Sigma-delta adc testing trimming device and method

Abstract

This invention relates to the field of semiconductor testing technology, and in particular to a Σ-Δ ADC testing and adjustment device and method. The Σ-Δ ADC testing and adjustment device of this invention includes a test socket assembly for carrying the ADC under test and establishing a connection with the PCB through a low-inductance probe to achieve a resettable low-inductance contact; a two-stage impedance matching circuit for providing frequency adaptation for clock frequency adjustment; a dual control module, including an automatic control unit and a manual control unit; a digital-to-analog conversion and amplification module, including a digital-to-analog converter and a differential amplifier, wherein the digital input terminal of the digital-to-analog converter is connected to the logic output port of the dual control module, and the output terminal of the differential amplifier is used to connect to the differential input terminal of the ADC under test; a frequency testing module, connected to the clock output terminal of the ADC under test through a relay circuit, for detecting the clock frequency output by the ADC under test; and a logic signal acquisition module, connected to the digital output terminal of the ADC under test, for reading the analog-to-digital conversion logic signal of the ADC under test.

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