Detection supporting device for linear array cloth inspecting machine

By designing a detection support device for linear array fabric verification machines, including an adjustable cloth inspection table and linear guides, the problem of inconsistent sagging heights of different gram weight fabrics is solved, reducing the occurrence of wrinkles and improving the clarity of detection.

CN222671679UActive Publication Date: 2025-03-25ZHEJIANG ZHIXIN INTELLIGENT CONTROL EQUIP CO LTD
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Patent Information

Application Number
CN202421621628.9
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-07-10
Publication Date
2025-03-25
Estimated Expiration
2034-07-10

AI Technical Summary

Technical Problem

The existing fabric inspection machines cannot automatically adjust according to the thickness of the fabric, resulting in different sagging heights of fabrics of different grams of weight, forming wrinkles, affecting the clarity of photography inspection.

Method used

A detection support device for a linear array cloth inspection machine is designed, including a cloth inspection table and two linear guide rails. The cloth inspection table has a light-transmitting hole and an adjustable guide portion. It is connected by the slider of the linear guide rail to realize the up and down movement of the cloth inspection table and adapt to fabrics of different thicknesses.

Benefits of technology

By adjusting the height of the support device, the contact between the fabric and the inspection table is reduced, the occurrence of wrinkles is reduced, and the flatness of the fabric and the clarity of the detection are improved.

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Abstract

The utility model provides a detection supporting device for a linear array cloth inspecting machine, and belongs to the technical field of machinery. A detection supporting device used on a linear array cloth inspecting machine comprises a cloth inspecting table, the cloth inspecting table is provided with a supporting face, and a light hole is formed in the supporting face in the length direction of the cloth inspecting table; sliding blocks of the two linear guide rails are connected to the two ends of the cloth inspecting table respectively. The supporting device has the advantages that the height of the supporting device is adjusted according to the collapse conditions of different fabrics, the fabrics are in better contact with the supporting device, and wrinkles are reduced.
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Description

Technical Field

[0001] The utility model belongs to the technical field of machinery, in particular to a detection support device used on a linear array fabric inspection machine. Background Art

[0002] In existing fabric inspection machines, when fabric passes through the inspection table, it cannot be automatically adjusted according to the fabric thickness, so the fabrics of different weights sag to different heights. When the fabric weight is high, the sag depth increases, causing the fabric to contact the edge of the inspection table in advance and form wrinkles, especially at the overlapping position of the fabric. This situation may make it impossible to clearly identify fabric defects during photo inspection. Summary of the invention

[0003] The purpose of the utility model is to address the above-mentioned problems in the existing technology and to propose a detection support device for a linear array fabric inspection machine, which has the characteristics of adjusting the height of the support device according to the collapse conditions of different fabrics, so that the fabrics can be better contacted with the support device and wrinkles can be reduced.

[0004] The purpose of the utility model can be achieved through the following technical solutions:

[0005] A detection support device for a linear array fabric inspection machine, comprising:

[0006] A fabric inspection platform, the fabric inspection platform having a support surface, the support surface being provided with light-transmitting holes arranged along the length direction of the fabric inspection platform; and

[0007] Two linear guide rails and sliders of the two linear guide rails are respectively connected to two ends of the fabric inspection table.

[0008] In the above-mentioned detection support device used on the linear array fabric inspection machine, the fabric inspection platform also has guide parts arranged on both sides of the support surface and light blocking parts connected to the guide parts. The light blocking parts are parallel to the support surface, and there are corresponding light-transmitting holes between adjacent light blocking parts.

[0009] In the above-mentioned detection support device used on the linear array fabric inspection machine, the guide portion is in an arc shape.

[0010] In the above detection support device used on the linear array fabric inspection machine, the orthographic projection of the light-transmitting hole is within the interval.

[0011] In the above detection support device for the linear array fabric inspection machine, vertical plates are fixed at both ends of the fabric inspection platform, the vertical plates are connected to the support surface, the guide part, and the light shielding part, and the vertical plates are connected to the slider of the linear guide rail.

[0012] Compared with the prior art, this application has the following advantages:

[0013] In this application, the fabric inspection table is provided with a light-transmitting hole, which means that when the fabric passes through the fabric inspection table, the light-transmitting hole can be used to illuminate the bottom, thereby facilitating the detection of minor defects and quality problems on the fabric surface. The sliders on the two linear guide rails are respectively connected to the two ends of the fabric inspection table, so that the fabric inspection table can move up and down along the guide rails, which provides great flexibility for adjusting the tension and position of the fabric. This structure can adapt to the thickness of fabric and reduce problems caused by sagging or unevenness of the fabric. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a three-dimensional structural diagram in this application;

[0015] Figure 2 yes Figure 1 A cross-sectional view at the AA position.

[0016] In the figure,

[0017] 2. Fabric inspection table; 21. Support surface; 211. Light transmission hole; 22. Guide part; 23. Light shielding part; 231. Spacer; 24. Vertical board;

[0018] 3. Linear guide. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] like Figure 1 to Figure 2 As shown, a detection support device for a linear array fabric inspection machine includes: a fabric inspection platform 2 and two linear guide rails 3. The fabric inspection platform 2 has a support surface 21, and the support surface 21 is provided with light-transmitting holes 211 arranged along the length direction of the fabric inspection platform 2; the sliders of the two linear guide rails 3 are respectively connected to the two ends of the fabric inspection platform 2.

[0021] In the present application, the fabric inspection platform 2 is provided with a light-transmitting hole 211, which means that when the fabric passes through the fabric inspection platform 2, light can pass through the light-transmitting hole 211 for illumination, thereby facilitating the detection of minor defects and quality problems on the fabric surface. The sliders on the two linear guide rails 3 are respectively connected to the two ends of the fabric inspection platform 2, so that the fabric inspection platform 2 can move up and down along the guide rails, which provides great flexibility for adjusting the tension and position of the fabric. This structure can adapt to the thickness of fabric and reduce problems caused by sagging or unevenness of the fabric.

[0022] Specifically, the fabric inspection platform 2 further comprises guide portions 22 arranged on both sides of the support surface 21 and light shielding portions 23 connected to the guide portions 22 . The light shielding portions 23 are parallel to the support surface 21 , and there are intervals 231 corresponding to the light transmission holes 211 between adjacent light shielding portions 23 .

[0023] The light source can enter through the gap 231 and be emitted from the light-transmitting hole 211. After the light enters the interior of the fabric inspection platform 2, part of the light may be reflected internally. These reflected light rays can be shielded by the light-blocking portion 23, so that the interior of the fabric inspection platform 2 is adjusted to be brighter, thereby increasing the brightness and being able to better capture the fabric passing by. Some of the light sources will also be irradiated from the oblique upper side of the fabric inspection platform 231, thereby increasing the brightness.

[0024] Specifically, the guide portion 22 is in an arc shape.

[0025] The curved guide portion 22 can guide the fabric more smoothly, reducing the friction and pulling that may be caused by right angles or sharp edges, which is especially important for delicate or fragile fabrics. The curved design also helps the fabric to pass smoothly, avoiding the fabric from getting stuck or gathering during the guiding process, which not only protects the fabric, but also improves the continuity and efficiency of the detection process.

[0026] Specifically, the orthographic projection of the light-transmitting hole 211 is within the interval 231 .

[0027] This design maximizes direct light utilization and enhances the lighting effect, thereby improving the quality and accuracy of image capture.

[0028] Specifically, vertical plates 24 are fixed at both ends of the fabric inspection platform 2 , the vertical plates 24 are connected to the support surface 21 , the guide portion 22 , and the light shielding portion 23 , and the vertical plates 24 are connected to the slider of the linear guide rail 3 .

[0029] The addition of the vertical plate 24 as a structural support point can increase the stability and rigidity of the entire fabric inspection platform 2. This stability is the key to ensure that the fabric inspection machine maintains accuracy and consistency during operation, especially when processing large fabrics.

[0030] It should be noted that all directional indications in the embodiments of the present invention, such as up, down, left, right, front, back, etc., are only used to explain the relative position relationship and movement status of the components in a certain specific posture, as shown in the accompanying drawings. If the specific posture changes, the directional indication will also change accordingly.

[0031] In addition, the descriptions of "first", "second", etc. in the present invention are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. At the same time, the meaning of "and / or" appearing in the full text is that it includes three schemes. Taking "A and / or B" as an example, it includes scheme A, or scheme B, or a scheme that satisfies both A and B. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0032] The above components are all common standard parts or components known to those skilled in the art, and their structures and principles can be known to those skilled in the art through technical manuals or conventional experimental methods.

[0033] The specific embodiments described herein are merely examples of the spirit of the present invention. Those skilled in the art may make various modifications or additions to the specific embodiments described or replace them in similar ways, but they will not deviate from the spirit of the present invention or exceed the scope defined by the appended claims.

Claims

1. A detection support device for a linear array fabric inspection machine, characterized in that: include: A fabric inspection platform (2), the fabric inspection platform (2) having a support surface (21), the support surface (21) being provided with light-transmitting holes (211) arranged along the length direction of the fabric inspection platform (2); and Two linear guide rails (3), and slide blocks of the two linear guide rails (3) are respectively connected to two ends of the fabric inspection platform (2).

2. The detection support device for a linear array fabric inspection machine according to claim 1 is characterized in that: The fabric inspection platform (2) further comprises guide portions (22) arranged on both sides of the support surface (21) and light shielding portions (23) connected to the guide portions (22); the light shielding portions (23) are parallel to the support surface (21), and there are intervals (231) corresponding to the light-transmitting holes (211) between adjacent light shielding portions (23).

3. The detection support device for a linear array fabric inspection machine according to claim 2 is characterized in that: The guide portion (22) is in an arc shape.

4. The detection support device for a linear array fabric inspection machine according to claim 3 is characterized in that: The orthographic projection of the light-transmitting hole (211) is located within the interval (231).

5. The detection support device for a linear array fabric inspection machine according to claim 4, characterized in that: Vertical plates (24) are fixed at both ends of the fabric inspection platform (2); the vertical plates (24) are connected to the support surface (21), the guide portion (22), and the light shielding portion (23); and the vertical plates (24) are connected to the slider of the linear guide rail (3).