Chip PTC test fixture

Abstract

The utility model belongs to the technical field of jigs, particularly relates to a chip PTC test jig, and aims to solve the problems that a conventional test jig is complex in structure for fixing a chip, poor in fixing effect, poor in contact effect between the chip and an electrode in the fixing process and the like, and provides the following scheme: the chip PTC test jig comprises a base, the top of the base is fixedly provided with a supporting seat, the top of the supporting seat is fixedly provided with a testing seat, the top of the testing seat is provided with a testing groove, and a plurality of chip main bodies are arranged in the testing groove. Meanwhile, the stable and reliable contact between the electrode and the chip is realized, the test efficiency and the operation convenience are improved through the convenient chip fixation and the flexible test environment control, in addition, the stability of the jig is ensured through the mounting holes of the base, and the use effect of the jig is better.

Description

Technical Field

[0001] The utility model relates to the technical field of fixtures, in particular to a chip PTC test fixture. Background Art

[0002] In the field of semiconductor chip manufacturing and testing, PTC testing is one of the key links in evaluating chip performance. This test measures the resistance change of the chip at different temperatures to evaluate the stability and reliability of the chip under different working environments. However, the use of traditional chip PTC test fixtures still has some problems and is difficult to meet the needs of modern production lines.

[0003] Traditional test fixtures often use complex mechanical structures for chip fixation and electrode contact, which not only increases manufacturing costs, but also reduces the versatility and flexibility of the test fixtures. At the same time, traditional test fixtures often find it difficult to ensure that the contact between the electrodes and the chip is sufficiently stable and reliable during the test process, which may lead to inaccurate test results or even damage the chip.

[0004] In view of the above problems, the present utility model document proposes a chip PTC test fixture. Utility Model Content

[0005] The purpose of the utility model is to solve the shortcomings of the prior art that the structure of the traditional test fixture for fixing the chip is relatively complex, the fixing effect is not good enough, and the contact effect between the chip and the electrode during fixing is not good enough, and a chip PTC test fixture is proposed.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] A chip PTC test fixture, comprising:

[0008] A base, a support base is fixedly installed on the top of the base, a test base is fixedly installed on the top of the support base, a test slot is opened on the top of the test base, and a plurality of chip bodies are arranged in the test slot;

[0009] It also includes a plurality of first electrodes and a plurality of second electrodes, wherein the plurality of second electrodes are fixedly mounted on one side of the test slot, an L-shaped sliding plate is fixedly mounted on one side of the plurality of first electrodes, and the plurality of L-shaped sliding plates are slidably arranged on the bottom inner wall of the test slot, and the plurality of first electrodes correspond to adjacent second electrodes, and both are matched with corresponding chip bodies, and are used to energize the chip bodies to be tested;

[0010] It also includes a control box, which is fixedly mounted on the top of the base, and is electrically connected to the plurality of first electrodes and the plurality of second electrodes to complete the transmission of the test current;

[0011] It also includes a plurality of fixing components, and the plurality of fixing components are used to press and fix a plurality of chip bodies.

[0012] In one possible design, a plurality of clearance grooves are provided inside the test seat, and the plurality of clearance grooves all penetrate the bottom inner wall of the test slot, and the interiors of the plurality of clearance grooves are all slidably connected with sliders, and the plurality of sliders are respectively fixedly connected to the bottoms of corresponding L-shaped sliding plates, and a spring is fixedly installed on the inner wall on one side of the plurality of clearance grooves, and the other ends of the plurality of springs are fixedly connected to one side of an adjacent slider, and the plurality of springs are used to enable the plurality of L-shaped sliding plates to drive the corresponding first electrodes to continuously abut against adjacent chip bodies.

[0013] In a possible design, the fixing assembly includes two fixing plates fixedly mounted on the top of the test seat, the two fixing plates rotatably penetrate the same pressing frame, one end of the pressing frame is bent downward to a certain extent and abuts against the top of the corresponding chip body, the outer wall fixing sleeve of the pressing frame is provided with a fixing ring, the fixing ring is located between the two fixing plates, the outer wall sleeve of the pressing frame is provided with a torsion spring, one end of the torsion spring is fixedly connected to one side of the fixing ring, and the other end of the torsion spring is fixedly connected to one side of the fixing plate away from the fixing ring.

[0014] In a possible design, a groove is provided on the top of the support seat, a heating plate is fixedly mounted on the bottom inner wall of the groove, the heating plate corresponds to the test slot, and the heating plate is used to adjust the test environment temperature of multiple chip bodies.

[0015] In a possible design, an arc-shaped groove is formed on the inner wall of the bottom of the test slot. The arc-shaped groove is located near the second electrode. The arc-shaped groove is used to facilitate the quick picking up of the chip body after the test is completed.

[0016] In a possible design, a plurality of mounting holes are provided on the base, and the plurality of mounting holes enable a user to stably install and fix the base.

[0017] In a possible design, the outer walls of the plurality of fixing rings are each provided with a plurality of protrusions, and the plurality of protrusions are used to facilitate the movement of the fixing rings.

[0018] In the present application, when in use, the user can first complete the fixing of the base, and then the user only needs to place the chip body to be tested in the test slot, and then push the sliding plate to separate the first electrode and the second electrode, and then place the chip body between the first electrode and the second electrode. After stopping pushing the first electrode, under the action of the spring, the first electrode will continue to abut the chip body to complete the close contact between the first electrode, the second electrode and the two sides of the chip body. Then the user can lift one end of the pressing frame and adjust the position of the chip body so that the pressing frame can be pressed on the top of the chip body to ensure that the chip body does not move; after completing the installation of the chip body, the user can power on the installed chip body through the control box to complete the test of the chip body. During the test, the user can also start the heating plate to heat the inside of the test slot from below to test the working performance of the chip body at different ambient temperatures; after the test, the user can directly lift the pressing frame or turn the fixing ring to complete the lifting of one end of the pressing frame, and then the user can take out the chip body and replace it with a new batch of chip bodies for testing to ensure the continuous progress of the test.

[0019] Beneficial effects:

[0020] In the utility model, the chip PTC test fixture adopts a simple base, a support seat, a test seat and other structures, which reduces the complex mechanical structure in the traditional test fixture, reduces the manufacturing cost, and improves the versatility and flexibility of the test fixture;

[0021] In the utility model, the chip PTC test fixture, by designing the first electrode and the second electrode, and cooperating with the L-shaped sliding plate and the spring and other structures, realizes stable and reliable contact between the electrode and the chip, effectively ensures the accuracy of the test results, and reduces the risk of damage to the chip;

[0022] In the utility model, the chip PTC test fixture, through a fixing component, utilizes structures such as a pressing frame and a torsion spring to achieve convenient fixation of the chip, improves the test efficiency, reduces the difficulty of operation, and can also adapt to the installation and fixation of chips of different specifications, meeting the testing requirements of different chips.

[0023] In the utility model, the chip PTC test fixture simplifies the structure and reduces the cost, while achieving stable and reliable contact between the electrode and the chip, ensuring the accuracy of the test results, and improving the test efficiency and operational convenience through convenient chip fixation and flexible test environment control. In addition, the arc-shaped groove design at the bottom of the test slot facilitates chip removal, and the mounting hole of the base ensures the stability of the fixture, which is conducive to better use of the fixture. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1A three-dimensional structural schematic diagram of a chip PTC test fixture proposed by the utility model;

[0025] Figure 2 This is a schematic diagram of a side cross-sectional structure of a chip PTC test fixture proposed by the utility model;

[0026] Figure 3 This is a schematic diagram of the test socket structure of a chip PTC test fixture proposed by the utility model;

[0027] Figure 4 The utility model is a schematic diagram of the disassembly structure of the fixed components of a chip PTC test fixture.

[0028] In the figure: 1. base; 2. support base; 3. test base; 4. test slot; 5. chip body; 6. control box; 7. heating plate; 8. give way slot; 9. slider; 10. L-shaped sliding plate; 11. spring; 12. first electrode; 13. second electrode; 14. arc-shaped groove; 15. pressing frame; 16. fixing plate; 17. fixing ring; 18. torsion spring; 19. mounting hole. DETAILED DESCRIPTION

[0029] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0030] Example 1

[0031] Reference Figure 1-4 , a fixture, comprising:

[0032] The base 1 has a support base 2 fixedly mounted on the top of the base 1, a test base 3 further fixedly mounted on the top of the support base 2, and a test slot 4 for placing a chip body is provided on the top of the test base 3. A plurality of chip bodies 5 to be tested can be placed in the test slot 4.

[0033] In order to realize the power-on test of the chip body 5, the present embodiment provides a plurality of first electrodes 12 and a plurality of second electrodes 13. The plurality of second electrodes 13 are fixedly mounted on one side of the test slot 4, and the plurality of first electrodes 12 are slidably connected to the bottom inner wall of the test slot 4 through the L-shaped sliding plate 10. Specifically, a corresponding first electrode 12 is fixedly mounted on one side of each L-shaped sliding plate 10, and the bottom of the L-shaped sliding plate 10 is slidably connected to the bottom inner wall of the test slot 4. Such a design enables the first electrode 12 to move to a certain extent in the horizontal direction to adapt to chip bodies 5 of different sizes. At the same time, the plurality of first electrodes 12 correspond to adjacent second electrodes 13, and both cooperate with the corresponding chip body 5 to power on the chip body 5 to be tested.

[0034] Furthermore, a plurality of clearance grooves 8 are provided inside the test seat 3, and these clearance grooves 8 all penetrate the bottom inner wall of the test slot 4, and a slider 9 is slidably connected inside the clearance groove 8, and the bottom of the slider 9 is fixedly connected to the bottom of the L-shaped sliding plate 10. At the same time, a spring 11 is fixedly installed on the inner wall of one side of the clearance groove 8, and the other end of the spring 11 is fixedly connected to one side of the adjacent slider 9. Such a design enables the L-shaped sliding plate 10 and the corresponding first electrode 12 to continuously abut against the adjacent chip body 5 under the action of the spring 11, thereby further ensuring the stability of the power-on test.

[0035] In addition, this embodiment also includes a control box 6, which is fixedly installed on the top of the base 1 and is electrically connected to the multiple first electrodes 12 and the multiple second electrodes 13. The control box 6 is provided with corresponding circuits and control elements for completing the transmission and control of the test current.

[0036] In order to ensure the stability of the chip body 5 during the test process, the present embodiment also designs multiple groups of fixing components; the fixing components include two fixing plates 16 fixedly installed on the top of the test seat 3, and the same pressing frame 15 is rotatably passed through the two fixing plates 16, one end of the pressing frame 15 is bent downward to a certain extent and abuts against the top of the corresponding chip body 5, and a fixing ring 17 is fixedly sleeved on the outer wall of the pressing frame 15, and the fixing ring 17 is located between the two fixing plates 16. In addition, a torsion spring 18 is sleeved on the outer wall of the pressing frame 15, and one end of the torsion spring 18 is fixedly connected to one side of the fixing ring 17, and the other end is fixedly connected to one side of the fixing plate 16 away from the fixing ring 17. Such a design enables the pressing frame 15 to continuously press and abut against the top of the chip body 5 under the action of the torsion spring 18, which can ensure that the chip body 5 can be stably placed in the test slot 4.

[0037] In order to adjust the test environment temperature of the chip body 5, a groove is also opened on the top of the support base 2, and a heating plate 7 is fixedly installed on the bottom inner wall of the groove. The heating plate 7 corresponds to the test slot 4 and is used to adjust the test environment temperature of multiple chip bodies 5. Such a design can simulate the chip working environment at different temperatures, so as to more comprehensively evaluate the performance of the chip. Among them, the heating plate 7 is the same as that in the patent with announcement number CN213278056U.

[0038] In order to facilitate the quick picking up of the chip body 5 after the test is completed, an arc-shaped groove 14 is also provided on the bottom inner wall of the test slot 4. The arc-shaped groove 14 is located close to the second electrode 13. This design allows the user's fingers to be more easily inserted under the chip body 5, thereby easily removing the chip body 5 from the test slot 4.

[0039] The present application can be used in the field of semiconductor chip manufacturing and detection technology, and can also be used in other fields applicable to the present application.

[0040] Example 2

[0041] refer to Figure 1 , 2 3. Improved on the basis of Example 1: a chip PTC test fixture, which is applied to the field of semiconductor chip manufacturing and detection technology;

[0042] Finally, in order to facilitate the user to stably install and fix the base 1, a plurality of mounting holes 19 are provided on the base 1. These mounting holes 19 can be used with fasteners such as bolts to fix the test fixture on a workbench or other fixed positions.

[0043] In order to more conveniently move the fixing ring 17 to lift the pressing frame 15, multiple protrusions are provided on the outer walls of the multiple fixing rings 17. These protrusions increase the friction between the fixing ring 17 and the user's fingers, so that the user can more easily move the fixing ring 17 and thereby lift the pressing frame 15.

[0044] The working principle and use process of the present technical solution are as follows: when in use, the user can first fix the base 1, and then the user only needs to place the chip body 5 to be tested in the test slot 4, and then push the L-shaped sliding plate 10 to separate the first electrode 12 and the second electrode 13, and then place the chip body 5 between the first electrode 12 and the second electrode 13. After stopping pushing the first electrode 12, under the action of the spring 11, the first electrode 12 will continue to abut against the chip body 5, completing the close contact between the first electrode 12, the second electrode 13 and the two sides of the chip body 5, and then the user can lift one end of the pressing frame 15 and adjust the position of the chip body 5 to make the pressing frame 1 5 can be pressed on the top of the chip body 5 to ensure that the chip body 5 does not move; after completing the installation of the chip body 5, the user can power on the installed chip body 5 through the control box 6 to complete the test of the chip body 5. During the test, the user can also start the heating plate 7 to heat the inside of the test slot 4 at the bottom to test the working performance of the chip body 5 at different ambient temperatures; after the test, the user can directly lift the pressing frame 15 or turn the fixing ring 17 to complete the lifting of one end of the pressing frame 15, and then the user can take out the chip body 5, and then replace a new batch of chip bodies 5 for testing, which can ensure the continuous testing.

[0045] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A chip PTC test fixture, characterized in that: include: A base (1), a support base (2) being fixedly mounted on the top of the base (1), a test base (3) being fixedly mounted on the top of the support base (2), a test slot (4) being provided on the top of the test base (3), and a plurality of chip bodies (5) being arranged in the test slot (4); It also comprises a plurality of first electrodes (12) and a plurality of second electrodes (13), wherein the plurality of second electrodes (13) are fixedly mounted on one side of the test slot (4), an L-shaped sliding plate (10) is fixedly mounted on one side of the plurality of first electrodes (12), and the plurality of L-shaped sliding plates (10) are slidably arranged on the bottom inner wall of the test slot (4), and the plurality of first electrodes (12) correspond to adjacent second electrodes (13), and both are matched with corresponding chip bodies (5) for energizing the chip bodies (5) to be tested; It also includes a control box (6), the control box (6) is fixedly mounted on the top of the base (1), and the control box (6) is electrically connected to the plurality of first electrodes (12) and the plurality of second electrodes (13) to complete the transmission of the test current; It also includes a plurality of groups of fixing components, and the plurality of groups of fixing components are used to press and fix a plurality of chip bodies (5).

2. A chip PTC test fixture according to claim 1, characterized in that: The test seat (3) is provided with a plurality of clearance grooves (8) inside, the plurality of clearance grooves (8) all penetrate the bottom inner wall of the test slot (4), the plurality of clearance grooves (8) are slidably connected with sliders (9) inside, the plurality of sliders (9) are respectively fixedly connected to the bottom of the corresponding L-shaped sliding plate (10), a spring (11) is fixedly installed on one side inner wall of the plurality of clearance grooves (8), the other end of the plurality of springs (11) is fixedly connected to one side of an adjacent slider (9), and the plurality of springs (11) are used to enable the plurality of L-shaped sliding plates (10) to drive the corresponding first electrodes (12) to continuously contact the adjacent chip bodies (5).

3. A chip PTC test fixture according to claim 2, characterized in that: The fixing assembly comprises two fixing plates (16) fixedly mounted on the top of the test seat (3); the two fixing plates (16) are rotatably connected to the same pressing frame (15); one end of the pressing frame (15) is bent downward to a certain extent and abuts against the top of the corresponding chip body (5); the outer wall of the pressing frame (15) is fixedly sleeved with a fixing ring (17); the fixing ring (17) is located between the two fixing plates (16); the outer wall of the pressing frame (15) is sleeved with a torsion spring (18); one end of the torsion spring (18) is fixedly connected to one side of the fixing ring (17); and the other end of the torsion spring (18) is fixedly connected to one side of the fixing plate (16) away from the fixing ring (17).

4. A chip PTC test fixture according to claim 1, characterized in that: A groove is provided on the top of the support seat (2), and a heating plate (7) is fixedly mounted on the inner wall of the bottom of the groove. The heating plate (7) corresponds to the test slot (4), and the heating plate (7) is used to adjust the test environment temperature of the plurality of chip bodies (5).

5. A chip PTC test fixture according to claim 2, characterized in that: The bottom inner wall of the test slot (4) is provided with an arc-shaped groove (14), the arc-shaped groove (14) is located near the second electrode (13), and the arc-shaped groove (14) is used to facilitate the rapid picking up of the chip body (5) after the test is completed.

6. A chip PTC test fixture according to claim 1, characterized in that: The base (1) is provided with a plurality of mounting holes (19), and the plurality of mounting holes (19) enable a user to stably mount and fix the base (1).

7. A chip PTC test fixture according to claim 3, characterized in that: The outer walls of the plurality of fixing rings (17) are each provided with a plurality of protrusions, and the plurality of protrusions are used to facilitate the movement of the fixing rings (17).

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