Switching device test circuit

Abstract

The utility model discloses a switch device test circuit comprising N devices, two ends of the N devices are respectively connected with a device state monitoring module and an output state monitoring module, and the device state monitoring module comprises a control unit and a power supply unit; the N devices are respectively powered by the power supply unit, the signal output ends of the N devices are connected with the control unit, and the signal input ends of the N devices are respectively connected with the signal generation unit. Effective long-term high-frequency reliability tests can be carried out on the performance of driving switch products in a centralized manner, the switch frequency is counted by ten millions of times, and the products are quickly screened; the circuit is simple, cascade connection of multiple devices can be achieved, and good realizability, maintainability and generalization performance are achieved.

Description

Technical Field

[0001] The utility model relates to a switch device test circuit. Background Art

[0002] With the update and iteration of semiconductor packaging and testing technology, the application of semiconductor packaging and testing technology is becoming more and more extensive, such as SIP packaging technology. These advanced packaging and testing technologies are used to package some board-level functional systems at the device level to improve the application scope and quality reliability of the functional systems. With the application of these advanced packages, what follows is how to effectively evaluate the reliability of these functional devices and how to effectively judge the quality of the devices. For the reliability evaluation of some new high-power and low-loss switch modules and some test circuits, we have carried out targeted design based on its functional characteristics, parameter characteristics, etc., and have achieved the purpose of effective reliability evaluation. At present, there are equipment in China for reliability screening of such hybrid integrated module products. Utility Model Content

[0003] In order to solve the above technical problems, the utility model provides a switch device test circuit.

[0004] The utility model is realized through the following technical solutions.

[0005] The utility model provides a switch device test circuit, comprising N devices, wherein two ends of the N devices are respectively connected to a device state monitoring module and an output state monitoring module, and the device state monitoring module comprises a control unit and a power supply unit; the N devices are respectively powered by the power supply unit, the signal output ends of the N devices are connected to the control unit, and the signal input ends of the N devices are respectively connected to the signal generating unit.

[0006] The power supply unit includes a resistor R1, one end of which is connected to a 10VVCC power supply and an RL resistor module, and the other end is connected to a positive electrode of a light-emitting diode LED-greed, and a negative electrode of the light-emitting diode LED-greed is grounded. The other end of the RL resistor module is connected to a power input end of the device and a light-emitting diode LED2-red, and the negative electrode of the light-emitting diode is connected to the resistor R2. The other end of the resistor R2 is connected to a base of a transistor Q, and a collector of the transistor Q is connected to a negative electrode of a buzzer. The positive electrode of the buzzer inputs a power supply, and the emitter of the transistor Q is grounded.

[0007] The RL resistor module includes two groups of resistors connected in parallel, and the two groups of resistors are respectively composed of three resistors connected in series.

[0008] The signal generating unit includes a signal generator, the anode of the signal generator is connected to the cathode of the light-emitting diode LED-greed2, the output end and the ground end are grounded, the anode of the diode LED-greed2 is connected to the resistor R3, the other end of the resistor R3 is connected to the 28V power supply and the emitter of the transistor Q1, the base of the transistor Q1 is connected to the cathode of the diode DR, the anode of the diode DR is connected to the resistor R4, the other end of the resistor R4 is connected to the signal end of the signal generator, and the collector of the transistor Q1 and the signal end of the signal generator are respectively connected to the anode and cathode of the signal input end of the device.

[0009] The device state monitoring module and the output state monitoring module are respectively connected to the device through a wiring terminal, the wiring terminal includes 2×N input ports, the 2×N input ports are divided into two groups, each group is connected in parallel with an output port, and the two input ports of the two wiring terminals are respectively connected to the positive and negative poles of the input ends of the output state monitoring module and the device state monitoring module.

[0010] The beneficial effects of the utility model are: it can concentrate on conducting effective long-term and high-frequency reliability tests on the performance of drive switch products, with the switching frequency counted in tens of millions of times, so that products can be quickly screened; the circuit is simple, and multiple devices can be cascaded, with good feasibility, maintainability and promotion. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 It is a schematic diagram of the system structure of the utility model;

[0012] Figure 2 This is a schematic diagram of the load circuit principle of the utility model;

[0013] Figure 3 It is a schematic diagram of a power supply circuit of the utility model;

[0014] Figure 4 It is a schematic diagram of a control signal circuit of the utility model. DETAILED DESCRIPTION

[0015] The technical solution of the utility model is further described below, but the scope of protection required is not limited to the description.

[0016] A switch device test circuit, characterized in that: it includes N devices, the two ends of the N devices are respectively connected to the device state monitoring module and the output state monitoring module, the device state monitoring module includes a control unit and a power supply unit; the N devices are respectively powered by the power supply unit, the signal output ends of the N devices are connected to the control unit, and the signal input ends of the N devices are respectively connected to the signal generating unit. Functional module products are hybrid integrated circuit module products with certain electrical functions composed of different discrete devices through a certain circuit design. The functional characteristics of the module itself lead to the fact that some devices can no longer be parameter tested after the module is formed, and only the device parameter test cannot fully guarantee the normal function of the module as a whole. Therefore, it is necessary to study the electrical parameter characteristics of the functional module, formulate scientific and reasonable electrical performance parameter test items and standards suitable for the functional module, and develop a set of comprehensive electrical parameter test solutions integrating test circuits, computer test programs, and test fixtures. The alarm system alarms the products that fail the test during the test, saves the data, and automatically cuts off the work of the unqualified product station. The control center, power system, device operation station and simulated load end are separated into four areas and connected through bus communication technology to ensure the mobility of the test platform and the evaluation requirements for more products. Long-term high-frequency reliability tests are carried out, and the switching frequency is counted in tens of millions of times. The circuit is simple and can realize cascading of multiple devices, which has good feasibility, maintainability and promotion.

[0017] like Figure 2 As shown, the power supply unit includes a resistor R1, one end of the resistor R1 is connected to the 10VVCC power supply and the RL resistor module, the other end is connected to the positive electrode of the light-emitting diode LED-greed, the negative electrode of the light-emitting diode LED-greed is grounded, the other end of the RL resistor module is connected to the power input end of the device and the light-emitting diode LED2-red, the negative electrode of the light-emitting diode is connected to the resistor R2, the other end of the resistor R2 is connected to the base of the transistor Q, the collector of the transistor Q is connected to the negative electrode of the buzzer, the positive electrode of the buzzer inputs the power supply, and the emitter of the transistor Q is grounded. When the lamp and the buzzer are welded and installed, a row socket type is used. When the light-emitting diode LED2-red is on, it means that the aging device has failed, and the buzzer sounds at the same time, and the alarm voltage is ~2.5V.

[0018] The RL resistor module includes two groups of resistors connected in parallel, and the two groups of resistors are respectively composed of three resistors connected in series.

[0019] like Figure 4As shown, in order to increase the switching speed and prevent power jitter products from causing damage, the signal generating unit includes a signal generator, the positive electrode of the signal generator is connected to the negative electrode of the light-emitting diode LED-greed2, the output end and the ground end are grounded, the positive electrode of the diode LED-greed2 is connected to the resistor R3, the other end of the resistor R3 is connected to the 28V power supply and the emitter of the transistor Q1, the base of the transistor Q1 is connected to the negative electrode of the diode DR, the positive electrode of the diode DR is connected to the resistor R4, the other end of the resistor R4 is connected to the signal end of the signal generator, and the collector of the transistor Q1 and the signal end of the signal generator are respectively connected to the positive and negative electrodes of the signal input end of the device.

[0020] The device state monitoring module and the output state monitoring module are respectively connected to the device through a wiring terminal, the wiring terminal includes 2×N input ports, the 2×N input ports are divided into two groups, each group is connected in parallel with an output port, and the two input ports of the two wiring terminals are respectively connected to the positive and negative poles of the input ends of the output state monitoring module and the device state monitoring module.

Claims

1. A switching device test circuit, characterized in that: It comprises N devices, both ends of which are respectively connected to a device status monitoring module and an output status monitoring module, and the device status monitoring module comprises a control unit and a power supply unit; the N devices are respectively powered by the power supply unit, the signal output ends of the N devices are connected to the control unit, and the signal input ends of the N devices are respectively connected to the signal generating unit.

2. The switching device test circuit according to claim 1, characterized in that: The power supply unit includes a resistor R1, one end of which is connected to a 10VVCC power supply and an RL resistor module, and the other end is connected to the positive electrode of a light-emitting diode LED-greed, and the negative electrode of the light-emitting diode LED-greed is grounded. The other end of the RL resistor module is connected to the power input end of the device and the light-emitting diode LED2-red, and the negative electrode of the light-emitting diode is connected to the resistor R2. The other end of the resistor R2 is connected to the base of the transistor Q, and the collector of the transistor Q is connected to the negative electrode of the buzzer. The positive electrode of the buzzer inputs the power supply, and the emitter of the transistor Q is grounded.

3. The switching device test circuit according to claim 2, characterized in that: The RL resistor module includes two groups of resistors connected in parallel, and the two groups of resistors are respectively composed of three resistors connected in series.

4. The switching device test circuit according to claim 1, characterized in that: The signal generating unit includes a signal generator, the anode of the signal generator is connected to the cathode of the light-emitting diode LED-greed2, the output end and the ground end are grounded, the anode of the diode LED-greed2 is connected to the resistor R3, the other end of the resistor R3 is connected to the 28V power supply and the emitter of the transistor Q1, the base of the transistor Q1 is connected to the cathode of the diode DR, the anode of the diode DR is connected to the resistor R4, the other end of the resistor R4 is connected to the signal end of the signal generator, and the collector of the transistor Q1 and the signal end of the signal generator are respectively connected to the anode and cathode of the signal input end of the device.

5. The switching device test circuit according to claim 1, characterized in that: The device state monitoring module and the output state monitoring module are respectively connected to the device through a wiring terminal, the wiring terminal includes 2×N input ports, the 2×N input ports are divided into two groups, each group is connected in parallel with an output port, and the two input ports of the two wiring terminals are respectively connected to the positive and negative poles of the input ends of the output state monitoring module and the device state monitoring module.

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