Testing device of image sensor

Abstract

The utility model provides a testing device of an image sensor. The testing device of the image sensor comprises a mounting bracket; the mobile platform is movably arranged on the mounting bracket along a main scanning direction and an auxiliary scanning direction, the mobile platform is provided with a mounting station for mounting an image sensor to be detected, and the main scanning direction is vertical to the auxiliary scanning direction; the test sample sheet is arranged on the mounting bracket, extends along the main scanning direction and comprises a plurality of test areas along the auxiliary scanning direction, and the plurality of test areas at least comprise a photosensitive chip position test area and a lens position test area; the to-be-detected image sensor is driven by the mobile platform to shoot the test specimen along the main scanning direction and the auxiliary scanning direction, so that the to-be-detected image sensor is tested. According to the utility model, the problem of single test aspect of the test of the image sensor in the prior art is solved.

Description

Technical Field

[0001] The utility model relates to the field of image sensor detection, in particular to a testing device for an image sensor. Background Art

[0002] With the development of the scanning field, contact image sensors (CIS) are gradually applied to various devices. Compared with traditional cameras, they have obvious advantages in spatial installation, defect identification, length measurement, etc.

[0003] The current factory calibration test of image sensors is usually static calibration, that is, the image sensor is placed statically on a white sample, and then the light and dark output data of the image sensor is obtained, and the image correction coefficient is calculated based on the light and dark output data. However, since the image sensor is static, it cannot be guaranteed that there is no dirt or other factors that affect the reflection directly below the image sensor on the white sample, so the scanned image of the image sensor after the final calibration will inevitably have problems such as black lines and white lines. In addition, due to the limitations of the manufacturing process, it is inevitable that there will be defective photosensitive chips in the production process of image sensors. Figure 3 As shown, the photosensitive part of the image sensor is composed of multiple photosensitive chips arranged and spliced ​​along a straight line. Affected by the manufacturing process of the photosensitive chips, the individual photosensitive chips have different output linearity. The manufacturing process of the photosensitive chips is affected by the accuracy of the bonding process, and there may be excessive gaps and vertical misalignment between adjacent photosensitive chips. In addition, if the lens of the image sensor is not installed in place, the scanning clarity of the product will deteriorate. These problems will eventually affect the imaging effect, but there is currently no suitable testing device for these problems.

[0004] That is to say, the image sensor test in the prior art has the problem of single testing aspect. Utility Model Content

[0005] The main purpose of the utility model is to provide a testing device for an image sensor, so as to solve the problem that the testing of the image sensor in the prior art has a single testing aspect.

[0006] In order to achieve the above-mentioned purpose, the utility model provides a testing device for an image sensor, comprising: a mounting bracket; a moving platform, the moving platform is movably arranged on the mounting bracket along a main scanning direction and a sub-scanning direction, the moving platform has an installation station for installing an image sensor to be detected, and the main scanning direction is perpendicular to the sub-scanning direction; a test sample, the test sample is arranged on the mounting bracket, and the test sample extends along the main scanning direction, the test sample includes a plurality of test areas along the sub-scanning direction, and the plurality of test areas at least include a photosensitive chip position test area and a lens position test area, the image sensor to be detected is driven by the moving platform to shoot the test sample along the main scanning direction and the sub-scanning direction, so as to test the image sensor to be detected.

[0007] Furthermore, the photosensitive chip position test area includes a plurality of oblique lines, the plurality of oblique lines are all arranged obliquely to the main scanning direction, and the plurality of oblique lines are arranged in sequence along the main scanning direction.

[0008] Further, projections of two adjacent oblique lines among the plurality of oblique lines in the main scanning direction at least partially overlap; and / or two adjacent oblique lines among the plurality of oblique lines are arranged in parallel.

[0009] Furthermore, the inclination angle c of the oblique line relative to the main scanning direction is greater than or equal to 40° and less than or equal to 50°; and / or the width of the oblique line is less than or equal to 0.15 mm, the length of the oblique line is greater than or equal to 7 mm and less than or equal to 8.5 mm; and / or the spacing between two adjacent oblique lines among the multiple oblique lines is greater than or equal to 3.5 mm and less than or equal to 4.5 mm.

[0010] Furthermore, the multiple test areas also include a dark correction area, a bright correction area, a photosensitive chip fault detection area, and the dark correction area, the bright correction area, the photosensitive chip fault detection area, the photosensitive chip position test area and the lens position test area are arranged sequentially along the sub-scanning direction.

[0011] Furthermore, the dark correction area is a black area, and the bright correction area is a white area.

[0012] Furthermore, the photosensitive chip step difference detection area includes a first gray area, a blank area and a second gray area in sequence along the sub-scanning direction, and the blank area has a black line extending along the main scanning direction.

[0013] Furthermore, the lens position test area is a line array area, and the line array area is composed of a plurality of lines, and the plurality of lines are arranged at intervals along the main scanning direction and extend along the sub-scanning direction.

[0014] Furthermore, the width of the line is less than or equal to 1.2 mm, the length of the line is greater than or equal to 5.0 mm and less than or equal to 5.8 mm; and / or the spacing between two adjacent lines in the plurality of lines is greater than or equal to 0.2 mm and less than or equal to 0.3 mm.

[0015] Furthermore, the image sensor testing device also includes a control structure and a terminal structure, the terminal structure is electrically connected to the control structure, and the control structure is electrically connected to the mobile platform.

[0016] By applying the technical solution of the utility model, a testing device for an image sensor comprises a mounting bracket, a mobile platform and a test sample, wherein the mobile platform is movably arranged on the mounting bracket along a main scanning direction and a sub-scanning direction, the mobile platform has an installation station for installing an image sensor to be detected, and the main scanning direction is perpendicular to the sub-scanning direction; the test sample is arranged on the mounting bracket, and the test sample extends along the main scanning direction, the test sample comprises a plurality of test areas along the sub-scanning direction, the plurality of test areas at least comprise a photosensitive chip position test area and a lens position test area, the image sensor to be detected is driven by the mobile platform to shoot the test sample along the main scanning direction and the sub-scanning direction, thereby testing the image sensor to be detected.

[0017] The mounting bracket provides mounting space for the mobile platform and the test sample, which is beneficial to ensuring the stability of the process in which the mobile platform drives the image sensor to be tested to move to shoot the test sample along the main scanning direction and the sub-scanning direction. Since the test sample includes multiple test areas, the multiple test areas include at least a photosensitive chip position test area and a lens position test area. It is possible to determine whether the photosensitive chip in the image sensor to be tested has a misaligned arrangement or a large gap based on the image obtained by shooting the photosensitive chip position test area with the image sensor to be tested, and it is possible to determine whether the lens in the image sensor to be tested is installed in place based on the image obtained by shooting the lens position test area with the image sensor to be tested, thereby realizing the detection and correction of the device in the image sensor to be tested and increasing the test direction. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The drawings constituting part of the present application are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation on the present invention. In the drawings:

[0019] Figure 1 A schematic structural diagram of an image sensor testing device according to an optional embodiment of the utility model is shown;

[0020] Figure 2 Shows Figure 1 Schematic diagram of the test sample in ;

[0021] Figure 3 A schematic diagram showing the arrangement of multiple photosensitive chips of an image sensor to be tested in the prior art is shown;

[0022] Figure 4 Shows Figure 1 The image sensor testing device captures an image of the photosensitive chip fault detection area;

[0023] Figure 5 Shows Figure 1 The image sensor testing device captures an image of a test area of ​​a photosensitive chip position;

[0024] Figure 6 Shows Figure 1 The image sensor test device captures an image of the lens position test area.

[0025] The above drawings include the following reference numerals:

[0026] 10. Mounting bracket; 20. Moving platform; 30. Test sample; 31. Dark correction area; 32. Bright correction area; 33. Photosensitive chip break detection area; 331. First gray area; 332. Blank area; 333. Second gray area; 34. Photosensitive chip position test area; 35. Lens position test area; 40. Image sensor to be tested; 41. Photosensitive chip; 50. Control structure; 60. Terminal structure; 71. Main scanning direction; 72. Sub-scanning direction. DETAILED DESCRIPTION

[0027] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present utility model will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0028] It should be noted that, unless otherwise specified, all technical and scientific terms used in this application have the same meanings as commonly understood by ordinary technicians in the technical field to which this application belongs.

[0029] In the present invention, unless otherwise specified, the directional words used, such as "up, down, top, bottom", usually refer to the directions shown in the drawings, or to the components themselves in the vertical, perpendicular or gravity directions; similarly, for ease of understanding and description, "inside and outside" refer to the inside and outside relative to the outline of each component itself, but the above-mentioned directional words are not used to limit the present invention.

[0030] In order to solve the problem of single testing aspect in the testing of image sensors in the prior art, the utility model provides a testing device for an image sensor.

[0031] like Figures 1 to 6As shown, the image sensor testing device includes a mounting bracket 10, a moving platform 20 and a test sample 30. The moving platform 20 is movably arranged on the mounting bracket 10 along a main scanning direction 71 and a sub-scanning direction 72. The moving platform 20 has an installation station for installing an image sensor 40 to be detected, and the main scanning direction 71 is perpendicular to the sub-scanning direction 72. The test sample 30 is arranged on the mounting bracket 10, and the test sample 30 extends along the main scanning direction 71. The test sample 30 includes a plurality of test areas along the sub-scanning direction 72, and the plurality of test areas include at least a photosensitive chip position test area 34 and a lens position test area 35. The image sensor 40 to be detected is driven by the moving platform 20 to shoot the test sample 30 along the main scanning direction 71 and the sub-scanning direction 72, so as to test the image sensor 40 to be detected.

[0032] The mounting bracket 10 provides mounting space for the mobile platform 20 and the test sample 30, which helps to ensure the stability of the process in which the mobile platform 20 drives the image sensor to be tested to move to shoot the test sample 30 along the main scanning direction 71 and the sub-scanning direction 72. Since the test sample 30 includes multiple test areas, the multiple test areas include at least a photosensitive chip position test area 34 and a lens position test area 35. It is possible to determine whether the photosensitive chip 41 in the image sensor to be tested has a misaligned arrangement or a large gap based on the image obtained by shooting the photosensitive chip position test area 34 by the image sensor to be tested 40, and it is possible to determine whether the lens in the image sensor to be tested is installed in place based on the image obtained by shooting the lens position test area 35 by the image sensor to be tested 40, thereby realizing the detection and correction of the device in the image sensor to be tested 40 and increasing the test direction.

[0033] In an optional embodiment of the present application, the mounting bracket 10 of the present application has a first slide rail and a second slide rail, the second slide rail extends along the main scanning direction 71, the first slide rail extends along the sub-scanning direction 72, and the first slide rail is slidably connected to the second slide rail, and the mobile platform 20 is arranged on the first slide rail. The movement of the mobile platform 20 on the first slide rail drives the image sensor 40 to be detected to scan the test sample 30 along the sub-scanning direction 72, and the movement of the first slide rail on the second slide rail drives the image sensor 40 to be detected to scan the test sample 30 along the main scanning direction 71. Of course, the mounting bracket 10 of the present application may not be in this form, as long as the mobile platform 20 can move along the main scanning direction 71 and the sub-scanning direction 72.

[0034] like Figure 1As shown, the image sensor testing device also includes a control structure 50 and a terminal structure 60. The terminal structure 60 is electrically connected to the control structure 50, and the control structure 50 is electrically connected to the mobile platform 20. At the same time, the image sensor 40 to be tested is electrically connected to the terminal structure 60. In the present application, the terminal structure 60 is a computer, which is installed with testing software and image processing software. The image captured by the image sensor 40 to be tested is transmitted to the computer for image processing.

[0035] like Figure 2 As shown, the photosensitive chip position test area 34 includes a plurality of oblique lines, and the plurality of oblique lines are arranged obliquely to the main scanning direction 71, and the plurality of oblique lines are arranged in sequence along the main scanning direction 71, and two adjacent oblique lines among the plurality of oblique lines are arranged in parallel, and the projections of two adjacent oblique lines among the plurality of oblique lines on the main scanning direction 71 at least partially overlap. By reasonably setting the arrangement of the plurality of oblique lines, when the image sensor 40 to be detected shoots the photosensitive chip position test area 34, the arrangement of the plurality of photosensitive chips 41 in the image sensor 40 to be detected can be judged according to the arrangement of the pixels formed by the oblique lines. Specifically, when two adjacent groups of pixels among the plurality of groups of pixels formed by the oblique lines are offset, there is a misalignment or a large gap between two connected photosensitive chips 41 among the plurality of photosensitive chips 41. The situation where two adjacent groups of pixels among the plurality of groups of pixels formed by the oblique lines mentioned here are offset specifically refers to the situation where two adjacent groups of pixels are offset in the secondary scanning direction 72, refer to Figure 5 shown.

[0036] Specifically, the inclination angle c of the oblique line relative to the main scanning direction 71 is greater than or equal to 40° and less than or equal to 50°; the width of the oblique line is less than or equal to 0.15 mm, the length of the oblique line is greater than or equal to 7 mm and less than or equal to 8.5 mm; the spacing between two adjacent oblique lines in the plurality of oblique lines is greater than or equal to 3.5 mm and less than or equal to 4.5 mm. In a specific embodiment of the present application, the inclination angle c of the oblique line relative to the main scanning direction 71 is 45°, the width of the oblique line is 0.13 mm, the length of the oblique line is 7.7 mm, the spacing between two adjacent oblique lines in the plurality of oblique lines is 4.06 mm, and the grayscale density gamma of the oblique line is 1.72, and the length, width and inclination angle of the plurality of oblique lines are equal.

[0037] like Figure 2As shown, the multiple test areas of the test sample 30 also include a dark correction area 31, a bright correction area 32, and a photosensitive chip step error detection area 33. The dark correction area 31, the bright correction area 32, the photosensitive chip step error detection area 33, the photosensitive chip position test area 34 and the lens position test area 35 are arranged in sequence along the sub-scanning direction 72, and the dark correction area 31, the bright correction area 32, the photosensitive chip step error detection area 33, the photosensitive chip position test area 34 and the lens position test area 35 are formed by printing.

[0038] Specifically, the dark correction area 31 is a black area, and the grayscale density gamma of the black area is 1.72. The bright correction area 32 is a white area, and the grayscale density gamma of the white area is 0.05. The dark correction area 31 is used to perform dark correction on the image sensor 40 to be detected, and the bright correction area 32 is used to perform dynamic bright correction on the image sensor 40 to be detected.

[0039] like Figure 2 As shown, the photosensitive chip step difference detection area 33 includes a first gray area 331, a blank area 332, and a second gray area 333 in sequence along the secondary scanning direction 72. The blank area 332 has a black line extending along the main scanning direction 71, and the black line is located at the center of the blank area 332. The grayscale values ​​of the first gray area 331 and the second gray area 333 are the same, and the grayscale density gamma of the first gray area 331 and the second gray area 333 are both 0.4. The step differences of multiple photosensitive chips 41 of the image sensor 40 to be detected are measured by the first gray area 331, the blank area 332, and the second gray area 333 to test the uniformity of the multiple photosensitive chips 41. Figure 4 When a photosensitive chip 41 has poor linearity, the grayscale image of the corresponding position captured will be dark or bright.

[0040] like Figure 2 As shown, the lens position test area 35 is a line array area, which is composed of multiple lines arranged in parallel, and the multiple lines are arranged at intervals along the main scanning direction 71 and extend along the sub-scanning direction 72. Multiple lines are arranged at a high density, the width and height of the multiple lines are equal, and the spacing between any two adjacent lines in the multiple lines is equal. The width of the line is less than or equal to 1.2mm, the length of the line is greater than or equal to 5.0mm and less than or equal to 5.8mm; the spacing between any two adjacent lines in the multiple lines is greater than or equal to 0.2mm and less than or equal to 0.3mm. In a specific embodiment of the present application, the width of the line is 0.13mm, the length of the line is 5.4mm, the spacing between two adjacent lines is 0.25mm, and the grayscale density gamma of the line is 1.72. The lens position test area 35 is used to determine whether the lens in the image sensor 40 to be detected is installed in place.

[0041] In an optional embodiment of the present application, Figure 2 As shown, the area of ​​the bright correction area 32 is larger than the sum of the areas of the dark correction area 31, the photosensitive chip fault detection area 33, the photosensitive chip position test area 34 and the lens position test area 35. The area of ​​the dark correction area 31 can be designed to be equal to the sum of the areas of the photosensitive chip fault detection area 33, the photosensitive chip position test area 34 and the lens position test area 35. Of course, the areas of the above areas can be adjusted according to actual conditions and are not limited thereto.

[0042] When the image sensor testing device of the present application is working, it will first perform dynamic correction on the image sensor 40 to be tested: the terminal structure 60 sends a start command to the control structure 50, and the control structure 50 controls the mobile platform 20 to move until the dark correction area 31 of the test sample 30 is directly below the image sensor 40 to be tested and then stops. After that, the image sensor 40 to be tested will perform dark correction. After the dark correction is completed, the bright correction area 32 of the test sample 30 will move at a constant speed at the focal position of the image sensor to be detected 40. At this time, it is necessary to ensure that the moving speed of the mobile platform 20 needs to match the scanning speed of the image sensor to be detected 40. At this time, the mobile platform 20 stops moving, and the image sensor to be detected 40 will scan and obtain an image of the bright correction area 32 without bright correction and transmit it to the terminal structure 60. The terminal structure 60 calculates the bright correction coefficient based on the image, and the software algorithm will remove abnormal pixels in the image. After the removal is completed, dozens or even hundreds of rows of data can be selected to average and calculate the correction coefficient of each pixel of the image sensor to be detected 40, and then the correction coefficient is written into the image sensor to be detected 40 through the data line, and the correction process is completed. Compared with the traditional method of taking only a few rows of data inside the image sensor to calculate the correction coefficient, this method has a higher success rate and more accurate calculation of the correction coefficient.

[0043] After the calibration is completed, the terminal structure 60 sends a scanning command, the image sensor 40 to be detected starts scanning, and the mobile platform 20 continues to move to scan the remaining graphics of the test sample 30. Figure 2 The abnormality of the images generated by each part determines whether there is a corresponding problem in the image sensor 40 to be detected. For example, Figure 4 Poor linearity of a photosensitive chip 41 in the image sensor 40 to be detected may cause the grayscale image at the position corresponding to the photosensitive chip discontinuity detection area 33 to be dark or bright; Figure 5If the adjacent photosensitive chips 41 in the image sensor 40 to be detected are misaligned or the gap is too large, the scanned image at the corresponding position of the photosensitive chip position test area 34 will be misaligned; if the lens of the image sensor 40 to be detected is not installed in place, the focus position of the image sensor 40 to be detected will be out of the designed position, and finally the image formed in the lens position test area 35 will be unclear. Figure 6 The left picture shows an unclear scanned image, and the right picture shows a clear scanned image.

[0044] Obviously, the embodiments described above are only some embodiments of the utility model, not all embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the utility model.

[0045] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0046] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein.

[0047] The above description is only the preferred embodiment of the utility model, and is not intended to limit the utility model. For those skilled in the art, the utility model can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A testing device for an image sensor, characterized in that: include: Mounting bracket (10); A movable platform (20), the movable platform (20) being movably arranged on the mounting bracket (10) along a main scanning direction (71) and a sub-scanning direction (72), the movable platform (20) having an installation position for installing an image sensor (40) to be detected, the main scanning direction (71) being perpendicular to the sub-scanning direction (72); A test sample (30), wherein the test sample (30) is arranged on the mounting bracket (10), and the test sample (30) extends along the main scanning direction (71), and the test sample (30) includes a plurality of test areas along the sub-scanning direction (72), and the plurality of test areas at least include a photosensitive chip position test area (34) and a lens position test area (35), and the image sensor (40) to be detected is driven by the moving platform (20) to shoot the test sample (30) along the main scanning direction (71) and the sub-scanning direction (72), thereby testing the image sensor (40) to be detected.

2. The image sensor testing device according to claim 1, characterized in that: The photosensitive chip position test area (34) comprises a plurality of oblique lines, the plurality of oblique lines are arranged obliquely to the main scanning direction (71), and the plurality of oblique lines are arranged in sequence along the main scanning direction (71).

3. The image sensor testing device according to claim 2, characterized in that: The projections of two adjacent oblique lines among the plurality of oblique lines in the main scanning direction (71) at least partially overlap; and / or the projections of two adjacent oblique lines among the plurality of oblique lines are arranged in parallel.

4. The image sensor testing device according to claim 2, characterized in that: The inclination angle c of the oblique line relative to the main scanning direction (71) is greater than or equal to 40° and less than or equal to 50°; and / or The width of the oblique line is less than or equal to 0.15 mm, and the length of the oblique line is greater than or equal to 7 mm and less than or equal to 8.5 mm; and / or The distance between two adjacent oblique lines among the plurality of oblique lines is greater than or equal to 3.5 mm and less than or equal to 4.5 mm.

5. The image sensor testing device according to claim 1, characterized in that: The plurality of test areas further include a dark correction area (31), a bright correction area (32), and a photosensitive chip step error detection area (33); the dark correction area (31), the bright correction area (32), the photosensitive chip step error detection area (33), the photosensitive chip position test area (34), and the lens position test area (35) are sequentially arranged along the secondary scanning direction (72).

6. The image sensor testing device according to claim 5, characterized in that: The dark correction area (31) is a black area, and the bright correction area (32) is a white area.

7. The image sensor testing device according to claim 5, characterized in that: The photosensitive chip step detection area (33) includes a first gray area (331), a blank area (332) and a second gray area (333) in sequence along the secondary scanning direction (72), and the blank area (332) has a black line extending along the primary scanning direction (71).

8. The image sensor testing device according to claim 1, characterized in that: The lens position test area (35) is a line array area, and the line array area is composed of a plurality of lines, and the plurality of lines are arranged at intervals along the main scanning direction (71) and extend along the sub-scanning direction (72).

9. The image sensor testing device according to claim 8, characterized in that: The width of the line is less than or equal to 1.2 mm, and the length of the line is greater than or equal to 5.0 mm and less than or equal to 5.8 mm; and / or A distance between two adjacent lines among the plurality of lines is greater than or equal to 0.2 mm and less than or equal to 0.3 mm.

10. The image sensor testing device according to any one of claims 1 to 9, characterized in that: The image sensor testing device further comprises a control structure (50) and a terminal structure (60); the terminal structure (60) is electrically connected to the control structure (50); and the control structure (50) is electrically connected to the mobile platform (20).

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