Automatic chip testing device

Abstract

The utility model discloses an automatic chip testing device, and relates to the technical field of chip detection. The conveying device comprises a bottom plate, a conveying belt is arranged at the top of the bottom plate, a partition plate is fixedly connected to the surface of the conveying belt, supporting frames are fixedly connected to the two sides of the front face and the two sides of the back face of the conveying belt, the bottoms of the supporting frames are fixedly connected with the top of the bottom plate, and a fixing frame is fixedly connected to the rear end of the top of the bottom plate. By arranging the feeding mechanism, the chip to be detected can be automatically placed on the top of the conveying belt, the chip can be directly conveyed by the conveying belt and then detected by the detection probe, and the chip can be continuously placed through the feeding mechanism, so that the labor is saved, the efficiency is improved, and the production efficiency is improved. And the material receiving mechanism is arranged and is used for independently storing qualified chips and unqualified chips after detection, so that the manpower is further saved, and the efficiency is improved.

Description

Technical Field

[0001] The utility model belongs to the technical field of chip detection, and particularly relates to an automatic chip testing device. Background Art

[0002] A chip is a miniaturized circuit that integrates multiple electronic components. It is the core component of modern electronic devices and is widely used in various fields such as computers, mobile phones, automotive electronics, home appliances, and communication equipment. Chip testing refers to various functional and performance-related tests on chips. In the chip manufacturing process, chip testing is a very important part. It can verify whether the chip design meets the specification requirements, detect whether the chip has defects or faults, and evaluate the performance of the chip;

[0003] According to the application number: 202221828281.6, an automated chip testing device is disclosed, the automated chip testing device comprises a base, an L-shaped plate is fixedly mounted on the top of the base, a hydraulic cylinder is fixedly mounted on the L-shaped plate, a test probe is fixedly mounted on the output shaft of the hydraulic cylinder, a rotating column is rotatably mounted on the base, a turntable is rotatably mounted on the top of the base, the top of the rotating column is fixedly connected to the turntable, a plurality of placement holes are provided on the top of the turntable, the plurality of placement holes are distributed in an annular shape, the test probes correspond to the placement holes, a plurality of clamping structures are provided on the turntable, and an annular groove is provided on the top of the base. The automated chip testing device provided in the comparative case is convenient for automatically clamping and releasing the chip, which is conducive to testing, and is convenient for automatic removal after testing, which is conducive to improving work efficiency;

[0004] This comparative case solves the problem that the chip is not easy to be automatically taken out after inspection, which affects the test efficiency. Although the chip can be taken out quickly after inspection, it still takes a certain amount of time to put the chip into the placement hole and clamp it, which affects the chip detection efficiency.

[0005] To this end, we provide an automated chip testing device to solve the above problems. Utility Model Content

[0006] The purpose of the utility model is to provide an automated chip testing device with the advantages of automatic loading and unloading, which solves the problem in the prior art that a certain amount of time is still consumed during the period of placing the chip into the placement hole and clamping it, thereby affecting the chip detection efficiency.

[0007] In order to solve the above technical problems, the utility model is achieved through the following technical solutions:

[0008] The utility model discloses an automatic chip testing device, comprising a bottom plate, a conveyor belt is arranged on the top of the bottom plate, a partition plate is fixedly connected to the surface of the conveyor belt, support frames are fixedly connected to both sides of the front and back sides of the conveyor belt, the bottom of the support frame is fixedly connected to the top of the bottom plate, a fixing frame is fixedly connected to the rear end of the top of the bottom plate, a detection probe is fixedly connected to the top of the fixing frame, a loading mechanism is arranged on the left side of the bottom plate, and a material receiving mechanism is arranged on the top of the bottom plate.

[0009] The utility model is further configured as follows: the feeding mechanism includes a placement box, the placement box is arranged on the left side of the top of the base plate and is fixedly connected to the base plate, a detachable baffle is detachably connected to the back of the placement box, and through grooves are opened on both sides of the placement box.

[0010] The utility model is further configured that an L-shaped plate is fixedly connected to the left side of the bottom plate, a first electric push rod is fixedly connected to the right side of the L-shaped plate, and a movable block is fixedly connected to the output end of the first electric push rod.

[0011] The utility model is further configured that the right side of the movable block extends to the inner cavity of the through slot on the left side and is fixedly connected with a pushing frame.

[0012] The utility model is further configured as follows: the material receiving mechanism includes a limit frame, which is located at the front end and the right side of the top of the base plate and is fixedly connected to the base plate; the inner cavity of the limit frame at the front end is detachably connected to a first storage box, the inner cavity of the limit frame on the right side is detachably connected to a second storage box, and the top of the first storage box is fixedly connected to a limit baffle.

[0013] The utility model is further configured such that a support plate is fixedly connected to the top of the base plate and located on the right side of the fixing frame, a second electric push rod is fixedly connected to the front side of the support plate, and a pushing block is fixedly connected to the output end of the second electric push rod.

[0014] The utility model is further configured such that a PLC controller is fixedly connected to the top of the fixing frame, the output end of the detection probe is electrically connected to the input end of the PLC controller, and the output end of the PLC controller is electrically connected to the input end of the second electric push rod.

[0015] The utility model is further configured such that limiting grooves are provided on both sides of the back side of the inner cavity of the placement box, limiting blocks are fixedly connected to both sides of the removable baffle, one side of the limiting block extends to the inner cavity of the limiting groove and is slidably connected to the inner cavity of the limiting groove.

[0016] The utility model has the following beneficial effects:

[0017] 1. The utility model provides a bottom plate to support and fix the components on the top, thereby improving the stability of each component when in use. A conveyor belt is provided to convey the chips to be detected. The partition plate is used to separate the individual chips. The support frame is used to support the conveyor belt. The fixing frame is used to fix the detection probe, and the detection probe is used to detect the chip.

[0018] 2. The utility model sets a feeding mechanism to automatically place the chip to be tested on the top of the conveyor belt, so that the chip can be directly transported by the conveyor belt and then tested by the detection probe. The feeding mechanism can continuously place the chips, thereby saving manpower and improving efficiency. The receiving mechanism is set to separately store qualified chips and unqualified chips after testing, thereby further saving manpower and improving efficiency.

[0019] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for describing the embodiments are briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0021] Figure 1 This is a schematic diagram of the main structure of an automated chip testing device.

[0022] Figure 2 The present invention is a schematic diagram of the connection structure of a limit frame, a first storage box and a second storage box in an automated chip testing device.

[0023] Figure 3 The figure is a schematic diagram of the connection structure of a conveyor belt, a partition plate and a support frame in an automated chip testing device.

[0024] Figure 4 The present invention is a schematic diagram of the connection structure of an L-shaped plate, a first electric push rod and a movable block in an automated chip testing device.

[0025] Figure 5 The present invention is a schematic diagram of the connection structure between a placement box and a removable baffle in an automated chip testing device.

[0026] Figure 6 The present invention is a schematic diagram of the connection structure of a support plate, a second electric push rod and a push block in an automated chip testing device.

[0027] In the accompanying drawings: 1. bottom plate; 2. conveyor belt; 3. partition plate; 4. support frame; 5. fixed frame; 6. detection probe; 7. feeding mechanism; 701. placement box; 702. removable baffle; 703. through groove; 704. L-shaped plate; 705. first electric push rod; 706. movable block; 707. pushing frame; 8. material receiving mechanism; 801. limit frame; 802. first storage box; 803. second storage box; 804. limit baffle; 805. support plate; 806. second electric push rod; 807. pushing block; 808. PLC controller; 9. limit groove; 10. limit block. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model. Specific embodiment 1

[0030] See also Figure 1-6 The utility model is an automated chip testing device, comprising a base plate 1, a conveyor belt 2 is arranged on the top of the base plate 1, a partition plate 3 is fixedly connected to the surface of the conveyor belt 2, support frames 4 are fixedly connected to both sides of the front and back sides of the conveyor belt 2, the bottom of the support frame 4 is fixedly connected to the top of the base plate 1, a fixing frame 5 is fixedly connected to the rear end of the top of the base plate 1, a detection probe 6 is fixedly connected to the top of the fixing frame 5, a loading mechanism 7 is arranged on the left side of the base plate 1, and a receiving mechanism 8 is arranged on the top of the base plate 1.

[0031] Specifically: the bottom plate 1 is used to support and fix the components on the top, the conveyor belt 2 is used to transport the chips to be tested, the partition plate 3 is used to separate individual chips, the support frame 4 is used to support the conveyor belt 2, the fixing frame 5 is used to fix the detection probe 6, the detection probe 6 is used to detect the chip, the loading mechanism 7 can automatically place the chip to be tested on the top of the conveyor belt 2, so that the chip can be directly transported by the conveyor belt 2, and then detected by the detection probe 6. The loading mechanism 7 can continuously place the chips, thereby improving efficiency, and the receiving mechanism 8 is used to separately store qualified chips and unqualified chips after detection, thereby further improving efficiency. Specific embodiment 2

[0033] See also Figure 1-6On the basis of the specific embodiment 1, the feeding mechanism 7 includes a placement box 701, which is arranged on the left side of the top of the bottom plate 1 and fixedly connected to the bottom plate 1. The back of the placement box 701 is detachably connected with a removable baffle 702, and both sides of the placement box 701 are provided with through grooves 703. The left side of the bottom plate 1 is fixedly connected with an L-shaped plate 704, and the right side of the L-shaped plate 704 is fixedly connected with a first electric push rod 705. The output end of the first electric push rod 705 is fixedly connected with a movable block 706, and the right side of the movable block 706 extends to the inner cavity of the left through groove 703 and is fixedly connected with a pushing frame 707. Limiting grooves 9 are provided on both sides of the back of the inner cavity of the placement box 701, and both sides of the detachable baffle 702 are fixedly connected with limiting blocks 10. One side of the limiting block 10 extends to the inner cavity of the limiting groove 9 and is slidably connected to the inner cavity of the limiting groove 9.

[0034] Specifically: the placement box 701 is used to place the chip to be tested. The chip can be added to the inside of the placement box 701 by removing the removable baffle 702. The left through slot 703 is used to provide space for the movable block 706 to move. The right through slot 703 facilitates the pushing of the chip. The L-shaped plate 704 is used to fix the first electric push rod 705. The first electric push rod 705 is used to adjust the position of the movable block 706. The movable block 706 can drive the push frame 707 to move, so that the push frame 707 can push the chip inside the placement box 701 through the right through slot 703 and add it to the top of the conveyor belt 2, thereby achieving the purpose of loading. Specific embodiment three

[0036] See also Figure 1-6 On the basis of the first and second specific embodiments, the material receiving mechanism 8 includes a limit frame 801, which is located at the front end and the right side of the top of the bottom plate 1 and is fixedly connected to the bottom plate 1, the inner cavity of the front limit frame 801 is detachably connected with a first storage box 802, and the inner cavity of the right limit frame 801 is detachably connected with a second storage box 803, the top of the first storage box 802 is fixedly connected with a limit baffle 804, the top of the bottom plate 1 and the right side of the fixed frame 5 is fixedly connected with a support plate 805, the front of the support plate 805 is fixedly connected with a second electric push rod 806, the output end of the second electric push rod 806 is fixedly connected with a push block 807, the top of the fixed frame 5 is fixedly connected with a PLC controller 808, the output end of the detection probe 6 is electrically connected to the input end of the PLC controller 808, and the output end of the PLC controller 808 is electrically connected to the input end of the second electric push rod 806.

[0037] Specifically: the limit frame 801 is used to limit the first storage box 802 and the second storage box 803, and the detection probe 6 detects the chip. After detecting the unqualified chip, the second electric push rod 806 will be started through the PLC controller 808, so that the second electric push rod 806 drives the push block 807 to move. When moving, the push block 807 will push the unqualified chip off the top of the conveyor belt 2 and drop it into the first storage box 802, and the first storage box 802 will store the unqualified chip parts, and the qualified chips will eventually fall into the second storage box 803.

[0038] The working principle of the utility model is as follows: when it is necessary to detect the chip, firstly, the removable baffle plate 702 is disassembled to add the chip into the placement box 701. After adding, the conveyor belt 2 and the first electric push rod 705 are started to make the first electric push rod 705 continuously reciprocate and extend. When the first electric push rod 705 is extended and retracted, the position of the movable block 706 can be adjusted, so that the movable block 706 drives the push frame 707 to move, and the push frame 707 pushes the chip inside the placement box 701 through the right through slot 703 and adds it to the conveyor belt 2. The top of the conveyor belt 2 is pushed to the top of the conveyor belt 2, thereby achieving the purpose of loading. At the same time, the detection probe 6 detects the chip. After detecting the unqualified chip, the second electric push rod 806 is started through the PLC controller 808, so that the second electric push rod 806 drives the push block 807 to move. When moving, the push block 807 pushes the unqualified chip off the top of the conveyor belt 2 and drops it into the first storage box 802, and the first storage box 802 stores the unqualified chip parts, and the qualified chip finally falls into the second storage box 803, so as to complete the chip detection work.

[0039] In the description of this specification, the description with reference to the terms "one embodiment", "example", "specific example", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the utility model. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0040] The preferred embodiments of the utility model disclosed above are only used to help explain the utility model. The preferred embodiments do not describe all the details in detail, nor do they limit the utility model to the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the utility model, so that technicians in the relevant technical field can well understand and use the utility model. The utility model is limited only by the claims and their full scope and equivalents.

Claims

1. An automated chip testing device, comprising a base plate (1), characterized in that: A conveyor belt (2) is arranged on the top of the bottom plate (1), a partition plate (3) is fixedly connected to the surface of the conveyor belt (2), support frames (4) are fixedly connected to both the front and back sides of the conveyor belt (2), the bottom of the support frame (4) is fixedly connected to the top of the bottom plate (1), a fixing frame (5) is fixedly connected to the rear end of the top of the bottom plate (1), a detection probe (6) is fixedly connected to the top of the fixing frame (5), a loading mechanism (7) is arranged on the left side of the bottom plate (1), and a material receiving mechanism (8) is arranged on the top of the bottom plate (1).

2. An automated chip testing device according to claim 1, characterized in that: The loading mechanism (7) comprises a placement box (701), which is arranged on the left side of the top of the bottom plate (1) and fixedly connected to the bottom plate (1). A removable baffle (702) is detachably connected to the back of the placement box (701), and through grooves (703) are provided on both sides of the placement box (701).

3. An automated chip testing device according to claim 2, characterized in that: An L-shaped plate (704) is fixedly connected to the left side of the base plate (1), a first electric push rod (705) is fixedly connected to the right side of the L-shaped plate (704), and a movable block (706) is fixedly connected to the output end of the first electric push rod (705).

4. The automatic chip testing device according to claim 3, characterized in that: The right side of the movable block (706) extends to the inner cavity of the through slot (703) on the left side and is fixedly connected to a pushing frame (707).

5. The automatic chip testing device according to claim 1, characterized in that: The material receiving mechanism (8) comprises a limiting frame (801), the limiting frame (801) is located at the front end and the right side of the top of the bottom plate (1), and is fixedly connected to the bottom plate (1); the inner cavity of the limiting frame (801) at the front end is detachably connected to a first storage box (802); the inner cavity of the limiting frame (801) at the right side is detachably connected to a second storage box (803); and the top of the first storage box (802) is fixedly connected to a limiting baffle (804).

6. The automatic chip testing device according to claim 1, characterized in that: A support plate (805) is fixedly connected to the top of the base plate (1) and located on the right side of the fixing frame (5); a second electric push rod (806) is fixedly connected to the front of the support plate (805); and a pushing block (807) is fixedly connected to the output end of the second electric push rod (806).

7. The automatic chip testing device according to claim 6, characterized in that: A PLC controller (808) is fixedly connected to the top of the fixed frame (5), the output end of the detection probe (6) is electrically connected to the input end of the PLC controller (808), and the output end of the PLC controller (808) is electrically connected to the input end of the second electric push rod (806).

8. The automatic chip testing device according to claim 2, characterized in that: Limiting grooves (9) are provided on both sides of the back side of the inner cavity of the placement box (701), and limiting blocks (10) are fixedly connected to both sides of the removable baffle (702), and one side of the limiting block (10) extends to the inner cavity of the limiting groove (9) and is slidably connected to the inner cavity of the limiting groove (9).

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