Chip high-precision test fixture with controllable clamping force

Abstract

The utility model provides a chip high-precision test fixture with controllable clamping force, which relates to the technical field of chip testing and comprises a supporting table, a screw rod is arranged in the supporting table, one end of the screw rod is connected with a rotating motor, a moving assembly is arranged on the surface of the screw rod, and the front and the back of the moving assembly are connected with turnover mechanisms. The top of the turnover mechanism is fixedly connected with a test base, a storage box is placed below the test base, the bottom of the turnover mechanism is connected with a rotating rod, one end of the rotating rod is provided with a gear, the top of the moving assembly is connected with a rotating motor, the top of the supporting table is provided with a rotating support, and the bottom end of the rotating support is provided with a telescopic air cylinder. The telescopic end of the telescopic cylinder is provided with a connecting piece, the bottom of the connecting piece is connected with a double-head cylinder, the telescopic end of the double-head cylinder is connected with a clamping jaw, the inner side of the clamping jaw is connected with a pressure sensor, a supporting plate is arranged above the supporting table, the top of the supporting plate is provided with a stroke cylinder, the bottom of the stroke cylinder is provided with a testing cover, manpower is saved, and the working efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a high-precision chip testing fixture with controllable clamping force. Background Art

[0002] Chip is a general term for semiconductor component products, also known as microcircuit or microchip. It refers to a silicon wafer containing an integrated circuit. It is very small and is often part of a computer or other electronic device. Semiconductor is a general term for a class of materials. Integrated circuit is a large collection of circuits made of semiconductor materials. Chip is a product formed by different types of integrated circuits or a single type of integrated circuit.

[0003] The publication number is: CN212160005U. The utility model discloses a test device that can test multiple chips to be tested at the same time, which includes: a conveying mechanism, on which a plurality of test seats for placing the chips to be tested are installed; a test mechanism, which is arranged at the upper end of the conveying mechanism, including a stroke cylinder and a test cover arranged on the stroke cylinder, the test cover is provided with a probe connected to the test box, the probe cooperates with each pin of the chip to be tested, and is used to perform performance testing on the chip to be tested; and a unloading mechanism, which includes a picking mechanism for picking up the chip to be tested and a power mechanism for driving the picking mechanism to move from a picking area to an unloading area. The utility model proposes a test device that can test multiple chips to be tested at the same time, and is intended to perform automated processing on the chips to be tested to improve processing efficiency, and at the same time achieve the purpose of synchronously testing multiple chips to be tested.

[0004] Existing automatic testing devices for LCD screen defects usually have the following technical problems:

[0005] 1. The existing high-precision chip test fixture device with controllable clamping force requires the clamping claws to clamp and fix the chip, and the existing clamping claws cannot obtain the maximum force that the chip can withstand by retracting and extending the clamping claws during the clamping process. As a result, a large number of chips may be damaged and scrapped during the clamping process because the clamping claws cannot control the force. This greatly wastes resource costs.

[0006] 2. The existing high-precision chip test fixture device with controllable clamping force needs to use the clamping claws to place the chip into the test base when testing the chip. After the chip test is completed, the clamping claws need to be used to clamp the chip out. When the chip is detected as unqualified, the unqualified chip also needs to be placed in the designated recovery tray using the clamping claws. The chip detection speed is very fast, and the fixture needs to work continuously. Since the fixture is required for loading and unloading, it is likely to cause the fixture to be overloaded during work, causing damage to the fixture. The maintenance cost is high and the maintenance time is long, which is not conducive to factory development. Utility Model Content

[0007] The purpose of the utility model is to solve the technical problems that the clamping force of the prior art cannot be controlled, resulting in damage to the chip during the clamping process and that the clamp needs to clamp the chip and place it in a prepared storage box after the test chip is qualified, and to propose a high-precision chip testing fixture with controllable clamping force.

[0008] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: a high-precision chip testing fixture with controllable clamping force, comprising a support table, characterized in that: a screw is provided inside the support table, one end of the screw is connected to a rotating motor, a moving assembly is provided on the surface of the screw, a flip mechanism is connected to the front and rear of the moving assembly, the top of the flip mechanism is fixedly connected to a test base, a material storage box is placed below the test base, a rotating rod is connected to the bottom of the flip mechanism, a gear is provided at one end of the rotating rod, the top of the moving assembly is connected to a rotating motor, a rotating bracket is provided at the top of the support table, a telescopic cylinder is provided at the bottom end of the rotating bracket, a connecting piece is provided at the telescopic end of the telescopic cylinder, a double-headed cylinder is connected to the bottom of the connecting piece, a support plate is provided above the support table, a stroke cylinder is provided on the top of the support plate, a test cover is provided at the bottom of the stroke cylinder, a loading box is provided on one side of the support table, and a recovery tray is connected to the top of the support table.

[0009] It can be seen that in the above technical scheme, before the equipment works, the staff first puts the chip to be tested into the pressure end of the pressure sensor between the two jaws, and then the staff manually controls the jaws to make the telescopic cylinder drive the jaws to contract. When the pressure end of the pressure sensor contacts the chip, the pressure sensor converts the pressure into a small electrical signal, which is then transmitted and displayed. At this time, the staff will get some data. After the jaws fix the chip, the staff stops operating the jaws. At this time, the staff records the pressure data and inputs it into the control terminal of the operating fixture, so that when the fixture is working normally, when the pressure on the pressure sensor reaches the data input at the control terminal, the fixture stops clamping, so that the chip is fixed between the fixtures, and the chip will not be damaged. When the equipment is in During normal operation, the fixture uses the rotating bracket to rotate to the side of the support table to clamp and fix the chip to be tested in the loading box. At this time, the rotating motor rotates to move the test base into the range of the fixture, and the fixture places the chip in the test base. At this time, the upper half of the chip is exposed outside the test base. After the two sets of test bases are placed in the chips, the screw rod rotates to move the test base to the bottom of the support plate. At this time, the stroke cylinder works to press the test cover box test base down to start testing. When the chip is qualified, the screw rod moves the test base to the bottom of the storage box, and the output end of the rotating motor rotates to flip the flipping mechanism from inside to outside, so that the chip falls into the storage box below. When unqualified chips appear, the screw rod moves to one side of the fixture, and the unqualified chips are recovered by the fixture to the recovery tray above the support table.

[0010] Preferably, the rotating motor is welded to one side of the support platform, the moving component is sleeved on the surface of the screw rod, and the surface of the screw rod of the moving component is threadedly connected.

[0011] It can be seen that in the above technical solution, when the output end of the rotating motor rotates and drives the screw rod to rotate together, the moving component can move left and right on the surface of the screw rod.

[0012] Preferably, the surfaces of the rotating rod are respectively connected to the flipping mechanism and the moving assembly, and both ends of the rotating rod are located in the inner wall interface of the moving assembly and are connected to the bearings of the moving assembly.

[0013] It can be seen that in the above technical solution, the turning mechanism can be turned from inside to outside by driving the rotating rod to rotate with the gear, so that the chip falls off.

[0014] Preferably, there are two groups of gears, and the two groups of gears are respectively connected to one end of the rotating rod and the rotating end of the rotating motor, and the surfaces of the two groups of gears are meshed with each other. The rotating bracket is close to one side of the support platform, and the rotating bracket is L-shaped.

[0015] It can be seen that in the above technical solution, the output end of the rotating motor is used to rotate to drive the two sets of gears to rotate, so that the flipping mechanism can be flipped. Since a loading box is installed on one side of the support table, the rotating bracket is convenient for material removal and loading.

[0016] Preferably, the top end of the telescopic cylinder is connected to one end of the rotating bracket, and the telescopic cylinder is perpendicular to the top surface of the support platform, the connecting piece is located between the telescopic cylinder and the double-headed cylinder, and the double-headed cylinder is laterally connected to the bottom of the connecting piece.

[0017] It can be seen that in the above technical solution, the telescopic cylinder can be used to move the clamping jaws up and down during operation, and the connecting piece can be used to connect the telescopic ends of the double-headed cylinder and the telescopic cylinder.

[0018] Preferably, the telescopic ends of the double-headed cylinder are connected with clamping jaws, and there are two groups of clamping jaws in total, and pressure sensors are installed on the inner sides of the clamping jaws.

[0019] It can be seen that in the above technical solution, the telescopic end of the double-headed cylinder can be used to make the clamping jaws contract freely during operation, and the pressure sensor can be used to convert the pressure into data when clamping, so that the staff can obtain the pressure value that the chip is subjected to.

[0020] Preferably, there are two groups of stroke cylinders, and the telescopic end of one group of stroke cylinders is connected to the test cover, the loading box is fixedly welded to one side of the support platform, and the recovery plate is fixedly connected to the top of the support platform.

[0021] It can be seen that in the above technical solution, the stroke cylinder can be used to press the test cover down into the test base to detect the chip, the loading box is used to store the chips to be tested, and the recovery tray is used to recover the chips that fail the test.

[0022] Beneficial Effects

[0023] In the utility model, before the equipment starts working, the staff will first inspect the entire machine. When the equipment inspection is completed, the staff will first take out a chip that needs to be inspected and place it under the fixture. Then the staff will manually control the fixture to clamp the chip. Since pressure sensors are installed on the sides of the two jaws of the fixture, when the chip is located in the center of the two pressure sensors, the telescopic end of the double-headed cylinder above the fixture contracts from the outside to the inside to shrink the jaws. When the sensor is subjected to pressure, the pressure sensor converts the pressure into a small electrical signal, which is then transmitted and displayed. At this time, the staff will obtain some data. After the fixture fixes the chip, the staff will record the current data and then input the data into the control terminal of the operating fixture. When the fixture clamps the chip normally, when the data of the pressure sensor reaches the data input in the control terminal, the fixture stops clamping, so that the chip is fixed between the fixtures, and the chip will not be damaged, saving resource costs.

[0024] In the utility model, when the equipment is working, the fixture uses the rotating bracket to rotate to the side of the support platform, uses the telescopic cylinder and the double-headed cylinder to clamp and fix the chip in the loading box, and then the output end of the rotating motor drives the screw to rotate. At this time, the moving component drives the detection base to move toward the fixture. After moving into the working range of the fixture, the fixture starts to put the chip to be detected on the detection base. The upper part of the chip is exposed at the top. When the two detection bases on the moving component are placed with chips, the detection base will move to the bottom of the detection cover on the other side as the screw rotates. At this time, the two stroke cylinders on the top of the support plate start to work. The two inspection covers at the bottom of the support plate are pressed down into the inspection base to allow the chip to be inspected. When the chip is qualified, the two rotating motor output ends on the moving component drive the gears to rotate. At this time, the flip structure reverses from top to bottom, causing the qualified chips to fall into the storage box below. There is no need to use a clamp to take out and recycle the qualified chips, reducing the workload of the clamp and avoiding overloading of the clamp. When an unqualified chip is detected, the moving component continues to move toward the clamp, and the unqualified chip is clamped by the clamp and placed in the recovery tray above the support table. This series of operations not only saves time, but also improves work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 It is a three-dimensional diagram of the structure of the utility model;

[0026] Figure 2 It is a top view of the structure of the utility model;

[0027] Figure 3 It is a rear view of the structure of the utility model;

[0028] Figure 4 A schematic diagram of a fixture of the utility model structure

[0029] Figure 5 for Figure 4 A magnified view of location A.

[0030] Legend:

[0031] 1. Support table; 2. Screw; 3. Rotating motor; 4. Moving assembly; 5. Rotating motor; 6. Gear; 7. Rotating rod; 8. Flipping mechanism; 9. Test base; 10. Recovery tray; 11. Support plate; 12. Stroke cylinder; 13. Test cover; 14. Rotating bracket; 15. Telescopic cylinder; 16. Connector; 17. Double-head cylinder; 18. Gripper; 19. Pressure sensor; 20. Loading box; 21. Storage box. DETAILED DESCRIPTION

[0032] In order to make the technical means, creative features, objectives and effects of the utility model easier to understand, the utility model is further described below in conjunction with specific embodiments and drawings, but the following embodiments are only preferred embodiments of the utility model, not all. Based on the embodiments in the implementation mode, other embodiments obtained by those skilled in the art without creative work are all within the protection scope of the utility model.

[0033] The specific embodiments of the present utility model are described below in conjunction with the accompanying drawings. Specific embodiment:

[0035] Embodiment 1:

[0036] Reference Figure 1-5 A high-precision chip test fixture with controllable clamping force includes a support table 1, characterized in that: a screw rod 2 is provided inside the support table 1, one end of the screw rod 2 is connected to a rotating motor 3, a moving component 4 is provided on the surface of the screw rod 2, the support table 1 is installed with a screw rod 2, and the two ends of the screw rod 2 are tightly fitted with the two sides of the interior of the support table 1, and the output end of the rotating motor 3 is connected to one end of the screw rod 2, and the rotating motor 3 is tightly fitted with one side of the support table 1, the moving component 4 is sleeved on the surface of the screw rod 2, and the top and bottom of the moving component 4 are respectively fitted with the upper and lower ends of the interior of the support table 1, because the two ends of the screw rod 2 are fitted with the inner walls on both sides of the support table 1, so the moving component 4 can be prevented from slipping during the movement, causing damage to the equipment.

[0037] The front and rear of the moving component 4 are connected with a flipping mechanism 8, the top of the flipping mechanism 8 is fixedly connected with a test base 9, a storage box 21 is placed below the test base 9, and a rotating rod 7 is connected to the bottom of the flipping mechanism 8. There are two groups of flipping mechanisms 8, which are respectively located at the front and rear of the moving component 4. Grooves are provided at the front and rear of the moving component 4. The flipping mechanism 8 is embedded in the groove, and the rotating rod 7 is located in the groove, and the rotating rod 7 is connected with a bearing on the inner wall of the groove, so that the rotating rod 7 can be limited when it rotates, and the flipping mechanism 8 is connected to the surface of the rotating rod 7. When the rotating rod 7 rotates, the flipping mechanism 8 can be driven to flip from the inside to the outside, and the chip in the test base 9 is flipped and dropped into the storage box 21 below. A gear 6 is provided at one end of the rotating rod 7. A rotating motor 5 is connected to the top of the moving component 4. There are two groups of gears 6, which are respectively located at one end of the rotating rod 7 and the output end of the rotating motor 5, and the two groups of gears 6 are meshed with each other. When the flipping mechanism 8 needs to be flipped, the output end of the rotating motor 5 rotates, driving the rotating rod 7 to rotate, so that the flipping structure flips.

[0038] Embodiment 2:

[0039] Reference Figure 1-5A rotating bracket 14 is provided on the top of the support platform 1, a telescopic cylinder 15 is provided at the bottom of the rotating bracket 14, a connecting piece 16 is provided at the telescopic end of the telescopic cylinder 15, a double-headed cylinder 17 is connected to the bottom of the connecting piece 16, a clamp 18 is connected to the telescopic end of the double-headed cylinder 17, a pressure sensor 19 is connected to the inner side of the clamp 18, a base is provided at the bottom of the rotating bracket 14, and the base is installed on the top of the support platform 1. When the rotating bracket 14 is working, the rotating bracket 14 can rotate on the base, and the rotating bracket 14 is L-shaped. The top of the telescopic cylinder 15 is installed at one end of the rotating bracket 14, and the telescopic end of the telescopic cylinder 15 is vertically downward. When the clamp needs to clamp, the telescopic end of the telescopic cylinder 15 extends out, and then the clamp clamps and fixes the chip. The connecting piece 16 is located between the telescopic end of the telescopic cylinder 15 and the top surface of the double-headed cylinder 17, and is used to connect the two groups of cylinders. The telescopic ends at both ends of the double-headed cylinder 17 are fixedly connected to two groups of clamping claws 18. When the double-headed cylinder 17 is working, the clamping claws 18 can freely shrink according to the double heads and the telescopic ends of the cylinder, and the two groups of clamps Two groups of pressure sensors 19 are installed on the inner side of the claw 18, and the two sides of the two groups of pressure sensors 19 are fixedly connected to the inner sides of the two groups of clamps respectively. The pressure sensor 19 is composed of components such as a receptor, a signal converter, and a signal processor, and the pressure sensor 19 utilizes the characteristics of piezoelectric materials. When subjected to pressure, the piezoelectric material will generate an electric charge or voltage. This change can be contacted to the piezoelectric material through the electrode, thereby measuring the pressure. When the staff needs to perform pressure detection on the chip, the staff puts the chip between the pressing pieces on the two groups of pressure sensors 19 and controls the clamping of the clamp 18. When the pressing piece touches the chip, the staff obtains pressure data through the components of the pressure sensor 19. When the chip is completely clamped and fixed, the jaws 18 stop contracting, and finally the obtained pressure data is input into the control terminal of the operating jaws 18. When the jaws 18 clamp the chip normally, when the pressure data reaches the data input at the control terminal, the jaws 18 stop contracting, so that the chip is fixed and supported between the jaws 18 without damaging the chip.

[0040] A support plate 11 is provided above the support platform 1, a stroke cylinder 12 is provided on the top of the support plate 11, a test cover 1313 is provided at the bottom of the stroke cylinder 12, a loading box 20 is provided on one side of the support platform 1, a recovery plate 10 is connected to the top of the moving component 4, the support plate 11 is located directly above the support platform 1, and the support legs of the support platform 1 are fixedly welded to the bottom of the support platform 1, two groups of stroke cylinders 12 are provided above the support plate 11, and two groups of test covers 13 are installed at the telescopic ends of the two groups of stroke cylinders 12, and the shape of the test cover 13 is the same as that of the test cover 13. The test base 9 has the same shape and size. When the chip needs to be tested, the test base 9 is moved to just below the test cover 13, and the stroke cylinder 12 starts to work, pressing the test cover 13 downward, and the chip is completely enclosed by the test cover 13 and the test base 9. The chip is connected to the external signal source through the interface, and the test can be carried out, so as to test the performance, function, quality and other aspects of the chip. The chip in the test base 9 is tested, the loading box 20 is used to store the chips to be tested, and the recovery tray 10 is used to recover the chips that fail the test.

[0041] In summary:

[0042] 1. The pressure sensor 19 can detect the force exerted on the chip during the process of being clamped by the clamp 18, and the chip can be fixedly clamped by the clamp 18 at a certain pressure, and the chip will not be damaged, which reflects the practicality of the pressure sensor 19;

[0043] 2. The qualified chips in the test base 9 are turned over and dropped into the storage box 21 below by using the rotating rod 7, the gear 6 and the rotating motor 5, thereby improving the working efficiency.

[0044] In the present utility model, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0045] The above shows and describes the basic principle, main features and advantages of the utility model. Those skilled in the art should understand that the utility model is not limited by the above embodiments. The above embodiments and descriptions are only preferred examples of the utility model and are not used to limit the utility model. Without departing from the spirit and scope of the utility model, the utility model may have various changes and improvements, which fall within the scope of the utility model to be protected. The scope of protection of the utility model is defined by the attached claims and their equivalents.

Claims

1. A high-precision chip testing fixture with controllable clamping force, comprising a support table (1), characterized in that: The support platform (1) is provided with a screw rod (2) inside, one end of the screw rod (2) is connected to a rotating motor (3), a moving assembly (4) is provided on the surface of the screw rod (2), the moving assembly (4) is connected to a flipping mechanism (8), the top of the flipping mechanism (8) is fixedly connected to a test base (9), a material storage box (21) is placed below the test base (9), the bottom of the flipping mechanism (8) is connected to a rotating rod (7), one end of the rotating rod (7) is provided with a gear (6), the top of the moving assembly (4) is connected to a rotating motor (5), the support platform ( 1) is provided with a rotating bracket (14) at the top, a telescopic cylinder (15) is provided at the bottom end of the rotating bracket (14), a connecting piece (16) is provided at the telescopic end of the telescopic cylinder (15), a double-headed cylinder (17) is connected to the bottom of the connecting piece (16), a supporting plate (11) is provided above the supporting platform (1), a stroke cylinder (12) is provided at the top of the supporting plate (11), a test cover (13) is provided at the bottom of the stroke cylinder (12), a loading box (20) is provided on one side of the supporting platform (1), and a recovery tray (10) is connected to the top of the supporting platform (1).

2. The high-precision chip test fixture with controllable clamping force according to claim 1, characterized in that: The rotating motor (3) is welded to one side of the support platform (1), the moving component (4) is sleeved on the surface of the screw rod (2), and the surface of the moving component (4) and the screw rod (2) are threadedly connected.

3. The high-precision chip test fixture with controllable clamping force according to claim 1, characterized in that: The surfaces of the rotating rod (7) are respectively connected to the flipping mechanism (8) and the moving assembly (4), and the two ends of the rotating rod (7) are located at the inner wall interface of the moving assembly (4) and are connected to the bearing of the moving assembly (4).

4. The high-precision chip test fixture with controllable clamping force according to claim 1, characterized in that: There are two groups of gears (6), and the two groups of gears (6) are respectively connected to one end of the rotating rod (7) and the rotating end of the rotating motor (5), and the surfaces of the two groups of gears (6) are meshed with each other. The rotating bracket (14) is close to one side of the supporting platform (1), and the rotating bracket (14) is L-shaped.

5. The high-precision chip test fixture with controllable clamping force according to claim 1, characterized in that: The top end of the telescopic cylinder (15) is connected to one end of the rotating bracket (14), and the telescopic cylinder (15) is perpendicular to the top surface of the support platform (1). The connecting piece (16) is located between the telescopic cylinder (15) and the double-headed cylinder (17), and the double-headed cylinder (17) is transversely connected to the bottom of the connecting piece (16).

6. The high-precision chip test fixture with controllable clamping force according to claim 1, characterized in that: The telescopic end of the double-headed cylinder (17) is connected with a clamping jaw (18), and there are two groups of clamping jaws (18). A pressure sensor (19) is installed inside the clamping jaw (18).

7. The high-precision chip testing fixture with controllable clamping force according to claim 1, characterized in that: There are two groups of stroke cylinders (12), and the telescopic end of one group of stroke cylinders (12) is connected to the test cover (13), and the loading box (20) is fixedly welded to one side of the support platform (1).

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