, thereby driving the coil spring 2212 to coil up and accumulate elastic potential energy until the driven roller 2213 also contacts the test plate. At this time, the test plate is released, and the driven rollers 2213 located on both sides of the end of the test plate deflect in the opposite direction under the action of the tightened coil spring 2212, so that the plug on the test plate can be evenly inserted into the socket on the base plate 4 under the force on both sides. Finally, under the guidance of the guide post 13, the other base plate 4 is fastened to the box 1, thereby achieving a tight connection between the plug and the socket at both ends of the test plate. It should be noted that when the test plate is pulled out, the clamping section 21 loses its support and resets under the action of gravity difference. At the same time, the elastic torsion member 221 moves in the opposite direction along the arc track 3, and the coil spring 2212 resets and releases stress, so as not to hinder the pull-out of the test plate.
[0043] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.
Claims
1. A connector mating device for power semiconductor testing, characterized in that, include: Box (1), with multiple placement strips (11) on both sides of the box (1), the multiple placement strips (11) are spaced apart along the height direction of the box (1), and a pressing and pushing component (2) is provided above each placement strip (11) of the box (1); The pressing and pushing assembly (2) includes a strip-shaped pressing section (21) and a pushing section (22). The pressing section (21) and the pushing section (22) are arranged alternately along the pushing direction of the test plate. The pressing section (21) and the pushing section (22) are coaxially connected and fixed, and are rotatably assembled on the inner wall of the box (1). The inner wall of the box (1) is provided with an arc-shaped track (3) on one side of the pushing section (22). The pushing section (22) includes an elastic torsion member (221). The clamping section (21) is configured to press against the edge of the test insert when the test insert is inserted, thereby causing the pushing section (22) to deflect and causing the elastic torsion member (221) to rotate and store elastic potential energy through the transmission member (222), so as to use the elastic potential energy to push the test insert.
2. The connector mating device for power semiconductor testing according to claim 1, characterized in that, The clamping section (21) includes a clamping rod (211), one end of which is fixedly connected to a rotating column (212), which is rotatably mounted on the inner wall of the box (1), and the other end of the clamping rod (211) is rotatably connected to a clamping wheel (213).
3. The connector mating device for power semiconductor testing according to claim 2, characterized in that, The push segment (22) also includes: A push rod (223) is fixedly mounted on the rotating column (212) at one end and coaxial with the clamping rod (211). The other end of the push rod (223) is provided with the transmission component (222), and the elastic torsion component (221) is provided below the transmission component (222). The length of the push rod (223) is greater than the length of the clamping rod (211), and the push rod (223) is hollow inside, so that the mass of the push rod (223) is less than the mass of the clamping rod (211).
4. The connector mating device for power semiconductor testing according to claim 3, characterized in that, The transmission component (222) includes: The active rod (2221) has a rectangular notch at one end of the push rod (223). One end of the active rod (2221) is rotatably mounted on the side wall of the rectangular notch. A rotating roller (2222) is coaxially fixedly connected to the outside of the active rod (2221). One side of the rotating roller (2222) abuts against the arc-shaped track (3). The other end of the active rod (2221) is coaxially fixedly connected to the active gear (2223). Two transmission gears (2224) are provided, both of which are rotatably mounted on the side wall of the rectangular notch and mesh with each other. One of the transmission gears (2224) meshes with the drive gear (2223), and the other transmission gear (2224) is configured to transmit power to the elastic torsion member (221).
5. The connector mating device for power semiconductor testing according to claim 4, characterized in that, The elastic torsion member (221) includes: A rotating rod (2211) is provided, and a driven roller (2213) is coaxially sleeved on the outside of the rotating rod (2211) through a coil spring (2212). One end of the rotating rod (2211) is fixedly mounted on the side wall of the rectangular notch. A driven gear (2214) is coaxially fixedly connected to one side of the driven roller (2213), and another transmission gear (2224) meshes with the driven gear (2214). The coil spring (2212) is coaxially sleeved outside the rotating rod (2211) and located between the rotating rod (2211) and the driven roller (2213). One end of the coil spring (2212) is connected and fixed to the driven roller (2213), and the other end is connected and fixed to the outer wall of the rotating rod (2211).
6. The connector mating device for power semiconductor testing according to claim 4, characterized in that: The driven roller (2213) has a plurality of arc-shaped elastic sheets (2215) arranged around its circumference, and the arc-shaped elastic sheets (2215) are arranged tangentially along the outer wall of the driven roller (2213).
7. The connector mating device for power semiconductor testing according to claim 1, characterized in that: It also includes two base plates (4), and rectangular openings (12) are respectively provided at both ends of the box body (1). The two base plates (4) are detachably assembled into the rectangular openings (12), and multiple sockets for connecting test plates are provided on both base plates (4).
8. The connector mating device for power semiconductor testing according to claim 1, characterized in that: The upper surface of the placement strip (11) is provided with a strip-shaped groove (111). The two ends of the placement strip (11) are respectively rotatably connected to rotating wheels (112). The two rotating wheels (112) are fitted with a transmission belt (113). The placement strip (11) is equipped with a plurality of support wheels (114) rotatably along the length of the strip-shaped groove (111) inside the strip-shaped groove (111). The plurality of support wheels (114) are located between the two rotating wheels (112) and are arranged inside the transmission belt (113).
9. A connector mating device for power semiconductor testing according to claim 7, characterized in that: The box (1) has guide posts (13) fixedly connected at the four corners of the rectangular opening (12). The guide posts (13) have threaded holes (131) inside along their own length direction. The guide posts (13) are threaded with clamping bolts (132) at the threaded holes (131). Both base plates (4) have perforations (41) at their four corners through which the guide post (13) can pass.
10. A connector mating device for power semiconductor testing according to claim 9, characterized in that: Handles (42) are provided on both sides of the box (1) and on the two bottom plates (4), and a fixed seat is provided at the bottom of the box (1).