Transient photoelectric signal test system for photovoltaic device

Abstract

A photovoltaic device transient photoelectric signal test system disclosed by the present invention comprises a computer host, a signal source, a data acquisition end, a diode light source, a lens, a reflector, a sample bin and a lifting displacement platform, the computer host is connected with the signal source and the data acquisition end, the signal source is connected with the data acquisition end, and the diode light source is connected with the lens. The other side of the data acquisition end is connected with a sample bin, the other side of the signal source is connected with a diode light source, pulse light emitted by the diode light source is reflected to the sample bin through a lens and a reflector, a lifting displacement table is arranged below the sample bin, and the lifting displacement table is connected with the signal source. Pulse illumination required for testing is generated by modulating the diode light source through the signal source. The transient photoelectric signal testing system for the photovoltaic device is simple in structure, light in weight, small in size, convenient to operate and capable of testing transient light current and transient light voltage of different samples.

Description

Technical Field

[0001] This invention relates to the field of photovoltaic device photoelectric performance characterization and testing technology, and in particular to a photovoltaic device transient photoelectric signal testing system. Background Technology

[0002] Photovoltaic power generation is a flexible application in emerging clean energy sources, applicable to various scales including rooftops, ground surfaces, water surfaces, garages, businesses, and large power stations. Transient photocurrent and transient photovoltage testing are important methods for characterizing the performance of photovoltaic devices. By measuring the transient current and voltage signals generated by a sample under pulsed light illumination, important parameters such as charge extraction efficiency, carrier lifetime, and carrier mobility can be studied.

[0003] The existing technology has the following problems: the system is complex to operate, has a large size, and requires the use of expensive pulsed lasers in the testing system. Summary of the Invention

[0004] The purpose of this invention is to provide a transient photoelectric signal testing system for photovoltaic devices, which is simple in structure, lightweight and compact, and easy to operate, and can realize the testing of transient photocurrent and transient photovoltage for different samples.

[0005] To achieve the above objectives, the present invention provides a transient photoelectric signal testing system for photovoltaic devices, comprising a computer host, a signal source, a data acquisition terminal, a diode light source, a lens, a reflector, a sample chamber, and a lifting and displacement platform. The computer host is connected to the signal source and the data acquisition terminal, the signal source is connected to the data acquisition terminal, the other side of the data acquisition terminal is connected to the sample chamber, and the other side of the signal source is connected to the diode light source. The pulsed light emitted by the diode light source is reflected into the sample chamber through the lens and the reflector. A lifting and displacement platform is provided below the sample chamber. The pulsed light required for the test is generated by the signal source modulating the diode light source.

[0006] Preferably, the wavelength of the diode light source is 405nm, 520nm, 650nm, 780nm, 850nm, or 940nm, covering the visible to near-infrared band.

[0007] Preferably, the sample chamber and the data acquisition terminal are connected by a BNC cable.

[0008] Preferably, the signal source and the data acquisition terminal are controlled by the computer host.

[0009] Preferably, the lens and the reflector adjust the size of the light spot and the transmission path of the pulsed light emitted by the diode light source.

[0010] Preferably, the lifting displacement stage is a multi-axis displacement stage.

[0011] The technical solution of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of an embodiment of a photovoltaic device transient photoelectric signal testing system according to the present invention;

[0013] Figure 2 This is a transient photocurrent test curve of a lead-based perovskite sample in a photovoltaic device transient photoelectric signal testing system according to the present invention;

[0014] Figure 3 This is a transient photocurrent test curve of a tin-lead mixed perovskite sample in a photovoltaic device transient photoelectric signal testing system according to the present invention;

[0015] Figure 4 This is a transient photocurrent test curve of a polycrystalline silicon sample in a photovoltaic device transient photoelectric signal testing system according to the present invention;

[0016] Figure 5 This is a transient photocurrent test curve of an indium gallium arsenide sample in a photovoltaic device transient photoelectric signal testing system according to the present invention;

[0017] Figure 6 This is a transient photovoltage test curve of a lead-based perovskite sample in a photovoltaic device transient photoelectric signal testing system according to the present invention;

[0018] Figure 7 This is a transient photovoltage test curve of a tin-lead mixed perovskite sample in a photovoltaic device transient photoelectric signal testing system according to the present invention;

[0019] Figure 8 This is a transient photovoltage test curve of a polycrystalline silicon sample in a photovoltaic device transient photoelectric signal testing system according to the present invention;

[0020] Figure 9 This is a transient photovoltage test curve of an indium gallium arsenide sample in a photovoltaic device transient photoelectric signal testing system according to the present invention.

[0021] Figure Labels

[0022] 1. Computer host; 2. Signal source; 3. Data acquisition terminal; 4. Diode light source; 5. Lens; 6. Reflector; 7. Sample chamber; 8. Lifting and displacement platform. Detailed Implementation

[0023] The technical solution of the present invention will be further described below with reference to the accompanying drawings and embodiments.

[0024] Unless otherwise defined, the technical or scientific terms used in this invention shall have the ordinary meaning understood by one of ordinary skill in the art to which this invention pertains. The terms "first," "second," and similar terms used in this invention do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed following the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are used only to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0025] like Figure 1-9 As shown, a transient photoelectric signal testing system for photovoltaic devices includes a computer host 1, a signal source 2, a data acquisition terminal 3, a diode light source 4, a lens 5, a reflector 6, a sample chamber 7, and a lifting and displacement platform 8. The computer host 1 is connected to the signal source 2 and the data acquisition terminal 3. The signal source 2 is connected to the data acquisition terminal 3. The other side of the data acquisition terminal 3 is connected to the sample chamber 7. The other side of the signal source is connected to the diode light source. The diode light source is reflected into the sample chamber through the lens and the reflector. A lifting and displacement platform is provided below the sample chamber.

[0026] Computer host 1 is used to control the modulation signal of signal source 2, the sampling parameters of data acquisition terminal 3, and the storage of test data; signal source 2 is used to modulate the light intensity, light pulse width, and light pulse repetition frequency of diode light source 4, and output a synchronization signal to data acquisition terminal 3; data acquisition terminal 3 is used to receive the synchronization signal output by signal source 2, set different sampling resistor values, and acquire the transient photocurrent and transient photovoltage signals generated by the sample under pulsed light illumination.

[0027] Diode light source 4 is used to generate pulsed light to irradiate the sample under test and generate transient photoelectric signals. The wavelengths of the diode light source are 405nm, 520nm, 650nm, 780nm, 850nm, and 940nm, covering the visible to near-infrared band.

[0028] Lens 5 is used to focus the divergent light emitted by diode light source 4 to produce a pulsed light spot with a small area and high optical power density; reflector 6 is used to adjust the light propagation path of diode light source 4; sample chamber 7 is used to fix the sample under test and connect the test system circuit. The sample chamber 7 is connected to the data acquisition terminal 3 by BNC cable to ensure that the signal transmission is not distorted; lifting displacement stage 8 is used to adjust the position of the device under test, so as to realize convenient switching and rapid testing of multiple sub-samples on one sample; computer host 1 can display the test waveform and store data in real time. Signal source 2 and data acquisition terminal 3 are controlled by computer host 1. The switching between transient photocurrent and transient photovoltage test modes is realized by setting the resistance value of sampling resistor.

[0029] Signal source 2 is used to modulate the luminous intensity, pulse width, and pulse repetition frequency of diode light source 4. Diode light source 4 generates the pulsed light required for testing. By changing the diode light source to have characteristic wavelengths of 410nm, 532nm, 650nm, 710nm, 850nm, and 940nm, transient photocurrent and transient photovoltage tests of the sample under pulsed light covering the visible light to near-infrared bands can be achieved. The intensity of the pulsed light can be controlled by modulating the voltage of the signal source to achieve transient photocurrent and transient photovoltage tests under different light intensities. Lens 5 and reflector 6 adjust the spot size and transmission path of the pulsed light emitted by diode light source 3. The lifting and displacement stage 8 is a multi-axis displacement stage used to adjust the position of the device under test, enabling convenient and rapid testing of multiple sub-samples on a single sample.

[0030] Example 1:

[0031] The lead-based perovskite sample was placed in sample chamber 7 and the wiring was completed. A diode light source 4 with a characteristic wavelength of 520nm was selected. The modulation signal of signal source 2 was set at the computer host 1. One of the output modulation signals was used to drive the diode light source 4, and the other was used to transmit to the signal acquisition terminal as a synchronous trigger signal. The sampling resistor of the data acquisition terminal was set to 50Ω. After the range of the data acquisition terminal 3 was set, the data was saved after obtaining the complete cycle signal, and the transient photocurrent test was completed.

[0032] Example 2:

[0033] The tin-lead mixed perovskite sample was placed in sample chamber 7 and the wiring was completed. A diode light source 4 with a characteristic wavelength of 850nm was selected. The modulation signal of signal source 2 was set at the computer host 1. One of the output modulation signals was used to drive the diode light source 4, and the other was used to transmit to the signal acquisition end as a synchronous trigger signal. The sampling resistor of the data acquisition end was set to 50Ω. After the range of the data acquisition end 3 was set, the data was saved after obtaining the complete cycle signal, and the transient photocurrent test was completed.

[0034] Example 3:

[0035] Place the polycrystalline silicon sample in sample chamber 7 and complete the wiring. Select a diode light source 4 with a characteristic wavelength of 850nm. Set the modulation signal of signal source 2 at the computer host 1. One output modulation signal is used to drive the diode light source 4, and the other is used to transmit to the signal acquisition terminal as a synchronous trigger signal. Set the sampling resistor of the data acquisition terminal to 50Ω. Set the range of the data acquisition terminal 3 to obtain the complete cycle signal and save the data to complete the transient photocurrent test.

[0036] Example 4:

[0037] The indium gallium arsenide sample was placed in the sample chamber 7 and the wiring was completed. A diode light source 4 with a characteristic wavelength of 940nm was selected. The modulation signal of the signal source 2 was set at the computer host 1. One of the output modulation signals was used to drive the diode light source 4 to work, and the other was used to transmit to the signal acquisition end as a synchronous trigger signal. The sampling resistor of the data acquisition end was set to 50Ω. After the range of the data acquisition end 3 was set and the complete cycle signal was obtained, the data was saved to complete the transient photocurrent test.

[0038] Example 5:

[0039] The lead-based perovskite sample was placed in the sample chamber 7 and the wiring was completed. A diode light source 4 with a characteristic wavelength of 650nm was selected. The modulation signal of the signal source 2 was set at the computer host 1. One of the output modulation signals was used to drive the diode light source 4, and the other was used to transmit to the signal acquisition end as a synchronous trigger signal. The sampling resistance of the data acquisition end was set to 1MΩ. After the range of the data acquisition end 3 was set and the complete cycle signal was obtained, the data was saved to complete the transient photovoltage test.

[0040] Example 6:

[0041] The tin-lead mixed perovskite sample was placed in sample chamber 7 and the wiring was completed. A diode light source 4 with a characteristic wavelength of 850nm was selected. The modulation signal of signal source 2 was set at the computer host 1. One path of the output modulation signal was used to drive the diode light source 4, and the other path was used to transmit to the signal acquisition end as a synchronous trigger signal. The sampling resistance of the data acquisition end was set to 1MΩ. After the range of the data acquisition end 3 was set, the data was saved after obtaining the complete cycle signal, and the transient photovoltage test was completed.

[0042] Example 7:

[0043] Place the polycrystalline silicon sample in sample chamber 7 and complete the wiring. Select a diode light source 4 with a characteristic wavelength of 850nm. Set the modulation signal of signal source 2 at the computer host 1. One output modulation signal is used to drive the diode light source 4, and the other is used to transmit to the signal acquisition terminal as a synchronous trigger signal. Set the sampling resistor of the data acquisition terminal to 1MΩ. Set the range of the data acquisition terminal 3 to obtain the complete cycle signal and save the data to complete the transient photovoltage test.

[0044] Example 8:

[0045] The indium gallium arsenide sample was placed in the sample chamber 7 and the wiring was completed. A diode light source 4 with a characteristic wavelength of 940nm was selected. The modulation signal of the signal source 2 was set at the computer host 1. One path was used to drive the diode light source 4 to work, and the other path was used to transmit to the signal acquisition end as a synchronous trigger signal. The sampling resistor of the data acquisition end was set to 1MΩ. After the range of the data acquisition end 3 was set, the data was saved after obtaining the complete cycle signal, and the transient photovoltage test was completed.

[0046] Therefore, the photovoltaic device transient photoelectric signal testing system of the present invention adopts the above structure, which is simple in structure, lightweight and small, easy to operate, and can realize the testing of transient photocurrent and transient photovoltage for different samples.

[0047] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the technical solutions of the present invention, and these modifications or equivalent substitutions cannot cause the modified technical solutions to deviate from the spirit and scope of the technical solutions of the present invention.

Claims

1. A transient photoelectric signal testing system for photovoltaic devices, characterized in that: The system includes a computer host, a signal source, a data acquisition terminal, a diode light source, a lens, a reflector, a sample chamber, and a lifting and displacement platform. The computer host is connected to the signal source and the data acquisition terminal. The signal source is connected to the data acquisition terminal. The other side of the data acquisition terminal is connected to the sample chamber. The other side of the signal source is connected to the diode light source. The pulsed light emitted by the diode light source is reflected into the sample chamber through the lens and the reflector. A lifting and displacement platform is provided below the sample chamber. The pulsed light required for the test is generated by the signal source modulating the diode light source.

2. The transient photoelectric signal testing system for photovoltaic devices according to claim 1, characterized in that: The diode light source has wavelengths of 405nm, 520nm, 650nm, 780nm, 850nm, and 940nm, covering the visible to near-infrared band.

3. The transient photoelectric signal testing system for photovoltaic devices according to claim 1, characterized in that: The sample chamber and the data acquisition terminal are connected by a BNC cable.

4. The transient photoelectric signal testing system for photovoltaic devices according to claim 1, characterized in that: The signal source and the data acquisition terminal are controlled by the computer host.

5. The transient photoelectric signal testing system for photovoltaic devices according to claim 1, characterized in that: The lens and the reflector adjust the size of the light spot and the transmission path of the pulsed light emitted by the diode light source.

6. The transient photoelectric signal testing system for photovoltaic devices according to claim 1, characterized in that: The lifting displacement table is a multi-axis displacement table.

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