Display screen testing method, electronic device, and computer storage medium
By setting multi-screen configuration attributes and applying stress simultaneously during display testing, the problem of long independent testing times for multiple displays is solved, achieving more efficient testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HONOR DEVICE CO LTD
- Filing Date
- 2024-02-02
- Publication Date
- 2026-06-23
AI Technical Summary
In traditional display testing, testing multiple displays of electronic devices independently results in long testing times and low testing efficiency.
By setting multi-screen configuration attributes, the target display screen to be tested can be flexibly configured, and stress can be applied to multiple display screens at the same time, prompting potential defects to be exposed at an early stage and improving testing efficiency.
While ensuring the quality of potential defect interception, we can save testing time and improve testing efficiency.
Smart Images
Figure CN119252157B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of testing, and more particularly to a display screen testing method, electronic device, and computer storage medium. Background Technology
[0002] Testing the displays of electronic devices, such as through aging tests, can improve the reliability of the devices. The inventors, in implementing the embodiments of this application, discovered that in traditional testing, each display of an electronic device is tested individually as a separate component, resulting in low testing efficiency. For example, if an electronic device includes two displays, performing an aging test on one display separately before the other results in long testing times and low efficiency. Summary of the Invention
[0003] This application provides a display screen testing method, electronic device, and computer storage medium, which solves the problems of long testing time and low testing efficiency in display screen testing.
[0004] Firstly, a display screen testing method is provided, applied to an electronic device, the electronic device including N displays, where N is an integer greater than or equal to 2. The method includes: obtaining the test configuration of the current test scenario; obtaining the multi-screen configuration attribute of the test configuration, the multi-screen configuration attribute being used to indicate the target displays to be tested in the current test scenario; determining M target displays to be tested from the N displays according to the multi-screen configuration attribute, where M is an integer greater than or equal to 2 and M is less than or equal to N; obtaining the screen information of the M target displays; controlling the display of the M target displays according to the screen information of the M target displays; and applying corresponding stress to the displayed M target displays according to the current test scenario.
[0005] By setting multi-screen configuration attributes, corresponding target displays to be tested can be flexibly configured for each test scenario. This allows for the simultaneous configuration of two or more target displays within a test scenario. By controlling the display on these two or more target displays and applying corresponding stress, potential defects in the target displays are accelerated and exposed as early-stage faults. This achieves the goal of discovering and eliminating potential defects, thereby saving testing time and improving testing efficiency while ensuring the quality of potential defect interception.
[0006] In one possible implementation, controlling the display of M target displays based on the screen information of the M target displays includes: controlling the M target displays to display simultaneously based on the screen information of the M target displays; when controlling the M target displays to display simultaneously, applying corresponding stress to the displayed M target displays according to the current test scenario includes: applying corresponding stress to the simultaneously displayed M target displays simultaneously according to the current test scenario.
[0007] It can control the display of two or more target screens under test and simultaneously apply corresponding stress to the two or more target screens under test.
[0008] In one possible implementation, the method further includes: obtaining the total test duration of the test configuration; obtaining the temperature of the electronic device; and controlling the operation of electronic components in the electronic device according to the total test duration when the temperature of the electronic device reaches a preset threshold.
[0009] The testing process can be controlled by temperature regulation to ensure the completion of the display screen test.
[0010] In one possible implementation, controlling the display of the M target displays based on their screen information includes: controlling the display order and duration of the M target displays based on their screen information and test configuration; applying corresponding stress to the M target displays based on the current test scenario includes: applying corresponding stress to the currently displayed target display based on the current test scenario.
[0011] It allows for flexible control of testing on various target displays, and enables adjustment of the display on the target displays based on actual conditions, providing greater freedom.
[0012] In one possible implementation, controlling the display of the M target displays based on their screen information further includes: acquiring the test resources of the current test scenario; and controlling the M target displays to display the images or videos corresponding to the test resources based on their screen information.
[0013] Configure corresponding test resources based on the test scenario. The configured test resources are used to better perform detection and facilitate effective testing.
[0014] In one possible implementation, the screen information includes the physical ID and resolution of the target display screen. Controlling the display screens to show the images or videos corresponding to the test resources based on the screen information of the M target display screens includes: starting the corresponding M target display screens based on their physical IDs; and controlling the started target display screens to display images or videos at the corresponding resolutions.
[0015] In one possible implementation, the method further includes: determining a unique target display screen to be tested among N displays based on multi-screen configuration attributes; obtaining screen information of the unique target display screen; obtaining test resources for the current test scenario; controlling the unique target display screen to display images or videos corresponding to the test resources based on the screen information of the unique target display screen; and applying corresponding stress to the displayed unique target display screen according to the current test scenario.
[0016] In one possible implementation, the electronic device further includes a display driver chip, and each display screen is configured with a corresponding display driver chip; applying corresponding stress to the M target display screens according to the current test scenario includes: applying corresponding electrical stress to the target display screens through the display driver chip according to the current test scenario.
[0017] In a second aspect, an electronic device is provided, the electronic device including a memory and a processor, the memory being connected to the processor, the memory being used to store a computer program, and the processor being used to execute the computer program to implement any of the methods described above.
[0018] Thirdly, a computer storage medium is provided, including computer instructions that, when executed on an electronic device, cause the electronic device to perform any of the methods described above.
[0019] The technical effects achieved by the second and third aspects mentioned above are similar to those achieved by the corresponding technical means in the first aspect, and will not be repeated here. Attached Figure Description
[0020] Figure 1 This is a schematic diagram of the failure rate curve of an electronic product provided in an embodiment of this application.
[0021] Figure 2 This is a schematic diagram of the hardware structure of an electronic device provided in an embodiment of this application.
[0022] Figure 3 This is a schematic diagram of the software structure of an electronic device provided in an embodiment of this application.
[0023] Figure 4 This is a schematic flowchart of a display screen testing method provided in an embodiment of this application.
[0024] Figure 5 This is a schematic flowchart of a target display screen display method provided in an embodiment of this application.
[0025] Figure 6 This is a schematic flowchart of another target display screen display method provided in an embodiment of this application.
[0026] Figure 7This is a schematic diagram of another display screen testing method provided in an embodiment of this application.
[0027] Figure 8 This is a schematic diagram of another display screen testing method provided in an embodiment of this application.
[0028] Figure 9 This is a schematic diagram of a display screen test interface provided in an embodiment of this application. Detailed Implementation
[0029] Understandably, the connection relationships described in this application refer to direct or indirect connections. For example, the connection between A and B can be a direct connection between A and B, or an indirect connection between A and B through one or more other electrical components. For instance, A can be directly connected to C, and C can be directly connected to B, thus enabling a connection between A and B through C.
[0030] It should be noted that the terms "first" and "second" in the specification, claims, and drawings of this application are used to distinguish similar objects, not to describe a specific order or sequence. In the specification, claims, and drawings of this application, unless otherwise stated, " / " indicates "or," for example, A / B can mean A or B. For example, A and / or B can represent: A alone, A and B simultaneously, and B alone. Furthermore, the term "multiple" in the specification, claims, and drawings of this application refers to two or more.
[0031] It should also be noted that the methods disclosed in the embodiments of this application or the methods shown in the flowcharts include one or more steps for implementing the method. Without departing from the scope of the claims, the execution order of multiple steps can be interchanged, and some steps can also be deleted.
[0032] Some embodiments will now be described with reference to the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.
[0033] It is understandable that with the development of electronic technology, electronic devices are becoming increasingly integrated, with more and more processes and more complex manufacturing processes, leading to defects in electronic products, such as latent and obvious defects. Obvious defects can be detected through conventional inspection methods, but latent defects cannot be detected through conventional inspection methods and are eliminated through aging tests. Aging tests apply stress to the product, such as electrical stress and temperature stress, causing latent defects to be exposed more quickly as early failures, thus achieving the purpose of discovering and eliminating latent defects, reducing product return rates, lowering maintenance costs, and improving the user experience.
[0034] Please see Figure 1The failure rate curve of an electronic product is illustrated by example.
[0035] Figure 1 The failure rate curve shown is also known as the bathtub curve for electronic products. In the early failure period, when the electronic product is first used, its failure rate is very high. As the product's operating time increases, the failure rate gradually decreases. Therefore, to shorten the early failure period, the product should undergo trial operation before being put into full-scale operation so that defects can be detected, corrected, and eliminated as early as possible. Ideal test points for aging tests include... Figure 1 As shown in point A, reaching point A ensures that the product defect rate is effectively reduced after aging testing without increasing aging costs.
[0036] As mentioned above, the inventors discovered during the implementation of the embodiments of this application that, for electronic devices including two or more displays, in traditional testing, each display of the electronic device is tested separately as an independent device, which results in long testing time and low testing efficiency.
[0037] In view of this, embodiments of this application provide a display screen testing method and related equipment. By setting multi-screen configuration attributes, corresponding target displays to be tested can be flexibly configured for each test scenario. Thus, two or more target displays to be tested can be configured simultaneously in the test scenario. By applying corresponding stress to the two or more target displays, the potential defects of the target displays are accelerated to be exposed as early faults, thereby achieving the purpose of discovering and eliminating potential defects. This can save testing time and improve testing efficiency while ensuring the interception quality of potential defects.
[0038] The electronic devices provided in this application can be mobile phones, tablets, desktops, laptops, notebook computers, ultra-mobile personal computers (UMPCs), handheld computers, netbooks, personal digital assistants (PDAs), wearable electronic devices, smartwatches, smart screens, and other devices that include two or more displays. This application does not impose any special restrictions on the specific form of the electronic devices.
[0039] Please see Figure 2 This document provides an exemplary embodiment of the hardware structure of an electronic device. The electronic device 100 may include: a processor 110, an external memory interface 120, an internal memory 121, a universal serial bus (USB) interface 130, a charging management module 140, a power management module 141, a battery 142, a wireless communication module 150, a display screen 160, etc.
[0040] Processor 110 may include one or more processing units, such as application processor (AP), modem processor, graphics processing unit (GPU), image signal processor (ISP), controller, memory, video codec, digital signal processor (DSP), baseband processor, and / or neural network processing unit (NPU). These different processing units may be independent devices or integrated into one or more processors.
[0041] The controller can be the nerve center and command center of the electronic device 100. The controller can generate operation control signals according to the instruction opcode and timing signals to complete the control of fetching and executing instructions.
[0042] The processor 110 may also include a memory for storing instructions and data. In some embodiments, the memory in the processor 110 is a cache memory. This memory can store instructions or data that the processor 110 has just used or that are used repeatedly. If the processor 110 needs to use the instruction or data again, it can retrieve it directly from the memory. This avoids repeated accesses, reduces the waiting time of the processor 110, and thus improves the efficiency of the system.
[0043] In some embodiments, the processor 110 may include one or more interfaces. Interfaces may include an I2C interface, an inter-integrated circuit sound (I2S) interface, a pulse code modulation (PCM) interface, a universal asynchronous receiver / transmitter (UART) interface, a mobile industry processor interface (MIPI), a general-purpose input / output (GPIO) interface, a subscriber identity module (SIM) interface, and / or a USB interface, etc.
[0044] It is understood that the interface connection relationships between the modules illustrated in this embodiment are merely illustrative and do not constitute a structural limitation on the electronic device 100. In other embodiments, the electronic device 100 may also employ different interface connection methods or combinations of multiple interface connection methods as described in the above embodiments.
[0045] The charging management module 140 receives charging input from a charger, which can be a wireless charger or a wired charger. While charging the battery 142, the charging management module 140 can also supply power to the electronic device 100 via the power management module 141.
[0046] In some embodiments, when the electronic device 100 is used as a device under test, it can connect to the connection end of the aging power supply through a corresponding charging interface such as USB interface 130 to receive the charging input of the aging power supply.
[0047] The power management module 141 is used to connect the battery 142, the charging management module 140, and the processor 110. The power management module 141 receives input from the battery 142 and / or the charging management module 140 to power the processor 110, internal memory 121, external memory, display screen 160, and wireless communication module 150, etc. In some embodiments, the power management module 141 and the charging management module 140 may also be housed in the same device.
[0048] The wireless communication module 150 can provide wireless communication solutions for use on the electronic device 100, including WLAN (such as Wi-Fi), Bluetooth, Global Navigation Satellite System (GNSS), Frequency Modulation (FM), Near Field Communication (NFC), and Infrared (IR) technologies. For example, in this embodiment, the electronic device 100 can establish a Bluetooth connection with a terminal device (such as a wireless headset) through the wireless communication module 150.
[0049] The wireless communication module 150 may be one or more devices integrating at least one communication processing module. The wireless communication module 150 receives electromagnetic waves via an antenna, performs frequency modulation and filtering of the electromagnetic wave signal, and sends the processed signal to the processor 110. The wireless communication module 150 may also receive signals to be transmitted from the processor 110, perform frequency modulation and amplification on them, and then convert them into electromagnetic waves for radiation via the antenna.
[0050] Electronic device 100 implements display functions through a GPU, a display screen 160, and an application processor. The GPU is a microprocessor for image processing, connecting the display screen 160 and the application processor. The GPU is used to perform mathematical and geometric calculations and for graphics rendering. Processor 110 may include one or more GPUs, which execute program instructions to generate or modify display information.
[0051] The display screen 160 is used to display images, videos, etc. The display screen 160 may include a display panel. The display panel may be a liquid crystal display (LCD), an organic light-emitting diode (OLED), an active-matrix organic light-emitting diode (AMOLED), a flexible light-emitting diode (FLED), a Mini LED, a MicroLED, a Micro-OLED, a quantum dot light-emitting diode (QLED), etc., and this application does not specifically limit its application to these types of displays.
[0052] In some embodiments of this application, when the display panel uses materials such as OLED, AMOLED, and FLED, the above-mentioned Figure 2 The display screen 160 in the device is bendable. Here, "bendable" means that the display screen 160 can be bent to any angle along any axis at any location and can maintain that angle. For example, the display screen 160 can be folded from the middle left to right, or from the middle up to down. In this application, the bendable display screen is referred to as a foldable display screen. The foldable display screen can be a single screen or a display screen composed of multiple screens pieced together; no limitation is made here. The display screen 160 of the electronic device 100 is a flexible screen. Currently, flexible screens are attracting much attention due to their unique characteristics and enormous potential. Compared to traditional screens, flexible screens are highly flexible and bendable, providing users with new interaction methods based on their bendability, and meeting more user needs for electronic devices. For the electronic device 100 equipped with a foldable display screen, the foldable display screen on the electronic device 100 can switch between a small screen in a folded state and a large screen in an unfolded state at any time. Therefore, users are increasingly using the split-screen function on the electronic device 100 equipped with a foldable display screen.
[0053] In this embodiment, the electronic device 100 may include N displays 160, where N is an integer greater than 2. The electronic device 100 may be configured with two or more displays 160 to provide a better display experience for the user. For example, the electronic device 100 may have a foldable screen on the inside and one or more other displays 160 on the outside. Thus, when the electronic device 100 is in the unfolded state, the foldable screen faces the user, providing display functionality. This foldable screen can also be referred to as the inner screen. When the electronic device 100 is in the folded state, the display on the outside (such as simply the outer screen) faces the user, providing display functionality.
[0054] In some embodiments, the display screen 160 may be a touch screen for receiving touches from the user.
[0055] In some embodiments, each display screen 160 may also be configured with a corresponding display driver integrated circuit (DDIC).
[0056] For example, such as Figure 2 As shown, taking the display screen 160 of electronic device 100, which includes an inner screen and an outer screen, as an example, the outer screen can be configured with a display driver chip DDIC-1, and the inner screen can be configured with a display driver chip DDIC-2.
[0057] The external storage interface 120 can be used to connect an external memory card, such as a Micro SD card, to expand the storage capacity of the electronic device 100. The external memory card communicates with the processor 110 through the external storage interface 120 to perform data storage functions. For example, music, video, and other files can be saved on the external memory card.
[0058] Internal memory 121 can be used to store computer executable program code, which includes instructions. Processor 110 executes various functional applications and data processing of electronic device 100 by running the instructions stored in internal memory 121. For example, in this application, processor 110 causes electronic device 100 to execute the display screen testing method provided in this application by running instructions stored in internal memory.
[0059] Internal memory 121 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, universal flash storage (UFS), etc.
[0060] It should be understood that Figure 2The hardware structure of the electronic device 100 shown is merely an example. The electronic device 100 of this application embodiment may have more or fewer components than those shown in the figures, may combine two or more components, or may have different component configurations. The various components shown in the figures may be implemented in hardware, software, or a combination of hardware and software, including one or more signal processing and / or application-specific integrated circuits.
[0061] Furthermore, it should be understood that the electronic device 100 in this application embodiment can achieve different functions by installing different applications. For example, the electronic device 100 can install a test application to perform tests on the electronic device 100, such as aging tests. The test application can be, for example, an aging test application (also called an aging APK) in a product aging test scenario, used to initiate aging tests.
[0062] The software systems of electronic devices can adopt layered architecture, event-driven architecture, microkernel architecture, microservice architecture, or cloud architecture.
[0063] Please see Figure 3 This example illustrates the software structure of an electronic device.
[0064] A layered architecture divides software into several layers, each with a clear role and function. Layers communicate with each other through software interfaces. In some embodiments, the Android system is divided into five layers, from top to bottom: the application layer, the application framework layer, the Android runtime and system libraries, the hardware abstraction layer, the kernel layer, and the hardware layer.
[0065] The application layer can include a series of application packages. For example... Figure 3 As shown, the application package can include applications such as tests, gallery, and video.
[0066] On the production line of electronic devices, testing applications can be used to trigger aging tests on the displays of electronic devices. By applying corresponding stress to the already activated displays (which are the displays to be tested), potential defects in the displays can be brought to light, effectively intercepting electronic devices with early-stage display failures.
[0067] The application framework layer provides application programming interfaces (APIs) and a programming framework for applications in the application layer. The application framework layer includes some predefined functions.
[0068] like Figure 3As shown, the application framework layer may include the window manager service (WMS), display manager service (DMS), content provider, view system, resource manager, notification manager, activity manager, etc.
[0069] The window manager is used to manage windowed applications. It can retrieve screen size, determine the presence of a status bar, lock the screen, and capture screenshots, among other things.
[0070] The display manager manages the lifecycle of an application's display. It can determine how to control its logical display based on the currently connected physical display device, and send notifications to the system and applications when the state changes.
[0071] Content providers store and retrieve data, making that data accessible to applications. This data can include videos, images, audio, phone calls made and received, browsing history and bookmarks, phone books, etc.
[0072] A view system includes visual controls, such as controls for displaying text and controls for displaying images. View systems can be used to build applications. A display interface can include one or more views. For example, a display interface including a text message notification icon can include a view for displaying text and a view for displaying images.
[0073] The file explorer provides applications with various resources, such as localized strings, icons, images, layout files, video files, etc.
[0074] The Android Runtime consists of core libraries and a virtual machine. The Android runtime is responsible for scheduling and managing the Android system.
[0075] The core library consists of two parts: one part is the functionalities that need to be called by the Java language, and the other part is the Android core library.
[0076] The application layer and application framework layer run in a virtual machine. The virtual machine executes the Java files of the application layer and application framework layer as binary files. The virtual machine is used to perform functions such as object lifecycle management, stack management, thread management, security and exception management, and garbage collection.
[0077] System libraries can include multiple functional modules. For example: graphics rendering module, surface manager, surface mixer, asset manager, media libraries, 3D graphics processing library (e.g., OpenGL ES), 2D graphics engine (e.g., SGL), etc.
[0078] The graphics drawing module is responsible for drawing and rendering images before they are displayed on the interface. It can include a drawing management module and a rendering module. The drawing management module can draw graphics on the canvas, meaning it can draw graphics using the CPU. The rendering module can render the drawn images using the GPU.
[0079] The graphics drawing module can call upon 3D graphics processing libraries and 2D graphics engines, etc.
[0080] A 3D graphics processing library can be an Open Graphics Library (OpenGL), used for image rendering and other tasks. A 2D graphics engine can be SGL. A 2D graphics engine is a drawing engine for two-dimensional (2D) graphics. OpenGL refers to a professional graphics programming interface that defines a cross-programming language, cross-platform programming interface specification. It is used for 3D (3-Dimensional) graphics (but can also be 2D), and is a powerful and easy-to-use low-level graphics library. OpenGL ES is a subset of the OpenGL 3D graphics API, designed for embedded devices such as mobile phones and game consoles.
[0081] Surface Flinger is a system service responsible for processing and compositing upper-layer data and interacting with the display. Specifically, it can composite images based on information provided by the WMS (Windows Management System) and submit the composited information to the screen's buffer, waiting for the display to map it onto the screen. Surface Flinger uses either a Hardware Composer (HWC) or the GPU to composite the display layers.
[0082] The Interface Manager manages the display subsystem and provides blending of 2D and 3D layers for multiple applications. The Interface Manager can access the Surface Flinger service, the core of the graphical user interface (GUI), which is responsible for sequentially blending and outputting the graphical data from all applications to a buffer stream.
[0083] The asset manager is used to load resource classes.
[0084] The media library supports playback and recording of various common audio and video formats, as well as still image files. It supports multiple audio and video encoding formats, such as MPEG4, H.264, MP3, AAC, AMR, JPG, and PNG.
[0085] The Hardware Abstraction Layer (HAL) is the interface layer located between the operating system kernel and the hardware circuitry. It provides the operating system with a virtual hardware platform for controlling the operation of hardware devices. Figure 3 As shown, the hardware abstraction layer may include a hardware composer (HWC), production services, a framebuffer, a mouse interface, a keyboard interface, a Bluetooth interface, a GPS interface, a WiFi interface, an audio / video interface, a voice interface, etc.
[0086] The hardware compositor is used to perform the final composite display on the buffered stream of graphics data composed by Surface Flinger.
[0087] HWC can work with SurfaceFlinger to composite the Surface onto the screen. Assuming the electronic device's screen is portrait orientation with the status bar at the top, HWC, being a hardware abstraction of the display controller system, delegates some compositing work to SurfaceFlinger to reduce the GPU load. This consumes less power than compositing solely through the GPU.
[0088] The framebuffer is a graphical buffer stream synthesized by the Surface Flinger service, which draws the application's user interface by writing content to the framebuffer.
[0089] Production services can be used to enable communication between application-level test applications and kernel-level display drivers. For example, during testing, the test application can use production services to transfer test scenarios to the display driver.
[0090] The kernel layer is the layer between hardware and software. It drives the hardware, enabling it to function. The kernel layer includes at least a display driver, screen driver, graphics processing unit (GPU) driver, charge driver, and sensor driver, among others; however, this embodiment does not limit the specific drivers. For example, the screen driver can control whether the screen is on or off.
[0091] The display driver controls the display to map the data synthesized in Surface Flinger onto the screen. Specifically, the display driver drives the display driver chip at the hardware layer to complete the display processing and implementation.
[0092] Charging drivers are used to manage and control the charging process of electronic devices.
[0093] The hardware layer refers to the hardware of the electronic device. The hardware layer may include display driver chips, displays, CPUs, and GPUs.
[0094] It is understood that electronic devices may include two or more displays. Each display may also be equipped with a corresponding display driver chip.
[0095] Understandable, Figure 3 The layers in the illustrated software structure and the components contained in each layer do not constitute a specific limitation on the electronic device. In other embodiments of this application, the electronic device may include more or fewer layers than illustrated, and each layer may include more or fewer components; this application does not impose any limitations.
[0096] It should be noted that, although the embodiments of this application are based on... This system is used as an example for explanation, but its basic principles also apply to systems based on HarmonyOS. or Electronic devices with operating systems, etc.
[0097] The following exemplarily describes a display screen testing method provided in an embodiment of this application, applied to an electronic device. The electronic device may include N displays, where N is an integer greater than or equal to 2. The display screen testing method may include the following steps S41 to S46.
[0098] Please see Figure 4 The present application provides an exemplary description of the display screen testing process.
[0099] Step S41: Obtain the test configuration for the current test scenario.
[0100] In this application embodiment, the electronic device can perform an aging test on the display screen to detect whether there are any abnormalities in the display screen after the aging test, such as detecting whether the display screen has aging phenomena, which may include, but is not limited to: the screen showing different degrees of degradation in terms of detail, color, brightness, etc.
[0101] In this embodiment of the application, test items for aging tests on the display screen can be pre-constructed. Specifically, the test items for aging tests on the display screen can be constructed based on the faults that may occur in the early failure period of the display screen.
[0102] For example, a display screen may exhibit vertical bright and dark lines, thus creating a vertical line test item. When an electronic device performs a vertical line test item, the current test scenario can be determined as a vertical line test scenario. The vertical line test scenario is used to detect whether the display screen exhibits vertical bright and dark lines due to a fault (hardware failure) after applying corresponding stress to the display screen.
[0103] For example, a display screen may exhibit horizontal bright and dark lines, thus creating a horizontal line test item. When an electronic device performs a horizontal line test item, the current test scenario can be determined as a horizontal line test scenario. The horizontal line test scenario is used to detect whether the display screen exhibits horizontal bright and dark lines due to a fault after applying corresponding stress.
[0104] For example, a display screen might exhibit video playback abnormalities, such as being unable to play videos. This leads to the creation of a video playback test scenario. When the electronic device executes the video playback test scenario, the current test scenario can be determined as a video playback test scenario. The video playback test scenario is used to detect whether the display screen can still play videos normally after applying corresponding stress.
[0105] It is understood that the scenario for aging tests on the display screen can be set according to the actual situation, and the corresponding test items can be set according to the actual situation. This application does not make any specific restrictions on this.
[0106] In this application embodiment, each scenario for aging testing of the display screen has its corresponding test configuration. The test configuration is used to indicate the test object and test parameters in the test scenario. The test parameters may include, but are not limited to, test duration, test method, and the state of the test object.
[0107] The test duration can be the test duration for each individual test object or the total test duration for all test objects in the test scenario. The test method can indicate whether to test all test objects simultaneously or sequentially when the number of test objects is greater than or equal to 2. When testing all test objects sequentially, the test method can also indicate the testing order of each test object. The state of the test object includes its display brightness, for example, indicating whether to instruct the test object to display at maximum brightness or minimum brightness.
[0108] Step S42: Obtain the multi-screen configuration attributes of the test configuration. The multi-screen configuration attributes are used to indicate the target display screen to be tested in the current test scenario.
[0109] In this embodiment, the test configuration provides a multi-screen configuration attribute, which indicates the target display screen to be tested in the current test scenario. This multi-screen configuration attribute allows for flexible configuration of corresponding target display screens for each test scenario, improving testing flexibility. Furthermore, this attribute enables the simultaneous configuration of two or more target display screens for a test scenario, thereby saving testing time and improving testing efficiency while ensuring the quality of potential defect interception.
[0110] In this embodiment, the test configuration can be implemented as a configuration file. For example, the electronic device includes an inner screen, an outer screen, and a third screen. The logical id of the inner screen is defined as 0, the logical id of the outer screen as 1, and the logical id of the third screen as 2. A multi-screen configuration attribute is provided in the configuration file, and the value of the multi-screen configuration attribute is of type Byte. The multi-screen configuration attribute corresponding to the inner screen is bit0, the multi-screen configuration attribute corresponding to the outer screen is bit1, and the multi-screen configuration attribute corresponding to the third screen is bit2. For the vertical line test scenario, if the target displays to be tested are determined to be the inner and outer screens, then the Byte values of bit0 for the inner screen and bit1 for the outer screen in the multi-screen configuration attribute are set to 1, indicating that the inner and outer screens are being tested. The bits of other displays in the multi-screen configuration attribute are set to 0, indicating that they are not being tested. Finally, in the vertical line test scenario, the multi-screen configuration attribute mulltiScreen = "cfg = 3" was obtained, where the binary representation of 3 is 00000011. The binary representation "00000011" indicates the bit positions of the inner screen, outer screen, and third screen from right to left, so the Byte values of inner screen bit0 and outer screen bit1 are set to 1.
[0111] Step S43: Determine the M target displays to be tested from the N displays according to the multi-screen configuration attributes, where M is an integer greater than or equal to 2 and less than or equal to N.
[0112] In this embodiment of the application, the electronic device obtains the test configuration under the current test scenario in step S41, and obtains the multi-screen configuration attributes of the test configuration in step S42. Then, in step S43, it can determine the M target displays to be tested among the N displays of the electronic device based on the multi-screen configuration attributes obtained in step S42.
[0113] As in the example above, based on the multi-screen configuration attribute multiScreen="cfg=3", the Byte values of inner screen bit0 and outer screen bit1 can be set to 1. Therefore, the target display screen to be tested among the three displays of the electronic device (inner screen, outer screen and third screen) are the inner screen and the outer screen, respectively.
[0114] Step S44: Obtain screen information from M target displays.
[0115] The screen information may include, but is not limited to: the physical identifier (sensor cell identification, sensor cell id) of the display screen and the resolution of the display screen.
[0116] It is understandable that each display screen has its own unique logical ID and its own unique physical identifier. The logical ID of the same display screen corresponds to its physical identifier.
[0117] The aforementioned physical identification information can also be called physical ID or physical identifier ID information. The physical ID of the display screen can be used by upper-layer applications when calling the device.
[0118] Step S45: Control the display of the M target displays based on the screen information of the M target displays.
[0119] In this embodiment of the application, the electronic device can call the target display screen according to the physical ID number of the target display screen, and thus control the display of the target display screen.
[0120] In this embodiment, the electronic device can control the M target displays to display simultaneously, thereby applying corresponding stress to the M target displays simultaneously. Alternatively, it can first control the display of a portion of the M target displays and apply corresponding stress to that portion, then display the display of another portion of the M target displays and apply corresponding stress to that other portion. This embodiment does not specifically limit the approach in this way.
[0121] In some embodiments, controlling the display of M target displays by the electronic device may further include controlling the state of the target displays, such as controlling the brightness of the target displays. Controlling the display of M target displays by the electronic device may also include controlling the content displayed on the target displays, such as controlling the target displays to display overloaded images.
[0122] Step S46: Apply corresponding stress to the M target displays according to the current test scenario.
[0123] The stress applied to the display screen may include, but is not limited to, electrical stress, temperature stress, humidity stress, etc.
[0124] It is understandable that the required stress can be set according to the test scenario, and this application does not make any specific limitations in this regard.
[0125] In this embodiment of the application, the electronic device can apply corresponding stress to the M target displays according to the current test scenario. That is, in different test scenarios, the target displays being tested may be different, and the applied stress may also be different, such as different types of applied stress or different amounts of applied stress.
[0126] The stress applied to the target display screen can be applied by the electronic device itself or by the electronic device controlling external devices to apply stress to the target display screen.
[0127] Taking the application of temperature stress to a target display screen as an example, electronic devices can place themselves in high-load, high-power scenarios. For instance, the processor may utilize (or frequently utilize) high processing power, increasing its operating frequency and consequently its power consumption, thus raising the temperature of the electronic device and applying temperature stress to its target display screen. Alternatively, electronic devices can communicate with external devices to allow those devices to adjust the temperature of the external environment in which the electronic device operates, thereby applying temperature stress to the target display screen.
[0128] In this embodiment, the electronic device may further include a display driver chip. When the electronic device itself applies a corresponding stress to its target display screen, the electronic device applies a corresponding electrical stress to the target display screen through the display driver chip according to the current test scenario. This electrical stress may include, but is not limited to, voltage and current.
[0129] It is understandable that electrical stress has a significant impact on the reliability of display materials. The lifespan and failure rate of display materials are closely related to the electrical stress they withstand, and reducing the electrical stress can improve their reliability during use. Therefore, by applying corresponding electrical stress to the display, the aging rate of the display materials can be accelerated, allowing for the detection of displays exhibiting aging phenomena.
[0130] In this embodiment of the application, after applying corresponding stress to the M target displays and reaching a preset time (such as test duration) or a preset number of cycles, the target displays can be tested to determine whether the target displays after the aging test are abnormal (such as showing signs of aging).
[0131] For example, after applying corresponding stress to M target displays and reaching a preset time (e.g., test duration) or a preset number of cycles, an electrostatic discharge (ESD) test can be performed on the target displays via a display driver chip, and the ESD test data is stored in the registers of the display driver chip. The processor of the electronic device can read the ESD test data from the registers of the display driver chip via the Mobile Industry Processor Interface (MIPI) protocol, and determine the state of the display based on the read data, thereby judging the result of the display aging test. The test application can display the results of the aging test, such as the results after each test scenario.
[0132] In other embodiments, after applying corresponding stress to the M target displays and reaching a preset time (such as test duration) or a preset number of cycles, technicians can inspect the target displays after the aging test to determine whether there are any abnormalities in the target displays after the aging test.
[0133] In some embodiments, controlling the display of M target displays based on the screen information of the M target displays includes: controlling the M target displays to display simultaneously based on the screen information of the M target displays; when controlling the M target displays to display simultaneously, applying corresponding stress to the displayed M target displays according to the current test scenario includes: applying corresponding stress to the simultaneously displayed M target displays according to the current test scenario.
[0134] As in the example above, the target displays in the current test scenario are identified as the inner screen and the outer screen. Their physical IDs are obtained, and the inner and outer screens are activated based on these IDs to control their simultaneous display. When the inner and outer screens are displayed simultaneously, the stress corresponding to the current test scenario can be applied to both screens.
[0135] In some embodiments, controlling the display of M target displays based on the screen information of the M target displays includes: controlling the display order of the M target displays and controlling the display duration of the target displays based on the screen information of the M target displays and the test configuration; applying corresponding stress to the displayed M target displays according to the current test scenario includes: applying corresponding stress to the currently displayed target display according to the current test scenario.
[0136] As mentioned above, the test configuration can indicate the test method, that is, the order in which the test objects are tested. This order also indicates the order in which the target displays are shown.
[0137] As in the example above, the target displays in the current test scenario are identified as an inner screen and an outer screen. The test configuration can instruct the inner screen to be displayed for half an hour first, followed by the outer screen for half an hour. The electronic device obtains the physical IDs of the inner and outer screens, and activates the inner screen based on its physical ID to control its display for half an hour. While the inner screen is displaying, stress corresponding to the current test scenario can be applied to it. After the inner screen has been displayed for half an hour, it is deactivated and the outer screen is activated to control its display for another half hour. While the outer screen is displaying, stress corresponding to the current test scenario can be applied to it.
[0138] It's understandable that a single target display screen to be tested can be configured through multi-screen configuration attributes. When an electronic device includes two or more displays, the single target display screen to be tested in each test scenario can be flexibly configured based on multi-screen configuration attributes, improving testing flexibility.
[0139] In some embodiments, the screen information of the unique target display screen to be tested among N displays is determined according to the multi-screen configuration attributes, the screen information of the unique target display screen is obtained, the display of the unique target display screen is controlled according to the screen information of the unique target display screen, and the corresponding stress is applied to the unique target display screen according to the current test scenario.
[0140] In some embodiments, a unique target display screen to be tested is determined among N displays based on multi-screen configuration attributes; screen information of the unique target display screen is obtained; test resources of the current test scenario are obtained; based on the screen information of the unique target display screen, the unique target display screen is controlled to display the image or video corresponding to the test resources; and corresponding stress is applied to the displayed unique target display screen according to the current test scenario.
[0141] In some embodiments, please refer to Figure 5 Step S45 may specifically include the following steps:
[0142] Step S51: Obtain the test resources for the current test scenario.
[0143] In this embodiment of the application, when performing aging tests on the display screen, corresponding test resources can be configured for individual test scenarios. These test resources may include, but are not limited to, images and videos. The images can be reloaded images.
[0144] In some embodiments, the test resources may also include applications, such as game applications. For example, in a particular test scenario, the electronic device may be instructed to run a game application so that the display shows the interface of the game application.
[0145] Step S52: Based on the screen information of the M target displays, control the M target displays to display the images or videos corresponding to the test resources.
[0146] In this embodiment of the application, under the current test scenario, the test configuration can indicate the test resources that each target display screen needs to display. For example, it can instruct one part of the target display screens to display images, instruct another part of the display screens to display videos, and instruct M target display screens to display images or videos simultaneously.
[0147] In some embodiments, please refer to Figure 6 Step S52 may specifically include the following steps:
[0148] Step S61: Start the corresponding M target displays according to their physical IDs.
[0149] Step S62: For the target display screen that has been activated, control the target display screen to display an image or video of the corresponding resolution.
[0150] An electronic device may contain N displays with different or the same resolution. When the displays have different resolutions, images or videos of the corresponding resolutions can be displayed on each display. For example, if the inner screen has a resolution of 1280*2800 and the outer screen has a resolution of 1080*2400, then the inner screen can be controlled to display images or videos of the 1280*2800 resolution, and the outer screen can be controlled to display images or videos of the 1080*2400 resolution.
[0151] In some embodiments, please refer to Figure 7 The display screen testing method provided in this application embodiment may further include the following steps:
[0152] Step S71: Obtain the total test duration of the test configuration.
[0153] After obtaining the test configuration for the current test scenario in step S41, the total test duration of that configuration can be obtained. The total test duration indicates the total time required for testing in the current test scenario. If the current test scenario indicates that M target displays are simultaneously displayed, then the total test duration indicates the total time for all M target displays to be displayed simultaneously. If the current test scenario indicates that M target displays are displayed sequentially, then the total test duration indicates the sum of the display times for each of the M target displays.
[0154] Step S72: Obtain the temperature of the electronic device.
[0155] Electronic devices include temperature sensors, which can be used to obtain the temperature of the electronic device.
[0156] Step S73: When the temperature of the electronic device reaches the preset threshold, control the operation of the electronic components in the electronic device according to the total test duration.
[0157] It is understandable that when the temperature of an electronic device reaches a certain value, it will trigger the device to shut down, which will in turn affect the aging test of the target display screen.
[0158] When the temperature of an electronic device reaches a preset threshold, it can be used to indicate that the electronic device is overheating, which may trigger the device to shut down. The preset threshold can be set according to actual conditions, and this application does not impose specific limitations on it.
[0159] The phrase "controlling the operation of electronic devices in electronic devices according to the total test duration" can control the operation of devices such as cameras and graphics processors in electronic devices, as well as the threads or processes running in electronic devices.
[0160] When the temperature of an electronic device reaches a preset threshold, the target display screen can be prioritized, and the operation of other devices, threads, or processes can be shut down or stopped.
[0161] In another embodiment, when the temperature of the electronic device reaches a preset threshold, if the difference between the current test duration and the total test duration exceeds a preset difference, the display of the target screen is prioritized, and the operation of other devices, threads, or processes is shut down or stopped. If the difference between the current test duration and the total test duration does not exceed the preset difference, meaning the aging test of the target screen can be completed before the electronic device is powered off, then the operation of electronic devices, threads, or processes in the electronic device can be left uncontrolled.
[0162] Please see Figure 8 This document provides an exemplary embodiment of a display screen testing method. Taking a test application comprising components, a test queue, a multi-screen management state machine, and a fault triggering module as an example.
[0163] A component is a part of a test application, and it includes the test application's configuration file. The configuration file records the test configuration, including the test configuration for each device. It may also include the test resources required for each test scenario.
[0164] A test queue is middleware used to monitor and manage test tasks, arranging them in chronological order. The test queue records both currently executing and pending test tasks.
[0165] The multi-screen management state machine is used to determine the target display screen based on the current test scenario. It can also be used to control the display on the target display screen.
[0166] The fault triggering module is used to trigger the display driver to apply corresponding stress to the target display screen that is being displayed, based on the current test scenario.
[0167] The display module includes display-related modules in the application layer, hardware abstraction layer, and kernel layer, such as window manager, interface manager, hardware compositor, and display driver.
[0168] Step S801: Start the test application and add the test task to the test queue.
[0169] In this embodiment, the electronic device can be equipped with a testing application. The testing application can be used to perform aging tests on various electronic components of the electronic device. These electronic components may include, but are not limited to, displays, memory, microphones, etc. For each electronic component to be tested, test items for aging tests can be pre-built. The relevant content of the test items can be referred to the above, and will not be repeated here.
[0170] In some embodiments, the electronic device can display individual test items, thereby facilitating user management of the test configuration corresponding to each test item. An example is shown illustrating some test items for aging testing of the display screen. Figure 9 As shown, the electronic device 100 displays a screen aging test interface 900. The screen aging test interface 900 includes a vertical line test item 901, a horizontal line test item 902, and a video playback test item 903. The vertical line test item 901, the horizontal line test item 902, and the video playback test item 903 are used to perform the corresponding vertical line test, horizontal line test, and video playback test, respectively.
[0171] Users can access the test interface by clicking on a test item. The interface displays the test configuration for that test item. Users can then adjust the test configuration, such as changing the test object and test parameters within the test scenario. For example, clicking on the vertical line test item 901 will take the user to its interface, which displays the configured target object, test duration, test method, and brightness of the test object. Users can adjust the content on the vertical line test item interface, such as changing the target object from the inner and outer screens to the inner screen, outer screen, and a third screen.
[0172] In some embodiments, users can select the above test items to control the electronic device to perform the corresponding test items. For example, for aging tests on the display screen, if the user selects only the vertical line test item and the horizontal line test item, then the display screen will undergo vertical line tests and horizontal line tests.
[0173] It is understandable that users can also adjust the devices to be tested and the test items of the devices through the test application, including but not limited to: adding, deleting and modifying.
[0174] Each test item corresponds to a test task. For example, the vertical line test item mentioned above means that when the electronic device executes the vertical line test item, it is performing the vertical line test task, and the current test scenario is the vertical line test scenario.
[0175] After launching the test application, test tasks are created and added to the test queue. In other words, once the electronic device launches the test application, the application creates test tasks based on its internal logic and adds them to the test queue.
[0176] In one exemplary embodiment, when an electronic device is powered on and enters the testing station, the production line system can automatically send a test application start command to the electronic device. Upon receiving the command, the electronic device starts the test application. Taking an aging test application as an example, when the electronic device enters the aging test station, the production line system can automatically send an aging test application start command to the electronic device, and the electronic device starts the aging test application upon responding to the command.
[0177] In another exemplary embodiment, the test application may also be manually started by a tester. In other embodiments, the test application may be started by a robotic arm on the production line. This application does not impose any special limitations on the method of starting the test application.
[0178] Step S802: Retrieve the current test task from the test queue.
[0179] The multi-screen management state machine and fault triggering module retrieve the currently executing test task from the test queue, which is the current test task.
[0180] Step S803: Determine the current test scenario based on the current test task.
[0181] The multi-screen management state machine and fault triggering module determine the current test scenario based on the current test task. For example, if the current test task is a vertical line test task, then the current test scenario is a vertical line test scenario.
[0182] Step S804: Obtain the test configuration and test resources for the current test scenario.
[0183] In this embodiment, the test application's components store configuration files, which include test configurations corresponding to the test items. In some embodiments, the test application's components may also indicate test resources. For example, the configuration file may also include test resources corresponding to the test items. The multi-screen management state machine obtains the test configurations and test resources from the components.
[0184] It is understandable that some test scenarios may not have corresponding test resources configured. Therefore, in step S804, the multi-screen management state machine obtains the test configuration for the current test scenario.
[0185] Step S805: Obtain the multi-screen configuration attributes of the test configuration.
[0186] The multi-screen management state machine retrieves the multi-screen configuration attributes of the test configuration.
[0187] Step S806: Determine the M target displays to be tested from the N displays based on the multi-screen configuration attributes.
[0188] The multi-screen management state machine determines the M target displays to be tested from among the N displays based on the multi-screen configuration attributes.
[0189] The contents of steps S805 and S806 can be referred to in steps S42 and S43 above, and will not be repeated here.
[0190] Step S807: Draw the display data of the target display screen through the display module.
[0191] The test application can control the target display screen through the display module, including but not limited to: controlling the test resources loaded on the target display screen, controlling the display brightness of the target display screen, and controlling the power-on and / or power-off of the target display screen.
[0192] After the test application constructs the target display screen, the content to be displayed on the target display screen, and the state to be displayed on the target display screen according to the current test task being executed, the display module can draw the display data to be displayed on the target display screen as described above, and will not be repeated here.
[0193] Step S808: Transmit display data for each target display screen.
[0194] The display module can draw windows based on the screen information of the target display screen, and can also draw display data of the target display screen based on the test resources, and then transmit the display data of each target display screen to the display driver.
[0195] Step S809: Transmit the current test scenario.
[0196] The fault triggering module transmits the current test scenario to the display driver via the production service.
[0197] Step S810: Control the display of the target display screen according to the display data of each target display screen, and apply corresponding stress to the displayed target display screen according to the current test scenario.
[0198] The display driver controls the display of the target display screens based on the display data of each target display screen, and applies corresponding stress to the target display screens according to the current test scenario.
[0199] In some embodiments, the test application sends the screen information of the target display to be tested to the hardware abstraction layer and the driver layer. The display driver simultaneously applies stresses such as voltage and brightness to the target display corresponding to the received screen information to stimulate potential defects. For example, in a vertical line test scenario: after the upper-layer test application constructs two displays, an inner screen and an outer screen, to simultaneously display the corresponding overloaded image, it uses the interface of the hardware abstraction layer to notify the screen information of the inner and outer screens to be tested, and simultaneously schedules the interface for sending stress, which can achieve the effect of stimulating and intercepting vertical line faults.
[0200] In other embodiments, the display driver can directly apply the stress corresponding to the current test scenario to the target display screen.
[0201] It is understood that the display driver can apply corresponding stress to the target display screen according to the current test scenario. The actual stress applied to the target display screen by the display driver may vary between different manufacturers, and this application does not make any specific limitations on this.
[0202] This application also provides a computer program product that, when run on a computer, causes the computer to perform the aforementioned related steps to implement the testing methods in the above-described method embodiments.
[0203] This application also provides a computer storage medium including computer instructions, which, when executed on an electronic device, cause the electronic device to perform the test method as described in the above embodiments.
[0204] In this application, the electronic device, computer storage medium, computer program product, or charging system provided in the embodiments are all used to execute the corresponding methods provided above. Therefore, the beneficial effects they can achieve can be referred to the beneficial effects in the corresponding methods provided above, and will not be repeated here.
[0205] Through the above description of the embodiments, those skilled in the art can clearly understand that, for the sake of convenience and brevity, only the division of the above functional modules is used as an example. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.
[0206] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another device, or some features may be ignored or not executed. Furthermore, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.
[0207] The unit described as a separate component may or may not be physically separate. The component shown as a unit can be one physical unit or multiple physical units, that is, it can be located in one place or distributed in multiple different places. Some or all of the units can be selected to achieve the purpose of the solution in this embodiment according to actual needs.
[0208] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.
[0209] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium. Based on this understanding, the technical solutions of the embodiments of this application, essentially or in other words, the parts that contribute to the prior art, or all or part of the technical solutions, can be embodied in the form of a software product. This software product is stored in a storage medium and includes several instructions to cause a device (which may be a microcontroller, chip, etc.) or processor to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.
[0210] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions within the technical scope disclosed in this application should be covered within the scope of protection of this application.
Claims
1. A method for testing a display screen, characterized in that, The method is applied to an electronic device, the electronic device including an inner screen and an outer screen, the inner screen being the display screen facing the user when the electronic device is in an unfolded state, and the outer screen being the display screen facing the user when the electronic device is in a folded state, the method comprising: Get the test configuration for the current test scenario; Obtain the multi-screen configuration attributes of the test configuration, wherein the multi-screen configuration attributes are used to indicate the target display screen to be tested in the current test scenario, and the target display screen includes the inner screen and the outer screen; The target display screen to be tested in the inner screen and the outer screen is determined based on the multi-screen configuration attributes; Obtain the screen information of the target display screen, the screen information including the physical ID and resolution of the target display screen; The target display screen is activated based on its physical ID. The target display screen is controlled to display simultaneously according to its resolution; According to the current test scenario, corresponding stresses are simultaneously applied to the target display screens that are displayed at the same time to conduct an aging test on the target display screens.
2. The method as described in claim 1, characterized in that, The method further includes: Obtain the total test duration of the test configuration; Obtain the temperature of the electronic device; When the temperature of the electronic device reaches a preset threshold, the operation of the electronic components in the electronic device is controlled according to the total test duration, so as to prioritize the display of the target screen.
3. The method as described in claim 1 or 2, characterized in that, The step of controlling the corresponding target display screen to display simultaneously according to the resolution of the target display screen includes: Obtain the test resources for the current test scenario; Based on the resolution of the target display screen, control the target display screen to simultaneously display the image or video corresponding to the test resource.
4. The method as described in claim 1 or 2, characterized in that, The electronic device further includes a display driver chip, and the inner screen and the outer screen are configured with corresponding display driver chips; The step of simultaneously applying corresponding stress to the target display screens displayed simultaneously according to the current test scenario includes: Based on the current test scenario, the display driver chip simultaneously applies corresponding electrical stress to the target display screen that is being displayed at the same time.
5. An electronic device, characterized in that, The electronic device includes a memory and a processor, the memory being connected to the processor, the memory being used to store a computer program, and the processor being used to execute the computer program to implement the method as described in any one of claims 1 to 4.
6. A computer storage medium, characterized in that, Includes computer instructions that, when executed on an electronic device, cause the electronic device to perform the method as described in any one of claims 1 to 4.