Test method of power module, data processing method and power module management system

Abstract

The application relates to a power module test method, a data processing method and a power module management system. The power module test method comprises the following steps: in response to an automatic test instruction for a power module, determining each test item of the power module and a test sequence of each test item; according to the test sequence, sequentially testing the power module according to a test strategy matched with each test item to obtain a module test result of the power module; and based on a module identifier of the power module, sending the module test result to a data management subsystem for data storage, and the data management subsystem is used for performing full-life-cycle data management on the power module. The method can improve the automation degree and systematicness of a power module test process.

Description

Technical Field

[0001] This application relates to the field of power electronic equipment testing technology, and in particular to a power module testing method, a power module data processing method, an apparatus, a computer device, a storage medium, a computer program product, and a power module management system. Background Technology

[0002] A Static Var Generator (SVG) is a dynamic reactive power compensation device based on power electronics technology. It can quickly and accurately adjust the reactive power in the power grid to improve power quality, stabilize voltage, and enhance system operating efficiency. The power module is the core component of the reactive power compensation device in a power electronic system, and its hardware performance and operational stability directly determine the reliability of the SVG system.

[0003] Currently, performance testing of power modules in the industry is usually carried out manually by testers who manually test and record data. This is not only inefficient, but also prone to inaccurate test results due to operational errors, which can lead to hardware damage risks. Therefore, current power module testing and management suffer from fragmented test data and high reliance on manual labor. Summary of the Invention

[0004] Therefore, it is necessary to provide a power module testing method, power module data processing method, apparatus, computer equipment, storage medium, computer program product, and power module management system that can improve the automation and systematic nature of the power module testing process, in response to the above-mentioned technical problems.

[0005] Firstly, this application provides a testing method for a power module, applied to a module testing subsystem, the method comprising:

[0006] In response to automated test instructions for the power module, determine the test items for the power module and the test order for each test item;

[0007] According to the test order, the power module is tested sequentially according to the test strategy that matches each test item, and the module test results of the power module are obtained.

[0008] Based on the module identifier of the power module, the module test results are sent to the data management subsystem for data storage. The data management subsystem is used to perform full lifecycle data management of the power module.

[0009] Secondly, this application also provides a data processing method for a power module, applied to a data management subsystem, wherein the data management subsystem stores module test results of the power module, the module test results being obtained by an automated testing subsystem of the power module; the method includes:

[0010] In response to a full-cycle traceability command for the power module, the module identifier of the power module is obtained;

[0011] Based on the module identifier, obtain the module test results of the power module at each stage of its life cycle;

[0012] The test results of each module are sorted according to the phase order of each life stage to obtain a module test result sequence;

[0013] Based on the sequence of test results of the module, a traceability query page for the power module throughout its entire life cycle is generated and displayed; the traceability query page for the entire life cycle includes the test results of each item obtained by the power module in each of the life stages.

[0014] Thirdly, this application also provides a testing apparatus for a power module. The apparatus includes:

[0015] The instruction response module is used to respond to automated test instructions for the power module, and to determine the test items of the power module and the test order of the test items.

[0016] The project testing module is used to perform project tests on the power module sequentially according to the test order and the test strategy matched with each of the test items, so as to obtain the module test results of the power module.

[0017] The data storage module is used to send the test results of the power module to the data management subsystem for data storage based on the module identifier of the power module. The data management subsystem is used to perform full life cycle data management of the power module.

[0018] Fourthly, this application also provides a data processing apparatus for a power module. The apparatus includes:

[0019] The identifier acquisition module is used to acquire the module identifier of the power module in response to a full-cycle traceability command for the power module.

[0020] The test result acquisition module is used to acquire the module test results of the power module at each stage of its life cycle based on the module identifier.

[0021] The result sorting module is used to sort the test results of each module according to the stage order of each life stage to obtain a module test result sequence.

[0022] The traceability query page display module is used to generate and display the traceability query page of the power module throughout its entire life cycle based on the sequence of test results of the module; the traceability query page throughout the entire life cycle includes the test results of each item obtained by the power module in each of the life stages.

[0023] Fifthly, this application also provides a power module management system, the system comprising a test subsystem and a data management subsystem that are interconnected.

[0024] The test subsystem is used to test the power module and execute the steps of the power module test method described above.

[0025] The data management subsystem is used to perform full lifecycle data management of the power module and execute the steps of the data processing method for the power module described above.

[0026] The aforementioned power module testing method, power module data processing method, device, and power module management system, upon receiving an automated testing instruction for the power module, can determine the test items to be tested and the test order of each test item. Following the test order and according to the test strategy matched to each test item, the power module is tested sequentially to obtain the module test results. Then, based on the module identifier, the module test results are sent to the data management subsystem for data storage. The data management subsystem is used for full lifecycle data management of the power module. In this method, when the power module needs to be tested, only an automated testing instruction needs to be triggered. The entire testing process will be automated without manual operation, directly implemented by the testing subsystem to cover the core test items of all hardware components of the power module. This effectively eliminates human error, improves test accuracy and efficiency. After obtaining the module test results, the module test results are uploaded to the data management subsystem for storage, using the power module as the storage unit, to achieve full lifecycle data management of the power module. This reduces the probability of power module test data fragmentation and improves the management efficiency of the power module. Attached Figure Description

[0027] Figure 1 This is a structural block diagram of a power module management system in one embodiment;

[0028] Figure 2 This is a flowchart illustrating a testing method for a power module in one embodiment;

[0029] Figure 3 This is a flowchart illustrating the process of performing project tests on the power module in sequence according to the test order and the test strategy that matches each test item, in one embodiment, to obtain the module test results of the power module.

[0030] Figure 4 This is a flowchart illustrating a testing method for a power module in another embodiment;

[0031] Figure 5 This is a flowchart illustrating a data processing method for a power module in one embodiment;

[0032] Figure 6 This is a schematic diagram of the trace query page in one embodiment;

[0033] Figure 7 This is a flowchart illustrating the data processing method of the power module in another embodiment;

[0034] Figure 8 This is a schematic diagram of a variable trend display page in one embodiment;

[0035] Figure 9 This is a flowchart illustrating the data processing method of the power module in another embodiment;

[0036] Figure 10 This is a flowchart illustrating the data processing method of the power module in another embodiment;

[0037] Figure 11 This is a schematic diagram of the system topology of the power module management system in one embodiment;

[0038] Figure 12 This is a flowchart illustrating a testing method for a power module in one embodiment;

[0039] Figure 13 This is a flowchart illustrating the data processing method of the power module in another embodiment;

[0040] Figure 14 This is a structural block diagram of a test device for a power module in one embodiment;

[0041] Figure 15 This is a structural block diagram of the data processing device of the power module in one embodiment;

[0042] Figure 16 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0043] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0044] In one embodiment, such as Figure 1 As shown, a power module management system 100 is provided, which includes a test subsystem 101 and a data management subsystem 102 that are interconnected.

[0045] Among them, the test subsystem 101 is a test system used to test the power module. It integrates the physical test environment, automated execution control, intelligent data analysis and process management functions required for automated testing of the power module.

[0046] In one embodiment, the software implementation module of the test subsystem 101 can be deployed on an external test device. This external test device may include, for example, a test chassis integrating the control boards required for testing. The external test device can connect to a corresponding host computer to provide an interactive interface for users. The host computer can be a user terminal used by administrators, including but not limited to various personal computers, laptops, smartphones, tablets, and portable wearable devices. Portable wearable devices may include smartwatches, smart bracelets, head-mounted devices, etc.

[0047] The data management subsystem 102 is a management system for managing the power module's data throughout its entire lifecycle. Using the power module's module identifier as the core index, the data management subsystem 102 centrally stores, integrates, and deeply analyzes all data from the power module's design, production, testing, application, maintenance, and eventual disposal. It also provides data support for power module quality traceability, process improvement, and reliability prediction.

[0048] In one embodiment, the data management subsystem 102 may be deployed on a server or a server cluster consisting of multiple servers.

[0049] For example, when module testing of a power module is required, the user can trigger an automated test command for the power module. In response to the automated test command for the power module, the test subsystem 101 determines the test items of the power module and the test order of each test item. According to the test order and the test strategy matched to each test item, the power module is tested sequentially to obtain the module test results of the power module. Then, based on the module identifier of the power module, the module test results are sent to the data management subsystem 102 for data storage.

[0050] After receiving the module test results from the power module, the data management subsystem 102 binds the module test results with the module identifier of the power module and stores them in the storage area corresponding to the power module. Users can trigger a full-lifecycle traceability command for the power module in the data management subsystem 102. The data management subsystem 102 can obtain the module test results for each stage of the power module's lifecycle based on the module identifier, sort the module test results according to the stage order of each lifecycle, obtain a module test result sequence, and generate and display a traceability query page for the power module throughout its entire lifecycle based on the module test result sequence. Users can view the test results obtained from project testing at each stage of the power module's lifecycle through the full-lifecycle traceability query page.

[0051] The aforementioned power module management system's testing subsystem drives automated testing processes through instructions, achieving high efficiency and reliability in power module testing. Simultaneously, with the help of a data management subsystem that uses module identifiers as key indexes, it enables the archiving and deep correlation of test results. Ultimately, it provides users with an intuitive and orderly view of the entire lifecycle of power modules, improving the effectiveness and efficiency of power module management.

[0052] In one embodiment, the testing subsystem may include a power module testing device and a power module automated testing platform. The power module testing device is a collection of hardware devices that perform specific physical testing operations, providing a precise, controllable, and safe physical environment for power module testing. The power module automated testing platform, on the other hand, is a software system running on the external testing device. It serves as the intelligent scheduling and decision-making center for testing tasks and the specific executor of the power module testing methods. The platform stores standard testing logic for performing automated tests on the power module and can send precise control commands to the power module testing device, directing each step of its operation.

[0053] For example, the automated power module testing platform can perform testing functions including but not limited to communication interface functions and optical power values, IGBT core temperature acquisition, fault detection of various hardware components, capacitor voltage sampling accuracy verification, IGBT power device and driver board functions and turn-on / turn-off response times, bypass contactor response time, hardware overvoltage protection circuit thresholds, capacitor value verification, power-on / power-off times of various boards, and operating status of various boards, etc. It also supports fault diagnosis and real-time early warning functions. During testing, if a test item fails, the automated power module testing platform can immediately trigger protection and display the fault location on the human-machine interface. It supports fault information output and can automatically generate test fault alarm logs.

[0054] For example, when there is a testing requirement for a power module, the user can place the power module with the testing requirement in the power module testing equipment. The power module automated testing platform will trigger an automated testing command, and the power module automated testing platform will respond to the automated testing command for the power module, determine the test items of the power module and the test order of each test item, and control the power module testing equipment to perform the test items on the power module in sequence according to the test order and the test strategy matched to each test item, so as to obtain the module test results of the power module. Based on the module identifier of the power module, the module test results are sent to the data management subsystem for data storage.

[0055] In the above embodiments, the power module testing equipment, as the hardware execution layer, interacts with the power module at the physical level, providing data input and output. The power module automated testing platform, as the software execution layer, is responsible for command, judgment, and management. This hardware-software separation architecture can effectively improve the flexibility of the testing subsystem and the consistency of power module testing, thereby improving the testing efficiency and accuracy of the power module.

[0056] Based on the same inventive concept, in one embodiment, such as Figure 2 As shown, a test method for a power module is provided, which is applied to... Figure 1 Taking the test subsystem as an example, the following steps are included:

[0057] S202, in response to the automated test instructions for the power module, determines the test items for the power module and the test sequence for each test item.

[0058] Among them, the automated test command is a command signal used to instruct the power module to perform automated testing. It can be triggered and generated by the tester through the human-machine interface of the test subsystem. For example, the tester can trigger the automated test command for the power module by clicking the one-click test control through the human-machine interface.

[0059] Test items refer to the specific test categories that need to be performed on the power module, and are the smallest task unit that constitutes a complete automated test. For example, test items may include, but are not limited to, low-voltage initialization test, IGBT on / off test, high-voltage protection function verification test, power-down detection, etc. Understandably, different power modules may require different test items, and the test subsystem needs to determine the test items for the power module based on the module identifier.

[0060] The test sequence refers to the order in which each test item is executed. This sequence can be set based on principles of safety priority, efficiency optimization, and / or early fault exposure. For example, a safety priority principle means performing non-destructive or low-risk tests first to prevent damage to the power module or test equipment. An efficiency priority principle might group items requiring the same test configuration together, such as those using the same or similar test voltages, to reduce adjustment steps. An early fault exposure principle prioritizes items that can quickly determine the basic functionality of the power module. If the test results indicate that the power module fails, the test can be terminated early, allowing for the explanation of test time and resources. Understandably, the test sequence can be pre-ordered by the designer and configured within the test subsystem.

[0061] For example, the test subsystem can respond to automated test instructions for the power module by determining the test items that the power module needs to perform and the test order of each test item based on the module identifier of the power module.

[0062] S204. Following the test order and according to the test strategy that matches each test item, the power module is tested sequentially to obtain the module test results.

[0063] The testing strategy, in this context, refers to the detailed testing procedures and judgment criteria for the corresponding test item; that is, the specific implementation plan for the test item. A testing strategy typically includes the test parameters, data acquisition methods, judgment algorithms, and standards required for the test item. Test parameters may include, for example, the specific parameter types and values ​​applied to the power module, such as voltage, current, waveform, frequency, and duration. Data acquisition methods may include, for example, the sampling rate, range, and trigger conditions required for data acquisition. Judgment algorithms and standards may include, for example, data processing algorithms for processing raw data and the threshold range for judging whether the test is qualified.

[0064] Project testing of the power module refers to the complete process of executing individual test items sequentially on the power module. By performing project testing on the power module, the corresponding project test results can be obtained. The module test results of the power module are the final output of the entire automated testing process, which can include information such as the overall pass status of the power module, the individual project test results of each test item, the test time, and the test environment throughout the entire testing process.

[0065] For example, the testing subsystem can sequentially obtain the test strategies matching each test item according to the test order, and perform project tests on the power module according to the test strategies matching the test items. After the test is completed, the module test results of the power module are obtained. It can be understood that the end of the test can refer to the procedural termination corresponding to the completion of all test items, or it can refer to the forced termination triggered by the failure of a certain test item.

[0066] S206, based on the module identifier of the power module, sends the module test results to the data management subsystem for data storage. The data management subsystem is used to manage the power module's data throughout its entire lifecycle.

[0067] The module identifier is a unique identifier used to identify the power module. It can be understood as a unique identity certificate for the power module. The module identifier can be represented by numbers or strings.

[0068] Among them, full life cycle data management refers to the management process of systematically and continuously collecting, integrating, analyzing and utilizing all data generated throughout the entire life cycle of power modules, from design, raw materials, production, testing, sales, integration and application, field operation, maintenance and even scrapping and recycling.

[0069] For example, after obtaining the module test results of the power module, the test subsystem can send the module test results to the data management subsystem for data storage based on the module identifier of the power module. The data management subsystem can determine the storage location of the module test results of the power module according to the module identifier, write the module test results to the storage location, and integrate and manage them with other data generated by the power module throughout its life cycle.

[0070] In the aforementioned power module testing method, upon receiving an automated test instruction for the power module, the test items to be tested and their testing order can be determined. Following the test order and according to the test strategies matched to each test item, the power module is tested sequentially to obtain the module test results. Then, based on the module identifier, the module test results are sent to the data management subsystem for data storage. The data management subsystem is used for full lifecycle data management of the power module. In this method, when the power module needs to be tested, only an automated test instruction needs to be triggered. The entire testing process requires no manual operation; the testing subsystem automatically implements an automated testing process covering all core test items of the power module's hardware components, effectively eliminating human error and improving test accuracy and efficiency. After obtaining the module test results, the module test results are uploaded to the data management subsystem for storage, using the power module as the storage unit, to achieve full lifecycle data management of the power module. This reduces the probability of power module test data fragmentation and improves the management efficiency of the power module.

[0071] In one embodiment, such as Figure 3 As shown in S204, following the test order and according to the test strategy matched to each test item, the power module is tested sequentially to obtain the module test results, including:

[0072] S302, determine the target test item for the current moment from each test item according to the test order.

[0073] Among them, the target test item refers to the specific test item that should be executed at the current moment, determined according to the established test sequence and the actual test progress.

[0074] For example, the testing subsystem can determine the target test item for the current moment from each test item according to the test order and the historical test items that ended at the previous moment.

[0075] S304. Based on the target test strategy that matches the target test items, perform project tests on the power module to obtain the target project test results of the power module.

[0076] For example, after determining the target test items, the test subsystem can determine the target test strategy that matches the target test items, use the target test strategy to perform project tests on the power module, and obtain the target project test results of the power module.

[0077] In one embodiment, the testing subsystem can determine the target testing strategy that matches the project identifier from each set of testing strategies based on the project identifier of the target test project.

[0078] S306, if the test results of the target project indicate that the power module meets the test qualification requirements of the target test project, then return to execute the steps of determining the target test project at the current moment from each test project according to the test order, until each test project is completed.

[0079] Among them, the test pass requirements are the quantitative pass standards set in advance for the target test items, and are the preset judgment criteria for determining whether the power module passes the test item.

[0080] In one embodiment, the target test result directly includes a field indicating whether the target test item is qualified, such as a qualified capacitor test result. The testing subsystem can determine whether the power module meets the test qualification requirements of the target test item by reading the key fields in the target test result.

[0081] In one embodiment, the target test result includes key fields for determining whether the target test item is qualified. For example, if the qualification requirement for the target test item is that the response time of the IGBT executing the turn-on / turn-off command is less than a preset response time threshold, then the key field for determining whether the target test item is qualified is the response time of the IGBT executing the turn-on / turn-off command. The test subsystem can extract key field information from the target test result and compare the key field information with the qualification requirement to determine whether the power module meets the qualification requirement of the target test item.

[0082] For example, the testing subsystem can first obtain the test qualification requirements of the target test item, determine whether the power module meets the test qualification requirements based on the test results of the target item, and if the power module meets the test qualification requirements of the target test item, the testing subsystem can store the target test results in the local database and return to execute S302, that is, the step of determining the target test item at the current moment from each test item according to the test order. At this time, the target test items that have been tested are historical test items. The testing subsystem can continue to determine the target test item at the current moment from each test item according to the test order and historical test items until each test item is tested.

[0083] S308, based on the test results of each target project, obtains the module test results of the power module.

[0084] For example, after all test items have been completed, the test subsystem can obtain the module test results of the power module based on the test results of each target item.

[0085] In one embodiment, the test subsystem can integrate the test results of each target item, the test time of each test item, the test environment and other information into the module test results of the power module.

[0086] In the above embodiments, the testing subsystem can sequentially perform target test items on the power module according to the test order. If the current test item passes the test, it will automatically jump to the next test item for automated testing. Even without manual intervention, the testing process of each test item can still be completed in a strict and orderly manner, which effectively improves the automation, accuracy and efficiency of power module testing.

[0087] In one embodiment, such as Figure 4 As shown, the test method for power modules may also include:

[0088] S402, if the test results of the target project indicate that the power module does not meet the test qualification requirements of the target test project, then stop the test.

[0089] For example, if the test subsystem determines, based on the test results of the target project, that the power module does not meet the test qualification requirements of the target test project, it can forcibly stop the automated testing of the power module. For instance, the test subsystem can control the adjustable voltage source within the system to stop boosting and start the discharge circuit to discharge, reducing the risk of damage to the power module or test equipment.

[0090] S404 generates a fault log based on the test results of the target project and sends the fault log to the management terminal for display.

[0091] Among them, the fault log is a structured fault report generated by the test subsystem for the target test item, which may include fault identifier, fault object, fault details, context information, etc.

[0092] The management terminal is the interface or device through which testers interact, such as the human-computer interaction interface corresponding to the test subsystem.

[0093] For example, the testing subsystem can generate a fault log based on the test results of the target project, send the fault log to the management terminal, and display the fault status of the power module to the operator on the management terminal.

[0094] In one embodiment, the testing subsystem can extract template fill fields from the test results of the target project according to a preset fault log template, and fill the template fill fields into the corresponding positions of the template to generate a fault log.

[0095] S406. Based on the target project test results, fault logs, and the individual project test results of each completed test project, the module test results of the power module are obtained.

[0096] For example, the test subsystem can integrate the target project test results, fault logs, and the individual project test results of each completed test project to obtain the module test results of the power module.

[0097] In the above embodiments, if any test item detects a power module failure, the testing subsystem will forcibly stop the automated testing process. This not only reduces the probability of safety accidents but also reduces the time and resources that might be wasted in subsequent power module testing. Generating fault logs and sending them to the management terminal makes the testing process transparent and real-time, ensuring that faults are detected and perceived by testers immediately, facilitating immediate manual intervention processes such as retesting and fault analysis.

[0098] Based on the same inventive concept, such as Figure 5 As shown, a data processing method for a power module is provided, which can be applied to, for example... Figure 1 The data management subsystem 102 shown is illustrated as an example. This subsystem stores the module test results of the power module, which are obtained by the module testing subsystem through automated testing of the power module. The method may include the following steps:

[0099] S502, in response to the full lifecycle trace command for the power module, obtains the module identifier of the power module.

[0100] The full-lifecycle traceability command is a signal used to instruct the display of data throughout the entire lifecycle of a power module. This command can be triggered by the user through the human-machine interface (HMI) of the data management subsystem. For example, if a user needs to conduct a quality background investigation, fault cause analysis, or audit of a power module, they can enter the module identifier of the power module in the HMI and click the full-lifecycle traceability control to trigger the generation of the full-lifecycle traceability command for that power module.

[0101] For example, the data management subsystem can obtain the module identifier of the power module in response to a full lifecycle traceability command for the power module.

[0102] S504, obtain the module test results of the power module at each stage of its life cycle based on the module identifier.

[0103] Among them, each life stage refers to the various state intervals that the power module goes through from leaving the factory to being scrapped. The specific division of life stages can be determined by the designer based on the actual use of the power module. For example, the life stages included in the entire life cycle of the power module may include the factory testing stage, the on-site installation and commissioning stage, the power grid operation and maintenance stage, and the decommissioning assessment stage.

[0104] Understandably, at each stage of the power module's lifecycle, users can perform tests on the power module and obtain the module test results for that stage.

[0105] For example, the data management subsystem can determine the storage area of ​​the power module based on the module identifier, and obtain the module test results of the power module at each stage of its life cycle from the storage area of ​​the power module.

[0106] S506, sort the test results of each module according to the phase sequence of each life cycle to obtain the module test result sequence.

[0107] The sequence of each life stage is a logical vector axis that conforms to the objective life cycle of the power module. It defines the order of the various life stages that the power module goes through. The sequence of stages is determined by the liquid level logic. For example, if the life stages of the power module include the factory testing stage, the on-site installation and commissioning stage, the grid operation and maintenance stage, and the decommissioning assessment stage, the corresponding sequence of stages from first to last is the factory testing stage, the on-site installation and commissioning stage, the grid operation and maintenance stage, and the decommissioning assessment stage.

[0108] For example, the data management subsystem can sort the test results of each module according to the phase sequence of each lifecycle stage to obtain a module test result sequence. For instance, in the module test result sequence, the module test results obtained during the factory inspection stage will be listed before the module test results obtained during the field installation and commissioning stage.

[0109] S508 generates and displays a traceability query page for the power module throughout its entire lifecycle, based on the module test result sequence.

[0110] The full lifecycle traceability query page is the final visual interface presented to users by the data management subsystem. This page includes the test results obtained from project testing at each stage of the power module's lifecycle. By generating and displaying this full lifecycle traceability query page to users, they can intuitively understand the test results obtained from project testing at each stage of the power module's lifecycle.

[0111] For example, the controller can generate and display a traceability query page for the power module throughout its entire lifecycle based on the sequence of module test results.

[0112] In one embodiment, the data management subsystem can determine the ranking of the test results of each module in the first dimension based on the sequence of module test results, then determine the ranking of the test results of each test item in the second dimension based on the test sequence of each test item, determine the page position of each item's test results on the full lifecycle traceability query page based on the ranking of the first dimension and the ranking of the second dimension, and generate and display the traceability query page of the power module in the full lifecycle based on the page position and the test results of each item.

[0113] In one embodiment, the power module's full lifecycle traceability query page can be viewed as follows: Figure 6 As shown, the traceability query page can display the test time for each life stage, as well as the key variable values ​​of each project included in the test results, such as the bypass trigger board power-on time, the power supply power-on time, IGBT temperature, bypass closing time, optical power, capacitor value, IGBT switching time, bypass trigger board power-off time, power supply power-off time, and IGBT driver board power-off time.

[0114] In the above embodiments, the test results of each module are sorted according to the stage sequence of each life cycle to obtain a module test result sequence. Based on the module test result sequence, a traceability query page for the power module throughout its entire life cycle is generated and displayed. This can transform multi-stage and scattered test data into a clear and intuitive visual timeline, enabling users to quickly understand the complete quality evolution process of the power module from production to application. This not only improves the efficiency of historical data query and analysis of power modules, but also provides a data foundation for power module failure analysis, quality traceability, reliability assessment, and module iteration.

[0115] In one embodiment, such as Figure 7 As shown, the data processing method for the power module may further include the following steps:

[0116] S702, in response to a single variable trend query command for a power module, determines the target test item corresponding to the target variable to be queried.

[0117] Among them, the single variable trend query command is a command signal used to indicate the trend analysis of a single variable. It can be triggered by the user in the human-computer interaction interface of the data management subsystem for a single variable of the power module. For example, the user can enter the module identifier and variable identifier of the power module in the human-computer interaction interface and click the trend query control to trigger the generation of a single variable trend query command for the power module.

[0118] The target variable is a specific performance variable explicitly specified by the user for trend analysis, such as optical power, capacitor value, or IGBT temperature. The target test item corresponding to the target variable is the test task used to carry and provide the specific value of the target variable. For example, the target test item for optical power could be a low-voltage initialization test. Another example is the target test item for power supply failure time, which could be a power-down detection. It is understandable that one test item can correspond to multiple variables.

[0119] For example, the data management subsystem can respond to a single variable trend query command for a power module, determine the variable identifier of the target variable to be queried, and determine the target test item corresponding to the target variable based on the variable identifier.

[0120] S704, based on the module identifier, obtain the test results of the power module under the target test items and corresponding to each stage of its life cycle.

[0121] Among them, the phase project test results refer to the test results obtained by conducting project tests on the power module according to the target test items at a specific life stage.

[0122] For example, the data management subsystem can obtain the test results of the power module under the target test item and corresponding to each stage of its life cycle based on the module identifier of the power module.

[0123] S706, for each stage of the project test results, extract the target variable's variable test results in the corresponding life cycle stage from the stage project test results.

[0124] Since a single test item may generate test results for multiple variables, it is necessary to extract information from the test results of each stage of the test to obtain the test results of the target variable at the corresponding lifecycle stage. For example, when the test item is a low-voltage initialization test, the corresponding test variables may include the power-on time of the power supply, the capacitance value, the optical power, and the power-on time of the bypass trigger board.

[0125] Among them, the variable test results are the specific variable values ​​corresponding to the target variable in the phase project test results.

[0126] For example, the data management subsystem can extract the variable test results of the target variable in the corresponding life stage from the test results of each stage of the project, based on the variable representation of the target variable.

[0127] S708 determines the variable change trend of the power module for the target variable based on the time of each stage of the life cycle and the test results of each variable.

[0128] Here, the time period to which a stage belongs refers to the specific time period corresponding to a life cycle stage. It is not just a stage label such as "manufacturing stage" or "operation stage," but a specific timestamp. Determining the time period to which each life cycle stage belongs allows us to establish precise coordinates for the variable test results on the time axis, which is crucial for connecting discrete data points into a continuous trend line.

[0129] For example, after determining the time to which each life stage belongs, the data management subsystem can use the time to which the stage belongs as the independent variable X and the corresponding variable test result as the dependent variable Y to form a two-dimensional time series dataset. Then, based on the two-dimensional time series data, the power module can construct the variable change trend of the target variable.

[0130] S710 generates and displays a variable trend display page for the target variable based on the variable change trend.

[0131] The variable trend display page is a data visualization interface used to present the trend of variable changes. The variable trend display page can display trend charts corresponding to the trend of variable changes.

[0132] For example, the data management subsystem can call a chart library template to perform visualization rendering based on the trend of variable changes, generate a trend chart of variable changes, and then use the trend chart as a page element in the display page to generate and display the variable trend display page of the target variable.

[0133] In one embodiment, the variable trend display page, in addition to trend charts showing the changing trends of variables, may also include anomaly detection results and statistical distribution of the target variable. The data management subsystem can perform statistical analysis on the variable values ​​of the target variable based on the test results of each variable, obtaining the average, maximum, and minimum values ​​of the target variable. Simultaneously, based on the variable changing trend, it can determine whether there are any anomalies in the target variable, such as whether there is an abnormal drift in optical power. The anomalies and statistical analysis results are then displayed as page elements on the variable trend display page. Taking optical power as an example, the variable trend display page can be as follows: Figure 8 As shown.

[0134] In the above embodiments, when there is a need to query the trend of a single variable for the power module, the data management subsystem automatically extracts the test results of each variable scattered in the test results of each stage of the project, and aggregates them into a continuous historical change trajectory of the target variable, accurately determines its change trend, and finally presents the variable analysis results in an intuitive visualization page. This enables users to quickly understand the evolution trend of the target variable, predict its potential risks, and provide an accurate data foundation for subsequent predictive maintenance or quality improvement.

[0135] In one embodiment, such as Figure 9 As shown, the data processing method for the power module may further include the following steps:

[0136] S902, in response to a test variable statistical analysis instruction for a power module production batch, determines the batch identifier, target test variable, and variable statistical parameters corresponding to the target test variable for the power module production batch.

[0137] Among them, a power module production batch refers to a group of power modules manufactured under the same production conditions and within the same time period. The batch is the basic unit for group quality analysis and process control.

[0138] Among them, the test variable statistical analysis instruction is an instruction signal used to instruct the statistical analysis of test variables for the power module production batch. It can be triggered by the user in the human-machine interface corresponding to the data management subsystem for the target test variables of the power module production batch. For example, the user can enter the batch identifier of the power module production batch and the variable identifier of the target test variable in the human-machine interface, and click the statistical analysis control to trigger the generation of the test variable statistical analysis instruction for the power module production batch.

[0139] The batch identifier is a unique identifier used to identify a production batch, and can be represented by characters or strings. The target test variable is the specific performance parameter that the user expects to perform statistical analysis on, such as optical power. Statistical parameters refer to the specific statistical quantities to be calculated when performing statistical analysis on the target test variable, such as mean, median, standard deviation, and range. Understandably, different target test variables correspond to different statistical parameters. For example, when the target test variable is optical power, the corresponding statistical parameters could be mean, standard deviation, pass rate, maximum value, minimum value, etc. When the target test variable is capacitance value, the corresponding statistical parameters could be mean, standard deviation, process capability index, scale, skewness, etc.

[0140] For example, the data management subsystem can respond to a test variable statistical analysis instruction for a power module production batch, determine the batch identifier and target test variable of the power module production batch, and then determine the variable statistical parameters corresponding to the target test variable based on the target test variable.

[0141] S904, based on the batch identifier, obtain the variable test results of each batch of power modules contained in the power module production batch under the target test variable.

[0142] The power modules included in the power module production batch refer to all individual power modules belonging to that power module production batch.

[0143] For example, the data management subsystem can determine the power modules in each batch of power module production batch 1 based on the batch identifier, and then obtain the module test results of the batch power modules based on the module identifier of the batch power modules for each batch power module. Then, based on the variable identifier of the target test variable, the variable test results are extracted from the module test results.

[0144] S906, based on variable statistical parameters, performs statistical analysis on the test results of each variable to obtain the parameter values ​​corresponding to the variable statistical parameters.

[0145] For example, the data management subsystem can load the statistical formula or statistical model corresponding to the variable statistical parameters based on the variable statistical parameters, and then call the statistical formula or statistical model corresponding to the variable statistical parameters to perform result statistics on the test results of each variable and obtain the parameter value corresponding to the variable statistical parameters.

[0146] S908 generates and displays a statistical analysis page for the module's production batch based on the parameter values ​​corresponding to the variable statistical parameters.

[0147] The statistical analysis display page is a visualization page specifically designed to present the overall quality profile of the production batches in the module.

[0148] For example, the data management subsystem can dynamically render and generate a statistical analysis display page based on the parameter values ​​corresponding to the variable statistical parameters and the preset display page template, and then display the page.

[0149] In the above embodiments, by statistically analyzing the test results of each batch of power modules under the target test variables, the parameter values ​​corresponding to the variable statistical parameters are obtained. Then, based on the parameter values ​​corresponding to the variable statistical parameters, a statistical analysis display page for the module production batch is generated and displayed. This can efficiently transform massive discrete test data into core indicators that reflect the overall quality level of the batch and display them intuitively through a visual page. Users can quickly evaluate the production efficiency of the production batch and identify batch-specific quality problems.

[0150] In one embodiment, such as Figure 10 As shown, the data processing method for the power module may further include the following steps:

[0151] S1002, in response to the lifetime prediction command for the power module, determines the lifetime prediction strategy for each module component according to the module components included in the power module.

[0152] Among them, the life prediction command is a command signal used to instruct the power module to perform life prediction. It can be triggered by the user in the human-machine interface corresponding to the data management subsystem for the power module. For example, the user can enter the module identifier of the power module in the human-machine interface and click the life prediction control to trigger the generation of the life prediction command for the power module.

[0153] Module components are the key physical units that make up a power module, and these components typically have different failure mechanisms and aging modes. For example, module components may include capacitors, IGBTs, optical fibers, etc.

[0154] The lifetime prediction strategy for a specific module component is defined by the failure physics model and data analysis method for that module component, specifying how to predict its lifetime. For example, a finite element simulation model can be used to predict the lifetime of a solder layer, while an electrothermal stress analysis model can be used to predict the lifetime of a chip.

[0155] For example, the data management subsystem may, in response to a lifetime prediction command for a power module, determine the lifetime prediction strategy for each module component according to the module components contained in the power module.

[0156] In one embodiment, the data management subsystem can determine a lifetime prediction strategy that matches the component identifier from a set of strategies based on the component identifier of each module component.

[0157] S1004, for each module component, determine the key parameters of the life prediction strategy corresponding to the module component.

[0158] Among them, the key parameters of the strategy refer to the core input variables that affect the life prediction results. They are the parameters that can have a key impact on the life of the module components.

[0159] For example, for each module component, the data management subsystem can determine the key strategy parameters of the lifetime prediction strategy corresponding to that module component. For instance, the key strategy parameters in the lifetime prediction strategy can be determined based on the parameter identifiers of each strategy parameter within the lifetime prediction strategy.

[0160] S1006, based on the key parameters of the strategy, extract key information for predicting the lifespan of module components from the test results of each module.

[0161] Among them, the key information for lifetime prediction refers to the parameter data that can be directly used for lifetime prediction extracted from the module test results based on the key parameters of the strategy.

[0162] For example, the data management subsystem can extract information from the test results of each module based on the parameter identifiers of the key strategy parameters to obtain key information for predicting the lifespan of the module components. For instance, if the key strategy parameter is temperature, temperature information can be extracted from the module test results as key information for predicting the lifespan of the module components.

[0163] S1008, based on the life prediction strategy and key life prediction information, performs component life prediction on the module component to obtain the remaining service life of the module component.

[0164] For example, the data management subsystem can predict the lifespan of module components based on the lifespan prediction strategy and key lifespan prediction information, and obtain the remaining service life of the module components.

[0165] In one embodiment, the data management subsystem can instantiate a lifetime prediction strategy and inject key lifetime prediction information into the input variables corresponding to the model. The lifetime prediction strategy instance is then run to predict the lifetime of the module components, thereby obtaining the remaining service life of the module components.

[0166] S1010, determine the remaining service life of the power module based on the remaining service life of each module component.

[0167] For example, the data management subsystem can determine the remaining service life of the power module based on the remaining service life of each module component.

[0168] In one embodiment, the data management subsystem can determine the minimum remaining lifespan from the remaining lifespan of each component, and determine the minimum remaining lifespan as the module remaining lifespan of the power module.

[0169] In one embodiment, the data management subsystem can perform a weighted summation of the remaining lifespan of each component based on the lifespan impact weight of each module component to obtain the remaining lifespan of the power module.

[0170] In the above embodiments, by predicting the lifespan of each module component in the power module and then determining the remaining lifespan of the power module based on the remaining lifespan of each module component, the potential failure risk of the power module can be warned in advance, reducing the risk of resource waste that may result from replacing the power module too early, or the risk of operational failure caused by not replacing the power module in time.

[0171] In one embodiment, a testing method for a power module and a data processing method for a power module are provided, applicable to, for example, Figure 11The power module management system shown is used as an example for illustration. The power module management system may include an adjustable voltage source, a test platform chassis, a test platform host computer, and a server that communicates with the test platform host computer.

[0172] The adjustable voltage source can be used to implement stepped control and adjustment of the unit charging voltage, meeting the power supply requirements of the power module throughout the entire process from low-voltage initialization to high-voltage functional verification. For example, the adjustable voltage source can be an adjustable DC power supply.

[0173] The test platform chassis is the hardware framework used for testing power modules. It contains control function boards and sampling function boards. The control function boards can be designed using a plug-in box structure or a custom design. By integrating multiple types of control function boards into the test platform chassis, an automated power module testing platform can be built, enabling the issuance of test commands, automatic detection and judgment of test results, and control of the collaborative functions of various hardware units. The control function boards automatically store the test results of each power module in a local database deployed on a host computer. The data content includes the sampling data of each power module, and optional content includes, but is not limited to, communication optical power value, power supply board gain / loss voltage, power module capacitance value, contactor trigger board gain / loss time, contactor trigger board power status, contactor closing time, drive board gain / loss time, etc. It also includes information such as the power module number, test time, and test personnel.

[0174] The sampling function board can be a customizable board design with a card slot box structure, integrating multiple types of data acquisition boards, including but not limited to bridge port voltage acquisition boards, communication optical power detection boards, and capacitance detection boards. Working in conjunction with the control function board and other sensors or hardware detection circuits on the power module, the sampling function board can collect parameters from various hardware components of the power module and transmit them back to the control function board to provide data support for determining the detection results.

[0175] The types of sampling function boards include, but are not limited to, QR code scanners, bridge voltage acquisition boards, module current acquisition boards, optical power acquisition boards, capacitance value detection boards, etc. The type of board can be selected and matched according to the needs of the test object.

[0176] The testing platform's host computer integrates a human-machine interface that can display the testing process, progress, collected data, and fault alarm information in real time. It supports manual configuration of test parameters, such as tester name, test stage, and threshold range, and also supports one-click testing. The host computer also integrates a local database, which can be a MySQL relational database, to store all data from a single test, such as module identity information, test time, measured values ​​of various parameters, and fault logs. It also supports data exchange with the full lifecycle management system.

[0177] The server integrates a data management subsystem, which can also use a MySQL relational database to store basic module information, test data, fault logs, and other data. The data management subsystem supports the import and export of external data and bidirectional communication with the local database of the host computer on the test platform via the network. It also supports the access of power module test data collected during the commissioning and testing phases, realizing unified management of data information collected during the factory testing, field testing, and commissioning of power modules. It achieves unified reception, storage, and retrieval of data at each stage of "factory delivery - field testing - commissioning," and can extract and analyze data throughout the entire life cycle of the power module through an interactive interface.

[0178] In one embodiment, the core function of the data management subsystem is to store and manage test data throughout the power module's lifecycle. This primarily includes a database deployed on a server, a module lifecycle data management interface, and a collection of fitting and statistical algorithms related to power module hardware quality analysis, statistics, and lifespan prediction. The data management subsystem can perform functions including, but not limited to:

[0179] First, data import, export, and storage. The data management subsystem supports the access of test data collected from different units and platforms, and also supports the import of external data collected from other systems. Data sources can be cross-platform and cross-device, enabling unified management and analysis of power module test data across all stages and platforms.

[0180] Second, system data traceability and query. The data management subsystem provides multi-dimensional data query functions to meet various traceability needs. Users can enter the module identifier to view all test data of the power module from "factory testing - field installation testing - maintenance", and sort them in chronological order.

[0181] Third, it supports univariate trend queries. By selecting a variable and the module identifier of the power module, the system can generate a curve showing the change of that variable at different stages, diagnosing any abnormal drift and analyzing statistical distribution. For example, if the variable is optical power, the statistical distribution includes average, maximum, and minimum values, facilitating quick identification of quality issues.

[0182] Fourth, batch statistical analysis. The data management subsystem can perform statistical analysis and diagnosis based on statistical analysis algorithms. The user inputs the batch number, and the data management subsystem can then statistically analyze the distribution of a specific test indicator for that batch, quickly identifying batch-related quality issues. For example, it can calculate the average, maximum, and minimum optical power, and the pass rate.

[0183] Fifth, health status assessment. Based on preset health thresholds and combined with the module's current test data and historical trends, the data management subsystem can generate assessment results. For example, a light power deviation of ±10% is normal, ±10%-20% is a warning, and >20% is a fault.

[0184] Sixth, lifespan prediction. For core components of the power module, such as capacitors, IGBTs, and optical fibers, the data management subsystem is designed with statistical analysis and prediction algorithms for different components. By fitting parameter degradation curves with historical data and combining them with industry lifespan standards, the remaining lifespan of the component can be predicted.

[0185] like Figure 12 As shown, the testing method for a power module may include the following steps:

[0186] S1201, in response to automated test instructions for the power module, determines the test items for the power module and the test sequence for each test item.

[0187] Before conducting the test, the tester needs to prepare for the test, correctly install the connection wiring between the test device and the power module according to the test instructions, read the power module's identification QR code with a QR code scanner, and use the human-machine interface to input the test stage, tester, test time, and the module's preset parameters (such as the rated range of capacitor value, normal threshold of IGBT core temperature, optical power receiving threshold, contactor closing time threshold, etc.) to establish the association between the module's identity and the test data.

[0188] Subsequently, testers can click the "One-Click Automatic Test" button on the host computer interface to send charging commands through the test chassis.

[0189] S1202, determine the target test item for the current moment from each test item according to the test order.

[0190] S1203, according to the target test strategy that matches the target test item, perform project tests on the power module and obtain the target project test results of the power module.

[0191] S1204: Determine whether the power module meets the test qualification requirements. If yes, proceed to S1205; otherwise, proceed to S1206.

[0192] S1205, determine whether each test item has been completed. If not, return to execute S1202; otherwise, execute S1208.

[0193] S1206, Stop the test, generate a fault log based on the test results of the target project, and send the fault log to the management terminal for display.

[0194] S1207, based on the target project test results, fault logs, and the individual project test results of each completed test project, obtain the module test results of the power module.

[0195] S1208, the module test results of the power module are obtained based on the test results of each target project.

[0196] S1209, based on the module identifier of the power module, sends the module test results to the data management subsystem for data storage.

[0197] The test items include low voltage initialization test, high voltage function verification test, high voltage protection function verification test, power-down detection, and fault handling and retesting.

[0198] The power module automated test platform first performs a low-voltage initialization test. Specifically, the test chassis issues a charging command to control the adjustable voltage source to gradually increase the voltage to charge the capacitor, and uses a sampling board to collect the following test parameters. Optional test items include, but are not limited to:

[0199] Power supply parameters: Collect the power supply's energizing time and determine whether it meets the preset voltage range.

[0200] Driver board functional parameters: detect the power-on time of the driver board and verify whether the timing meets the design requirements.

[0201] Capacitor voltage balance: Collect module capacitor information and calculate capacitor value.

[0202] Optical communication performance: The optical power detection board collects the transmit / receive power of the optical port of the driver board, as well as the data transmission and reception bit error rate. If the measured value is lower than the preset threshold, the optical communication performance is judged to be unqualified.

[0203] Bypass contactor trigger board parameters: whether the unit control board detects the bypass, trigger coil charging time, board energization time, and power supply status meet the expected design requirements.

[0204] Sampling accuracy of capacitor voltage sampling circuit: If the measured value is lower than the preset accuracy, the capacitor voltage sampling circuit is deemed to be unqualified.

[0205] Once all parameters are within acceptable limits, the system automatically enters the high-voltage testing phase; if any parameter is abnormal, the test is immediately paused and a fault log is generated.

[0206] After the low-voltage initialization test passes, the high-voltage functional verification test can proceed. The test chassis controls the adjustable voltage source to continue boosting the voltage to the power module's rated operating voltage of 900V, while simultaneously performing core hardware functional tests. Optional test items include, but are not limited to:

[0207] IGBT On / Off Test: Unlock the unit, send a specific switching command, and use a bridge port voltage detection board to detect changes in the bridge port voltage to determine whether the IGBT is executing normally and the response time of the on / off command, etc., to determine whether it meets the preset threshold. At the same time, the IGBT core temperature is collected to verify whether it is within the normal range.

[0208] After the high-voltage function verification test is passed, the high-voltage protection function verification test can be performed. Optional test items include, but are not limited to:

[0209] Hardware overvoltage circuit function: If the voltage is further increased to 1300V, the overvoltage trigger function of the hardware overvoltage circuit is detected, the unit sends a bypass request and executes bypass protection.

[0210] Bypass contactor related functions: test the contactor closing response time, determine whether it is within the preset threshold, and verify the reliability of the contactor operation.

[0211] After the high-voltage protection function verification test is passed, a power-down test can be performed, which triggers the discharge circuit to discharge the unit and simultaneously detects the hardware parameters during the discharge process. Optional test items include, but are not limited to:

[0212] Power supply parameters: Collect the power supply failure time and determine whether it meets the preset voltage range.

[0213] Driver board functional parameters: detect the power failure time of the driver board and verify whether the timing meets the design requirements.

[0214] Bypass contactor trigger board parameters: whether the board's power failure time and the power supply status and response under power failure conditions meet the expected design requirements.

[0215] After the power-down test passes, fault handling and retesting can be performed, including but not limited to:

[0216] Fault protection: If a unit fault occurs during testing (such as an IGBT driver fault), the system immediately instructs the adjustable voltage source to stop boosting and starts the discharge circuit to discharge. The human-machine interface displays alarm information and the location of the fault, and automatically generates a fault log (including timestamp, module identification code, fault parameters, etc.).

[0217] Once all six test items are completed, the system automatically compares the measured values ​​with preset thresholds to generate a pass / fail result. Simultaneously, it outputs a power module test report, including module identification information, test stage, measured values ​​of each parameter, judgment result, and fault records. The report and the original collected data are bound and stored in the test platform's backend database. The test platform's backend database automatically uploads all test data, including reports, original parameters, and fault logs, to the data management subsystem. The data management subsystem can create indexes based on module identification codes to achieve structured data storage, conforming to the "unified database management" design of this invention.

[0218] If any of the six test items fails the power module test, the testing can be stopped immediately. The test results and data of the completed test items are packaged and integrated into the module test results, which are then sent to the data management subsystem for management. At the same time, a fault log is generated and provided to the user for querying through the human-machine interface.

[0219] like Figure 13 As shown, the data processing method for the power module may include the following steps:

[0220] S1301, in response to the full lifecycle traceability command for the power module, obtains the module identifier of the power module.

[0221] S1302, obtain the module test results of the power module at each stage of its life cycle based on the module identifier.

[0222] S1303, sort the test results of each module according to the stage order of each life cycle to obtain the module test result sequence.

[0223] S1304, based on the module test result sequence, generate and display a traceability query page for the power module throughout its entire life cycle.

[0224] The above function is a single-module full-cycle traceability function in the data management subsystem. That is, by inputting the module identification code, the system can display all historical data of the module on a timeline, clearly presenting the historical changes of each hardware parameter.

[0225] S1305, in response to a single variable trend query command for a power module, determines the target test item corresponding to the target variable to be queried.

[0226] S1306, based on the module identifier, obtain the test results of the power module under the target test items and corresponding to each stage of its life cycle.

[0227] S1307, based on the time of each life stage and the test results of each variable, determines the variable change trend of the power module for the target variable.

[0228] S1308, Generate and display the variable trend display page of the target variable based on the variable change trend.

[0229] The above function is a single-variable trend query function supported by the data management subsystem. By selecting a variable and the power module identification code, the change curve of the variable at different stages can be generated, diagnosing whether there is abnormal drift, and analyzing the statistical distribution (average, maximum and minimum values, etc.), which makes it convenient for personnel to quickly identify quality problems.

[0230] S1309, in response to a test variable statistical analysis instruction for a power module production batch, determines the batch identifier, target test variable, and variable statistical parameters corresponding to the target test variable for the power module production batch.

[0231] S1310, based on the batch identifier, obtain the variable test results of each batch of power modules contained in the power module production batch under the target test variable.

[0232] S1311, based on the variable statistical parameters, perform statistical analysis on the test results of each variable to obtain the parameter values ​​corresponding to the variable statistical parameters.

[0233] S1312, Based on the parameter values ​​corresponding to the variable statistical parameters, generate and display the statistical analysis display page of the module production batch.

[0234] The above functions are batch statistical analysis functions supported by the data management subsystem. They can perform statistics and diagnosis on the system based on statistical analysis algorithms. By inputting the batch number, the statistical distribution (average, maximum and minimum values, pass rate) of a certain test index of the batch module can be statistically analyzed, and batch quality problems can be quickly identified.

[0235] S1313, in response to the lifetime prediction command for the power module, determines the lifetime prediction strategy for each module component according to the module components contained in the power module.

[0236] S1314, For each module component, determine the key parameters of the life prediction strategy corresponding to the module component.

[0237] S1315, based on the key parameters of the strategy, extract key information for predicting the lifespan of module components from the test results of each module.

[0238] S1316, based on the life prediction strategy and key life prediction information, performs component life prediction on the module component to obtain the remaining service life of the module component.

[0239] S1317, determine the remaining service life of the power module based on the remaining service life of each module component.

[0240] The above-mentioned function is the life prediction function supported by the data management subsystem. For the core components of the power module, the system designs statistical analysis and prediction algorithms for different components. It can predict the remaining service life of the component by fitting parameter degradation curves through historical data and combining industry life standards.

[0241] In one embodiment, the data management subsystem can also implement a health status assessment function, generating assessment results based on preset health thresholds and combining current test data and historical trends of the module. For example, an optical power deviation of ±10% is considered normal, ±10%-20% is a warning, and >20% is a fault.

[0242] In one embodiment, such as Figure 13 In other stages, such as on-site installation and commissioning and operation and maintenance, maintenance personnel scan the module's identification code with a barcode scanner to import on-site test data into the system. The system automatically appends this data to the module's full-lifecycle file. On-site test data may include, but is not limited to, IGBT temperature and capacitor voltage after installation. The data management subsystem periodically collects real-time data from the module's operation, compares it with historical data to determine if any anomalies exist, and issues an alarm signal if the data approaches a warning threshold.

[0243] The power module testing method and power module data processing method in the above embodiments have the following advantages:

[0244] First, the standardization and automation of the testing process reduces reliance on manual labor, and automated testing improves production testing efficiency and accuracy. Test items can cover all hardware components and functional scenarios of the power module, and the testing process requires no manual intervention, significantly shortening the testing time for a single module and reducing the test error rate.

[0245] Secondly, it can provide early warnings of potential faults, reduce unplanned downtime, formulate replacement plans based on lifespan predictions, avoid over-maintenance or under-maintenance, reduce operation and maintenance costs, and facilitate fault location through data traceability, thus shortening repair time.

[0246] Third, we will promote a more digital and intelligent power module testing process, upgrading from single-point testing to system testing and intelligent platforms, and transforming from passive maintenance to predictive maintenance, providing technical support for improving the reliability of power electronic equipment.

[0247] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0248] Based on the same inventive concept, this application also provides a power module testing apparatus for implementing the power module testing method described above. The solution provided by this apparatus is similar to the implementation described in the above method; therefore, the specific limitations of one or more power module testing apparatus embodiments provided below can be found in the limitations of the power module testing method described above, and will not be repeated here.

[0249] In one embodiment, such as Figure 14 As shown, a power module testing device 1400 is provided, including: a command response module 1401, a project testing module 1402, and a data storage module 1403, wherein:

[0250] The instruction response module 1401 is used to respond to automated test instructions for the power module and determine the test items of the power module and the test order of the test items.

[0251] Project test module 1402 is used to perform project tests on the power module in sequence according to the test strategy that matches each test item, and obtain the module test results of the power module.

[0252] The data storage module 1403 is used to send the module test results to the data management subsystem for data storage based on the module identifier of the power module. The data management subsystem is used to perform full life cycle data management of the power module.

[0253] In one embodiment, the project testing module 1402 includes: determining the target test item at the current moment from each test item according to the test order; performing project testing on the power module according to the target test strategy matching the target test item to obtain the target project test result of the power module; if the target project test result indicates that the power module meets the test qualification requirements of the target test item, then returning to the step of determining the target test item at the current moment from each test item according to the test order until each test item is completed; and obtaining the module test result of the power module based on the test results of each target item.

[0254] In one embodiment, the power module testing apparatus 1400 may further include:

[0255] The test stop module is used to stop the test if the test results of the target project characterization power module do not meet the test qualification requirements of the target test project.

[0256] The fault log generation module is used to generate fault logs based on the test results of the target project and send the fault logs to the management terminal for display.

[0257] The test result generation module is used to obtain the module test results of the power module based on the target project test results, fault logs, and the individual project test results of each completed test project.

[0258] Based on the same inventive concept, this application also provides a data processing apparatus for a power module to implement the data processing method for the power module described above. The solution provided by this apparatus is similar to the implementation described in the above method; therefore, the specific limitations in one or more embodiments of the power module data processing apparatus provided below can be found in the limitations of the power module data processing method described above, and will not be repeated here.

[0259] In one embodiment, such as Figure 15 As shown, a data processing device 1500 for a power module is provided, including: an identifier acquisition module 1501, a test result acquisition module 1502, a result sorting module 1503, and a traceability query page display module 1503, wherein:

[0260] The identifier acquisition module 1501 is used to acquire the module identifier of the power module in response to the full life cycle traceability command for the power module.

[0261] The test result acquisition module 1502 is used to obtain the module test results of the power module at each stage of its life cycle based on the module identifier.

[0262] The result sorting module 1503 is used to sort the test results of each module according to the stage order of each life cycle to obtain the module test result sequence.

[0263] The traceability query page display module 1504 is used to generate and display the traceability query page of the power module throughout its entire life cycle based on the module test result sequence; the traceability query page of the entire life cycle includes the test results of each item obtained by the power module in each stage of its life cycle.

[0264] In one embodiment, the data processing device 1500 for the power module may further include:

[0265] The target test item determination module is used to determine the target test item corresponding to the target variable to be queried in response to a single variable trend query command for the power module.

[0266] The phase project test result acquisition module is used to obtain the phase project test results of the power module under the target test project and corresponding to each life stage, based on the module identifier.

[0267] The variable test result extraction module is used to extract the variable test results of the target variable in the corresponding life cycle stage from the test results of each stage of the project.

[0268] The variable change trend determination module is used to determine the variable change trend of the power module for the target variable based on the time of each stage of life and the test results of each variable.

[0269] The variable trend display page module is used to generate and display a variable trend display page for the target variable based on the variable change trend.

[0270] In one embodiment, the data processing device 1500 for the power module may further include:

[0271] The batch information determination module, in response to the test variable statistical analysis command for the power module production batch, determines the batch identifier, target test variable, and variable statistical parameters corresponding to the target test variable for the power module production batch.

[0272] The variable test result acquisition module is used to obtain the variable test results of each batch of power modules contained in the production batch of the power module under the target test variable, based on the batch identifier.

[0273] The results statistics module is used to perform statistical analysis on the test results of each variable based on the variable statistical parameters, and obtain the parameter values ​​corresponding to the variable statistical parameters.

[0274] The statistical analysis display page module is used to generate and display the statistical analysis display page for each production batch of the module based on the parameter values ​​corresponding to the statistical parameters of the variables.

[0275] In one embodiment, the data processing device 1500 for the power module may further include:

[0276] The lifetime prediction strategy determination module is used to determine the lifetime prediction strategy for each module component in response to the lifetime prediction command for the power module.

[0277] The strategy key parameter determination module is used to determine the strategy key parameters of the lifetime prediction strategy corresponding to each module component.

[0278] The key information extraction module is used to extract key information for predicting the lifespan of module components from the test results of each module based on the key parameters of the strategy.

[0279] The component life prediction module is used to predict the remaining service life of module components based on life prediction strategies and key life prediction information.

[0280] The total remaining lifetime prediction module is used to determine the remaining lifetime of the power module based on the remaining lifetime of each component.

[0281] The aforementioned power module testing device and the various modules in the power module data processing can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of a computer device in software form, so that the processor can call and execute the operations corresponding to each module.

[0282] In one embodiment, a computer device is provided, which may be a server integrating a data management subsystem, and its internal structure diagram may be as follows: Figure 16 As shown, the computer device includes a processor, memory, and a network interface connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The database stores data related to the data processing method of the power module. The network interface communicates with external terminals via a network connection. When the computer program is executed by the processor, it implements a data processing method for the power module.

[0283] Those skilled in the art will understand that Figure 16 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0284] In one embodiment, a computer device is provided, which may be a test chassis. The test chassis can communicate with a host computer, which includes a processor, memory, communication interface, display screen, and input device connected via a system bus. The host computer's memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used to communicate with the external test chassis via wired or wireless means, controlling the test chassis to implement a power module testing method. The memory on the host computer can be used to store relevant data of the power module testing method. The wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. The host computer's display screen can be an LCD screen or an e-ink screen. The input device of the host computer can be a touch layer covering the display screen, or buttons, a trackball, or a touchpad mounted on the host computer's casing, or an external keyboard, touchpad, or mouse, etc.

[0285] In one embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the specific steps of the method embodiment described above.

[0286] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the specific steps of the above-described method embodiment.

[0287] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the specific steps of the method embodiment described above.

[0288] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties. Furthermore, the acquisition, storage, processing, and transmission of the data all comply with relevant laws and regulations.

[0289] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0290] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0291] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A test method for a power module, characterized in that, The method, applied to a module testing subsystem, includes: In response to automated test instructions for the power module, determine the test items for the power module and the test order for each test item; According to the test order, the power module is tested sequentially according to the test strategy that matches each test item, and the module test results of the power module are obtained. Based on the module identifier of the power module, the module test results are sent to the data management subsystem for data storage. The data management subsystem is used to perform full lifecycle data management of the power module.

2. The method according to claim 1, characterized in that, The process of sequentially performing project tests on the power module according to the test order and the test strategy matched to each test item, to obtain the module test results of the power module, includes: According to the test order, determine the target test item for the current moment from each of the test items; According to the target test strategy that matches the target test item, the power module is tested to obtain the target test results of the power module. If the test result of the target project indicates that the power module meets the test qualification requirements of the target test project, then return to the step of determining the target test project at the current moment from each of the test projects according to the test order, until each of the test projects is completed; The module test results of the power module are obtained based on the test results of each of the target projects.

3. The method according to claim 2, characterized in that, The method further includes: If the test results of the target project indicate that the power module does not meet the test qualification requirements of the target test project, then the test shall be stopped; A fault log is generated based on the test results of the target project, and the fault log is sent to the management terminal for display. Based on the target project test results, fault logs, and the individual project test results of each completed test project, the module test results of the power module are obtained.

4. A data processing method for a power module, characterized in that, The method is applied to a data management subsystem, which stores module test results of the power module. These test results are obtained by the module testing subsystem through automated testing of the power module. The method includes: In response to a full-cycle traceability command for the power module, the module identifier of the power module is obtained; Based on the module identifier, obtain the module test results of the power module at each stage of its life cycle; The test results of each module are sorted according to the phase order of each life stage to obtain a module test result sequence; Based on the sequence of test results of the module, a traceability query page for the power module throughout its entire life cycle is generated and displayed; the traceability query page for the entire life cycle includes the test results of each item obtained by the power module in each of the life stages.

5. The method according to claim 4, characterized in that, The method further includes: In response to a single variable trend query command for the power module, the target test item corresponding to the target variable to be queried is determined; Based on the module identifier, obtain the test results of the power module under the target test item and corresponding to each stage of its life cycle; For each stage of the project test results, extract the variable test results of the target variable in the corresponding life stage from the stage project test results; Based on the time period of each of the aforementioned life stages and the test results of each of the aforementioned variables, the variable change trend of the power module in relation to the target variable is determined; Based on the changing trend of the variable, generate and display the variable trend display page for the target variable.

6. The method according to claim 4, characterized in that, The method further includes: In response to a test variable statistical analysis instruction for a power module production batch, the batch identifier, target test variable, and variable statistical parameters corresponding to the target test variable of the power module production batch are determined. Based on the batch identifier, obtain the variable test results of each batch of power modules included in the power module production batch under the target test variable; Based on the statistical parameters of the variables, the test results of each variable are statistically analyzed to obtain the parameter values ​​corresponding to the statistical parameters of the variables. Based on the parameter values ​​corresponding to the statistical parameters of the variables, a statistical analysis display page for the production batch of the module is generated and displayed.

7. The method according to any one of claims 4-6, characterized in that, The method further includes: In response to a lifetime prediction command for the power module, a lifetime prediction strategy is determined for each of the module components included in the power module. For each of the aforementioned module components, determine the key parameters of the lifetime prediction strategy corresponding to that module component; Based on the key parameters of the strategy, extract the key information for life prediction of the module components from the test results of each module; Based on the life prediction strategy and the key life prediction information, the life prediction of the module component is performed to obtain the remaining service life of the module component. The remaining service life of the power module is determined based on the remaining service life of each of the module components.

8. A testing device for a power module, characterized in that, The device includes: The instruction response module is used to respond to automated test instructions for the power module, and to determine the test items of the power module and the test order of the test items. The project testing module is used to perform project tests on the power module sequentially according to the test order and the test strategy matched with each of the test items, so as to obtain the module test results of the power module. The data storage module is used to send the test results of the power module to the data management subsystem for data storage based on the module identifier of the power module. The data management subsystem is used to perform full life cycle data management of the power module.

9. A data processing device for a power module, characterized in that, The device includes: The identifier acquisition module is used to acquire the module identifier of the power module in response to a full-cycle traceability command for the power module. The test result acquisition module is used to acquire the module test results of the power module at each stage of its life cycle based on the module identifier. The result sorting module is used to sort the test results of each module according to the stage order of each life stage to obtain a module test result sequence. The traceability query page display module is used to generate and display the traceability query page of the power module throughout its entire life cycle based on the sequence of test results of the module; the traceability query page throughout the entire life cycle includes the test results of each item obtained by the power module in each of the life stages.

10. A power module management system, characterized in that, The system includes a test subsystem and a data management subsystem that are interconnected. The test subsystem is used to test the power module and perform the method as described in any one of claims 1 to 3; The data management subsystem is used to perform full lifecycle data management of the power module and execute the method as described in any one of claims 4 to 7.

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