Sample table for X-ray diffractometer

Abstract

A sample table for an X-ray diffractometer comprises a base, a groove and a plurality of adjusting pieces, the groove is formed in the top of the base, and the depth of the groove is known; the adjusting pieces are detachably connected to the bottoms of the grooves, the thicknesses of the adjusting pieces are known, the adjusting pieces are of various types, and the thicknesses of the adjusting pieces of different types are different and known; during use, the base is placed at a specified position, and the total thickness of the adjusting pieces is adjusted by placing different numbers and types of adjusting pieces in the groove, so that powdery samples with different thicknesses can be tested; as the sample table is only composed of two parts, the sample table is simple in structure and low in manufacturing cost; the thickness of the adjusting piece is known, so that the accommodating depth of the groove can be accurately adjusted and powder samples with different thicknesses can be tested only by changing the number and the type of the adjusting piece, the adjusting piece only needs to be taken and placed back and forth during operation, and the operation is simple and convenient; in general, the sample table for the X-ray diffractometer has the advantages of being simple in structure, convenient to operate, low in price and convenient to use.

Description

Technical Field

[0001] The utility model relates to the technical field of experimental instruments, in particular to a sample table for an X-ray diffractometer. Background Art

[0002] X-ray diffractometer is the most effective and widely used method to study the microstructure of materials. It uses the principle of diffraction to perform phase analysis and qualitative analysis on materials. Bruker's D8-Advance series diffractometer uses three contact points on the goniometer sample holder to contact the sample stage reference plane to determine the sample test surface. The sample stage does not rotate during the test.

[0003] At present, in the process of developing innovative drugs, new food processing processes and technologies, and micro-nano functional materials, due to the constraints of experimental conditions and synthesis methods, the yield of many synthetic products is very low, and the final sample volume is only tens of milligrams or even less. The X-ray diffraction test using the sample table provided by the manufacturer is not ideal, and sometimes even the test cannot be performed due to insufficient sample volume, which seriously limits the research and development of new drugs, new processes and new materials.

[0004] The area of ​​the existing X-ray diffractometer used to hold the substance to be tested is a fixed trough structure. After the powdered sample is laid flat, it is usually necessary to scrape the sample flat so that the sample fills the bottom of the trough. The sample amount required by the sample table provided by the manufacturer in the experiment is generally around 200 mg, and it is not possible to test small and trace samples. The existing X-ray diffractometers that can perform micro-area, trace, in-situ and non-destructive identification are complex in structure, expensive, and inconvenient to use. Utility Model Content

[0005] 1. Technical issues to be resolved

[0006] In order to solve the above problems, the utility model provides a sample stage for an X-ray diffractometer, which has a simple structure, is easy to operate, low in price and convenient to use.

[0007] (II) Technical solution

[0008] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0009] A sample stage for an X-ray diffractometer, comprising a base and further comprising:

[0010] A groove, which is arranged at the top of the base and has a known depth, and is used to accommodate a powdered sample. The thickness of the powdered sample that can be accommodated in the groove is the accommodating depth;

[0011] A plurality of adjusting pieces are provided, wherein the adjusting pieces are detachably connected to the bottom of the groove and have a known thickness. The thickness of the adjusting pieces is less than the depth of the groove. The shape of the cross section of the adjusting piece corresponds to the shape of the cross section of the groove. The size of the cross section of the adjusting piece corresponds to the size of the cross section of the groove. The adjusting pieces are used to adjust the accommodation depth of the groove. The adjusting pieces are of various types. The thickness of different types of adjusting pieces is different and known. By changing the number and type of the adjusting pieces in the groove, the accommodation depth of the groove can be changed to test powder samples of different thicknesses.

[0012] Preferably, the base and the adjusting member are both made of organic glass.

[0013] Preferably, the groove and the adjusting member are both cylindrical in shape.

[0014] Preferably, the base is cylindrical, the diameter of the base is 50 mm, and the diameter of the groove is 30 mm.

[0015] Preferably, the thickness of the base is 8.5 mm, and the depth of the groove is 2 mm.

[0016] Preferably, the adjusting members are of three types, and the thicknesses of the three types of adjusting members are 0.5 mm, 1 mm, and 2 mm, respectively.

[0017] (III) Beneficial effects

[0018] Compared with the prior art, the beneficial effects of the utility model are:

[0019] In actual use, the base is placed in a designated position, and the accommodating depth of the groove is determined according to the thickness of the powder sample to be tested. The depth of the groove minus the accommodating depth is the total thickness of the adjusting member. According to the total thickness of the adjusting member, the corresponding number and type of adjusting members are selected and placed in the groove, and the powder sample of the corresponding thickness can be tested. Since the sample stage for the X-ray diffractometer in the present application is composed of only two components as a whole, it has a simple structure, is easy to manufacture, and has low cost. When it is necessary to test powder samples of different thicknesses, since the thickness of the adjusting member is known, it is only necessary to change the number and type of the adjusting member to accurately adjust the accommodating depth of the groove. During specific operation, it is only necessary to take and put the adjusting member back and forth in the groove, which is simple and convenient to operate. In general, the sample stage for the X-ray diffractometer in the present application has the advantages of simple structure, easy operation, low price, and easy use. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0021] Figure 1 A stereogram of a sample stage for an X-ray diffractometer of the utility model is shown;

[0022] Figure 2 Shows Figure 1 A cross-sectional view of a vertical plane of a sample stage for an X-ray diffractometer;

[0023] Figure 3 Shows Figure 1 Schematic diagram of the exploded structure of the sample stage used for the X-ray diffractometer;

[0024] Figure 4 Shows Figure 1 Three-dimensional diagram of the three types of middle adjustment parts.

[0025] In the figure: 1. base; 2. groove; 3. adjusting piece. DETAILED DESCRIPTION

[0026] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0027] See attached Figure 1 -Attached Figure 3 The embodiment of the utility model discloses a sample stage for an X-ray diffractometer, comprising a base 1, a groove 2, and a plurality of adjusting members 3. The groove 2 is arranged at the top of the base 1 and has a known depth, and is used to accommodate powdered samples. The thickness of the powdered sample that can be accommodated in the groove 2 is the accommodation depth; the adjusting member 3 is detachably connected to the bottom of the groove 2 and has a known thickness. The thickness of the adjusting member 3 is less than the depth of the groove 2. The shape of the cross section of the adjusting member 3 corresponds to the shape of the cross section of the groove 2. The size of the cross section of the adjusting member 3 corresponds to the size of the cross section of the groove 2. The adjusting member 3 is used to adjust the accommodation depth of the groove 2. The adjusting member 3 has multiple types, and the thickness of different types of adjusting members 3 is different and known. By changing the number and type of the adjusting members 3 in the groove 2, the accommodation depth of the groove 2 can be changed to test powdered samples of different thicknesses.

[0028] In actual use, the base 1 is placed at a designated position, and the accommodating depth of the groove 2 is determined according to the thickness of the powder sample to be tested. The depth of the groove 2 minus the accommodating depth is the total thickness of the adjusting member 3. According to the total thickness of the adjusting member 3, the adjusting members 3 of corresponding quantity and type are selected and placed in the groove 2, and the powder sample of corresponding thickness can be tested. Since the sample stage for the X-ray diffractometer in the present application is composed of only two components as a whole, it has a simple structure, is easy to manufacture, and has low cost. When it is necessary to test powder samples of different thicknesses, since the thickness of the adjusting member 3 is known, it is only necessary to change the quantity and type of the adjusting member 3 to accurately adjust the accommodating depth of the groove. During specific operation, it is only necessary to take and place the adjusting member 3 back and forth in the groove 2, which is simple and convenient to operate. In general, the sample stage for the X-ray diffractometer in the present application has the advantages of simple structure, convenient operation, low price, and easy use.

[0029] It should be noted that the number of the adjusting members 3 in the above-mentioned groove 2 can be zero. In this case, the depth of the groove 2 is the accommodation depth, and the thickness of the powder sample that can be tested is the maximum value.

[0030] Furthermore, the adjusting member 3 in the present application is directly placed in the groove 2, and the position of the adjusting member 3 is limited by the blocking of the groove 2 on the side, the blocking of the base 1 below, and the effect of its own gravity, so that the relative position of the groove 2 and the adjusting member 3 is fixed, thereby completing the detachable connection between the two.

[0031] In order to make the test results of the X-ray diffraction test more accurate, the following design is carried out in this embodiment. Specifically, the base 1 and the adjusting member 3 are both made of organic glass.

[0032] By using organic glass to manufacture the base 1 and the adjusting member 3, interference peaks can be avoided, thereby avoiding the impact on the test results of the samples, and the test results are more accurate.

[0033] In order to more clearly introduce the sample stage for the X-ray diffractometer in the present application, the shapes of the groove 2 and the adjusting member 3 are designed as follows in this embodiment. Specifically, the shapes of the groove 2 and the adjusting member 3 are both cylindrical.

[0034] The design of the above structure is not only convenient for understanding the structure, but also convenient for taking and placing during actual use. The cylindrical structure also makes it difficult for workers to be cut by the edges and corners when taking and placing.

[0035] Furthermore, the corners on the groove 2 and the adjusting member 3 are provided with rounded corners, which not only provide a better protective effect but also facilitate the adjusting member 3 to quickly enter the groove 2 .

[0036] In order to more clearly introduce the sample stage used for the X-ray diffractometer in the present application, the shape of the base 1, the size of the cross section of the base 1 and the size of the cross section of the groove 2 are designed as follows in this embodiment. Specifically, the base 1 is cylindrical, the diameter of the base 1 is 50 mm, and the diameter of the groove 2 is 30 mm.

[0037] Through the design of the above structure, the sample stage used for the X-ray diffractometer in the present application can be of moderate size, which is convenient for carrying and use.

[0038] Furthermore, the corners of the base 1 are provided with rounded corners, which can further enhance the protective effect.

[0039] Furthermore, the groove 2 may be arranged at the center of the top of the base 1 , that is, the groove 2 and the base 1 are arranged coaxially, which can make the overall weight distribution of the sample stage for the X-ray diffractometer more uniform.

[0040] In order to adapt to the maximum test thickness of the powder sample, the following design is carried out in this embodiment. Specifically, the thickness of the base 1 is 8.5 mm, and the depth of the groove 2 is 2 mm.

[0041] Through the design of the above structure, powder samples with a thickness of 2 mm can be tested; in addition, since the size of the base 1 with a thickness of 8.5 mm is obviously larger than the size of the groove 2 with a depth of 2 mm, the overall structure of the sample stage for the X-ray diffractometer is more solid and not easy to be damaged.

[0042] See attached Figure 4 In order to be able to test powder samples of various thicknesses, the following design is carried out in this embodiment. Specifically, the adjusting member 3 has three types, and the thicknesses of the three types of adjusting members 3 are 0.5 mm, 1 mm, and 2 mm, respectively.

[0043] Through the design of the above structure, powder samples of various thicknesses can be tested. For example, if the adjusting piece 3 is not placed in the groove 2, the accommodating depth is 2mm, and a large amount of powder samples with a thickness of basically 2mm can be tested; if an adjusting piece 3 with a thickness of 0.5mm is placed in the groove 2, the accommodating depth is 1.5mm, and an appropriate amount of powder samples with a thickness of basically 1.5mm can be tested; if an adjusting piece 3 with a thickness of 1mm is placed in the groove 2, the accommodating depth is 1mm, and a small amount of powder samples with a thickness of basically 1mm can be tested; if an adjusting piece 3 with a thickness of 2mm is placed in the groove 2, the accommodating depth is 0, and a trace amount of powder samples with a thickness of basically 0 can be tested.

[0044] It should be noted that as long as the total thickness of the adjusting parts 3 meets the requirements, the number and type of the adjusting parts 3 can be adjusted at will. For example, as long as the total thickness of the adjusting parts 3 needs to reach 1.5 mm, three adjusting parts 3 with a thickness of 0.5 mm can be selected, or one adjusting part 3 with a thickness of 0.5 mm and one adjusting part 3 with a thickness of 1 mm can be selected.

[0045] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0046] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of this application.

[0047] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A sample stage for an X-ray diffractometer, comprising a base, characterized in that: Also includes: A groove, which is arranged at the top of the base and has a known depth, and is used to accommodate a powdered sample. The thickness of the powdered sample that can be accommodated in the groove is the accommodating depth; A plurality of adjusting pieces are provided, wherein the adjusting pieces are detachably connected to the bottom of the groove and have a known thickness. The thickness of the adjusting pieces is less than the depth of the groove. The shape of the cross section of the adjusting pieces corresponds to the shape of the cross section of the groove. The size of the cross section of the adjusting pieces corresponds to the size of the cross section of the groove. The adjusting pieces are used to adjust the accommodation depth of the groove. The adjusting pieces are of various types. The thickness of different types of adjusting pieces is different and known. By changing the number and type of the adjusting pieces in the groove, the accommodation depth of the groove can be changed to test powder samples of different thicknesses.

2. A sample stage for an X-ray diffractometer according to claim 1, characterized in that: The base and the adjusting member are both made of organic glass.

3. The sample stage for an X-ray diffractometer according to claim 1, characterized in that: The groove and the adjusting member are both cylindrical in shape.

4. The sample stage for an X-ray diffractometer according to claim 3, characterized in that: The base is cylindrical, the diameter of the base is 50 mm, and the diameter of the groove is 30 mm.

5. The sample stage for an X-ray diffractometer according to claim 4, characterized in that: The thickness of the base is 8.5 mm, and the depth of the groove is 2 mm.

6. The sample stage for an X-ray diffractometer according to claim 5, characterized in that: There are three types of the adjusting members, and the thicknesses of the three types of the adjusting members are 0.5 mm, 1 mm, and 2 mm respectively.

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