Sample cleaning device of magnetic particle flaw detector

Abstract

The utility model relates to the technical field of magnetic particle flaw detectors, and provides a sample cleaning device of a magnetic particle flaw detector, which comprises a magnetic particle flaw detector body, a U-shaped plate is driven to move through a first moving mechanism, when a first arc-shaped plate moves to the position above a sample workpiece, a first electric telescopic rod is started, the first electric telescopic rod pushes the first arc-shaped plate to move downwards, an electromagnet is started to adsorb magnetic powder on the sample workpiece, and after the magnetic powder is adsorbed, the first electric telescopic rod pushes the first arc-shaped plate to move downwards. When a second arc-shaped plate moves to the position above the sample workpiece, a second electric telescopic rod is started, the second electric telescopic rod pushes the second arc-shaped plate to move downwards, a brush on the second arc-shaped plate is made to make contact with the sample workpiece, at the moment, a magnetic particle flaw detector body is started, and the magnetic particle flaw detector body is driven to move downwards; and the workpiece clamping device in the magnetic particle flaw detector body drives the sample workpiece to rotate, so that the purpose of cleaning gaps of the sample workpiece by the brush is achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of magnetic particle flaw detectors, and in particular to a sample cleaning device for magnetic particle flaw detectors. Background Art

[0002] Magnetic particle testing utilizes the fact that after ferromagnetic materials are magnetized, the presence of discontinuities causes local distortion of the magnetic lines of force on the workpiece surface and near the surface, generating a leakage magnetic field (i.e. the magnetic field formed when the magnetic induction lines leave and enter the surface) that adsorbs the magnetic powder applied to the workpiece surface, forming magnetic marks that are visible under appropriate lighting, thereby showing the location, shape and size of the discontinuity.

[0003] Known Chinese public authorized patent: (publication number: CN202020842825.9) discloses a sample cleaning device for a magnetic particle flaw detector, which relates to the technical field of magnetic particle flaw detection, including a cleaning box and a cleaning mechanism. The cleaning box is provided with a pair of rotating disks, a dynamic support column and a fixed support column for supporting the rotating disk, the rotating disks are arranged in parallel and symmetrically, the rotating disks are rotatably arranged at one end of the dynamic support column and the fixed support column, the fixed support column is fixedly arranged on the bottom wall of the cleaning box, the dynamic support column is slidably arranged on the bottom wall of the cleaning box, and the dynamic support column is connected to a driving mechanism for controlling its approach and distance from the fixed support column, the rotating disk on the fixed support column is connected to an electric component for controlling its rotation, and the cleaning mechanism includes a water pump and a water spray pipe for spraying cleaning liquid toward the workpiece, one end of the water spray pipe is connected to the cleaning box, and the other end is connected to the water pump. The setting of the cleaning device is convenient for the staff to clean the sample workpiece.

[0004] However, in the implementation of relevant technologies, it was found that the sample cleaning device of the above-mentioned magnetic particle flaw detector has the following problems: when cleaning the workpiece sample, the prior art cleans the workpiece sample by spraying cleaning liquid, and then dries the workpiece sample after the workpiece sample is cleaned. However, this cleaning method is more troublesome, affects work efficiency, and it is also difficult to clean the gaps of the workpiece sample. Therefore, a sample cleaning device of a magnetic particle flaw detector is proposed. Utility Model Content

[0005] The utility model provides a sample cleaning device for a magnetic particle flaw detector, which solves the problems in the related art that cleaning is troublesome, affects work efficiency, and is difficult to clean the gaps of workpiece samples.

[0006] The technical solution of the utility model is as follows: A sample cleaning device for a magnetic particle flaw detector, comprising: a magnetic particle flaw detector body, a moving mechanism 1 is arranged on both sides of the top of the magnetic particle flaw detector body, a U-shaped plate is arranged on the moving mechanism 1, two first connecting plates are relatively fixedly installed on one side of the inner top wall of the U-shaped plate, the bottom ends of the two first connecting plates are fixedly connected to a first electric telescopic rod, the output end of the first electric telescopic rod is fixedly connected to a first arc plate, and the inner wall of the first arc plate is provided with an electromagnet;

[0007] Two second connecting plates are relatively fixedly installed on the other side of the inner top wall of the U-shaped plate, the bottom ends of the two second connecting plates are fixedly connected to the second electric telescopic rods, the output end of the second electric telescopic rod is fixedly connected to the second arc plate, and the inner wall of the second arc plate is provided with a brush;

[0008] A collecting groove is provided on one side of the top of the magnetic particle flaw detector body, a moving mechanism 2 is provided on one side of the inner wall of the collecting groove, and a cleaning mechanism is provided on the moving mechanism 2.

[0009] Preferably, the moving mechanism 1 includes two first slide grooves opened on both sides of the top of the magnetic particle flaw detector body, the interiors of the two first slide grooves are slidably connected with a first slider, and the top of the first slider is connected to the U-shaped plate.

[0010] Preferably, a first motor is fixedly mounted on one side of one of the two first slide grooves, a first screw rod is fixedly connected to an output end of the first motor, and an outer side wall of the first screw rod is threadedly connected to the first sliding block.

[0011] Preferably, the second moving mechanism comprises a second sliding groove opened on one side of the inner wall of the collecting groove, and a second sliding block is slidably connected inside the second sliding groove.

[0012] Preferably, a second motor is fixedly mounted on one side of the inner wall of the second slide groove, a second screw rod is fixedly connected to the output end of the second motor, and an outer side wall of the second screw rod is threadedly connected to the second sliding block.

[0013] Preferably, the cleaning mechanism comprises an L-shaped plate fixedly mounted on one side of the second sliding block, and a curved brush plate is fixedly connected to the top end of the L-shaped plate.

[0014] Preferably, four supporting legs are fixedly mounted on the bottom of the magnetic particle flaw detector body, and the four supporting legs are distributed at the four corners of the bottom of the magnetic particle flaw detector body.

[0015] The working principle and beneficial effects of the utility model are:

[0016] The U-shaped plate is driven to move by a moving mechanism. When the first curved plate moves to the top of the sample workpiece, the first electric telescopic rod is started, which pushes the first curved plate to move downward, and the magnetic powder on the sample workpiece is adsorbed by starting the electromagnet. After the magnetic powder is adsorbed, the U-shaped plate is driven to move again by a moving mechanism. When the second curved plate moves to the top of the sample workpiece, the second electric telescopic rod is started, which pushes the second curved plate to move downward, so that the brush on the second curved plate contacts the sample workpiece. At this time, the magnetic particle flaw detector body is started, so that the workpiece clamping device in the magnetic particle flaw detector body drives the sample workpiece to rotate, thereby achieving the purpose of cleaning the gap of the sample workpiece with the brush, and effectively improving the work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0018] Figure 1 It is a schematic diagram of the overall three-dimensional structure of the utility model;

[0019] Figure 2 It is a schematic diagram of the overall side-view stereoscopic structure of the utility model;

[0020] Figure 3 It is a schematic diagram of a partial three-dimensional structure of a U-shaped plate of the utility model;

[0021] Figure 4 It is a schematic diagram of a partial cross-section of the three-dimensional structure of the magnetic particle flaw detector body of the utility model.

[0022] In the figure: 1. magnetic particle flaw detector body; 2. U-shaped plate; 3. first connecting plate; 4. first electric telescopic rod; 5. first arc plate; 6. electromagnet; 7. second connecting plate; 8. second electric telescopic rod; 9. second arc plate; 10. brush; 11. collecting trough; 12. moving mechanism 1; 13. moving mechanism 2; 14. cleaning mechanism; 15. supporting leg; 120. first slide groove; 121. first slider; 122. first motor; 123. first screw rod; 130. second slide groove; 131. second slider; 132. second motor; 133. second screw rod; 140. L-shaped plate; 141. arc brush plate. DETAILED DESCRIPTION

[0023] The following will be combined with the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0024] Embodiment 1

[0025] See also Figure 1 - Figure 4 A sample cleaning device for a magnetic particle flaw detector comprises: a magnetic particle flaw detector body 1, a moving mechanism 12 is arranged on both sides of the top of the magnetic particle flaw detector body 1, a U-shaped plate 2 is arranged on the moving mechanism 12, two first connecting plates 3 are relatively fixedly installed on one side of the inner top wall of the U-shaped plate 2, the bottom ends of the two first connecting plates 3 are fixedly connected to a first electric telescopic rod 4, the output end of the first electric telescopic rod 4 is fixedly connected to a first arc plate 5, and the inner wall of the first arc plate 5 is provided with an electromagnet 6;

[0026] Two second connecting plates 7 are relatively fixedly installed on the other side of the inner top wall of the U-shaped plate 2, the bottom ends of the two second connecting plates 7 are fixedly connected to the second electric telescopic rods 8, the output ends of the second electric telescopic rods 8 are fixedly connected to the second arc-shaped plate 9, and the inner wall of the second arc-shaped plate 9 is provided with a brush 10;

[0027] A collecting tank 11 is provided on one side of the top of the magnetic particle flaw detector body 1 , a moving mechanism 13 is provided on one side of the inner wall of the collecting tank 11 , and a cleaning mechanism 14 is provided on the moving mechanism 13 .

[0028] The technical scheme provided by the utility model is that the U-shaped plate 2 is driven to move by a moving mechanism 12. When the first curved plate 5 moves to the top of the sample workpiece, the first electric telescopic rod 4 is started, the first electric telescopic rod 4 pushes the first curved plate 5 to move downward, and the magnetic powder on the sample workpiece is adsorbed by the electromagnet 6. After the magnetic powder is adsorbed, the U-shaped plate 2 is driven to move again by the moving mechanism 12. When the second curved plate 9 moves to the top of the sample workpiece, the second electric telescopic rod 8 is started, the second electric telescopic rod 8 pushes the second curved plate 9 to move downward, so that the brush 10 on the second curved plate 9 contacts the sample workpiece. At this time, the magnetic particle flaw detector body 1 is started, so that the workpiece clamping device in the magnetic particle flaw detector body 1 drives the sample workpiece to rotate, thereby achieving the purpose of cleaning the gap of the sample workpiece with the brush 10, and effectively improving the work efficiency.

[0029] Furthermore, the moving mechanism 12 includes two first slide grooves 120 opened on both sides of the top of the magnetic particle flaw detector body 1, the two first slide grooves 120 are internally slidably connected with a first slider 121, the top of the first slider 121 is connected to the U-shaped plate 2, and a first motor 122 is fixedly installed on one side of the two first slide grooves 120, and the output end of the first motor 122 is fixedly connected with a first screw rod 123, and the outer wall of the first screw rod 123 is threadedly connected to the first slider 121.

[0030] Specifically, by starting the first motor 122, the first motor 122 drives the first screw rod 123 to rotate inside the first slide groove 120, and the first slider 121 is linked to slide inside the first slide groove 120, thereby driving the first curved plate 5 and the second curved plate 9 on the U-shaped plate 2 to move, thereby facilitating the cleaning of the sample workpiece.

[0031] Furthermore, four support legs 15 are fixedly installed at the bottom of the magnetic particle flaw detector body 1 , and the four support legs 15 are distributed at four corners of the bottom of the magnetic particle flaw detector body 1 .

[0032] Specifically, the support legs 15 are used to support the magnetic particle flaw detector body 1, thereby effectively improving the stability of the magnetic particle flaw detector body 1.

[0033] Embodiment 2

[0034] Based on Example 1, in this embodiment: the moving mechanism 13 includes a second slide groove 130 opened on one side of the inner wall of the collecting trough 11, the second slide groove 130 is slidably connected to the inside of the second slide groove 131, a second motor 132 is fixedly installed on one side of the inner wall of the second slide groove 130, the output end of the second motor 132 is fixedly connected to a second screw rod 133, the outer wall of the second screw rod 133 is threadedly connected to the second slider 131, and the cleaning mechanism 14 includes an L-shaped plate 140 fixedly installed on one side of the second slider 131, and the top of the L-shaped plate 140 is fixedly connected to an arc-shaped brush plate 141.

[0035] The technical solution provided by this embodiment is as follows: after the sample workpiece is cleaned, the first curved plate 5 is driven to move to the top of the collecting tank 11 by the moving mechanism 12, and the electromagnet 6 is turned off so that the magnetic powder adsorbed by the electromagnet 6 falls into the inside of the collecting tank 11 for collection, and at the same time, the second electric telescopic rod 8 is started, and the second electric telescopic rod 8 pushes the first curved plate 5 to move downward, so that the electromagnet 6 on the first curved plate 5 contacts the brush on the curved brush plate 141, and the second motor 132 is started, and the second motor 132 drives the second screw rod 133 to rotate inside the second slide groove 130, and the second slider 131 is linked to slide inside the second slide groove 130, so that the brush on the curved brush plate 141 cleans the magnetic powder remaining on the electromagnet 6.

[0036] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A sample cleaning device for a magnetic particle flaw detector, characterized in that: include: A magnetic particle flaw detector body (1), wherein two sides of the top of the magnetic particle flaw detector body (1) are provided with a moving mechanism (12), a U-shaped plate (2) is provided on the moving mechanism (12), two first connecting plates (3) are relatively fixedly installed on one side of the inner top wall of the U-shaped plate (2), the bottom ends of the two first connecting plates (3) are fixedly connected to a first electric telescopic rod (4), the output end of the first electric telescopic rod (4) is fixedly connected to a first arc plate (5), and the inner wall of the first arc plate (5) is provided with an electromagnet (6); Two second connecting plates (7) are relatively fixedly installed on the other side of the inner top wall of the U-shaped plate (2), the bottom ends of the two second connecting plates (7) are fixedly connected to second electric telescopic rods (8), the output ends of the second electric telescopic rods (8) are fixedly connected to a second arc-shaped plate (9), and the inner wall of the second arc-shaped plate (9) is provided with a brush (10); A collecting groove (11) is provided on one side of the top of the magnetic particle flaw detector body (1), a moving mechanism (13) is provided on one side of the inner wall of the collecting groove (11), and a cleaning mechanism (14) is provided on the moving mechanism (13).

2. The sample cleaning device for a magnetic particle flaw detector according to claim 1, characterized in that: The moving mechanism (12) comprises two first slide grooves (120) provided on both sides of the top of the magnetic particle flaw detector body (1), the interiors of the two first slide grooves (120) are slidably connected with first sliders (121), and the top of the first sliders (121) is connected to the U-shaped plate (2).

3. The sample cleaning device for a magnetic particle flaw detector according to claim 2, characterized in that: A first motor (122) is fixedly mounted on one side of one of the two first slide grooves (120); a first screw rod (123) is fixedly connected to the output end of the first motor (122); and an outer wall of the first screw rod (123) is threadedly connected to the first sliding block (121).

4. The sample cleaning device for a magnetic particle flaw detector according to claim 1, characterized in that: The second moving mechanism (13) comprises a second sliding groove (130) opened on one side of the inner wall of the collecting groove (11), and a second sliding block (131) is slidably connected inside the second sliding groove (130).

5. The sample cleaning device for a magnetic particle flaw detector according to claim 4, characterized in that: A second motor (132) is fixedly mounted on one side of the inner wall of the second slide groove (130), a second screw rod (133) is fixedly connected to the output end of the second motor (132), and an outer wall of the second screw rod (133) is threadedly connected to the second sliding block (131).

6. The sample cleaning device for a magnetic particle flaw detector according to claim 5, characterized in that: The cleaning mechanism (14) comprises an L-shaped plate (140) fixedly mounted on one side of the second sliding block (131), and a curved brush plate (141) is fixedly connected to the top end of the L-shaped plate (140).

7. The sample cleaning device for a magnetic particle flaw detector according to claim 1, characterized in that: Four support legs (15) are fixedly mounted on the bottom of the magnetic particle flaw detector body (1), and the four support legs (15) are distributed at the four corners of the bottom of the magnetic particle flaw detector body (1).

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