Clamp structure of probe type electrical testing machine

Abstract

The utility model discloses a clamp structure of a probe-type electrical testing machine, which is characterized in that a design of contact connection between an induction piece and a pin binding area is adopted in a binding position, the induction piece and a pin are in face-to-face contact, and compared with point-to-face contact between a probe and the pin, the face-to-face contact can prevent the pin from being damaged, so that the service life of the probe-type electrical testing machine is prolonged, and the service life of the probe-type electrical testing machine is prolonged. In addition, the ITO material is hard, a glass substrate is arranged at the bottom of the ITO material, a point-to-face contact mode with the probe can still be adopted, the VA area probe is used for releasing current during electrical testing, the induction piece collects corresponding signals and feeds back the signals to the electrical testing machine host through the signal transmission line, and the electrical testing machine host judges open and short circuits of a channel according to the strength of the received signals. By increasing the contact area, the pressure of the contact position is reduced, and defects can be conveniently detected in time in the production process, so that the yield is improved, and the cost loss is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of probe detection, in particular to a probe type electric test machine fixture structure. Background Art

[0002] An electrical tester is a device used to test electrical properties of materials such as resistivity and dielectric constant. Its principle is based on the four-probe method, which measures the current and its distribution by applying a certain voltage, thereby inferring the electrical properties of the material.

[0003] From the product structure point of view, the electric test machine is mainly composed of probes, measurement circuits, control units and computers. The probe contacts the surface of the material, measures the current distribution, and transmits the signal to the control unit for processing through the measurement circuit. The control unit is responsible for applying voltage, controlling the measurement process and data processing, and finally transmitting the results to the computer for display and analysis.

[0004] For example, the Chinese utility model patent (CN202121972353.X) discloses an automatic electrical testing machine. The utility model discloses that the utility model relates to the field of automated manufacturing technology, specifically to an automatic electrical testing machine, including a machine platform, on which an electrical testing mechanism, a feeding mechanism, an alignment mechanism, a defective product collection mechanism, a pressing mechanism and two material taking and placing mechanisms are arranged. The two material taking and placing mechanisms are arranged at both ends of the machine platform, respectively. The electrical testing mechanism is arranged in the middle of the machine platform, the alignment mechanism is arranged between the material taking and placing mechanism and the electrical testing mechanism at the front end, the defective product collection mechanism is arranged between the material taking and placing mechanism and the electrical testing mechanism at the rear end, the feeding mechanism is arranged beside the alignment mechanism and the electrical testing mechanism, and the pressing mechanism is arranged correspondingly to the electrical testing mechanism. During the detection process, the product can be pressed to prevent the position of the product from changing, which can avoid the product from moving during the electrical detection process and causing the detection to be out of place, which is beneficial to improving the detection accuracy, and the product trays can be automatically collected, sorted and stored, reducing manual operations, which is beneficial to reducing production costs.

[0005] At present, the probe type electrical tester is mostly used for electrical testing of semi-finished products and finished products in the front process, so as to facilitate the timely detection of defects in the production process, thereby improving the yield rate and reducing cost losses. Because it uses a probe for testing, it has extremely high requirements for the flatness of the test head needle and the test table of the electrical tester. Otherwise, in order to make all test products contact with the test head during debugging, the downward pressure will be increased, which is very easy to cause puncture damage to the test product. On the contrary, because some needles do not contact the product, it will lead to the misjudgment of OK products. Because the wiring area (pin foot) of TP products is molybdenum aluminum molybdenum, its texture is relatively soft. When the needle is pressed down with a large amount, it will leave a puncture mark on the molybdenum aluminum molybdenum surface, or more seriously, it will cause the ink of the binding position of the OGS product to be transparent. Utility Model Content

[0006] In order to solve the deficiencies of the above-mentioned prior art, the utility model provides a probe type electrical testing machine fixture structure, which adopts a contact connection design between the sensing part and the pin binding area at the binding position. The sensing part and the pin are in face-to-face contact. Compared with the point-to-point contact between the probe and the pin, the face-to-face contact can avoid damage to the pin. In addition, the ITO material is relatively hard and has a glass substrate at the bottom, so the point-to-point contact with the probe can still be adopted. When the VA area probe is used to release the current during electrical testing, the sensing part collects the corresponding signal and feeds it back to the main body of the electrical testing machine through the signal transmission line. The main body of the electrical testing machine determines the open or short circuit of the channel by the strength of the received signal, and distinguishes OK and NG. By increasing the contact area, the pressure at the contact position is reduced, which is convenient for timely detection of defects in the production process, thereby improving the yield and reducing cost losses.

[0007] The technical problem to be solved by the utility model is achieved through the following technical solutions: A probe-type electric test machine fixture structure, comprising: a probe for current release;

[0008] An induction component, wherein the induction component is an integrated PCB capable of receiving the current pulse of the probe;

[0009] A test panel, wherein the sensing element is embedded in the surface of the test panel;

[0010] A sensing electrode, wherein the sensing electrode is embedded in the lower surface of the test panel and is electrically connected to the sensing element;

[0011] A signal transmission line, which is pluggable and connects the sensing electrode and the electrical measuring machine host;

[0012] The product to be tested comprises a VA visual area and a pin binding area, wherein the pin binding area is arranged on the side of the VA visual area.

[0013] As a preferred implementation of the probe-type electric tester fixture structure provided by the utility model, the probe contacts the ITO film layer in the VA visible area, and the sensing element contacts and connects with the pin binding area to collect corresponding signals.

[0014] As a preferred embodiment of the probe-type electric test machine fixture structure provided by the utility model, the probe includes a needle, a sliding sleeve and a buffer spring, the needle is slidably arranged in the sliding sleeve, and a buffer spring for buffer support is provided in the middle of the top end of the sliding sleeve.

[0015] As a preferred implementation of the probe-type electric tester fixture structure provided by the utility model, the end of the needle is a flat end.

[0016] As a preferred implementation of the probe-type electric test machine fixture structure provided by the utility model, the elastic force of the buffer spring is -g.

[0017] As a preferred embodiment of the probe-type electric tester fixture structure provided by the utility model, it also includes a chassis and a support column, wherein the support column is arranged on the chassis to connect and support the test panel and the chassis.

[0018] As a preferred implementation of the probe-type electric tester fixture structure provided by the utility model, the test panel is arranged on the surface of the support column.

[0019] As a preferred embodiment of the probe-type electric measuring machine fixture structure provided by the utility model, a signal collecting block is provided at one end of the sensing element, and the lower end of the signal collecting block is electrically connected to the sensing electrode.

[0020] As a preferred implementation of the probe-type electric tester fixture structure provided by the utility model, screw holes are provided at both ends of the sensing element, and the sensing element is fixed to the test panel by screws.

[0021] As a preferred implementation of the probe-type electric test machine fixture structure provided by the utility model, a plug-in connector is provided at the end of the signal transmission line to be connected to the electric test machine host.

[0022] The utility model has the following beneficial effects: a probe-type electric test machine fixture structure, comprising: a probe for current release; an induction component, the induction component is an integrated PCB that can receive the current pulse of the probe; a test panel, the induction component is embedded in the surface of the test panel; an induction electrode, the induction electrode is embedded in the lower surface of the test panel and the induction electrode is electrically connected to the induction component; a signal transmission line, the signal transmission line can plug and unplug the induction electrode and the electric test machine host; a product to be tested, comprising a VA visual area and a pin binding area, the pin binding area is arranged on the side of the VA visual area, the application adopts a contact connection design between the induction component and the pin binding area at the binding position, when the VA area probe is used to release the current during electrical testing, the induction component collects the corresponding signal and feeds it back to the electric test machine host through the signal transmission line, the electric test machine host determines the open or short circuit of the channel by the strength of the received signal, and makes OK and NG judgments, and reduces the pressure at the contact position by increasing the contact area. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the scheme in the present application, a brief introduction is given below to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0024] Figure 1 A schematic diagram of a product to be tested of the fixture structure of a probe-type electric tester provided by the utility model;

[0025] Figure 2 A schematic diagram of the probe structure of the probe type electric test machine fixture structure provided by the utility model;

[0026] Figure 3 A schematic diagram of the chassis and support columns of the probe-type electric test machine fixture structure provided by the utility model;

[0027] Figure 4 A top view of a test panel of the probe-type electric test machine fixture structure provided by the utility model.

[0028] 1. Probe; 11. Needle; 12. Sliding sleeve; 13. Buffer spring; 2. Sensing part; 21. Signal collecting block; 3. Test panel; 4. Chassis; 5. Support column; 6. Sensing electrode; 7. Transmission line; 8. Electrical test machine host; 9. Product to be tested; 91. Pin binding area; 92. VA visual area. DETAILED DESCRIPTION

[0029] The present invention is described in detail below in conjunction with the accompanying drawings and embodiments, examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0030] In the description of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0031] In addition, the terms "first", "second", and "third" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first", "second", and "third" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0032] In the present invention, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix", "set" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0033] Embodiment 1

[0034] like Figure 1 and Figure 3 As shown, a probe type electric test machine fixture structure is characterized by comprising: a probe 1 for current release;

[0035] The induction component 2 is an integrated PCB capable of receiving the current pulse of the probe 1;

[0036] A test panel 3, wherein the sensing element 2 is embedded in the surface of the test panel 3;

[0037] A sensing electrode 6, wherein the sensing electrode 6 is embedded in the lower surface of the test panel 3 and the sensing electrode 6 is electrically connected to the sensing element 2;

[0038] A signal transmission line 7, wherein the signal transmission line 7 is pluggable to connect the sensing electrode 6 and the electrical measuring machine host 8;

[0039] The product to be tested 9 includes a VA visible area 92 and a pin binding area 91, wherein the pin binding area 91 is arranged on the side of the VA visible area 92, wherein the probe 1 contacts the ITO film layer of the VA visible area 92, and the sensing element 2 contacts and connects with the pin binding area 91 to collect corresponding signals.

[0040] In the present application, the product to be tested 9 is installed on the test panel 3, and the sensing element 2 is contacted and connected with the pin binding area 91 of the product to be tested 9. The sensing element 2 and the pin binding area 91 are in face-to-face contact. Compared with the point-to-face contact between the probe 1 and the pin binding area 91, the face-to-face contact can avoid damage to the pin. In addition, the material of ITO is relatively hard and there is a glass substrate at the bottom, so the point-to-face contact with the probe can still be adopted. When the electrical test is performed, the main body 8 of the electrical test machine outputs a signal to the probe 1, and the probe 1 is used to release the current in the VA visible area 92. The sensing element 2 collects the corresponding signal and feeds it back to the main body 8 of the electrical test machine through the signal transmission line 7. The main body 8 of the electrical test machine determines the open or short circuit of the channel by the strength of the received signal, and distinguishes OK and NG. By increasing the contact area, the pressure at the contact position is reduced, which facilitates the timely detection of defects in the production process, thereby improving the yield and reducing cost losses.

[0041] The electrical measuring machine host 8 is mainly composed of a measuring circuit, a control unit and a computer. The specific structure and operation of the electrical measuring machine host 8 are prior arts in the art and will not be elaborated in detail here.

[0042] The pin binding area 91 includes a metal pin, preferably molybdenum aluminum molybdenum. The metal material is relatively soft. If a probe is used to contact and collect the current of the metal pin, the metal pin is prone to punctures and scratches under the pressure of the probe. Therefore, an integrated PCB is required as an induction component to make face-to-face contact with the metal pin to collect current.

[0043] The VA visible area 92 includes an ITO electrode. The material of ITO is relatively hard, and the current can still be released by point-to-point contact with the probe.

[0044] Specifically, the product to be tested 9 may be, but is not limited to, a display screen or a touch screen.

[0045] In another preferred embodiment of this embodiment, Figure 2 As shown, the probe comprises a needle 11, a sliding sleeve 12 and a buffer spring 13. The needle 11 is slidably arranged in the sliding sleeve 12, and a buffer spring 13 for buffering support is arranged in the middle of the top end of the sliding sleeve 12. The end of the needle 11 is a flat end and the elastic force of the buffer spring 13 is 5-8g.

[0046] Through the above structural design, the buffer spring 13 inside the probe 1 is selected to have a small elastic force, such as 5-8g. An elastic force above 8g may cause a risk of crushing the glass of the OGS product. At the same time, the needle tip at the end of the probe 1 is designed to be a flat end. By changing the end design of the probe 1 to a flat end, when the same pressure acts on the probe 1, the contact area is increased, thereby reducing the pressure at the contact position.

[0047] Embodiment 2

[0048] like Figure 3 As shown, the probe type electric tester fixture structure provided in the present application further includes a chassis 4 and a support column 5, wherein the support column 5 is arranged on the chassis 4 for connecting and supporting the test panel 3 and the chassis 4. The test panel 3 is arranged on the surface of the support column 5.

[0049] In this embodiment, the end of the signal transmission line 7 is provided with a plug-in connector to connect with the electrical measuring machine host 8. The plug-in connector design is convenient for replacement and maintenance.

[0050] Through the above structural design, the chassis 4 is fixed on the electrical testing machine host 8, and the test panel 3 is arranged on the surface of the support column 5. When performing electrical testing, the electrical testing machine host 8 outputs a signal to the probe 1, and the probe 1 is used to release the current in the VA visual area 92. The induction component 2 collects the corresponding signal and feeds it back to the electrical testing machine host 8 through the signal transmission line 7. The electrical testing machine host 8 determines the open or short circuit of the channel by the strength of the received signal, and distinguishes OK and NG, thereby increasing the contact area and reducing the pressure at the contact position.

[0051] Embodiment 3

[0052] In this embodiment, a signal collecting block 21 is provided at one end of the sensing element 2 , and a lower end of the signal collecting block 21 is electrically connected to the sensing electrode 6 .

[0053] Through the above structural design, the signal collecting block 21 collects the pulse signals received by the induction element 2 and transmits them to the outside through the signal transmission line 7 .

[0054] Furthermore, the sensing electrode 6 and the signal transmission line 7 are pluggable, which facilitates the maintenance and replacement of the fixture and improves the flexibility and convenience of use.

[0055] like Figure 4 As shown, screw holes are provided at both ends of the sensing element 2, and the sensing element 2 is fixed to the test panel 3 by screws.

[0056] Through the above structural design, the sensing element 2 is fixed to the test panel 3 by screws, so that the installation of the sensing element 2 is more firm and stable, and the accuracy and precision of the measurement are improved.

[0057] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the embodiments of the utility model rather than to limit them. Although the embodiments of the utility model are described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the embodiments of the utility model can still be modified or replaced by equivalents, and these modifications or equivalent replacements cannot cause the modified technical solutions to deviate from the scope of the technical solutions of the embodiments of the utility model.

Claims

1. A probe-type electrical tester fixture structure, used for testing a product to be tested, wherein the product to be tested comprises a VA visual area (92) and a pin binding area (91), wherein the pin binding area (91) is arranged on the side of the VA visual area (92); characterized in that: The probe type electric test machine fixture structure comprises: An electric measuring machine host (8); and A probe (1), the probe (1) being electrically connected to the electrical measuring machine host (8) and being used for contacting the VA visual area (92) to release current; A sensing element (2), the sensing element (2) being an integrated PCB, and being used for contacting the pin binding area (91) to receive the current pulse of the probe (1); A test panel (3), wherein the sensing element (2) is embedded in the upper surface of the test panel (3); A sensing electrode (6), the sensing electrode (6) being embedded in the lower surface of the test panel (3) and the sensing electrode (6) being electrically connected to the sensing element (2); A signal transmission line (7), wherein the signal transmission line (7) is pluggable and connected to the sensing electrode (6) and the electrical measuring machine host (8).

2. The probe type electric test machine fixture structure as claimed in claim 1, characterized in that: The probe (1) contacts the ITO film layer of the VA visual area (92), and the sensing element (2) contacts and connects with the pin binding area (91) to collect corresponding signals.

3. The probe type electric test machine fixture structure as claimed in claim 1, characterized in that: The probe comprises a needle (11), a sliding sleeve (12) and a buffer spring (13); the needle (11) is slidably arranged in the sliding sleeve (12); and a buffer spring (13) for buffering support is provided at the middle of the top end of the sliding sleeve (12).

4. The probe type electric test machine fixture structure as claimed in claim 3, characterized in that: The needle (11) has a flat end.

5. The probe type electric test machine fixture structure as claimed in claim 3, characterized in that: The elastic force of the buffer spring (13) is 5-8g.

6. The probe type electric test machine fixture structure as claimed in claim 1, characterized in that: It also comprises a chassis (4) and a support column (5), wherein the support column (5) is arranged on the chassis (4) and is used to connect and support the test panel (3) and the chassis (4).

7. The probe type electric test machine fixture structure as claimed in claim 6, characterized in that: The test panel (3) is arranged on the surface of the support column (5).

8. The probe type electric test machine fixture structure as claimed in claim 1, characterized in that: A signal collecting block (21) is provided at one end of the induction element (2), and the lower end of the signal collecting block (21) is electrically connected to the induction electrode (6).

9. The probe type electric test machine fixture structure as claimed in claim 1, characterized in that: Screw holes are provided at both ends of the sensing component (2), and the sensing component (2) is fixed to the test panel (3) by means of screws.

10. The probe type electric test machine fixture structure as claimed in claim 1, characterized in that: The end of the signal transmission line (7) is provided with a plug-in connector for connection with the electrical measuring machine host (8).

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