Power line plugging test system

Abstract

The utility model provides a power line plugging test system. The power line plugging test system comprises a power supply extension socket, a power line, a power supply extension socket, a control unit and a relay, the power line is electrically connected to the power supply extension socket and the power supply extension socket, the power supply extension socket is electrically connected with a to-be-tested instrument system, the to-be-tested instrument system is in communication connection with the control unit, and the relay is connected to a live wire of the power line in series and electrically connected with the control unit; the control unit comprises a single-chip microcomputer and a switch tube, the switch tube is electrically connected with the single-chip microcomputer and the relay, and the single-chip microcomputer is in communication connection with the instrument system to be tested. According to the utility model, the on-off of the switch tube is controlled by the program of the single-chip microcomputer, the on-off of the relay is further controlled, the power-down scene on the instrument is simulated, and the interaction between the single-chip microcomputer and the instrument to be tested is realized through serial communication so as to realize the automatic test, thereby improving the test efficiency of the performance test of the instrument to be tested.

Description

Technical Field

[0001] The utility model relates to the technical field of medical equipment testing, in particular to a power line plugging and unplugging testing system. Background Art

[0002] Most existing medical products are powered by AC (alternating current power) and batteries. It is inevitable that the products will experience abnormal power failure during use, such as when the battery is not in place or damaged, the power cord is loose or there is a power outage, and the battery becomes loose due to vibration of the instrument when the AC is not in place. For medical instruments, even in such abnormal use situations, medical products need to ensure that they can work normally, that is, they need to be powered on quickly under abnormal conditions to ensure that the product works normally and thus protect the patient's life safety; therefore, it is necessary to perform multiple power-on and power-off simulation tests on the instrument during the development stage of the product (especially therapeutic products) to observe the instrument status at each power-off and restart. However, in order to monitor the status of each test in real time, manual testing is usually used in related technologies, which is time-consuming and labor-intensive, and has low test efficiency. Utility Model Content

[0003] The utility model provides a power cord plugging and unplugging test system, aiming to solve the problem of low efficiency of manual testing in related technologies.

[0004] In order to solve the above technical problems, the utility model provides a power cord plug and unplug test system, including: a power strip, a power cord, a power supply strip, a control unit and a relay; the power cord is electrically connected to the power strip and the power supply strip respectively, the power supply strip is used to electrically connect to an instrument system to be tested, the instrument system to be tested is communicatively connected to the control unit, the relay is connected in series to the live wire of the power cord and is electrically connected to the control unit; the control unit includes a single-chip microcomputer and a switch tube, the switch tube is electrically connected to the single-chip microcomputer and the relay respectively, and the single-chip microcomputer is communicatively connected to the instrument system to be tested.

[0005] Furthermore, the gate of the switch tube is electrically connected to the input and output interface of the single-chip microcomputer, the drain of the switch tube is electrically connected to the relay, and the source of the switch tube is grounded.

[0006] Furthermore, the control unit also includes a first resistor, a second resistor and a third resistor; the first resistor is electrically connected between the single-chip microcomputer and the gate of the switching tube; the two ends of the second resistor are electrically connected to the gate and source of the switching tube respectively; one end of the third resistor is electrically connected to the drain of the switching tube, and the other end of the third resistor is electrically connected to the relay.

[0007] Furthermore, the first end of the relay is electrically connected to the power supply, the second end of the relay is electrically connected to the third resistor, the third end and the fourth end of the relay are both electrically connected to the first end of the live wire, and the fifth end and the sixth end of the relay are both electrically connected to the second end of the live wire.

[0008] Furthermore, the power cord plug and unplug test system also includes a diode, the anode of the diode is electrically connected to the common connection end of the third resistor and the relay, and the cathode of the diode is electrically connected to the first end of the relay.

[0009] Furthermore, the power cord plug and unplug test system also includes a first capacitor and a second capacitor, one end of the first capacitor and the second capacitor are both electrically connected to the first end of the relay, and the other ends of the first capacitor and the second capacitor are both grounded.

[0010] Furthermore, the instrument system under test includes multiple instruments under test, and the power input end of each of the instruments under test is electrically connected to the power strip; the first serial port of the first instrument under test is communicatively connected to the single-chip microcomputer, and the second serial port of the first instrument under test is communicatively connected to the first serial port of the next instrument under test; the first serial port and the second serial port of the last instrument under test are both communicatively connected to the single-chip microcomputer; the first serial ports of the remaining instruments under test are respectively communicatively connected to the second serial ports of the previous instrument under test, and the second serial ports of the remaining instruments under test are respectively communicatively connected to the first serial port of the next instrument under test.

[0011] Furthermore, the instrument system includes multiple instruments under test, the power input end of each of the instruments under test is electrically connected to the power strip, and the first serial port and the second serial port of the power input end of each of the instruments under test are communicatively connected to the single-chip microcomputer.

[0012] Furthermore, the power cord plug-in and plug-out test system also includes a fuse, one end of the fuse is electrically connected to the first end of the live wire, and the other end of the fuse is electrically connected to the power strip.

[0013] Furthermore, two ends of a power switch of the instrument under test in the instrument under test system are short-circuited.

[0014] From the above description, it can be seen that the present application connects a relay in series to the live wire of the power cord, and automatically controls the on and off of the switch tube under the program design of the single-chip microcomputer in the control unit, thereby controlling the on and off of the relay and the on and off delay, and then controlling the on and off of the live wire to simulate the power-off scenario on the instrument; and realizes the interaction between the single-chip microcomputer and the instrument system to be tested through serial communication, so as to return the test result data such as the normal number of on and off times to the instrument system to be tested, thereby realizing automated testing, reducing labor costs and effectively improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of a first power cord plug-in test system according to an embodiment of the utility model;

[0016] Figure 2 This is a circuit schematic diagram of a power cord plug-in test system according to an embodiment of the utility model;

[0017] Figure 3 It is a structural schematic diagram of a second power cord plugging and unplugging test system according to an embodiment of the utility model;

[0018] Figure 4 It is a structural schematic diagram of a third power cord plugging and unplugging test system of an embodiment of the utility model. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical scheme and advantages of the utility model clearer, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments, wherein the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. It should be understood that the specific embodiments described herein are only used to explain the utility model and are not used to limit the utility model. In addition, the technical features involved in the various embodiments of the utility model described below can be combined with each other as long as they do not conflict with each other.

[0020] In the related art, there is a problem of low efficiency in the manual testing method. Therefore, an embodiment of the utility model provides a power cord plug-in test system.

[0021] like Figure 1 The figure shows a schematic diagram of the structure of a first power cord plug-in test system provided by an embodiment of the utility model. The power cord plug-in test system includes: a power strip 100, a power cord 200, a power strip 300, a control unit 400 and a relay 500.

[0022] Specifically, the power cord 200 is electrically connected to the power strip 100 and the power strip 300 respectively. The power strip 300 is used to electrically connect to the instrument system 600 under test. The instrument system 600 under test is communicatively connected to the control unit 500. The relay 500 is serially connected to the live wire of the power cord 200 and is electrically connected to the control unit 400. The control unit 400 includes a single-chip microcomputer 410 and a switch tube 420. The switch tube 420 is electrically connected to the single-chip microcomputer 410 and the relay 500 respectively. The single-chip microcomputer 410 is communicatively connected to the instrument system 600 under test.

[0023] In this embodiment, in order to ensure that the medical instrument can start and work normally every time it is powered on quickly after abnormal power failure, a large number of abnormal power failure and power-on experiments need to be performed on the instrument. Since the battery power is limited and long-term hanging is not supported, this embodiment uses AC plug-in as a simulation. The AC power line consists of a neutral line, a live line, and a ground line. When the live line is disconnected, the power will be cut off. Therefore, the live line can be disconnected, and a relay can be connected in series. The on and off of the switch tube is controlled by the single-chip input and output interface (I / O port), and then the on and off of the relay is controlled to realize automatic power failure and power on. At the same time, the power switch of each instrument to be tested, that is, the two ends of the power switch of the instrument, that is, the power button of the instrument, need to be short-circuited. If the instrument is a code player, it is adjusted to the power-on gear to ensure that the instrument automatically starts when powered on, and the instrument is shut down when the power is off. By controlling the on and off time of the relay, the duration of the instrument power on and off can also be controlled to simulate different power-on and power-off scenarios. After a simulated power-on and power-off test, the detection data is returned to the instrument to be tested through the single-chip microcomputer, so that the tester can obtain the test results, thereby realizing automated testing and improving test efficiency. In addition, since the relay needs to be connected in series to the live wire, it is necessary to select a relay with a strong overcurrent capacity, such as the relay model HF115FD / 012-1H3AF, to ensure that stable power energy can be connected when multiple instruments are hung up at the same time.

[0024] like Figure 2 The circuit diagram of a power cord plug-in test system provided by this embodiment is shown in FIG. Figure 2 The gate of the switch tube Q1 (420) is electrically connected to the input / output interface of the single chip microcomputer 410, the drain of the switch tube Q1 is electrically connected to the relay K1 (500), and the source of the switch tube Q1 is grounded.

[0025] Specifically, in this embodiment, when the level of the I / O port (CTRL_K1) of the single-chip microcomputer is pulled high, the switch tube Q1 is turned on, the relay K1 is energized, the live wire is turned on, and the power strip 300 is powered on. Since the power button of the instrument is short-circuited, it is equivalent to pressing the power button while powering on. The instrument will turn on as the level of the pin CTRL_K1 is pulled high, until the level of the pin CTRL_K1 is pulled low; when the level of the pin CTRL_K1 is pulled low, the switch tube Q1 is not turned on, the relay K1 is disconnected, the live wire is disconnected, the power strip 300 loses power, and the instrument is turned off until the level of the pin CTRL_K1 is pulled high again, and the instrument is powered on again, and this cycle repeats. Therefore, by designing the required single-chip microcomputer software program to control the duration of the high and low levels of the I / O port, the automated plug-in and unplug test of multiple instruments can be realized.

[0026] For further information, see Figure 2 , the control unit 400 also includes a first resistor R3, a second resistor R5 and a third resistor R1.

[0027] Specifically, the first resistor R3 is electrically connected between the microcontroller 410 and the gate of the switch tube Q1; the two ends of the second resistor R5 are electrically connected to the gate and source of the switch tube Q1 respectively; one end of the third resistor R1 is electrically connected to the drain of the switch tube Q1, and the other end of the third resistor R1 is electrically connected to the relay K1.

[0028] In this embodiment, the second resistor R5 can be used to provide a bias voltage for the switch tube and discharge excess static electricity to protect the normal operation of the switch tube. The first resistor R3 and the third resistor R1 can be used to limit the current to improve the stability of the circuit. In this embodiment, the resistance values ​​of the first resistor R3, the second resistor R5 and the third resistor R1 are 1KΩ, 100KΩ and 100Ω respectively, and the switch tube Q1 uses an NMOS tube of model 2N7002LT1G.

[0029] Further, see Figure 2 The power cord plug-in test system also includes a diode D1, the positive electrode of the diode D1 is electrically connected to the common connection end of the third resistor R1 and the relay K1, and the negative electrode of the diode D1 is electrically connected to the first end 8 of the relay K1. Among them, the first end 8 of the relay K1 is electrically connected to the power supply, the second end 7 of the relay K1 is electrically connected to the third resistor R1, the third end 1 and the fourth end 4 of the relay K1 are both electrically connected to the first end of the live wire, and the fifth end 3 and the sixth end 6 of the relay K1 are both electrically connected to the second end of the live wire. The diode D1 in this embodiment can be used to prevent current backflow to protect the normal operation of the device, and the diode can be selected from CMDSH-3.

[0030] For further information, see Figure 2 The power cord plug-in test system further includes a first capacitor C1 and a second capacitor C2, one end of the first capacitor C1 and the second capacitor C2 are both electrically connected to the first end 8 of the relay K1, and the other ends of the first capacitor C1 and the second capacitor C2 are both grounded.

[0031] Specifically, the first capacitor C1 and the second capacitor C2 in this embodiment can be used for filtering so that the relay can be connected to a stable power supply. The capacitances of the first capacitor C1 and the second capacitor C2 are 0.1uF and 10uF respectively.

[0032] Further, see Figure 2 The power cord plug-in test system further includes a fuse F1, one end of the fuse F1 is electrically connected to the first end of the live wire, and the other end of the fuse F1 is electrically connected to the power strip J1 (100).

[0033] Specifically, a fuse F1 is connected in series between the live wire and the power strip J1 in this embodiment to protect the electrical equipment from damage caused by overcurrent and overheating. Figure 2The second end of the live wire is the output end of the live wire, which is connected to the power strip, i.e. Figure 2 Connect to connector J4 in the .

[0034] like Figure 3 The figure shows a schematic diagram of the structure of the second power cord plugging and unplugging test system provided by this embodiment. Figure 3 The instrument system under test includes multiple instruments under test, and the power input end of each instrument under test is electrically connected to the power strip 300; the first serial port UART1 of the first instrument under test is communicatively connected to the single-chip microcomputer 410, and the second serial port UART2 of the first instrument under test is communicatively connected to the first serial port UART1 of the next instrument under test; the first serial port UART1 and the second serial port UART2 of the last instrument under test are both communicatively connected to the single-chip microcomputer; the first serial ports UART1 of the remaining instruments under test are respectively communicatively connected to the second serial port UART2 of the previous instrument under test, and the second serial ports UART2 of the remaining instruments under test are respectively communicatively connected to the first serial port UART1 of the next instrument under test.

[0035] Specifically, in this embodiment, if there is a problem with the instrument during the test, such as the host computer or the slave computer crashes, the abnormal phenomenon will disappear when the I / O port of the single-chip microcomputer is pulled down, and it cannot be retained. Therefore, a judgment condition for pulling down the I / O port of the single-chip microcomputer can be added to record the abnormal phenomenon. Since commonly used medical instruments such as monitors, defibrillators, electrocardiographs, etc. often have multiple serial ports to communicate with peripherals, and each function will be self-checked when the instrument is powered on, and the internal software of the instrument will send an alarm when there is a fault, therefore, this embodiment is optimized based on the serial port communication AC plug-in test. When the number of instruments to be tested is large, the serial port cascade form can be used for step-by-step judgment and integration, and the instrument's own status can be sent to the single-chip microcomputer, and the single-chip microcomputer will pull down the level of the I / O port after the successful judgment.

[0036] For example Figure 3As shown, when the I / O port of the single-chip microcomputer is pulled high, the system is powered on, the instrument performs a power-on self-test, and two serial ports of the instrument are selected (a serial port that does not affect the self-test result is selected, or a single shield is performed). After the self-test of instrument 1 is successful, a specific data packet is sent to the first serial port UART1 of instrument 2 through the second serial port UART2; if the self-test of instrument 1 fails or crashes, it will not send instructions to instrument 2, at which time the data packet stops transmitting, the single-chip microcomputer cannot receive the data packet, and will not pull down the level of the I / O port; if all instruments are powered on normally and the self-test is successful, the last instrument sends the data packet to the single-chip microcomputer through the second serial port UART2, and the single-chip microcomputer counts the data packet after receiving it and returns it to instrument N, and then displays the number of power on and off times on the instrument interface. According to the above processing, as long as any of the instruments to be tested fails, the single-chip microcomputer will not be able to receive the data packet, the I / O port will always maintain a high level, the system will not lose power, and the phenomenon when the problem occurs will be retained. In addition, each time the MCU pulls up the I / O port, it sends a data packet to instrument 1 through the second serial port UART2 to simulate the state of successful self-test of the upper instrument, so there is no need to pay attention to the instrument connection sequence and software program.

[0037] like Figure 4 The third power cord plugging and unplugging test system provided by this embodiment is shown in FIG. Figure 4 The instrument system includes multiple instruments under test. The power input terminal of each instrument under test is electrically connected to the power strip 300 . The first serial port UART1 and the second serial port UART2 of each instrument under test are communicatively connected to the single-chip microcomputer 410 .

[0038] Specifically, in this embodiment, when the number of instruments under test is small and a fault that is difficult to reproduce has occurred, a parallel connection method can be used to save serial port resources of the instruments under test and speed up the test. Figure 4 As shown, each instrument under test interacts directly with the MCU and sends data packets to the MCU, which then determines the number of successes. When all the instruments under test are powered on and the self-test is successful, the I / O port level is pulled down and maintained for a certain period of time, the count is increased by 1, and then returned to the corresponding instrument. This parallel method is faster when the number of instruments under test should be less than the number of I / O ports of the MCU.

[0039] The power cord plug-in test system provided by the embodiment of the utility model controls the high and low levels and duration of the I / O port through a single-chip computer program, and then controls the power on and off of the system through a relay, simulates the plug-in and unplugging of the instrument AC line, and controls the power-off and power-on status of the instrument. In addition, the operating status of the instrument to be tested is monitored each time it is started through the single-chip computer serial port. When the instrument is all normal, the power is cut off, otherwise the power is kept on and the abnormal phenomenon is retained. This automated testing method can ensure that while saving manpower, the instrument failure phenomenon is retained, which is convenient for R&D personnel to investigate and solve problems, greatly improving the efficiency of the experiment.

[0040] It should be noted that the various embodiments in the present invention are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same and similar parts between the various embodiments can be referenced to each other.

[0041] It should also be noted that, in the present invention, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise one..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0042] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined in the present invention may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown in the present invention, but will conform to the widest range consistent with the principles and novel features disclosed in the present invention.

Claims

1. A power cord plug-in test system, characterized in that: include: A power strip, a power cord, a power strip, a control unit and a relay; the power cord is electrically connected to the power strip and the power strip respectively, the power strip is used to electrically connect to the instrument system under test, the instrument system under test is communicatively connected to the control unit, the relay is serially connected to the live wire of the power cord and is electrically connected to the control unit; the control unit includes a single-chip microcomputer and a switch tube, the switch tube is electrically connected to the single-chip microcomputer and the relay respectively, the single-chip microcomputer is communicatively connected to the instrument system under test.

2. The power cord plug-in test system according to claim 1, characterized in that: The gate of the switch tube is electrically connected to the input and output interface of the single chip microcomputer, the drain of the switch tube is electrically connected to the relay, and the source of the switch tube is grounded.

3. The power cord plug-in test system according to claim 2, characterized in that: The control unit also includes a first resistor, a second resistor and a third resistor; the first resistor is electrically connected between the single-chip microcomputer and the gate of the switch tube; the two ends of the second resistor are electrically connected to the gate and source of the switch tube respectively; one end of the third resistor is electrically connected to the drain of the switch tube, and the other end of the third resistor is electrically connected to the relay.

4. The power cord plug-in test system according to claim 3, characterized in that: The first end of the relay is electrically connected to the power supply, the second end of the relay is electrically connected to the third resistor, the third end and the fourth end of the relay are electrically connected to the first end of the live wire, and the fifth end and the sixth end of the relay are electrically connected to the second end of the live wire.

5. The power cord plug-in test system according to claim 4, characterized in that: The power cord plug and unplug test system also includes a diode, the anode of the diode is electrically connected to the common connection end of the third resistor and the relay, and the cathode of the diode is electrically connected to the first end of the relay.

6. The power cord plug-in test system according to claim 4, characterized in that: The power cord plug and unplug test system also includes a first capacitor and a second capacitor, one end of the first capacitor and the second capacitor are both electrically connected to the first end of the relay, and the other ends of the first capacitor and the second capacitor are both grounded.

7. The power cord plug-in test system according to claim 1, characterized in that: The instrument system under test includes multiple instruments under test, and the power input end of each of the instruments under test is electrically connected to the power strip; the first serial port of the first instrument under test is communicatively connected to the single-chip microcomputer, and the second serial port of the first instrument under test is communicatively connected to the first serial port of the next instrument under test; the first serial port and the second serial port of the last instrument under test are both communicatively connected to the single-chip microcomputer; the first serial ports of the remaining instruments under test are respectively communicatively connected to the second serial ports of the previous instrument under test, and the second serial ports of the remaining instruments under test are respectively communicatively connected to the first serial port of the next instrument under test.

8. The power cord plug-in test system according to claim 1, characterized in that: The instrument system includes a plurality of instruments under test, the power input end of each of the instruments under test is electrically connected to the power strip, and the first serial port and the second serial port of each of the instruments under test are communicatively connected to the single-chip microcomputer.

9. The power cord plug-in test system according to claim 1, characterized in that: The power cord plug-in and plug-out test system further includes a fuse, one end of the fuse is electrically connected to the first end of the live wire, and the other end of the fuse is electrically connected to the power strip.

10. The power cord plug-in test system according to any one of claims 1 to 9, characterized in that: Two ends of a power switch of the instrument under test in the instrument under test system are short-circuited.

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