Memory bank test equipment
By designing independent memory stick testing equipment and using processing modules and switch modules for independent testing, the existing equipment is solved by large size, high power consumption and relying on external computers, achieving efficient, accurate and flexible testing results.
Patent Information
- Application Number
- CN202421379771.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-17
- Publication Date
- 2025-02-25
- Estimated Expiration
- 2034-06-17
AI Technical Summary
The existing memory stick test equipment is large in size, has high power consumption, and relies on external computers, resulting in poor mobility and flexibility, low testing efficiency and accuracy, high system complexity and high maintenance costs.
Design an independent memory stick test device, including a housing and a test module, with a memory stick slot and multiple test channels in the housing. The test module includes a processing module and a switch module, and the processing module controls the switch module to One of the test channels is turned on and performs independent testing of memory modules.
It realizes independent and independent testing, small size, low power consumption, good mobility and flexibility, high testing efficiency and accuracy, reducing system complexity and maintenance costs.
Smart Images
Figure CN222530033U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of memory stick testing, and in particular to a memory stick testing device. Background Art
[0002] At present, memory stick test equipment usually relies on external computers to execute the memory stick test process. In practical applications, there are several problems: (1) The equipment is large in size and occupies more working space, which brings additional inconvenience to transportation and computer room layout. The large size and weight will also increase logistics costs and limit the mobility and flexibility of the test equipment; (2) The test platform based on external computers is often accompanied by high power consumption. Under continuous operation conditions, the test equipment not only generates significant energy consumption, but also may place higher requirements on the working environment due to heat dissipation requirements, increase maintenance costs, and may shorten the effective service life of the test equipment; (3) The test equipment has a strong dependence on external computers and needs to rely on external computers to provide necessary test commands and process test data. This not only increases the complexity of the system, but also may affect the flexibility and response speed of the test. When encountering compatibility and upgrade maintenance issues with the external computer, the test process may be disturbed, thereby affecting the overall test efficiency and accuracy. Utility Model Content
[0003] The present application provides a memory stick testing device with strong autonomy, good mobility and flexibility.
[0004] The present application provides a memory stick testing device, comprising:
[0005] The housing comprises a memory module slot, wherein a plurality of test channels are arranged in the memory module slot; and
[0006] A test module is arranged in the shell and includes a processing module and a switch module electrically connected to the processing module, wherein the switch module is electrically connected to the multiple test channels; when the memory stick is inserted into the memory stick slot and contacts the multiple test channels for testing, the processing module controls the switch module to turn on one of the test channels so that the processing module tests the memory stick.
[0007] Preferably, the switch module includes a multi-channel high-speed signal switch, and the multi-channel high-speed signal switch includes multiple switching channels, which are electrically connected to the multiple test channels one by one; when the memory stick is inserted into the memory stick slot and contacts the multiple test channels and is tested, the processing module controls one of the switching channels of the switch module to be turned on, so that the test channel electrically connected to the switching channel is turned on.
[0008] Preferably, the switch module includes a plurality of single-channel high-speed signal switches, and the plurality of single-channel high-speed signal switches are electrically connected to the test channels one by one; when the memory stick is inserted into the memory stick slot and contacts the plurality of test channels for testing, the processing module controls one of the plurality of single-channel high-speed signal switches to be turned on, so that the test channel electrically connected to the single-channel high-speed signal switch is turned on.
[0009] Preferably, the memory stick testing device comprises a display module, which is disposed on an outer surface of the housing and is electrically connected to the processing module.
[0010] Preferably, the memory stick testing device comprises a battery module electrically connected to the processing module and the switch module.
[0011] Preferably, the memory stick testing device includes a wireless communication module electrically connected to the processing module.
[0012] Preferably, the wireless communication module includes at least one of a Wi-Fi module and a Bluetooth module.
[0013] Preferably, the side wall of the housing is provided with at least one interface, and the memory stick testing device is connected to an external device via the at least one interface.
[0014] Preferably, the memory stick slot is located at the top of the housing, and the multiple test channels are arranged at the bottom of the memory stick slot.
[0015] Preferably, the processing module includes an embedded processor.
[0016] The memory stick test device provided in the embodiment of the present application is provided with a shell and a test module arranged in the shell, a memory stick slot is arranged on the shell, and a plurality of test channels are arranged in the memory stick slot. The test module is provided with a processing module and a switch module electrically connected to the processing module, and the switch module is arranged to be electrically connected to the plurality of test channels; when the memory stick is inserted into the memory stick slot and contacts with the plurality of test channels and is tested, the processing module controls the switch module to turn on one of the test channels so that the processing module tests the memory stick. The memory stick test device can be used as an independent device to independently test the memory stick without the aid of or reliance on external computer equipment, has strong autonomy, high test efficiency and accuracy, is small in size, does not need to occupy too much space, has good mobility and flexibility, has a simple structure, and has low cost and power consumption.
[0017] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 Shown is a schematic structural diagram of an embodiment of a memory stick testing device of the present application.
[0019] Figure 2 Shown Figure 1 A functional block diagram of an embodiment of a memory bar testing device is shown.
[0020] Figure 3 Shown Figure 1 A functional block diagram of another embodiment of a memory stick testing device is shown. DETAILED DESCRIPTION
[0021] The memory bar testing device provided by the embodiment of the present application is described in detail below in conjunction with the accompanying drawings. In the absence of conflict, the features of the following embodiments and implementations can be combined with each other at will.
[0022] Figure 1 Shown is a structural schematic diagram of an embodiment of a memory stick testing device 1 of the present application. Figure 2 Shown Figure 1 The schematic diagram of an embodiment of a memory bar testing device 1 is shown. Figure 1 and Figure 2 As shown, the memory stick test device 1 includes a housing 11 and a test module 12. The housing 11 includes a memory stick slot 111, and a plurality of test channels 112 are provided in the memory stick slot 111. When testing is required, the memory stick 2 can be inserted into the memory stick slot 111, and the memory stick 2 is in electrical contact with the test channels 112. When testing is not required, the memory stick 2 can be pulled out from the memory stick slot 111.
[0023] The test module 12 is arranged in the housing 11. The test module 12 includes a processing module 121 and a switch module 122 electrically connected to the processing module 121, and the switch module 122 is electrically connected to multiple test channels 112. The processing module 121 and the switch module 122 can be integrated into the same mainboard, or can be arranged on different circuit boards. The on-off of the switch module 122 is controlled by the processing module 121. The switch module 122 can control the on-off of the test path between the processing module 121 and the test channel 112, thereby controlling the on-off between the processing module 121 and the memory stick 2. When the memory stick is inserted into the memory stick slot 111 and contacts with multiple test channels 112 and is tested, the processing module 121 controls the switch module 122 to turn on one of the test channels 112, so that the processing module 121 tests the memory stick.
[0024] In this embodiment, the memory stick 2 can be a storage device in a computer for storing data and temporarily executing programs, also known as a memory module. The memory stick 2 is inserted into the memory stick slot 111 on the housing 11, and is used to temporarily store data for fast reading and writing by the CPU (Central Processing Unit), and is an important component in the computer system. In a computer, DDR (Double Data Rate) is a specification standard for the memory module of the memory stick 2, which is used to represent a certain type of dynamic random access memory module, which is characterized in that data can be transmitted twice in the same clock cycle. Compared with traditional methods, DDR has a higher data transmission speed. The memory stick test device 1 is used to test the read and write functions of the memory stick 2.
[0025] In this embodiment, a memory bar 2 has 8 DDR storage particles 21, and its data bus width is 64 bits, which means that 8 bits of data are transmitted in each DDR storage particle 21, and a total of 64 bits of data can be transmitted. Therefore, the memory bar 2 can be called a 64-bit memory module. Correspondingly, 8 test channels 112 are set in the memory bar slot 111, that is, one test channel 112 is connected to one DDR storage particle 21, and one test channel 112 is connected to an 8-bit memory module.
[0026] When testing, the memory stick 2 is inserted into the memory stick slot 111, and the memory stick 2 is in electrical contact with the test channel 112. When the processing module 121 controls the switch module 122 to be turned on, one of the test channels 112 is turned on. At this time, the processing module 121 transmits 8-bit data to one of the DDR storage particles 21 of the memory stick 2 corresponding to the test channel 112, and writes the 8-bit data into the 8-bit memory module corresponding to the DDR storage particle 21. After the write operation is completed, the 8-bit data is obtained from the 8-bit memory module through the DDR storage particle 21 to test the read and write functions of the DDR storage particle 21 corresponding to the test channel 112 in the memory stick 2 and its corresponding 8-bit memory module.
[0027] When the read and write function test of the 8-bit memory module connected to one of the DDR storage particles 21 is completed, the read and write function of the 8-bit memory module connected to the next DDR storage particle 21 is performed in sequence. The test sequence can be performed from left to right or from right to left in sequence according to the order of the DDR storage particles 21. When the test is completed or no test is needed, the processing module 121 controls the switch module 122 to disconnect, and then the memory stick 2 can be pulled out from the memory stick slot 111.
[0028] It should be noted that the memory stick testing device 1 can also test other functions of the memory stick 2, and can also test memory sticks 2 with other numbers or other capacities of memory modules, which is not limited in the present application.
[0029] In the above scheme, the memory stick test device 1 is an independent device. By setting a memory stick slot 111 to accommodate the memory stick 2, and setting a processing module 121 and a switch module 122 of the test module 12, an independent test architecture is constructed to independently test the memory stick 2 without the help of or reliance on external computer equipment. It has strong autonomy, high test efficiency and accuracy, small size, does not need to occupy too much space, has good mobility and flexibility, simple structure, and low cost and power consumption. In this way, the problems of large size, high power consumption and excessive dependence on external computers in the memory stick test device in the related art, as well as obvious deficiencies and limitations in test efficiency, test accuracy and functionality are solved. The purpose is to comprehensively improve and optimize the memory stick test device 1, and provide an independent test device with a simpler and more compact structure, efficient testing, stronger autonomy and low power consumption. While ensuring the reliability of the test results, it can improve the automation level of the test process, shorten the test cycle, and reduce the probability of errors in the operation process, improve the performance and feasibility of the test process, and achieve the dual goals of reducing production costs and improving product quality.
[0030] exist Figure 2In the illustrated embodiment, the switch module 122 includes a multi-channel high-speed signal switch 123. The multi-channel high-speed signal switch 123 includes a plurality of switching channels 124, which are electrically connected to the plurality of test channels 112 in a one-to-one correspondence. The multi-channel high-speed signal switch 123 can be an integrated module, and a plurality of switching channels 124 are provided, which are used to connect or disconnect the link of the high-speed signal, and the switching speed is high. When the memory stick is inserted into the memory stick slot 111 and contacts with the plurality of test channels 112 and is tested, the processing module 121 controls one of the switching channels 124 of the switch module 122 to be turned on, so that the test channel 112 electrically connected to the switching channel 124 is turned on. In the present embodiment, the multi-channel high-speed signal switch 123 includes 8 switching channels 124, and the 8 switching channels 124 are arranged in a one-to-one correspondence with the 8 test channels 112. When testing, the memory stick 2 is inserted into the memory stick slot 111, and the 8 DDR storage particles 21 of the memory stick 2 are in contact with the 8 test channels 112. When the processing module 121 controls one of the switching channels 124 of the multi-channel high-speed signal switch 123 to be turned on, the test channel 112 electrically connected to the switching channel 124 is turned on, so that the processing module 121 transmits 8-bit data to one of the DDR storage particles 21 of the memory stick 2 corresponding to the test channel 112, and writes the 8-bit data into the 8-bit memory module corresponding to the DDR storage particle 21. After the write operation is completed, the 8-bit data is obtained from the 8-bit memory module through the DDR storage particle 21 to test the read and write functions of the DDR storage particle 21 corresponding to the test channel 112 in the memory stick 2 and its corresponding 8-bit memory module. When the test channel completes the test, the processing module 121 controls the next switching channel 124 of the multi-channel high-speed signal switch 123 to be turned on, and so on, until all the switching channels are switched. The test process is similar and will not be repeated here.
[0031] In this embodiment, by setting a multi-channel high-speed signal switch 123, during the test process, the switching and transmission of the signal can be completed in a very short period of time, the switching efficiency is high, and the signal with a wide frequency range can be effectively transmitted, the energy loss is low, and the isolation between the multiple switching channels 124 is high, which can effectively resist the influence of external noise and interference on signal transmission, and is stable and reliable. Considering that the DDR physical interface of the embedded platform usually has only a single 32-bit width, this embodiment expands the signal channel by adopting a single-channel high-speed signal switch solution. This solution allows more data channels to be dynamically called when needed, while maintaining the low power consumption characteristics of the embedded processor, enhancing the ability of the memory bar test device 1 to process high-speed memory bars, improving the efficiency and accuracy of the test, and meeting the test requirements of more complex memory products.
[0032] exist Figure 1In the illustrated embodiment, the memory stick slot 111 is located at the top of the housing 11, and a plurality of test channels 112 are provided at the bottom of the memory stick slot 111. The opening of the memory stick slot 111 is provided at the top surface of the housing 11. When testing is required, the memory stick 2 can be inserted into the memory stick slot 111 from top to bottom. When testing is not required, the memory stick 2 can be pulled out from the memory stick slot 111 from bottom to top. With such a configuration, on the one hand, the memory stick 2 can be easily inserted and pulled out up and down, and on the other hand, the test channel 112 is provided at the bottom of the memory stick slot 111, so that when the memory stick 2 is inserted into the memory stick slot 111 from top to bottom, the contact stability between the DDR storage particles 21 and the test channel 112 is good.
[0033] The size of the memory stick slot 111 of this embodiment can be adapted to memory sticks 2 of different capacities or specifications. The memory stick slot 111 is compatible with different transmission data and capacities, such as memory sticks of various specifications including DDR3, DDR4 and DDR5, effectively expanding the application scope of the memory stick test device 1 to adapt to various test requirements and market changes, to meet test requirements, and to reduce the economic burden of users purchasing and maintaining multiple test equipment for memory sticks of different specifications.
[0034] For memory sticks 2 of different capacities or specifications, different test frameworks are formed in the memory stick testing device 1 of this embodiment. The test framework can automatically identify memory sticks 2 of different specifications, and can intelligently adjust test parameters and processes according to memory specifications to achieve automated testing, simplify operating procedures, improve test compatibility, and enhance the user-friendliness of the memory stick testing device 1, ensuring that reliable data can be obtained for each test, thereby ensuring the accuracy and consistency of the test.
[0035] exist Figure 2 In the illustrated embodiment, the processing module 121 includes an embedded processor. An embedded processor is a computer processor for an embedded system. The embedded system provided in the embedded processor is a computer system designed for certain specific control functions, and its function realization does not rely on external input devices such as a keyboard and a mouse, but is controlled by software and firmware built for specific applications. The processing module 121, as a core control unit, is embedded in the interior of the housing 11 and adopts a compact and low-power embedded processor. It is a core component that drives the device to operate according to a predetermined function, making the memory stick test device 1 more convenient to carry out and convenient for users to use in different test environments. The embedded processor has certain advantages in real-time computing power, stability, power efficiency, cost and space occupancy.
[0036] In addition, the embedded processor of the present embodiment is arranged in the housing 11, can work under low power consumption conditions, can be adapted to mobile devices, has good mobility and flexibility, adopts miniaturized packaging and integrated design, occupies little space, is suitable for integration in a limited space, has high integration, can be implemented at a lower cost according to specific application scenarios and functional requirements, has good real-time performance and response speed, is suitable for application scenarios that require fast response, can integrate multiple functions and peripherals, such as communication interfaces, analog input and output, accelerators, etc., can simplify system design and layout, reduce system cost and complexity, and has good reliability and stability. Compared with the traditional CPU, the energy consumption and space occupation of the entire memory bar test device 1 are significantly reduced, while maintaining sufficient data processing capabilities to meet various computing requirements during the memory bar test process.
[0037] exist Figure 1 and Figure 2 In the illustrated embodiment, the memory stick test device 1 includes a display module 13, which is disposed on the outer surface of the housing 11 and is electrically connected to the processing module 121. In this embodiment, the display module 13 may be a display screen. The display screen may be an LCD (Liquid Crystal Display) display screen, which can intuitively display the test results and the specific location of the problem particles, which is beneficial to the test.
[0038] exist Figure 2 In the illustrated embodiment, the memory stick test device 1 includes a battery module 14, which is electrically connected to the processing module 121 and the switch module 122. The battery module 14 can supply power to the processing module 121 and the switch module 122 to ensure stable operation of the test process. Compared with the traditional power supply method, this method can achieve long-term offline testing and good mobility, and is not limited by an external power supply, so that the memory stick test device 1 can work in an environment without an external power supply, which is more convenient for use in a field or remote environment, greatly improving the mobility of the device and the flexibility of the use scenario, and is more convenient to use.
[0039] exist Figure 2In the illustrated embodiment, the memory stick test device 1 includes one of the wireless communication modules 15, which is electrically connected to the processing module 121. In some embodiments, the wireless communication module 15 includes at least one of a Wi-Fi module and a Bluetooth module. In some embodiments, the wireless communication module 15 includes a Wi-Fi module. In some other embodiments, the wireless communication module 15 includes a Bluetooth module. The memory stick test device 1 of this embodiment integrates the wireless communication module 15, and the memory stick test device 1 can support standards such as Wi-Fi or Bluetooth, which enables the memory stick test device 1 to be connected to an external mobile device through one of the wireless communication modules 15, and can realize wireless transmission of test data to a remote server or mobile device, and users can receive test results remotely, which is convenient for users to perform data analysis and long-distance monitoring and equipment management, while improving the efficiency of data processing and sharing.
[0040] In replay Figure 1 In the illustrated embodiment, the side wall of the housing 11 is provided with at least one interface 16, and the memory stick test device 1 is connected to an external device via the at least one interface 16. In this embodiment, the interface 16 may be a USB interface. The memory stick test device 1 may be connected to an external computer device via at least one USB interface, which is beneficial for uploading the test results to a computer host computer, and is convenient for users to perform data analysis.
[0041] Figure 3 Shown Figure 1 The schematic diagram of another embodiment of the memory stick testing device 1 is shown. Figure 3 The embodiment shown is Figure 1 and Figure 2 The embodiment shown is similar, with the main difference being that the switch module 122 includes a plurality of single-channel high-speed signal switches 125, and the plurality of single-channel high-speed signal switches 125 are electrically connected to the test channels 112 one by one. The single-channel high-speed signal switch 125 can be an independent module, used to connect or disconnect the link of the high-speed signal, and has a high switching speed. When the memory stick is inserted into the memory stick slot 111 and contacts with the plurality of test channels 112 and is tested, the processing module 121 controls one of the plurality of single-channel high-speed signal switches 125 to be turned on, so that the test channel 112 electrically connected to the single-channel high-speed signal switch 125 is turned on. Figure 3In the illustrated embodiment, the switch module 122 may include 8 single-channel high-speed signal switches 125, and the 8 single-channel high-speed signal switches 125 are arranged in a one-to-one correspondence with the 8 test channels 112. When testing, the memory stick 2 is inserted into the memory stick slot 111, and the 8 DDR storage particles 21 of the memory stick 2 are in contact with the 8 test channels 112. When the processing module 121 controls one of the single-channel high-speed signal switches 125 to be turned on, the test channel 112 electrically connected to the single-channel high-speed signal switch 125 is turned on, so that the processing module 121 transmits 8-bit data to one of the DDR storage particles 21 of the memory stick 2 corresponding to the test channel 112, and writes the 8-bit data into the 8-bit memory module corresponding to the DDR storage particle 21. After the write operation is completed, the 8-bit data is obtained from the 8-bit memory module through the DDR storage particle 21 to test the read and write functions of the DDR storage particle 21 corresponding to the test channel 112 in the memory stick 2 and the corresponding 8-bit memory module. When the test channel completes the test, the processing module 121 controls the next single-channel high-speed signal switch 125 to turn on, and so on, until all the single-channel high-speed signal switches 125 are switched. The test process is similar and will not be repeated here. In this embodiment, by setting a plurality of single-channel high-speed signal switches 125, the switching and transmission of the signal can be completed in a very short period of time during the test process, the switching efficiency is high, and the signal with a wide frequency range can be effectively transmitted, and the energy loss is low. The plurality of single-channel high-speed signal switches 125 are separately set, which is convenient for maintenance or replacement, and are independently controlled during the test process. The isolation between the plurality of single-channel high-speed signal switches 125 is high, the signal interference effect is small, and it is stable and reliable. The switching efficiency of the multi-channel high-speed signal switch 123 and the single-channel high-speed signal switch 125 is very high, and the main difference is that the integration is different.
[0042] It should be understood that the present application is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.
Claims
1. A memory bar testing device, characterized in that: include: The housing comprises a memory stick slot, wherein a plurality of test channels are arranged in the memory stick slot; and A test module is arranged in the shell and includes a processing module and a switch module electrically connected to the processing module, wherein the switch module is electrically connected to the multiple test channels; when the memory stick is inserted into the memory stick slot and contacts the multiple test channels for testing, the processing module controls the switch module to turn on one of the test channels so that the processing module tests the memory stick.
2. The memory bar testing device according to claim 1, characterized in that: The switch module includes a multi-channel high-speed signal switch, which includes multiple switching channels, which are electrically connected to the multiple test channels in a one-to-one correspondence; when the memory stick is inserted into the memory stick slot and contacts the multiple test channels for testing, the processing module controls one of the switching channels of the switch module to be turned on, so that the test channel electrically connected to the switching channel is turned on.
3. The memory bar testing device according to claim 1, characterized in that: The switch module includes a plurality of single-channel high-speed signal switches, and the plurality of single-channel high-speed signal switches are electrically connected to the test channels one by one; when the memory stick is inserted into the memory stick slot and contacts the plurality of test channels for testing, the processing module controls one of the plurality of single-channel high-speed signal switches to be turned on, so that the test channel electrically connected to the single-channel high-speed signal switch is turned on.
4. The memory bar testing device according to claim 1, characterized in that: The memory bar testing device comprises a display module, which is arranged on the outer surface of the shell and is electrically connected to the processing module.
5. The memory bar testing device according to claim 1, characterized in that: The memory stick testing device comprises a battery module which is electrically connected to the processing module and the switch module.
6. The memory bar testing device according to claim 1, characterized in that: The memory stick testing device includes a wireless communication module which is electrically connected to the processing module.
7. The memory bar testing device according to claim 6, characterized in that: The wireless communication module includes at least one of a Wi-Fi module and a Bluetooth module.
8. The memory bar testing device according to claim 1, characterized in that: The side wall of the shell is provided with at least one interface, and the memory stick testing device is connected to an external device via the at least one interface.
9. The memory bar testing device according to claim 1, characterized in that: The memory bar slot is located at the top of the shell, and the multiple test channels are arranged at the bottom of the memory bar slot.
10. The memory bar testing device according to claim 1, characterized in that: The processing module includes an embedded processor.