Direct current test structure and electronic device
By setting symmetric edge angle sampling points and through stop structures on both sides of the alloy resistor structure of the DC current test structure, the current flow path is changed, and the problems of current density and temperature drift are solved, and current sparseness and drift are achieved. Reduced, suitable for mass production.
Patent Information
- Application Number
- CN202420484287.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-12
- Publication Date
- 2024-12-31
- Estimated Expiration
- 2034-03-12
AI Technical Summary
In the existing DC current test structure, the current at the sampling point is relatively dense, and the current introduced after the copper path is large, which is easy to produce temperature drift.
A DC current test structure is designed, by providing edge angle regions of the first and second fixed structures as sampling points on both sides of the alloy resistor structure, and through the first and second stop structures in these fixed structures, the Current flows through the path, reducing the amount of current introduced and reducing drift caused by temperature.
The current sparseness in the sampling point area is achieved, reducing the amount of drift generated by the DC current test structure with the increase in temperature, and the design is suitable for batch stamping, and the intermediate sampling area will not be deformed.
Smart Images
Figure CN222280728U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of electronic technology, in particular to a direct current test structure and an electronic device. Background Art
[0002] The DC current test structure is constructed based on the principle of detecting the voltage generated across a resistor when DC current passes through it. It is a direct detection method. The upper limit of the measured current is generally not too large. The electrical signal directly obtained from the resistor is an analog signal with a very small value. An external amplifier circuit is required to amplify the signal and then convert it into a digital signal through an A / D conversion circuit.
[0003] In the prior art, a DC current test structure includes an alloy resistor and copper on both sides of the alloy resistor. The sampling point on the copper is located in the middle of the copper. The current at the sampling point is relatively dense, and the amount of current introduced after passing through the copper is large, which is prone to temperature drift.
[0004] The above content is only used to assist in understanding the technical solution of the present invention and does not constitute an admission that the above content is prior art. Utility Model Content
[0005] The main purpose of the utility model is to provide a DC current test structure and an electronic device, aiming to solve the problem in the prior art that the current at the sampling point of the DC current test structure is relatively dense, and the amount of current introduced after passing through copper is large, which is prone to temperature drift.
[0006] In order to achieve the above object, the present invention provides a DC current test structure, which includes:
[0007] Alloy resistor structure;
[0008] A first fixing structure and a second fixing structure are respectively installed on both sides of the alloy resistor structure in the horizontal direction, the first fixing structure and the second fixing structure have edge corner areas, the edge corner areas of the first fixing structure and the second fixing structure are arranged close to the alloy resistor structure, the edge corner areas of the first fixing structure and the edge corner areas of the second fixing structure are respectively provided with a first sampling point and a second sampling point, and the first sampling point of the first fixing structure and the second sampling point of the second fixing structure are symmetrically arranged in the horizontal direction;
[0009] The first stop structure and the second stop structure respectively pass through the first fixed structure and the second fixed structure. The first stop structure and the second stop structure each include a first section extending in the transverse direction and a second section connected to the first section and extending in the longitudinal direction. The first section and the second section of the first stop structure, as well as the first section and the second section of the second stop structure are respectively correspondingly arranged around the periphery of the first sampling point and the second sampling point. The first section and the second section of the first stop structure, as well as the first section and the second section of the second stop structure are respectively arranged on the inner side of the first sampling point and the second sampling point.
[0010] Preferably, in the DC current test structure, the length of the first section of the first stop structure is C1, the length of the second section of the first stop structure is B1, 5mm≤B1≤6mm, 5mm≤C1≤6mm.
[0011] Preferably, in the DC current test structure, the length of the first section of the second stop structure is C2, the length of the second section of the second stop structure is B2, 5mm≤B2≤6mm, 5mm≤C2≤6mm.
[0012] Preferably, in the DC current test structure, a distance between the top of the connection between the first section and the second section of the first stop structure and the center of the first sampling point is A1, and 6.5 mm≤A1≤7.5 mm.
[0013] Preferably, in the DC current test structure, a connection between the first section and the second section of the first stop structure is rounded.
[0014] Preferably, in the DC current test structure, the width of the first section of the first stopping structure in the longitudinal direction is D1, and 1.5≤D1≤2mm.
[0015] Preferably, in the DC current test structure, a distance between a top of a connection between the first section and the second section of the second stop structure and a center of the second sampling point is A2, and 6.5 mm ≤ A2 ≤ 7.5 mm.
[0016] Preferably, in the DC current test structure, a connection between the first section and the second section of the second stop structure is rounded.
[0017] Preferably, in the DC current test structure, the width of the first section of the second stopping structure in the longitudinal direction is D2, and 1.5≤D2≤2mm.
[0018] In order to achieve the above object, the present invention further provides an electronic device, which includes the above DC current testing structure.
[0019] The utility model has at least the following beneficial effects:
[0020] The utility model provides a first sampling point and a second sampling point through an edge corner region of the first fixing structure and an edge corner region of the second fixing structure, respectively. The first sampling point of the first fixing structure and the second sampling point of the second fixing structure are symmetrically arranged in the transverse direction. A first stop structure and a second stop structure respectively penetrate the first fixing structure and the second fixing structure. The first stop structure and the second stop structure each include a first section extending in the transverse direction and a second section connected to the first section and extending in the longitudinal direction. The first and second sections of the first stop structure, as well as the first and second sections of the second stop structure, are respectively correspondingly arranged around the periphery of the first sampling point and the second sampling point. The first and second sections of the first stop structure, as well as the first and second sections of the second stop structure, are respectively arranged on the inner side of the first sampling point and the second sampling point. In this way, the current flow path of the DC current test structure can be changed, the amount of current introduced after passing through the first and second fixing structures can be reduced, the current in the sampling point region can be sparse, and the drift of the DC current test structure caused by increasing temperature can be reduced.
[0021] Furthermore, the present invention uses the first section and the second section of the first stop structure, and the first section and the second section of the second stop structure to respectively surround the periphery of the first sampling point and the second sampling point. Compared with the solution in which the sampling area between the first sampling point and the second sampling point is easily deformed by surrounding the first sampling point and the second sampling point on three sides, the solution in which the first sampling point and the second sampling point are surrounded on two sides by the present invention can achieve batch stamping, and the sampling area in the middle will not be deformed. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Figure 1 This is a schematic diagram of an embodiment of a DC current test structure provided by the present utility model;
[0023] Figure 2 for Figure 1 Schematic diagram of the middle part structure;
[0024] Figure 3 Renderings of solutions not provided by this utility model;
[0025] Figure 4 The following is a rendering of the effect of the solution provided by the present utility model.
[0026] Label name Label name 100 DC current test structure 31 Second sampling point 1 Alloy resistor structure 41 First stop structure 2 First fixed structure 42 Second stop structure 21 First sampling point 411,421 Paragraph 1 3 Second fixing structure 412,422 Second paragraph
[0027] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION
[0028] In the embodiments of the present invention, the term "and / or" describes the relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent three situations: A exists alone, A and B exist simultaneously, and B exists alone. The character " / " generally indicates that the associated objects are in an "or" relationship.
[0029] It should be noted that the terms "first", "second", etc. in the specification and claims of the present utility model and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.
[0030] In the embodiments of the present invention, the term "plurality" refers to two or more than two, and other quantifiers are similar.
[0031] In the present invention, unless otherwise specified, directional words such as "up, down, top, bottom" are usually used with reference to the directions shown in the drawings, or with reference to the components themselves in the vertical, perpendicular or gravity direction; similarly, for ease of understanding and description, "inside and outside" refer to the inside and outside relative to the outline of each component itself, but the above directional words are not used to limit the present invention.
[0032] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, each embodiment of the present invention will be described in detail below with reference to the accompanying drawings. However, it will be understood by those skilled in the art that many technical details are provided in each embodiment of the present invention to enable the reader to better understand the present invention. However, even without these technical details and the various changes and modifications based on the following embodiments, the technical solutions claimed in the present invention can be implemented. The division of the following embodiments is for convenience of description and should not constitute any limitation on the specific implementation of the present invention. The various embodiments can be combined and referenced with each other under the premise that there is no contradiction.
[0033] The utility model provides a DC current test structure 100, please refer to Figure 1 and Figure 2The DC current test structure 100 includes an alloy resistor structure 1, a first fixing structure 2 and a second fixing structure 3, and a first stop structure 41 and a second stop structure 42. The first fixing structure 2 and the second fixing structure 3 are respectively installed on both sides of the alloy resistor structure 1 in the horizontal direction. The first fixing structure 2 and the second fixing structure 3 have edge corner areas. The edge corner areas of the first fixing structure 2 and the second fixing structure 3 are arranged close to the alloy resistor structure 1. The edge corner areas of the first fixing structure 2 and the second fixing structure 3 are respectively provided with a first sampling point 21 and a second sampling point 31. The first sampling point 21 of the first fixing structure 2 and the second sampling point 31 of the second fixing structure 3 are arranged symmetrically in the horizontal direction. The first stop structure 41 and the second The stop structure 42 passes through the first fixing structure 2 and the second fixing structure 3 respectively. The first stop structure 41 and the second stop structure 42 each include a first section 411, 421 extending in the transverse direction, and a second section 412, 422 connected to the first section 411, 421 and extending in the longitudinal direction. The first section 411 and the second section 412 of the first stop structure 41, and the first section 421 and the second section 422 of the second stop structure 42 are respectively correspondingly arranged around the periphery of the first sampling point 21 and the second sampling point 31. The first section 411 and the second section 412 of the first stop structure 41, and the first section 421 and the second section 422 of the second stop structure 42 are respectively arranged on the inner side of the first sampling point 21 and the second sampling point 31.
[0034] It should be noted that the fixed structures (the first fixed structure 2 and the second fixed structure 3) can be copper or other conductive structures, and are not specifically limited here. Each fixed structure has four corners. In the present invention, the two corners of the first fixed structure 2 close to the second fixed structure 3 are referred to as edge corner areas; similarly, the two corners of the second fixed structure 3 close to the first fixed structure 2 are referred to as edge corner areas. The two edge corner areas of the first fixed structure 2 are arranged longitudinally, and the two edge corner areas of the second fixed structure 3 are arranged longitudinally. A sampling point can be set in one of the edge corner areas of the first fixed structure 2, or a first sampling point 21 can be set in both edge corner areas of the first fixed structure 2; similarly, a second sampling point 31 can be set in one of the edge corner areas of the second fixed structure 3, or a second sampling point 31 can be set in both edge corner areas of the second fixed structure 3. However, the first sampling points 21 of the first fixed structure 2 are symmetrically arranged with the second sampling points 31 of the second fixed structure 3, that is, when the first fixed structure 2 is set with one first sampling point 21, the second fixed structure 3 must also be set with only one second sampling point 31, and the two are symmetrically arranged.
[0035] In the prior art, the DC current test structure 100 includes an alloy resistor and copper located on both sides of the alloy resistor. The sampling point on the copper is located in the middle of the copper. The current at the sampling point is relatively dense, and the amount of current introduced after passing through the copper is large, which is prone to temperature drift.
[0036] The utility model is provided with a first sampling point 21 and a second sampling point 31 through the edge corner area of the first fixing structure 2 and the edge corner area of the second fixing structure 3, respectively. The first sampling point 21 of the first fixing structure 2 and the second sampling point 31 of the second fixing structure 3 are symmetrically arranged in the transverse direction; a first stop structure 41 and a second stop structure 42 respectively penetrate the first fixing structure 2 and the second fixing structure 3, and the first stop structure 41 and the second stop structure 42 each include a first section 411, 421 extending in the transverse direction, and a second section 412, 422 connected to the first section 411, 421 and extending in the longitudinal direction. The first section 411 and the second stop structure 42 are respectively provided with a first sampling point 21 and a second sampling point 31. The second section 412, and the first section 421 and the second section 422 of the second stop structure 42 are respectively disposed around the periphery of the first sampling point 21 and the second sampling point 31. The first section 411 and the second section 412 of the first stop structure 41, and the first section 421 and the second section 422 of the second stop structure 42 are respectively disposed on the inner side of the first sampling point 21 and the second sampling point 31. This can change the current flow path of the DC current test structure 100, reduce the amount of current introduced after passing through the first fixing structure 2 and the second fixing structure 3, make the current in the sampling point area sparse, and reduce the drift of the DC current test structure 100 caused by increasing temperature.
[0037] Furthermore, in the present invention, the first section 411 and the second section 412 of the first stop structure 41, and the first section 421 and the second section 422 of the second stop structure 42 are respectively arranged around the periphery of the first sampling point 21 and the second sampling point 31. Compared with the solution in which the intermediate sampling area between the first sampling point 21 and the second sampling point 31 is easily deformed by surrounding the stop structure on three sides, the solution in which the first sampling point 21 and the second sampling point 31 are surrounded on two sides can achieve batch stamping without deformation of the intermediate sampling area.
[0038] Furthermore, the comparison Figure 3 and Figure 4 It can be clearly seen that the solution provided by the present invention can significantly make the current in the sampling point area sparse, and reduce the drift of the DC current test structure 100 as the temperature increases.
[0039] In this embodiment, the length of the first section 411 of the first stop structure 41 is C1, and the length of the second section 412 of the first stop structure 41 is B1. 5mm≤B1≤6mm, 5mm≤C1≤6mm, which is more effective. In other embodiments, B1 can also be 5.5mm, and C1 can also be 5.5mm.
[0040] In this embodiment, the length of the first section 411, 421 of the second stop structure 42 is C2, and the length of the second section 412, 422 of the second stop structure 42 is B2. 5mm≤B2≤6mm, 5mm≤C2≤6mm, which is more effective. In other embodiments, B2 can also be 5.5mm, and C2 can also be 5.5mm.
[0041] To improve the flow avoidance effect, the distance A1 between the top of the connection between the first section 411 and the second section 412 of the first stop structure 41 and the center of the first sampling point 21 is 6.5mm≤A1≤7.5mm. If A1 is too large, the flow avoidance effect will be affected, while if it is too small, the process capability will be affected.
[0042] Furthermore, the connection between the first section 411 and the second section 412 of the first stop structure 41 is rounded, which makes processing easier and the flow avoidance effect better.
[0043] To ensure the flow avoidance effect without causing deformation, the longitudinal width of the first section 411 of the first stop structure 41 is D1, 1.5≤D1≤2mm. If D1 is too large, deformation will occur easily, and if it is too small, the flow avoidance effect will be affected.
[0044] To improve the flow avoidance effect, the distance A2 between the top of the junction of the first section 421 and the second section 422 of the second stop structure 42 and the center of the second sampling point 31 is 6.5 mm ≤ A2 ≤ 7.5 mm. A larger A2 will affect the flow avoidance effect, while a smaller A2 will affect the process capability.
[0045] Furthermore, the connection between the first section 421 and the second section 422 of the second stop structure 42 is rounded, which makes processing easier and improves the flow avoidance effect.
[0046] To ensure the flow avoidance effect without causing deformation, the longitudinal width of the first section 421 of the second stop structure 42 is D2, 1.5≤D2≤2mm. If D2 is too large, deformation will occur easily, and if it is too small, the flow avoidance effect will be affected.
[0047] To achieve the above objectives, the present invention further provides an electronic device comprising the DC current test structure 100. An embodiment of the electronic device comprises an embodiment of the DC current test structure 100, and the beneficial effects of the DC current test structure 100 can be applied to the electronic device.
[0048] Obviously, the embodiments described above are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, those skilled in the art can make other variations or modifications without creative work, which should fall within the scope of protection of the present invention.
Claims
1. A direct current test structure, characterized in that: include: Alloy resistor structure; A first fixing structure and a second fixing structure are respectively installed on both sides of the alloy resistor structure in the transverse direction, the first fixing structure and the second fixing structure have edge corner regions, the edge corner regions of the first fixing structure and the second fixing structure are arranged close to the alloy resistor structure, the edge corner regions of the first fixing structure and the second fixing structure are respectively provided with a first sampling point and a second sampling point, and the first sampling point of the first fixing structure and the second sampling point of the second fixing structure are symmetrically arranged in the transverse direction; The first stop structure and the second stop structure respectively penetrate the first fixed structure and the second fixed structure. The first stop structure and the second stop structure each include a first section extending in the transverse direction and a second section connected to the first section and extending in the longitudinal direction. The first section and the second section of the first stop structure and the first section and the second section of the second stop structure are respectively and correspondingly arranged around the periphery of the first sampling point and the second sampling point. The first section and the second section of the first stop structure and the first section and the second section of the second stop structure are respectively arranged on the side close to the inner side of the first sampling point and the second sampling point.
2. The DC current test structure according to claim 1, characterized in that: The length of the first section of the first stop structure is C1, the length of the second section of the first stop structure is B1, 5mm≤B1≤6mm, 5mm≤C1≤6mm.
3. The DC current test structure according to claim 1, characterized in that: The length of the first section of the second stop structure is C2, the length of the second section of the second stop structure is B2, 5mm≤B2≤6mm, 5mm≤C2≤6mm.
4. The DC current test structure according to claim 1, characterized in that: The distance between the top of the connection between the first section and the second section of the first stop structure and the center of the first sampling point is A1, 6.5mm≤A1≤7.5mm.
5. The DC current test structure according to claim 4, characterized in that: The connection between the first section and the second section of the first stop structure is rounded.
6. The DC current test structure according to claim 1, characterized in that: The first section of the first stop structure has a longitudinal width D1, where 1.5≤D1≤2 mm.
7. The DC current test structure according to claim 1, characterized in that: The distance between the top of the connection between the first section and the second section of the second stop structure and the center of the second sampling point is A2, 6.5mm≤A2≤7.5mm.
8. The DC current test structure according to claim 7, characterized in that: The connection between the first section and the second section of the second stop structure is rounded.
9. The DC current test structure according to claim 1, characterized in that: The width of the first section of the second stop structure in the longitudinal direction is D2, 1.5≤D2≤2mm.
10. An electronic device, characterized in that: Comprising the direct current test structure as described in any one of claims 1 to 9.