Waveform excitation signal generation method and device of automatic test system

Abstract

The invention belongs to the field of automatic testing of power transmission equipment, and particularly relates to a waveform excitation signal generation method and device of an automatic testing system. The method comprises the following steps: generating a new waveform excitation signal by at least one waveform excitation signal generation mode or a combination of at least two waveform excitation signal generation modes in waveform editing, waveform drawing, waveform combination and waveform reading; the waveform editing comprises the step of editing the existing waveform data; the waveform drawing comprises the step of generating a standard waveform by setting a specified waveform type and a corresponding waveform parameter value; the waveform combination comprises the step of generating a new waveform formed by combining more than two waveforms through a set combination rule; the waveform reading comprises the steps of processing the existing wave recording data, and appointing to read the wave recording data of a certain wave recording channel of a certain wave recording in a certain period of time. Various signals meeting requirements under different test working conditions can be obtained through independent waveform reading, waveform editing, waveform drawing and waveform combination or cooperation of two or more of waveform reading, waveform editing, waveform drawing and waveform combination.

Description

Technical Field

[0001] This invention belongs to the field of automated testing of power transmission equipment, and specifically relates to a method and apparatus for generating waveform excitation signals for an automated testing system. Background Technology

[0002] With the increasing complexity of power electronic systems such as high-voltage direct current transmission and new energy grid connection, traditional manual testing methods have many problems: converter valve equipment needs to be tested under thousands of operating conditions, and it is difficult to meet the massive testing needs by manually using signal generators; high-frequency switching devices (such as IGBTs) require nanosecond-level timing control, but manual operation in high-voltage environments is extremely risky; testing efficiency is low and testing accuracy is poor.

[0003] In the early stages of waveform excitation signal generation, signal generators were the primary means of production. However, the waveform parameters of the generated excitation signals were fixed and adjustments were extremely time-consuming. Later, the rise of FPGA-based programmable waveform synthesis technology ushered in an automated transformation of waveform excitation signal generation, supporting the generation of basic pulse sequences. However, this approach still offered limited coverage of the various waveform excitation signals required for testing and struggled to generate complex waveform excitations.

[0004] Chinese invention patent application CN118483465A discloses a method for drawing arbitrary waves using an oscilloscope. The method includes the following steps: Step S100: Providing the user with two graphical interface modes for arbitrary wave editing: edit mode and drawing mode; Step S200: The user sets parameter configuration items for edit mode and drawing mode through the graphical interface; Step S300: Obtaining the parameter configuration items set by the user on the graphical interface; Step S400: Generating algorithm parameter values ​​for waveform data based on the obtained parameter configuration items in edit mode; Step S500: Generating algorithm parameter values ​​based on the coordinate values ​​of the drawn waveform trajectory by the user in drawing mode; Step S600: Sending the algorithm parameter values ​​to the oscilloscope via an FPGA to display the waveform. This invention eliminates the need to repeatedly read data from external files to generate the waveform required by the user, enabling more efficient realization of arbitrary waveforms. Summary of the Invention

[0005] The purpose of this invention is to provide a method and apparatus for generating waveform excitation signals for an automatic testing system, which solves the problems of low coverage of various waveform excitation signals required for automated testing of power transmission equipment and difficulty in generating complex waveform excitations in the prior art.

[0006] To achieve the above objectives, the present invention provides a waveform excitation signal generation method for an automatic testing system, including at least one waveform excitation signal generation method among waveform editing, waveform drawing, waveform combination and waveform reading, or a combination of at least two waveform excitation signal generation methods, to generate a new waveform excitation signal. Waveform editing includes editing existing waveform data; Waveform drawing includes generating standard waveforms by setting a specified waveform type and corresponding waveform parameter values; Waveform combination includes generating a new waveform by combining two or more waveforms together according to the set combination rules; Waveform reading involves processing existing waveform data and specifying the waveform data for a specific time period from a specific waveform channel.

[0007] Furthermore, the methods for editing existing waveform data include waveform data editing and waveform parameter editing; Waveform data editing includes: Specify a data point of the waveform to be edited, and replace the original waveform data with the new value; Specify a time period of the waveform to be edited, and replace the original waveform data with a fixed list of values; Specify a time period of the waveform to be edited, and replace the original waveform data with random numbers generated within the original waveform data range; Specify a time period of the waveform to be edited, and replace the original waveform data with waveform data generated by specific rules; Waveform parameter editing includes: Specify a time period of the waveform to be edited to change the amplitude of the original waveform data; Specify a time period of the waveform to be edited to change the frequency of the original waveform data.

[0008] Furthermore, the methods for generating a standard waveform by setting a specified waveform type and corresponding waveform parameter values, based on a specified waveform type, include: By specifying a waveform type from among the preset waveform types, the specified waveform type is set; based on the specified waveform type, the values ​​of the corresponding waveform parameters are set, and then the corresponding standard waveform is generated based on the specified waveform type and the corresponding waveform parameters. Waveform types include at least one of sine wave, square wave, triangle wave, and clipped sine wave; When the waveform type is a sine wave or a triangular wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, and offset. When the waveform type is a square wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, and square wave duty cycle. When the waveform type is a clipped sine wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, as well as the maximum and minimum values ​​of the clipped sine wave parameters.

[0009] Furthermore, by setting combination rules, the methods for generating new waveforms by combining two or more waveforms include waveform splicing and waveform overlay; Waveform splicing methods include: combining two or more waveforms sequentially by setting the splicing order and the time interval between waveforms to obtain a new combined waveform; Waveform superposition methods include: adding or subtracting two or more waveforms with the same length to obtain a new combined waveform.

[0010] Furthermore, for waveform reading, the existing waveform data includes waveform recording data directly generated by the converter valve control device and stored waveform data; For waveform data directly generated by the converter valve control device, the waveform data file, waveform configuration file, read start time, read end time, and read channel list are used as parameters for reading, and the waveform data of each channel is stored separately; for the stored waveform data, the waveform data file, read start time, and read end time are used as parameters for reading, and the read data is stored.

[0011] The technical solution described above provides a novel method for generating waveform excitation signals for an automated testing system. Its advantages include: by using waveform reading, waveform editing, waveform drawing, and waveform combination individually or in combination, various waveform excitation signals can be obtained to meet the needs of various automated testing conditions. Therefore, it can efficiently, comprehensively, and accurately generate the waveform excitation signals required by the automated testing system for reproducible fault waveforms and simulating extreme conditions that are difficult to construct using traditional methods. Furthermore, by generating excitation waveforms in a standardized manner (e.g., reading existing waveform recording data, utilizing combination rules, specifying waveform types and corresponding waveform parameter values), it reduces manual configuration errors and manpower, and improves testing consistency.

[0012] The present invention also provides a waveform excitation signal generation device for an automatic testing system, including at least one waveform excitation signal generation module selected from a waveform editing module, a waveform drawing module, a waveform combination module, and a waveform reading module to generate a new waveform excitation signal, or a combination of at least two waveform excitation signal generation modules to generate a new waveform excitation signal; The waveform editing module is used to edit existing waveform data; The waveform drawing module is used to generate standard waveforms by setting a specified waveform type and corresponding waveform parameter values; The waveform combination module is used to generate a new waveform by combining two or more waveforms according to the set combination rules; The waveform reading module is used to process existing waveform data and specify the waveform data of a certain time period of a certain waveform channel.

[0013] Furthermore, the methods for editing existing waveform data include waveform data editing and waveform parameter editing; Waveform data editing includes: Specify a data point of the waveform to be edited, and replace the original waveform data with the new value; Specify a time period of the waveform to be edited, and replace the original waveform data with a fixed list of values; Specify a time period of the waveform to be edited, and replace the original waveform data with random numbers generated within the original waveform data range; Specify a time period of the waveform to be edited, and replace the original waveform data with waveform data generated by specific rules; Waveform parameter editing includes: Specify a time period of the waveform to be edited to change the amplitude of the original waveform data; Specify a time period of the waveform to be edited to change the frequency of the original waveform data.

[0014] Furthermore, the methods for generating a standard waveform by setting a specified waveform type and corresponding waveform parameter values, based on a specified waveform type, include: By specifying a waveform type from among the preset waveform types, the specified waveform type is set; based on the specified waveform type, the values ​​of the corresponding waveform parameters are set, and then the corresponding standard waveform is generated based on the specified waveform type and the corresponding waveform parameters. Waveform types include at least one of sine wave, square wave, triangle wave, and clipped sine wave; When the waveform type is a sine wave or a triangular wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, and offset. When the waveform type is a square wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, and square wave duty cycle. When the waveform type is a clipped sine wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, as well as the maximum and minimum values ​​of the clipped sine wave parameters.

[0015] Furthermore, by setting combination rules, the methods for generating new waveforms by combining two or more waveforms include waveform splicing and waveform overlay; Waveform splicing methods include: combining two or more waveforms sequentially by setting the splicing order and the time interval between waveforms to obtain a new combined waveform; Waveform superposition methods include: adding or subtracting two or more waveforms with the same length to obtain a new combined waveform.

[0016] Furthermore, in the waveform reading module, the existing waveform data includes waveform recording data directly generated by the converter valve control device and stored waveform data; For waveform data directly generated by the converter valve control device, the waveform data file, waveform configuration file, read start time, read end time, and read channel list are used as parameters for reading, and the waveform data of each channel is stored separately; for the stored waveform data, the waveform data file, read start time, and read end time are used as parameters for reading, and the read data is stored.

[0017] The technical solution of the waveform excitation signal generation device of the automatic test system described above can achieve the same beneficial effects as the waveform excitation signal generation method of the automatic test system described above. Attached Figure Description

[0018] Figure 1 This is a block diagram of the waveform excitation signal generation method for the automatic test system of the present invention. Figure 2 This is an example diagram illustrating waveform data editing achieved by changing data points in an implementation of the waveform excitation signal generation method of the automatic testing system of the present invention. Figure 3 This is an example diagram illustrating waveform data editing achieved through waveform data replacement in the implementation of the waveform excitation signal generation method of the automatic testing system of the present invention. Figure 4 This is an example diagram illustrating the effect of waveform parameter editing in the implementation of the waveform excitation signal generation method of the automatic testing system of the present invention; Figure 5 This is an example of the waveform drawing effect in the implementation of the waveform excitation signal generation method of the automatic testing system of the present invention; Figure 6 This is an example of the waveform splicing effect in the implementation of the waveform excitation signal generation method of the automatic testing system of the present invention; Figure 7 This is a block diagram of the waveform excitation signal generation device used in the automatic testing system of the present invention. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments.

[0020] Implementation of Waveform Excitation Signal Generation Method for Automatic Test System This embodiment provides a technical solution for generating waveform excitation signals in an automatic test system. By using editing, drawing, combining, and existing waveform reading functions, it can more comprehensively meet the waveform excitation signal requirements of various test conditions in an automatic test system.

[0021] Reference Figure 1 The method specifically includes at least one waveform excitation signal generation method among waveform editing, waveform drawing, waveform combination and waveform reading, or a combination of at least two waveform excitation signal generation methods, to generate a new waveform excitation signal; Waveform editing includes editing existing waveform data; Waveform drawing includes generating standard waveforms by setting a specified waveform type and corresponding waveform parameter values; Waveform combination includes generating a new waveform by combining two or more waveforms together according to the set combination rules; Waveform reading involves processing existing waveform data and specifying the waveform data for a specific time period from a specific waveform channel.

[0022] Therefore, by using waveform reading, waveform editing, waveform drawing, and waveform combination individually or in combination, a wide variety of waveform excitation signals can be obtained to meet the needs of various automated testing conditions. This enables the efficient, comprehensive, and accurate generation of waveform excitation signals required by automated testing systems, for reproducible fault waveforms, and for simulating extreme conditions that are difficult to construct using traditional methods. Furthermore, by generating excitation waveforms in a standardized manner (e.g., reading existing waveform recordings, utilizing combination rules, specifying waveform types and corresponding waveform parameter values), manual configuration errors and manpower are reduced, improving test consistency.

[0023] In this embodiment, the methods for editing existing waveform data include waveform data editing and waveform parameter editing; Waveform data editing includes: Specify a data point of the waveform to be edited, and replace the original waveform data with the new value; Specify a time period of the waveform to be edited, and replace the original waveform data with a fixed list of values; Specify a time period of the waveform to be edited, and replace the original waveform data with random numbers generated within the original waveform data range; Specify a time period of the waveform to be edited, and replace the original waveform data with waveform data generated by specific rules; Waveform parameter editing includes: Specify a time period of the waveform to be edited to change the amplitude of the original waveform data; Specify a time period of the waveform to be edited to change the frequency of the original waveform data.

[0024] In one specific embodiment, such as Figure 2 As shown, in this embodiment, when editing waveform data, first select the location of the data point to be changed, then change the value of the data point, and then redraw the waveform to check whether the edited waveform meets expectations. The editing and redrawing operations can be performed multiple times to achieve a suitable waveform. Finally, the edited waveform can be saved.

[0025] like Figure 3 The image shows another embodiment of waveform data editing. This embodiment replaces the waveform data between the quarter-cycle and the second-cycle of the original standard sine waveform with a standard triangular wave, resulting in a completely new waveform.

[0026] Waveform parameter editing primarily involves editing the parameters that affect the waveform, including: changing the amplitude of the original waveform data for a specified time period; and changing the frequency of the original waveform data for a specified time period. For example... Figure 4 The image shows an example of waveform parameter editing. This example changes the waveform frequency of a standard sine wave with a frequency of 50Hz between the quarter-cycle and the second-cycle to 250Hz, and fits the starting point of the edited waveform data.

[0027] In this embodiment, the method of generating a standard waveform by setting a specified waveform type and corresponding waveform parameter values ​​according to a specified waveform type includes: By specifying a waveform type from among the preset waveform types, the specified waveform type is set; based on the specified waveform type, the values ​​of the corresponding waveform parameters are set, and then the corresponding standard waveform is generated based on the specified waveform type and the corresponding waveform parameters. Waveform types include at least one of sine wave, square wave, triangle wave, and clipped sine wave; When the waveform type is a sine wave or a triangular wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, and offset. When the waveform type is a square wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, and square wave duty cycle. When the waveform type is a clipped sine wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, as well as the maximum and minimum values ​​of the clipped sine wave parameters.

[0028] In one specific embodiment, such as Figure 5The image shows an example of waveform plotting when the specified waveform type is a sine wave. This example sets the sampling frequency to 20000, the sampling duration to 300ms, the waveform amplitude to 2000, the waveform frequency to 50Hz, and the waveform phase and offset to 0, resulting in a standard sine wave with a duration of 300ms and containing 15 cycles.

[0029] Furthermore, in this embodiment, the methods for generating a new waveform by combining two or more waveforms through the set combination rules include waveform splicing and waveform superposition. Waveform splicing methods include: combining two or more waveforms sequentially by setting the splicing order and the time interval between waveforms to obtain a new combined waveform; Waveform superposition methods include: adding or subtracting two or more waveforms with the same length to obtain a new combined waveform.

[0030] In one specific embodiment, waveform combination includes some of the functionality of waveform drawing, and can also draw standard waveforms in a similar manner to waveform drawing. The drawn waveforms are then combined. The combination rules for waveform combination are divided into two parts: waveform splicing and waveform superposition. Waveform splicing involves setting the splicing order and time intervals between waveforms to sequentially combine multiple waveforms into a more complex combined waveform. Waveform superposition involves adding or subtracting multiple waveforms of the same length to obtain a completely new combined waveform. For example... Figure 6 The example shown is a waveform splicing implementation example. This example combines two sine waves with different frequencies and a triangular wave, and sets a time interval between the different waveforms to obtain a complex new waveform.

[0031] In addition, in this embodiment, for waveform reading, the existing waveform data includes waveform recording data directly generated by the converter valve control device and stored waveform data; For waveform data directly generated by the converter valve control device, the waveform data file, waveform configuration file, read start time, read end time, and read channel list are used as parameters for reading, and the waveform data of each channel is stored separately; for the stored waveform data, the waveform data file, read start time, and read end time are used as parameters for reading, and the read data is stored.

[0032] Specifically, in a preferred embodiment, the read start time and read end time are in milliseconds (ms). For example, the sampling frequency in the waveform data file is 20000, the sampling duration is 500ms, the read start time and end time are 300 and 400 respectively, and the read channel list is {50, 52}. First, the data name, position, and data type of the read channel are obtained through the waveform data file and the waveform configuration file. Assuming that the data name of channel 50 is voltage, the position is line 51, and the data type is integer, then the waveform obtained by reading data points 6000 to 8000 from line 51 of the waveform data file is the required voltage waveform. When reading waveform data, only the waveform data file, read start time, and read end time need to be used as parameters. At this time, the waveform data file contains only one channel of data, and the required waveform data can be obtained simply by using the sampling frequency and sampling duration, and the read start time and end time in the waveform data file.

[0033] The waveforms generated by waveform reading and waveform drawing can be used as the reference waveforms for waveform editing and waveform combination; similarly, the waveforms generated by waveform editing can also be used as the reference waveforms for waveform combination. In this embodiment, the waveform excitation signals generated by waveform reading, waveform editing, waveform drawing, and waveform combination can all be directly used to generate test cases for the automatic test system. Furthermore, the waveform signals generated by waveform reading from stored waveforms can be directly transmitted to the automatic test system. During the test, they are read through instructions to simulate waveform signal changes during the test process, and are especially useful for reproducing fault waveforms.

[0034] Implementation method of waveform excitation signal generation device for automatic test system This embodiment provides a technical solution for a waveform excitation signal generation device for an automatic testing system, referring to... Figure 7 It includes at least one waveform excitation signal generation module among waveform editing module, waveform drawing module, waveform combination module and waveform reading module, to generate a new waveform excitation signal, or a combination of at least two waveform excitation signal generation modules to generate a new waveform excitation signal; The waveform editing module is used to edit existing waveform data; The waveform drawing module is used to generate standard waveforms by setting a specified waveform type and corresponding waveform parameter values; The waveform combination module is used to generate a new waveform by combining two or more waveforms according to the set combination rules; The waveform reading module is used to process existing waveform data and specify the waveform data of a certain time period of a certain waveform channel.

[0035] Therefore, by using waveform reading, waveform editing, waveform drawing, and waveform combination individually or in combination, a wide variety of waveform excitation signals can be obtained to meet the needs of various automated testing conditions. This enables the efficient, comprehensive, and accurate generation of waveform excitation signals required by automated testing systems, for reproducible fault waveforms, and for simulating extreme conditions that are difficult to construct using traditional methods. Furthermore, by generating excitation waveforms in a standardized manner (e.g., reading existing waveform recordings, utilizing combination rules, specifying waveform types and corresponding waveform parameter values), manual configuration errors and manpower are reduced, improving test consistency.

[0036] In this embodiment, the methods for editing existing waveform data include waveform data editing and waveform parameter editing; Waveform data editing includes: Specify a data point of the waveform to be edited, and replace the original waveform data with the new value; Specify a time period of the waveform to be edited, and replace the original waveform data with a fixed list of values; Specify a time period of the waveform to be edited, and replace the original waveform data with random numbers generated within the original waveform data range; Specify a time period of the waveform to be edited, and replace the original waveform data with waveform data generated by specific rules; Waveform parameter editing includes: Specify a time period of the waveform to be edited to change the amplitude of the original waveform data; Specify a time period of the waveform to be edited to change the frequency of the original waveform data.

[0037] In one specific embodiment, when editing waveform data, first select the location of the data point to be changed, then change the value of the data point, and then redraw the waveform to check whether the edited waveform meets expectations. The editing and redrawing operations can be performed multiple times to achieve a suitable waveform. Finally, the edited waveform can be saved.

[0038] In another embodiment of waveform data editing, the waveform data between the quarter-cycle and the second-cycle of the original standard sine waveform is replaced with a standard triangular wave, resulting in a completely new waveform.

[0039] Waveform parameter editing mainly involves editing the parameters that affect the waveform, including: changing the amplitude of the original waveform data for a specified period of time; and changing the frequency of the original waveform data for a specified period of time. In one embodiment of waveform parameter editing, the waveform frequency of a standard sine wave with a frequency of 50Hz between the quarter-cycle and the second-cycle is changed to 250Hz, and the starting point of the edited waveform data is fitted.

[0040] In this embodiment, the method of generating a standard waveform by setting a specified waveform type and corresponding waveform parameter values ​​according to a specified waveform type includes: By specifying a waveform type from among the preset waveform types, the specified waveform type is set; based on the specified waveform type, the values ​​of the corresponding waveform parameters are set, and then the corresponding standard waveform is generated based on the specified waveform type and the corresponding waveform parameters. Waveform types include at least one of sine wave, square wave, triangle wave, and clipped sine wave; When the waveform type is a sine wave or a triangular wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, and offset. When the waveform type is a square wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, and square wave duty cycle. When the waveform type is a clipped sine wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, as well as the maximum and minimum values ​​of the clipped sine wave parameters.

[0041] In one specific embodiment, an example of waveform plotting is provided when the specified waveform type is a sine wave. This example sets the sampling frequency to 20000, the sampling duration to 300ms, the waveform amplitude to 2000, the waveform frequency to 50Hz, and the waveform phase and offset to 0, thus obtaining a standard sine wave with a duration of 300ms and containing 15 cycles.

[0042] Furthermore, in this embodiment, the methods for generating a new waveform by combining two or more waveforms through the set combination rules include waveform splicing and waveform superposition. Waveform splicing methods include: combining two or more waveforms sequentially by setting the splicing order and the time interval between waveforms to obtain a new combined waveform; Waveform superposition methods include: adding or subtracting two or more waveforms with the same length to obtain a new combined waveform.

[0043] In one specific embodiment, waveform combination includes some of the functions of waveform drawing, and can also draw standard waveforms in a similar manner to waveform drawing. The drawn waveforms are then combined. The combination rules for waveform combination are divided into two parts: waveform splicing and waveform superposition. Waveform splicing involves setting the splicing order and time intervals between waveforms to sequentially combine multiple waveforms into a more complex combined waveform. Waveform superposition involves adding or subtracting multiple waveforms of the same length to obtain a completely new combined waveform. For example, combining a sine wave and a triangle wave with different frequencies, and setting time intervals between the different waveforms, yields a complex new waveform.

[0044] In addition, in this embodiment, for waveform reading, the existing waveform data includes waveform recording data directly generated by the converter valve control device and stored waveform data; For waveform data directly generated by the converter valve control device, the waveform data file, waveform configuration file, read start time, read end time, and read channel list are used as parameters for reading, and the waveform data of each channel is stored separately; for the stored waveform data, the waveform data file, read start time, and read end time are used as parameters for reading, and the read data is stored.

[0045] Specifically, in a preferred embodiment, the read start time and read end time are in milliseconds (ms). For example, the sampling frequency in the waveform data file is 20000, the sampling duration is 500ms, the read start time and end time are 300 and 400 respectively, and the read channel list is {50, 52}. First, the data name, position, and data type of the read channel are obtained through the waveform data file and the waveform configuration file. Assuming that the data name of channel 50 is voltage, the position is line 51, and the data type is integer, then the waveform obtained by reading data points 6000 to 8000 from line 51 of the waveform data file is the required voltage waveform. When reading waveform data, only the waveform data file, read start time, and read end time need to be used as parameters. At this time, the waveform data file contains only one channel of data, and the required waveform data can be obtained simply by using the sampling frequency and sampling duration, and the read start time and end time in the waveform data file.

[0046] For waveform data directly generated by the converter valve control device, the waveform data file, waveform configuration file, read start time, read end time, and list of channels to be read need to be passed as parameters to the waveform reading module for reading. The waveform reading module will store the waveform data of each channel separately. For the stored waveform data, the waveform data file, read start time, and read end time need to be passed as parameters to the waveform reading module for reading, and the waveform reading module will store the read data.

[0047] The waveforms generated by the waveform reading unit and the waveform drawing unit can be used as reference waveforms for waveform editing and waveform combination; similarly, the waveforms generated by the waveform editing unit can also be used as reference waveforms for waveform combination. In this embodiment, the waveform excitation signals generated by the waveform reading unit, waveform editing unit, waveform drawing unit, and waveform combination unit can all be directly used to generate test cases for the automatic test system. Furthermore, the waveform signals generated by the waveform reading unit from the stored waveforms can be directly transmitted to the automatic test system. During the test, the signals are read through instructions to simulate waveform signal changes during the test, which is especially useful for reproducing fault waveforms.

[0048] It should be understood that the above-described specific embodiments of the present invention are merely illustrative or explanatory of the principles of the present invention, and do not constitute a limitation thereof.

Claims

1. A method for generating waveform excitation signals for an automatic testing system, characterized in that, The method of generating a new waveform excitation signal includes at least one waveform excitation signal generation method among waveform editing, waveform drawing, waveform combination and waveform reading, or a combination of at least two waveform excitation signal generation methods. Waveform editing includes editing existing waveform data; Waveform drawing includes generating standard waveforms by setting a specified waveform type and corresponding waveform parameter values; Waveform combination includes generating a new waveform by combining two or more waveforms together according to the set combination rules; Waveform reading involves processing existing waveform data and specifying the waveform data for a specific time period from a specific waveform channel.

2. The waveform excitation signal generation method of the automatic testing system according to claim 1, characterized in that, There are two ways to edit existing waveform data: waveform data editing and waveform parameter editing. Waveform data editing includes: Specify a data point of the waveform to be edited, and replace the original waveform data with the new value; Specify a time period of the waveform to be edited, and replace the original waveform data with a fixed list of values; Specify a time period of the waveform to be edited, and replace the original waveform data with random numbers generated within the original waveform data range; Specify a time period of the waveform to be edited, and replace the original waveform data with waveform data generated by specific rules; Waveform parameter editing includes: Specify a time period of the waveform to be edited to change the amplitude of the original waveform data; Specify a time period of the waveform to be edited to change the frequency of the original waveform data.

3. The waveform excitation signal generation method for the automatic testing system according to claim 1, characterized in that, The methods for generating a standard waveform based on a specified waveform type, by setting the specified waveform type and corresponding waveform parameter values, include: By specifying a waveform type from among the preset waveform types, the specified waveform type is set; based on the specified waveform type, the values ​​of the corresponding waveform parameters are set, and then the corresponding standard waveform is generated based on the specified waveform type and the corresponding waveform parameters. Waveform types include at least one of sine wave, square wave, triangle wave, and clipped sine wave; When the waveform type is a sine wave or a triangular wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, and offset. When the waveform type is a square wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, and square wave duty cycle. When the waveform type is a clipped sine wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, as well as the maximum and minimum values ​​of the clipped sine wave parameters.

4. The waveform excitation signal generation method of the automatic testing system according to claim 1, characterized in that, By setting combination rules, the methods for generating new waveforms by combining two or more waveforms together include waveform splicing and waveform overlay; Waveform splicing methods include: combining two or more waveforms sequentially by setting the splicing order and the time interval between waveforms to obtain a new combined waveform; Waveform superposition methods include: adding or subtracting two or more waveforms with the same length to obtain a new combined waveform.

5. The waveform excitation signal generation method of the automatic testing system according to any one of claims 1-4, characterized in that, For waveform reading, existing waveform data includes waveform recording data directly generated by the converter valve control device and stored waveform data; For waveform data directly generated by the converter valve control device, the waveform data file, waveform configuration file, read start time, read end time, and read channel list are used as parameters for reading, and the waveform data of each channel is stored separately; for the stored waveform data, the waveform data file, read start time, and read end time are used as parameters for reading, and the read data is stored.

6. A waveform excitation signal generation device for an automatic testing system, characterized in that, The system includes at least one waveform excitation signal generation module among waveform editing module, waveform drawing module, waveform combination module and waveform reading module, to generate a new waveform excitation signal, or a combination of at least two waveform excitation signal generation modules to generate a new waveform excitation signal; The waveform editing module is used to edit existing waveform data; The waveform drawing module is used to generate standard waveforms by setting a specified waveform type and corresponding waveform parameter values; The waveform combination module is used to generate a new waveform by combining two or more waveforms according to the set combination rules; The waveform reading module is used to process existing waveform data and specify the waveform data of a certain time period of a certain waveform channel.

7. The waveform excitation signal generating device for the automatic testing system according to claim 6, characterized in that, There are two ways to edit existing waveform data: waveform data editing and waveform parameter editing. Waveform data editing includes: Specify a data point of the waveform to be edited, and replace the original waveform data with the new value; Specify a time period of the waveform to be edited, and replace the original waveform data with a fixed list of values; Specify a time period of the waveform to be edited, and replace the original waveform data with random numbers generated within the original waveform data range; Specify a time period of the waveform to be edited, and replace the original waveform data with waveform data generated by specific rules; Waveform parameter editing includes: Specify a time period of the waveform to be edited to change the amplitude of the original waveform data; Specify a time period of the waveform to be edited to change the frequency of the original waveform data.

8. The waveform excitation signal generating device for the automatic testing system according to claim 6, characterized in that, The methods for generating a standard waveform based on a specified waveform type, by setting the specified waveform type and corresponding waveform parameter values, include: By specifying a waveform type from among the preset waveform types, the specified waveform type is set; based on the specified waveform type, the values ​​of the corresponding waveform parameters are set, and then the corresponding standard waveform is generated based on the specified waveform type and the corresponding waveform parameters. Waveform types include at least one of sine wave, square wave, triangle wave, and clipped sine wave; When the waveform type is a sine wave or a triangular wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, and offset. When the waveform type is a square wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, and square wave duty cycle. When the waveform type is a clipped sine wave, the corresponding waveform parameters include sampling frequency, sampling duration, waveform amplitude, waveform frequency, waveform phase, offset, as well as the maximum and minimum values ​​of the clipped sine wave parameters.

9. The waveform excitation signal generating device for the automatic testing system according to claim 6, characterized in that, By setting combination rules, the methods for generating new waveforms by combining two or more waveforms together include waveform splicing and waveform overlay; Waveform splicing methods include: combining two or more waveforms sequentially by setting the splicing order and the time interval between waveforms to obtain a new combined waveform; Waveform superposition methods include: adding or subtracting two or more waveforms with the same length to obtain a new combined waveform.

10. The waveform excitation signal generating device for the automatic testing system according to any one of claims 6-9, characterized in that, In the waveform reading module, the existing waveform data includes waveform recording data directly generated by the converter valve control device and stored waveform data; For waveform data directly generated by the converter valve control device, the waveform data file, waveform configuration file, read start time, read end time, and read channel list are used as parameters for reading, and the waveform data of each channel is stored separately; for the stored waveform data, the waveform data file, read start time, and read end time are used as parameters for reading, and the read data is stored.

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