Rotary transformer high and low rotating speed waveform test board

Abstract

The utility model discloses a rotary transformer high and low rotating speed waveform test board, and belongs to the technical field of test equipment and tool clamps. The device mainly comprises a base; the testing assembly is arranged on the base, and the first mounting frame is arranged on the base; the first screw rod is in threaded connection with a mounting seat, a first motor is arranged on one side of the first mounting frame, and the output end of the first motor is fixedly connected with one end of the first screw rod; the second screw rod is arranged in the mounting seat, a second motor is fixedly mounted at the top of the mounting seat, and the output end of the second motor is fixedly connected with the second screw rod; the accommodating cavity is mounted on the second screw rod; the second mounting frame is arranged on the side, away from the first mounting frame, of the base in a mirror image mode. According to the rotary transformer high and low rotating speed waveform test bench, the rotor and the stator can be adjusted in the X direction, the Y direction and the Z direction, and the effect of different eccentricity requirements is achieved.

Description

Technical Field

[0001] The present application relates to the technical field of testing equipment and fixtures, and specifically to a resolver high and low speed waveform test bench. Background Art

[0002] As customers' requirements for resolvers increase day by day, more and more customers need to understand the waveforms of resolvers at different speeds, especially at high speeds, and sometimes there are some requirements for extreme eccentricity waveform testing. At this time, it is necessary to design a simple test bench that can simultaneously realize the high and low speed waveforms of the resolver and the stator and rotor eccentricity waveforms, which can be used in different scenarios.

[0003] For example, the patent with publication number CN211856858U specifically discloses a rotary transformer test bench. The rotary transformer is installed by a test device. After installation, the test bench is rotated to the right so that the left end of the conduction rod is connected to the rotor of the rotary transformer through the connecting rod. The reduction motor can indirectly drive the conduction rod and the rotor of the rotary transformer to rotate, so as to perform testing, which is convenient to operate and efficient.

[0004] In the above patent, the test bench has a simple structure and is suitable for quick installation of the rotary transformer. However, when the device is used to test the stator and rotor of the motor, since the device is only provided with a separate slide rail, the stator and the rotor can only be rotated in the coaxial state. The eccentricity test of the rotary transformer cannot be performed in a variety of environments, which limits the flexibility of the device. Therefore, it is necessary to provide a high and low speed waveform test bench for the rotary transformer to solve the above problems.

[0005] It should be noted that the above information disclosed in this background technology section is only for understanding the background technology of the present application concept, and therefore, it may contain information that does not constitute the prior art. Summary of the invention

[0006] Based on the above problems existing in the prior art, the problem to be solved by the present application is: to provide a high and low speed waveform test bench for a rotary transformer, so that the rotor and the stator can be adjusted in three directions of X, Y, and Z, thereby achieving the effect of achieving different eccentricity requirements.

[0007] The technical solution adopted by the present application to solve its technical problems is: a rotary transformer high and low speed waveform test bench, including a base; a test assembly, the test assembly is arranged on the base, a first mounting frame, the first mounting frame is arranged on the base; a first screw rod, a mounting seat is threadedly connected to the first screw rod, a first motor is arranged on one side of the first mounting frame, and the output end of the first motor is fixedly connected to one end of the first screw rod; a second screw rod, the second screw rod is arranged in the mounting seat, a second motor is fixedly installed on the top of the mounting seat, and the output end of the second motor is fixedly connected to the second screw rod; an accommodating cavity, the accommodating cavity is installed on the second screw rod, the high and low speed motors are installed in the accommodating cavity, and the output end of the high and low speed motors is installed with a rotor; a second mounting frame, the second mounting frame is mirror-arranged on the side of the base away from the first mounting frame, and a stator is arranged in the accommodating cavity on the second mounting frame.

[0008] Furthermore, a through hole is provided on a side of the accommodating cavity away from the first mounting frame, and the size of the through hole is larger than the size of the output end of the high and low speed motors.

[0009] Furthermore, two sets of slide rails are arranged on both sides of the base, and the first mounting frame and the second mounting frame are slidably mounted on the slide rails.

[0010] Furthermore, an external component is disposed on one side of the base, and the external component includes a decoder, and the decoder is fixedly mounted on a side of the base away from the slide rail.

[0011] Furthermore, an oscilloscope is provided on one side of the decoder.

[0012] The beneficial effect of the present application is that the present application provides a high and low speed waveform test bench for a rotary transformer, which simulates the rotation of the rotor at different speeds by setting a test component and a test bench, and a motor that can achieve high and low speeds, so that the rotor and the stator can be adjusted in three directions of X, Y, and Z, thereby meeting the requirements of different eccentricities, and then the component under test can be freely switched between multiple workstations, which is convenient for use in multiple scenarios.

[0013] In addition to the above-described purposes, features and advantages, the present application also has other purposes, features and advantages. The present application will be further described in detail with reference to the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The drawings in the specification, which constitute a part of the present application, are used to provide further understanding of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute improper limitations on the present application.

[0015] In the attached picture:

[0016] Figure 1 This is an overall schematic diagram of a resolver high and low speed waveform test bench in this application;

[0017] Figure 2 for Figure 1 Schematic diagram of the main structure of the test bench;

[0018] Figure 3 for Figure 2 A schematic diagram of the side structure of the middle mounting frame;

[0019] Figure 4 for Figure 3 A schematic diagram of the main structure of the middle mounting frame;

[0020] Among them, the reference numerals in the figure are:

[0021] 1. Base; 11. Slide rail; 2. First mounting frame; 21. First screw rod; 22. First motor; 23. Mounting seat; 231. Accommodating cavity; 24. Second screw rod; 25. Second motor; 3. Second mounting frame; 4. External components; 41. Decoder; 42. Oscilloscope; 5. Through hole; 6. High and low speed motor; 61. Rotor; 7. Stator. DETAILED DESCRIPTION

[0022] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0023] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present application.

[0024] like Figure 1-Figure 2 As shown, the present application provides a resolver high and low speed waveform test bench, comprising a base 1, which is arranged in a motor processing plant and is used to test the high and low speed and eccentric waveforms of the resolver;

[0025] The base 1 is provided with a test assembly, including a slide rail 11, which is arranged on both sides of the base 1, and two sets of mirror-image mounting frames are slidably mounted on the slide rail 11, including a first mounting frame 2 and a second mounting frame 3, and the two sets of mounting frames are suitable for moving on the slide rail 11 under the control of the staff to achieve mutual approach or distance between the two;

[0026] A first screw rod 21 is rotatably connected to the top of the first mounting frame 2, and a mounting seat 23 is threadedly connected to the first screw rod 21. At the same time, a first motor 22 is arranged on one side of the first mounting frame 2, and the output end of the first motor 22 is fixedly connected to one end of the first screw rod 21, so that the mounting seat 23 is suitable for moving along the width direction of the first mounting frame 2 under the drive of the first motor 22.

[0027] like Figure 2-Figure 3 As shown, a second screw rod 24 is rotatably connected in the mounting seat 23, and a second motor 25 is fixedly installed on the top of the mounting seat 23, the output end of the second motor 25 is fixedly connected to the second screw rod 24, and a receiving cavity 231 is threadedly connected on the second screw rod 24, and the receiving cavity 231 is suitable for moving along the height direction of the first mounting frame 2 under the drive of the second motor 25;

[0028] A high and low speed motor 6 is detachably mounted in the accommodating chamber 231, and the high and low speed motor 6 can realize high and low speed control through a frequency converter. At the same time, a through hole 5 is provided on the side of the accommodating chamber 231 away from the first mounting frame 2, and the size of the through hole 5 is larger than the size of the output end of the high and low speed motor 6. At the same time, a rotor 61 is installed at the front end of the high and low speed motor 6;

[0029] Before the test, the rotor 61 is first connected to the output end of the high and low speed motor 6. After the connection is completed, the high and low speed motor 6 is fixed in the accommodating cavity 231. At this time, the output end of the high and low speed motor 6 and the rotor 61 will extend out of the through hole 5 on the accommodating cavity 231. At the same time, the stator 7 is fixedly installed on the outside of the accommodating cavity 231 of the second mounting frame 3, and a through groove is arranged at the center of the stator 7. The through groove is arranged concentrically with the through hole 5, and the size of the through groove is smaller than the size of the through hole 5.

[0030] like Figure 2 As shown, an external component 4 is provided on one side of the base 1, including a decoder 41, which is fixedly mounted on the base 1 on a side away from the slide rail 11, and the decoder 41 is used to output a sinusoidal signal (5-24V sinusoidal waveform), and the output signal of the decoder 41 provides an input signal to the excitation coil of the resolver;

[0031] At the same time, an oscilloscope 42 is provided on one side of the decoder 41 . The oscilloscope 42 is used to collect sine and cosine signals and excitation signals of the resolver product. The decoder 41 and the oscilloscope 42 are both electrically connected to the stator 7 .

[0032] During the test, the first mounting frame 2 and the second mounting frame 3 are first brought close to each other so that the rotor 61 extends into the through slot of the stator 7 and does not contact the stator 7. When the test starts, the high and low speed motors 6 drive the rotor 61 to rotate at different speeds in the stator 7, so that it generates an electrical signal through electromagnetic induction, and the electrical signal is transmitted to the oscilloscope 42 and the decoder 41, thereby testing the waveform of the rotary transformer at different speeds. At the same time, the rotor 61 and the stator 7 are controlled to be adjusted in the up and down and left and right directions on the mounting frame to simulate the eccentric state and realize the test of the extreme eccentric waveform.

[0033] In summary, the device sets up a test component and a test bench, and uses a motor that can achieve high and low speeds to simulate the rotation of the rotor 61 at different speeds, so that the rotor 61 and the stator 7 can be adjusted in three directions of X, Y, and Z, thereby meeting the requirements of different eccentricities, and then the component under test can be freely switched between multiple workstations, which is convenient for use in multiple scenarios.

[0034] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A resolver high and low speed waveform test bench, comprising: Base (1); A test assembly, which is arranged on the base (1), and is characterized in that: A first mounting frame (2), the first mounting frame (2) being arranged on the base (1); a first screw rod (21), a mounting seat (23) being threadedly connected to the first screw rod (21); a first motor (22) being arranged on one side of the first mounting frame (2); an output end of the first motor (22) being fixedly connected to one end of the first screw rod (21); a second screw rod (24), the second screw rod (24) being arranged in the mounting seat (23), a second motor (25) being fixedly mounted on the top of the mounting seat (23), and an output end of the second motor (25) being fixedly connected to the second screw rod (24); an accommodating chamber (231), the accommodating chamber (231) being mounted on the second screw rod (24), the accommodating chamber (231) being mounted with a high and low speed motor (6), and a rotor (61) being mounted on an output end of the high and low speed motor (6); A second mounting frame (3), the second mounting frame (3) being arranged in a mirror image on a side of the base (1) away from the first mounting frame (2), and a stator (7) being arranged in a receiving cavity (231) on the second mounting frame (3).

2. A resolver high and low speed waveform test bench according to claim 1, characterized in that: A through hole (5) is provided on a side of the accommodating cavity (231) away from the first mounting frame (2), and the size of the through hole (5) is larger than the size of the output end of the high and low speed motor (6).

3. A resolver high and low speed waveform test bench according to claim 2, characterized in that: Two sets of slide rails (11) are arranged on both sides of the base (1), and the first mounting frame (2) and the second mounting frame (3) are slidably mounted on the slide rails (11).

4. A resolver high and low speed waveform test bench according to claim 3, characterized in that: An external component (4) is provided on one side of the base (1), and the external component (4) comprises a decoder (41). The decoder (41) is fixedly mounted on a side of the base (1) away from the slide rail (11).

5. A resolver high and low speed waveform test bench according to claim 4, characterized in that: An oscilloscope (42) is provided on one side of the decoder (41).

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