Circuit board integration test system and method

Abstract

The invention provides a circuit board integration test system and method. The test system comprises a circuit board function test fixture, a light source temperature control device, a programmable direct current power supply and a universal meter. Wherein the circuit board function test fixture is provided with a data interface used for being externally connected with a light source temperature control device, positive and negative binding posts used for being externally connected with a programmable direct-current power supply, and a pair of constant-current voltage test probes used for being externally connected with a universal meter; when the light source driving control board is installed on the circuit board function test fixture, the corresponding external terminals of the light source driving control board are connected with the data interface, the positive and negative binding posts and the internal connection ends of the constant current voltage test probes through the corresponding connection probes of the probe array. The test method is realized based on the test system and comprises the steps of system integrated connection, circuit board clamping, static parameter test, dynamic function test, data synchronous acquisition and recording and function comprehensive evaluation. According to the technical scheme of the invention, the function test of the light source driving control panel can be quickly, mistakenly-proofing, lossless and multi-parameter synchronous measurement.

Description

Technical Field

[0001] This invention belongs to the field of circuit board functional testing, and more specifically, relates to a circuit board integrated testing system and method. Background Technology

[0002] A fiber optic gyroscope is an angular rate sensor widely used in inertial navigation and is currently the primary sensor for determining the spatial attitude of a moving object. The light source driver control board is a crucial component of the fiber optic gyroscope, used for temperature control and constant current driving of the fiber optic gyroscope light source to ensure stable light output under high and low temperature environments. Therefore, the operational stability of the temperature control chip and constant current circuit on the light source driver control board directly affects the output performance of the entire optical path of the fiber optic gyroscope, thus impacting the overall performance and quality of the fiber optic gyroscope.

[0003] To ensure the overall performance and quality of the fiber optic gyroscope, it is essential to perform functional testing on the light source driver control board before installation. Existing methods for testing the light source driver control board's functionalities typically involve connecting the board to a DC power supply and a light source temperature control device via wires. One end of the wire is soldered to the corresponding pad on the control board, and the other end is connected to the DC power supply via an alligator clip, or to the temperature control device via an alligator clip. When testing the constant current drive function, a multimeter is used at the appropriate voltage setting, with the red and black probes touching the corresponding pads on the control board.

[0004] However, the above-mentioned method for testing the functionality of the light source driver control board has the following main problems:

[0005] 1. When connecting the light source driver control board to the DC power supply and the light source temperature control device, it is necessary to configure different colored wires for each pad on the light source driver control board and solder the wires to the pads. This operation is troublesome and time-consuming. When connecting the wires to the corresponding alligator clips, the wire color needs to correspond to the wire color of the alligator clip, which is complicated and prone to errors.

[0006] Second, when testing the constant current drive function of the light source driver control board, the multimeter probes are in direct contact with the solder pads, which can easily damage the light source driver control board. In addition, soldering and desoldering operations on the solder pads can also easily damage the light source driver control board.

[0007] Third, it is impossible to perform synchronous dynamic testing. Manual operation makes it difficult to read multiple parameters such as current, resistance, and voltage simultaneously when the temperature changes, resulting in incomplete and inaccurate test data.

[0008] Therefore, there is an urgent need in this field for an automated testing solution that can achieve rapid, error-proof, non-destructive, and multi-parameter synchronous measurement. Summary of the Invention

[0009] In view of this, the present invention provides a circuit board integrated testing system and method.

[0010] According to a first aspect of the present invention, a circuit board integrated testing system is provided, the testing system comprising a circuit board functional testing fixture, a light source temperature control device, a programmable DC power supply, and a multimeter;

[0011] The circuit board functional test fixture includes:

[0012] The base housing has a data interface, a positive terminal and a negative terminal on its side wall, and a pair of constant current voltage test probes on its top plate.

[0013] The circuit board carrier includes a probe holder, a carrier base, and a first guide post system.

[0014] The probe holder is disposed on the top plate of the base housing. The probe holder is equipped with a probe array whose upper end extends beyond the top surface of the probe holder and whose lower end penetrates through the top plate of the base housing. The data interface, the positive terminal, the negative terminal, and the pair of constant current voltage test probes are respectively connected to the lower ends of the corresponding connecting probes of the probe array through wiring arranged inside the base housing.

[0015] The carrier is able to be suspended above the probe holder based on the first guide post system and can move up and down relative to it. The carrier has a circuit board placement area, in which through holes are provided that match the positions of each connecting probe of the probe array.

[0016] The pressing mechanism is configured to apply pressure to the light source drive control board located in the circuit board placement area to fix it, and drive the carrier to move downward so that each external terminal of the light source drive control board contacts the upper end of the corresponding connection probe of the probe array.

[0017] The light source temperature control device is connected to the data interface, the programmable DC power supply is connected to the positive terminal and the negative terminal, and the multimeter is connected to the pair of constant current voltage test probes.

[0018] Optionally, the data interface is a DB9 interface, and the data interface is located on the first side wall of the base housing;

[0019] The data interface is electrically connected to the SLD+, SLD-, RT+, RT-, TEC+, and TEC- terminals of the light source driver control board via corresponding connection probes of the probe array.

[0020] Optionally, the positive terminal and the negative terminal are disposed close to each other on the second side wall of the base housing, and the second side wall is disposed opposite to the first side wall;

[0021] The positive terminal and the negative terminal are electrically connected to the power supply terminal and the ground terminal of the light source drive control board through the corresponding connection probes of the probe array.

[0022] Optionally, the pair of constant current voltage test probes are electrically connected to the two constant current voltage output terminals of the light source drive control board through corresponding connection probes of the probe array.

[0023] Optionally, two positioning posts are also provided on the carrier.

[0024] The two positioning posts are asymmetrically designed and configured so that the light source drive control board can only be placed in the circuit board placement area with the top layer facing down.

[0025] Optionally, the pressing mechanism includes:

[0026] The backplate structure is vertically mounted on the top plate of the base box.

[0027] Rotate the pressure lever handle, which is located on the back plate structure;

[0028] The second guide post system is installed on the back plate structure;

[0029] The pressure plate is fixedly installed at the front end of the rotating pressure rod handle, and under the restriction of the second guide column system, it can only move up and down relative to the carrier in an attitude parallel to it.

[0030] Four clamping posts are located at the four vertices of the lower surface of the pressure plate, and are used to press the light source drive control board into the circuit board placement area based on the corresponding four through holes on the light source drive control board.

[0031] According to a second aspect of the present invention, a circuit board integration testing method is provided, which is implemented based on any of the circuit board integration testing systems described above;

[0032] The circuit board integration testing method includes:

[0033] System integration connection steps: Connect the light source temperature control device to the data interface of the circuit board function test fixture, connect the programmable DC power supply to the positive and negative terminals of the circuit board function test fixture, and connect the multimeter probes to a pair of constant current voltage test probes of the circuit board function test fixture.

[0034] Circuit board mounting steps: Place the light source driver control board to be tested into the circuit board placement area. Apply pressure to the light source driver control board located in the circuit board placement area based on the pressing mechanism to fix it, and drive the carrier to move downward so that each external terminal of the light source driver control board contacts the upper end of the corresponding connection probe of the probe array.

[0035] Static parameter testing steps: Turn on the programmable DC power supply, adjust its output voltage to the predetermined level, and read and record the static operating current value of the circuit board displayed on the programmable DC power supply.

[0036] Dynamic function test steps: While maintaining power supply to the light source drive control board, turn on the light source temperature control device and use its temperature control function to keep the working environment temperature of the fiber optic gyroscope light source at room temperature, a preset low temperature threshold, and a preset high temperature threshold, respectively.

[0037] Data synchronization acquisition and recording steps: Obtain the target parameters of the light source drive control board under three temperature conditions. The target parameters include the resistance value of the thermistor, the operating current value, and the constant current voltage value. The thermistor resistance value is obtained based on the light source temperature control device, the operating current value is obtained based on the programmable DC power supply, and the constant current voltage value is obtained based on the multimeter.

[0038] Functional comprehensive evaluation steps: If the thermistor resistance, working current and constant current values ​​under the three temperature conditions are within their respective preset qualified ranges, then the light source driver control board is determined to have passed the functional test;

[0039] The constant current value is determined based on the corresponding constant current voltage value.

[0040] Optionally, the acceptable range is defined as follows: the average resistance of the thermistor is within the range of 6.8KΩ±0.5KΩ, the operating current does not exceed 0.500A, and the constant current resistance value is stable at the expected value.

[0041] The beneficial effects of this invention are as follows:

[0042] When performing functional testing on the light source drive control board of a fiber optic gyroscope using the integrated circuit board testing system of this invention, the light source drive control board under test is placed in the circuit board placement area of ​​the carrier. Pressure is applied to the light source drive control board using a pressing mechanism to fix it in place, and the carrier is driven downwards to bring the external terminals of the light source drive control board into contact with the upper ends of the corresponding connection probes of the probe array. This ensures a reliable electrical connection between the corresponding external terminals of the light source drive control board and the data interface, positive terminal, negative terminal, and a pair of constant current voltage test probes on the base housing. The data interface connects to a light source temperature control device, the positive and negative terminals connect to a programmable DC power supply, and the pair of constant current voltage test probes contact the probes of a multimeter.

[0043] The integrated circuit board testing system of this invention enables convenient, fast, and accurate connection between the light source driver control board and the programmable DC power supply and light source temperature control device. It also avoids direct contact between the multimeter probes and the corresponding pads on the light source driver control board, thus eliminating the possibility of damage. Simultaneously, this integrated circuit board testing system allows for the simultaneous acquisition of multiple parameters (operating current, thermistor resistance, and constant current value) under dynamic temperature variations. It can capture the performance of the light source driver control board under extreme temperatures, providing more comprehensive and accurate data, which is beneficial for screening products with potentially unstable thermal performance—something existing testing methods cannot achieve.

[0044] Other features and advantages of the present invention will be described in detail in the following detailed description section. Attached Figure Description

[0045] The present invention can be better understood by referring to the following description taken in conjunction with the accompanying drawings, in which the same or similar reference numerals are used throughout the drawings to denote the same or similar parts.

[0046] Figure 1 A schematic block diagram of a circuit board integration test system according to an embodiment of the present invention is shown;

[0047] Figure 2 A schematic diagram of a circuit board function testing fixture from a first perspective, according to an embodiment of the present invention, is shown.

[0048] Figure 3 A schematic diagram of a circuit board function testing fixture from a second perspective, according to an embodiment of the present invention, is shown.

[0049] Figure 4 A flowchart illustrating the implementation of a circuit board integration testing method according to an embodiment of the present invention is shown. Detailed Implementation

[0050] To enable those skilled in the art to more fully understand the technical solutions of the present invention, exemplary embodiments of the present invention will be described more comprehensively and in detail below with reference to the accompanying drawings. Obviously, the one or more embodiments of the present invention described below are merely one or more specific ways to implement the technical solutions of the present invention, and are not exhaustive. It should be understood that other ways belonging to a general inventive concept can be used to implement the technical solutions of the present invention, and should not be limited to the embodiments described exemplary. Based on one or more embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0051] Example: Figure 1 A schematic block diagram of the circuit board integration testing system according to an embodiment of the present invention is shown. Figure 2 This diagram illustrates the structure of a circuit board function testing fixture from a first-view perspective according to an embodiment of the present invention. Figure 3 A schematic diagram of the circuit board function testing fixture from a second perspective of an embodiment of the present invention is shown.

[0052] Reference Figures 1 to 3 The circuit board integration test system of this invention is used to perform functional tests on the light source drive control board of a fiber optic gyroscope.

[0053] The circuit board integrated testing system of this invention includes a circuit board functional testing fixture, a light source temperature control device, a programmable DC power supply, and a multimeter;

[0054] The circuit board functional testing fixture includes:

[0055] The base housing 100 has a data interface 110, a positive terminal 120 and a negative terminal 130 on its side wall, and a pair of constant current voltage test probes 140 on its top plate.

[0056] The circuit board carrier 200 includes a probe holder 210, a carrier 220, and a first guide post system.

[0057] The probe holder 210 is mounted on the top plate of the base housing 100. The probe holder 210 is equipped with a probe array whose upper end extends beyond the top surface of the probe holder and whose lower end penetrates through the top plate of the base housing. The data interface 110, the positive terminal 120, the negative terminal 130, and a pair of constant current voltage test probes 140 are respectively connected to the lower ends of the corresponding connecting probes of the probe array through wiring arranged inside the base housing.

[0058] The carrier 220 is able to be suspended above the probe holder 210 based on the first guide post system and can move up and down relative to it. The carrier 220 has a circuit board placement area, in which through holes are provided that match the positions of each connecting probe of the probe array.

[0059] The pressing mechanism 300 is configured to apply pressure to the light source drive control board located in the circuit board placement area to fix it, and drive the carrier 220 to move downward so that each external terminal of the light source drive control board contacts the upper end of the corresponding connection probe of the probe array.

[0060] The light source temperature control device is connected to the data interface 110, the programmable DC power supply is connected to the positive terminal 120 and the negative terminal 130, and the multimeter is connected to a pair of constant current voltage test probes 140.

[0061] Furthermore, in this embodiment of the invention, the data interface 110 is a DB9 interface, and the data interface 110 is disposed on the first side wall of the base housing 100.

[0062] The data interface 110 is electrically connected to the SLD+, SLD-, RT+, RT-, TEC+, and TEC- terminals of the light source driver control board via the corresponding connection probes of the probe array.

[0063] Furthermore, in this embodiment of the invention, the positive terminal 120 and the negative terminal 130 are disposed close to each other on the second side wall of the base housing 100, and the second side wall of the base housing 100 is disposed opposite to the first side wall.

[0064] The positive terminal 120 and the negative terminal 130 are electrically connected to the power supply terminal and ground terminal of the light source drive control board through corresponding connection probes of the probe array.

[0065] Furthermore, in this embodiment of the invention, a pair of constant current voltage test probes 140 are electrically connected to the two constant current voltage output terminals of the light source drive control board through corresponding connection probes of the probe array.

[0066] Furthermore, in this embodiment of the invention, two positioning posts are also provided on the carrier 220;

[0067] The two positioning posts are designed asymmetrically to allow the light source drive control board to be placed in the circuit board placement area with the top layer facing down.

[0068] Specifically, in this embodiment of the invention, the two positioning posts with an asymmetrical design can prevent mistaken placement of the light source drive control board in the circuit board placement area with the top layer facing down.

[0069] Furthermore, in this embodiment of the invention, the pressing mechanism 300 includes:

[0070] The back panel structure 310 is vertically mounted on the top plate of the base box 100;

[0071] Rotate the pressure lever handle 320, which is located on the back plate structure 310;

[0072] The second guide column system 330 is installed on the back plate structure 310;

[0073] The pressure plate 340 is fixedly installed at the front end of the rotating pressure rod handle 320, and under the restriction of the second guide column system 330, it can only move up and down relative to the carrier 220 in an attitude parallel to it.

[0074] Four clamping posts 350 are located at the four vertices of the lower surface of the pressure plate 340, and are used to clamp the light source drive control board in the circuit board placement area based on the corresponding four through holes on the light source drive control board.

[0075] Specifically, in this embodiment of the invention, the light source temperature control device internally includes a metal temperature control platform module. This module is directly connected to the light source temperature control switch, temperature display panel, and resistance value display panel. The metal temperature control platform module is used to regulate the operating environment temperature of the SLD (fiber optic gyroscope) light source within the light source temperature control device. The light source temperature control device is connected to the data interface 110 of the circuit board function test fixture via a DB9 serial cable, used to provide temperature control excitation signals to the light source driver control board under test and receive its temperature feedback signals. The output terminal of the programmable DC power supply is connected to the positive terminal 120 and negative terminal 130 of the circuit board function test fixture, used to provide a precise operating voltage to the light source driver control board under test and to monitor and display the operating current of the light source driver control board in real time. The multimeter probes are connected to a pair of constant current voltage test probes 140 of the circuit board function test fixture, used to measure the constant current voltage value output by the light source driver control board.

[0076] Accordingly, based on the circuit board integration testing system of the present invention, the present invention also proposes a circuit board integration testing method based on the circuit board integration testing system.

[0077] Figure 4 A flowchart illustrating the implementation of the circuit board integration testing method according to an embodiment of the present invention is shown. (Refer to...) Figure 4 The circuit board integration testing method of this invention includes the following steps:

[0078] Step S100: Connect the light source temperature control device to the data interface of the circuit board function test fixture, connect the programmable DC power supply to the positive and negative terminals of the circuit board function test fixture, and connect the multimeter probes to a pair of constant current voltage test probes of the circuit board function test fixture.

[0079] Step S200: Place the light source driver control board to be tested into the circuit board placement area. Apply pressure to the light source driver control board located in the circuit board placement area based on the pressing mechanism to fix it, and drive the carrier to move downward so that each external terminal of the light source driver control board contacts the upper end of the corresponding connection probe of the probe array.

[0080] Step S300: Turn on the programmable DC power supply, adjust its output voltage to the predetermined level, and read and record the static operating current value of the circuit board displayed on the programmable DC power supply.

[0081] Step S400: While maintaining power supply to the light source drive control board, turn on the light source temperature control device and use its temperature control function to keep the working environment temperature of the fiber optic gyroscope light source at room temperature, a preset low temperature threshold, and a preset high temperature threshold, respectively.

[0082] Step S500: Obtain the target parameters of the light source driver control board under three temperature conditions. The target parameters include the thermistor resistance value, operating current value and constant current voltage value. The thermistor resistance value is obtained based on the light source temperature control device, the operating current value is obtained based on the programmable DC power supply, and the constant current voltage value is obtained based on the multimeter.

[0083] Step S600: If the thermistor resistance, working current and constant current values ​​under the three temperature conditions are within their respective preset qualified ranges, then the light source driver control board is determined to have passed the functional test.

[0084] The constant current value is determined based on the corresponding constant current voltage value.

[0085] The circuit board integration testing method of this invention will be described in more detail below based on a specific example:

[0086] Take the testing of a company's GY-91 light source driver circuit board as an example.

[0087] I. Preparation of testing equipment:

[0088] Circuit board functional test fixture, 1 set (customized according to the GY-91 board pad layout, internal probe array layout).

[0089] The light source temperature control device adopts a self-made temperature control system using SLD light source, and includes a temperature control module platform, adjustment switch, temperature digital display panel (range +10℃~+45℃) and thermistor resistance value display panel (range 0~20KΩ).

[0090] Programmable DC power supply: GW Instek GPD-3303S model, voltage set to +5V, current range set to 3A.

[0091] Multimeter: Victor Instruments (VC) VC890C+ handheld digital multimeter, set to DC voltage 2V range.

[0092] Board under test: GY-91 light source driver circuit board.

[0093] II. System Connection and Testing:

[0094] S1 system integration connection:

[0095] Insert the DB9 serial cable that comes with the light source temperature control device into the DB9 serial male connector on the side of the circuit board functional test fixture.

[0096] Take two power cords and firmly connect one end to the red terminal ("+5V") and the black terminal ("GND") on the back of the circuit board functional test fixture, respectively. Connect the other end to the positive output terminal and the negative output terminal of the programmable DC power supply, respectively.

[0097] Connect the red and black probes of the multimeter reliably to the two constant current voltage test probes on the front panel of the circuit board functional test fixture.

[0098] This system only needs to be connected once before testing; afterwards, only the circuit board to be tested needs to be replaced.

[0099] S2 circuit board clamping:

[0100] With the top layer of the GY-91 light source driver circuit board to be tested facing down, align the two asymmetrical vias on it with the two asymmetrically designed positioning posts on the carrier and gently place it down; if the circuit board is oriented incorrectly, it cannot be placed, thus achieving foolproofing; after confirming that the circuit board is in place, pressure is applied to the light source driver control board located in the circuit board placement area by the pressing mechanism to fix it, and the carrier is driven to move downward so that the pads of the GY-91 light source driver circuit board contact the upper ends of the corresponding connection probes of the probe array.

[0101] S3 Static Parameter Test:

[0102] Turn on the output switch of the programmable DC power supply, observe its display screen, and record the current value displayed at this time (e.g., 115mA). This is the static operating current of the GY-91 light source driver circuit board at room temperature.

[0103] S4 Dynamic Functional Testing and S5 Data Synchronization Acquisition:

[0104] Keep the programmable DC power supply on. Turn on the power switch of the light source temperature control device; its temperature display panel should show the current ambient temperature (e.g., 25°C). Turn on the multimeter.

[0105] Start the dynamic testing process:

[0106] a) Room temperature recording: Observe and record the readings of the three devices at this time: ① the working current value displayed by the programmable DC power supply (115mA), ② the resistance value of the thermistor displayed by the light source temperature control device (e.g., 6.8KΩ), ③ the constant current voltage value displayed by the multimeter (e.g., 1.000V, then the constant current value is 100.0mA).

[0107] b) Refrigeration test:

[0108] Turn on the temperature control switch on the light source temperature control device and set the mode to "cooling". Observe the temperature display panel. When the temperature drops and stabilizes at +10℃, simultaneously observe and record the readings of the three devices: ① the operating current value displayed by the programmable DC power supply, ② the resistance value of the thermistor displayed by the light source temperature control device, and ③ the constant current voltage value displayed by the multimeter.

[0109] c) Heating Test: Set the temperature control mode to "Heating". Observe the temperature display panel. When the temperature rises and stabilizes at +45℃, observe and record all readings of the three devices simultaneously.

[0110] S6 Functionality Comprehensive Evaluation:

[0111] Fill the recorded data into Appendix 1 below for comprehensive judgment:

[0112]

[0113] Table 1 Test Data Record Table

[0114] Analysis and Judgment: As shown in Table 1, throughout the entire test, the operating current of the tested board remained well below the 500mA threshold; the thermistor resistance changed normally with temperature variations, and its average value remained within the acceptable range throughout the test; the constant current value remained extremely stable even under drastic temperature changes. Therefore, the GY-91 light source driver circuit board can be determined to be functionally qualified.

[0115] The circuit board integration testing system and method of this invention have the following beneficial effects:

[0116] Extremely high efficiency: Through the integrated design of specialized fixtures, the welding, connection, testing and disassembly process, which originally took more than 10 minutes, is shortened to less than 1 minute, improving testing efficiency by more than 90%, which greatly meets the needs of batch testing on the production line.

[0117] High reliability and error prevention: The fixture's foolproof design (asymmetric positioning posts) fundamentally eliminates the possibility of reversed circuit board orientation or incorrect positioning. The one-time precise contact between the probe array and the pads avoids risks such as connection errors, loose connections, and short circuits caused by manual soldering and probe point testing, significantly improving test consistency and reliability.

[0118] Zero damage to the board under test: It completely avoids the thermal stress damage to the board pads caused by repeated soldering and the scratch damage to the silkscreen and solder mask layer on the board surface caused by the metal probe, thus extending the service life of the board (especially the board that needs to be repaired) and reducing production costs.

[0119] Improved testing accuracy and depth: Simultaneous acquisition of multiple parameters (operating current, thermistor resistance, constant current value) under dynamic temperature change conditions has been achieved, which can capture the performance of products under extreme temperatures. The data is more comprehensive and accurate, which is helpful for screening out products with potentially unstable thermal performance, which is something that traditional methods cannot achieve.

[0120] Simple to operate and reduces labor costs: The entire testing process requires almost no professional electronic operation skills. Ordinary employees can start working after simple training, which reduces the technical requirements and training costs for operators, and at the same time reduces losses caused by human error.

[0121] The embodiments of the present invention achieve efficient, reliable, non-destructive and comprehensive performance testing of fiber optic gyroscope light source drive circuit boards through a highly integrated and specialized testing system and method, perfectly solving all the problems raised in the background art and possessing high industrial application value.

[0122] While one or more embodiments of the present invention have been described above, those skilled in the art will recognize that the present invention can be implemented in any other form without departing from its spirit and scope. Therefore, the embodiments described above are illustrative and not restrictive, and many modifications and substitutions will be apparent to those skilled in the art without departing from the spirit and scope of the invention as defined in the appended claims.

Claims

1. A circuit board integration test system, characterized by comprising: Used for functional testing of the light source drive control board of fiber optic gyroscope; The integrated circuit board testing system includes a circuit board functional testing fixture, a light source temperature control device, a programmable DC power supply, and a multimeter. The circuit board functional test fixture includes: The base housing has a data interface, a positive terminal and a negative terminal on its side wall, and a pair of constant current voltage test probes on its top plate. The circuit board carrier includes a probe holder, a carrier base, and a first guide post system. The probe holder is disposed on the top plate of the base housing. The probe holder is equipped with a probe array whose upper end extends beyond the top surface of the probe holder and whose lower end penetrates through the top plate of the base housing. The data interface, the positive terminal, the negative terminal, and the pair of constant current voltage test probes are respectively connected to the lower ends of the corresponding connecting probes of the probe array through wiring arranged inside the base housing. The carrier is able to be suspended above the probe holder based on the first guide post system and can move up and down relative to it. The carrier has a circuit board placement area, in which through holes are provided that match the positions of each connecting probe of the probe array. The pressing mechanism is configured to apply pressure to the light source drive control board located in the circuit board placement area to fix it, and drive the carrier to move downward so that each external terminal of the light source drive control board contacts the upper end of the corresponding connection probe of the probe array. The light source temperature control device is connected to the data interface, the programmable DC power supply is connected to the positive terminal and the negative terminal, and the multimeter is connected to the pair of constant current voltage test probes.

2. The system according to claim 1, wherein The data interface is a DB9 interface, and the data interface is located on the first side wall of the base housing. The data interface is electrically connected to the SLD+, SLD-, RT+, RT-, TEC+, and TEC- terminals of the light source driver control board via corresponding connection probes of the probe array.

3. The system according to claim 2, wherein The positive terminal and the negative terminal are disposed close to each other on the second side wall of the base housing, and the second side wall is disposed opposite to the first side wall; The positive terminal and the negative terminal are electrically connected to the power supply terminal and the ground terminal of the light source drive control board through the corresponding connection probes of the probe array.

4. The system according to claim 3, wherein The pair of constant current voltage test probes are electrically connected to the two constant current voltage output terminals of the light source drive control board through the corresponding connection probes of the probe array.

5. The system according to claim 4, wherein Two positioning posts are also provided on the carrier. The two positioning posts are asymmetrically designed and configured so that the light source drive control board can only be placed in the circuit board placement area with the top layer facing down.

6. The system according to claim 5, wherein The pressing mechanism includes: The backplate structure is vertically mounted on the top plate of the base box. Rotate the pressure lever handle, which is located on the back plate structure; The second guide post system is installed on the back plate structure; The pressure plate is fixedly installed at the front end of the rotating pressure rod handle, and under the restriction of the second guide column system, it can only move up and down relative to the carrier in an attitude parallel to it. Four clamping posts are located at the four vertices of the lower surface of the pressure plate, and are used to press the light source drive control board into the circuit board placement area based on the corresponding four through holes on the light source drive control board.

7. A method of testing a circuit board integrated, characterized by, Based on the circuit board integration test system according to any one of claims 1-6; The circuit board integration testing method includes: System integration connection steps: Connect the light source temperature control device to the data interface of the circuit board function test fixture, connect the programmable DC power supply to the positive and negative terminals of the circuit board function test fixture, and connect the multimeter probes to a pair of constant current voltage test probes of the circuit board function test fixture. Circuit board mounting steps: Place the light source driver control board to be tested into the circuit board placement area. Apply pressure to the light source driver control board located in the circuit board placement area based on the pressing mechanism to fix it, and drive the carrier to move downward so that each external terminal of the light source driver control board contacts the upper end of the corresponding connection probe of the probe array. Static parameter testing steps: Turn on the programmable DC power supply, adjust its output voltage to the predetermined level, and read and record the static operating current value of the circuit board displayed on the programmable DC power supply. Dynamic function test steps: While maintaining power supply to the light source drive control board, turn on the light source temperature control device and use its temperature control function to keep the working environment temperature of the fiber optic gyroscope light source at room temperature, a preset low temperature threshold, and a preset high temperature threshold, respectively. Data synchronization acquisition and recording steps: Obtain the target parameters of the light source drive control board under three temperature conditions. The target parameters include the resistance value of the thermistor, the operating current value, and the constant current voltage value. The thermistor resistance value is obtained based on the light source temperature control device, the operating current value is obtained based on the programmable DC power supply, and the constant current voltage value is obtained based on the multimeter. Functional comprehensive evaluation steps: If the thermistor resistance, working current and constant current values ​​under the three temperature conditions are within their respective preset qualified ranges, then the light source driver control board is determined to have passed the functional test. The constant current value is determined based on the corresponding constant current voltage value.

8. The method of testing a circuit board according to claim 7, wherein, The acceptable range is defined as follows: the average resistance of the thermistor is within the range of 6.8KΩ±0.5KΩ, the operating current does not exceed 0.500A, and the constant current resistance value is stable within the expected value.

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