Test fixture

Abstract

The utility model discloses a test fixture. The test fixture comprises a supporting seat; the carrying table is movably connected with the supporting seat through an elastic piece and is provided with a bearing area for bearing at least one product to be tested; the carrying platform is provided with a through hole which is located in the bearing area. The bracket is connected with the supporting seat; the driving mechanism is connected with the bracket; the pressing plate is connected with the driving mechanism and is used for moving towards or away from the carrying table under the driving of the driving mechanism; part of the projection of the pressing plate on the surface, deviating from the supporting seat, of the carrying table is located on the periphery of the bearing area; the at least one probe is connected with the supporting seat and is arranged corresponding to the through hole; when the test fixture is in a working state and the driving mechanism drives the pressing plate to move towards the carrying platform, the carrying platform and the to-be-tested product carried by the carrying platform can be driven to move towards the probe until the probe extends out of the through hole and is matched with the to-be-tested product. The test efficiency can be improved, and the labor cost can be reduced.

Description

Technical Field

[0001] The present application relates to the technical field of electronic product testing, and in particular to a testing fixture. Background Art

[0002] Functional or performance testing of electronic product hardware (such as circuit boards, display screens, etc.) is an important part of electronic product quality control.

[0003] In the related art, when testing the hardware of electronic products, manual testing is usually required, for example, manually electrically connecting the electronic products to be tested to external devices. In some large-scale product testing scenarios, it is even necessary to manually temporarily weld external leads to electrically connect the electronic products to an external power supply to achieve batch power-on, resulting in low testing efficiency. Utility Model Content

[0004] The present application aims to provide a test fixture that can solve related technical problems to a certain extent, improve test efficiency and reduce labor costs.

[0005] To achieve the above-mentioned purpose, the test fixture provided by the embodiment of the present application includes: a support seat; a carrier, which is movably connected to the support seat through an elastic member, and the carrier has a bearing area for bearing at least one product to be tested; the carrier is provided with a through hole, and the through hole is located in the bearing area; a bracket, which is connected to the support seat; a driving mechanism, which is connected to the bracket; a pressure plate, which is connected to the driving mechanism, and the pressure plate is used to move toward or away from the carrier under the drive of the driving mechanism; the projection of the pressure plate on the surface of the carrier away from the support seat is partially located on the periphery of the bearing area; a probe, which is connected to the support seat, and the probe has at least one, and the probe is arranged corresponding to the through hole; wherein, when the test fixture is in a working state, when the driving mechanism drives the pressure plate to move toward the carrier, it can drive the carrier and the product to be tested carried by it to move toward the probe until the probe extends out of the through hole and cooperates with the product to be tested.

[0006] In some embodiments, the pressing plate is provided with an observation area, the observation area corresponds to the bearing area, and the observation area is used for viewing the product to be tested.

[0007] In some embodiments, the aforementioned pressing plate includes: a connecting portion and a pressing portion made of a transparent material, the connecting portion is connected to the driving mechanism, the pressing portion is arranged corresponding to the platform, and the area corresponding to the pressing portion and the bearing area forms an observation area.

[0008] In some embodiments, the pressing plate is provided with a window corresponding to the carrying area, and the area of ​​the pressing plate provided with the window forms an observation area.

[0009] In some embodiments, the test fixture further includes: a limiter connected to the bracket, and the limiter is used to limit the extreme position of the pressing plate moving toward the carrier.

[0010] In some embodiments, the limiting member includes: a limiting sleeve; the driving mechanism includes: a toggle clamp and a connecting rod, the connecting rod is connected between the toggle clamp and the pressure plate, the connecting rod is passed through the limiting sleeve, and the toggle clamp drives the pressure plate to move toward the carrier to the extreme position through the connecting rod so as to be able to counteract the limiting sleeve.

[0011] In some embodiments, the test fixture further includes: a guide mechanism, the guide mechanism is connected to the bracket, and the guide mechanism is also connected to the pressing plate to guide the pressing plate to move along the height direction of the test fixture.

[0012] In some embodiments, the bracket includes: a first vertical plate and a second vertical plate, the first vertical plate has at least one, the first vertical plate is connected to the support seat, the first vertical plate is connected to the second vertical plate, and the first vertical plate is located on the side of the second vertical plate away from the platform; there is a gap between the second vertical plate and the support seat, and the gap between the second vertical plate and the support seat is used for a pressure plate to pass through; the guide mechanism includes: a guide rod and a guide sleeve, the guide rod extends along the height direction of the test fixture, the guide rod is inserted into the guide sleeve, the guide sleeve is located on the side of the second vertical plate away from the platform, and the guide sleeve is connected to the first vertical plate and / or the second vertical plate; the guide rod is connected to the pressure plate; or, the guide rod is connected to the support seat, and the pressure plate is provided with a sliding hole, and the guide rod is inserted into the sliding hole.

[0013] In some embodiments, the carrier is provided with an anti-foolproof portion, which is used to mark the placement position of the product to be tested; the anti-foolproof portion includes: an anti-foolproof groove and / or an anti-foolproof protrusion.

[0014] In some embodiments, the carrier is provided with a receiving groove for receiving the product to be tested, the receiving groove is located in the bearing area, there is at least one receiving groove, the shape of the receiving groove is adapted to the shape of the product to be tested, and the receiving groove is connected to the through hole.

[0015] In some embodiments, the support seat includes: a seat body having a receiving space, an opening being provided at one end of the seat body; a cover plate being provided at the opening, the cover plate being movably connected to the seat body so as to be able to open or close the receiving space; the cover plate being movably connected to the carrier through an elastic member; the probe having a connecting head and a terminal, and the connecting head being connected to the terminal through a spring; wherein at least a portion of the terminal is located on a side of the cover plate facing away from the carrier.

[0016] In some embodiments, there are multiple elastic members, wherein at least two elastic members are symmetrically distributed about the center of the carrier.

[0017] The test fixture provided in the present embodiment, through the above-mentioned setting, when testing the product to be tested, the product to be tested is placed on the carrier platform of the carrier, so that the contact point of the product to be tested corresponds to the probe, and the driving mechanism can drive the product to be tested and the probe to cooperate reliably through the pressure plate to electrically connect the product to be tested with the external device. In the above process, manual participation is reduced or even unnecessary, and it is convenient to test multiple products to be tested at the same time, thereby improving test efficiency and reducing labor costs.

[0018] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 is a schematic diagram of the three-dimensional structure of a test fixture provided by an exemplary embodiment when it is in a non-working state;

[0020] Figure 2 It is a schematic diagram of the three-dimensional structure of the probe and the carrier when the test fixture provided by an exemplary embodiment is in a working state;

[0021] Figure 3 It is a schematic diagram of the relative positions of the carrier and the probe when the test fixture provided by an exemplary embodiment is in a non-working state;

[0022] Figure 4 It is a schematic diagram of the relative positions of a carrier and a probe when a test fixture provided by an exemplary embodiment is in a working state;

[0023] Figure 5 is a schematic diagram of a three-dimensional structure of a test fixture provided by an exemplary embodiment when it is in a working state;

[0024] Figure 6 It is a relative schematic diagram of a pressing plate and a carrier when a test fixture provided by an exemplary embodiment is in a working state;

[0025] Figure 7 is a front view of a test fixture provided by an exemplary embodiment when it is in a non-working state;

[0026] Figure 8 is a rear view of a test fixture provided by an exemplary embodiment when it is in a non-working state;

[0027] Fig. 9 It is a structural schematic diagram of a test fixture provided by an exemplary embodiment, which is provided with a plurality of receiving slots;

[0028] Fig.10 It is a structural schematic diagram of a foolproof part in a test fixture provided by an exemplary embodiment;

[0029] Fig.11 It is a structural schematic diagram of a test fixture provided by an exemplary embodiment when the receiving space of the support seat is opened.

[0030] Explanation of the reference numerals: 10-support seat; 10a-accommodating space; 11-seat body; 12-cover plate; 20-carrier; 21-carrying area; 21a-accommodating groove; 22-through hole; 23-elastic member; 24-foolproofing portion; 24a-foolproofing protrusion; 30-bracket; 31-first vertical plate; 32-second vertical plate; 40-driving mechanism; 41-elbow clamp; 411-handle; 42-connecting rod; 50-pressing plate; 50a-observation area; 51-connecting portion; 52-pressing portion; 60-probe; 61-connecting head; 62-terminal; 70-limiting member; 71-limiting sleeve; 80-guide mechanism; 81-guide sleeve; 82-guide rod. DETAILED DESCRIPTION

[0031] Embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limiting the present application.

[0032] The structure, function and implementation process of the test fixture of the embodiment of the present application are illustrated below with reference to the accompanying drawings.

[0033] Please refer to Figures 1 to 5 The test fixture provided in the embodiment of the present application includes: a support base 10; a carrier 20, which is movably connected to the support base 10 through an elastic member 23, and the carrier 20 has a carrying area 21 for carrying at least one product to be tested; the carrier 20 is provided with a through hole 22, and the through hole 22 is located in the carrying area 21; a bracket 30, the bracket 30 is connected to the support base 10; a driving mechanism 40, the driving mechanism 40 is connected to the bracket 30; a pressing plate 50, the pressing plate 50 is connected to the driving mechanism 40, and the pressing plate 50 is used to move toward or away from the carrier 20 under the drive of the driving mechanism 40; a probe 60, the probe 60 is connected to the support base 10, the probe 60 has at least one, and the probe 60 is arranged corresponding to the through hole 22.

[0034] When the test fixture is in working state, the driving mechanism 40 is used to drive the pressure plate 50 to move toward the carrier 20, so as to press the carrier 20 and the product to be tested carried by it to move toward the probe 60 until the probe 60 extends out of the through hole 22 and contacts the product to be tested.

[0035] For ease of description, the height direction of the test fixture is taken as the up-down direction, one of the directions perpendicular to the up-down direction is taken as the left-right direction, and the direction perpendicular to the up-down direction and the left-right direction is taken as the front-back direction.

[0036] The support base 10 is used to support the test fixture on the work surface. The support base 10 can have a relatively large size and weight to ensure the stability of the test fixture. Exemplarily, the support base 10 can be a plate with a preset thickness, or a box with a preset height. The projection of the support base 10 on the horizontal plane can have a rectangular, elliptical, circular or other shape.

[0037] The upper surface of the support seat 10 is provided with a bracket 30, and the bracket 30 can be connected to the support seat 10 by a detachable connection method such as bolt connection or clamping, or by a connection method such as welding, or of course, the bracket 30 can also be provided integrally with the support seat 10 by an integrated molding process. Optionally, the bracket 30 can be provided close to the rear edge of the support seat 10. For example, the rear side of the bracket 30 and the rear side of the support seat 10 can be flush, that is, the projection of the rear edge of the bracket 30 on the horizontal plane coincides with the projection of the rear edge of the support seat 10 on the horizontal plane. In other embodiments, there can also be a preset spacing between the rear side of the bracket 30 and the rear side of the support seat 10, but it is best that the rear side of the bracket 30 does not protrude from the rear side of the support seat 10.

[0038] A driving mechanism 40 is mounted on the bracket 30, and a pressure plate 50 is provided at the output end of the driving mechanism 40, and the driving mechanism 40 can drive the pressure plate 50 to reciprocate in the up and down directions. In some examples, in order to improve the automation of the test fixture, the driving mechanism 40 can be automatically driven. For example, the driving motor 40 may include: a driving member such as a linear motor or a hydraulic cylinder that can output linear motion; or, the driving mechanism 40 may include: a motor and a transmission assembly, and the transmission assembly can convert the rotational motion output by the motor into linear motion. In other examples, in order to reduce the cost of the test fixture, the driving mechanism may also be manually driven. For example, the driving mechanism may include a toggle clamp 41.

[0039] The support seat 10 is also connected to a carrier 20. The carrier 20 is located below the pressure plate 50. When the test fixture is in a non-working state, there may be a preset spacing between the carrier 20 and the support seat 10, and there is also a preset distance between the carrier 20 and the pressure plate 50. The carrier 20 is used to carry the product to be tested, wherein the product to be tested may be a finished product or a semi-finished product of an electronic component, or an assembly consisting of at least two electronic components. Exemplarily, the carrier 20 has a carrying area 21, and the carrying area 21 can be used to place at least one product to be tested. The shape and size of the carrying area 21 can be set according to actual needs. When it is necessary to adapt to the scenario of mass testing, the carrying area 21 can be relatively large so that multiple products to be tested can be placed at the same time, which is convenient for mass testing.

[0040] like Figure 3As shown, the carrier 20 is connected to the support base 10 through an elastic member 23. The elastic member 23 can be extended and retracted in the up and down directions. By providing the elastic member 23, the elastic member 23 can play a buffering role when the carrier 20 moves downward with the pressing plate 50, and after the test is completed, when the driving mechanism 40 drives the pressing plate 50 to move upward, the carrier 20 can be reset under the action of the elastic member 23.

[0041] In some examples, there are multiple elastic members 23, and the arrangement of the elastic members 23 is based on ensuring that the carrier 20 can move smoothly. For example, among the multiple elastic members 23, at least two elastic members 23 are symmetrically distributed about the center of the carrier 20. For example, the carrier 20 can be rectangular, and there can be four elastic members 23, and the four elastic members 23 can be respectively arranged near the four corners of the carrier 20.

[0042] Optionally, the elastic member 23 may include a spring. A mounting post may be connected to the lower surface of the carrier 20, and the spring may be sleeved on the mounting post and disposed between the carrier 20 and the support seat 10. The support seat 10 is provided with a matching hole that slidably cooperates with the mounting post. When the carrier 20 moves up and down relative to the support seat 10, the mounting post can slide in the matching hole. In this way, not only can the spring be ensured to be extended and retracted in the up and down directions, but the cooperation between the mounting post and the matching hole can also guide the movement of the carrier 20, thereby preventing the carrier 20 from being displaced in the horizontal direction relative to the support seat 10 and affecting the cooperation and contact between the product to be tested and the probe 60. In other examples, the elastic member 23 may include: a rubber column or other components made of elastic material.

[0043] like Figures 2 to 3 As shown, a probe 60 is also installed on the support seat 10. The probe 60 is used to cooperate with the corresponding contact point of the product to be tested to electrically connect the product to be tested with an external device. The specific type of the probe 60 can be selected or replaced according to actual needs. For example, the probe 60 can be a flat-head probe for large-area contact, or a multi-pin needle that can contact the pins of components on the circuit board. The probe 60 is arranged corresponding to the through hole 22 opened on the carrier 20.

[0044] Generally speaking, there are multiple probes 60, and correspondingly, there may also be multiple through holes 22, and the multiple through holes 22 correspond to the multiple probes 60 respectively, and the diameter of the through holes 22 may be slightly larger than the diameter of the probes 60. In other examples, the number of through holes 22 may be less than the number of probes 60, for example, probes 60 with similar distances may correspond to a through hole 22 with a larger size.

[0045] like Figure 1 and Figure 3As shown, when the test fixture is in a non-working state, the top of the probe 60 is lower than the top of the through hole 22 to prevent the probe 60 from being damaged by factors such as being accidentally touched. Exemplarily, the probe 60 may be partially inserted into the through hole 22, and there is a gap between the top of the probe 60 and the top of the through hole 22; or, the probe 60 is located below the carrier 20. In other examples, when the test fixture is in a non-working state, the top of the probe 60 may also be flush with the top of the through hole 22.

[0046] Optionally, the probe 60 can be detachably connected to the support seat 10 to facilitate the replacement of the type of the probe 60. Exemplarily, the probe 60 can be connected to a mounting seat, and the mounting seat is fastened to the support seat 10 through a plurality of fasteners. Among them, each probe 60 can be detachably connected to the support seat 10 through its corresponding mounting seat, or the probes 60 with similar distances can be detachably connected to the support seat 10 through one mounting seat. Different types of probes 60 can be respectively configured with corresponding mounting seats, and each mounting seat can be fastened to the support seat 10 through a plurality of fasteners.

[0047] like Figure 4 and Figure 5 As shown, when the test fixture is in working state, the driving mechanism 40 drives the pressure plate 50 to move downward until the pressure plate 50 contacts the carrier 20; the driving mechanism 40 continues to provide driving force to drive the carrier 20 and the product to be tested carried by it to continue to move downward through the pressure plate 50 to overcome the force of the elastic member 23, and at the same time, the probe 60 moves upward relative to the through hole 22 on the carrier 20 until the probe 60 extends out of the through hole 22 and contacts with the product to be tested.

[0048] After the test is completed, the driving mechanism 40 drives the pressing plate 50 to move upward; during the upward movement of the pressing plate 50, the carrier 20 will be reset upward under the action of the elastic potential energy of the elastic member 23; after the carrier 20 is reset, the top of the probe 60 is lower than the top of the through hole 22. After the driving mechanism 40 drives the pressing plate 50 to move upward to the initial position of the pressing plate 50, the product to be tested can be removed from the carrier 20, and the test fixture is in a non-working state.

[0049] The test fixture provided in this embodiment, through the above-mentioned setting, when testing the product to be tested, first place the product to be tested in the bearing area 21 of the carrier 20, so that the contact point of the product to be tested corresponds to the probe 60, and then the driving mechanism 40 drives the product to be tested to cooperate with the probe 60 reliably through the pressure plate 50, so as to electrically connect the product to be tested with the external device, and prepare for the next step of the real test. In the above process, manual participation is reduced, or even unnecessary, which is convenient for accurate and efficient testing, and multiple products to be tested can be tested at the same time, thereby improving test efficiency and reducing labor costs.

[0050] Please refer to Figure 6 , and continue to refer to Figure 5 In some embodiments, the projection of the pressing plate 50 on the upper surface of the carrier 20 partially extends beyond the projection of the bearing area 21 on the surface, so that when the driving mechanism 40 drives the pressing plate 50 to move downward, the pressing plate 50 fully contacts the carrier 20 and drives the carrier 20 and the product to be tested to move downward, thereby preventing the pressing plate 50 from directly contacting the product to be tested and causing damage to the product to be tested.

[0051] Exemplarily, along the left-right direction, the size of the projection of the pressing plate 50 on the upper surface of the support seat 10 is larger than the size of the projection of the bearing area 21 on the surface, and the projection of the pressing plate 50 on the upper surface of the support seat 10 can cover the left edge portion and the right edge portion of the projection of the bearing area 21 on the surface. And / or, along the front-back direction, the size of the projection of the pressing plate 50 on the upper surface of the platform 20 is larger than the size of the projection of the bearing area 21 on the surface, and the projection of the pressing plate 50 on the upper surface of the platform 20 can cover the front edge portion and the rear edge portion of the projection of the bearing area 21 on the surface.

[0052] For example, the carrying area 21 can be a rectangle, and the projection of the pressure plate 50 on the upper surface of the platform 20 can cover the left edge, right edge, or front edge and rear edge of the projection of the carrying area 21 on the surface; or, the projection of the pressure plate 50 on the upper surface of the platform 20 can cover all edges of the projection of the carrying area 21 on the surface.

[0053] In addition, since the driving mechanism 40 can drive the carrier 20 to move downward through the pressure plate 50, and then drive the product to be tested to move downward, during the downward movement, the product to be tested gradually approaches the probe 60 until the contact point of the product to be tested touches the probe 60, ensuring reliable cooperation between the product to be tested and the probe 60.

[0054] Please continue to refer to Figure 5 and Figure 6In some embodiments, the pressing plate 50 is provided with an observation area 50a, which corresponds to the carrying area 21, and is used for viewing the product to be tested. The area of ​​the observation area 50a may be equivalent to the area of ​​the carrying area 21. For example, the area of ​​the observation area 50a may be slightly larger than the area of ​​the carrying area 21, and the projection of the observation area 50a on the upper surface of the platform 20 may completely cover the projection of the carrying area 21 on the upper surface of the platform 20; or, the area of ​​the observation area 50a may be slightly smaller than the area of ​​the carrying area 21, and the projection of the observation area 50a on the upper surface of the platform 20 is located in the projection of the carrying area 21 on the upper surface of the platform 20; or, the area of ​​the observation area 50a may be equal to the area of ​​the carrying area 21, and the projection of the observation area 50a on the upper surface of the platform 20 coincides with the projection of the carrying area 21 on the upper surface of the platform 20. It can be understood that the size and position of the observation area 50a are not limited thereto, as long as they can meet the needs of viewing the product to be tested.

[0055] In some examples, the pressing plate 50 includes: a connecting portion 51 and a holding portion 52. The connecting portion 51 is connected to the holding portion 52, and the connecting portion 51 can be specifically connected to the rear side of the holding portion 52. The connecting portion 51 is connected to the driving mechanism 40. The holding portion 52 is arranged corresponding to the carrier 20, and the holding portion 52 can be made of a transparent material. The area corresponding to the holding portion 52 and the bearing area 21 forms an observation area 50a. Optionally, the entire pressing plate 50 can be made of a transparent material to simplify the preparation process and cost of the pressing plate 50.

[0056] In other examples, the pressing plate 50 is provided with a window corresponding to the bearing area 21, and the area of ​​the pressing plate 50 provided with the window forms an observation area 50a. The window is provided through the thickness direction of the pressing plate 50, so that the product to be tested can be viewed at the window.

[0057] It is understandable that the observation area 50a can be directly viewed by on-site staff; it can also be used for the image acquisition device to obtain images of the product to be tested during the test process, so that the staff can view the product to be tested by viewing the images obtained by the image acquisition device.

[0058] In this embodiment, by setting up the observation area 50a, the need to view the status of the product to be tested during the test process can be met, for example, the need to view the display status of the product to be tested such as an electronic display screen, so that the test fixture of this embodiment can be applied to more test scenarios.

[0059] Please continue to refer to Figure 1 and Figure 5 In some embodiments, the test fixture further includes: a limit member 70 , the limit member 70 is connected to the bracket 30 , and the limit member 70 is used to limit the extreme position of the pressing plate 50 moving toward the carrier 20 .

[0060] Exemplarily, the limiting member 70 includes: a limiting sleeve 71; the limiting sleeve 71 can be fixedly connected to the bracket 30. Optionally, the limiting sleeve 71 can be connected to the bracket 30 by bolt connection or welding. The axial direction of the limiting sleeve 71 is parallel to the up and down direction. The driving mechanism 40 includes: a toggle clamp 41 and a connecting rod 42, the connecting rod 42 is connected between the toggle clamp 41 and the pressure plate 50, the connecting rod 42 is passed through the limiting sleeve 71, and the toggle clamp 41 drives the pressure plate 50 to move toward the platform 20 to the extreme position through the connecting rod 42, which can be against the limiting sleeve 71 to limit the further downward movement of the pressure plate 50 driven by the toggle clamp 41 through the connecting rod 42.

[0061] Among them, the elbow clamp 41 has a handle 411 for on-site personnel to operate. When the test fixture is in a non-working state, the handle 411 is placed on the bracket 30. The maximum rotation angle of the handle 411 is 180°. The elbow clamp 41 can convert the rotational motion of the handle 411 into linear motion in the up and down directions. The specific structure of the elbow clamp 41 can be set according to actual needs or adopt a conventional setting, and this embodiment is not specifically limited here.

[0062] In other examples, the limiting member 70 may also be a limiting platform fixed on the bracket 30, the limiting platform may be in a block or plate shape, and a stopper is provided on the driving mechanism 40, the stopper being located above the limiting platform. When the driving mechanism 40 drives the pressing plate 50 to move toward the carrier 20 to the limit position, the stopper can be placed on the limiting platform to limit the driving mechanism 40 from driving the pressing plate 50 to move further downward.

[0063] In this embodiment, the above arrangement can prevent the driving mechanism 40 from driving the pressing plate 50 to move excessively downward, thereby causing damage to components such as the carrier 20, the elastic member 23, the probe 60, or the support base 10.

[0064] Please refer to Figure 7 and Figure 8 , and continue to refer to Figure 5 In some embodiments, the test fixture further includes: a guide mechanism 80, the guide mechanism 80 is connected to the bracket 30, and the guide mechanism 80 is also connected to the pressing plate 50 to guide the pressing plate 50 to move in the up and down directions.

[0065] Exemplarily, the bracket 30 includes: a first vertical plate 31 and a second vertical plate 32, the first vertical plate 31 has at least one, the first vertical plate 31 is connected to the support seat 10, and the first vertical plate 31 is located on the side of the second vertical plate 32 away from the carrier 20, and the second vertical plate 32 is connected to the first vertical plate 31. There is a gap between the second vertical plate 32 and the support seat 10, and the gap between the second vertical plate 32 and the support seat 10 is used for the pressure plate 50 to pass through, so that the pressure plate 50 is connected to the guide mechanism 80.

[0066] Exemplarily, the first vertical plate 31 and the second vertical plate 32 can be respectively arranged perpendicular to the support base 10, and the first vertical plate 31 and the second vertical plate 32 can be perpendicular to each other. The first vertical plate 31 can be welded to the support base 10, or the two can be integrally arranged by an integral molding process. The second vertical plate 32 can be welded to the first vertical plate 31, or the two can be integrally arranged by an integral molding process. Figure 8 In the illustrated embodiment, there are two first vertical plates 31 , and the two first vertical plates 31 are respectively disposed near two opposite edges of the second vertical plate 32 to improve the connection reliability between the bracket 30 and the support base 10 and the structural compactness of the test fixture.

[0067] In other examples, the first vertical plate 31 may also have one, three, or more than three, wherein the first vertical plate 31 may be arranged to avoid the pressure plate 50, or an avoidance hole for avoiding the first vertical plate 31 may be arranged on the pressure plate 50 to prevent the first vertical plate 31 from affecting the movement of the pressure plate 50.

[0068] The guide mechanism 80 includes: a guide rod 82 and a guide sleeve 81. The guide rod 82 extends along the height direction of the test fixture, and the guide rod 82 is inserted into the guide sleeve 81. The guide sleeve 81 can be connected to the first vertical plate 31, or the guide sleeve 81 is connected to the second vertical plate 32, or the guide sleeve 81 is respectively connected to the first vertical plate 31 and the second vertical plate 32. Among them, the guide rod 82 can be directly fixedly connected to the pressing plate 50; or the guide rod 82 is fixedly connected to the support seat 10, and the pressing plate 50 is provided with a sliding hole, and the guide rod 82 is inserted into the sliding hole.

[0069] Exemplarily, there are two guide sleeves 81, the two guide sleeves 81 are connected to the second vertical plate 32 respectively, and the two guide sleeves 81 can be symmetrically distributed about the center line of the second vertical plate 32 along the height direction. Correspondingly, there are also two guide rods 82, the two guide rods 82 are slidably inserted into the two guide sleeves 81 respectively, and the two guide rods 82 are respectively matched with the pressing plate 50. When the driving mechanism 40 drives the pressing plate 50 to move up and down, the guide rod 82 slides in the guide sleeve 81 accordingly. In other examples, one guide sleeve 81 and one guide rod 82 can also be respectively provided, and the guide sleeve 81 can be provided close to the center line of the second vertical plate 32 along the height direction.

[0070] Optionally, the guide sleeve 81 is located on the side of the second vertical plate 32 away from the carrier 20, so that the area of ​​the support base 10 located in front of the second vertical plate 32 can place more or larger carriers 20, thereby being able to test a larger number of products to be tested at the same time.

[0071] In the embodiment, the guide sleeve 81 and the first vertical plate 31 may also be connected to the side of the second vertical plate 32 facing the carrier 20 .

[0072] Please continue to refer to Figure 2In some embodiments, the carrier 20 is provided with a receiving groove 21 a for receiving the product to be tested. The receiving groove 21 a is located in the carrying area 21 . The shape of the receiving groove 21 a is adapted to the shape of the product to be tested. The receiving groove 21 a is connected to the through hole 22 .

[0073] In some examples, the stage 20 may be provided with a receiving groove 21a, and the receiving groove 21a may be provided near the middle area of ​​the stage 20. Taking the receiving groove 21a and the stage 20 as an example, the length direction of the receiving groove 21a may be parallel to the length direction of the stage 20.

[0074] Please refer to Fig. 9 In other examples, the carrier 20 may be provided with two or more receiving grooves 21a so as to be able to test multiple products to be tested at the same time. The through hole 22 may be provided on the bottom wall of the receiving groove 21a. Taking the example that the receiving groove 21a and the carrier 20 are both rectangular, the length direction of the carrier 20 may be parallel to the left-right direction of the test fixture, and the length direction of the carrier 20 may also be parallel to the front-back direction of the test fixture, so as to facilitate the side-by-side arrangement of a large number of receiving grooves 21a on the carrier 20; or, the length direction of the carrier 20 and the length direction of the receiving grooves 21a are both parallel to the left-right direction of the test fixture, and a plurality of receiving grooves 21a may be provided along the width direction of the carrier 20.

[0075] In this embodiment, by providing a receiving groove 21 a adapted to the product to be tested, it can limit the placement position of the product to be tested, which helps to ensure that the product to be tested and the probe 60 are reliably matched.

[0076] It is understandable that: since the shapes of the products to be tested of different types or specifications are different, and the number and position of the contact points may also be different, the test fixture can also be configured with a carrier 20 with a receiving groove 21a of different shapes, or a support base 10 with probes 60 of different numbers or distribution positions, so that the on-site personnel can replace the carrier 20 or the support base 10 according to the test requirements. In order to facilitate replacement, the support base 10 can be detachably connected to the bracket 30 and the carrier 20.

[0077] In other embodiments, the product to be tested may be placed directly on the upper surface of the carrier 20; in order to limit the position of the product to be tested, a plurality of limiting protrusions may be provided on the surface of the carrier 20, and the shape of the space defined by the limiting protrusions may be adapted to the shape of the product to be tested.

[0078] Please refer to Fig.10 , and please continue to refer to Figure 2In some embodiments, the carrier 20 is provided with a foolproof portion 24, which is used to mark the placement position of the product to be tested to ensure that the contact point of the product to be tested can correspond to the probe 60. The foolproof portion 24 includes: a foolproof groove and / or a foolproof protrusion 24a.

[0079] Exemplarily, the foolproof part 24 can be arranged in the carrying area 21, or near the carrying area 21. For example, if the foolproof part 24 is arranged in the right area of ​​the carrying area 21, or near the right edge of the carrying area 21, the target side of the product to be tested needs to be placed corresponding to the right side of the carrying area 21; wherein, the target side of the product to be tested refers to the side of the product to be tested that needs to correspond to the position of the foolproof part 24 when the product to be tested is correctly placed in the carrying area 21; the target side of the product to be tested is set according to actual needs.

[0080] In some examples, the portion of the carrier 20 located in the bearing area 21 may be provided with a receiving groove 21a for receiving the product to be tested, and the fool-proof portion 24 may be provided on the groove wall of the receiving groove 21a. For example, the fool-proof portion 24 may be provided on the right groove wall of the receiving groove 21a, or on the front side wall and in an area close to the right groove wall, or on the rear side wall and in an area close to the right groove wall, or on the bottom wall and in an area close to the right groove wall. Wherein, when the fool-proof portion 24 is provided on the side groove wall, the fool-proof portion 24 may include a semi-cylindrical fool-proof protrusion 24a, or a semi-circular fool-proof groove, and the fool-proof groove may be recessed in a direction away from the center of the receiving groove 21a; when the fool-proof portion 24 is provided on the bottom wall of the receiving groove 21a, the fool-proof portion 24 may include a cylindrical or prismatic fool-proof protrusion 24a, or a circular or polygonal fool-proof groove.

[0081] The foolproof part 24 can be matched with the structure at the corresponding position of the product to be tested; for example, when the foolproof part 24 includes a foolproof groove, the foolproof groove can be matched with a protruding structure on the product to be tested and corresponding to the position of the foolproof groove. Alternatively, the foolproof part 24 only serves as an identification and does not need to be matched with the structure on the product to be tested.

[0082] Optional, please continue to refer to Fig.10 In some examples, when foolproofing parts 24 are provided on both opposite sides of the receiving groove 21a, the shapes of the foolproofing parts 24 on both sides are not completely the same. For example, when foolproofing protrusions 24a are provided on both the right side area and the left side area of ​​the receiving groove 21a, two cylindrical foolproofing protrusions 24a are provided on the bottom wall of the receiving groove 21a and in the area close to the right side groove wall, one cylindrical foolproofing protrusion 24a is provided on the bottom wall of the receiving groove 21a and in the area close to the left side groove wall, and one semi-cylindrical foolproofing protrusion 24a is provided on the rear side groove wall of the receiving groove 21a and in the area close to the left side groove wall.

[0083] In other examples, when foolproofing parts 24 are provided on opposite sides of the receiving groove 21a, the distances between the foolproofing parts 24 on both sides and the corresponding side groove walls are different. For example, when foolproofing protrusions 24a are provided on both the right side area and the left side area of ​​the receiving groove 21a, the distance between the foolproofing protrusion 24a on the bottom wall of the receiving groove 21a and the area close to the right groove wall and the right groove wall is smaller than the distance between the foolproofing protrusion 24a on the bottom wall of the receiving groove 21a and the area close to the left groove wall and the left groove wall.

[0084] It can be understood that the specific location and shape of the fool-proof portion 24 can be set according to actual needs, as long as it can serve as an indication or identification in the process of placing the product to be tested.

[0085] In other examples, the fool-proofing portion 24 may be a fool-proofing groove or a fool-proofing protrusion 24a disposed in the load-bearing area 21 or near the load-bearing area 21, and the fool-proofing groove or fool-proofing protrusion 24a may be in a circular or triangular shape.

[0086] Please refer to Fig.11 , and continue to refer to Figure 1 In some embodiments, the support base 10 includes: a base body 11 having a receiving space 10a, and an opening may be provided at the upper end of the base body 11 to facilitate taking and placing items into the receiving space 10a. The receiving space 10a may be used to receive a wiring harness or an external test circuit, etc. In other examples, an opening may also be provided at the rear side, left side, front side, or right side of the base body 11.

[0087] A cover plate 12 is provided at the opening, and the cover plate 12 is movably connected to the base body 11 so as to be able to open or close the receiving space 10a. In some examples, the cover plate 12 can be rotatably connected to the base body 11 through a hinge such as a rotating shaft, so as to open or close the receiving space 10a by rotating the cover plate 12. In other examples, the cover plate 12 can also be slidably connected to the base body 11, so as to open or close the receiving space 10a by pushing and pulling the cover plate 12. The cover plate 12 is movably connected to the carrier 20 through an elastic member 23. When the receiving space 10a is in a closed state, the cover plate 12 can be locked with the base body 11 by a snap or fastener or a lock.

[0088] The probe 60 has a connector 61 and a terminal 62, and the connector 61 is connected to the terminal 62 through a spring; wherein at least part of the terminal 62 is located on the side of the cover plate 12 away from the carrier 20. In this way, when the driving mechanism 40 drives the carrier 20 and the product to be tested to move downward through the pressing plate 50, the connector 61 of the probe 60 can have a certain amount of floating to adapt to the position of the product to be tested, so as to avoid crushing the probe 60.

[0089] The test fixture provided in this embodiment can conveniently perform power supply or connection testing on the product to be tested to achieve power screening or functional testing, etc.

[0090] The following is an example of an application scenario of the test fixture of this embodiment.

[0091] The test fixture of this embodiment can test the electronic screen. For example, it is widely used in the electronic screens of supermarkets to mark the price of goods, product introduction or other information. The electronic screen usually includes: a display screen, a PCBA (Printed Circuit Board + Assembly, an assembled circuit board, also referred to as a circuit board) and a battery module. The PCBA is equipped with a boost circuit, an MCU (Microcontroller Unit), an NFC (Near Field Communication) module or a base station communication chip. The battery module can be a lithium battery or an independent small battery pack. With long-term use, some components of the electronic screen may age, power consumption may increase, and the battery life may be short, causing abnormalities in the boost circuit, which in turn may not rise to the threshold voltage within a predetermined time or may not maintain the voltage during the screen refresh process, causing display abnormalities. Therefore, it is necessary to perform regular power screening or functional testing on the electronic screen.

[0092] The test screening principle is as follows: By analyzing the circuit simulation data, it can be found that the time required for the boost circuit to increase from 3V to 20V is about 1ms. After connecting a 100Ω resistor in series, the boost time can be reduced to 3ms, indicating that the series resistor can greatly increase the output settling time. Remove the battery module and use an external power supply to power the electronic screen instead, increase the input voltage divider resistor or reduce the input power supply voltage, and force the boost circuit of the electronic screen to work at the limit state. If there is device aging or increased power consumption, the boost circuit of the electronic screen cannot increase the voltage to above the threshold voltage within the predetermined time or cannot stabilize the voltage when refreshing the screen, resulting in abnormal display or screen refresh failure. After analyzing the experimental data, it can be found that when applied to a certain electronic screen, the output settling time changes linearly after the series resistance exceeds 70Ω. Therefore, a series resistance (series resistance) threshold can be found above 70Ω, so that the electronic screen with high power consumption cannot complete the boost action within the predetermined time.

[0093] The process of testing the electronic screen may include the following steps a1 to a5:

[0094] Step a1, connecting the terminal of the probe of the test fixture to an external DC signal source after being connected in series with a variable resistor;

[0095] Step a2: select one or a group of reference samples, for example, select a brand new and unused electronic screen, and place it in the receiving slot of the carrier of the test fixture. The driving mechanism drives the carrier and the electronic screen downward through the pressing plate until the contact point of the electronic screen cooperates with the probe. Figure 5 or Fig. 9 As shown; wherein the shape of the receiving groove is adapted to the shape of the product to be tested;

[0096] Step a3, triggering the screen-swiping action of the reference sample, slowly increasing the variable resistance and observing the screen-swiping phenomenon through the transparent pressure plate until the following phenomena occur: there is a screen-swiping action but the screen-swiping cannot be completed, the display is abnormal after the screen-swiping is completed, etc.; determining the series resistance threshold value according to the recorded resistance value; wherein, when the reference sample has one, the recorded resistance value can be used as the series resistance threshold value; when the reference sample has multiple, the average value of multiple resistance values ​​can be taken as the series resistance threshold value;

[0097] Step a4: lower the series resistance threshold by 10%-50%, place the batches of electronic screens to be tested into the receiving slots of the test fixture, and drive the platform and the electronic screens downward through the pressing plate until the contact points of each electronic screen cooperate with the corresponding probes. Fig. 9 As shown;

[0098] Step a5: Screen the electronic screens that need to be tested in batches, and sort out the electronic screens that have no screen refresh action, have screen refresh action but cannot complete the screen refresh, and have abnormal display after the screen refresh is completed. It can be considered that these electronic screens have the problem of high power consumption.

[0099] In step a5, the reduction ratio of the series resistance threshold can be determined according to actual needs or historical data or simulation data. For example, the reduction ratio can be set to 50%, and the electronic screens that need to be replaced immediately can be selected by reducing the series resistance threshold by 50%; the reduction ratio can also be set to 20%, and the electronic screens that are about to be replaced can be selected by reducing the series resistance threshold by 20%.

[0100] The test fixture of this embodiment can also perform Rg test on MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor, MOS for short) devices on PCBA, and sort out samples with Rg>3Ω.

[0101] The process of testing the PCBA may include the following steps b1 to b5:

[0102] Step b1, connecting the terminal of the probe of the test fixture to the external Rg tester;

[0103] Step b2: Place the PCBA into the receiving slot of the carrier of the test fixture, and the driving mechanism drives the carrier and the electronic screen to move downward through the pressure plate until the pins of the MOS device on the PCBA are matched with the probes. Figure 5 or Fig. 9 As shown; wherein the shape of the receiving groove is adapted to the shape of the PCBA; the probe needs to be a 4-claw probe that can cooperate with the pins of the MOS device on the PCBA;

[0104] Step b3: operate the Rg tester to test the Rg parameters of the MOS device.

[0105] It can be understood that: for different products, you only need to select a carrier with a receiving slot that matches the product, and select a support base with a probe type and position that matches the product. The probe's terminal posts can be connected to a variety of testers such as LCR bridges, multimeters, oscilloscopes, etc., which can easily realize batch testing and batch data collection.

[0106] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0107] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0108] In addition, the terms "first", "second", etc. used in the embodiments of the present application are only used for descriptive purposes and should not be understood as indicating or implying relative importance, or implicitly indicating the number of technical features indicated in the present embodiment. Therefore, the features defined by the terms "first", "second", etc. in the embodiments of the present application can explicitly or implicitly indicate that at least one of the features is included in the embodiment. In the description of the present application, the word "multiple" means at least two or two or more, such as two, three, four, etc., unless otherwise clearly and specifically defined in the embodiments.

[0109] In this application, unless otherwise clearly specified or limited in the embodiments, the terms "installed", "connected", "connected" and "fixed" etc. appearing in the embodiments should be understood in a broad sense. For example, the connection can be a fixed connection, a detachable connection, or an integrated connection. It can be understood that it can also be a mechanical connection, an electrical connection, etc.; of course, it can also be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal connection of two elements, or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific implementation situation.

[0110] In the present application, unless otherwise clearly specified and limited, a first feature being “above” or “below” a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being “above”, “above”, and “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being “below”, “below”, and “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0111] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A test fixture, characterized in that: include: Support seat; A carrier, the carrier being movably connected to the support seat via an elastic member, the carrier having a carrying area for carrying at least one product to be tested; The carrier is provided with a through hole, and the through hole is located in the carrying area; A bracket, the bracket being connected to the support seat; A driving mechanism connected to the bracket; A pressing plate, the pressing plate is connected to the driving mechanism and is used to move toward or away from the carrier under the drive of the driving mechanism; a projection of the pressing plate on the surface of the carrier away from the support seat is partially located at the periphery of the carrying area; A probe, the probe is connected to the support seat, the probe has at least one, and the probe is arranged corresponding to the through hole; Wherein, when the test fixture is in working state, the driving mechanism drives the pressing plate to move toward the carrier, so as to drive the carrier and the product to be tested carried by it to move toward the probe, until the probe extends out of the through hole and cooperates with the product to be tested.

2. The test fixture according to claim 1, characterized in that: The pressing plate is provided with an observation area, the observation area corresponds to the bearing area, and the observation area is used to view the product to be tested.

3. The test fixture according to claim 2, characterized in that: The pressing plate comprises: a connecting portion and a pressing portion made of a transparent material, the connecting portion is connected to the driving mechanism, the pressing portion is arranged corresponding to the platform, and the area corresponding to the pressing portion and the carrying area forms the observation area; Alternatively, the pressing plate is provided with a window corresponding to the bearing area, and the area of ​​the pressing plate where the window is provided forms the observation area.

4. The test fixture according to claim 1, characterized in that: Also includes: A limit member is connected to the bracket, and is used to limit the extreme position of the pressing plate moving toward the carrier.

5. The test fixture according to claim 4, characterized in that: The limiting member comprises: a limiting sleeve; The driving mechanism includes: a toggle clamp and a connecting rod, wherein the connecting rod is connected between the toggle clamp and the pressure plate, and the connecting rod is passed through the limiting sleeve. When the toggle clamp drives the pressure plate to move toward the platform to the extreme position through the connecting rod, it can abut against the limiting sleeve.

6. The test fixture according to claim 1, characterized in that: Also includes: A guiding mechanism is connected to the bracket, and the guiding mechanism is also connected to the pressing plate to guide the pressing plate to move along the height direction of the test fixture.

7. The test fixture according to claim 6, characterized in that: The bracket comprises: a first vertical plate and a second vertical plate, the first vertical plate has at least one, the first vertical plate is connected to the support seat, the first vertical plate is connected to the second vertical plate, and the first vertical plate is located on the side of the second vertical plate away from the carrier; there is a gap between the second vertical plate and the support seat, and the gap between the second vertical plate and the support seat is used for the pressure plate to pass through; The guide mechanism comprises: a guide rod and a guide sleeve, wherein the guide rod extends along the height direction of the test fixture, the guide rod is inserted into the guide sleeve, the guide sleeve is located on a side of the second vertical plate away from the carrier, and the guide sleeve is connected to the first vertical plate and / or the second vertical plate; The guide rod is connected to the pressure plate; or, the guide rod is connected to the support seat, and the pressure plate is provided with a sliding hole, and the guide rod is inserted into the sliding hole.

8. The test fixture according to claim 1, characterized in that: The carrier is provided with an anti-foolproof part, which is used to mark the placement position of the product to be tested; the anti-foolproof part includes: an anti-foolproof groove and / or an anti-foolproof protrusion; And / or, the carrier is provided with a receiving groove for accommodating the product to be tested, the receiving groove is located in the carrying area, the receiving groove has at least one receiving groove, the shape of the receiving groove is adapted to the shape of the product to be tested, and the receiving groove is connected to the through hole.

9. The test fixture according to claim 1, characterized in that: The support seat comprises: a seat body having a receiving space, and an opening is arranged at one end of the seat body; A cover plate is provided at the opening, and the cover plate is movably connected to the seat body so as to be able to open or close the receiving space; The cover plate is movably connected to the carrier through the elastic member; The probe has a connector and a terminal, and the connector is connected to the terminal via a spring; wherein at least a portion of the terminal is located on a side of the cover plate away from the carrier.

10. The test fixture according to claim 1, characterized in that: There are a plurality of elastic members, wherein at least two of the elastic members are symmetrically distributed about the center of the carrier.

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