Electronic equipment drop test device

Abstract

The utility model relates to the field of electronic equipment testing, in particular to an electronic equipment drop test device, which comprises a test box, a protective plate and an observation window are respectively and rotatably mounted on one side of the test box, a lifting mechanism is arranged in the middle of the other side of the test box, a lifting head is arranged on the lifting mechanism in a driving manner, and a vacuum pump is arranged on the lifting head. The vacuum pump is connected with the vacuum suckers. According to the utility model, the equipment to be detected is fixed on the lifting head through the vacuum chuck, the lifting head is driven by the control box to ascend and descend, and the equipment is released at a specified height, so that not only can the stability and the homogeneity of each test condition be ensured, but also the feeding can be carried out more quickly, and the detection efficiency is ensured; meanwhile, through cooperation with an inclined table and a test platform arranged at the bottom of the test box, splashing of chippings falling from the equipment can be avoided, the chippings are collected in time, and the accuracy of a test result is guaranteed.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic equipment testing, in particular to an electronic equipment drop testing device. Background Art

[0002] Electronic equipment refers to equipment that uses electronic technology or microelectronic technology to process, store, transmit, and display information. In simple terms, it is a device that uses electronic technology to achieve various functions, such as mobile phones, televisions, and computers.

[0003] Since electronic equipment covers a wide range of areas, some electronic equipment will undergo drop tests during the production process to improve its performance. During use, electronic products may be subject to mechanical damage such as falling, resulting in equipment damage or performance degradation. Therefore, in order to ensure the stability and durability of electronic products during use, drop tests are required.

[0004] Among them, the Chinese patent document with authorization announcement number CN 106289703 A discloses a "drop test device for electronic equipment products". Through the cooperation between the hopper and the material pipe, the material is discharged through the material pipe that can only discharge one product. There is a connecting material plate under the material pipe that is driven to open or close by the discharge cylinder. Only one product can be dropped at a time. After dropping, it is directly put into the box for drop test. After the test is completed, the dropped product is pushed out of the box by the push cylinder, such as collected in a storage box. The result is obvious, which solves the defect that only one product can be tested and improves the test efficiency.

[0005] However, there are still some application defects in the actual application of this utility model. Since the materials are discharged through a hopper, the falling speed and height of each test product will have certain deviations. Although the hopper can limit the free fall of a single product, there is still a probability of the hopper being blocked and multiple products piling up and falling. The debris that falls to the bottom will also affect the test results. Therefore, there is an urgent need for an electronic equipment drop test device. Utility Model Content

[0006] The utility model aims to solve the shortcomings in the prior art and proposes an electronic equipment drop test device.

[0007] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0008] An electronic device drop test device comprises a test box, a protective plate and an observation window are rotatably mounted on one side of the test box, and a lifting mechanism is arranged in the middle of the other side, a lifting head is driven and arranged on the lifting mechanism, a vacuum pump is arranged on the lifting head, and the vacuum pump is connected to a vacuum suction cup;

[0009] The bottom of the test box is provided with an inclined platform, the middle of the inclined platform is provided with a test platform, a test plate is installed on the test platform, wherein one end of the inclined platform is provided with a drain groove, and the drain groove is connected with the debris groove.

[0010] In addition, a preferred structure is that a protective plate is rotatably mounted on one side of the upper portion of the test box, and an observation window is rotatably mounted on one side of the lower portion, and an observation window is provided in the middle of the observation window.

[0011] In addition, a preferred structure is that a control box is provided on a side away from the test box, and the control box is connected to the lifting mechanism and the vacuum pump.

[0012] In addition, a preferred structure is that the inclined platform is inclined toward one side of the observation window, and a horizontal platform is provided at a distance from the inclined end of the inclined platform, a drain groove is provided in the middle of the platform, and the drain groove is connected to the debris groove.

[0013] In addition, a preferred structure is that the debris trough is installed on one side of the bottom of the test box, and the interior of the debris trough is arranged in an inclined shape, and a notch is opened on the inclined surface, and a magnetic plate is installed in the notch by clamping a clamp block.

[0014] In addition, a preferred structure is that a guide plate is provided at the inclined end of the debris groove.

[0015] In addition, a preferred structure is that a vacuum pump is installed on the upper part of the lifting head, and a plurality of vacuum suction cups are arranged on the lower part, and each vacuum suction cup is connected to the vacuum pump.

[0016] The beneficial effects of the utility model are:

[0017] In the utility model, the device to be tested is fixed on the lifting head by a vacuum suction cup, and the lifting head is driven to rise and fall by a control box, and the device is released at a specified height. Not only can the stability and sameness of the test conditions be guaranteed each time, but also the loading can be carried out more quickly to ensure the detection efficiency. At the same time, by cooperating with the inclined table and the test platform set at the bottom of the test box, the splashing of debris caused by the falling equipment can be avoided, and the debris can be collected in time to ensure the accuracy of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the external structure of an electronic device drop test device proposed by the utility model;

[0019] Figure 2 A schematic diagram of the test platform structure of an electronic device drop test device proposed by the utility model;

[0020] Figure 3 This is a schematic diagram of the structure of a lifting head of an electronic equipment drop test device proposed by the utility model;

[0021] Figure 4 The present invention is a schematic diagram of a debris chute structure of an electronic device drop test device.

[0022] In the figure: 1 test box, 2 lifting mechanism, 3 control box, 4 protection plate, 5 observation window, 6 guide plate, 7 debris trough, 71 leakage trough, 72 magnetic plate, 721 block, 8 inclined table, 9 test platform, 91 test plate, 10 lifting head, 11 vacuum pump, 12 vacuum suction cup. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0024] Reference Figure 1-4 , an electronic device drop test device, comprising a test box 1, a protective plate 4 and an observation window 5 are rotatably installed on one side of the test box 1, and a lifting mechanism 2 is arranged in the middle of the other side, a lifting head 10 is driven and arranged on the lifting mechanism 2, a vacuum pump 11 is arranged on the lifting head 10, and the vacuum pump 11 is connected to a vacuum suction cup 12;

[0025] Furthermore, a ramp 8 is provided at the bottom of the test box 1 , a test platform 9 is provided in the middle of the ramp 8 , a test plate 91 is mounted on the test platform 9 , and a drain groove 71 is provided at one end of the ramp 8 , which is connected to the debris groove 7 .

[0026] A protective plate 4 is rotatably mounted on one side of the upper portion of the test box 1 , and an observation window 5 is rotatably mounted on one side of the lower portion, wherein an observation window is provided in the middle of the observation window 5 .

[0027] Moreover, a control box 3 is disposed on a side away from the test box 1 , and the control box 3 is connected to the lifting mechanism 2 and the vacuum pump 11 .

[0028] In addition, the inclined platform 8 is inclined toward one side of the observation window 5 , and a horizontal platform is provided at a distance from the inclined end of the inclined platform 8 . A drain groove 71 is provided in the middle of the platform, and the drain groove 71 is connected to the debris groove 7 .

[0029] Meanwhile, the debris trough 7 is installed at one side of the bottom of the test box 1, and the interior of the debris trough 7 is arranged in an inclined shape, and a notch is provided on the inclined surface thereof, and a magnetic plate 72 is installed in the notch by a clamping block 721. The magnetic plate 72 can effectively absorb metal debris in the debris, avoid waste of resources, and improve the convenience of recycling.

[0030] Next, a guide plate 6 is provided at the inclined end of the debris groove 7. The guide plate 6 can enable the debris to be discharged faster and improve the collection efficiency of the debris.

[0031] Moreover, a vacuum pump 11 is installed on the upper part of the lifting head 10 , and a plurality of vacuum suction cups 12 are arranged on the lower part, and each vacuum suction cup 12 is connected to the vacuum pump 11 .

[0032] In this embodiment, the vacuum pump 11 is driven by the control box 3 to work, and the device to be tested is adsorbed and fixed by the vacuum suction cup 12. At the same time, the lifting mechanism 2 is controlled by the control box 3 to drive the lifting head 10 to lift and lower, and drive the device on the vacuum suction cup 12 to rise to the specified test height, and the vacuum pump 11 is controlled by the control box 3 to release the device, so that the device falls on the test plate 91 at the bottom of the test box 1 in a free fall manner, and the debris splashed due to the test is collected by the inclined platform 8, and the debris enters the leakage groove 71 on one side through the inclined platform 8, and the possible metal debris is adsorbed and collected by the magnetic plate 72, and other debris is discharged through the guide plate 6.

[0033] During the test, the protective plate 4 and the observation window 5 can prevent debris from splashing, and the test results can be observed. At the same time, the detachable magnetic plate 72 at the bottom also improves the efficiency of collecting debris.

[0034] It is worth noting that, under the action of the vacuum pump 11, the vacuum suction cup 12 generates negative pressure inside the suction cup and adsorbs the attached device.

[0035] It is worth noting that the lifting mechanism 2 drives the lifting head 10 to move up and down, and the lifting mechanism 2 is a motor and a screw drive mechanism, thereby realizing the lifting function of the lifting head 10.

[0036] In the utility model, the device to be tested is fixed on the lifting head 10 by the vacuum suction cup 12, and the lifting head 10 is driven to rise and fall by the control box 3, and the device is released at a specified height, which can not only ensure the stability and consistency of the test conditions each time, but also enable faster loading and ensure the detection efficiency. At the same time, by cooperating with the inclined table 8 and the test platform 9 set at the bottom of the test box 1, it is possible to avoid the splashing of debris caused by the falling of the equipment, and the debris can be collected in time to ensure the accuracy of the test results.

[0037] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. An electronic equipment drop test device, comprising a test box (1), characterized in that: A protective plate (4) and an observation window (5) are rotatably mounted on one side of the test box (1), and a lifting mechanism (2) is arranged in the middle of the other side. A lifting head (10) is driven and arranged on the lifting mechanism (2). A vacuum pump (11) is arranged on the lifting head (10), and the vacuum pump (11) is connected to a vacuum suction cup (12); The bottom of the test box (1) is provided with an inclined platform (8), the middle of the inclined platform (8) is provided with a test platform (9), a test plate (91) is installed on the test platform (9), wherein one end of the inclined platform (8) is provided with a drain groove (71), and the drain groove (71) is connected to the debris groove (7).

2. The electronic device drop test device according to claim 1, characterized in that: A protective plate (4) is rotatably mounted on one side of the upper portion of the test box (1), and an observation window (5) is rotatably mounted on one side of the lower portion, wherein an observation window is provided in the middle of the observation window (5).

3. The electronic device drop test device according to claim 1, characterized in that: A control box (3) is provided on a side away from the test box (1), and the control box (3) is connected to the lifting mechanism (2) and the vacuum pump (11).

4. The electronic device drop test device according to claim 1, characterized in that: The inclined platform (8) is inclined toward one side of the observation window (5), and a horizontal platform is provided at a distance from the inclined end of the inclined platform (8). A drain groove (71) is provided in the middle of the platform, and the drain groove (71) is connected to the debris groove (7).

5. The electronic device drop test device according to claim 4, characterized in that: The debris trough (7) is installed on one side of the bottom of the test box (1), and the interior of the debris trough (7) is arranged in an inclined shape, with a notch provided on its inclined surface, and a magnetic plate (72) is mounted in the notch by means of a clamping block (721).

6. The electronic device drop test device according to claim 5, characterized in that: A guide plate (6) is provided at the inclined end of the debris groove (7).

7. The electronic device drop test device according to claim 1, characterized in that: A vacuum pump (11) is installed on the upper part of the lifting head (10), and a plurality of vacuum suction cups (12) are arranged on the lower part, and each vacuum suction cup (12) is connected to the vacuum pump (11).

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