Device for detecting sample defects of X-ray fluorescence spectrophotometer

Abstract

The utility model relates to a device for detecting sample defects of an X-ray fluorescence spectrophotometer, which comprises the X-ray fluorescence spectrophotometer, a belt conveying device, a sample machine, a removing mechanism, a visual identification system, a support, a photoelectric sensor, a waste sample groove and a data transmission control computer, and the belt conveying device is arranged between the sample machine and the X-ray fluorescence spectrophotometer. A visual identification system is arranged above the belt conveying device through a support, a photoelectric sensor and a removing mechanism are arranged on the belt conveying device, an opening is formed in the position, provided with the removing mechanism, of the belt conveying device, and the opening end is connected with a waste sample groove through a sliding groove. The data transmission control computer is electrically connected with the visual identification system, the belt conveying device, the motor and the photoelectric sensor respectively; the device is convenient to use, low in cost, convenient to maintain, low in failure rate, high in applicability and capable of effectively controlling defective samples not to enter the X-ray fluorescence spectrophotometer and guaranteeing the accuracy of data analysis of the spectrophotometer and smooth operation of the equipment.

Description

Technical Field

[0001] The utility model relates to a device for detecting defects, in particular to a device for detecting defects of a sample of an X-ray fluorescence spectrometer, and belongs to the technical field of physical and chemical detection. Background Art

[0002] X-ray fluorescence spectrometer (XRF) is a non-destructive testing instrument that can quickly and accurately analyze the chemical composition of materials. It is widely used in the metallurgical industry. It can detect the chemical composition of materials and products in the steel plant production process in real time, providing reliable chemical analysis data for steel furnaces.

[0003] The samples tested by the X-ray fluorescence spectrometer are divided into lollipop-shaped (racket-shaped) steel samples and round and flat slag samples from blast furnaces / converters / refining furnaces. However, due to the manufacturing process errors of the sample sampler itself, the sampling level of the on-site employees of the steel plant, the purity and quality of the molten iron or steel, etc., the samples taken out are often accompanied by burrs, uneven sample surfaces, irregular sample sizes, and too many sample inclusions. The slag samples made by the fully automatic slag sampler will also be defective due to the abnormal operation of the slag sampler. In the past, manual visual sorting was usually used to identify such defective samples. This method is not only inefficient, but also causes identification errors due to employee fatigue, causing abnormal data analyzed by the X-ray fluorescence spectrometer, affecting on-site production, and even more directly causing damage to the X-ray fluorescence spectrometer.

[0004] At present, the patent CN110632110AX fluorescence spectrometer steel sample surface defect visual recognition device and method, through the steel sample that is about to enter and has completed the analysis and detection of the X-ray fluorescence spectrometer, the defect of the analysis surface is automatically identified, the steel sample with surface defects is eliminated, the defective sample is prevented from entering the X-ray fluorescence spectrometer for analysis and detection, and the error and abnormality of the analysis data are eliminated, so as to ensure that the chemical composition analysis and detection results of the molten iron sample correctly guide the smelting process before the steelmaking furnace; it can effectively solve the problem of accurate identification of sample analysis surface defects when the X-ray fluorescence spectrometer performs molten iron sample analysis and detection in an automatic unmanned state, ensure that the surface finish of the molten iron sample meets the analysis and detection requirements of the X-ray fluorescence spectrometer, and ensure that the chemical composition analysis and detection data results of the X-ray fluorescence spectrometer are accurate and reliable; however, the device of the patent adopts a clamping manipulator to eliminate defective products, the manipulator has a high price and cost, a high failure rate and is easy to damage, the system compatibility is poor, and it is more troublesome to repair. At the same time, it can only identify steel samples, and cannot identify slag samples, and has poor applicability.

[0005] Therefore, developing a device for detecting sample defects of an X-ray fluorescence spectrometer that can overcome the above defects has become a technical problem that needs to be solved urgently by those skilled in the art. Utility Model Content

[0006] The technical problem to be solved by the utility model is to overcome the shortcomings of the prior art and provide a device for detecting sample defects of an X-ray fluorescence spectrometer, which is easy to use, low in cost, easy to maintain, has a low failure rate, and is highly applicable. It can effectively control defective samples from entering the X-ray fluorescence spectrometer, thereby ensuring the accuracy of the X-ray fluorescence spectrometer analysis data and the smooth operation of the equipment.

[0007] In order to solve the above technical problems, the utility model provides a device for detecting sample defects of an X-ray fluorescence spectrometer, comprising an X-ray fluorescence spectrometer, a belt conveyor, a sample machine, a rejection mechanism, a visual recognition system, a bracket, a photoelectric sensor, a waste sample tank, a data transmission control computer and a host computer, a belt conveyor is provided between the sample machine and the X-ray fluorescence spectrometer, a visual recognition system is provided above the belt conveyor through the bracket, a photoelectric sensor is provided on the belt conveyor between the bracket and the sample machine, a rejection mechanism is provided on the belt conveyor between the bracket and the X-ray fluorescence spectrometer, an opening is provided at the position where the rejection mechanism is provided on the belt conveyor, and the opening is connected to the waste sample tank through a slide slot, wherein:

[0008] The sample machine includes a fully automatic milling machine and a fully automatic slag sample machine arranged on the same side, and the waste sample tank includes a steel sample waste sample tank and a slag sample waste sample tank;

[0009] Two belt conveyors are provided, including a first belt conveyor and a second belt conveyor. One end of the first belt conveyor is located at the outlet of the fully automatic milling machine, and the other end is located at the inlet of the X-ray fluorescence spectrometer. An opening is provided on the outer side of the first belt conveyor, and a rejection mechanism is provided at the opening. The opening is connected to a waste sample tank for steel samples. One end of the second belt conveyor is located at the outlet of the fully automatic slag sample machine, and the other end is located at the inlet of the X-ray fluorescence spectrometer. An opening is provided on the outer side of the second belt conveyor, and a rejection mechanism is provided at the opening. The opening is connected to a waste sample tank for slag samples.

[0010] The rejection mechanism includes a shaft rod and a stop rod, the shaft rod is arranged at the connection between the slide slot and the belt conveyor, the stop rod is arranged on the shaft rod, the stop rod is parallel to the belt conveyor in the closed state, and in the working state, the stop rod moves in the opposite direction to the moving direction of the belt on the belt conveyor under the rotation of the shaft rod until the stop rod is perpendicular to the belt conveyor;

[0011] The data transmission control computer is electrically connected to the visual recognition system, the belt transmission device, the motor, and the photoelectric sensor respectively, and the data transmission control computer is electrically connected to the host computer.

[0012] The technical solution further defined in the utility model is:

[0013] Furthermore, in the aforementioned device for detecting defects in X-ray fluorescence spectrometer samples, the chute is arranged at an angle, one end of the chute on the first belt conveyor is connected to the first belt conveyor, and the other end is connected to the steel sample waste trough, and one end of the steel sample waste trough on the chute is lower than one end of the first belt conveyor.

[0014] Technical effect: The utility model is provided with two belt conveyors and two waste sample troughs. The waste sample troughs for steel samples are provided corresponding to the fully automatic milling machine, so as to collect similar defective products and facilitate recycling. The inclined setting of the chute utilizes the weight of the sample to facilitate the defective sample to reach the corresponding waste sample trough smoothly, without the need for manual or conveyor belt transportation, thereby reducing costs.

[0015] In the aforementioned device for detecting sample defects of an X-ray fluorescence spectrometer, a motor is provided at the lower end of the shaft, and the motor controls the shaft to drive the rotation of the blocking rod.

[0016] In the aforementioned device for detecting defects in X-ray fluorescence spectrometer samples, the bracket includes a platform and legs extending vertically downward at both ends of the platform, the legs of the bracket are vertically arranged on the ground, the platform is parallel to the ground, the bracket is located above the two belt conveyor devices, and the bottom end of the platform is directly opposite to the first belt conveyor device and the second belt conveyor device. Visual recognition systems are respectively provided at the position.

[0017] Technical effect: The utility model sets the visual recognition system just above the belt conveyor through a bracket, which is convenient for identifying the sample, has a better angle, and can meet the simultaneous identification of two samples. It has good applicability, high efficiency, and more convenient and accurate identification.

[0018] In the aforementioned device for detecting defects in X-ray fluorescence spectrometer samples, visual recognition positions are fixed on the first belt conveyor and the second belt conveyor corresponding to the visual recognition system, and photoelectric sensors are provided on both sides of the visual recognition positions on the first belt conveyor and the second belt conveyor.

[0019] In the aforementioned device for detecting sample defects of an X-ray fluorescence spectrometer, the photoelectric sensor is perpendicular to the belt on the corresponding belt conveyor.

[0020] Technical effect: the photoelectric sensor is set perpendicular to the belt, which provides a clear view and is also easy to maintain and service.

[0021] In the aforementioned device for detecting sample defects of an X-ray fluorescence spectrometer, the shaft rod is arranged at the connection between the slide slot and the belt conveyor, and the shaft rod is located between the slide slot and the X-ray fluorescence spectrometer.

[0022] Technical effect: if it is set at another connection, the baffle cannot kick out the defective products smoothly when it moves. Only when it is set at the lower mouth in the direction of belt conveyor can it be successfully removed to ensure the normal operation of the work.

[0023] In the aforementioned device for detecting defects in X-ray fluorescence spectrometer samples, the visual recognition system includes a visual image recognition camera, an illumination lamp and a visual image recognition processor. The visual image recognition camera is arranged at the bottom end of the platform directly above the belt conveyor device. Illuminations are respectively provided on both sides of each visual image recognition camera. The visual image recognition camera is electrically connected to the visual image recognition processor, and the visual image recognition processor and the illumination lamp are electrically connected to the data transmission control computer.

[0024] In the aforementioned device for detecting defects of X-ray fluorescence spectrometer samples, the X-ray fluorescence spectrometer is connected to an X-ray fluorescence spectrometer analysis control computer via a bus, and the X-ray fluorescence spectrometer analysis control computer is electrically connected to a data transmission control computer.

[0025] The beneficial effects of the utility model are:

[0026] The rejection mechanism of the utility model is a simple mechanization. Compared with robots, manipulators have higher cost performance, better system compatibility, lower failure rate, and are more conducive to maintenance. Moreover, the utility model can be used not only to identify molten iron samples, but also to identify slag samples, with strong adaptability and high efficiency.

[0027] The utility model adopts existing mature technology, has low procurement cost, high system automation, saves a lot of labor and improves work efficiency.

[0028] The utility model sets up a visual recognition system and uses a programmable controller as the main control of the equipment, which can effectively control defective samples from entering the X-ray fluorescence spectrometer, thereby ensuring the accuracy of the X-ray fluorescence spectrometer analysis data and the smooth operation of the equipment. The whole system adopts existing mature technology, has low procurement costs, and a high degree of system automation, which saves a lot of labor and improves work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 This is a schematic diagram of the structure of a device for detecting sample defects of an X-ray fluorescence spectrometer according to an embodiment of the utility model;

[0030] Figure 2 for Figure 1 The enlarged structural diagram of the rejection mechanism part;

[0031] Figure 3 for Figure 1 A schematic diagram of the enlarged structure of the middle bracket part;

[0032] In the figure: 1-X-ray fluorescence spectrometer, 2-belt conveyor, 21-first belt conveyor, 22-second belt conveyor, 3-visual recognition system, 4-bracket, 5-photoelectric sensor, 6-opening, 7-chute, 8-fully automatic milling machine, 9-fully automatic slag sample machine, 10-steel sample waste trough, 11-slag sample waste trough, 12-axis rod, 13-blocking rod. DETAILED DESCRIPTION

[0033] The present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the relevant utility model, rather than to limit the utility model. It is also necessary to explain that, for ease of description, only the parts related to the utility model are shown in the accompanying drawings. Example 1

[0034] This embodiment provides a device for detecting defects in an X-ray fluorescence spectrometer sample, the structure of which is as follows: Figure 1-3 As shown, it includes an X-ray fluorescence spectrometer 1, a belt conveyor 2, a sample machine, a rejection mechanism, a visual recognition system 3, a bracket 4, a photoelectric sensor 5, a waste sample tank and a data transmission control computer. A belt conveyor 2 is provided between the sample machine and the X-ray fluorescence spectrometer 1. A visual recognition system 3 is provided above the belt conveyor 2 through the bracket 4. A photoelectric sensor 5 is provided on the belt conveyor 2 between the bracket 4 and the sample machine. A rejection mechanism is provided on the belt conveyor 2 between the bracket 4 and the X-ray fluorescence spectrometer 1. An opening 6 is provided at the position where the rejection mechanism is provided on the belt conveyor 2. The opening is connected to the waste sample tank through a slide slot 7, wherein:

[0035] The sample machine includes a fully automatic milling machine 8 and a fully automatic slag sample machine 9 arranged on the same side, and the waste sample tank includes a steel sample waste sample tank 10 and a slag sample waste sample tank 11;

[0036] The belt conveyor 2 is provided with two first belt conveyors 21 and second belt conveyors 22 which are arranged in parallel. One end of the first belt conveyor 21 is located at the outlet of the fully automatic milling machine 8, and the other end is located at the inlet of the X-ray fluorescence spectrometer 1. An opening 6 is provided on the outer side of the first belt conveyor 21, and a rejection mechanism is provided at the opening. The opening is connected to a waste steel sample tank 10. One end of the second belt conveyor 22 is located at the outlet of the fully automatic slag sample machine 9, and the other end is located at the inlet of the X-ray fluorescence spectrometer 1. An opening 6 is provided on the outer side of the second belt conveyor 22, and a rejection mechanism is provided at the opening. The opening is connected to a waste slag sample tank 11.

[0037] The rejection mechanism includes a shaft rod 12 and a blocking rod 13. The shaft rod 12 is arranged at the connection between the slide slot 7 and the belt conveyor 2. The blocking rod 13 is arranged on the shaft rod 12. A motor is arranged at the lower end of the shaft rod 12. The motor controls the shaft rod 12 to drive the blocking rod 13 to rotate. When the rejection mechanism is closed, the blocking rod 13 is parallel to the belt in the belt conveyor 2. In the working state, the blocking rod 13 moves in the opposite direction to the conveying direction of the belt on the belt conveyor 2 under the rotation of the shaft rod 12 until the blocking rod 13 is perpendicular to the belt conveyor 2 to transfer the unqualified samples into the corresponding waste sample slot for rejection.

[0038] The data transmission control computer is electrically connected to the visual recognition system 3, the belt conveyor 2, the motor, and the photoelectric sensor 5 respectively, and the data transmission control computer is electrically connected to the host computer.

[0039] In this embodiment, the chute 7 is arranged at an angle, one end of the chute 7 on the first belt conveyor 21 is connected to the first belt conveyor 21, and the other end is connected to the steel sample waste trough 10, and one end of the steel sample waste trough 10 on the chute 7 is lower than one end of the first belt conveyor 21.

[0040] In this embodiment, the bracket 4 includes a platform and legs extending vertically downward at both ends of the platform. The legs of the bracket 4 are vertically arranged on the ground, and the platform is parallel to the ground. The bracket 4 is located above the two belt conveyor devices 2. The bottom end of the platform is opposite to the first belt conveyor device 21 and the second belt conveyor device 22, and a visual recognition system 3 is provided respectively.

[0041] In this embodiment, visual recognition positions are fixed on the first belt conveyor 21 and the second belt conveyor 22 corresponding to the visual recognition system 3 , and photoelectric sensors 5 are provided on both sides of the visual recognition positions on the first belt conveyor 21 and the second belt conveyor 22 .

[0042] In this embodiment, the photoelectric sensor 5 is perpendicular to the belt on the corresponding belt conveyor 2 .

[0043] In this embodiment, the shaft rod 12 is disposed at the connection between the slide slot 7 and the belt conveyor 2 , and the shaft rod is located between the slide slot and the X-ray fluorescence spectrometer 1 .

[0044] In this embodiment, the visual recognition system 3 includes a visual image recognition camera, a lighting lamp and a visual image recognition processor. The visual image recognition camera is arranged at the bottom end of the platform directly above the belt conveyor 2. Lights are provided on both sides of each visual image recognition camera. The visual image recognition camera is electrically connected to the visual image recognition processor, and the visual image recognition processor and the lighting lamp are electrically connected to the data transmission control computer.

[0045] In this embodiment, the X-ray fluorescence spectrometer is connected to the X-ray fluorescence spectrometer analysis control computer via the RS232 bus, the X-ray fluorescence spectrometer analysis control computer is electrically connected to the data transmission control computer, and the data transmission control computer communicates with the fully automatic X-ray fluorescence spectrometer analysis control computer via the TCP / IP protocol.

[0046] In this embodiment, the components of the utility model are all components of the prior art, and the data transmission control computer transmits the obtained signal to the host computer, and the host computer controls the electrical system.

[0047] When implementing:

[0048] (1) After the steel racket-shaped sample is milled by the fully automatic milling machine 8, it is transported to the visual recognition position of the visual recognition system 3 through the first belt conveyor 21. After the photoelectric sensor 5 captures the signal, the first belt conveyor 21 stops moving, and the steel racket-shaped sample stops at the visual recognition system 3 detection position, waiting for detection. After the visual recognition system 3 completes the detection, the obtained parameters are transmitted to the host computer through the data transmission control computer. The host computer analyzes and determines whether the surface finish of the steel racket-shaped sample meets the requirements set by the X-ray fluorescence spectrometer 1. If it meets the requirements, the first belt conveyor 21 moves, and the steel racket-shaped sample is transported by the first belt conveyor 21 to the X-ray fluorescence spectrometer 1 for analysis. If the surface finish of the steel racket-shaped sample does not meet the requirements set by the X-ray fluorescence spectrometer 1, the shaft 12 drives the blocking rod 13 to rotate 90 degrees to prevent the steel racket-shaped sample from entering the X-ray fluorescence spectrometer 1. Under the action of the movement of the first belt conveyor 21 and the blocking rod 13 , the steel racket-shaped sample is changed in conveying direction and is conveyed to the steel sample waste tank 10 .

[0049] (2) After the slag sample is pressed by the fully automatic slag sample machine 9, it is transported to the detection position of the visual recognition system 3 by the second belt conveyor 22. After the signal is captured by the photoelectric sensor 5, the second belt conveyor 22 stops moving, and the slag sample stops at the detection position of the visual recognition system 3 and waits for detection. After the visual recognition system 3 completes the detection, the obtained parameters are transmitted to the processor, and the processor analyzes and determines whether the surface finish of the slag sample meets the requirements set by the X-ray fluorescence spectrometer 1. If it meets the requirements, the second belt conveyor 22 moves, and the slag sample is transported by the second belt conveyor 22 to the X-ray fluorescence spectrometer 1 for analysis. If the surface finish of the slag sample does not meet the requirements set by the X-ray fluorescence spectrometer 1, the shaft 12 drives the blocking rod 13 to rotate 90 degrees to prevent the slag sample from entering the X-ray fluorescence spectrometer 1. The second belt conveyor 22 moves, and the slag sample is changed in the direction of conveyance and is transported to the slag sample waste tank 11.

[0050] The utility model can overcome the existing defects and provide a device for detecting sample defects of an X-ray fluorescence spectrometer. The design adopts existing mature technology, has low procurement cost, high system automation, saves a lot of labor and improves work efficiency.

[0051] In addition to the above embodiments, the present invention may also have other implementations. Any technical solution formed by equivalent replacement or equivalent transformation falls within the protection scope required by the present invention.

Claims

1. A device for detecting sample defects of an X-ray fluorescence spectrometer, characterized in that: The invention comprises an X-ray fluorescence spectrometer (1), a belt conveyor (2), a sample machine, a rejection mechanism, a visual recognition system (3), a bracket (4), a photoelectric sensor (5), a waste sample tank, a data transmission control computer and a host computer, wherein the belt conveyor (2) is arranged between the sample machine and the X-ray fluorescence spectrometer (1), the visual recognition system (3) is arranged above the belt conveyor (2) through the bracket (4), the photoelectric sensor (5) is arranged on the belt conveyor (2) between the bracket (4) and the sample machine, and the photoelectric sensor (5) is arranged on the belt conveyor (2) between the bracket (4) and the X-ray fluorescence spectrometer. A rejection mechanism is provided between the spectrometer (1); an opening (6) is provided at the position where the rejection mechanism is provided on the belt conveyor (2); the opening is connected to the waste sample trough through a slide groove (7), wherein: the sample machine includes a fully automatic milling machine (8) and a fully automatic slag sample machine (9) arranged on the same side; the waste sample trough includes a steel sample waste sample trough (10) and a slag sample waste sample trough (11); the belt conveyor (2) is provided with two first belt conveyor devices (21) and a second belt conveyor device (22); one end of the first belt conveyor device (21) is located at the exit of the fully automatic milling machine (8), and the other end is located at the exit of the X-ray fluorescence spectrometer The first belt conveyor (21) is located at the inlet of the instrument (1), the outer side of the first belt conveyor (21) is provided with an opening (6), the opening is provided with the rejection mechanism, and the opening is connected to the steel sample waste sample tank (10); one end of the second belt conveyor (22) is located at the outlet of the fully automatic slag sample machine (9), and the other end is located at the inlet of the X-ray fluorescence spectrometer (1); the outer side of the second belt conveyor (22) is provided with an opening (6), the opening is provided with the rejection mechanism, and the opening is connected to the slag sample waste sample tank (11); the rejection mechanism comprises a shaft rod (12) and a stop rod (13), the shaft rod (12) is arranged at the At the connection between the slide groove (7) and the belt conveyor (2), a blocking rod (13) is arranged on the shaft (12); when the rejection mechanism is closed, the blocking rod (13) is parallel to the belt conveyor (2); when the blocking rod (13) is in a working state, the blocking rod (13) moves in a direction opposite to the conveying direction of the belt on the belt conveyor (2) under the rotation of the shaft (12) until the blocking rod (13) is perpendicular to the belt conveyor (2); the data transmission control computer is electrically connected to the visual recognition system (3), the belt conveyor (2), the motor, and the photoelectric sensor (5), respectively, and the data transmission control computer is electrically connected to the host computer.

2. The device for detecting sample defects of an X-ray fluorescence spectrometer according to claim 1, characterized in that: The slide chute (7) is arranged at an angle, one end of the slide chute (7) on the first belt conveyor (21) is connected to the first belt conveyor (21), and the other end is connected to the steel sample waste trough (10), and one end of the steel sample waste trough (10) on the slide chute (7) is lower than one end of the first belt conveyor (21).

3. The device for detecting sample defects of an X-ray fluorescence spectrometer according to claim 1, characterized in that: A motor is provided at the lower end of the shaft rod (12), and the motor controls the shaft rod (12) to drive the blocking rod (13) to rotate.

4. The device for detecting sample defects of an X-ray fluorescence spectrometer according to claim 1, characterized in that: The support (4) comprises a platform and legs extending vertically downward at both ends of the platform, the legs of the support (4) are arranged vertically on the ground, the platform is parallel to the ground, the support (4) is located above the two belt conveyor devices (2), and the visual recognition system (3) is respectively arranged at the bottom end of the platform facing the first belt conveyor device (21) and the second belt conveyor device (22).

5. The device for detecting defects of X-ray fluorescence spectrometer samples according to claim 1, characterized in that: A visual recognition position corresponding to the visual recognition system (3) is fixed on the first belt conveyor (21) and the second belt conveyor (22), and the photoelectric sensors (5) are provided on both sides of the visual recognition position on the first belt conveyor (21) and the second belt conveyor (22).

6. The device for detecting defects in X-ray fluorescence spectrometer samples according to claim 1, characterized in that: The photoelectric sensor (5) is perpendicular to the belt on the corresponding belt conveyor (2).

7. The device for detecting sample defects of an X-ray fluorescence spectrometer according to claim 1, characterized in that: The shaft rod (12) is arranged at the connection between the slide groove (7) and the belt conveyor (2), and the shaft rod is located between the slide groove and the X-ray fluorescence spectrometer (1).

8. The device for detecting defects in X-ray fluorescence spectrometer samples according to claim 4, characterized in that: The visual recognition system (3) comprises a visual image recognition camera, an illumination lamp and a visual image recognition processor. The visual image recognition camera is arranged at the bottom end of the platform and directly above the belt conveyor (2). The illumination lamps are respectively arranged on both sides of each visual image recognition camera. The visual image recognition camera is electrically connected to the visual image recognition processor. The visual image recognition processor and the illumination lamp are electrically connected to the data transmission control computer.

9. The device for detecting sample defects of an X-ray fluorescence spectrometer according to claim 1, characterized in that: The X-ray fluorescence spectrometer is connected to an X-ray fluorescence spectrometer analysis control computer via a bus, and the X-ray fluorescence spectrometer analysis control computer is electrically connected to the data transmission control computer.

Images