Thermal barrier coating temperature and thickness coupling measurement method, system and equipment and storage medium

Abstract

The invention discloses a thermal barrier coating temperature and thickness coupling measurement method, system and device and a storage medium, and relates to the technical field of aeronautical material testing. The method comprises the following steps: calibrating a mapping relation among parameters: preparing a series of standard samples with different thicknesses, collecting phosphorescence spectrums of the samples with the standard thicknesses at different temperatures, and calibrating the mapping relation among the parameters; the phosphorescence spectrum of the to-be-detected sample is collected, the phosphorescence intensity ratio of 457 nm to 483 nm is calculated, and the phosphorescence intensity of 586 nm is read; calculating the temperature of the to-be-measured sample: calculating the temperature of the to-be-measured sample according to the measured phosphorescence intensity ratio and the intensity ratio-temperature mapping relation; and calculating the thickness of the to-be-measured sample: determining a change curve of the phosphorescence intensity along with the thickness according to the calculated temperature of the to-be-measured sample, and calculating the thickness of the phosphorescence coating in combination with the measured phosphorescence intensity. The method and the system can realize non-contact synchronous online measurement of the temperature and the thickness of the thermal barrier coating.

Description

Technical Field

[0001] This invention relates to the field of aerospace material testing technology, and in particular to a method, system, device and storage medium for coupled measurement of temperature and thickness of thermal barrier coatings. Background Technology

[0002] The turbine inlet temperature of fourth-generation aero-engines has reached 1900-2000K, far exceeding the temperature resistance limit of existing materials. Thermal barrier coatings (TBCs), as a key heat insulation technology for hot-end components of aero-engines, are crucial to the engine's reliability and service life. A typical TBC structure includes an adhesive layer and a ceramic layer. The ceramic layer, with its low thermal conductivity, reduces the surface temperature of the metal in the aero-engine environment. The adhesive layer primarily mitigates the deformation differences caused by the different thermal expansion coefficients of the ceramic layer and the metal substrate. Long-term operation in high-temperature environments leads to various changes in the TBC, including the following: ① Thermal expansion mismatch between layers: The thermal barrier coating is a multi-layer structure with huge differences in the coefficients of thermal expansion between the metal and non-metal layers. During temperature cycling, the deformation between the layers is different, which leads to stress concentration at the coating interface. ② Thermally Grown Oxide (TGO) Layer Growth: In a high-temperature and oxygen-rich service environment, oxygen molecules in the hot gas flow pass through the loose and porous ceramic layer and come into contact with the metal bonding layer to form TGO. TGO is usually unevenly thickened, with tensile stress concentration in the peak area and compressive stress concentration in the trough area, which damages the interface stability and bonding strength. ③ Sintering of ceramic layer: In a long-term high-temperature environment, the grains in the coating grow, the porosity decreases, and the coating becomes denser, which leads to a decrease in the strain tolerance of the ceramic layer and accelerates the failure of the coating.

[0003] The aforementioned problems can easily lead to partial or complete peeling of the thermal barrier coating, shortening the service life of hot-end components and threatening the safe operation of the engine. Therefore, achieving online synchronous measurement of the operating temperature and thickness of the thermal barrier coating is crucial for extending the life of hot-end components and improving engine reliability and safety.

[0004] Based on a search of existing publicly available information, there are currently no technical solutions for simultaneously testing the temperature and thickness of thermal barrier coatings; only the measurement of a single physical quantity, such as temperature or thickness, is performed.

[0005] ① Temperature Measurement: Infrared thermometry is mainly used for testing the temperature of thermal barrier coatings. The principle of infrared thermometry is the blackbody radiation law: all objects with a temperature above absolute zero continuously radiate energy outward. The amount of energy radiated outward is closely related to the object's temperature and surface characteristics. Infrared detectors receive thermal radiation and convert it into electrical signals, which are then processed by a specific algorithm to obtain the object's temperature. However, infrared thermometry is severely affected by the complex combustion atmosphere of the engine and background radiation, and it is difficult to accurately calibrate the emissivity of the thermal barrier coating surface.

[0006] ② Thickness Measurement: Thermal barrier coating thickness measurement technologies include eddy current thickness measurement and ultrasonic thickness measurement. Eddy current thickness measurement utilizes the law of electromagnetic induction. An electromagnetic coil carrying an alternating current is placed close to the surface of the thermal barrier coating. The magnetic field generated by the alternating current in the electromagnetic coil induces a current on the surface of the metal substrate covered with the thermal barrier coating. The magnetic field generated by the induced current then acts on the electromagnetic coil. This effect is related to the distance between the metal substrate and the electromagnetic coil, and this distance is the thickness of the thermal barrier coating. The thickness of the thermal barrier coating can be measured by monitoring the change in the current in the electromagnetic coil. Ultrasonic thickness measurement calculates the coating thickness by calculating the propagation time of an ultrasonic pulse signal in the material. Ultrasonic pulse signals exhibit reflection and transmission phenomena at the interface between two different media. After the ultrasonic thickness gauge emits an ultrasonic pulse signal, the ultrasonic pulse signal is reflected and transmitted at the interface between air and the thermal barrier coating, and at the interface between the thermal barrier coating and the metal substrate, respectively. The reflected ultrasonic pulse signal is received again by the ultrasonic thickness gauge. The thickness of the thermal barrier coating can be calculated by calculating the time difference between the ultrasonic echoes generated at the two interfaces. Eddy current thickness measurement and ultrasonic thickness measurement are both contact-based measurements, which cannot enable online testing of thermal barrier coating thickness under the operating conditions of aero-engines. Summary of the Invention

[0007] The technical problem to be solved by the present invention is how to provide a method for non-contact synchronous online accurate measurement of the temperature and thickness of thermal barrier coatings.

[0008] To solve the above-mentioned technical problems, the technical solution adopted by the present invention is: a method for coupled measurement of temperature and thickness of thermal barrier coating, comprising the following steps: Calibrate the mapping relationship between various parameters: Prepare a series of standard samples of different thicknesses, collect phosphorescence spectra of each standard thickness sample at different temperatures, and calibrate the mapping relationship between various parameters; Read the phosphorescence intensity and intensity ratio in the phosphorescence spectrum of the sample to be tested: acquire the phosphorescence spectrum of the sample to be tested, calculate the phosphorescence intensity ratio of the wavelength combination corresponding to the thermally coupled energy level, and read the phosphorescence intensity of another independent characteristic peak. Calculate the temperature of the sample to be tested: Calculate the temperature of the sample to be tested based on the measured phosphorescence intensity ratio and intensity ratio-temperature mapping relationship; Calculate the thickness of the sample to be tested: Based on the calculated temperature of the sample to be tested, determine the curve of phosphorescence intensity as a function of thickness, and calculate the thickness of the phosphorescent coating by combining the measured phosphorescence intensity.

[0009] This invention also discloses a coupled measurement system for the temperature and thickness of a thermal barrier coating, comprising: a pulsed laser, a first reflecting mirror, a first dichroic mirror, a first filter, a lens, a second dichroic mirror, an image splitter, a first sCMOS camera, a computer, a second reflecting mirror, a second sCMOS camera, and a second filter. The pulsed laser emits a high-frequency pulsed laser beam, which passes through the first reflecting mirror and the first dichroic mirror to illuminate the surface of the thermal barrier coating to be measured. The surface of the thermal barrier coating to be measured radiates phosphorescence. The phosphorescence passes through the first dichroic mirror, the first filter, and the lens to reach the second dichroic mirror. The second dichroic mirror simultaneously transmits the phosphorescence signal corresponding to the wavelength combination of the thermally coupled energy levels. At that time, the phosphorescent signal of another independent characteristic peak is reflected. The phosphorescent signal of the thermally coupled energy level corresponding to the wavelength combination enters the imaging separator and is separated into two independent wavelength phosphorescent images, which are projected onto both sides of the chip of the first sCMOS camera. The first sCMOS camera converts the phosphorescent signal into a phosphorescent image electrical signal and transmits it to the computer for data processing. The phosphorescent signal of the other independent characteristic peak is reflected by the second dichroic mirror and then reflected by the second mirror to the second filter in front of the second sCMOS camera. The second filter will filter out signals of other wavelengths in the phosphorescent signal. The second sCMOS camera converts the phosphorescent signal of the other independent characteristic peak into a phosphorescent image electrical signal and transmits it to the computer for data processing.

[0010] The present invention also discloses a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the thermal barrier coating temperature and thickness coupling measurement method.

[0011] The present invention also discloses a computer-readable storage medium storing a computer program thereon, characterized in that the computer program, when executed by a processor, is used to implement the aforementioned thermal barrier coating temperature and thickness coupling measurement method.

[0012] The beneficial effects of adopting the above technical solution are as follows: Based on the response characteristics of the emission wavelength of the phosphorescent coating (thermal barrier coating) to different temperatures and thicknesses, the method proposes a non-contact online transient synchronous measurement scheme for temperature and thickness, which solves the problem of simultaneous measurement of temperature and thickness of thermal barrier coating, and provides technical support for online diagnosis of the service status of thermal barrier coating and research on the mechanism of temperature influence on coating failure.

[0013] Based on the coupled measurement scheme of phosphorescent coating temperature and thickness, a coupled measurement system for phosphorescent coating temperature and thickness was designed. It is unaffected by complex gas atmosphere, background radiation and surface emissivity, and can realize the acquisition of high-frequency transient two-dimensional field test. Attached Figure Description

[0014] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0015] Figure 1 This is the main flowchart of the method described in Embodiment 1 of the present invention; Figure 2 This is a schematic diagram of the coating temperature and thickness coupled measurement data processing in the method described in Embodiment 1 of the present invention; Figure 3 This is a schematic diagram of the thermal barrier coating structure after incorporation of rare earth ions. Figure 4 This is a graph showing the relationship between phosphorescence intensity ratio and temperature in Embodiment 1 of the present invention. Figure 5 This is a mapping curve of phosphorescence intensity and coating thickness under different temperature conditions in Embodiment 1 of the present invention; Figure 6 This is a schematic diagram of the system described in Embodiment 2 of the present invention; Figure 7 This is a schematic block diagram of the computer device described in Embodiment 3 of the present invention; The components are: 1. Pulsed laser; 2. First reflector; 3. First dichroic mirror; 4. Thermal barrier coating on the surface to be tested; 5. First filter; 6. Lens; 7. Second dichroic mirror; 8. Imaging separator; 9. First sCMOS camera; 10. Second reflector; 11. Second sCMOS camera; 12. Second filter; 13. Computer. Detailed Implementation

[0016] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0017] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and those skilled in the art can make similar extensions without departing from the spirit of the invention. Therefore, the invention is not limited to the specific embodiments disclosed below.

[0018] Example 1: Overall, such as Figures 1-2 As shown in the figure, an embodiment of the present invention discloses a method for coupled measurement of temperature and thickness of thermal barrier coating, the method comprising the following steps: The first step is to calibrate the mapping relationship between various parameters. A series of standard samples of different thicknesses are prepared, and phosphorescence spectra of each standard thickness sample are collected at different temperatures to calibrate the mapping relationship between the various parameters. The second step is to read the phosphorescence intensity and intensity ratio in the phosphorescence spectrum of the sample to be tested. The phosphorescence spectrum of the sample to be tested is collected, and the phosphorescence intensity ratio at 457 nm and 483 nm is calculated. FIR 1. Read the phosphorescence intensity at 586nm J 1; The third step is to calculate the temperature of the sample to be tested. This is based on the measured phosphorescence intensity ratio. FIR t Based on the intensity-temperature mapping relationship, the temperature of the sample under test is calculated. T 1; The fourth step is to calculate the thickness of the sample to be tested. This is based on the sample temperature calculated in the third step. T 1. Determine the phosphorescence intensity as a function of thickness, and combine this with the experimentally measured phosphorescence intensity. J 1. Calculate the thickness of the phosphorescent coating. d 1; At this point, the temperature information... T 1 and thickness information d 1. All have been obtained, temperature T 1. Obtained in step 3, thickness d 1. This is obtained in the fourth step, enabling simultaneous online measurement of coating temperature and coating thickness.

[0019] The above steps will be explained in detail below with specific methods: This invention involves uniformly incorporating trace amounts of rare earth ions (phosphorescent coating) into the ceramic layer of a thermal barrier coating. Upon exposure to excitation light, these rare earth ions emit phosphorescence. By utilizing the spectral characteristics of the phosphorescent coating, simultaneous measurement of the temperature and thickness of the thermal barrier coating can be achieved.

[0020] (1) Preparation of phosphorescent coating The most commonly used material for thermal barrier coatings is yttria-stabilized zirconia (YSZ). The preparation process of thermal barrier coatings includes powder preparation, powder granulation, and spraying. This application adds rare earth oxides such as dysprosium oxide as raw materials in the powder preparation stage to produce rare earth ion-doped YSZ nanoparticles. For example, dysprosium-doped yttria-stabilized zirconia (YSZ:Dy) gives the powder photoluminescence properties. Then, electro-spray granulation or spray granulation processes are used to prepare micron-sized powders suitable for spraying. Finally, atmospheric plasma spraying (APS) and other spraying processes are used to spray the micron-sized powders into a phosphorescent coating. Figure 3 This is a schematic diagram of the thermal barrier coating structure after incorporating rare earth ions.

[0021] (2) Measurement principle ① Temperature measurement principle Coating temperature measurement is based on the ratio of the intensities of two characteristic peaks in the phosphorescence spectrum. The phosphorescent coating (a thermal barrier ceramic layer doped with rare earth ions) emits phosphorescence after being irradiated with excitation light. The operating temperature of the thermal barrier coating can be obtained by using the mapping relationship between the ratio of the intensities of the two characteristic peaks in the phosphorescence spectrum and temperature.

[0022] The relationship between the intensity ratio of the two characteristic peaks in a phosphorescence spectrum and temperature is expressed as follows: ; In the formula, FIR The ratio of phosphorescence intensity of the two wavelengths. I 1 and I 2 represents the phosphorescence intensity at two wavelengths, Δ E This represents the energy level difference between the thermally coupled energy levels corresponding to two wavelengths. k B Boltzmann's constant, T For temperature, B and C These are all fitting constants. A typical intensity ratio versus temperature curve is shown below. Figure 4 As shown.

[0023] ②Thickness measurement principle Coating thickness measurement is based on absolute phosphorescence intensity. Based on the Kubelka-Munk theory, a transmission model of excitation light and phosphorescence within the coating is established, and finally, a mapping relationship between the absolute intensity of emitted phosphorescence and coating thickness is constructed.

[0024] The relationship between phosphorescence intensity and coating thickness is expressed as follows: ; in: ; In the formula,J The intensity of phosphorescence emitted by the phosphorescent coating. I 0 represents the excitation of light energy. q 1 represents quantum yield. d For the thickness of the coating, K denoted as the absorption coefficient of the coating for excitation light. S Let be the scattering coefficient of the coating for the excitation light. K 1 represents the absorption coefficient of the coating to phosphorescence. S 1 represents the scattering coefficient of phosphorescence by the coating; all other variables are intermediate variables. A typical mapping relationship between phosphorescence intensity and coating thickness is shown below. Figure 5 As shown.

[0025] ③ Decoupling method for coating temperature and thickness information This application decouples temperature and thickness measurements by selecting specific phosphorescence wavelengths. When calibrating the mapping relationship between temperature and phosphorescence intensity ratio, a pair of wavelengths with a phosphorescence intensity ratio that is only temperature-dependent and independent of thickness is selected for calibration. When calibrating the mapping relationship between thickness and phosphorescence intensity, another emission peak wavelength independent of the temperature calibration process is used to establish a mapping relationship between its absolute intensity and coating thickness. To obtain a higher signal-to-noise ratio, characteristic peak wavelengths with higher emission intensity in the phosphorescence spectrum are typically selected.

[0026] Taking a yttrium-stabilized zirconia coating doped with dysprosium ions as an example, when establishing a mapping model between phosphorescence intensity ratio and temperature, the wavelength combination corresponding to the two thermally coupled energy levels of 457 nm and 483 nm is selected. The intensity ratio of this combination can eliminate the interference of thickness. When calibrating the mapping relationship between thickness and phosphorescence intensity, 586 nm, which has a higher emission intensity in the phosphorescence spectrum, is selected to obtain a higher signal-to-noise ratio.

[0027] The proposed method addresses the challenge of simultaneously measuring the temperature and thickness of thermal barrier coatings. Based on the spectral characteristics of phosphorescent coatings, it decouples temperature and thickness information by selecting wavelengths with different response characteristics. Temperature is measured using the intensity ratio of the two wavelengths. The phosphorescence intensity ratio of this set of wavelengths is only sensitive to temperature and not to thickness. The thickness is then measured by combining the intensity of another phosphorescence intensity-sensitive wavelength. This establishes a non-contact, synchronous, online measurement method for the temperature and thickness of thermal barrier coatings.

[0028] To address the need for online measurement of the temperature and thickness of thermal barrier coatings for aero-engines, a synchronous online measurement system for coating temperature and thickness was designed based on the temperature and thickness coupled measurement method proposed in this application. The system employs a high-frequency laser to achieve high-frequency transient testing.

[0029] Example 2 like Figure 6As shown, this embodiment of the invention discloses a coupled measurement system for the temperature and thickness of a thermal barrier coating, including a pulsed laser 1, a first reflector 2, a first dichroic mirror 3, a thermal barrier coating surface to be measured 4, a first filter 5, a lens 6, a second dichroic mirror 7, an imaging splitter 8, a first sCMOS camera 9, a second reflector 10, a second sCMOS camera 11, a second filter 12, and a computer 13.

[0030] A 100kHz pulsed laser is used to emit high-frequency pulsed laser light. A first reflecting mirror 2 reflects the laser light emitted by the laser onto the surface of a first dichroic mirror 3. The first dichroic mirror 3 has wavelength selective transmittance, allowing shorter wavelength laser light to pass through while simultaneously reflecting longer wavelength phosphorescence. A first filter 5 filters out residual laser light from the phosphorescence. A lens 6 focuses the phosphorescence light onto the signal acquisition and data processing system. A second dichroic mirror 7 has wavelength selective transmittance, allowing 586nm phosphorescence light to pass through while simultaneously reflecting 457nm and 483nm phosphorescence light. An imaging separator 8 is used for… Phosphorescent signals of 457nm and 483nm are projected onto both sides of the chip of sCMOS camera 1, respectively. The first sCMOS camera 9 is used to convert the phosphorescent signals of 457nm and 483nm into phosphorescent image electrical signals and transmit them to computer 13 for data processing. The second reflector 10 is used to reflect the phosphorescent signal of 586nm into the second sCMOS camera 10. The second filter 12 is used to filter out signals of other wavelengths in the phosphorescent signal. The second sCMOS camera 10 is used to convert the phosphorescent signal of 586nm into phosphorescent image electrical signals and transmit them to computer 13 for data processing.

[0031] When the measurement system is working, a 100kHz pulsed laser emits laser light. The laser light emitted by pulsed laser 1 passes through the first reflecting mirror 2 and the first dichroic mirror 3 and illuminates the thermal barrier coating surface 4 to be measured. The thermal barrier coating surface 4 radiates phosphorescence. The phosphorescence passes through the first dichroic mirror 3, the first filter 5, and the lens 6 to reach the second dichroic mirror 7. The second dichroic mirror 7 transmits phosphorescence signals of 457nm and 483nm while reflecting a phosphorescence signal of 586nm. The phosphorescence signals of 457nm and 483nm enter the image separator 8 and are separated into a 457nm phosphorescence image and a 483nm image. The phosphorescent image of 457nm is projected onto both sides of the chip of the first sCMOS camera 9. The first sCMOS camera 9 converts the phosphorescent signals of 457nm and 483nm into phosphorescent image electrical signals, which are then transmitted to the computer for data processing. The phosphorescent signal of 586nm is reflected by the second dichroic mirror 7 and then reflected by the second reflector 10 to the second filter 12 in front of the second sCMOS camera 11. The second filter 12 filters out signals of other wavelengths in the phosphorescent signal. The second sCMOS camera 11 converts the phosphorescent signal of 586nm into phosphorescent image electrical signals, which are then transmitted to the computer 13 for data processing.

[0032] The processing method of computer 13 in the system described in Embodiment 2 of this application can refer to the method described in Embodiment 1, and will not be repeated here.

[0033] Example 3 In one exemplary embodiment, the present invention also provides a computer device, which may be a server or a terminal, and its internal structure diagram may be as follows. Figure 7 As shown, the computer device includes a processor, memory, input / output interfaces (I / O), and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The I / O interfaces are used for exchanging information between the processor and external devices. The communication interface is used for communicating with external terminals via a network connection. When the computer program is executed by the processor, it implements the thermal barrier coating temperature and thickness coupling measurement method described in Embodiment 1.

[0034] Those skilled in the art will understand that Figure 7 The structures shown are merely block diagrams of some structures related to the present application and do not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than shown in the figures, or combine certain components, or have different component arrangements. In an exemplary embodiment, a computer device is provided, including a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0035] In one exemplary embodiment, the present invention also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0036] In one exemplary embodiment, the present invention also provides a computer program product, including a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0037] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0038] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM).

[0039] The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic units, data processing logic units, etc., and are not limited to these.

[0040] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0041] This document uses specific examples to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. Furthermore, those skilled in the art will recognize that, based on the ideas of this application, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A method for coupled measurement of temperature and thickness of thermal barrier coating, characterized in that... Includes the following steps: Calibrate the mapping relationship between various parameters: Prepare a series of standard samples of different thicknesses, collect the phosphorescence spectra of each standard thickness sample at different temperatures, and calibrate the mapping relationship between various parameters; Read the phosphorescence intensity and intensity ratio in the phosphorescence spectrum of the sample to be tested: acquire the phosphorescence spectrum of the sample to be tested, calculate the phosphorescence intensity ratio of the wavelength combination corresponding to the thermally coupled energy level, and read the phosphorescence intensity of another independent characteristic peak. Calculate the temperature of the sample to be tested: Calculate the temperature of the sample to be tested based on the measured phosphorescence intensity ratio and intensity ratio-temperature mapping relationship; Calculate the thickness of the sample to be tested: Based on the calculated temperature of the sample to be tested, determine the curve of phosphorescence intensity as a function of thickness, and calculate the thickness of the phosphorescent coating by combining the measured phosphorescence intensity.

2. The method for coupled measurement of temperature and thickness of thermal barrier coating as described in claim 1, characterized in that, The standard sample was prepared by the following method: The preparation of the thermal barrier coating includes powder preparation, powder granulation and spraying. In the powder preparation step, rare earth oxides are added as raw materials to make rare earth ion-doped nanoparticles, which give the powder photoluminescence properties. Then, micron-sized powder suitable for spraying is prepared by electro-spray granulation or spray granulation process. Finally, the micron-sized powder is sprayed into a thermal barrier coating by spraying process.

3. The method for coupled measurement of temperature and thickness of thermal barrier coating as described in claim 1, characterized in that, The mapping relationship between the parameters is calibrated as follows: The relationship between the phosphorescence intensity ratio at 457nm and 483nm and temperature was determined: In the formula, The ratio of phosphorescence intensity of the two wavelengths. and Phosphorescence intensities at wavelengths of 457 nm and 483 nm, respectively, Δ E This represents the energy level difference between the thermally coupled energy levels corresponding to two wavelengths. Boltzmann's constant, T For temperature, B and C All of these are fitting constants.

4. The method for coupled measurement of temperature and thickness of thermal barrier coating as described in claim 1, characterized in that, The mapping relationship between the parameters is calibrated as follows: The relationship between phosphorescence intensity at 586 nm and coating thickness is calibrated. The formula for the relationship between phosphorescence intensity and coating thickness is: in: In the formula, J The intensity of phosphorescence emitted by the phosphorescent coating. I 0 represents the excitation of light energy. q 1 represents quantum yield. d For the thickness of the coating, K denoted as the absorption coefficient of the coating for excitation light. S Let be the scattering coefficient of the coating for the excitation light. K 1 represents the absorption coefficient of the coating to phosphorescence. S 1 represents the scattering coefficient of the coating to phosphorescence; all other variables are intermediate variables.

5. A coupled measurement system for temperature and thickness of thermal barrier coating, characterized in that, include: A pulsed laser (1) emits a laser beam, which passes through a first reflecting mirror (2) and a first dichroic mirror (3) and irradiates the thermal barrier coating surface (4) to be tested. The thermal barrier coating surface (4) radiates phosphorescence, which passes through the first dichroic mirror (3), the first filter (5), and the lens (6) to reach the second dichroic mirror (7). The second dichroic mirror (7) transmits the phosphorescence signal corresponding to the wavelength combination of the thermally coupled energy level while reflecting the phosphorescence signal of another independent characteristic peak. The phosphorescence signal corresponding to the wavelength combination of the thermally coupled energy level enters the imaging separator (8) and is separated into two independent wavelength phosphorescence images. The phosphorescent signal is projected onto both sides of the chip of the first sCMOS camera (9). The first sCMOS camera (9) converts the phosphorescent signal into a phosphorescent image electrical signal and transmits it to the computer for data processing. The phosphorescent signal of another independent characteristic peak is reflected by the second dichroic mirror (7) and then reflected by the second mirror (10) to the second filter (12) in front of the second sCMOS camera (11). The second filter (12) filters out signals of other wavelengths in the phosphorescent signal. The second sCMOS camera (11) converts the phosphorescent signal of another independent characteristic peak into a phosphorescent image electrical signal and transmits it to the computer (13) for data processing.

6. The thermal barrier coating temperature and thickness coupled measurement system as described in claim 5, characterized in that, The pulsed laser is a 100kHz pulsed laser.

7. The thermal barrier coating temperature and thickness coupled measurement system as described in claim 5, characterized in that: The preparation of the thermal barrier coating includes powder preparation, powder granulation and spraying. In the powder preparation step, rare earth oxides are added as raw materials to make rare earth ion-doped nanoparticles, which give the powder photoluminescence properties. Then, micron-sized powder suitable for spraying is prepared by electro-spray granulation or spray granulation process. Finally, the micron-sized powder is sprayed into a thermal barrier coating by spraying process.

8. The thermal barrier coating temperature and thickness coupled measurement system as described in claim 5, characterized in that: The computer processing method in the system includes: When calibrating the mapping relationship between temperature and phosphorescence intensity ratio, a pair of wavelength combinations with phosphorescence intensity ratio that are only related to temperature and not to thickness are selected for calibration; when calibrating the mapping relationship between thickness and phosphorescence intensity, another emission peak wavelength independent of the temperature calibration process is selected to establish the mapping relationship between its absolute intensity and coating thickness.

9. A computer device, comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that the processor executes the computer program to implement the thermal barrier coating temperature and thickness coupling measurement method according to any one of claims 1-4.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When executed by a processor, the computer program is used to implement the temperature and thickness coupling measurement method for thermal barrier coatings as described in any one of claims 1-4.

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