Virtual connection fault simulation method, fault simulation module, test method and test system

Abstract

The application relates to a virtual connection fault simulation method, a fault simulation module, a test method and a test system. The fault simulation method comprises the following steps: determining switching reference information corresponding to a target communication link according to the signal type of a signal to be transmitted by the target communication link, wherein the fault simulation switch is adapted to be arranged on a communication link of different signal types under different conditions; and controlling the fault simulation switch to switch on and off according to the switching reference information, so as to simulate the state of the current measured piece when the virtual connection occurs outside.

Description

Technical Field

[0001] This application relates to the field of testing technology, and in particular to a method for simulating virtual connection faults, a fault simulation module, a testing method, and a testing system. Background Technology

[0002] In the field of testing, it is often necessary to connect the test system to the device under test (DUT) so that the test system can inject signals back into the DUT, or conduct test work on the DUT through closed-loop signal communication between the test system and the DUT.

[0003] To achieve testing objectives, fault simulation techniques are often introduced into the external communication links of the device under test (DUT). These simulations can include short-circuit faults, open-circuit faults, and even intermittent connection faults. One approach to simulating intermittent connection faults is to continuously switch a switch connected in series in the communication link to simulate the intermittent nature of such faults.

[0004] However, existing fault simulation modules and fault simulation switches can only be adapted to communication links with a single signal, which has certain limitations. Summary of the Invention

[0005] Therefore, it is necessary to provide a method, module, method and system for simulating virtual connection faults, in order to address the above-mentioned technical problems and overcome the limitations of existing fault simulation modules and switches designed for communication links with a single signal.

[0006] According to a first aspect of this application, a method for simulating virtual connection faults in a communication link is provided, comprising: Based on the signal type of the signal to be transmitted by the target communication link equipped with a fault simulation switch, the on / off switching reference information corresponding to the target communication link is determined. The on / off switching reference information can be used to represent the on / off switching rate of the fault simulation switch. The target communication link is connected between the current device under test and the test component. The fault simulation switch is suitable for being installed on communication links with different signal types under different conditions. Based on the on / off switching reference information, the fault simulation switch is controlled to switch on and off, so as to simulate the state when the current device under test has a loose connection to the outside world through the on / off switching.

[0007] Optionally, the on / off switching reference information includes an interval of on / off switching frequency; the on / off switching frequency corresponding to the target communication link includes a target interval of on / off switching frequency; Based on the signal type of the signal to be transmitted by the target communication link equipped with a fault simulation switch, determine the on / off switching reference information corresponding to the target communication link, including: Based on the signal type of the target communication link and the on / off switching reference information corresponding to each signal type, the on / off switching reference information of the target communication link is determined. The communication rate of each type of communication link is positively correlated with the statistical value of the interval of the on / off switching frequency, wherein the statistical value is any one of the following of the on / off switching frequencies in the corresponding interval: minimum value, maximum value, average value.

[0008] Optionally, the on / off switching reference information of the target communication link includes the target range of the on / off switching frequency of the fault simulation switch; Based on the on / off switching reference information, control the fault simulation switch, including: Obtain the current on / off switching frequency determined by the user within the target range; Obtain the current fault simulation duration determined by the user; When testing the device under test, the fault simulation switch is controlled to switch on and off according to the current on / off switching frequency and the current fault simulation duration.

[0009] Optionally, the signal types may include at least two of the following: CAN bus signals; LIN bus signals; Flexray bus signals; In-vehicle Ethernet signal; Standard Ethernet signal; GMSL signal; LVDS signal; USB signal; DSI signal; PSI signal.

[0010] According to a second aspect of the present invention, a fault simulation module capable of simulating virtual connections is provided, comprising: The first and second communication lines are used to connect between the device under test and the test component to form a corresponding communication link. A fault simulation switch is provided in the first communication line and / or the second communication line; The fault simulation switch is switched on and off in a controlled manner using the virtual connection fault simulation method described in any one of claims 1 to 4.

[0011] According to a third aspect of the present invention, a testing method is provided, using a fault simulation module as described in the second aspect and its alternatives, the testing method comprising: In the case of carrying out the first test task for the first device under test, the fault simulation module is connected between the first device under test and the first test component to form a first communication link. The first communication link is used as the target communication link. The first device under test is tested in the case of simulating a loose connection fault of the first device under test. In the case of carrying out a second test task for the second device under test, the fault simulation module is connected between the second device under test and the first test component or other second test components that are not the first test component to form a second communication link. The first communication link is used as the target communication link. When the device under test is simulated to have a loose connection fault, the first device under test is tested. The first communication link and the second communication link are different types of communication links.

[0012] Optionally, the first communication line and the second communication line of the fault simulation module are connected to the first side of the selective switching device in the first test component; the selective switching device is connected to the channel communication lines of a plurality of channels in the first test component; the plurality of channels include a channel for the first communication link and a channel for the second communication link. The testing method also includes: In the case of carrying out the first test task for the first device under test, the selective connection device is configured to connect the first communication line and the second communication line to the channel communication line used by the first communication link. When conducting a second test task for the second device under test, the selective connection device is switched to a channel communication line that can connect the first communication line and the second communication line to the channel communication line used by the second communication link.

[0013] According to a third aspect of the present invention, a testing system is provided, comprising a testing component and a fault simulation module as described in the second aspect, wherein the testing component is respectively connected to the first communication line and the second communication line.

[0014] Optionally, the test component includes a test processing module and several channels; some of the channels are connected to the fault simulation module and connected to the device under test through the fault simulation module. The channels can form corresponding communication links after being directly or indirectly connected to the device under test.

[0015] Optionally, the first and second communication lines of the fault simulation module are connected to the first side of the selective switching device in the test component; the selective switching device is connected to the channel communication lines of several channels in the test component; the several channels include a channel for the first communication link and a channel for the second communication link; the selective switching device can selectively connect the first and second communication lines to the channel communication lines of channels with different signal types.

[0016] The virtual connection fault simulation method, fault simulation module, test method, and test system provided in this application, because the fault simulation switch is suitable for being installed on communication links of different signal types under different conditions, and the control of the switching frequency of the fault simulation switch needs to be based on the signal type of the signal transmitted by the target communication link with the fault simulation switch installed, can achieve adaptive matching of different switching frequencies under communication links of different signal types, ensuring the adaptability of the virtual connection fault simulation scheme to different signal types, and breaking through the limitation that the fault simulation switch and fault simulation module can only be applied to a single signal type. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of a test device, a fault simulation module and a test component in one embodiment of this application; Figure 2 This is a flowchart illustrating a method for simulating virtual connection faults in one embodiment of this application; Figure 3 This is a schematic diagram of the interface elements for adjusting the switching frequency and fault simulation duration in one embodiment of this application; Figure 4 This is a flowchart illustrating a testing method in one embodiment of this application; Figure 5 This is a schematic diagram of the structure of a test device, a fault simulation module and a test component in another embodiment of this application; Figure 6 This is a schematic diagram of the structure of the fault simulation module in one embodiment of this application. Detailed Implementation

[0019] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings, which illustrate embodiments of the present application. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this application will be thorough and complete.

[0020] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0021] It is understood that the terms “first,” “second,” etc., used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.

[0022] It should be noted that when one element is considered to be "connected" to another element, it can be directly connected to the other element or connected to the other element through an intermediary element. Furthermore, in the following embodiments, "connection" should be understood as "electrical connection," "communication connection," etc., if there is transmission of electrical signals or data between the connected objects.

[0023] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising,” “including,” or “having,” etc., specify the presence of the stated feature, whole, step, operation, component, part, or combination thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof.

[0024] Please refer to Figure 1 This application provides a fault simulation module capable of simulating virtual connections, comprising: Includes: a first communication line and a second communication line, used to connect between the device under test (DUT) and the test component to form a corresponding communication link; the first communication line and the second communication line can be, for example... Figure 1 Line_1 and Line_2 are shown in the diagram.

[0025] Furthermore, the solution of this application can be applied to any communication link that transmits signals through two lines, such as a communication link that can transmit signals in any differential manner.

[0026] In some examples, the first communication line and the second communication line are suitable for transmitting at least two of the following signal types: CAN bus signals; LIN bus signals; Flexray bus signals; In-vehicle Ethernet signal; Standard Ethernet signal; GMSL signal; LVDS signal; USB signal; DSI signal; PSI signal.

[0027] That is, the electrical parameters (such as voltage, current, etc.) of the signals that the first communication line and the second communication line can carry can meet the requirements of at least two of the above signal types.

[0028] To address this, this manual primarily uses CAN bus signals and GMSL signals as examples. The signal transmission rate of CAN bus signals is much lower than that of GMSL signals; GMSL signals can, for example, be used to transmit serialized video data streams. The same principle applies to other signal types.

[0029] Taking a communication link that transmits GMSL signals as an example, the first communication line can be set on the N line, and the second communication line can be set on the P line; taking a communication link that transmits CAN signals as an example, the first communication line can be set on the H line, and the second communication line can be set on the L line. Other signal types that use two lines (such as other differential signals) can be understood in the same way.

[0030] The first communication line and / or the second communication line are equipped with a fault simulation switch, for example Figure 1 The fault simulation switch K shown can refer to a single switch or a combination of switches; that is, it is possible that only the first communication line has a fault simulation switch, or only the second communication line has a fault simulation switch, or both the first and second communication lines have fault simulation switches.

[0031] A single fault simulation module may have only one set of first communication lines and second communication lines, or it may have multiple sets of first communication lines and second communication lines. A single fault simulation module may have only one fault simulation switch, or it may have multiple fault simulation modules.

[0032] The test components involved can be understood as devices or a collection of devices used to achieve signal interaction with the device under test (DUT). In some examples, the test components may include an industrial control computer (ICC) (also described as a real-time machine) and modules. The ICC can communicate with the DUT through a channel, and the fault simulation module can be located between the channel and the DUT. The ICC and the channel can be directly connected or connected through other devices.

[0033] A single channel in a test component can be any of the following: CAN bus channel; LIN bus channel; Flexray bus channel; In-vehicle Ethernet channel; Standard Ethernet channel; GMSL channel; LVDS channel; USB channel; DSI channel; PSI channel.

[0034] The relationship between the communication link, the first communication line, the second communication line, the channel, and the interface of the device under test (DUT) in this specification can be understood as follows: If a fault simulation module is set between the channel and the interface of the DUT, then one end of the first communication line is directly or indirectly (e.g., via a selective switching device) connected to the channel in the test assembly, and the other end of the first communication line is directly or indirectly connected to the interface of the DUT. One end of the second communication line is directly or indirectly (e.g., via a selective switching device) connected to the channel in the test assembly, and the other end of the first communication line is directly or indirectly connected to the interface of the DUT. Thus, the communication link formed can be understood as follows: the interface, the first communication line, the second communication line, and the channel (or the interface, the first communication line, the second communication line, the selective switching device, and the channel, and of course, other wires, interfaces, and other components may also be included) form a communication link between the interface and the channel. If no selective switching device is set between the channel and the interface of the DUT, then the channel, the component used to connect the channel and the interface of the DUT, and the interface of the DUT can form a communication link.

[0035] In addition, for the channels in the test components, each channel usually requires two lines for signal transmission, which can be understood as channel communication lines. Some or all of these channel communication lines can be connected to the first or second communication line after the fault simulation module is connected.

[0036] The fault simulation switch in this application embodiment is switched on and off in a controlled manner using the virtual connection fault simulation method involved in this application embodiment.

[0037] The virtual connection fault simulation method can be implemented by a single execution subject or by multiple execution subjects working together. The execution subjects involved can be at least one of the following: test configuration equipment such as a host computer or remote terminal, a fault simulation module, an industrial control computer, a real-time machine, etc. The real-time machine and the industrial control computer can also be the same device.

[0038] Please refer to Figure 2The communication link virtual connection fault simulation method provided in this application includes: S21: Determine the on / off switching reference information corresponding to the target communication link based on the signal type of the signal to be transmitted by the target communication link equipped with a fault simulation switch; The on / off switching reference information can be used to represent the on / off switching rate of the fault simulation switch. It can be the magnitude of the rate, the range of the rate, or other information related to the rate, such as the period. As long as it can be interpreted and converted into information describing the rate or the rate range, it can be understood as an implementation scheme of the on / off switching reference information; the rate can also be understood as the frequency. The target communication link is connected between the device under test and the test component; it can be understood as the communication link that the corresponding fault simulation switch actually connects to during testing. The fault simulation switch is suitable for being installed on communication links of different signal types under different conditions; thus, under different conditions, it can be used to perform fault simulation on communication links for different signal types, and the switching frequency used will be determined based on the switching reference information of the corresponding signal type. S22: Based on the on / off switching reference information, control the fault simulation switch to switch on / off, so as to simulate the state when the current device under test has a loose connection to the outside through the on / off switching.

[0039] The above steps S21 and S22 can be implemented by the same execution entity or by different execution entities. A single step can be implemented by a single execution entity or by multiple different execution entities.

[0040] A loose connection can be understood as a loose connection at the interface of the device under test (DUT) used to access the corresponding communication line. In practical applications, if a loose connection occurs, it is often at the connection point of the interface, resulting in intermittent signal. The embodiments of this application can simulate this intermittent signal state by switching the on and off of a fault simulation switch, so that the DUT will think that a loose connection fault has occurred due to the intermittent signal. Based on this, the DUT can be tested according to the handling of the DUT when a loose connection fault occurs.

[0041] Therefore, in the above-mentioned solution of this application, since the fault simulation switch is suitable for being installed on communication links of different signal types under different conditions, and the control of the switching frequency of the fault simulation switch needs to be based on the signal type of the signal transmitted by the target communication link with the fault simulation switch, the adaptive matching of different switching frequencies can be achieved under the condition of communication links of different signal types, ensuring the adaptability of the virtual connection fault simulation solution to different signal types, and breaking through the limitation that the fault simulation switch and fault simulation module can only be applied to a single signal type.

[0042] Based on this, since the signal transmission rates of different types of signals may be different (the signal transmission rate can be characterized by the maximum transmission rate), if a higher switching frequency is provided in the communication link for signal types with lower signal transmission rates, it will often not have a significant impact on signal transmission, thus making it impossible to simulate the signal state when a loose connection fault occurs; conversely, if a lower switching frequency is provided in the communication link for signal types with higher signal transmission rates, it may be difficult to distinguish between a loose connection fault and a loose connection fault.

[0043] Meanwhile, configuring a higher switching frequency for communication links with higher transmission rates and a lower switching frequency for lower transmission rates can help ensure that the simulation accuracy of virtual connection faults is adaptable to the transmission rate.

[0044] In one implementation of this objective, the on / off switching reference information includes an interval of on / off switching frequencies; the on / off switching frequency corresponding to the target communication link includes a target interval of on / off switching frequencies. Step S21 may include: Based on the signal type of the target communication link and the on / off switching reference information corresponding to each signal type, the on / off switching reference information of the target communication link is determined. The communication rate of each type of communication link is positively correlated with the statistical value of the interval of the on / off switching frequency, wherein the statistical value is any one of the following of the on / off switching frequencies in the corresponding interval: minimum value, maximum value, average value.

[0045] A positive correlation refers to the same statistical value in two intervals. For example, the lower the communication rate, the smaller the minimum value of the corresponding interval; the lower the communication rate, the smaller the maximum value of the corresponding interval; and the lower the communication rate, the smaller the average value of the corresponding interval.

[0046] In some examples, while satisfying the above relationship, it can also be designed such that, for two communication links with different communication rates (characterized by the maximum communication rate), the maximum value of the interval corresponding to the communication link with the smaller communication rate is less than the minimum value of the interval corresponding to the communication link with the larger communication rate. This ensures the realization of the aforementioned positive correlation statistics.

[0047] In one example, consider a communication link between CAN signals and GMSL signals: If the fault simulation switch is connected to the CAN signal communication link and a dummy connection fault simulation is set, then the frequency range information for on / off switching can be automatically switched to (a1, a2). If the fault simulation switch is connected to the GMSL signal communication link and a dummy connection fault simulation is set, then the frequency range information for switching can be automatically switched to (b1, b2). Since the signal transmission rate of the CAN signal is less than that of the GMSL signal, the above range information can be designed to at least satisfy: a2 < b1. This ensures that a1 is necessarily less than b1, and a2 is necessarily less than b2.

[0048] The aforementioned signal types include at least two of the following: CAN bus signals; LIN bus signals; Flexray bus signals; In-vehicle Ethernet signal; Standard Ethernet signal; GMSL signal; LVDS signal; USB signal; DSI signal; PSI signal.

[0049] In some examples, for communication links with different signal types, if their communication rates are the same or similar, they may also correspond to the same or similar frequency ranges for switching on and off.

[0050] In some embodiments, the on / off switching reference information of the target communication link includes the target range of the on / off switching frequency of the fault simulation switch; Therefore, step S22 may include: S221: Obtain the current on / off switching frequency determined by the user within the target range; S222: Obtain the current fault simulation duration determined by the user; S223: When testing the device under test, the fault simulation switch is controlled to switch on and off according to the current on / off switching frequency and the current fault simulation duration.

[0051] by Figure 3For example, step S221 can be implemented by displaying the target range to the user through the first element in the interactive interface (e.g., the slider and slide rail set for the on / off switching frequency in the figure). The user can select the current on / off switching frequency within the target range by operating the first element. Step S222 can be implemented by displaying the range of duration to the user through the second element in the interactive interface (e.g., the slider and slide rail set for the duration in the figure). The user can select the current fault simulation duration within the range of duration by operating the second element.

[0052] in: For the first element, the two ends of the slide rail in the first element can correspond to the maximum and minimum values ​​of the target range. For example, the mapping relationship or linear expression between each position of the slide rail and the on / off switching frequency value can be pre-designed. Furthermore, for different signal types, since the on / off switching frequency range is different, different mapping relationships or linear expressions will also be used. Thus, when using the same slide rail and slider on the interface, the on / off switching frequency of different ranges can be adjusted.

[0053] For the second element, besides using a slider or track, it can also be implemented using a box for entering the duration value. The specific implementation method is not limited to this. Figure 3 As shown.

[0054] The display and operation of the interactive interface involved (which can also be understood as the process of steps S221 and S222) can be implemented, for example, in a host computer or remote terminal. The implementation of step S223 can be implemented, for example, through an industrial control computer (or real-time machine) in the test component.

[0055] Please refer to Figure 4 This application also provides a testing method using the fault simulation module involved in this application. The testing method includes: S41: When carrying out the first test task for the first device under test, the fault simulation module is connected between the first device under test and the first test component to form a first communication link. The first communication link is used as the target communication link. When simulating a loose connection fault of the first device under test, the first device under test is tested. S42: When carrying out a second test task for the second device under test, the fault simulation module is connected between the second device under test and the first test component or other second test components that are not the first test component to form a second communication link. The first communication link is used as the target communication link. When the device under test is simulated to have a loose connection fault, the first device under test is tested. The first communication link and the second communication link are different types of communication links.

[0056] As can be seen, in the above-mentioned scheme of this application, since the fault simulation switch is suitable for being set on communication links of different signal types under different conditions, and the control of the switching frequency of the fault simulation switch needs to be based on the signal type of the signal transmitted by the target communication link with the fault simulation switch, the adaptive matching of different switching frequencies can be achieved under the condition of communication links of different signal types, ensuring the adaptability of the virtual connection fault simulation scheme to different signal types, and breaking through the limitation that the fault simulation switch and fault simulation module can only be applied to a single signal type.

[0057] Based on this, configuring a higher switching frequency for communication links with higher transmission rates and a lower switching frequency for lower transmission rates can help ensure that the simulation accuracy of virtual connection faults is adaptable to the transmission rate.

[0058] In addition, in some embodiments, the fault simulation module and some or all channels may be located in the same device, such as on the same circuit board, or in different devices.

[0059] In some embodiments, please refer to Figure 5 The first communication line and the second communication line of the fault simulation module are connected to the first side of the selective switching device in the first test component; the selective switching device is connected to the channel communication lines of a plurality of channels in the first test component; the plurality of channels include a channel for the first communication link and a channel for the second communication link. by Figure 5 Taking the example shown, channel 1 can be connected to lines Line_1 and Line_2 via a selective connection device. Thus, channel 1 forms a corresponding communication link with lines Line_1 and Line_2, which can be described as a first communication link. Through the configuration of the selective connection device, it can also be switched so that channel 2 is connected to lines Line_1 and Line_2 via the selective connection device. Thus, channel 2 forms a corresponding communication link with lines Line_1 and Line_2, which can be described as a second communication link. Channel 1 and channel 2 can be channels used to transmit signals of different signal types.

[0060] In addition, in some embodiments, the fault simulation module and the selective switching device may be located in the same device, such as on the same circuit board, or in different devices.

[0061] The testing method also includes: S51: When carrying out a first test task for the first device under test, the selective connection device is configured to connect the first communication line and the second communication line to the channel communication line used by the first communication link. S52: When carrying out a second test task for the second test device, the selective connection device is switched to a channel communication line that can connect the first communication line and the second communication line to the channel communication line used by the second communication link.

[0062] The selective connection device can be understood as any device whose circuitry can freely connect the communication line. For example, it can be implemented using a switch matrix, relay matrix, or FPGA. The selective connection device may include one or more circuit boards containing this circuitry. The selective connection device can be configured for connection under the control of a host computer and / or industrial control computer. It can also be automatically or manually controlled by other devices (such as a host computer or server connected to the electronic system). This control process can be implemented through the host computer or bypass the host computer and directly control the selective connection device through other interfaces of the electronic system.

[0063] Among them, the selective connection device allows users to freely connect the first and second communication lines used for fault simulation to any channel.

[0064] It allows for more flexible wiring of the target object, and can especially improve the processing efficiency when replacing the tested component. It is only necessary to configure the routing mode of the selective connection device according to the connection result. In contrast, for embodiments that do not use the selective connection device, it is necessary to remove the interface of the corresponding communication line of the fault simulation module and reconnect and disconnect the wires, which makes the operation process complicated.

[0065] This application also provides a testing system, including a testing component and a fault simulation module as described in this specification, wherein the testing component is connected to the first communication line and the second communication line respectively.

[0066] Optionally, the test component includes a test processing module and several channels; some of the channels are connected to the fault simulation module and connected to the device under test through the fault simulation module. The channels can form corresponding communication links after being directly or indirectly connected to the device under test.

[0067] Optionally, the first and second communication lines of the fault simulation module are connected to the first side of the selective switching device in the test component; the selective switching device is connected to the channel communication lines of several channels in the test component; the several channels include a channel for the first communication link and a channel for the second communication link; the selective switching device can selectively connect the first and second communication lines to the channel communication lines of channels with different signal types.

[0068] In some embodiments, GMSL fault simulation is used as an example. For the fault simulation module, please refer to... Figure 6 When used for GMSL fault simulation, the first interface of the fault simulation module includes a first P-line interface (e.g., Figure 6 The interface shown (Input_P) and the first N-line interface (e.g.) Figure 6 The interface shown is Input_N); the second interface includes a second P-line interface (e.g., Figure 6 The interface Output_P shown is connected to the second N-line interface (e.g., Figure 6 The interface shown is Output_N); the first P-line interface and the second P-line interface form a P-line, which can be understood as the first communication line; the first N-line interface and the second N-line interface form an N-line, which can be understood as the second communication line.

[0069] Based on this, in order to simulate faults such as loose connections, the fault simulation switch in the fault simulation module includes at least one of the following: The first switch section K1 is connected in series with the N line; The second switch section K2 is connected in series with the P line.

[0070] By continuously switching the first switch K1 on and off, a loose connection fault in the N line can be simulated; by continuously switching the second switch K2 on and off, a loose connection fault in the P line can be simulated.

[0071] In addition, the fault simulation switch connected in series in the circuit can also realize open circuit faults. For example, by opening the first switch section K1, an open circuit fault of the N line can be simulated, and by opening the second switch section K2, an open circuit fault of the P line can be simulated. For example, the first switch section and / or the second switch section can be controlled to open at a specified time during the test process to simulate an open circuit fault for the device under test.

[0072] In some examples, the fault simulation module may include both the first switch section K1 and the second switch section K2. In other examples, the fault simulation module may include only the first switch section K1 or the second switch section K2.

[0073] The first switch section K1 can be implemented using a single switch or multiple switches, and the second switch section K2 can be implemented using a single switch or multiple switches.

[0074] To simulate a short-circuit fault in the power supply, the GMSL fault simulation module includes at least one of the following: The third switch unit K3 is connected between the N line and the designated power supply unit; The fourth switch unit K4 is connected between the P line and the target power supply unit.

[0075] The designated power supply unit and the target power supply unit can be the same power supply unit, which provides power. Alternatively, the designated power supply unit and the target power supply unit can be different power supply units. As long as they can provide power for a short circuit of the power supply, they can be understood as an implementation of the embodiments of this application.

[0076] To accommodate the GMSL fault simulation module's ability to simulate power supply short circuits across different voltage sources and to adapt to various devices under test and testing requirements, some examples provide both an internal power supply and an interface for connecting an external power supply. Please refer to [reference needed]. Figure 6 Specifically: For a given power supply unit, the given power supply unit includes an internal specified power supply and an external specified power supply interface (not shown) for connecting to an external specified power supply; the third switch unit K3 can be selectively connected to the internal specified power supply and the external specified power supply interface; For the target power unit, the target power unit includes an internal target power supply and an external target power interface (not shown) for connecting to an external target power supply; the fourth switch K4 can be selectively connected to the internal target power supply and the external target power interface.

[0077] exist Figure 6 In the example shown, the specified power supply unit and the target power supply unit are the same power supply unit. Therefore, the internal specified power supply and the internal target power supply are as shown in the internal power supply V_internal; the external specified power supply and the external target power supply are as shown in the external power supply V_bat. The external target power supply interface and the external specified power supply interface are the same interface, which can be described as the external power supply interface.

[0078] In some examples, to meet the above requirements, the third switch section K3 can be implemented by switching switches, or it can be formed by combining multiple switches. Similarly, the fourth switch section K4 can be implemented by switching switches, or it can be formed by combining multiple switches.

[0079] In other examples, such as Figure 3As shown, an internal power switch K8 and an external power switch K9 can be provided between the third switch section K3, the internal power supply, and the external power supply, and between the fourth switch section K3, the internal power supply, and the external power supply. The internal power switch K8 can be connected between the fourth switch section K4 and the internal power supply V_internal, and the external power switch K9 can be connected between the third switch section K3 and the external power interface for connecting the external power supply V_bat.

[0080] For the same reason, in order to meet the fault simulation module's requirements for simulating short circuits in different ground resources and to adapt to different devices under test and testing needs, some examples provide both internal ground and an interface for connecting to external ground. Please refer to [reference needed]. Figure 6 Specifically: The sixth switch unit K6 can be selectively connected to the internal ground and the ground resource interface for connecting to the external ground; the seventh switch unit K7 can be selectively connected to the internal ground and the ground resource interface for connecting to the external ground. In some examples, to meet the above requirements, the sixth switch section K6 can be implemented by switching switches, or it can be formed by combining multiple switches. Similarly, the seventh switch section K7 can be implemented by switching switches, or it can be formed by combining multiple switches.

[0081] In other examples, such as Figure 6 As shown, an internal grounding switch K10 and an external grounding switch K11 can be installed between the sixth switch section K6, the internal ground, and the external ground, and between the seventh switch section K7, the internal ground, and the external ground. The internal grounding switch K10 can be connected between the sixth switch section K6 and the internal ground GND_internal, and the external grounding switch K11 can be connected between the seventh switch section K7 and the ground resource interface used to connect the external ground GND_bat.

[0082] The internal power switch K8 and the internal grounding switch K10 can be synchronized, that is, synchronously turned on and off. The external power switch K9 and the external grounding switch K11 can also be synchronized, that is, synchronously turned on and off. In some further examples, in order to facilitate a higher degree of synchronization, the internal power switch K8 and the internal grounding switch K10 can be implemented using single-pole double-throw switches, and the external power switch K9 and the external grounding switch K11 can be implemented using single-pole double-throw switches.

[0083] In some examples, in order to simulate a short-circuit fault between the N line and the P line, the fault simulation module may include a fifth switch unit K5, which is connected between the N line and the P line.

[0084] In some examples, in order to simulate ground faults, the GMSL fault simulation module may include a sixth switch unit K6 connected between the N line and ground; and a seventh switch unit K7 connected between the P line and ground.

[0085] As can be seen, the fault simulation module of this application embodiment can realize the simulation of virtual connection faults, or it is not limited to this type of fault, but can combine the simulation of multiple faults, such as at least one of the following: open circuit faults in the corresponding part of the interface of the device under test, short circuit faults to the power supply, short circuit faults to ground, short circuit faults of the two differential lines of the interface, etc.

[0086] It should be noted that in the existing related technologies, there is currently no fault simulation module that can be used for the communication link of GMSL signals, while the fault simulation module provided in the embodiments of this application can be adapted to realize the fault simulation of the communication link of GMSL signals, which is not limited to the application scenario.

[0087] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0088] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for simulating a virtual interface fault of a communication link, characterized in that, include: Based on the signal type of the signal to be transmitted by the target communication link equipped with a fault simulation switch, the on / off switching reference information corresponding to the target communication link is determined. The on / off switching reference information can be used to represent the on / off switching rate of the fault simulation switch. The target communication link is connected between the current device under test and the test component. The fault simulation switch is suitable for use in communication links with different signal types under different conditions; Based on the on / off switching reference information, the fault simulation switch is controlled to switch on and off, so as to simulate the state when the current device under test has a loose connection to the outside world through the on / off switching.

2. The method for simulating virtual connection faults according to claim 1, characterized in that, The on / off switching reference information includes an interval of on / off switching frequencies; the on / off switching frequency corresponding to the target communication link includes a target interval of on / off switching frequencies; Based on the signal type of the signal to be transmitted by the target communication link equipped with a fault simulation switch, determine the on / off switching reference information corresponding to the target communication link, including: Based on the signal type of the target communication link and the on / off switching reference information corresponding to each signal type, the on / off switching reference information of the target communication link is determined. The communication rate of each type of communication link is positively correlated with the statistical value of the interval of the on / off switching frequency, wherein the statistical value is any one of the following of the on / off switching frequencies in the corresponding interval: minimum value, maximum value, average value.

3. The method for simulating virtual connection faults according to claim 2, characterized in that, The on / off switching reference information of the target communication link includes the target range of the on / off switching frequency of the fault simulation switch; Based on the on / off switching reference information, control the fault simulation switch, including: Obtain the current on / off switching frequency determined by the user within the target range; Obtain the current fault simulation duration determined by the user; When testing the device under test, the fault simulation switch is controlled to switch on and off according to the current on / off switching frequency and the current fault simulation duration.

4. The virtual fault simulation method of claim 2, wherein, Multiple signal types include at least two of the following: CAN bus signals; LIN bus signals; Flexray bus signals; In-vehicle Ethernet signal; Standard Ethernet signal; GMSL signal; LVDS signal; USB signal; DSI signal; PSI signal.

5. A fault simulation module capable of implementing virtual interface simulation, characterized in that, include: The first and second communication lines are used to connect between the device under test and the test component to form a corresponding communication link. A fault simulation switch is provided in the first communication line and / or the second communication line; The fault simulation switch is switched on and off in a controlled manner using the virtual connection fault simulation method described in any one of claims 1 to 4.

6. A test method characterized by, The test method, which uses the fault simulation module of claim 5, includes: In the case of carrying out the first test task for the first device under test, the fault simulation module is connected between the first device under test and the first test component to form a first communication link. The first communication link is used as the target communication link. The first device under test is tested in the case of simulating a loose connection fault of the first device under test. In the case of carrying out a second test task for the second device under test, the fault simulation module is connected between the second device under test and the first test component or other second test components that are not the first test component to form a second communication link. The first communication link is used as the target communication link. When the device under test is simulated to have a loose connection fault, the first device under test is tested. The first communication link and the second communication link are different types of communication links.

7. The test method according to claim 6, characterized in that, The first and second communication lines of the fault simulation module are connected to the first side of the selective switching device in the first test component; the selective switching device is connected to the channel communication lines of several channels in the first test component. The plurality of channels includes a channel for the first communication link and a channel for the second communication link; The testing method also includes: In the case of carrying out the first test task for the first device under test, the selective connection device is configured to connect the first communication line and the second communication line to the channel communication line used by the first communication link. When conducting a second test task for the second device under test, the selective connection device is switched to a channel communication line that can connect the first communication line and the second communication line to the channel communication line used by the second communication link.

8. A test system, characterized by It includes a test component and the fault simulation module as described in claim 5, wherein the test component is connected to the first communication line and the second communication line respectively.

9. The test system of claim 8, wherein, The test component includes a test processing module and several channels; some of the channels are connected to the fault simulation module and are connected to the device under test through the fault simulation module. The channels can form corresponding communication links after being directly or indirectly connected to the device under test.

10. The testing system according to claim 9, characterized in that, The first and second communication lines of the fault simulation module are connected to the first side of the selective switching device in the test component; the selective switching device is connected to the channel communication lines of a plurality of channels in the test component; the plurality of channels include a channel for the first communication link and a channel for the second communication link. The selective connection device can selectively connect the first communication line and the second communication line to the channel communication lines of different signal types.

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