Aging jig capable of being quickly assembled

Abstract

The utility model discloses an aging jig capable of being rapidly assembled, which comprises a jig base and a test board, the test board is matched with the jig base, the jig base is provided with a plurality of mounting holes for mounting test probes, and the lower end of the test board is provided with a plurality of mounting cavities for mounting electronic products to be tested. A jig base and a test plate are arranged, the jig base is provided with a plurality of mounting holes used for mounting test probes, the lower end of the test plate is provided with a plurality of mounting cavities used for mounting electronic products to be tested, the test probes are used for testing the electronic products to be tested, and the test probes are inserted into the mounting holes of the jig base. The to-be-tested electronic product is clamped into the mounting cavity of the test board, so that the test probe and the to-be-tested electronic product can be quickly assembled, the test efficiency is greatly improved, and the requirement of quick production is met.

Description

Technical Field

[0001] The utility model relates to the technical field of aging jigs, in particular to an aging jig that can be assembled quickly. Background Art

[0002] Aging room (or aging cabinet) is a device that simulates a high temperature and harsh environment test for high-performance electronic products. It is an important experimental equipment to improve product stability and reliability, and an important production process for manufacturers to improve product quality and competitiveness. The equipment is widely used in power electronics, computers, communications, biopharmaceuticals, chemicals and other fields. In order to improve the factory quality of electronic products, a series of aging tests need to be performed on electronic products before they leave the factory. In the prior art, when performing aging tests on electronic products, a single electrical connection test is performed on the electronic products. However, this single product testing method is very inefficient and cannot meet the needs of rapid production. Utility Model Content

[0003] In order to overcome the above-mentioned shortcomings of the prior art, the utility model provides a rapidly assembled aging fixture, aiming to solve the problem in the prior art that the efficiency of aging testing of electronic products is very low and cannot meet the needs of rapid production.

[0004] The utility model solves the technical problem by adopting the following technical solution: a rapidly assembled aging fixture, comprising a fixture base and a test board, the test board cooperates with the fixture base, the fixture base is provided with a plurality of mounting holes for mounting test probes, and the lower end of the test board is provided with a plurality of mounting cavities for mounting electronic products to be tested; the fixture base is provided with a locking component, and the locking component comprises a fixing seat fixed to the fixture base, a locking arm rotatably connected to the fixing seat, and a locking switch for locking the locking arm.

[0005] As a further improvement of the present invention: the installation cavity has a clamping portion for clamping the electronic product to be tested and a taking portion for taking the electronic product to be tested.

[0006] As a further improvement of the present invention: the fixture base and the test plate are detachably connected.

[0007] As a further improvement of the present invention: the fixture base and the test plate are arranged up and down, the test plate has a mounting surface in a direction close to the fixture base, and the mounting cavity is located on the mounting surface.

[0008] As a further improvement of the utility model: the fixture base is provided with a positioning groove, and the positioning groove corresponds to the test plate.

[0009] As a further improvement of the present invention: a positioning column for mounting the test board on a fixture base is provided at the lower end of the test board, and a positioning hole corresponding to the positioning column is provided on the fixture base.

[0010] As a further improvement of the present invention: the fixture base is hinged to the test plate.

[0011] As a further improvement of the present invention: four locking components are provided, and the four locking components are respectively installed at the four corners of the fixture base.

[0012] As a further improvement of the present invention: the number of the installation cavities is 10, and the installation cavities are arranged in a 2×5 matrix on the test board.

[0013] Compared with the prior art, the beneficial effects of the utility model are:

[0014] 1. The utility model is provided with a fixture base and a test board. The fixture base is provided with a plurality of mounting holes for installing test probes. The lower end of the test board is provided with a plurality of mounting cavities for installing electronic products to be tested. The test probes are used to test the electronic products to be tested. By inserting the test probes into the mounting holes of the fixture base and inserting the electronic products to be tested into the mounting cavities of the test board, the test probes and the electronic products to be tested can be quickly assembled, thereby greatly improving the test efficiency and meeting the needs of rapid production.

[0015] 2. The utility model provides a locking component through the fixture base. After the electronic product to be tested is installed in the installation cavity of the test board, the test board is placed above the fixture base, the locking arm is rotated to press the test board, and the locking arm is locked with a locking switch, and the locking component can lock the test board and the fixture base; when the test is completed, the locking switch is released to unlock the locking arm, and the locking arm is rotated to release the test board, so that the locking component can be opened, and then the test board can be taken out, and the electronic product to be tested can be taken out. It has the advantages of simple structure and easy disassembly and assembly. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the overall structure of the utility model.

[0017] Figure 2 It is a schematic diagram of the assembly structure of the test board and the electronic product to be tested.

[0018] Figure 3 Schematic diagram of the assembly structure of the fixture base and the test board.

[0019] Figure 4 It is a schematic diagram of the structure of the locking component.

[0020] Figure numerals: 1. fixture base; 11. positioning groove; 2. test board; 3. mounting hole; 4. mounting cavity; 5. electronic product to be tested; 6. clamping part; 7. picking part; 8. locking component; 81. fixing seat; 82. locking arm; 83. locking switch. DETAILED DESCRIPTION

[0021] In this document, relational terms such as first and second, etc. are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprises" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. The utility model is further described in conjunction with the accompanying drawings and embodiments:

[0022] Implementation case 1:

[0023] See also Figure 1-4 A quickly assembled aging fixture includes a fixture base and a test board. The test board cooperates with the fixture base. The fixture base is provided with a plurality of mounting holes for installing test probes. The lower end of the test board is provided with a plurality of mounting cavities for installing electronic products to be tested.

[0024] A jig base and a test board are provided, the jig base is provided with a plurality of mounting holes for installing test probes, the lower end of the test board is provided with a plurality of mounting cavities for installing electronic products to be tested, the test probes are used to test the electronic products to be tested, and the test probes are inserted into the mounting holes of the jig base, and the electronic products to be tested are clamped into the mounting cavities of the test board, thereby realizing rapid assembly of the test probes and the electronic products to be tested, greatly improving the test efficiency and meeting the needs of rapid production.

[0025] The fixture base is provided with a locking component, and the locking component includes a fixing seat fixed to the fixture base, a locking arm rotatably connected to the fixing seat, and a locking switch for locking the locking arm.

[0026] After the electronic product to be tested is installed in the installation cavity of the test board, the test board is placed on top of the fixture base, the locking arm is rotated to press the test board, and the locking arm is locked with the locking switch, and the locking component can lock the test board and the fixture base; when the test is completed, release the locking switch to unlock the locking arm, and the locking arm is rotated to release the test board to open the locking component, and then the test board is taken out, and the electronic product to be tested can be taken out.

[0027] Implementation case 2:

[0028] A fast-assembled aging fixture includes a fixture base and a test board, the test board cooperates with the fixture base, the fixture base is provided with a plurality of mounting holes for mounting test probes, and the lower end of the test board is provided with a plurality of mounting cavities for mounting electronic products to be tested. The fixture base is provided with a locking component, and the locking component includes a fixing seat fixed to the fixture base, a locking arm rotatably connected to the fixing seat, and a locking switch for locking the locking arm.

[0029] The installation cavity comprises a clamping portion and a taking portion, wherein the clamping portion is used to clamp the electronic product to be tested, and the taking portion is used to take the electronic product to be tested, so that the staff can take the electronic product to be tested conveniently.

[0030] The fixture base is detachably connected to the test plate.

[0031] The fixture base and the test plate are arranged up and down, the test plate has a mounting surface in a direction close to the fixture base, and the mounting cavity is located on the mounting surface.

[0032] The fixture base is provided with a positioning groove, and the positioning groove corresponds to the test board. The test board can be installed on the fixture base through the positioning groove.

[0033] Implementation case three:

[0034] The difference from the second implementation case is that the lower end of the test plate is provided with a positioning column for mounting the test plate on the fixture base, and the fixture base is provided with a positioning hole corresponding to the positioning column. The test plate and the fixture base are positioned by the positioning column and the positioning hole, which is convenient for assembly. The other structures are the same as those of the second implementation case, and will not be described in detail in this implementation case.

[0035] Implementation Case 4:

[0036] The difference from implementation case 2 is that the fixture base is hinged to the test plate.

[0037] In this embodiment, after the electronic product to be tested is installed in the installation cavity of the test board, the test board is flipped over to the top of the fixture base and closed, the locking arm is rotated to press the test board, and the locking arm is locked with the locking switch, and the locking component can lock the test board and the fixture base; when the test is completed, the locking switch is released to unlock the locking arm, and the locking arm is rotated to release the test board, the locking component can be opened, and then the test board is flipped over to take out the electronic product to be tested. The other structures are the same as those in the second implementation case, and this implementation case will not be repeated.

[0038] Implementation Case 5:

[0039] The difference from implementation case 1 is that the number of the installation cavities is 10, and the installation cavities are arranged in a 2×5 matrix on the test board.

[0040] Each electronic product to be tested has 6 test probe points, the lower end of the test board is provided with 10 mounting cavities for mounting the electronic products to be tested, and the fixture base is provided with 60 mounting holes for mounting the test probes. The aging fixture can test up to 10 products at the same time, greatly improving the work efficiency. The other structures are the same as those in the first implementation case, and will not be described in detail in this implementation case.

[0041] Implementation Case 6:

[0042] The difference from implementation case 1 is that: there are four locking components, which are respectively installed at the four corners of the fixture base.

[0043] In the above example, four locking components are respectively installed at the four corners of the fixture base. When the test board is installed on the top of the fixture base, the four locking components can lock the test board and the fixture base, making the connection between the test board and the fixture base more stable. The other structures are the same as those in the first implementation case, and this implementation case will not be repeated.

[0044] The main functions of this utility model:

[0045] The utility model is provided with a jig base and a test board. The jig base is provided with a plurality of mounting holes for installing test probes. The lower end of the test board is provided with a plurality of mounting cavities for installing the electronic product to be tested. The test probe is used to test the electronic product to be tested. The test probe is inserted into the mounting hole of the jig base, and the electronic product to be tested is inserted into the mounting cavity of the test board, so that the test probe and the electronic product to be tested can be quickly assembled, which greatly improves the test efficiency and meets the demand for rapid production. The jig base is provided with a locking component. After the electronic product to be tested is installed in the mounting cavity of the test board, the test board is placed above the jig base, the locking arm is rotated to press the test board, and the locking arm is locked with a locking switch, so that the locking component can lock the test board and the jig base; when the test is completed, the locking switch is released to unlock the locking arm, and the locking arm is rotated to release the test board, so that the locking component can be opened, and then the test board is taken out, and the electronic product to be tested can be taken out, which has the advantages of simple structure and convenient disassembly and assembly.

[0046] In the description of the present utility model, it needs to be understood that the orientations or positional relationships indicated by terms such as "upper end face", "lower end face", "top", "bottom", "left" and "right" are based on the orientations or positional relationships shown in the accompanying drawings and are only for the convenience of describing the present utility model. Therefore, they cannot be understood as limitations on the actual use direction of the present utility model.

[0047] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some or all of the technical features thereof may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present invention, and should all be included in the scope of the claims and specification of the present invention.

Claims

1. A rapidly assembled aging fixture, characterized by: The jig base comprises a jig and a test board, wherein the test board cooperates with the jig base, the jig base is provided with a plurality of mounting holes for installing test probes, and the lower end of the test board is provided with a plurality of mounting cavities for installing electronic products to be tested; the jig base is provided with a locking component, and the locking component comprises a fixing seat fixed to the jig base, a locking arm rotatably connected to the fixing seat, and a locking switch for locking the locking arm.

2. The quickly assembled aging fixture according to claim 1, characterized in that: The installation cavity has a clamping portion for clamping the electronic product to be tested and a taking portion for taking the electronic product to be tested.

3. A rapidly assembled aging fixture according to claim 1 or 2, characterized in that: The fixture base is detachably connected to the test plate.

4. A rapidly assembled aging fixture according to claim 1 or 2, characterized in that: The fixture base and the test plate are arranged up and down, the test plate has a mounting surface in a direction close to the fixture base, and the mounting cavity is located on the mounting surface.

5. The rapidly assembled aging fixture according to claim 1, characterized in that: The fixture base is provided with a positioning groove, and the positioning groove corresponds to the test plate.

6. The rapidly assembled aging fixture according to claim 1, characterized in that: A positioning column for mounting the test board on a fixture base is disposed at the lower end of the test board, and a positioning hole corresponding to the positioning column is disposed on the fixture base.

7. The rapidly assembled aging fixture according to claim 1, characterized in that: The fixture base is hinged to the test plate.

8. The rapidly assembled aging fixture according to claim 2, characterized in that: There are four locking components, which are respectively installed at the four corners of the fixture base.

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