Test equipment for electronic component

Abstract

The utility model discloses a test device for an electronic component, which relates to the field of electronic component testing and comprises a mounting seat, a test disc, two probes, two elastic mounting pieces and a power piece, at least one test position for placing the electronic component is arranged on the test disc, the test position is positioned below the probes, and the power piece is arranged on the mounting seat. The two elastic mounting pieces are respectively used for connecting the two probes and the mounting seat, the elastic direction of the elastic mounting pieces to the probes faces the test position, and the power piece is used for controlling the distance between the electronic component and the tip of the probe; the probe is installed on the installation seat through the elastic installation part, during testing, under the action of the power part, the electronic component and the tip of the probe are close to each other and make extrusion contact, at the moment, the elastic installation part enables the probe to adapt to the condition of the contact surface of a product electrode, and the probe generates certain displacement in the direction of the central axis of the probe. The tip of the probe is perpendicular to the electrode, and only two small points are pricked on the surface of the electrode, so that scratches are avoided.

Description

Technical Field

[0001] The utility model relates to the field of electronic component testing, in particular to a testing device for electronic components. Background Art

[0002] During the production process of devices such as resistors and capacitors, the four-wire method is required to test electronic components. When testing electronic components, a four-wire probe mechanism is required to perform high-precision testing on the electronic components. Existing electronic component testing equipment still has some shortcomings during use. For example, existing electronic component test probes usually use needle cards or DC tungsten steel probes. Needle cards and DC tungsten steel needles need to be given a certain amount of pressure during testing. After the needle tip contacts the product, the steel needle will deform, which will cause the needle tip and the product to move relative to each other. Scratches will inevitably appear on the product electrode, affecting the appearance. In addition, the coating on the product electrode is uneven, and the needle card or DC tungsten steel needle tip on the same plane cannot pierce the electrode at the same time. Utility Model Content

[0003] The purpose of the utility model is to design a testing device for electronic components in order to solve the above problems.

[0004] The utility model achieves the above-mentioned purpose through the following technical solutions:

[0005] Test equipment for electronic components, including:

[0006] Mounting seat;

[0007] A test tray; the test tray is provided with at least one test position for placing electronic components;

[0008] Two probes; the test position is located below the probes;

[0009] Two elastic mounting parts; the two elastic mounting parts are used to connect the two probes to the mounting base respectively, and the elastic force direction of the elastic mounting parts on the probes is toward the test position;

[0010] Power piece: The power piece is used to control the distance between the electronic component and the needle tip of the probe.

[0011] The beneficial effect of the utility model is that the probe is installed on the mounting seat by means of an elastic mounting part. When testing, under the action of a power part, the electronic component and the needle tip of the probe are close to each other and produce a squeeze contact. At this time, the elastic mounting part allows the probe to adapt to the contact surface of the product electrode. The probe produces a certain displacement in the direction of the central axis of the probe. The needle tip of the probe is perpendicular to the electrode and only pierces two small points on the surface of the electrode, thus avoiding scratches. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a structural schematic diagram of the utility model for testing equipment of electronic components;

[0013] The corresponding figures are:

[0014] 1-mounting seat, 2-probe, 3-mounting rod, 4-guide plate, 5-base, 6-slider, 7-slide rail, 8-protection seat, 9-test channel, 10-guide hole, 11-connecting rod, 12-compression spring, 13-limit block. DETAILED DESCRIPTION

[0015] In order to make the purpose, technical scheme and advantages of the embodiments of the present invention clearer, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0016] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the present invention to be protected, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0017] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0018] In the description of the present utility model, it should be understood that the terms "upper", "lower", "inside", "outside", "left", "right", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings, or are directions or positional relationships in which the utility model product is usually placed when in use, or are directions or positional relationships that are usually understood by those skilled in the art. These directions or positional relationships are only for the convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the device or component referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as a limitation on the present utility model.

[0019] Furthermore, the terms “first”, “second”, etc. are merely used for distinguishing descriptions and should not be understood as indicating or implying relative importance.

[0020] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms such as "setting" and "connection" should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0021] The specific implementation of the utility model is described in detail below in conjunction with the accompanying drawings.

[0022] like Figure 1 As shown, the test equipment for electronic components includes:

[0023] Mounting seat 1;

[0024] A test tray; the test tray is provided with at least one test position for placing electronic components;

[0025] Two probes 2; the test position is located below the probes 2;

[0026] Two elastic mounting members; the two elastic mounting members are used to connect the two probes 2 to the mounting base 1 respectively, and the elastic force direction of the elastic mounting members on the probes 2 is toward the test position;

[0027] Power member; the power member is used to control the distance between the electronic component and the needle tip of the probe 2, and the power member and the test disk are not shown in the figure.

[0028] Each resilient mount includes:

[0029] The mounting rod 3; the mounting seat 1 is provided with a mounting through hole, the first end of the mounting rod 3 is fixed to the first end of the mounting through hole, the first end of the mounting rod 3 is provided with a mounting blind hole, and the needle of the probe 2 passes through the mounting through hole and is located in the mounting blind hole;

[0030] Tension spring; the two ends of the tension spring are fixedly connected to the mounting through hole and the probe 2, respectively, and the elastic force direction of the tension spring on the probe 2 is toward the test position.

[0031] The testing device further comprises a guide plate 4 , on which two guide holes 10 are arranged, and a needle tip of a probe 2 passes through one guide hole 10 . The guide plate 4 is fixedly mounted on the mounting seat 1 .

[0032] The power component is any one of a linear motor, an oil cylinder and a pneumatic cylinder, and the power output end of the power component acts on the test plate or the mounting seat 1 .

[0033] The testing equipment also includes a base 5 and two groups of sliding components, which are respectively arranged on both sides of the mounting base 1. Each group of sliding components includes a slider 6 and a slide rail 7. The slider 6 is fixedly connected to the base 5, and the slide rail 7 is arranged on the side of the mounting base 1. The slider 6 can be slidably installed on the slide rail 7.

[0034] The testing equipment also includes a protective seat 8, which is fixedly mounted on the base 5. Two test channels 9 are arranged on the protective seat 8. The tip of a probe 2 passes through a test channel 9. When testing electronic components, the lower end of the protective seat 8 is squeezed into contact with the test position. A test channel 9 and the central axis of a guide hole 10 are in the same straight line.

[0035] The testing equipment also includes at least one elastic member, each elastic member includes a connecting rod 11, a limit block 13 and a compression spring 12, the first end of the connecting rod 11 is fixedly mounted on the base 5, the mounting seat 1 is provided with a connecting through hole, the second end of the connecting rod 11 passes through the connecting through hole, the compression spring 12 is sleeved on the connecting rod 11, the second end of the connecting rod 11 is fixedly connected to the limit block 13, the size of the limit block 13 is larger than the size of the connecting through hole, and the two ends of the compression spring 12 are respectively squeezed and contacted with the mounting seat 1 and the base 5.

[0036] The working principle of the test equipment for electronic components of the utility model is as follows:

[0037] After the protection seat 8 contacts the test disk, the power component continues to bring the probe 2 and the test disk closer to each other, and the protection seat 8 is pressed tightly against the test disk. The protection seat 8, the base 5 and the test disk are displaced, and the protection seat 8, the base 5 and the test disk are in a relatively static state. The power component continues to work, so that the distance between the needle tip of the probe 2 and the test disk continues to shrink. At this time, the compression spring 12 is compressed to store energy. At the same time, the needle tip of the probe 2 begins to extend from the test channel 9 of the protection seat 8 and contacts the electrode of the electronic component in the test disk. The tension spring is stretched to store energy. The elastic mounting part allows the probe 2 to adapt to the contact surface of the product electrode. Under the action of the tension spring, the probe 2 produces a certain displacement along the direction of the central axis of the probe 2. Under the action of the test channel 9 and the guide hole 10, the needle tip of the probe 2 is perpendicular to the electrode, and only two small points are pierced on the surface of the electrode to avoid scratches.

[0038] A tension spring is designed to install the probe 2, and under the action of the guide plate 4 and the protective seat 8, the probe 2 is perpendicular to the electrode of the electronic component, while avoiding sliding displacement between the needle tip and the electrode of the electronic component, thereby avoiding the occurrence of scratches, and being compatible with the uneven electrode surface, ensuring good contact between the probe 2 and the electrode.

[0039] The technical solution of the present utility model is not limited to the above-mentioned specific embodiments, and all technical variations made according to the technical solution of the present utility model fall within the protection scope of the present utility model.

Claims

1. A test device for electronic components, characterized in that: include: Mounting seat; Test disk; The test tray is provided with at least one test position for placing electronic components; Two probes; The test position is located below the probe; Two elastic mounting parts; the two elastic mounting parts are respectively used for connecting the two probes with the mounting seat; Power piece: The power piece is used to control the distance between the electronic component and the needle tip of the probe.

2. The testing device for electronic components according to claim 1, characterized in that: Each resilient mount includes: A mounting rod; a mounting through hole is provided on the mounting seat, a first end of the mounting rod is fixed to a first end of the mounting through hole, a mounting blind hole is provided at the first end of the mounting rod, and a needle of the probe passes through the mounting through hole and is located in the mounting blind hole; Tension spring; the two ends of the tension spring are respectively fixedly connected to the mounting through hole and the probe, and the elastic force direction of the tension spring on the probe is toward the test position.

3. The testing device for electronic components according to claim 1 or 2, characterized in that: The testing device also includes a guide plate, on which two guide holes are arranged, a needle tip of a probe passes through one guide hole, and the guide plate is fixedly mounted on the mounting seat.

4. The testing device for electronic components according to claim 1 or 2, characterized in that: The power component is any one of a linear motor, an oil cylinder and an air cylinder, and the power output end of the power component acts on the test plate or the mounting seat.

5. The testing device for electronic components according to claim 1 or 2, characterized in that: The testing equipment also includes a base and two sets of sliding components, which are respectively arranged on both sides of the mounting seat. Each set of sliding components includes a slider and a slide rail. The slider is fixedly connected to the base, and the slide rail is arranged on the side of the mounting seat. The slider can be slidably installed on the slide rail.

6. The testing device for electronic components according to claim 5, characterized in that: The test equipment also includes a protection seat, which is fixedly mounted on the base and has two test channels. The tip of a probe passes through a test channel. When testing electronic components, the lower end of the protection seat is in squeeze contact with the test position.

7. The testing device for electronic components according to claim 5, characterized in that: The testing equipment also includes at least one elastic member, each elastic member includes a connecting rod, a limit block and a compression spring, the first end of the connecting rod is fixedly mounted on the base, a connecting through hole is provided on the mounting seat, the second end of the connecting rod passes through the connecting through hole, the compression spring is sleeved on the connecting rod, the second end of the connecting rod is fixedly connected to the limit block, the size of the limit block is larger than the size of the connecting through hole, and the two ends of the compression spring are respectively in compression contact with the mounting seat and the base.

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