Backlight LED aging test board for mobile phone display screen

Abstract

The utility model discloses an aging test board of a backlight LED for a mobile phone display screen, which comprises a board body, the edge of the board body is provided with an anode access terminal and a cathode access terminal, the board body is provided with a first control unit and a second control unit, the first control unit is connected in series through a common line, and the second control unit is connected in series through a common line. The first control unit comprises a control switch Ti, the second control unit comprises a control switch Ki, the positive electrode access terminal is electrically connected with the negative electrode access terminal through the control switch Ti, a resistor R (i + 10) and a light emitting diode bonding pad D (i + 10), and the positive electrode access terminal is electrically connected with the negative electrode access terminal through the resistor R (i + 10) and the light emitting diode bonding pad D (i + 10). The positive electrode access terminal is electrically connected with the negative electrode access terminal through the control switch Ki, the resistor R (11-i) and the light emitting diode bonding pad D (11-i), and i is equal to 1, 2, 3,..., 10. A user can control each backlight LED to work or not in time, the test requirements of different experiment items are met, the manufacturing of an aging test board is reduced, the material loss is reduced, and the operation is convenient.

Description

Technical Field

[0001] The utility model relates to an LED testing tool, more specifically, to an aging testing board for backlight LEDs used for mobile phone display screens. Background Art

[0002] With the development of the industry and the improvement of different needs of consumers, the reliability test items of mobile phone displays are increasing, with different experimental conditions and test durations. One of the tests is to verify the changes in color (chromaticity), heat generation, etc. of the mobile phone display at different time periods, which requires testing the LED backlight of the display at different time periods.

[0003] For example, test item 1 requires lighting for 5 minutes, turning off for 5 minutes...cycle test; test item 2 requires lighting for 3 minutes, turning off for 10 minutes...cycle test, etc. At present, the conventional practice is to make multiple aging test boards according to the test item requirements, control the switching of all LEDs on the entire board through the power LED+ / LED- on the test board, and perform a test on each test board. If there are more test items, more test boards need to be made, and more material consumption will be required.

[0004] Chinese utility model patent document CN209590183U discloses a backlight LED circuit open circuit detection circuit, characterized in that it includes: a voltage detection unit, the voltage detection unit includes a plurality of voltage detection modules and a plurality of voltage detection ports; one end of each of the voltage detection modules is correspondingly provided with a voltage detection port and is used to be connected to the negative terminal of an LED connection circuit of the backlight LED circuit, and the other end is respectively used to be connected to the negative terminal of a DC power supply, and is used to respectively detect the voltage value of the negative terminal of each LED connection circuit; and a power control unit, the power control unit includes a switch module and a control module, the first end of the switch module is used to be connected to the positive terminal of the DC power supply, and the second end of the switch module is used to be connected to the positive terminal of each LED connection circuit of the backlight LED circuit; the control module is respectively connected to each of the voltage detection ports, and is used to disconnect the positive terminal of the DC power supply from the positive terminal of each LED connection circuit when a preset voltage value exists at one of the voltage detection ports.

[0005] Obviously, this patent is used to test whether the side-emitting LED connection circuit of the backlight module is open, and cannot solve the material consumption problem of the existing backlight LED test. Utility Model Content

[0006] Based on this, it is necessary to provide an aging test board for backlight LEDs for mobile phone display screens in response to the above technical problems, comprising a board body, the edge of which is provided with a positive access terminal and a negative access terminal, a first control unit and a second control unit are provided on the board body, the first control unit is connected in series through a common line, and the first control unit comprises a control switch T i The second control unit includes a control switch K i The positive electrode is connected to the terminal through the control switch T i , resistor R （i+10） and LED pad D (i+10)， The positive electrode access terminal is electrically connected to the negative electrode access terminal through the control switch K i , resistor R (11-i） and LED pad D (11-i)， And form an electrical connection with the negative access terminal, wherein i=1, 2, 3, ..., 10. The light-emitting diode soldering pad is used to facilitate the user to directly solder the backlight LED to be tested. Since each backlight LED is connected in series with a current-limiting resistor, a 100Ω resistor is provided in each LED power supply circuit to prevent the backlight LED from being burned by improper power supply settings. By using the toggle control switches on the independently set first control unit and the second control unit, the user can control the operation of each backlight LED in a timely manner to meet the test requirements of different experimental projects, reduce the production of aging test boards, reduce material loss, facilitate operation, greatly reduce the consumption of test materials, and reduce production costs.

[0007] In order to solve the above technical problems, the utility model adopts the following technical solutions:

[0008] A backlight LED aging test board for a mobile phone display, characterized in that the backlight LED aging test board for the mobile phone display comprises a board body, a positive electrode access terminal and a negative electrode access terminal are arranged at the edge of the board body, a first control unit and a second control unit are arranged on the board body, the first control unit is connected in series through a common line, and the first control unit comprises a control switch T i The second control unit includes a control switch K i The positive electrode is connected to the terminal through the control switch T i , resistor R （i+10） and LED pad D (i+10)， The positive electrode access terminal is electrically connected to the negative electrode access terminal through the control switch K i , resistor R (11-i） and LED pad D (11-i)，And it forms an electrical connection with the negative electrode access terminal, wherein i=1, 2, 3, ..., 10.

[0009] As a preferred embodiment of the aging test board for backlight LED of the mobile phone display provided by the utility model, the resistor R （i+10） , i=1,2,3,…,10, the resistance value is 100 ohms.

[0010] As a preferred embodiment of the aging test board for backlight LED of the mobile phone display provided by the utility model, the resistor R (11-i) , i=1,2,3,…,10, the resistance value is 100 ohms.

[0011] As a preferred embodiment of the aging test board for backlight LED of the mobile phone display provided by the utility model, the light emitting diode pad D (i+10） and LED pad D (11-i) , i=1, 2, 3, …, 10, the size of which is adapted to the size of the backlight LED.

[0012] As a preferred embodiment of the aging test board for backlight LED of the mobile phone display provided by the utility model, the light emitting diode pad D (i+10） and LED pad D (11-i) , i=1,2,3,…,10, all are magnetic pads.

[0013] As a preferred embodiment of the aging test board for backlight LED of the mobile phone display provided by the utility model, the control switch T i And control switch K i , i=1,2,3,…,10, all are toggle control switches.

[0014] As a preferred implementation of the aging test board for backlight LEDs used in the mobile phone display screen provided by the utility model, a working indicator light is provided on the board body.

[0015] As a preferred implementation of the aging test board for backlight LEDs used in the mobile phone display screen provided by the utility model, a flippable cover is provided on the board body.

[0016] As a preferred implementation of the aging test board for backlight LEDs used in mobile phone display screens provided by the utility model, the cover plate is made of transparent resin.

[0017] As a preferred implementation of the aging test board for backlight LEDs used in the mobile phone display screen provided by the utility model, the surface of the board is white.

[0018] Compared with the prior art, the utility model has the following beneficial effects:

[0019] The utility model provides an aging test board for backlight LEDs used in mobile phone display screens, which utilizes light-emitting diode soldering pads to facilitate users to directly solder backlight LEDs to be tested. Since each backlight LED is connected in series with a current-limiting resistor, a 100Ω resistor is provided in each LED power supply circuit to prevent the backlight LEDs from being burned by improper power supply settings. By utilizing the toggle control switches on the independently configured first control unit and the second control unit, users can timely control the operation of each backlight LED to meet the testing requirements of different experimental projects, reduce the production of aging test boards, reduce material loss, facilitate operation, greatly reduce the consumption of test materials, and reduce production costs.

[0020] In addition, a working indicator light can be provided on the board body. With the working indicator light, the user can quickly know whether the aging test board is in operation, so as to prevent other workers from accidentally unplugging the power supply and affecting the test.

[0021] In addition, a reversible cover plate can be provided on the board. The cover plate is made of transparent resin. The surface of the board is white. The transparent cover plate can effectively prevent the aging test board from being disturbed by the external environment, thereby improving the reliability and accuracy of the test. Since the surface of the board is white, the user can easily observe the backlight LED. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the scheme in the utility model, a brief introduction is given below to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0023] FIG. 1 is a schematic structural diagram of an aging test board for backlight LEDs used in a mobile phone display screen according to the present invention. DETAILED DESCRIPTION

[0024] In order to enable those skilled in the art to better understand the solution of the utility model, the technical solution in the embodiment of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiment of the utility model. Obviously, the described embodiment is only a part of the embodiment of the utility model, not all of the embodiments. Based on the embodiment of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the utility model.

[0025] As described in the background technology, with the development of the industry and the improvement of different needs of consumers, the existing technology for mobile phone display screen testing has more and more reliability test items for mobile phone display screens, with different experimental conditions and experimental durations. One of the tests is to verify the changes in color (chromaticity), heat generation, etc. of the mobile phone display screen in different time periods, which requires testing the LED of the display screen backlight in different time periods. For example, test item one requires lighting for 5 minutes, turning off for 5 minutes...cycle test; test item two requires lighting for 3 minutes, turning off for 10 minutes...cycle test, etc. At present, the conventional practice is to make multiple aging test boards according to the requirements of the test items, control the switches of all LEDs on the entire board through the power LED+ / LED- on the test board, and perform a test on each test board. If there are more test items, more test boards need to be made, and the material consumption is relatively high.

[0026] In order to solve this technical problem, the utility model provides an aging test board for backlight LEDs for mobile phone display screens, comprising a board body S, the edge of which is provided with a positive electrode access terminal 3 and a negative electrode access terminal 4. The board body S is provided with a first control unit 1 and a second control unit 2, and the first control unit 1 is connected in series via a common line M. In addition, the first control unit 1 includes a control switch T i The second control unit 2 includes a control switch K i The positive electrode is connected to terminal 3 through the control switch T i , resistor R i+10 and LED pad D (i+10)， The positive electrode terminal 3 is electrically connected to the negative electrode terminal 4 through the control switch K. i , resistor R (11-i） and LED pad D (11-i)， And it forms an electrical connection with the negative electrode access terminal 4, wherein i=1, 2, 3, ..., 10.

[0027] Through the above structural design, the light-emitting diode pad is used to facilitate the user to directly solder the backlight LED to be tested. Since each backlight LED is connected in series with a current-limiting resistor, a 100Ω resistor is provided in each LED power supply circuit to prevent the backlight LED from being burned by improper power supply settings. By using the toggle control switches on the independently set first control unit 1 and the second control unit 2, the user can control the operation of each backlight LED in a timely manner to meet the test requirements of different experimental projects, reduce the production of aging test boards, reduce material loss, facilitate operation, greatly reduce the consumption of test materials, and reduce production costs.

[0028] In order to enable those skilled in the art to better understand the present invention, the technical solutions in the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present invention.

[0029] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features and technical solutions in the embodiments may be combined with each other.

[0030] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0031] Example 1

[0032] As shown in FIG1 , the aging test board for the backlight LED of the mobile phone display includes a board body S, and a positive electrode access terminal 3 and a negative electrode access terminal 4 are provided at the edge of the board body S. A first control unit 1 and a second control unit 2 are provided on the board body S, and the first control unit 1 is connected in series through a common line M.

[0033] In addition, the first control unit 1 includes a control switch T i The second control unit 2 includes a control switch K i The positive electrode is connected to terminal 3 through the control switch T i , resistor R i+10 and LED pad D (i+10)， The positive electrode terminal 3 is electrically connected to the negative electrode terminal 4 through the control switch K. i , resistor R (11-i） and LED pad D (11-i)， And it forms an electrical connection with the negative electrode access terminal 4, wherein i=1, 2, 3, ..., 10.

[0034] It should be noted that the resistor R i+10 , i=1,2,3,…,10,the resistance value is 100 ohms. (11-i) , i=1,2,3,…,10, the resistance value is 100 ohms.

[0035] The LED pad D (i+10） and LED pad D (11-i) , i=1, 2, 3, …, 10, the size of which is adapted to the size of the backlight LED.

[0036] In addition, the LED pad D (i+10） and LED pad D (11-i), i=1,2,3,…,10, all are magnetic pads.

[0037] In addition, the control switch T i And control switch K i , i=1,2,3,…,10, all are toggle control switches.

[0038] The working mode of this embodiment is described below.

[0039] The LED pads are used to facilitate users to directly solder the backlight LEDs to be tested. Since each backlight LED is connected in series with a current-limiting resistor, a 100Ω resistor is provided in each LED power supply circuit to prevent the backlight LEDs from being burned by improper power supply settings. Using the independently set toggle control switches on the first control unit 1 and the second control unit 2, users can control the operation of each backlight LED in a timely manner to meet the test requirements of different experimental projects, reduce the production of aging test boards, reduce material loss, and facilitate operation, greatly reduce the consumption of test materials, and reduce production costs.

[0040] Example 2

[0041] The aging test board for backlight LEDs for mobile phone display screens provided in Example 1 is further optimized. Specifically, a working indicator light 5 is provided on the board body S.

[0042] The working mode of this embodiment is described below.

[0043] By using the working indicator light 5, the user can quickly know whether the aging test board is in operation, so as to prevent other workers from accidentally unplugging the power supply and affecting the test.

[0044] Example 3

[0045] The aging test board for backlight LEDs for mobile phone display screens provided in Example 1 or 2 is further optimized. Specifically, a flippable cover plate (not shown) is provided on the board body S. The cover plate is made of transparent resin.

[0046] In addition, the surface of the plate body S is white.

[0047] The working mode of this embodiment is described below.

[0048] The transparent cover can effectively prevent the aging test board from being disturbed by the external environment, thereby improving the reliability and accuracy of the test. Since the surface of the board body S is white, the user can easily observe the backlight LED.

[0049] The terms "coupling" and "coupling" involved in the embodiments of the present application should be understood in a broad sense. For example, they may refer to a direct physical connection, or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors or other electronic devices.

[0050] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral one; it can be a mechanical connection, an electrical connection, or communication with each other; it can be a direct connection, or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0051] Obviously, the embodiments described above are only some embodiments of the present application, rather than all embodiments. The preferred embodiments of the present application are given in the accompanying drawings, but they do not limit the patent scope of the present application. The present application can be implemented in many different forms. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the present application more thorough and comprehensive. Although the present application is described in detail with reference to the aforementioned embodiments, for those skilled in the art, it is still possible to modify the technical solutions recorded in the aforementioned specific implementation methods, or to replace some of the technical features therein with equivalents. Any equivalent structure made using the contents of the specification and drawings of this application, directly or indirectly used in other related technical fields, is similarly within the scope of patent protection of this application.

Claims

1. An aging test board for backlight LEDs used in mobile phone displays, characterized in that: The aging test board for backlight LEDs for mobile phone display screens comprises a board body (S), the edge of the board body (S) is provided with a positive electrode access terminal (3) and a negative electrode access terminal (4), the board body (S) is provided with a first control unit (1) and a second control unit (2), the first control unit (1) is connected in series via a common line (M), and the first control unit (1) comprises a control switch T i The second control unit (2) comprises a control switch K i The positive electrode access terminal (3) is connected to the control switch T i , resistor R （i+10） and LED pad D (i+10)， The positive electrode access terminal (3) is electrically connected to the negative electrode access terminal (4). i , resistor R (11-i） and LED pad D (11-i)， And it forms an electrical connection with the negative electrode access terminal (4), wherein i=1, 2, 3, ..., 10.

2. The aging test board for backlight LEDs for mobile phone display screens according to claim 1, characterized in that: The resistor R （i+10） , i=1,2,3,…,10, the resistance value is 100 ohms.

3. The aging test board for backlight LEDs for mobile phone display screens according to claim 1, characterized in that: The resistor R (11-i) , i=1,2,3,…,10, the resistance value is 100 ohms.

4. The aging test board for backlight LEDs for mobile phone display screens according to claim 1, characterized in that: The light emitting diode pad D (i+10） and LED pad D (11-i) , i=1, 2, 3, …, 10, the size of which is adapted to the size of the backlight LED.

5. The aging test board for backlight LEDs for mobile phone display screens according to claim 1, characterized in that: The light emitting diode pad D (i+10） and LED pad D (11-i) , i=1,2,3,…,10, all are magnetic pads.

6. The aging test board for backlight LEDs for mobile phone display screens according to claim 1, characterized in that: The control switch T i And control switch K i , i=1,2,3,…,10, all are toggle control switches.

7. The aging test board for backlight LEDs for mobile phone display screens according to claim 1, characterized in that: The plate body (S) is provided with a working indicator light (5).

8. The aging test board for backlight LEDs for mobile phone display screens according to claim 1, characterized in that: The plate body (S) is provided with a flippable cover.

9. The aging test board for backlight LEDs for mobile phone display screens according to claim 8, characterized in that: The cover plate is made of transparent resin.

10. The aging test board for backlight LEDs for mobile phone display screens according to claim 1, characterized in that: The surface of the plate (S) is white.

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