Defect plane positioning method and tool based on ultrasonic testing
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-07-15
- Publication Date
- 2026-08-11
AI Technical Summary
[0004]1.缺陷分析效率低下:因定位不准,在缺陷分析时,往往需要反复加工、检测、甚至为了便于观察,需要在加工后辅以腐蚀工序,整个过程耗时耗力
[0022]本发明的有益效果是:本发明,先采用探头在缺陷定位器等工具的配合下对试块的参考反射体进行标记,找出参考反射体的实际平面位置与测量平面位置之间的偏差,再利用同一探头探测出工件实际缺陷的测量平面位置,再结合试块确定出的偏差,找出工件实际缺陷的实际平面位置,这种方式,消除了探头自身由于制作工艺等因素引起的误差,将缺陷平面定位精度提升至±1mm以内。
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Figure CN122545663A_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of nondestructive testing technology, specifically relating to a defect plane localization method and tool based on ultrasonic testing. Background Technology
[0002] Ultrasonic testing, due to its strong penetration, high sensitivity, and relatively simple operation, has become the primary method for detecting internal defects in forgings. In actual testing, when a defect is found that affects the product's acceptable delivery, it is usually necessary to cut open the workpiece, locate the defect, and analyze it. For products that can be reused after the defect is removed according to standards, it is necessary to determine whether the defect can be removed and specify a salvage machining plan. Both defect analysis and salvage machining require precise spatial positioning of the defect. Currently, ultrasonic testing equipment can directly read the depth information of defects; as long as the sound velocity calibration is accurate, the precise depth and location of the defect can be easily determined (e.g., ...). Figure 1 (The height of the dashed line is shown). However, regarding the planar location of defects on the inspection surface, the industry generally adopts a simple approach, namely, as... Figure 2 As shown, the defect is assumed to be located directly below the center of the probe, with the center point of the probe (the center of the probe circle) as the reference point. Figure 2 Point A in the diagram is taken as the projection position of the defect on the inspection surface, i.e., the planar position of the defect.
[0003] This method is based on an ideal sound field model, where the sound pressure is highest along the ultrasonic beam axis (sound axis) when ultrasound propagates through a workpiece, and the strongest defect echo occurs at the intersection of the sound axis and the defect. However, in actual testing, due to factors such as probe manufacturing processes, the sound pressure along the sound axis is not necessarily the highest, and the location of the maximum sound pressure at different distances from the probe is not always completely consistent with the distance from the sound axis. Even probes of the same model can have different maximum sound pressure distributions. This leads to errors in commonly used industry processing methods. Specifically, the defect plane position determined by the probe center is not the actual plane position of the defect. For example, for a probe with a wafer diameter of φ20mm, the actual deviation in defect plane positioning can reach up to 10mm. This error causes the following serious problems:
[0004] 1. Low efficiency of defect analysis: Due to inaccurate location, defect analysis often requires repeated processing and inspection, and even corrosion processes after processing to facilitate observation. The whole process is time-consuming and labor-intensive. Moreover, because the defect size is usually small, coupled with the problem of inaccurate defect location, the probability of the defect being found is low.
[0005] 2. High Risk and Cost of Product Remediation: For valuable forgings (such as aero-engine discs) where standards allow for partial removal of defects before use, remediation plans require precise removal of the defective area. Traditionally, as a precaution, the estimated defect location is used as the center, extending outwards by 20-30mm as the starting boundary for removal. However, aero-engine forgings are designed with high precision and have limited machining allowances. Inaccurate positioning may result in the defect remaining in the workpiece after removal, causing the entire remediation process to fail and resulting in significant economic losses (high workpiece value, processing cycles lasting several months, and high processing costs).
[0006] For workpieces whose defects allow for continued use after removal, when the workpiece allowance is large enough, cutting is typically initiated 20-30mm from the defect to ensure its removal. However, for aerospace forgings, which are designed and manufactured with high precision and have smaller machining allowances, and which are generally high-value, heavy, and large workpieces requiring salvage, machining is usually calculated monthly, with costs in the tens of thousands of yuan. If, after machining is completed, the defect is found to be located within the part itself and cannot be removed, the losses will be enormous. Therefore, inaccurate defect location directly affects the execution of workpiece salvage.
[0007] Therefore, there is an urgent need to develop a method that can correct probe acoustic field offset and achieve high-precision planar positioning of internal defects in forgings, so as to improve the success rate of defect analysis and the benefits of product salvage. Summary of the Invention
[0008] The present invention aims to overcome the shortcomings of the prior art and provide a defect plane localization method and tool based on ultrasonic detection, thereby improving the localization accuracy of the defect plane position.
[0009] The technical solution adopted in this invention is: a defect plane localization method based on ultrasonic testing, comprising the following steps:
[0010] S1. Select a test block with a reference reflector having known geometric parameters, and make sure that the geometric parameters of the reference reflector are adapted to the equivalent geometric parameters of the defect to be tested, and determine the actual projection point P of the reference reflector on the test block detection surface;
[0011] S2. Using a probe with a directional marker, couple it to the test block detection surface, find the position of the maximum echo, and use the defect locator to transmit the position and direction information of the probe to the test block detection surface. Determine the test block measurement origin O on the test block detection surface, and establish a first coordinate system with the test block measurement origin O as the origin; and obtain the coordinates of the actual projection point P in the first coordinate system.
[0012] S3. Using the same probe from step S2, find the maximum echo of the real defect on the workpiece inspection surface, and transmit the position and direction information of the probe to the workpiece inspection surface through the defect locator, determine a workpiece measurement origin O', and establish a second coordinate system with the workpiece measurement origin O' as the origin and consistent with the direction of the first coordinate system.
[0013] S4. In the second coordinate system, obtain point F. The coordinates of point F in the second coordinate system are consistent with the coordinates of the actual projection point P in the first coordinate system. Point F is the actual projection position of the real defect on the workpiece inspection surface.
[0014] Furthermore, in step S1, the test block is a cylindrical flat-bottomed hole test block, the reference reflector is the flat-bottomed hole on the test block, and the actual projection point P is determined by a scribing ruler that matches the outer diameter of the test block.
[0015] Furthermore, the scribing ruler is in the shape of a round cap, and a cross-shaped scribing groove is provided at the center of the top of the cap, and the inner diameter of the side wall of the cap matches the diameter of the test block; in S1, the scribing ruler is first placed on the top of the test block, and then a cross is drawn on the test surface of the test block through the cross-shaped scribing groove, and the intersection of the cross is the actual projection point P.
[0016] Furthermore, the equivalent size of the reference reflector in the test block is adapted to the equivalent size of the actual defect in the workpiece under inspection, and the burial depth of the reference reflector in the test block is adapted to the burial depth of the actual defect in the workpiece under inspection.
[0017] Furthermore, the orientation mark is located in the non-wafer area of the probe; the defect locator includes a positioning concave ruler and a positioning convex ruler; the positioning concave ruler is a plate with a flat bottom surface, on which a semi-circular groove matching the outer diameter of the probe is provided, the semi-circular groove being perpendicular to the bottom surface of the positioning concave ruler and penetrating the positioning concave ruler; a reference line for centering with the orientation mark on the probe is provided on the top surface of the positioning concave ruler; the positioning convex ruler includes a convex ruler body and a limiting part, the convex ruler body being a disc shape matching the semi-circular groove of the positioning concave ruler, and having a cross-shaped scribe groove in the center. The limiting part is arranged around the outer periphery of the convex ruler body; when the convex ruler body is inserted into the semi-circular groove of the positioning concave ruler, the limiting part and the positioning concave ruler are assembled into a square block; in steps S2 and S4, after finding the maximum echo, fix the probe, place the semi-circular groove of the positioning concave ruler against the probe and align the reference line with the direction mark of the probe, fix the positioning concave ruler and remove the probe, then splice and position the positioning convex ruler and the positioning concave ruler, fix the positioning convex ruler and remove the positioning concave ruler, and finally determine the measurement origin O of the test block and the measurement origin O' of the workpiece through the cross-shaped scribe groove of the positioning convex ruler.
[0018] The defect plane positioning tool used in the above method includes a scribing ruler, a defect locator, and a probe with directional markings. The scribing ruler has a scribing structure I at its center for marking the actual projection point of the reference reflector on the test surface of the test block. The probe has directional markings. The defect locator includes a positioning concave ruler and a positioning convex ruler. The positioning concave ruler is a plate with a flat bottom surface and a semi-circular groove matching the outer diameter of the probe. The semi-circular groove is perpendicular to the bottom surface of the positioning concave ruler and penetrates through it. A reference line for centering with the directional markings on the probe is provided on the top surface of the positioning concave ruler. The positioning convex ruler is a disc-shaped structure that matches the semi-circular groove of the positioning concave ruler and has a scribing structure II at its center.
[0019] Furthermore, the scribing ruler is in the shape of a round cap, and a scribing structure is provided at the center of the top of the cap, and the inner diameter of the side wall of the cap matches the diameter of the test block.
[0020] Furthermore, the scribing structure is a cross-shaped scribing groove.
[0021] Furthermore, the second scribing structure is a cross-shaped scribing groove.
[0022] The beneficial effects of this invention are as follows: This invention first uses a probe, in conjunction with tools such as a defect locator, to mark the reference reflector of the test block, find the deviation between the actual plane position of the reference reflector and the measurement plane position, and then uses the same probe to detect the measurement plane position of the actual defect of the workpiece. Combined with the deviation determined by the test block, the actual plane position of the actual defect of the workpiece is found. This method eliminates the error caused by the probe itself due to factors such as manufacturing process, and improves the defect plane positioning accuracy to within ±1mm.
[0023] It is precisely because of the high accuracy of defect plane positioning that the success rate of defect dissection and finding is greatly improved, the search cycle is shortened, and the efficiency and probability of finding defects during defect analysis are increased; in the stage of planning to salvage products, the possibility and value of salvage can be accurately judged in advance, avoiding unnecessary waste of time and output value; in salvage processing, the amount of material removed can be minimized, the success rate of salvaging valuable forgings can be improved, and huge economic losses caused by positioning errors can be avoided.
[0024] Using a scribing ruler, a positioning concave ruler, and a positioning convex ruler for position transfer reduces errors caused by human judgment and probe characteristics, and improves the reliability of defect location results. Attached Figure Description
[0025] Figure 1 The main view is used to locate the defects in existing technology;
[0026] Figure 2 Top view for locating defects in existing technology;
[0027] Figure 3 This is a schematic diagram of how the actual projection point P is determined on the test surface of the test block using a scribing ruler, as disclosed in this invention.
[0028] Figure 4 This is a schematic diagram of the probe disclosed in this invention;
[0029] Figure 5 This is a schematic diagram of the positioning concave ruler disclosed in this invention;
[0030] Figure 6 This is a schematic diagram of the positioning concave ruler and probe cooperation disclosed in this invention;
[0031] Figure 7 This is a schematic diagram of the positioning convex ruler disclosed in this invention;
[0032] Figure 8 This is a schematic diagram of the splicing of the positioning concave ruler and the positioning convex ruler 3 disclosed in this invention;
[0033] Figure 9 A schematic diagram for determining the actual plane position and measurement plane position of the reference reflector on the test surface of the test block;
[0034] Figure 10 A schematic diagram showing the determination of the actual plane position of the reference reflector and the measurement plane position on the inspection surface of the workpiece.
[0035] In the figure, 1-marking ruler, 1-1-cross fork marking groove one, 2-positioning concave ruler, 2-1-semi-circular groove, 2-2-reference line, 3-positioning convex ruler, 3-1-cross fork marking groove two, 3-2-convex ruler body, 3-3-limiting part, 4-probe, 4-1-direction mark, 5-test block, 6-workpiece. Detailed Implementation
[0036] The present invention will be further described below with reference to the accompanying drawings and embodiments:
[0037] In this specification, unless otherwise stated, the terms "top," "bottom," etc., indicate the orientation or positional relationship based on the appendix. Figure 3 The orientation or positional relationship shown is for the purpose of describing the invention only, and is not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention.
[0038] The defect plane localization method based on ultrasonic testing includes the following steps:
[0039] S1. Prepare the calibration test block, which includes the following steps:
[0040] S11. Select a suitable test block: Select test block 5 with a reference reflector having known geometric parameters, and the geometric parameters of the reference reflector should be adapted to the equivalent geometric parameters of the defect to be tested.
[0041] The test block is generally a commonly used cylindrical flat-bottomed hole test block, with the flat-bottomed hole serving as a reference reflector.
[0042] Common hole diameters for standard flat-bottomed hole test blocks, both domestically and internationally, are φ0.4mm, φ0.8mm, φ1.2mm, φ2.0mm, and φ3.2mm. The probability of the actual defect equivalent size exactly matching these dimensions is extremely low. Therefore, test blocks are selected based on the principle of proximity; that is, the flat-bottomed hole size of the selected test block should be as close as possible to the defect equivalent size. For example, when the actual defect equivalent size is φ1.8mm, there are no standard flat-bottomed hole test blocks of this specification. φ1.8mm is closer to φ2.0mm, so a φ2.0mm test block is selected. Of course, if further improvement in accuracy is required, existing standard test blocks can be discarded, and new test blocks with the same hole diameter as the actual defect equivalent size can be fabricated.
[0043] The probability that the actual defect depth exactly matches the flat-bottom hole depth of the standard test block is also extremely small. Similarly, the test block should be selected according to the principle of proximity. The flat-bottom hole depth of the selected test block should be as close as possible to the defect depth. If further improvement in accuracy is required, a test block with the same depth as the actual defect can be made.
[0044] S12. Determine the actual projection point P: Determine the actual projection point P of the reference reflector (flat-bottomed hole) on the test surface of the selected test block. Whether it is a standard test block or a remade test block, the flat-bottomed hole is machined on the axis of the test block, that is, its projection on the test surface (incident surface) of the test block is located at the center of the test surface.
[0045] In order to accurately and quickly locate the actual projection point P on the test block, the following method is used: Figure 3 The scribing ruler 1 shown is in the shape of a round cap, with a cross-shaped scribing groove 1-1 at the center of the cap. The intersection of the cross-shaped scribing groove 1-1 coincides with the center of the cap's circle, and the inner diameter of the cap's side wall matches the diameter of the test block, allowing it to fit snugly onto the test block. Furthermore, the center of the cap's circle is aligned with the center of the test surface of the test block. In use, first, place the scribing ruler 1 on top of the test block, then draw lines on the test surface of the test block through the cross-shaped scribing groove 1-1. The intersection of the cross lines is the actual projection point P.
[0046] Of course, the scribing ruler 1 can also use other scribing structures, such as a small round hole set at the center of the top of the cover. As long as the actual projection point P can be determined quickly, accurately and clearly on the test surface of the test block, it is acceptable.
[0047] S2. Determine the measurement plane position of the calibration block defect:
[0048] like Figure 4 As shown, a mark is made on the non-wafer surface of probe 4 as direction mark 4-1. The position and method of the mark are not limited, as long as the mark is unique and easy to use. In this embodiment, a short vertical line is used. The probe 4 is coupled to the detection surface of the test block, and the probe is moved slightly back and forth and left and right. The echo of the flat-bottomed hole is observed on the ultrasonic flaw detector to find the position of the maximum echo and keep the probe stationary. The position and direction information of the probe 4 at this time are reflected to the detection surface of the test block through the defect locator. The measurement origin O of the test block is determined on the detection surface of the test block, and a first coordinate system is established with the measurement origin O of the test block as the origin. The coordinates of the actual projection point P in the first coordinate system are obtained.
[0049] To quickly and accurately determine the measurement origin O of the test block, a defect locator was designed, which includes a positioning concave ruler 2 and a positioning convex ruler 3. For example... Figure 5 As shown, the positioning recess 2 is a flat plate with a semi-circular groove 2-1 matching the outer diameter of the probe 4. The semi-circular groove 2-1 is perpendicular to and passes through the positioning recess 2, allowing the positioning recess 2 to fit snugly onto the outer circumference of the probe 4. A reference line 2-2 is provided on the top surface of the positioning recess 2 for alignment with the direction mark 4-1 on the probe 4. Thus, when the positioning recess 2 is fitted onto the outer circumference of the probe 4 and the direction mark 4-1 is aligned with the reference line 2-2, the position of the probe 4 on the test block is defined by the semi-circular groove 2-1 of the positioning recess 2. After removing the probe 4, the position of the maximum echo detected by the probe 4 is exposed. This position needs to be marked on the detection surface of the test block, and the positioning protrusion 3 serves this purpose. Figure 7 As shown, the positioning convex ruler 3 includes a convex ruler body 3-2 and a limiting part 3-3. The convex ruler body 3-2 is a disc-shaped part that matches the semi-circular groove 2-1 of the positioning concave ruler 2, and has a cross-shaped scribe groove 3-1 at its center. The limiting part 3-3 is arranged around the outer periphery of the convex ruler body 3-2. When the convex ruler body 3-2 is inserted into the semi-circular groove 2-1 of the positioning concave ruler 2, the limiting part 3-3 and the positioning concave ruler 2 are assembled into a square block. The convex ruler body 3-2 of the positioning convex ruler 3 is mainly used to replicate the position of the probe 4 on the test block and provides the cross-shaped scribe groove 3-1 for marking the detection surface of the test block. The limiting part 3-3 of the positioning convex ruler 3 is mainly used to cooperate with the end face of the positioning concave ruler 2, mutually limiting each other and preventing the convex ruler body 3-2 from rotating and changing position within the positioning concave ruler 2. Similar to the scribing structure of the scribing ruler 1, the positioning convex ruler 3 can also adopt other scribing structures besides the cross-shaped scribing groove 3-1, such as a small round hole set at its center.
[0050] When using it, firstly, as Figure 6As shown, the inner arc of the semi-circular groove 2-1 of the positioning recess 2 is tightly fitted to the outer circumference of the probe 4, and its reference line 2-2 is aligned with the direction mark 4-1 of the probe 4. Next, after fixing the positioning recess 2 in place, remove the probe 4, ensuring that the positioning recess 2 does not shift during the movement. Then, as... Figure 8 As shown, the positioning protrusion 3 is spliced in place. The positioning protrusion 3 and the positioning concave ruler 2 are then spliced into position, taking care to prevent the positioning concave ruler 2 from shifting. Next, the positioning protrusion 3 is fixed in place, and the positioning concave ruler 2 is removed, ensuring that the positioning protrusion 3 does not shift during the removal process. At this point, the orthographic projection of the intersection of the cross-shaped groove 3-1 on the test block's detection surface is the test block's measurement origin O. (As shown...) Figure 9 As shown, lines are drawn on the test surface of the test block through the crosshair scriber groove 2-1, and the intersection of the crosshairs is the measurement origin O of the test block. A first coordinate system XOY is established with the measurement origin O of the test block as the origin, and the coordinates of the actual projection point P in the first coordinate system are obtained.
[0051] S3. Determine the measurement plane position of the workpiece defect:
[0052] On the inspection surface of workpiece 6, use the same probe 4 from step S2 to find the point of maximum echo of the defect. Repeat step S2: fix probe 4 → position concave ruler 2 tightly against the outer circumferential surface of probe 4, and align reference line 2-2 with direction mark 4-1 → replace probe 4 with positioning convex ruler 3 and connect it with positioning concave ruler 2 → mark the workpiece measurement origin O' on the inspection surface of the workpiece using positioning convex ruler 3. Figure 10 As shown, with the workpiece measurement origin O' as the origin, a second coordinate system X'O'Y' is established that is completely consistent with the first coordinate system XOY (that is, the X' axis is in the same direction as the X axis, and the Y' axis is in the same direction as the Y axis).
[0053] S4. Determine the actual planar location of the workpiece defect:
[0054] In the second coordinate system, point F is obtained. The coordinates of point F in the second coordinate system are consistent with the coordinates of the actual projection point P in the first coordinate system. Point F is the actual projection position of the real defect on the workpiece inspection surface, i.e., the actual planar position. For example, assuming the coordinates of the actual projection point P in the first coordinate system are (1.2, 0.5), then the coordinates of point F in the second coordinate system are (1.2, 0.5). Based on the coordinates, i.e., the second coordinate system on the workpiece inspection surface, the actual planar position of the workpiece defect can be accurately marked, and a precise remediation plan can be formulated accordingly.
[0055] This ultrasonic-based defect planar localization method first uses probe 4, along with tools such as a defect locator, to mark the reference reflector of the test block. The deviation between the actual planar position of the reference reflector (the actual projection point on the detection surface) and the measurement plane position is then identified. Next, the same probe 4 is used to detect the measurement plane position of the actual defect in the workpiece. Combined with the deviation determined from the test block, the actual planar position of the defect is determined. This method eliminates errors caused by the probe itself due to manufacturing processes and other factors, improving the defect planar localization accuracy to within ±1mm. This high defect planar localization accuracy allows for faster and more accurate defect location during defect analysis. Furthermore, the accurate defect localization enables precise defect location during the product salvage planning stage, allowing for prior assessment of the possibility and value of salvage, avoiding unnecessary waste of time and production value.
[0056] To implement the above-mentioned defect plane localization method based on ultrasonic testing, a defect plane localization tool is required. The defect plane localization tool disclosed in this invention includes a scribing ruler 1, a defect locator, and a probe 4 with a direction mark 4-1. The scribing ruler 1 has a scribing structure 1 at its center, used to mark the actual projection point of the reference reflector on the test surface of the test block. The probe 4 is provided with the direction mark 4-1. The defect locator includes a positioning concave ruler 2 and a positioning convex ruler 3; the positioning concave ruler 2 is a plate-shaped plate with a flat bottom surface, and has a semi-circular groove 2-1 that matches the outer diameter of the probe 4. The semi-circular groove 2-1 is perpendicular to the bottom surface of the positioning concave ruler 2 and penetrates through the positioning concave ruler 2; a reference line 2-2 is provided on the top surface of the positioning concave ruler 2 for centering with the direction mark 4-1 on the probe 4, and the straight line containing the reference line 2-2 passes through the center of the semi-circular groove 2-1; the positioning convex ruler 3 is a disc-shaped structure that matches the semi-circular groove 2-1 of the positioning concave ruler 2, and has a scribing structure 2 at its center.
[0057] The scribing ruler 1 is in the shape of a round cover, and a scribing structure is provided at the center of the top of the cover. The inner diameter of the side wall of the cover matches the diameter of the test block.
[0058] The first marking structure is a cross-shaped marking groove 1-1, the intersection of which coincides with the center of the top circle of the cover. The second marking structure is a cross-shaped marking groove 3-1.
[0059] This defect plane positioning tool has a simple structure and is easy to use. It accurately locates the target point through position transmission, reduces human judgment error, and improves the repeatability and reliability of positioning results.
[0060] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A defect plane localization method based on ultrasonic testing, characterized in that, Includes the following steps: S1. Select a test block with a reference reflector having known geometric parameters, and make sure that the geometric parameters of the reference reflector are adapted to the equivalent geometric parameters of the defect to be tested, and determine the actual projection point P of the reference reflector on the test block detection surface; S2. Using a probe (4) with a direction mark (4-1) coupled to the test block detection surface, find the position of the maximum echo, and use the defect locator to reflect the position and direction information of the probe (4) to the test block detection surface. Determine the test block measurement origin O on the test block detection surface, and establish the first coordinate system with the test block measurement origin O as the origin; and obtain the coordinates of the actual projection point P in the first coordinate system. S3. Using the same probe (4) from step S2, find the maximum echo of the real defect on the workpiece inspection surface, and transmit the position and direction information of the probe (4) to the workpiece inspection surface through the defect locator, determine a workpiece measurement origin O', and establish a second coordinate system with the workpiece measurement origin O' as the origin and consistent with the direction of the first coordinate system. S4. In the second coordinate system, obtain point F. The coordinates of point F in the second coordinate system are consistent with the coordinates of the actual projection point P in the first coordinate system. Point F is the actual projection position of the real defect on the workpiece inspection surface.
2. The defect plane localization method based on ultrasonic testing according to claim 1, characterized in that, In step S1, the test block is a cylindrical flat-bottomed hole test block, the reference reflector is the flat-bottomed hole on the test block, and the actual projection point P is determined by a scribing ruler (1) that matches the outer diameter of the test block.
3. The defect plane localization method based on ultrasonic testing according to claim 2, characterized in that, The scribing ruler (1) is in the shape of a round cover, and a cross-shaped scribing groove (1-1) is opened at the center of the top of the cover, and the inner diameter of the side wall of the cover matches the diameter of the test block. In S1, first place the scribing ruler (1) on the top of the test block, and then draw a cross on the test surface of the test block through the cross scribing groove (1-1). The intersection of the cross is the actual projection point P.
4. The defect plane localization method based on ultrasonic testing according to claim 2, characterized in that, The equivalent size of the reference reflector in the test block is adapted to the equivalent size of the actual defect in the workpiece under inspection, and the burial depth of the reference reflector in the test block is adapted to the burial depth of the actual defect in the workpiece under inspection.
5. The defect plane localization method based on ultrasonic testing according to claim 3, characterized in that, The orientation mark (4-1) is located in the non-crystal area of the probe (4); The defect locator includes a positioning concave ruler (2) and a positioning convex ruler (3); the positioning concave ruler (2) is a plate with a flat bottom surface, and a semi-circular groove (2-1) matching the outer diameter of the probe (4) is provided on it. The semi-circular groove (2-1) is perpendicular to the bottom surface of the positioning concave ruler (2) and penetrates through the positioning concave ruler (2); a reference line (2-2) is provided on the top surface of the positioning concave ruler (2) for centering with the direction mark (4-1) on the probe (4). The positioning convex ruler (3) includes a convex ruler body (3-2) and a limiting part (3-3). The convex ruler body (3-2) is in the shape of a disc that matches the semi-circular groove (2-1) of the positioning concave ruler (2), and a cross-shaped scribe groove (3-1) is provided in the center. The limiting part (3-3) is arranged around the outer periphery of the convex ruler body (3-2). When the convex ruler body (3-2) is inserted into the semi-circular groove (2-1) of the positioning concave ruler (2), the limiting part (3-3) and the positioning concave ruler (2) are assembled into a square block. In steps S2 and S4, after finding the maximum echo, fix the probe (4), attach the semi-circular groove (2-1) of the positioning concave ruler (2) to the probe (4) and align the reference line (2-2) with the direction mark (4-1) of the probe (4). After fixing the positioning concave ruler (2), remove the probe (4), then splice the positioning convex ruler (3) with the positioning concave ruler (2) for positioning. After fixing the positioning convex ruler (3), remove the positioning concave ruler (2). Finally, determine the measurement origin O of the test block and the measurement origin O' of the workpiece through the cross-shaped scribe groove (3-1) of the positioning convex ruler (3).
6. A defect plane positioning tool for implementing the method as described in claim 1, characterized in that, Includes a scribing ruler (1), a defect locator, and a probe (4) with directional markings (4-1); The scribing ruler (1) has a scribing structure 1 at its center, which is used to mark the actual projection point of the reference reflector on the test surface of the test block; The probe (4) is equipped with a direction mark (4-1); The defect locator includes a positioning concave ruler (2) and a positioning convex ruler (3); the positioning concave ruler (2) is a plate with a flat bottom surface, and a semi-circular groove (2-1) matching the outer diameter of the probe (4) is provided on it. The semi-circular groove (2-1) is perpendicular to the bottom surface of the positioning concave ruler (2) and penetrates through the positioning concave ruler (2); a reference line (2-2) is provided on the top surface of the positioning concave ruler (2) for centering with the direction mark (4-1) on the probe (4); the positioning convex ruler (3) is a disc-shaped structure matching the semi-circular groove (2-1) of the positioning concave ruler (2), and a scribing structure II is provided in the center.
7. The defect plane positioning tool according to claim 6, characterized in that, The scribing ruler (1) is in the shape of a round cover, and a scribing structure is provided at the center of the top of the cover, and the inner diameter of the side wall of the cover matches the diameter of the test block.
8. The defect plane positioning tool according to claim 7, characterized in that, The first scribing structure is a cross-shaped scribing groove (1-1).
9. The defect plane positioning tool according to claim 6, characterized in that, The second scribing structure is a cross-shaped scribing groove (3-1).