Signal test report generation method and device, equipment, medium and program product
By automatically extracting waveform parameters and generating signal test reports using data conversion rules, the inefficiency caused by manually determining parameters is solved, and efficient and accurate signal test report generation is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHANGHAI EVEX INFORMATION TECHNOLOGY CO LTD
- Filing Date
- 2025-12-24
- Publication Date
- 2026-05-08
AI Technical Summary
Existing signal test reports require manual parameter determination and writing, resulting in low generation efficiency.
By acquiring waveform parameter extraction strategies, signal waveform data, and signal test report templates, the computer automatically extracts parameter data and generates signal test reports according to preset data conversion rules.
It improves the efficiency and accuracy of signal test report generation, reduces manual intervention, and enhances compatibility.
Smart Images
Figure CN121997907A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of data processing technology, and in particular to a method, apparatus, device, medium, and program product for generating signal test reports. Background Technology
[0002] With the continuous development of technology, various electronic devices need to undergo signal testing after research and development to determine whether there are any abnormalities.
[0003] In existing technologies, signal testing typically involves connecting an oscilloscope to an electronic device. Testers observe the waveform of the signal on the oscilloscope, determine the relevant parameters based on their experience, and then write a test report.
[0004] In summary, existing signal test reports require manual parameter determination and writing, resulting in low generation efficiency. Summary of the Invention
[0005] The signal test report generation method, apparatus, device, medium, and program products provided in this application are intended to solve the problem of low generation efficiency caused by the need for manual parameter determination and writing of existing signal test reports.
[0006] In a first aspect, embodiments of this application provide a method for generating a signal test report, including:
[0007] Acquire waveform parameter extraction strategy, signal waveform data, and signal test report template, wherein the signal test report template includes placeholders;
[0008] The signal waveform data is processed by extracting parameters according to the waveform parameter extraction strategy to obtain parameter data. Each parameter data includes a parameter name and an initial parameter value.
[0009] Each parameter data is matched with the signal test report template to obtain the parameter data corresponding to each placeholder;
[0010] For each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder;
[0011] For each placeholder, replace the placeholder in the signal test report template with the target data value corresponding to the placeholder to obtain the signal test report.
[0012] In one possible implementation, the waveform parameter extraction strategy includes:
[0013] Develop a strategy for extracting waveform parameters input by the tester; or,
[0014] Based on the obtained test item identifier and the device under test identifier, the waveform parameter extraction strategy corresponding to the test item identifier and the device under test identifier is obtained from the database.
[0015] In one possible implementation, the matching process between each parameter data and the signal test report template to obtain the parameter data corresponding to each placeholder includes:
[0016] Based on the preset correspondence between placeholders and parameter names, for each placeholder in the signal test report template, determine the target parameter name corresponding to the placeholder;
[0017] If all parameter data includes each target parameter name, for each placeholder, the parameter data of the target parameter name corresponding to the placeholder will be included as the parameter data corresponding to the placeholder.
[0018] In one possible implementation, the matching process between each parameter data and the signal test report template to obtain the parameter data corresponding to each placeholder includes:
[0019] Each parameter data, the signal test report template, and the preset prompt words are input into a preset large language model to obtain the parameter data corresponding to each placeholder; the preset large language model and a pre-trained neural network model that obtains the parameter data corresponding to each placeholder based on the parameter data and the signal test report template.
[0020] In one possible implementation, the preset data conversion rules include unit conversion rules and decimal place conversion rules.
[0021] In one possible implementation, the method further includes:
[0022] For each placeholder, a test result is generated based on the target data value corresponding to the placeholder and a preset threshold range. The test result is used to indicate whether the target data value corresponding to the placeholder is abnormal.
[0023] Fill the signal test report with the test results corresponding to each placeholder.
[0024] In one possible implementation, before processing the initial parameter value in the parameter data corresponding to each placeholder according to a preset data conversion rule to obtain the target data value corresponding to the placeholder, the method further includes:
[0025] For each placeholder, a verification result is generated based on the initial parameter value in the parameter data corresponding to the placeholder and the unit range corresponding to the placeholder. The verification result is used to indicate whether the match is correct.
[0026] For each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder, including:
[0027] If the verification result for each placeholder indicates a correct match, then for each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder.
[0028] Secondly, embodiments of this application provide a signal test report generation apparatus, comprising:
[0029] The acquisition module is used to acquire waveform parameter extraction strategies, signal waveform data, and signal test report templates, wherein the signal test report templates include placeholders.
[0030] The processing module is used to perform parameter extraction processing on the signal waveform data according to the waveform parameter extraction strategy to obtain parameter data, each parameter data including a parameter name and an initial parameter value;
[0031] The processing module is also used to match each parameter data with the signal test report template to obtain the parameter data corresponding to each placeholder;
[0032] The processing module is further configured to process the initial parameter value in the parameter data corresponding to each placeholder according to the preset data conversion rule corresponding to the placeholder, so as to obtain the target data value corresponding to the placeholder.
[0033] The generation module is used to replace each placeholder in the signal test report template with the target data value corresponding to the placeholder, thereby obtaining a signal test report.
[0034] Thirdly, embodiments of this application provide an electronic device, including:
[0035] Processor, memory, communication interface;
[0036] The memory is used to store the executable instructions of the processor;
[0037] The processor is configured to execute the signal test report generation method according to any one of the first aspects by executing the executable instructions.
[0038] Fourthly, embodiments of this application provide a readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the signal test report generation method described in any one of the first aspects.
[0039] Fifthly, embodiments of this application provide a computer program product, including a computer program, which, when executed by a processor, is used to implement the signal test report generation method described in any of the first aspects.
[0040] The signal test report generation method, apparatus, device, medium, and program product provided in this application embodiment extract parameters from acquired signal waveform data according to an acquired waveform parameter extraction strategy to obtain parameter data. Then, each parameter data is matched with a signal test report template to obtain parameter data corresponding to each placeholder in the signal test report template. Based on a preset data conversion rule corresponding to the placeholder, the initial parameter values in the parameter data corresponding to the placeholder are processed to obtain the target data values corresponding to the placeholders. Finally, each placeholder in the signal test report template is replaced with its corresponding target data value to obtain the signal test report. This solution extracts parameter data, determines the target data value corresponding to each placeholder, and replaces the placeholders in the signal test report template with the target data values to obtain the signal test report, eliminating the need for manual parameter determination and writing, thus improving generation efficiency. Attached Figure Description
[0041] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.
[0042] Figure 1 A flowchart illustrating an embodiment of the signal test report generation method provided in this application;
[0043] Figure 2 A flowchart illustrating Embodiment 2 of the signal test report generation method provided in this application;
[0044] Figure 3 This is a schematic diagram of the structure of an embodiment of the signal test report generation device provided in this application;
[0045] Figure 4 This is a schematic diagram of the structure of an electronic device provided in this application.
[0046] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation
[0047] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.
[0048] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a particular order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.
[0049] With the continuous development of technology, various electronic devices need to undergo signal testing after research and development to determine whether there are any abnormalities.
[0050] In existing technologies, signal testing typically involves connecting an oscilloscope to electronic equipment. Testers observe the waveform of the signal on the oscilloscope, determine the relevant parameters based on their experience, and then write a test report. Because this requires manual parameter determination and report writing, it leads to low efficiency.
[0051] To address the problems existing in the prior art, the inventors, during their research on signal test report generation methods, discovered that to improve the generation efficiency, signal waveform data can be extracted using a waveform parameter extraction strategy to obtain parameter data. Then, each parameter data is matched with a signal test report template to obtain the parameter data corresponding to each placeholder in the template. Based on the preset data conversion rules corresponding to the placeholders, the initial parameter values in the placeholder-corresponding parameter data are processed to obtain the target data values. Finally, each placeholder in the signal test report template is replaced with its corresponding target data value to obtain the signal test report. Based on the above inventive concept, the signal test report generation scheme of this application was designed.
[0052] The execution subject of the signal test report generation method in this application can be a computer, a server, a terminal device, etc. This application does not limit it. The following description uses a computer as an example.
[0053] The following provides examples illustrating the application scenarios of the signal test report generation method provided in this application.
[0054] For example, in this application scenario, testers need to test the device under test to generate a signal test report. The testers connect the device under test to an oscilloscope, and the oscilloscope collects signal waveform data during the operation of the device under test.
[0055] The oscilloscope sends the signal waveform data to the computer, and the tester inputs the signal test report template and waveform parameter extraction strategy into the computer.
[0056] The computer performs parameter extraction processing on the signal waveform data according to the waveform parameter extraction strategy to obtain parameter data. Each parameter data includes a parameter name and an initial parameter value.
[0057] Then, each parameter data and signal test report template are matched to obtain the parameter data corresponding to each placeholder; for each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder.
[0058] Finally, for each placeholder, replace the placeholder in the signal test report template with the target data value corresponding to that placeholder to obtain the signal test report.
[0059] The computer displays the signal test report through a user graphical interface, allowing testers to determine whether the device under test has any abnormalities based on the test report.
[0060] It should be noted that the above scenario is only an example of an application scenario provided by the embodiments of this application. The embodiments of this application do not limit the actual form of the various devices included in the scenario, nor do they limit the interaction method between devices. In the specific application of the solution, it can be set according to actual needs.
[0061] The technical solution of this application will now be described in detail through specific embodiments. It should be noted that the following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments.
[0062] Figure 1This is a flowchart illustrating an embodiment of the signal test report generation method provided in this application. This embodiment describes how a computer extracts parameter data from signal waveform data, obtains the target data value corresponding to each placeholder in the signal test report template, and then replaces the placeholders with the target data value to obtain the signal test report. The method in this embodiment can be implemented through software, hardware, or a combination of both. Figure 1 As shown, the method for generating this signal test report specifically includes the following steps:
[0063] S101: Obtain waveform parameter extraction strategy, signal waveform data and signal test report template.
[0064] In this step, in order to generate a signal test report, the computer needs to obtain the waveform parameter extraction strategy, signal waveform data, and signal test report template.
[0065] In one implementation, the computer can acquire the waveform parameter extraction strategy by having the tester input the waveform parameter extraction strategy into the computer, and then the computer can acquire the waveform parameter extraction strategy input by the tester.
[0066] In another implementation, the computer can obtain the waveform parameter extraction strategy by retrieving the waveform parameter extraction strategy corresponding to the test item identifier and the device under test identifier from the database.
[0067] The database contains the correspondence between test project identifiers and device under test identifiers and waveform parameter extraction strategies. Testers can input the test project identifier and device under test identifier into the computer, and the computer can obtain the test project identifier and device under test identifier, and then obtain the corresponding waveform parameter extraction strategy from the database.
[0068] It should be noted that signal waveform data can be non-image files such as CSV, WFM, and MAT files, or image files.
[0069] It should be noted that the signal test report template includes placeholders.
[0070] For example, a signal test report template could be: peak value of the voltage signal is A, valley value is B, and duty cycle is C. Please promptly determine if there are any abnormalities in the electronic equipment based on the test report.
[0071] In this document, A, B, and C are placeholders. This application does not limit the signal test report template and placeholders; they can be determined based on actual circumstances.
[0072] S102: Perform parameter extraction processing on the signal waveform data according to the waveform parameter extraction strategy to obtain parameter data.
[0073] In this step, after the computer obtains the waveform parameter extraction strategy, signal waveform data, and signal test report template, in order to determine the parameters required for the signal test report template, it performs parameter extraction processing on the signal waveform data according to the waveform parameter extraction strategy to obtain parameter data. Each parameter data includes a parameter name and an initial parameter value.
[0074] In one implementation, when the signal waveform data is not an image file, the waveform parameter extraction strategy includes a waveform point extraction strategy and a sub-strategy corresponding to each parameter name.
[0075] When the signal waveform data is not an image file, it includes waveform point data, which includes the acquisition time and the acquired data value. Therefore, waveform point data can be extracted from the signal waveform data according to a waveform point extraction strategy. Then, for each parameter name, the waveform point data is processed according to the sub-strategy corresponding to that parameter name to obtain the initial parameter value corresponding to that parameter name. The parameter name and its corresponding initial parameter value constitute the parameter data.
[0076] For example, when the signal waveform data is in CSV format, the signal waveform data includes a column for acquisition time and a column for acquisition data value. The corresponding reading method, namely the waveform point extraction strategy, such as pd.read_csv(), can be used to extract the waveform point data.
[0077] When the signal waveform data is in .mat format, you can use the corresponding reading method, that is, the waveform point extraction strategy, such as scipy.io.loadmat(), to extract the waveform point data.
[0078] When the parameter name is high-level voltage, the corresponding sub-strategy is: use the collected data value that is greater than the preset high-level threshold as the initial parameter value.
[0079] When the parameter name is low-level voltage, the corresponding sub-strategy is: use the collected data value that is less than the preset low-level threshold as the initial parameter value.
[0080] When the parameter name is peak voltage, the corresponding sub-strategy is as follows: Sort the waveform point data from morning to evening according to the acquisition time to obtain a waveform point sequence; for each waveform point data in the waveform point sequence, if there are a preset number of waveform point data before and after the waveform point data, the waveform point data is used as the candidate waveform point data; for each candidate waveform point data, if the acquired data value in the candidate waveform point data is greater than the preset peak threshold, and the acquired data value in the candidate waveform point data in the waveform point sequence is greater than or equal to the acquired data value in the preset number of waveform point data before it, and greater than or equal to the acquired data value in the preset number of waveform point data after it, then the acquired data value in the candidate waveform point data is used as the initial parameter value.
[0081] It should be noted that the preset high-level threshold can be 2.3V, 2.5V, 2.8V, etc., the preset low-level threshold can be 0.3V, 0.5V, 0.7V, etc., the preset quantity can be 4, 5, 6, etc., and the peak threshold can be 2.8V, 3V, 3.2V, etc. This application embodiment does not limit the preset high-level threshold, preset low-level threshold, preset quantity, peak threshold, etc., and can be determined according to the actual situation.
[0082] It should be noted that the embodiments of this application do not limit the waveform point extraction strategy and sub-strategy, which can be determined according to the actual situation.
[0083] In one implementation, when the signal waveform data is an image file, the image file includes parameter names and their corresponding initial parameter values, as well as the waveform. The waveform parameter extraction strategy is to convert the image file into a grayscale image, then perform noise reduction and binarization processing, and then use the Optical Character Recognition (ORC) method to process it to obtain the parameter data.
[0084] S103: Match each parameter data with the signal test report template to obtain the parameter data corresponding to each placeholder.
[0085] In this step, after the computer obtains the parameter data, it matches each parameter data with the signal test report template to obtain the parameter data corresponding to each placeholder.
[0086] In one implementation, based on a preset correspondence between placeholders and parameter names, the target parameter name corresponding to each placeholder in the signal test report template is determined.
[0087] For example, placeholder A corresponds to peak voltage; placeholder B corresponds to valley voltage; and placeholder C corresponds to duty cycle. This application does not limit the correspondence between placeholders and parameter names; it can be determined according to actual circumstances.
[0088] If all parameter data includes each target parameter name, for each placeholder, the parameter data of the target parameter name corresponding to that placeholder will be included as the parameter data corresponding to that placeholder.
[0089] It should be noted that if there is at least one target parameter name that is not in all parameter data, an alarm message will be output to prompt the tester that the signal test report template is incorrect.
[0090] In another implementation, each parameter data, signal test report template, and preset prompt words are input into a preset large language model to obtain the parameter data corresponding to each placeholder.
[0091] The preset large language model and the pre-trained neural network model, based on parameter data and signal test report templates, obtain the parameter data corresponding to each placeholder.
[0092] For example, the default prompt is: Please match the placeholder in the signal test report template with the parameter data.
[0093] This application does not limit the preset prompt words, which can be determined according to the actual situation.
[0094] S104: For each placeholder, according to the preset data conversion rule corresponding to the placeholder, process the initial parameter value in the parameter data corresponding to the placeholder to obtain the target data value corresponding to the placeholder.
[0095] In this step, after the computer determines the parameter data corresponding to each placeholder, since the number of decimal places and units of the data required by the signal test report template are different from the initial parameter values in the parameter data, for each placeholder, the initial parameter values in the parameter data corresponding to the placeholder are processed according to the preset data conversion rules corresponding to the placeholder to obtain the target data value corresponding to the placeholder.
[0096] The preset data conversion rules include unit conversion rules and decimal point conversion rules. First, the initial parameter value is converted to a unit according to the unit conversion rules to obtain the unit-converted data value. Then, the number of decimal places in the unit-converted data value is adjusted according to the decimal point conversion rules to obtain the target data value.
[0097] For example, in the parameter data corresponding to the placeholder, the parameter name is peak voltage. The unit conversion rule for this placeholder is: convert the unit of the initial parameter value to V. The decimal point conversion rule for this placeholder is: adjust the decimal point of the unit-converted data value to 3 digits.
[0098] The parameter name in the parameter data corresponding to the placeholder is frequency. The unit conversion rule for this placeholder is to convert the unit of the initial parameter value to kHz. The decimal point conversion rule for this placeholder is to adjust the decimal point of the unit-converted data value to 0 places.
[0099] It should be noted that the embodiments of this application do not limit the unit conversion rules and the decimal point conversion rules, which can be determined according to the actual situation.
[0100] It should be noted that after the computer obtains the parameter data corresponding to each placeholder, it can generate a verification result for each placeholder based on the initial parameter value in the parameter data corresponding to that placeholder and the unit range corresponding to that placeholder. The verification result is used to indicate whether the match is correct.
[0101] In other words, if the unit of the initial parameter value is within the unit range, a verification result indicating a correct match is generated; if the unit of the initial parameter value is not within the unit range, a verification result indicating an incorrect match is generated.
[0102] If the verification result for each placeholder indicates a correct match, then for each placeholder, the initial parameter value in the parameter data corresponding to that placeholder is processed according to the preset data conversion rule corresponding to that placeholder to obtain the target data value corresponding to that placeholder.
[0103] If the verification result corresponding to a placeholder indicates an incorrect match, an alarm message will be output to prompt the tester to extract the anomaly.
[0104] For example, the initial parameter value in the parameter data corresponding to the placeholder is 3V, and the unit range corresponding to the placeholder is {kV, V, mV}, generating a verification result indicating that the match is correct.
[0105] The initial parameter value in the parameter data corresponding to the placeholder is 2V, and the unit range corresponding to this placeholder is {Hz, kHz, MHz}. A verification result indicating an incorrect match is generated.
[0106] The embodiments of this application do not limit the scope of units, which can be determined according to the actual situation.
[0107] S105: For each placeholder, replace the placeholder in the signal test report template with the target data value corresponding to the placeholder to obtain the signal test report.
[0108] In this step, after the computer obtains the target data value corresponding to each placeholder, it replaces the placeholder in the signal test report template with the target data value corresponding to that placeholder to obtain the signal test report.
[0109] It should be noted that a correspondence can be established between the signal test report and the signal waveform data and stored so that testers can accurately obtain the corresponding signal waveform data when reviewing the test report later.
[0110] It should be noted that the computer can also generate and store logs after generating the signal test report.
[0111] The signal test report generation method provided in this embodiment extracts parameters from the acquired signal waveform data according to an acquired waveform parameter extraction strategy to obtain parameter data. Then, each parameter data is matched with a signal test report template to obtain parameter data corresponding to each placeholder in the signal test report template. Based on the preset data conversion rules corresponding to the placeholders, the initial parameter values in the parameter data corresponding to the placeholders are processed to obtain the target data values corresponding to the placeholders. Finally, each placeholder in the signal test report template is replaced with its corresponding target data value to obtain the signal test report. This solution extracts parameter data, determines the target data value corresponding to each placeholder, and replaces the placeholders in the signal test report template with the target data values to obtain the signal test report. This eliminates the need for manual parameter determination and writing, improving the generation efficiency and accuracy of signal test reports. Furthermore, this solution can process signal waveform data of various formats, improving compatibility.
[0112] Figure 2 This is a flowchart illustrating a second embodiment of the signal test report generation method provided in this application. Based on the above embodiments, this application describes how the computer determines the test result corresponding to each placeholder. For example... Figure 2 As shown, the method for generating this signal test report specifically includes the following steps:
[0113] S201: For each placeholder, generate the test result corresponding to that placeholder based on the target data value and the preset threshold range.
[0114] In this step, after the computer generates a signal test report, in order to determine whether the target data value is abnormal, it is necessary to generate a test result for each placeholder based on the target data value corresponding to the placeholder and the preset threshold range. The test result is used to indicate whether the target data value corresponding to the placeholder is abnormal.
[0115] If the target data value falls within the preset threshold range, a test result indicating that the target data value corresponding to the placeholder is normal is generated; if the target data value does not fall within the preset threshold range, a test result indicating that the target data value corresponding to the placeholder is abnormal is generated.
[0116] For example, when the parameter name corresponding to the placeholder is pulse width, the preset threshold range is 0-10 microseconds; when the parameter name corresponding to the placeholder is voltage rise time, the preset threshold range is 5 nanoseconds to positive infinity; and when the parameter name corresponding to the placeholder is peak voltage, the preset threshold range is 4-6V.
[0117] This application does not limit the preset threshold range; it can be determined according to the actual situation.
[0118] 202: Fill the signal test report with the test results corresponding to each placeholder.
[0119] In this step, after the computer obtains the test results corresponding to each placeholder, it fills the signal test report with the test results corresponding to each placeholder.
[0120] It should be noted that the computer can also generate signal test results and populate the signal test report based on the test results corresponding to each placeholder. If the test results corresponding to each placeholder indicate that the target data value is normal, a signal test result indicating that the test has passed is generated; if the test results corresponding to some placeholders indicate that the target data value is abnormal, a signal test result indicating that the test has failed is generated.
[0121] The signal test report generation method provided in this embodiment determines whether the target data value is abnormal by using the target data value and a preset threshold range, thereby improving the test accuracy.
[0122] The following are embodiments of the apparatus described in this application, which can be used to execute the embodiments of the method described in this application. For details not disclosed in the apparatus embodiments of this application, please refer to the embodiments of the method described in this application.
[0123] Figure 3 This is a schematic diagram of an embodiment of the signal test report generation device provided in this application. Figure 3 As shown, the signal test report generation device 30 includes:
[0124] The acquisition module 31 is used to acquire waveform parameter extraction strategies, signal waveform data, and signal test report templates. The signal test report templates include placeholders.
[0125] Processing module 32 is used for:
[0126] The signal waveform data is processed by extracting parameters according to the waveform parameter extraction strategy to obtain parameter data. Each parameter data includes a parameter name and an initial parameter value.
[0127] Each parameter data and signal test report template are matched to obtain the parameter data corresponding to each placeholder;
[0128] For each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder;
[0129] The generation module 33 is used to replace the placeholder in the signal test report template with the target data value corresponding to the placeholder for each placeholder, so as to obtain the signal test report.
[0130] Furthermore, module 31 is specifically used for:
[0131] Develop a strategy for extracting waveform parameters input by the tester; or,
[0132] Based on the obtained test item identifier and device under test identifier, the waveform parameter extraction strategy corresponding to the test item identifier and device under test identifier is obtained from the database.
[0133] Furthermore, processing module 32 is specifically used for:
[0134] Based on the preset correspondence between placeholders and parameter names, for each placeholder in the signal test report template, determine the target parameter name corresponding to the placeholder;
[0135] If all parameter data includes each target parameter name, for each placeholder, the parameter data of the target parameter name corresponding to the placeholder will be included as the parameter data corresponding to the placeholder.
[0136] Furthermore, processing module 32 is specifically used for:
[0137] Each parameter data, signal test report template, and preset prompt word are input into the preset large language model to obtain the parameter data corresponding to each placeholder; the preset large language model and the pre-trained neural network model obtain the parameter data corresponding to each placeholder based on the parameter data and signal test report template.
[0138] Furthermore, the preset data conversion rules include unit conversion rules and decimal place conversion rules.
[0139] Furthermore, the processing module 32 is also used for:
[0140] For each placeholder, a test result is generated based on the target data value corresponding to the placeholder and the preset threshold range. The test result is used to indicate whether the target data value corresponding to the placeholder is abnormal.
[0141] Fill the signal test report with the test results corresponding to each placeholder.
[0142] Furthermore, for each placeholder, before processing the initial parameter value in the parameter data corresponding to the placeholder according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder, the processing module 32 is also used for:
[0143] For each placeholder, a validation result is generated based on the initial parameter value in the parameter data corresponding to the placeholder and the unit range corresponding to the placeholder. The validation result is used to indicate whether the match is correct.
[0144] Processing module 32 is specifically used for:
[0145] If the verification result for each placeholder indicates a correct match, then for each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder.
[0146] The signal test report generation device provided in this embodiment is used to execute the technical solution in any of the foregoing method embodiments. Its implementation principle and technical effect are similar, and will not be described again here.
[0147] Figure 4 This is a schematic diagram of the structure of an electronic device provided in this application. Figure 4 As shown, the electronic device 40 includes:
[0148] Processor 41, memory 42, and communication interface 43;
[0149] The memory 42 is used to store the executable instructions of the processor 41;
[0150] The processor 41 is configured to execute the technical solutions in any of the foregoing method embodiments by executing executable instructions.
[0151] Optionally, the memory 42 can be either standalone or integrated with the processor 41.
[0152] Optionally, when the memory 42 is a device independent of the processor 41, the electronic device 40 may further include:
[0153] Bus 44, memory 42 and communication interface 43 are connected to processor 41 through bus 44 and complete communication with each other. Communication interface 43 is used to communicate with other devices.
[0154] Optionally, the communication interface 43 can be implemented using a transceiver. The communication interface is used to enable communication between the database access device and other devices (e.g., clients, read-write databases, and read-only databases). The memory may include random access memory (RAM) and may also include non-volatile memory, such as at least one disk drive.
[0155] Bus 44 can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be categorized as address buses, data buses, control buses, etc. For ease of representation, only one thick line is used in the diagram, but this does not indicate that there is only one bus or one type of bus.
[0156] The processors mentioned above can be general-purpose processors, including central processing units (CPUs), network processors (NPs), etc.; they can also be digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.
[0157] The electronic device is used to execute the technical solutions in any of the foregoing method embodiments. Its implementation principle and technical effect are similar, and will not be described again here.
[0158] This application also provides a readable storage medium storing a computer program thereon, which, when executed by a processor, implements the technical solutions provided in any of the foregoing method embodiments.
[0159] This application also provides a computer program product, including a computer program, which, when executed by a processor, is used to implement the technical solutions provided in any of the foregoing method embodiments.
[0160] Those skilled in the art will understand that all or part of the steps of the above-described method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When executed, the program performs the steps of the above-described method embodiments; and the aforementioned storage medium includes various media capable of storing program code, such as ROM, RAM, magnetic disks, or optical disks.
[0161] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.
Claims
1. A method for generating a signal test report, characterized in that, include: Acquire waveform parameter extraction strategy, signal waveform data, and signal test report template, wherein the signal test report template includes placeholders; The signal waveform data is processed by extracting parameters according to the waveform parameter extraction strategy to obtain parameter data. Each parameter data includes a parameter name and an initial parameter value. Each parameter data is matched with the signal test report template to obtain the parameter data corresponding to each placeholder; For each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder; For each placeholder, replace the placeholder in the signal test report template with the target data value corresponding to the placeholder to obtain the signal test report.
2. The method according to claim 1, characterized in that, The waveform parameter extraction strategy includes: Develop a strategy for extracting waveform parameters input by the tester; or, Based on the obtained test item identifier and the device under test identifier, the waveform parameter extraction strategy corresponding to the test item identifier and the device under test identifier is obtained from the database.
3. The method according to claim 1, characterized in that, The process of matching each parameter data with the signal test report template to obtain the parameter data corresponding to each placeholder includes: Based on the preset correspondence between placeholders and parameter names, for each placeholder in the signal test report template, determine the target parameter name corresponding to the placeholder; If all parameter data includes each target parameter name, for each placeholder, the parameter data of the target parameter name corresponding to the placeholder will be included as the parameter data corresponding to the placeholder.
4. The method according to claim 1, characterized in that, The process of matching each parameter data with the signal test report template to obtain the parameter data corresponding to each placeholder includes: Each parameter data, the signal test report template, and the preset prompt words are input into a preset large language model to obtain the parameter data corresponding to each placeholder; the preset large language model and a pre-trained neural network model that obtains the parameter data corresponding to each placeholder based on the parameter data and the signal test report template.
5. The method according to claim 1, characterized in that, The preset data conversion rules include unit conversion rules and decimal place conversion rules.
6. The method according to any one of claims 1 to 5, characterized in that, The method further includes: For each placeholder, a test result is generated based on the target data value corresponding to the placeholder and a preset threshold range. The test result is used to indicate whether the target data value corresponding to the placeholder is abnormal. Fill the signal test report with the test results corresponding to each placeholder.
7. The method according to any one of claims 1 to 5, characterized in that, Before processing the initial parameter value in the parameter data corresponding to each placeholder according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder, the method further includes: For each placeholder, a verification result is generated based on the initial parameter value in the parameter data corresponding to the placeholder and the unit range corresponding to the placeholder. The verification result is used to indicate whether the match is correct. For each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder, including: If the verification result for each placeholder indicates a correct match, then for each placeholder, the initial parameter value in the parameter data corresponding to the placeholder is processed according to the preset data conversion rule corresponding to the placeholder to obtain the target data value corresponding to the placeholder.
8. A signal test report generation device, characterized in that, include: The acquisition module is used to acquire waveform parameter extraction strategies, signal waveform data, and signal test report templates, wherein the signal test report templates include placeholders. The processing module is used to perform parameter extraction processing on the signal waveform data according to the waveform parameter extraction strategy to obtain parameter data, each parameter data including a parameter name and an initial parameter value; The processing module is also used to match each parameter data with the signal test report template to obtain the parameter data corresponding to each placeholder; The processing module is further configured to process the initial parameter value in the parameter data corresponding to each placeholder according to the preset data conversion rule corresponding to the placeholder, so as to obtain the target data value corresponding to the placeholder. The generation module is used to replace each placeholder in the signal test report template with the target data value corresponding to the placeholder, thereby obtaining a signal test report.
9. An electronic device, characterized in that, include: Processor, memory, communication interface; The memory is used to store the executable instructions of the processor; The processor is configured to execute the signal test report generation method according to any one of claims 1 to 7 by executing the executable instructions.
10. A readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the signal test report generation method according to any one of claims 1 to 7.
11. A computer program product, characterized in that, Includes a computer program, which, when executed by a processor, is used to implement the signal test report generation method according to any one of claims 1 to 7.