Display panel and display device
By setting crack test lines and forming a detection loop in the second area of the display panel, and using the touch drive circuit to detect the capacitance value, the problem of low crack detection accuracy in the prior art is solved, and higher detection accuracy and product quality improvement are achieved.
Patent Information
- Application Number
- CN202411455759.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-17
- Publication Date
- 2026-04-17
AI Technical Summary
The existing display panel crack detection accuracy is low, which affects product quality.
A crack test line is set in the second area of the display panel, and a crack detection loop is formed between the touch driving circuit and the crack test line. The capacitance value is used to detect whether there is a crack in the display panel.
This improved the accuracy of crack detection in display panels, avoided yield losses caused by misjudgments, and enhanced product quality.
Smart Images

Figure CN121884689A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of display technology, and more particularly to a display panel and display device. Background Technology
[0002] Currently, in the production process of display panel generation lines, the large display substrates that have been prepared need to be cut into multiple individual display panels, or cut to meet the needs of irregular non-display areas. During the cutting process, cracks or damage can easily occur in the edge areas of the display panels. Cracks and damage can easily cause display defects in the display panels, and micro-cracks can also reduce the reliability of the display panels. Therefore, crack detection of display panels is particularly important for defect screening of display panels.
[0003] However, the existing display panels have low crack detection accuracy, which affects the quality of display panel products. Summary of the Invention
[0004] This application provides a display panel and display device that can improve the crack detection accuracy of the display panel, thereby improving the quality of the display panel product.
[0005] A first aspect of this application provides a display panel, including: a first region and a second region;
[0006] The display panel in the first area has a display measurement function;
[0007] The display panel in the second region is used to bend to the side of the display panel in the first region that is away from the display side;
[0008] The second region includes a first sub-region and a second sub-region, wherein the second sub-region at least partially surrounds the first sub-region;
[0009] The display panel includes a touch electrode, a touch driving circuit, and crack test lines. The touch electrode is disposed in the first region, the touch driving circuit is disposed in the first sub-region, and at least a portion of the crack test lines are disposed in the second sub-region. The touch driving circuit is electrically connected to the touch electrode, and the crack test lines are electrically connected to the touch driving circuit.
[0010] The touch driving circuit is used to detect whether there is a crack in the display panel of the second sub-region by testing the electrical signal of the crack test line.
[0011] In some implementations, the touch driving circuit is used to test whether a crack exists in the second sub-region by testing the capacitance value of the crack test line.
[0012] In some implementations, the edges of the second region include irregular edges.
[0013] In some implementations, the width of the second region on the side closer to the first region is smaller than the width of the second region on the side farther from the first region;
[0014] The width of the second region is the size of the second region in a first direction, which is perpendicular to the second direction, and the second direction is the direction from the first region to the second region.
[0015] In some implementations, the maximum width of the second region is less than the width of the first region, where the width of the first region is the dimension of the first region in the first direction.
[0016] In some embodiments, the second region includes a third sub-region, a fourth sub-region, and a fifth sub-region arranged sequentially in the second direction, wherein the fourth sub-region is located between the third sub-region and the fifth sub-region, and the third sub-region is located between the fourth sub-region and the first region;
[0017] The width of the third sub-region is less than the maximum width of the fourth sub-region, the width of the fifth sub-region is greater than the minimum width of the fourth sub-region, and the width of the third sub-region is less than the width of the fifth sub-region.
[0018] In some embodiments, the second sub-region is provided with at least two crack test lines, the at least two crack test lines corresponding to different locations around the first sub-region.
[0019] In some embodiments, the electrical connection of at least two of the crack test lines to the touch drive circuit is used to form at least one crack detection loop.
[0020] In some embodiments, the touch driving circuit includes a plurality of test pins, wherein the crack test line is electrically connected to the test pins;
[0021] At least two of the test pins are connected in series, and the series-connected test pins and the electrically connected crack test wires are used to form at least one crack detection circuit.
[0022] In some embodiments, the touch driving circuit includes a first test pin, a second test pin, a third test pin, and a fourth test pin, and the crack test line includes a first crack test line and a second crack test line;
[0023] The first crack test line is electrically connected to the first test pin and the second test pin, respectively. The second crack test line is electrically connected to the third test pin and the fourth test pin, respectively. The first test pin is electrically connected to the third test pin, and the second test pin is electrically connected to the fourth test pin.
[0024] In some embodiments, the electrical connection of at least two of the crack test lines to the touch drive circuit is used to form at least two crack detection loops.
[0025] In some embodiments, the touch driving circuit includes at least four test pins, wherein each of the crack test lines is electrically connected to two of the test pins to form a crack detection loop;
[0026] There is no electrical connection between the test pins of the different crack test leads.
[0027] In some embodiments, the crack test line includes a first test line segment and a second test line segment, the first test line segment and the second test line segment surrounding the first sub-region at different locations;
[0028] One end of the first test line segment is electrically connected to the second test line segment, and the other ends of both the first test line segment and the second test line segment are electrically connected to the touch driving circuit. The ends of the first test line segment and the second test line segment connected to each other are located away from the touch driving circuit.
[0029] The first test segment and the second test segment are an integrated circuit structure.
[0030] In some implementations, the first test segment and the main body of the second test segment are arranged parallel to each other.
[0031] In some implementations, the first region includes a display region and a non-display region, the non-display region surrounding the display region;
[0032] A portion of the crack test line is disposed in the non-display area. The crack test line includes a first connection end, a test segment, and a second connection end. Both the first connection end and the second connection end are electrically connected to the touch driving circuit. The test segment partially surrounds the first sub-region and at least a portion of the display area.
[0033] In some implementations, the first region includes a display region and a non-display region, the non-display region surrounding the display region;
[0034] Some of the crack test lines are located in the non-display area, and there is no connection between the crack test lines in the non-display area and the crack test lines in the second sub-area.
[0035] In some implementations, the first sub-region is provided with a display driving circuit;
[0036] The first region includes a display area and a non-display area. The non-display area is provided with a resistance detection line, which at least partially surrounds the display area and is electrically connected to the display driving circuit.
[0037] In some implementations, the edge of the second sub-region furthest from the first sub-region coincides with the cutting line;
[0038] The first sub-region is provided with a first binding pin, a second binding pin and a third binding pin. The first binding pin is used to bind a touch driver chip, the second binding pin is used to bind a display driver chip, and the third binding pin is used to bind a flexible circuit board. The touch driver chip is provided with a touch driver circuit, and the display driver chip is provided with a display driver circuit. The first binding pin and the second binding pin are both electrically connected to the third binding pin.
[0039] The touch driving circuit is located on the side of the display driving circuit that is away from the first area;
[0040] or,
[0041] The display driver circuit and the touch driver circuit are integrated into the same chip.
[0042] In some embodiments, the first region includes a display region, which includes multiple conductive layers;
[0043] The crack test line is disposed in the same layer as at least one conductive layer.
[0044] A second aspect of this application provides a display device, including a display panel as described in the first aspect.
[0045] The display panel provided in this application embodiment features a crack detection loop formed by setting crack test lines at the edge of a second sub-region and electrically connecting a touch driving circuit to the crack test lines. This allows the driving circuit to automatically detect the electrical signals in the loop to determine whether cracks exist at the cut edge of the display panel in the second sub-region, improving the crack detection accuracy of the display panel and avoiding yield losses due to poor crack testing accuracy, thereby improving the product quality of the display panel. Attached Figure Description
[0046] Figure 1 A schematic structural diagram of a display panel provided in an embodiment of this application;
[0047] Figure 2 A schematic structural diagram of another display panel provided in an embodiment of this application;
[0048] Figure 3 A schematic partial structural diagram of a display panel provided in an embodiment of this application;
[0049] Figure 4 A schematic structural diagram of a crack test line provided in an embodiment of this application;
[0050] Figure 5 A schematic structural diagram illustrating the connection between a crack test line and a touch drive circuit, provided in an embodiment of this application;
[0051] Figure 6 A schematic structural diagram illustrating another connection between a crack test line and a touch driving circuit provided in an embodiment of this application;
[0052] Figure 7 A schematic structural diagram of another crack test line provided in an embodiment of this application;
[0053] Figure 8 A schematic structural diagram of another crack test line provided in the embodiments of this application;
[0054] Figure 9 A schematic structural diagram of another crack test line provided in the embodiments of this application;
[0055] Figure 10 A schematic structural diagram of another crack test line provided in the embodiments of this application;
[0056] Figure 11 A schematic structural diagram of another display panel provided in an embodiment of this application;
[0057] Figure 12 A partial cross-sectional structural diagram of the area where the cutting line of a display panel is located, provided for an embodiment of this application;
[0058] Figure 13 This is a schematic structural diagram of a display device provided in an embodiment of this application. Detailed Implementation
[0059] To better understand the technical solutions provided in the embodiments of this specification, the technical solutions of the embodiments of this specification will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the embodiments of this specification and the specific features in the embodiments are detailed descriptions of the technical solutions of the embodiments of this specification, rather than limitations on the technical solutions of this specification. In the absence of conflict, the embodiments of this specification and the technical features in the embodiments can be combined with each other.
[0060] In this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, without necessarily requiring or implying any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element. The term "two or more" includes two or more cases.
[0061] Currently, in the production process of display panel generation lines, the large display substrates that have been prepared need to be cut into multiple individual display panels, or cut to meet the needs of irregularly shaped non-display areas. During the cutting process, cracks or damage can easily occur in the edge areas of the display panels. In addition, bending of the display module during the manufacturing process of display products can also cause cracks and damage to the display panels. Collisions and drops during the use of display products can also cause cracks and damage to the display panels. Cracks and damage can easily cause display defects, and microcracks can also reduce the reliability of the display panels. Therefore, crack detection of display panels is particularly important for the defect screening of display panels.
[0062] However, the existing display panels have low crack detection accuracy, which affects the quality of display panel products.
[0063] In view of this, embodiments of this application provide a display panel and a display device that can improve the crack detection accuracy of the display panel, thereby improving the quality of the display panel product.
[0064] In a first aspect, this application provides a display panel. Figure 1 This is a schematic structural diagram of a display panel provided in an embodiment of this application. Figure 1As shown, the display panel includes a first region 100 and a second region 200. The display panel in the first region 100 has a display measure. The display panel in the second region 200 can be bent to the side of the display panel in the first region 100 away from the display side. The second region 200 includes a first sub-region 210 and a second sub-region 220, which is arranged around the first sub-region 210. The second sub-region 220 can be arranged partially around the first sub-region, or it can be arranged entirely around the first sub-region 210. At least a portion of the crack test line 201 is arranged in the second sub-region 220, and the crack test line 201 can be arranged at the edge of the second sub-region 220, surrounding the first sub-region 210. The display panel includes a touch electrode 101, a touch driving circuit 202, and a crack test line 201. The touch electrode 101 is arranged in the first region 100, and the touch electrode 101 is electrically connected to the touch driving circuit 202. Multiple touch electrodes 101 can be provided, and these electrodes 101 can be arranged in a regular pattern, distributed along the edge of the first region 100. A touch driving circuit 202 is located within the second sub-region 220. The touch driving circuit 202 is electrically connected to the touch electrodes 101, and the crack test line 201 is also electrically connected to the touch driving circuit 202. The touch driving circuit 202 can be used to test the electrical signal of the crack test line 201 to detect whether a crack exists in the display panel of the second sub-region 220. The electrical signal can include capacitance or voltage values, etc., and the sensitivity of capacitance or voltage values is higher than that of resistance values. If the touch driving circuit 202 detects an abnormality in the electrical signal of the crack test line, it can be determined that a crack exists in the display panel of the region where the crack test line 201 is located. If the touch driving circuit 202 detects an abnormality in the electrical signal of the crack test line 201, it can be determined that the display panel of the region where the crack test line 201 is located does not have a crack.
[0065] For example, the touch driving circuit can be integrated into the touch chip. The touch driving circuit 202 can drive the touch electrode 101 and process touch signals to realize the touch function of the display panel. The touch driving circuit can simultaneously test the electrical signals on the crack test line while testing the touch electrode.
[0066] For example, the touch driving circuit 202 can be integrated into the touch driving chip. The touch driving circuit 202 can be used to analyze the detected electrical signals to determine whether the touch electrodes and touch signal lines are functioning normally, and can also determine whether there are micro-cracks around the display panel.
[0067] Typically, during the manufacturing process of display panels, the traces of the PCD (Panel Crack Detect) lines are located far from the cutting edge, making it impossible to detect cracks at the edge and resulting in low crack detection accuracy. Furthermore, resistance-based crack detection is easily affected by external interference; only large resistance fluctuations can reflect crack conditions, leading to low sensitivity in resistance-based crack testing and impacting the quality of display panel products.
[0068] The display panel provided in this application embodiment establishes a crack detection loop by setting crack test lines at the edge of a second sub-region and electrically connecting a touch driving circuit to the crack test lines. This allows the driving circuit to automatically detect electrical signals in the crack detection loop, replacing manual microscopic inspection and reducing processing costs. The touch driving circuit is used to test the capacitance value in the crack detection loop. The sensitivity and anti-interference ability of capacitance are higher than those of resistance, avoiding interference with crack detection, improving the accuracy of crack detection in the display panel, and preventing yield losses due to misjudgments in crack testing, thus improving the quality of the display panel product.
[0069] In some implementations, the touch drive circuit is used to test whether a crack exists in the second sub-region by testing the capacitance value of the crack test line.
[0070] For example, such as Figure 1 As shown, the touch driving circuit 202 can acquire the capacitance value of the crack test line 201 to detect whether there is a crack in the display panel of the second sub-region 220. The touch driving circuit 202 can set a preset capacitance value and compare the preset capacitance value with the currently detected capacitance value of the crack test line 201. If the touch driving circuit 202 detects that the capacitance value of the crack test line 201 is different from the preset capacitance value, it can be determined that there is a crack in the display panel in the area where the crack test line is located. If the touch driving circuit 202 detects that the capacitance value of the crack test line 201 is the same as the preset capacitance value, it can be determined that there is no crack in the display panel in the area where the crack test line 201 is located. The area where the crack test line 201 is located can be the cutting edge area of the display panel. The capacitance value of the crack test line 201 being the same as the preset capacitance value means that the capacitance value of the crack test line 201 is within the allowable error range of the preset capacitance value. The capacitance value of the crack test line 201 being different from the preset capacitance value means that the capacitance value of the crack test line 201 is not within the allowable error range of the preset capacitance value.
[0071] For example, the crack detection line 201 can be disposed on two conductive layers, with insulation between the two conductive layers. The crack detection lines of the two conductive layers can serve as the two plates of a capacitor. The presence of cracks or microcracks in the display panel can be sensed by testing the change in capacitance value of the crack detection line, and the presence of damage to the display panel can also be sensed by testing the change in capacitance value of the crack detection line.
[0072] For example, when the end of the crack test line 201 away from the touch driving circuit 202 is disconnected, the two disconnected crack detection lines can act as the two plates of a capacitor. These two disconnected crack detection lines can be placed on the same conductive layer. The presence of cracks or microcracks in the display panel can be sensed by testing the change in capacitance between the crack detection lines. Using the touch driving circuit to test the capacitance value in the crack detection loop offers higher sensitivity and interference resistance than resistance, thus avoiding interference with crack detection and improving the accuracy of crack detection in the display panel.
[0073] In some implementations, the edge of the second region includes an irregularly shaped edge. This irregular edge can be an edge with an irregular shape formed by cutting. By providing this irregular edge, it is permissible for the second region to bend to the side of the first region's display panel facing away from the display side, even if the display panel of the second region is bent. This facilitates bending the display panel, reduces the difficulty of display panel manufacturing, and can also increase the screen-to-body ratio of the display panel.
[0074] In some implementations, the width of the second region on the side closer to the first region is smaller than the width of the second region on the side farther from the first region. The width of the second region is the dimension of the second region in a first direction, which is perpendicular to the second direction, and the second direction is the direction from the first region to the second region.
[0075] For example, Figure 2 This is a schematic structural diagram of another display panel provided in an embodiment of this application. Figure 2As shown, the width of the second region 200 on the side closer to the first region 100 can be set to be smaller than the width of the side of the second region 200 away from the first region 100. The width of the second region 200 on the side closer to the first region 100 is a first width h1, and the width of the second region 200 on the side away from the first region 100 is a second width h2, meaning the first width h1 is smaller than the second width h2. The width of the second region 200 is its dimension in the first direction x. The first direction x is perpendicular to the second direction y, which is the direction from the first region 100 to the second region 200. Setting the width of the second region 200 on the side closer to the first region 100 to be narrower facilitates the bending of the display panel of the second region 200 to the side of the first region 100 that is away from the display side. Since the edge of the second region 200 is an irregular edge, the width of the second region 200 on the side away from the first region 100 can be set to multiple values. The second width h2 and the third width h3 can both be considered as the width of the second region 200 on the side away from the first region. The third width h3 is the maximum width of the second region. The third width h3 is greater than the second width h2, and the second width h2 is greater than the first width h1. By setting the first width h1, the second width h2, and the third width h3, it is convenient for the display panel of the second region 200 to be bent to the side of the display panel of the first region 100 that is away from the display side.
[0076] In some implementations, the maximum width of the second region 200 is less than the width of the first region 100, the width of the first region 100 being the dimension of the first region 100 in the first direction x.
[0077] For example, such as Figure 2 As shown, the maximum width of the second region 200 is less than the width of the first region 100. The maximum width of the second region 200 is the third width h3, and the width of the first region 100 is the fourth width h4, meaning the third width h3 is less than the fourth width h4. By setting the third width h3 to be less than the fourth width h4, the width of the second region 200 on the side closer to the first region 100 is narrower, making it easier for the display panel of the second region 200 to bend to the side of the display panel of the first region 100 away from the display side.
[0078] In some embodiments, the second region includes a third sub-region, a fourth sub-region, and a fifth sub-region arranged sequentially in a second direction. The fourth sub-region is located between the third and fifth sub-regions, and the third sub-region is located between the fourth sub-region and the first region. The width of the third sub-region is less than the maximum width of the fourth sub-region, the width of the fifth sub-region is greater than the minimum width of the fourth sub-region, and the width of the third sub-region is less than the width of the fifth sub-region.
[0079] For example, Figure 3 This is a schematic partial structural diagram of a display panel provided in an embodiment of this application. Figure 3 As shown, the second region 200 includes a third sub-region 230, a fourth sub-region 240, and a fifth sub-region 250 arranged sequentially in a second direction. The fourth sub-region 240 is located between the third sub-region 230 and the fifth sub-region 250, and the third sub-region 230 is located between the fourth sub-region 240 and the first region 100. The width of the third sub-region 230 is less than the maximum width of the fourth sub-region 240. Specifically, the width of the third sub-region 230 is the fifth width h5, and the maximum width of the fourth sub-region 240 is the sixth width h6, meaning that the fifth width h5 is less than the sixth width h6. The width of the fifth sub-region 250 is greater than the minimum width of the fourth sub-region 240. The width of the fifth sub-region 250 is the seventh width h7, the same as the maximum width of the second region 200, and the same as the maximum width of the fourth sub-region 240. The minimum width of the fourth sub-region 240 is the same as the width of the third sub-region 230, meaning the seventh width h7 equals the third width h3 and the sixth width h6. All seven widths (h7, h6, and h3) are greater than the fifth width h5. The width of the third sub-region 230 is less than the width of the fifth sub-region 250. The width of the fifth sub-region 250 is the same as the maximum width of the second region 200, meaning the fifth width h5 is less than the third width h3. The width settings of the third, fourth, and fifth sub-regions can create irregular edges. The third sub-region setting facilitates bending the display panel of the second region to the side of the first region's display panel away from the display side. The width transition setting of the fourth sub-region enhances the reliability of the display panel. The establishment of a fifth sub-region provides sufficient space for the drive circuitry, thereby improving product quality.
[0080] In some implementations, the second sub-region is provided with at least two crack test lines, which correspond to different locations around the first sub-region.
[0081] For example, Figure 4 This application provides a schematic structural diagram of a crack test line according to an embodiment. For example... Figure 4As shown, the second sub-region 220 can be provided with at least two crack test lines, or multiple crack test lines can be provided according to actual testing needs. Taking two crack test lines as an example, the second sub-region 220 is provided with a first crack test line 203 and a second crack test line 204. The first crack test line 203 and the second crack test line 204 can surround the edge of the first sub-region 210, or surround the middle position between the first sub-region 210 and the second sub-region 220. The first crack test line 203 and the second crack test line 204 are respectively connected to the touch driving circuit 202 and are set on both sides of the touch driving circuit 202, that is, the first crack test line 203 and the second crack test line 204 are set on both sides of the second sub-region 220. The first crack test line 203 and the second crack test line 204 can be symmetrically set on both sides of the first sub-region 210, or asymmetrically set on both sides of the first sub-region 210. The first crack test line 203 and the second crack test line 204 can be symmetrically arranged on both sides of the second sub-region 220, or asymmetrically arranged on both sides of the second sub-region 220. Multiple crack test lines can also be arranged symmetrically or asymmetrically around both sides of the second sub-region 220 to meet different crack test line arrangement requirements. The crack test lines surround the edge of the second sub-region 220, and the outline of the crack test lines can match the cutting edge outline of the first sub-region 210. Crack test lines can be positioned between the first sub-region 210 and the second sub-region 220, and the outline of the crack test lines can match the edge outline of the second sub-region. Crack test lines can surround the first sub-region at different positions, and the edge outlines of the first and second sub-regions can match the outline of the crack test lines. The edge outline of the second sub-region can be set according to the outline of an irregular edge, that is, the edge outline of the second sub-region is the outline of an irregular edge. By matching the outline of the crack test line with the outline of the irregular edge, the arrangement outline of the crack test line on the display panel is made to fit the outline of the cut edge more closely, thereby improving the detection accuracy of cracks.
[0082] In some implementations, the electrical connection between at least two crack test lines and the touch drive circuit is used to form at least one crack detection loop.
[0083] For example, such as Figure 4As shown, the second sub-region 220 can be equipped with at least two crack test lines: a first crack test line 203 and a second crack test line 204. The first crack test line 203 and the second crack test line 204 are electrically connected to the touch driving circuit to form a crack detection loop. Depending on the degree of breakage at the cut edge of the display panel, multiple crack test lines can also be set. Any two of these multiple crack test lines are connected to the touch driving circuit to form multiple crack detection loops. The touch driving circuit 202 can acquire the capacitance value on at least one crack detection loop and compare the preset capacitance value with the capacitance value on the currently detected crack detection loop to determine the size of the crack in the display panel in the area where at least two crack test lines are located. By setting crack test lines connected to the touch driving circuit to form crack detection loops and detecting the capacitance value on the loops, crack detection can be performed specifically on display panels with different crack sizes, improving the accuracy of display panel crack detection.
[0084] In some implementations, the touch driving circuit includes multiple test pins, wherein a crack test line is electrically connected to the test pins. At least two test pins are connected in series, and the series-connected test pins and the electrically connected crack test line are used to form at least one crack detection loop.
[0085] For example, the touch driving circuit 202 can be equipped with multiple test pins, and crack test lines can be electrically connected one-to-one with the test pins. Any two test pins from the multiple test pins can be connected in series, and the two series-connected test pins are electrically connected to the crack test lines to form a crack detection loop. The two series-connected test pins can be electrically connected to two separate crack test lines, or the two ends of a single crack test line can be electrically connected to two test pins respectively. By setting multiple test pins, the crack test lines can be electrically connected to any two test pins, effectively avoiding interference with other devices integrated into the display panel. Different arrangement methods of crack detection loops can also be formed according to different cutting shapes, increasing the applicability of the crack detection loop.
[0086] In some embodiments, the touch driving circuit includes a first test pin, a second test pin, a third test pin, and a fourth test pin, and the crack test line includes a first crack test line and a second crack test line. The first crack test line is electrically connected to the first test pin and the second test pin, respectively, and the second crack test line is electrically connected to the third test pin and the fourth test pin, respectively. The first test pin is electrically connected to the third test pin, and the second test pin and the fourth test pin are electrically connected.
[0087] For example, Figure 5 This is a schematic structural diagram illustrating the connection between a crack test line and a touch drive circuit, provided as an embodiment of this application. Figure 5As shown, the touch driving circuit 202 is provided with a first test pin 221, a second test pin 222, a third test pin 223, and a fourth test pin 224. The first test pin 221, second test pin 222, third test pin 223, and fourth test pin 224 can be arranged symmetrically in pairs. The first test pin 221 and second test pin 222 are located on the same side, and the third test pin 223 and fourth test pin 224 are located on the same side. The first test pin 221 and second test pin 222 can be arranged symmetrically with the third test pin 223 and the fourth test pin 224, respectively, or they can be arranged asymmetrically. The crack test line includes a first crack test line 203 and a second crack test line 204, which can be arranged symmetrically or asymmetrically. The two ends of the first crack test line 203 are electrically connected to the first test pin 221 and the second test pin 222, respectively, and the two ends of the second crack test line 204 are electrically connected to the third test pin 223 and the fourth test pin 224, respectively.
[0088] For example, the first test pin 221 and the second test pin 222 are electrically connected to the first crack test line 203 to form a first circuit, and the third test pin 223 and the fourth test pin 224 are electrically connected to the second crack test line 204 to form a second circuit. The first circuit and the second circuit are symmetrically arranged, and the first crack test line 203 and the second crack test line 204 are symmetrically arranged.
[0089] For example, the first test pin 221, the first crack test line 203, the second test pin 222, the fourth test pin 224, the second crack test line 204, and the third test pin 223 can be electrically connected in sequence to form a circuit. Alternatively, the third test pin 223, the second crack test line 204, the fourth test pin 224, the second test pin 222, the first crack test line 203, and the first test pin 221 can be electrically connected in sequence to form a circuit. The first circuit and the second circuit are asymmetrically arranged, and the first crack test line 203 and the second crack test line 204 are also asymmetrically arranged. The four pins can be connected in series in sequence, or in parallel symmetrically in pairs, or other connection methods can be adapted according to the circuit layout on the touch driving circuit 202. By setting test pins on the touch driving circuit, at least two crack test lines are connected in series with the test pins to form a circuit. The connection between the pins connected to the crack test line can also be in other ways, which can provide a variety of control logic and detection methods for crack detection and improve the efficiency of crack detection.
[0090] In some implementations, the electrical connection between at least two crack test lines and the touch drive circuit is used to form at least two crack detection loops.
[0091] For example, Figure 6 This is a schematic structural diagram illustrating another connection between a crack test line and a touch drive circuit, provided in an embodiment of this application. Figure 6 As shown, the second sub-region 220 can be electrically connected to at least two crack test lines and the touch driving circuit 202 to form at least two crack detection loops. The at least two crack detection loops can include a first crack detection loop A and a second crack detection loop B. The first crack detection loop A can be composed of a first crack test line 203 connected in series with the touch driving circuit 202. The second crack detection loop B can be composed of a second crack test line 204 connected in series with the touch driving circuit 202. The first crack detection loop A and the second crack detection loop B are respectively connected in parallel with the touch driving circuit 202 to form two crack detection loops. The first crack detection loop A and the second crack detection loop B are located on opposite sides of the second sub-region 220, allowing for independent crack detection at different locations within the second sub-region. This ensures that the electrical signals detected by different crack detection loops do not interfere with each other during crack detection, thereby improving the accuracy of crack detection.
[0092] In some implementations, the touch driving circuit includes at least four test pins, wherein each crack test line is electrically connected to two test pins to form a crack detection loop. There is no electrical connection between the test pins to which different crack test lines are electrically connected.
[0093] For example, such as Figure 6 As shown, the touch driving circuit 202 has at least four test pins, and at least two crack test lines. Each crack test line can be electrically connected to any two adjacent pins to form a crack detection loop. There is no electrical connection between the test pins connected by different crack test lines. The first crack detection loop A can be composed of the first crack test line 203, the first test pin 221, and the second test pin 222 connected in series. The second crack detection loop B can be composed of the second crack test line 204, the third test pin 223, and the fourth test pin 224 connected in series. The first crack detection loop A and the second crack detection loop B are connected in parallel with the touch driving circuit 202 to form two crack detection loops. The first crack detection loop A and the second crack detection loop B are located on opposite sides of the second sub-region, allowing for independent crack detection at different locations within the second sub-region. This ensures that the electrical signals detected by different crack detection loops do not interfere with each other during crack detection, thereby improving the accuracy of crack detection.
[0094] In some embodiments, the crack test line includes a first test line segment and a second test line segment, which surround a first sub-region at different locations. One end of the first test line segment is electrically connected to the second test line segment, and the other ends of both the first and second test line segments are electrically connected to a touch driving circuit. The ends of the first and second test line segments that are connected to each other are located away from the touch driving circuit, and the first and second test line segments are an integral circuit structure.
[0095] For example, Figure 7 This is a schematic structural diagram of another crack test line provided in an embodiment of this application. Figure 7 As shown, each crack test line 204 may include a first test line segment D1 and a second test line segment D2, which surround a first sub-region at different locations. The first test line segment D1 and the second test line segment D2 may surround the first sub-region 210 and the second sub-region 220, positioned near the outer edge of the second sub-region 220. Alternatively, the first test line segment D1 and the second test line segment D2 may surround the first sub-region 210 and the second sub-region 220, positioned away from the outer edge of the second sub-region 220 and close to the edge of the first sub-region 210. One end of the first test line segment D1 may be electrically connected to the second test line segment D2, and the other ends of both the first test line segment D1 and the second test line segment D2 are electrically connected to the touch driving circuit 202. The ends where the first test line segment D1 and the second test line segment D2 are interconnected are positioned away from the touch driving circuit 202. After being electrically connected, the first test line segment D1 and the second test line segment D2 are respectively electrically connected to the touch driving circuit 202 to form a crack detection loop. The first test segment D1 and the second test segment D2 can be an integrated circuit structure. The structure where the first test segment D1 and the second test segment D2 are electrically connected to form a single test segment is an integrated circuit structure, which offers high sensitivity in transmitting electrical signals. By setting the first and second test segments around different locations of the first sub-region, crack detection circuits are formed at different positions on the display panel, allowing for the detection of cracks at different locations on the display panel. Combined with the integrated circuit structure, cracks at different locations on the display panel can be accurately detected, resulting in comprehensive and precise crack detection.
[0096] In some implementations, the main body portions of the first test segment and the second test segment are arranged in parallel.
[0097] For example, such as Figure 7As shown, the main body of the first test segment D1 can be a first main body D11, and the main body of the second test segment D2 can be a second main body D22. The first main body D11 can be positioned close to the outer edge of the second sub-region 220. The arrangement of the first main body D11 can be adjusted according to the cutting contour of the outer edge of the second sub-region 220, so that the first main body D11 matches the cutting contour of the outer edge of the second sub-region 220. The arrangement of the first main body D11 and the second main body D22 can be the same or partially the same. If the first main body D11 and the second main body D22 are arranged in the same way, the main bodies of the first test segment D1 and the second test segment D2 can be completely parallel. If the first main body D11 and the second main body D22 are partially the same, the first main body D11 and the second main body D22 can be partially parallel. For example, if both the first test segment D1 and the second test segment D2 are arranged in an "L" shape, the first main body D11 and the second main body D22 can be completely parallel. With the first test line segment arranged in an "N" shape and the second test line segment arranged in an "L" shape, the first main body D11 and the second main body D22 are partially parallel. By setting different arrangements of the main bodies of the first and second test line segments, crack testing of display panels with different cutting contours can be adapted to meet the testing requirements of irregular edges.
[0098] In some embodiments, the first region includes a display area and a non-display area, with the non-display area surrounding the display area. A portion of the crack test line is disposed in the non-display area. The crack test line includes a first connection end, a test segment, and a second connection end. Both the first and second connection ends are electrically connected to the touch driving circuit. The test segment partially surrounds the first sub-region and at least a portion of the display area.
[0099] For example, Figure 8 This is a schematic structural diagram of another crack test line provided in an embodiment of this application. (See diagram below.) Figure 8As shown, the first region includes a display area 110 and a non-display area 120, with the non-display area 120 surrounding the display area 110. Crack test lines are respectively set in the first region 100 and partially set in the second region 200. Specifically, the crack test line 208 in the first region is set within the non-display area 120, positioned away from the display area 110 and close to the edge of the non-display area 120. The crack test line 201 in the second region 200 is set close to the edge of the second sub-region 220. The crack test line 201 in the second sub-region 220 and the crack test line 208 in the non-display area 120 are electrically connected to form a first test segment D3. The two ends of the first test segment D3 are the two ends of the crack test line. The first test segment D3 includes a first connecting end 205 and a second connecting end 206. The first connecting end 205 and the second connecting end 206 of the first test segment D3 are respectively connected to the touch driving circuit 202 to form a crack detection loop. By connecting the crack test lines in the second sub-region and the crack test lines in the non-display area, the first and second regions can share a crack detection loop, which can simultaneously detect cracks at the cutting edges of the first and second regions, thus improving crack detection efficiency.
[0100] For example, Figure 9 This application provides a schematic structural diagram of another crack test line according to an embodiment. (See diagram below.) Figure 9 As shown, crack test lines are respectively set in the first region 100 and partially set in the second region 200. Specifically, the crack test line 302 in the first region 100 is set in the non-display area 120, while the crack test line 301 in the first region is set away from the display area 110 and closer to the edge of the non-display area 120. The crack test line 301 in the second region 200 is set closer to the edge of the second sub-region 220. The crack test line 301 in the second sub-region 220 and the crack test line 302 in the non-display area 120 are electrically connected to form the second test segment D4. The outline of the second test segment D4 matches that of the first test segment D3. The second test segment D4 includes a first connection terminal 205 and a second connection terminal 206, which are respectively connected to the touch driving circuit 202 to form a crack detection loop. Test section D4 is a crack detection circuit formed by a single crack test line and the touch drive circuit 202. By setting a single crack test line, the space occupied by the crack detection circuit on the display panel can be saved, which facilitates the arrangement of other crack detection circuits.
[0101] In some implementations, the first region includes a display region and a non-display region, with the non-display region surrounding the display region. A portion of the crack test lines are located in the non-display region, and there is no connection between the crack test lines in the non-display region and the crack test lines in the second sub-region.
[0102] For example, Figure 10 This is a schematic structural diagram of another crack test line provided in an embodiment of this application. (See diagram below.) Figure 10 As shown, the crack test line 208 of the non-display area 120 surrounds the display area 110 and is positioned near the edge of the non-display area 120. The crack test line 208 of the non-display area 120 can be connected to the display driving circuit 207 to form a crack detection loop in the non-display area. The capacitance value of the crack test line in the non-display area 120 is obtained through the display driving circuit 207 to test whether a crack exists at the edge of the non-display area 120. The crack test line 201 of the second sub-area 220 surrounds the first sub-area 210 and is positioned near the edge of the second sub-area 220, electrically connected to the touch driving circuit 202 to form a crack detection loop in the second sub-area. The capacitance value of the crack test line 201 in the second sub-area 220 is obtained through the touch driving circuit 202 to test whether a crack exists at the edge of the second sub-area 220. The principle of capacitance testing by the touch driving circuit 202 is the same as the testing principle of the touch electrode. There is no connection between the non-display area crack detection circuit and the second sub-region crack detection circuit, causing the second region 200 to bend to the side of the first region 100 away from the display area. Crack detection is performed independently by both the non-display area crack detection circuit and the first sub-region crack detection circuit. Crack detection is performed on the first and second regions before and after bending to check whether the cracks have changed. This avoids secondary damage to the display panel before and after bending, further improving product quality.
[0103] In some embodiments, a display driving circuit is provided in the first sub-region. The first region includes a display area and a non-display area. A resistance detection line is provided in the non-display area. The resistance detection line at least partially surrounds the display area and is electrically connected to the display driving circuit.
[0104] For example, a first sub-region is provided with a display driving circuit. The first region includes a display area and a non-display area. A resistance detection line is provided in the non-display area, which can be positioned near the edge of the non-display area. The resistance detection line at least partially surrounds the display area, and its arrangement outline in the first region can match the edge outline of the display area. The resistance detection line in the non-display area can be connected to the display driving circuit to form a resistance detection loop in the non-display area. A resistance detection line is positioned in a second region, surrounding the first sub-region, near the edge of the second sub-region. The outline of the resistance detection line can match the edge outline of the second sub-region. The arrangement of the resistance test line is the same as that of the crack test line, both arranged according to the edge outlines of the non-display area and the second sub-region. By obtaining the resistance value of the crack resistance detection line at the edge of the display panel through the display driving circuit, it is possible to test whether there is a crack at the edge of the first and second regions. This allows the display panel to have both capacitance and resistance testing methods, and also enables independent capacitance and resistance testing, improving product compatibility.
[0105] In some implementations... Figure 11 This is a schematic structural diagram of another display panel provided in an embodiment of this application. Figure 11 As shown, the edge of the second sub-region 220 away from the first sub-region 210 coincides with the cutting line. The first sub-region 210 is provided with a first bonding pin, a second bonding pin, and a third bonding pin. The first bonding pin is used to bond the touch driver chip 600, the second bonding pin is used to bond the display driver chip 500, and the third bonding pin is used to bond the flexible circuit board 700. The touch driver chip 600 contains a touch driver circuit, and the display driver chip 500 contains a display driver circuit. The first and second bonding pins are both electrically connected to the third bonding pin. The touch driver circuit is located on the side of the display driver circuit away from the first region 100.
[0106] In some implementations, the display driving circuit and the touch driving circuit are integrated into the same chip and located in the second region. This allows the display driving circuit and the touch driving circuit to be bent to the side of the display panel in the first region away from the display side, reducing the space occupied by the display driving circuit and the touch driving circuit.
[0107] In some embodiments, the first region 100 includes a display region, which includes multiple conductive layers. Crack test lines are disposed co-layered with at least one conductive layer. The crack test lines and at least one conductive layer can be formed simultaneously in the same patterning process. The etching depth of the crack test lines can be the same as the thickness of the conductive layers in the direction perpendicular to the display panel. The conductive layers can include gate signal lines, gate electrodes, data signal lines, and source / drain electrodes. Crack test lines can be disposed co-layered with gate signal lines. Crack test lines can be disposed co-layered with gate electrodes. Crack test lines can be disposed co-layered with data signal lines. Crack test lines can be disposed co-layered with source / drain electrodes. The display region also includes an anode and a cathode. Crack test lines can be disposed co-layered with the anode. Crack test lines can also be disposed co-layered with the cathode. By disposing crack test lines co-layered with any conductive layer of the display region, processing steps can be saved, and the processing efficiency of the display panel can be improved.
[0108] In some implementations... Figure 12 This is a partial cross-sectional structural diagram of the area where the cutting line of a display panel is located, provided as an embodiment of this application. For example... Figure 12 As shown, substrate 111 can be made of a flexible material. Buffer layer 112 can be SiO2 or SiNx. A conductive layer and an insulating layer are sequentially disposed on the side of silicon oxide away from the substrate. The insulating layer may include an indirect insulating layer ILD, an inorganic insulating layer EBB, a passivation insulating layer PVX, a first organic insulating layer PLN1, a second organic insulating layer PLN2, a third organic insulating layer PLN3, a pixel defining layer PDL, a touch insulating layer TLD, and an optical adhesive layer TOC. The inorganic insulating layer EBB has a first groove 124 and a second groove 125, the depth and width of which may be the same or different. During the preparation of the insulating layer, the first and second grooves can absorb the stress generated during the cutting process, preventing stress from damaging the film layer. The display panel may include a cutting area C, and the area other than the cutting area is a retained area D. The first and second areas of the display panel are both located within the retained area D. The cutting area C and the retained area D can be divided by a first cutting line 126.
[0109] A second aspect of this application provides a display device. Figure 13 This is a schematic structural diagram of a display device provided in an embodiment of this application. Figure 13As shown, the display device 1000 is equipped with a display panel 2000. A crack test line is set at the edge of the second sub-region, and a touch drive circuit is electrically connected to the crack test line to form a test loop. This allows the drive circuit to automatically detect the electrical signal in the loop to determine whether a crack exists in the display panel of the second sub-region, improving the detection accuracy of cracks in the display panel and avoiding yield losses due to misjudgments in crack testing, thus improving the quality of the display panel product.
[0110] The display devices provided in this application embodiment may include televisions, computers, smartphones, smart wearable devices, laptops, and tablets, etc. Smart wearable devices may include smartwatches, AR (augmented reality) devices, and VR (virtual reality) devices, etc.
[0111] It should be noted that the descriptions of each embodiment in the above embodiments have different focuses. For parts that are not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.
[0112] The above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.
[0113] Although preferred embodiments have been described in this specification, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of this specification.
[0114] Obviously, those skilled in the art can make various modifications and variations to this specification without departing from its spirit and scope. Therefore, if such modifications and variations fall within the scope of the claims and their equivalents, this specification is also intended to include such modifications and variations.
Claims
1. A display panel, characterized by, include: First and Second Zones; The display panel in the first area has a display measurement function; The display panel in the second region is used to bend to the side of the display panel in the first region that is away from the display side; The second region includes a first sub-region and a second sub-region, wherein the second sub-region at least partially surrounds the first sub-region; The display panel includes a touch electrode, a touch driving circuit, and crack test lines. The touch electrode is disposed in the first region, the touch driving circuit is disposed in the first sub-region, and at least a portion of the crack test lines are disposed in the second sub-region. The touch driving circuit is electrically connected to the touch electrode, and the crack test lines are electrically connected to the touch driving circuit. The touch drive circuit is used to detect whether there is a crack in the display panel of the second sub-region by using the electrical signal of the test crack test line.
2. The display panel according to claim 1, characterized in that, The touch driving circuit is used to test whether there is a crack in the second sub-region by testing the capacitance value of the crack test line.
3. The display panel according to claim 1, characterized in that, The edges of the second region include irregular edges.
4. The display panel according to claim 1, characterized in that, The width of the second region on the side closer to the first region is smaller than the width of the second region on the side farther from the first region; The width of the second region is the size of the second region in a first direction, which is perpendicular to the second direction, and the second direction is the direction from the first region to the second region.
5. The display panel according to claim 4, characterized in that, The maximum width of the second region is less than the width of the first region, and the width of the first region is the dimension of the first region in the first direction.
6. The display panel according to claim 4, characterized in that, The second region includes a third sub-region, a fourth sub-region, and a fifth sub-region arranged sequentially in the second direction, wherein the fourth sub-region is located between the third sub-region and the fifth sub-region, and the third sub-region is located between the fourth sub-region and the first region. The width of the third sub-region is less than the maximum width of the fourth sub-region, the width of the fifth sub-region is greater than the minimum width of the fourth sub-region, and the width of the third sub-region is less than the width of the fifth sub-region.
7. The display panel according to claim 1, characterized in that, The second sub-region is provided with at least two crack test lines, and the at least two crack test lines correspond to the first sub-region at different locations.
8. The display panel according to claim 7, characterized in that, The electrical connection of at least two of the crack test lines to the touch drive circuit is used to form at least one crack detection loop.
9. The display panel according to claim 8, characterized in that, The touch driving circuit includes multiple test pins, wherein the crack test line is electrically connected to the test pins; At least two of the test pins are connected in series, and the series-connected test pins and the electrically connected crack test wires are used to form at least one crack detection circuit.
10. The display panel according to claim 9, characterized in that, The touch driving circuit includes a first test pin, a second test pin, a third test pin, and a fourth test pin, and the crack test line includes a first crack test line and a second crack test line; The first crack test line is electrically connected to the first test pin and the second test pin, respectively. The second crack test line is electrically connected to the third test pin and the fourth test pin, respectively. The first test pin is electrically connected to the third test pin, and the second test pin is electrically connected to the fourth test pin.
11. The display panel according to claim 7, characterized in that, The electrical connection between at least two of the crack test lines and the touch drive circuit is used to form at least two crack detection loops.
12. The display panel according to claim 11, characterized in that, The touch driving circuit includes at least four test pins, wherein each of the crack test lines is electrically connected to two of the test pins to form a crack detection loop; There is no electrical connection between the test pins of the different crack test leads.
13. The display panel according to any one of claims 1 to 12, characterized in that, The crack test line includes a first test line segment and a second test line segment, the first test line segment and the second test line segment surrounding the first sub-region at different locations; One end of the first test line segment is electrically connected to the second test line segment, and the other ends of both the first test line segment and the second test line segment are electrically connected to the touch driving circuit. The ends of the first test line segment and the second test line segment connected to each other are located away from the touch driving circuit. The first test segment and the second test segment are an integrated circuit structure.
14. The display panel according to claim 13, characterized in that, The main body of the first test line segment and the second test line segment are arranged in parallel.
15. The display panel according to claim 1, characterized in that, The first region includes a display region and a non-display region, wherein the non-display region surrounds the display region; A portion of the crack test line is disposed in the non-display area. The crack test line includes a first connection end, a test segment, and a second connection end. Both the first connection end and the second connection end are electrically connected to the touch driving circuit. The test segment partially surrounds the first sub-region and at least a portion of the display area.
16. The display panel according to any one of claims 1 to 12, characterized in that, The first region includes a display region and a non-display region, wherein the non-display region surrounds the display region; Some of the crack test lines are located in the non-display area, and there is no connection between the crack test lines in the non-display area and the crack test lines in the second sub-area.
17. The display panel according to any one of claims 1 to 12, characterized in that, The first sub-region is equipped with a display driving circuit; The first region includes a display area and a non-display area. The non-display area is provided with a resistance detection line, which at least partially surrounds the display area and is electrically connected to the display driving circuit.
18. The display panel according to any one of claims 1 to 12, characterized in that, The edge of the second sub-region furthest from the first sub-region coincides with the cutting line; The first sub-region is provided with a first binding pin, a second binding pin and a third binding pin. The first binding pin is used to bind a touch driver chip, the second binding pin is used to bind a display driver chip, and the third binding pin is used to bind a flexible circuit board. The touch driver chip is provided with a touch driver circuit, and the display driver chip is provided with a display driver circuit. The first binding pin and the second binding pin are both electrically connected to the third binding pin. The touch driving circuit is located on the side of the display driving circuit away from the first area; or... The display driver circuit and the touch driver circuit are integrated into the same chip.
19. The display panel according to any one of claims 1 to 12, characterized in that, The first region includes a display area, and the display area includes multiple conductive layers; The crack test line is disposed in the same layer as at least one conductive layer.
20. A display device comprising: include: The display panel as described in any one of claims 1 to 19.