Limiting-adjustable numerical control probe

Abstract

The utility model provides a numerical control probe with adjustable limit, which relates to the technical field of numerical control probes, and comprises a probe body, the bottom of the probe body is fixedly connected with a connecting sleeve, the connecting sleeve is internally provided with a sliding cavity, the sliding cavity is internally provided with a probe, the probe is internally provided with an adjusting mechanism, and the probe is internally provided with a limiting mechanism. A movable groove is formed in the bottom end of the interior of the measuring head body, a sliding supporting hole is formed in one side of the movable groove, a connecting rod is slidably installed in the sliding supporting hole, one end of the connecting rod is fixedly connected with a limiting clamping plate, a clamping groove is formed in one side of the top of a probe, and the limiting clamping plate is clamped in the clamping groove; through the arrangement of the adjusting mechanism, adjustment can be carried out according to the depth of an object to be measured, the applicability of the probe is improved, vertical pressure generated by the probe and a workpiece can be buffered, the probe is prevented from being broken, and the service life of the probe is prolonged.

Description

Technical Field

[0001] The utility model belongs to the technical field of numerical control probes, and more specifically, particularly relates to a numerical control probe with adjustable limit. Background Art

[0002] The CNC probe is an important part of the probe, and the machine tool probe is a measuring device installed on the CNC machine tool. It is a scientific and technological innovation product with the advantages of improving the manufacturing quality of existing production equipment, reducing manufacturing costs, saving manufacturing time, etc. It is widely used in CNC machine tools. However, the existing probes are fixed and cannot be adjusted according to the depth of the object to be measured. Moreover, the probe will collide with the workpiece during measurement, which may easily cause the probe to break. Therefore, a probe with adjustable limit and long service life is needed. Utility Model Content

[0003] In order to solve the above technical problems, the embodiments of the present invention relate to a CNC probe with adjustable limit, so as to solve the problems that the probe cannot be adjusted according to the depth of the object to be measured and the collision with the workpiece easily leads to the breakage of the probe and the short service life. By setting the adjustment mechanism, the probe is changed into a telescopic structure, which can be adjusted according to the depth of the object to be measured, thereby improving the applicability of the probe. Moreover, when the probe and the workpiece generate vertical pressure, a second spring can be used for buffering to avoid the breakage of the probe and increase the service life of the probe. By setting the installation structure, the installation and disassembly of the probe is convenient, which is convenient for subsequent maintenance and replacement.

[0004] The utility model is a CNC probe with adjustable limit, which is achieved by the following specific technical means:

[0005] In a first aspect of the present disclosure, there is provided a numerically controlled probe with adjustable limit, specifically comprising a probe body;

[0006] The bottom of the probe body is fixedly connected with a connecting sleeve, and a sliding cavity is opened inside the connecting sleeve, and a probe is arranged inside the sliding cavity. An adjusting mechanism is arranged inside the probe body, and the adjusting mechanism includes a movable groove, a sliding support hole, a connecting rod, a limit clamping plate, a clamping groove, a fixed convex ring, a reset support groove, a first spring, a pull handle, a buffer sleeve, a buffer groove, a connecting top plate and a second spring. A movable groove is opened at the bottom end of the inner part of the probe body, and a sliding support hole is opened on one side of the movable groove, and a connecting rod is slidably installed inside the sliding support hole, one end of the connecting rod is fixedly connected to the limit clamping plate, and a clamping groove is opened on one side of the top of the probe. At the same time, the limit card plate is clamped in the clamping groove, the outer side of the connecting rod is fixedly connected with a fixed convex ring, and a reset branch groove is opened inside the probe body, and the fixed convex ring is slidably installed in the reset branch groove, and a first spring is provided inside the reset branch groove, and the first spring is sleeved on the outer side of the connecting rod, and the other end of the connecting rod passes through the probe body and is fixedly connected to the external pull handle, a buffer sleeve is provided on the top of the probe body, and a buffer groove is opened inside the buffer sleeve, and at the same time, a connecting top plate is fixedly connected to the top of the probe body, and the connecting top plate is slidably installed in the buffer groove, and a second spring is provided in the top buffer groove of the connecting top plate.

[0007] In at least some embodiments, a mounting protrusion is fixedly connected to the middle of the top of the buffer sleeve, and two groups of locking slots are respectively provided on both sides of the mounting protrusion.

[0008] In at least some embodiments, a mounting structure is provided on the top of the buffer sleeve, and the mounting structure includes a mounting support, an insertion slot, a partition and a through slot. The top of the buffer sleeve is provided with a mounting support, and the bottom of the mounting support is provided with an insertion slot, and the mounting protrusion is inserted in the insertion slot. Partitions are fixedly connected to both sides of the insertion slot, and the partition is provided with a through slot.

[0009] In at least some embodiments, the installation structure also includes an active cavity, a fixed bracket and an electromagnetic ring. The side of the partition is provided with an active cavity, and two groups of oppositely positioned fixed brackets are fixedly installed inside the active cavity, and an electromagnetic ring is fixedly installed at the end of the fixed bracket.

[0010] In at least some embodiments, the mounting structure further includes a connecting support plate, a locking plug and a sliding support rod. A connecting support plate is provided on the side of the partition plate, and locking plugs are fixedly connected to the upper and lower ends of one side of the connecting support plate. At the same time, the locking plug passes through the through groove and is inserted into the locking slot. The other side of the connecting support plate is fixedly connected to the sliding support rod.

[0011] In at least some embodiments, the mounting structure also includes a magnet, a fixed sleeve and a third spring. The sliding support rod passes through the electromagnetic ring and is fixedly connected to the magnet. A fixed sleeve is fixedly connected to the outer wall of the movable cavity, and the magnet is slidably mounted on the fixed sleeve. At the same time, a third spring is provided inside the fixed sleeve.

[0012] The utility model provides a numerical control probe with adjustable limit, which has the following beneficial effects:

[0013] 1. By setting an adjustment mechanism, through the cooperation of a connecting rod, a limit clamping plate, a clamping groove, a fixed convex ring, a reset support groove, a first spring and a pull handle, the probe is changed into a telescopic structure, which can be adjusted according to the depth of the object to be measured, thereby improving the applicability of the probe. Through the cooperation of a buffer sleeve, a buffer groove, a connecting top plate and a second spring, the vertical pressure generated by the probe and the workpiece can be buffered, thereby avoiding the breakage of the probe and increasing the service life of the probe.

[0014] 2. By setting up the installation structure, the electromagnetic ring, the fixed bracket, the movable cavity, the connecting support plate, the locking plug, the sliding support rod, the magnet, the fixed sleeve and the third spring are coordinated to facilitate the installation and disassembly of the probe and facilitate subsequent maintenance and replacement. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of the utility model.

[0016] Figure 2 It is a schematic diagram of the cross-sectional structure of the regulating mechanism of the utility model.

[0017] Figure 3 The utility model Figure 2 Enlarged structural diagram at A in the middle.

[0018] Figure 4 It is a structural schematic diagram of the installation structure part of the utility model.

[0019] Figure 5 It is a cross-sectional structural diagram of the installation structure of the utility model.

[0020] Figure 6 It is a structural schematic diagram of a connecting support plate and a locking plug block of the utility model.

[0021] In the figure, the corresponding relationship between the component names and the figure numbers is as follows:

[0022] 1. Probe body;

[0023] 101, connecting sleeve; 1011, sliding chamber;

[0024] 102. Probe;

[0025] 2. Adjustment mechanism;

[0026] 201, movable groove; 2011, sliding support hole;

[0027] 202, connecting rod; 2021, limiting clamping plate; 2022, clamping groove; 2023, fixing convex ring; 2024, reset support groove; 2025, first spring; 2026, pull handle;

[0028] 203, buffer sleeve; 2031, buffer groove; 2032, connecting top plate; 2033, second spring;

[0029] 204, mounting protrusion; 2041, locking slot;

[0030] 3. Installation structure;

[0031] 301, mounting support; 3011, insertion slot;

[0032] 302, partition; 3021, through groove;

[0033] 303, movable cavity; 3031, fixed bracket; 3032, electromagnetic ring;

[0034] 304, connecting support plate; 3041, locking plug; 3042, sliding support rod; 3043, magnet; 3044, fixing sleeve; 3045, third spring. DETAILED DESCRIPTION

[0035] The following is a further detailed description of the implementation of the present invention in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but cannot be used to limit the scope of the present invention.

[0036] Embodiment 1: as attached Figure 1 To Attachment Figure 6 As shown:

[0037] The utility model provides a numerical control probe with adjustable limit, comprising a probe body 1;

[0038] The bottom of the probe body 1 is fixedly connected with a connecting sleeve 101, and a sliding cavity 1011 is opened inside the connecting sleeve 101, and a probe 102 is arranged inside the sliding cavity 1011. An adjusting mechanism 2 is arranged inside the probe body 1, and the adjusting mechanism 2 includes a movable groove 201, a sliding support hole 2011, a connecting rod 202, a limit clamping plate 2021, a clamping groove 2022, a fixed convex ring 2023, a reset support groove 2024, a first spring 2025, a pull handle 2026, a buffer sleeve 203, a buffer groove 2031, a connecting top plate 2032 and a second spring 2033. A movable groove 201 is opened at the bottom of the inner part of the probe body 1, and a sliding support hole 2011 is opened on one side of the movable groove 201, and the sliding support hole 201 1 is slidably installed with a connecting rod 202, one end of the connecting rod 202 is fixedly connected to a limited clamping plate 2021, and a clamping groove 2022 is provided on one side of the top of the probe 102, and the limited clamping plate 2021 is clamped in the clamping groove 2022, the outer side of the connecting rod 202 is fixedly connected with a fixed convex ring 2023, and a reset support groove 2024 is provided inside the probe body 1, and the fixed convex ring 2023 is fitted and slidably installed in the reset support groove 2024, a first spring 2025 is provided inside the reset support groove 2024, and the first spring 2025 is sleeved on the outer side of the connecting rod 202, and the other end of the connecting rod 202 passes through the probe body 1 and is fixedly connected to the external pull handle 2026, and a buffer is provided on the top of the probe body 1 The sleeve 203 is provided with a buffer groove 2031 inside the buffer sleeve 203, and a connecting top plate 2032 is fixedly connected to the top of the probe body 1, and the connecting top plate 2032 is slidably installed in the buffer groove 2031, and a second spring 2033 is provided in the top buffer groove 2031 of the connecting top plate 2032, and a mounting protrusion 204 is fixedly connected to the middle of the top of the buffer sleeve 203, and two groups of locking slots 2041 are respectively provided on both sides of the mounting protrusion 204, and the connecting rod 202 is driven to move by pulling the handle 2026, so that the connecting rod 202 drives the limiting clamping plate 2021 to disengage from the clamping groove 2022 on the probe 102, so that the limit is released, and then it is adjusted according to the depth of the object to be measured to a suitable depth. When the pull handle 2026 is in the appropriate position, the pull handle 2026 is released. When the connecting rod 202 moves, the first spring 2025 is squeezed in the reset support groove 2024 through the fixed convex ring 2023, so that the first spring 2025 generates elastic force to push the fixed convex ring 2023 to move, so that the fixed convex ring 2023 drives the connecting rod 202 to move, and then the movement of the connecting rod 202 drives the limiting clamping plate 2021 to be clamped into the clamping groove 2022 for limiting. When the probe 102 and the workpiece generate vertical pressure, at this time, the probe body 1 drives the top connecting top plate 2032 to squeeze the second spring 2033 in the buffer groove 2031, so that the second spring 2033 generates elastic force to buffer the vertical pressure, thereby avoiding the probe 102 from breaking and increasing the service life of the probe 102.

[0039] Embodiment 2: Based on Embodiment 1, Figure 4 , Figure 5 and Figure 6 As shown, the top of the buffer sleeve 203 is provided with a mounting structure 3, and the mounting structure 3 includes a mounting support 301, an insertion slot 3011, a partition 302 and a through slot 3021. The top of the buffer sleeve 203 is provided with a mounting support 301, and the bottom of the mounting support 301 is provided with an insertion slot 3011, and the mounting protrusion 204 is inserted into the insertion slot 3011. The partitions 302 are fixedly connected to both sides of the insertion slot 3011, and the partitions 302 are provided with a through slot 3021. The mounting structure 3 also includes an active cavity 303, a fixed bracket 3031 and an electromagnetic ring 303. 032, a movable cavity 303 is provided on the side of the partition 302, and two sets of oppositely positioned fixed brackets 3031 are fixedly installed inside the movable cavity 303, and an electromagnetic ring 3032 is fixedly installed at the end of the fixed bracket 3031. The mounting structure 3 also includes a connecting support plate 304, a locking plug 3041 and a sliding support rod 3042. A connecting support plate 304 is provided on the side of the partition 302, and the upper and lower ends of one side of the connecting support plate 304 are fixedly connected with locking plugs 3041, and the locking plug 3041 passes through the through slot 3021 and is inserted into the locking slot 20 41, the other side of the connecting support plate 304 is fixedly connected with a sliding support rod 3042, the mounting structure 3 also includes a magnet 3043, a fixed sleeve 3044 and a third spring 3045, the sliding support rod 3042 passes through the electromagnetic ring 3032 and is fixedly connected to the magnet 3043, and the outer wall of the movable cavity 303 is fixedly connected with a fixed sleeve 3044, and the magnet 3043 is slidably mounted on the fixed sleeve 3044, and the third spring 3045 is arranged inside the fixed sleeve 3044, the magnetic poles of the electromagnetic ring 3032 and the magnet 3043 are the same, when the electromagnetic ring is started 3032, because the same magnetic poles produce repulsion, the magnet 3043 is pushed to move, and the magnet 3043 drives the connecting support plate 304 to move through the sliding support rod 3042. When the electromagnetic ring 3032 is closed, the magnet 3043 squeezes the third spring 3045 in the fixed sleeve 3044 when it moves, so that the third spring 3045 generates elastic force. When the third spring 3045 is unable to withstand the pressure, the elastic force is released, thereby pushing the magnet 3043 to move, and then the magnet 3043 drives the connecting support plate 304 to move and reset through the sliding support rod 3042.

[0040] The specific usage and function of this embodiment are as follows:

[0041] In the present invention, the electromagnetic ring 3032 is first started, because the same magnetic poles produce repulsion, thereby pushing the magnet 3043 to move, so that the magnet 3043 drives the connecting support plate 304 to move through the sliding support rod 3042, and then the top mounting protrusion 204 of the buffer sleeve 203 is inserted into the insertion groove 3011, and then when the electromagnetic ring 3032 is closed, because the magnet 3043 moves, it squeezes the third spring 3045 in the fixed sleeve 3044, so that the third spring 3045 generates elastic force, and when the third spring 3045 cannot be subjected to pressure, the elastic force is released, thereby pushing the magnet 3043 to move, and then the magnet 3043 drives the connecting support plate 304 to move and reset through the sliding support rod 3042, so that the locking block 3041 is inserted into the locking slot 2041 to complete the installation, which is convenient for the installation and disassembly of the probe, and is convenient for subsequent maintenance and replacement, and then the pull handle 2026 is pulled to drive the connecting rod 202 to move, so that the connecting rod 20 2 drives the limiting clamping plate 2021 to disengage from the clamping groove 2022 on the probe 102 to release the limit, and then adjust it according to the depth of the object to be measured. When it is adjusted to a suitable position, the pull handle 2026 is released. When the connecting rod 202 moves, the first spring 2025 is squeezed in the reset support groove 2024 through the fixed convex ring 2023, so that the first spring 2025 generates elastic force to push the fixed convex ring 2023 to move, so that the fixed convex ring 2023 drives the connecting rod 202 to move, and then the movement of the connecting rod 202 drives the limiting clamping plate 2021 to be clamped in the clamping groove 2022 for limiting, thereby improving the applicability of the probe. When the probe 102 and the workpiece generate vertical pressure, at this time, the probe body 1 drives the top connecting plate 2032 to squeeze the second spring 2033 in the buffer groove 2031, so that the second spring 2033 generates elastic force to buffer the vertical pressure, thereby avoiding the breakage of the probe 102 and improving the service life of the probe 102.

Claims

1. A CNC probe with adjustable limit, comprising a probe body; The bottom of the probe body is fixedly connected with a connecting sleeve, and a sliding cavity is provided inside the connecting sleeve, and a probe is provided inside the sliding cavity. An adjusting mechanism is provided inside the probe body, and the characteristics are as follows: The adjusting mechanism comprises a movable groove, a sliding support hole, a connecting rod, a limit clamping plate, a clamping groove, a fixed convex ring, a reset support groove, a first spring, a pull handle, a buffer sleeve, a buffer groove, a connecting top plate and a second spring. The inner bottom end of the probe body is provided with a movable groove, and a sliding support hole is provided on one side of the movable groove. At the same time, a connecting rod is slidably installed inside the sliding support hole. One end of the connecting rod is fixedly connected to the limit clamping plate, and a clamping groove is provided on one side of the top of the probe. At the same time, the limit clamping plate is clamped in the clamping groove. The outer side of the connecting rod is fixedly connected to the fixed convex ring. A reset support groove is provided inside the probe body, and a fixed convex ring is slidably installed in the reset support groove. A first spring is provided inside the reset support groove, and the first spring is mounted on the outside of the connecting rod. At the same time, the other end of the connecting rod passes through the probe body and is fixedly connected to the external pull handle. A buffer sleeve is provided on the top of the probe body, and a buffer groove is provided inside the buffer sleeve. At the same time, a connecting top plate is fixedly connected to the top of the probe body, and the connecting top plate is slidably installed in the buffer groove, and a second spring is provided in the top buffer groove of the connecting top plate.

2. A CNC probe with adjustable limit according to claim 1, characterized in that: A mounting protrusion is fixedly connected to the middle of the top of the buffer sleeve, and two groups of locking slots are respectively provided on both sides of the mounting protrusion.

3. A CNC probe with adjustable limit according to claim 1, characterized in that: A mounting structure is provided on the top of the buffer sleeve, and the mounting structure includes a mounting support, an insertion groove, a partition and a through groove. A mounting support is provided on the top of the buffer sleeve, and an insertion groove is provided at the bottom of the mounting support, and a mounting protrusion is inserted in the insertion groove. Partitions are fixedly connected on both sides of the insertion groove, and a through groove is provided on the partition.

4. A numerically controlled probe with adjustable limit according to claim 3, characterized in that: The installation structure also includes an active cavity, a fixed bracket and an electromagnetic ring. The side of the partition is provided with an active cavity, and two groups of fixed brackets in opposite positions are fixedly installed inside the active cavity. At the same time, an electromagnetic ring is fixedly installed at the end of the fixed bracket.

5. The CNC probe with adjustable limit according to claim 3, characterized in that: The mounting structure also includes a connecting support plate, a locking plug and a sliding support rod. A connecting support plate is provided on the side of the partition, and locking plugs are fixedly connected to the upper and lower ends of one side of the connecting support plate. At the same time, the locking plug passes through the through groove and is inserted into the locking slot. The other side of the connecting support plate is fixedly connected to the sliding support rod.

6. A numerically controlled probe with adjustable limit according to claim 5, characterized in that: The mounting structure also includes a magnet, a fixed sleeve and a third spring. The sliding support rod passes through the electromagnetic ring and is fixedly connected to the magnet. The outer wall of the movable cavity is fixedly connected with a fixed sleeve, and the magnet is slidably mounted on the fixed sleeve. At the same time, a third spring is arranged inside the fixed sleeve.

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