Fool-proof method for preventing module circuit from being burnt out

Abstract

The invention discloses a fool-proof method for preventing a module circuit from being burnt out, and the method comprises the following steps: 1, selecting two pins which are in symmetrical positions in a connector joint of a test device and are empty pins, namely a first pin and a second pin, enabling the first pin to be connected with an MCU (Microprogrammed Control Unit) of the test device through a circuit, and enabling the second pin to be connected with the MCU of the test device through a circuit; the second pin is kept in an empty pin state; 2, the connector is connected with the display module for testing, only the MCU of the testing device is powered on at the beginning of testing, and the MCU detects the state of the first pin; 3, if the MCU detects that the first pin has the connection signal, the MCU controls the test device to normally start the test; and if the MCU detects that the first pin does not have the connection signal, the MCU controls the test device not to start the test and controls the test device to give an alarm. Product burnout caused by electrification under the condition of wrong connection can be avoided, the implementation cost is low, and operation is convenient.

Description

Technical Field

[0001] This invention relates to the field of display module technology, and in particular to a foolproof method for preventing module circuits from burning out. Background Technology

[0002] In the LCD industry, FPCs are required to connect to terminal devices, typically using BTB or ZIF connectors. During display module testing, even if the connectors are reversed, they may still engage normally. However, this misalignment between the testing device and the display module's wiring will cause the backlight voltage and other auxiliary circuits to power on simultaneously when the testing device is activated. This reversed connection will result in the display module's low-voltage pins being connected to high voltages (5V or 12V), potentially burning out the display module.

[0003] Therefore, existing technologies have shortcomings and need to be improved. Summary of the Invention

[0004] The purpose of this invention is to overcome the shortcomings of the prior art and provide a foolproof method to prevent module circuits from burning out.

[0005] The technical solution of the present invention is as follows: The present invention provides a foolproof method to prevent module circuit burnout, including: Step 1: Select two pins that are symmetrically positioned in the connector of the test device and are both empty pins, namely the first pin and the second pin, and connect the first pin to the MCU of the test device through a line, while keeping the second pin in an empty pin state; Step 2: Connect the connector to the display module for testing. At the beginning of the test, only the MCU of the test device is powered on, and the MCU detects the status of the first pin. Step 3: If the MCU detects a connection signal on the first pin, the MCU controls the test device to start the test normally; if the MCU detects that the first pin does not have a connection signal, the MCU controls the test device not to start the test and controls the test device to alarm.

[0006] Furthermore, in step 3, during normal start-up testing, the MCU controls the voltage bias circuit and auxiliary circuit of the testing device to power on.

[0007] Furthermore, the power-on operation of the voltage bias circuit and auxiliary circuit can only be achieved through MCU control.

[0008] The significance and effect of the present invention by adopting the above solution are as follows: by setting the connector circuit of the test device, the MCU first judges whether the connection status is correct during the test, which can avoid the product burning out due to incorrect connection when powering on, and the implementation cost is low and the operation is convenient. Detailed Implementation

[0009] The present invention will be described in detail below with reference to specific embodiments.

[0010] This invention provides a foolproof method for preventing module circuit burnout, comprising the following: Step 1: Select two pins that are symmetrically positioned in the connector of the test device and are both empty pins, namely the first pin and the second pin. Connect the first pin to the MCU of the test device through a circuit, and keep the second pin empty. Step 2: Connect the connector to the display module, turn on the switch to start the test process. At the beginning of the test, only the MCU of the test device is powered on, and the MCU detects the status of the first pin.

[0011] Step 3: If the MCU detects a connection signal on the first pin, it indicates that the connector connection is normal. The MCU controls the voltage bias circuit and auxiliary circuit of the test device to power on, and the test device starts testing normally. If the MCU detects no connection signal on the first pin, it indicates a connection problem, possibly due to reversed connection. In this case, the MCU controls the test device not to start testing and triggers an alarm.

[0012] It is worth noting that in this solution, when the switch is started to perform the test process, the voltage bias circuit and auxiliary circuit of the test device are not powered on. The power-on action of the voltage bias circuit and auxiliary circuit can only be achieved through MCU control, ensuring that power is only applied when the MCU confirms that the connection is normal. This can effectively avoid burning out the display module in case of abnormal connection. It uses empty pins and does not occupy line resources.

[0013] In summary, this solution, by setting up the connector circuit of the testing device, allows the MCU to determine whether the connection status is correct before testing, which can prevent the product from burning out due to incorrect connection when powered on. It is also low-cost and easy to operate.

[0014] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A foolproof method for preventing module circuit burnout, characterized in that, Includes the following steps: Step 1: Select two pins that are symmetrically positioned and both empty in the connector of the test device, designated as pin 1 and pin 2. Connect pin 1 to the MCU of the test device via a circuit, while pin 2 remains empty. Step 2: Connect the connector to the display module for testing. Initially, only the MCU of the test device is powered on, and the MCU detects the status of pin 1. Step 3: If the MCU detects a connection signal on pin 1, the MCU controls the test device to start the test normally. If the MCU detects no connection signal on pin 1, the MCU controls the test device not to start the test and triggers an alarm.

2. The foolproof method for preventing module circuit burnout according to claim 1, characterized in that, In step 3, during normal start-up testing, the MCU controls the voltage bias circuit and auxiliary circuit of the test device to power on.

3. The foolproof method for preventing module circuit burnout according to claim 2, characterized in that, The power-on operation of the voltage bias circuit and auxiliary circuit can only be achieved through MCU control.