Testing device for accelerated aging of chip
By designing a chip aging test device including an operating cabinet, heating system, humidification system and heat dissipation fan, the problem in the prior art that the chip is not effectively simulated by factors such as high temperature in the air environment where the chip is powered and circulated, and more realistic and reliable experimental results are achieved.
Patent Information
- Application Number
- CN202420034333.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-01-08
- Publication Date
- 2025-03-07
- Estimated Expiration
- 2034-01-08
AI Technical Summary
The existing chip aging test device cannot effectively simulate the chip being affected by high temperature and other factors in the air environment where the chip is energized and circulated, affecting the experimental results.
A test device including an operating cabinet, heating system, humidification system and heat dissipation fan was designed. The circulating air wheel, heating pipe and humidification system simulated circulating ventilation while heating and humidification, and simulated the operation of the chip in the circulating air environment.
It realizes that the simulation chip is affected by high temperature and other factors in the air environment where the power is turned on and flows in the test device, and improves the authenticity and reliability of the experimental results.
Smart Images

Figure CN222580200U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of chip aging devices, in particular to a test device for accelerated chip aging. Background Art
[0002] Chip HAST accelerated aging test device, the purpose of accelerated life test is to increase environmental stress (such as temperature) and working stress (voltage, load, etc. applied to the product), speed up the test process, and shorten the life test time of the product or system. It is used to investigate and analyze when the wear and service life of electronic components and mechanical parts will occur, what shape the failure distribution function of the service life is, and analyze the reasons for the increase in failure rate. At present, since the chip is exposed, the chemical and physical effects of the environment will affect the test results during the test, and the post-packaging test cannot fully reflect the life of the chip under normal stress, so the chip life cannot be estimated. At present, the academic community also uses nitrogen as the test medium for LED chip life test, but its disadvantages are: ① it is difficult to completely isolate the oxygen molecules in the air; ② the test cost is high; ③ the control accuracy of the experimental thermal stress is relatively low. Among them, an LED chip accelerated life test device with application number "CN201020608332.5" can perform an aging test of the LED chip by energizing and lighting the exposed LED chip in the test environment liquid and controlling the temperature of the liquid; compared with the traditional LED chip aging test, the aging test of the utility model is more efficient, and its aging test results are closer to the aging test results of the actual packaged LED chip, but the device still has certain shortcomings when used: because the chip is placed in the solution and isolated from the air, it is impossible to effectively simulate the chip being affected by factors such as high temperature in an energized and circulating air environment, thereby affecting the experimental results. Utility Model Content
[0003] The purpose of the utility model is to provide a test device for accelerated chip aging, so as to solve the problem raised in the above background technology that since the chip is placed in a solution and isolated from the contact with the air, it is impossible to effectively simulate the chip being affected by factors such as high temperature in an environment with power and circulating air, thereby affecting the experimental results.
[0004] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a test device for accelerated chip aging, comprising an operating cabinet, a heating system, a humidification system and a heat dissipation fan;
[0005] A safety door is hingedly installed on the surface of the operating cabinet, a door handle is installed on the surface of the safety door, a box is fixedly installed inside the operating cabinet, and a warehouse door is installed on the surface of the box;
[0006] The heating system includes a heating tube fixedly installed inside the box body, a circulation motor is fixedly installed inside the operating cabinet, a circulation wind wheel is fixedly installed at the output end of the circulation motor, and the circulation wind wheel is arranged on one side of the heating tube;
[0007] The humidification system includes a water tank installed at the bottom of the operating cabinet;
[0008] The cooling fan is fixedly installed inside the operation cabinet.
[0009] As a preferred solution of the utility model: a sampling terminal is provided on one side of the box, a leakage switch is fixedly installed on the back of the box, and a distribution box is installed on one side of the bottom of the box.
[0010] As a preferred solution of the utility model: an over-temperature protection is fixedly installed on the top of the surface of the safety door, and a pressure display screen is installed on the top of the over-temperature protection.
[0011] As a preferred solution of the utility model: reinforcing ribs are fixedly installed around the outside of the box body, locking baffles are fixedly installed around the reinforcing ribs near the warehouse door, and an automatic locking device is installed inside the warehouse door, and the automatic locking device is inserted inside the locking baffle.
[0012] As a preferred solution of the utility model: a conversion joint is fixedly installed on one side of the box body.
[0013] As a preferred solution of the utility model: a touch screen is installed in the middle of the surface of the safety door, the conversion connector, circulation motor, cooling fan, sampling terminal, over-temperature protection and pressure display screen are all electrically connected to the touch screen, and the touch screen and leakage switch are electrically connected to the distribution box.
[0014] Compared with the prior art, the beneficial effects of the utility model are:
[0015] (1) Place the sample inside the box manually, connect the sampling terminal to the power supply for energy conduction, and after the wiring is completed, manually close the door and then the safety door. Then, set the relevant parameters (test temperature point) according to the standard through the touch screen, and press the start button to start the equipment. At this time, the circulating wind wheel, heating system and humidification system inside the box are started, so that the inside of the box can achieve circulating ventilation while simulating heating and humidification. The product is subjected to accelerated destructive test and the programmed reciprocating cycle test is carried out according to the standard;
[0016] (2) Reinforcement ribs are installed around the outside of the box to give it better structural strength. Lock baffles are installed around the reinforcement ribs. When the door is closed, the automatic locking device installed inside is inserted into the lock baffle, so that the door and the box are stably connected. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 This is a schematic diagram of the main structure of the utility model;
[0018] Figure 2 It is a schematic diagram of the top view structure of the utility model;
[0019] Figure 3 It is a side view structural schematic diagram of the utility model;
[0020] Figure 4 This is a schematic diagram of the water tank installation structure of the utility model;
[0021] Figure 5 This is a schematic diagram of the sampling terminal installation structure of the utility model;
[0022] Figure 6 This is a schematic diagram of the installation structure of the automatic locking device of the utility model;
[0023] Figure 7 This is a schematic diagram of the conversion joint structure of the utility model.
[0024] In the figure: 1. Operation cabinet; 2. Safety door; 21. Door handle; 3. Box body; 4. Warehouse door; 41. Automatic locking device; 5. Heating system; 51. Heating tube; 52. Circulation motor; 53. Circulation fan; 6. Humidification system; 61. Water tank; 7. Cooling fan; 8. Sampling terminal; 9. Leakage switch; 10. Distribution box; 11. Over-temperature protection; 12. Pressure display screen; 13. Reinforcement rib; 14. Lock baffle; 15. Conversion connector; 16. Touch screen. DETAILED DESCRIPTION
[0025] In order to make the purpose, technical solution and advantages of the implementation of the utility model clearer, the technical solution in the implementation of the utility model will be clearly and completely described below in conjunction with the drawings in the implementation of the utility model. Obviously, the described implementation is a part of the implementation of the utility model, not all of the implementations. Based on the implementation of the utility model, all other implementations obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0026] See also Figure 1-Figure 7 A test device for accelerated chip aging, comprising: an operating cabinet 1, a heating system 5, a humidifying system 6 and a heat dissipation fan 7; a safety door 2 is hingedly installed on the surface of the operating cabinet 1, a door handle 21 is installed on the surface of the safety door 2, a box body 3 is fixedly installed inside the operating cabinet 1, and a compartment door 4 is installed on the surface of the box body 3;
[0027] See also Figure 3, the heating system 5 includes a heating tube 51 fixedly installed inside the box body 3, a circulation motor 52 is fixedly installed inside the operating cabinet 1, a circulation wind wheel 53 is fixedly installed at the output end of the circulation motor 52, and the circulation wind wheel 53 is arranged on one side of the heating tube 51.
[0028] During specific use: after the heating tube 51 is powered on, heat radiation is generated, which increases the temperature inside the box 3. At this time, the circulation motor 52 rotates to drive the circulation wind wheel 53 at the output end to rotate. The circulation wind wheel 53 is arranged on one side of the heating tube 51, so that the heat generated by the heating tube 51 is evenly blown to the inside of the box 3, so that a circulating circulation environment is formed inside the box 3, simulating the chip running in a circulating air environment.
[0029] See also Figure 4 , the humidification system 6 includes a water tank 61 installed at the bottom position of the operation cabinet 1.
[0030] When used specifically, the water tank 61 installed at the bottom of the operating cabinet 1 is convenient for humidifying the interior of the box body 3, so that the simulation chip can work in a high humidity environment.
[0031] See also Figure 5 , a heat dissipation fan 7 , which is fixedly installed inside the operation cabinet 1 .
[0032] During specific use: a heat dissipation fan 7 is installed inside the operating cabinet 1 to dissipate heat and cool the temperature transferred from the box body 3 to the inside of the operating cabinet 1, so as to prevent the operating cabinet 1 from overheating.
[0033] See also Figure 5 A sampling terminal 8 is provided on one side of the box body 3 , a leakage switch 9 is fixedly installed on the back of the box body 3 , and a distribution box 10 is installed on one side of the bottom of the box body 3 .
[0034] During specific use: a sampling terminal 8 is provided on one side of the box 3, which is convenient for sampling the environmental parameters inside the box 3 and recording the simulation experiment data. A leakage switch 9 is installed on the back of the box 3, and a distribution box 10 is installed on one side of the bottom of the box 3 to control the power supply operation of the equipment. The leakage switch 9 is convenient for protecting the distribution box 10 and the stable operation of the equipment.
[0035] See also Figure 1 An over-temperature protection device 11 is fixedly installed on the top of the surface of the safety door 2, and a pressure display screen 12 is installed on the top of the over-temperature protection device 11.
[0036] During specific use: an over-temperature protection 11 is installed on the surface of the safety door 2, and the over-temperature protection 11 can prevent the internal temperature of the box body 3 from being too high. The pressure display screen 12 installed on the top is convenient for the operator to observe the temperature value inside the box body 3.
[0037] See also Figure 6 Reinforcing ribs 13 are fixedly installed around the outside of the box body 3, and locking baffles 14 are fixedly installed around the reinforcing ribs 13 near the warehouse door 4. An automatic locking device 41 is installed inside the warehouse door 4, and the automatic locking device 41 is inserted inside the locking baffle 14.
[0038] During specific use: reinforcing ribs 13 are installed around the outside of the box body 3 to give the box body 3 better structural strength, and locking baffles 14 are installed around the reinforcing ribs 13. When the warehouse door 4 is closed, the automatic locking device 41 installed inside is inserted into the locking baffle 14, so that the warehouse door 4 and the box body 3 are stably connected.
[0039] See also Figure 7 A conversion joint 15 is fixedly installed on one side of the box body 3.
[0040] When in use, a conversion connector 15 is installed on one side of the box body 3, and the conversion connector 15 is convenient for plugging with chips of different interfaces.
[0041] See also Figure 1 A touch screen 16 is installed in the middle of the surface of the safety door 2. The conversion connector 15, the circulation motor 52, the cooling fan 7, the sampling terminal 8, the over-temperature protection 11 and the pressure display screen 12 are all electrically connected to the touch screen 16. The touch screen 16 and the leakage switch 9 are electrically connected to the distribution box 10.
[0042] During specific use: when the distribution box 10 is connected to the external power supply, the touch screen 16 and the leakage switch 9 are powered on and operated. At this time, the touch screen 16, the conversion connector 15, the circulation motor 52, the cooling fan 7, the sampling terminal 8, the over-temperature protection 11 and the pressure display screen 12 are powered on and controlled to operate. When the distribution box 10 is disconnected from the external power supply, the equipment stops running.
[0043] When conducting the test, the sample is manually placed inside the box 3 and connected to the power supply with the sampling terminal 8 for energy conduction. After the wiring is completed, the compartment door 4 is manually closed and then the safety door 2 is closed. Then, the relevant parameters (test temperature point) are set according to the standard through the touch screen 16, and the operation is pressed to start the equipment. At this time, the circulating wind wheel 53, heating system 5 and humidification system 6 inside the box 3 are started, so that the inside of the box 3 can realize circulating ventilation while simulating heating and humidification, and the product is subjected to accelerated destructive testing, and a programmed reciprocating cycle test is carried out according to the standard.
[0044] The contents not described in detail in this specification belong to the prior art known to professional and technical personnel in the field. Although the present invention has been described in detail with reference to the aforementioned embodiments, it is still possible for technical personnel in the field to modify the technical solutions described in the aforementioned embodiments, or to make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention shall be included in the protection scope of the present invention.
Claims
1. A test device for accelerated chip aging, characterized in that: include: An operating cabinet (1), wherein a safety door (2) is hingedly mounted on the surface of the operating cabinet (1), a door handle (21) is mounted on the surface of the safety door (2), a box (3) is fixedly mounted inside the operating cabinet (1), and a warehouse door (4) is mounted on the surface of the box (3); A heating system (5), the heating system (5) comprising a heating tube (51) fixedly mounted inside the box (3), a circulation motor (52) fixedly mounted inside the operating cabinet (1), a circulation fan (53) fixedly mounted at the output end of the circulation motor (52), and the circulation fan (53) arranged on one side of the heating tube (51); A humidifying system (6), the humidifying system (6) comprising a water tank (61) installed at the bottom of the operating cabinet (1); A heat dissipation fan (7), wherein the heat dissipation fan (7) is fixedly installed inside the operating cabinet (1).
2. A test device for accelerated chip aging according to claim 1, characterized in that: A sampling terminal (8) is provided on one side of the box body (3), a leakage switch (9) is fixedly installed on the back of the box body (3), and a distribution box (10) is installed on one side of the bottom of the box body (3).
3. A test device for accelerated chip aging according to claim 2, characterized in that: An over-temperature protection device (11) is fixedly installed on the top of the surface of the safety door (2), and a pressure display screen (12) is installed on the top of the over-temperature protection device (11).
4. A test device for accelerated chip aging according to claim 1, characterized in that: Reinforcing ribs (13) are fixedly installed around the outside of the box body (3), and locking baffles (14) are fixedly installed around the reinforcing ribs (13) near the warehouse door (4). An automatic locking device (41) is installed inside the warehouse door (4), and the automatic locking device (41) is inserted inside the locking baffle (14).
5. The test device for accelerated chip aging according to claim 3, characterized in that: A conversion joint (15) is fixedly mounted on one side of the box body (3).
6. A test device for accelerated chip aging according to claim 5, characterized in that: A touch screen (16) is installed in the middle of the surface of the safety door (2); the conversion joint (15), the circulation motor (52), the cooling fan (7), the sampling terminal (8), the over-temperature protection (11) and the pressure display screen (12) are all electrically connected to the touch screen (16); and the touch screen (16) and the leakage switch (9) are electrically connected to the distribution box (10).
Citation Information
Patent Citations
Accelerated life test device for LED (light-emitting diode) chip
CN201859199U
Cited By
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