Test fixture and mechanical equipment for flexible circuit board
By designing a test fixture for flexible circuit boards, the effective area is depressed downward and the test probe height design, the problem of the flexible circuit board easily causing compression during electrical testing is solved, and the protective effect of probe bending and foreign object intrusion is achieved.
Patent Information
- Application Number
- CN202421053794.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-14
- Publication Date
- 2025-04-15
- Estimated Expiration
- 2034-05-14
AI Technical Summary
In the prior art, flexible circuit boards are prone to compression injuries during electrical testing, which are mainly due to bending probes and foreign objects, which are difficult to avoid.
A test fixture for flexible circuit boards is designed, including support structures, fixed structures and test probes. The effective area is sunk downward, the height of the test probe is higher than the height of the supporting convex, and only contacts the flexible circuit board in the effective area to avoid compression caused by bending of the probe.
It effectively avoids large-area compression of flexible circuit board caused by bending of the test probe, and prevents foreign objects from entering the effective area by designing the supporting protrusions and waste areas and avoids compression.
Smart Images
Figure CN222762199U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of electronic technology, in particular to a test fixture and mechanical equipment for a flexible circuit board. Background Art
[0002] Flexible Printed Circuit (FPC) is a highly reliable and extremely flexible printed circuit board made of polyimide or polyester film. With the birth and development of flexible circuit boards, their application scenarios are becoming more and more extensive. Flexible circuit boards have the characteristics of high wiring density, light weight, thin thickness, and good bendability; therefore, it is very important to test the functionality and stability of the flexible board before shipment. Related testing machines were born to test the functionality of flexible circuit boards in a quick and effective way.
[0003] The advantage of the test machine in the existing technology is that the test is fast and accurate, and it has preliminary automation functions; the disadvantage is that different flexible boards require different fixtures to be made for testing, which involves the importance of fixtures. Different fixtures are made according to different flexible board circuit materials and have different probe structures. They usually have a long service life and are easy to load and unload. However, foreign matter and existing probe materials limit the long-term reuse of the fixture. Once the number of pressing times is too many, the probe is easy to bend, causing the flexible board to be crushed. There are no visible signs of foreign particles and probe bending before the naked eye, and the crushing caused by this reason is more troublesome.
[0004] The above contents are only used to assist in understanding the technical solution of the present utility model and do not constitute an admission that the above contents are prior art. Utility Model Content
[0005] The main purpose of the utility model is to provide a guiding structure and production equipment for a flexible circuit board, aiming to solve the problem in the prior art that the flexible circuit board is easily crushed during the electrical measurement process.
[0006] In order to achieve the above object, the utility model provides a test fixture for a flexible circuit board, the test fixture for a flexible circuit board comprising:
[0007] The support structure comprises an effective area and a waste area located outside the effective area, wherein the effective area is recessed downwards and the waste area is provided with a supporting convex portion;
[0008] a fixed structure, disposed below the supporting structure and fixed to the supporting structure in the waste area, wherein a fixed area is provided on the fixed structure at a position corresponding to the effective area; and
[0009] A test probe, having a fixed end and a test end respectively located at two ends, wherein the fixed end is installed in the fixed area, the test end extends upward to the support structure and extends out of the effective area, and the test end is spaced apart from the support protrusion;
[0010] Wherein, the height of the test end is higher than the height of the supporting protrusion.
[0011] Preferably, in the test fixture for the flexible circuit board, the height difference between the test end and the supporting protrusion is ΔH, and 0.02 mm≤ΔH≤0.05 mm.
[0012] Preferably, in the test fixture for the flexible circuit board, ΔH is 0.02 mm.
[0013] Preferably, in the test fixture for the flexible circuit board, the downward depression depth of the effective area is H1, the thickness of the support structure is H, and 0.6 mm≤H1<H.
[0014] Preferably, in the test fixture for the flexible circuit board, the support structure includes a plurality of support plates, which are stacked together in the up and down directions, and each support plate is penetrated by a first guide hole for the test probe to pass through, and the plurality of support plates can move relative to each other in the lateral direction to adjust the extension direction of the test probe.
[0015] Preferably, in the test fixture for the flexible circuit board, the number of layers of the multi-layer support board is N1, and N1≥3.
[0016] Preferably, in the test fixture for the flexible circuit board, the fixing structure includes a plurality of fixing plates, which are stacked together in the up and down directions, and each fixing plate is penetrated by a second guide hole for the test probe to pass through, and the plurality of fixing plates can move relatively in the lateral direction to adjust the extension direction of the test probe.
[0017] Preferably, in the test fixture for the flexible circuit board, the number of layers of the multi-layer fixing plate is N2, and N2≥3.
[0018] Preferably, in the test fixture for the flexible circuit board, the support structure and the fixed structure are fixed by a support column, and the support column is extended in the up-down direction.
[0019] In order to achieve the above-mentioned object, the utility model provides a mechanical device, including the above-mentioned test fixture for a flexible circuit board.
[0020] The utility model has at least the following beneficial effects:
[0021] The test fixture for a flexible circuit board provided by the utility model, when the product to be tested is placed on the test probe for testing, since the effective area is concave downward, the height of the test probe is higher than the height of the supporting protrusion, and only the test probe contacts the flexible circuit board. In this way, once the test probe is bent due to external reasons or too many tests, when the height of the test probe is lower than the supporting protrusion, the flexible circuit board will not be crushed even if the test probe is not found to be bent, thus avoiding large-area crushing caused by the bending of the test probe;
[0022] Furthermore, the support convex part is set in the waste area, and the effective area has no support. Even if foreign matter sticks to the support convex part, it will not cause the product to be tested to be crushed. Foreign matter in the effective area will not be pressed on the product to be tested due to the effect of the support convex part. The effective area is set concave downward, so that foreign matter in the effective area will not be pressed on the product to be tested, effectively avoiding foreign matter in the effective area from causing crushing during the press test.
[0023] Furthermore, the waste area is located outside the effective area, and the waste area is separated from the effective area, which can limit foreign matter from entering the test area. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] Figure 1 It is a schematic diagram of an embodiment of a test fixture for a flexible circuit board provided by the utility model;
[0025] Figure 2 for Figure 1 The enlarged schematic diagram of point A in the middle;
[0026] Figure 3 This is a partial diagram of the test fixture for a flexible circuit board provided by the utility model when testing a product to be tested.
[0027] Label name Label name 100 Test fixture for flexible circuit boards 22 Fixed plate 1 Support structure 3 Test probe 11 Valid area 31 Fixed end 12 Waste area 32 Test terminal 121 support convex part 4 Support column 13 Support plate 200 Products to be tested 2 Fixed structure 210 Effective area 21 Fixed area 220 Invalid area
[0028] The realization of the purpose, functional features and advantages of the utility model will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION
[0029] In the embodiments of the present invention, the term "and / or" describes the association relationship of the associated objects, indicating that three relationships may exist. For example, A and / or B may represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the associated objects before and after are in an "or" relationship.
[0030] It should be noted that the terms "first", "second", etc. in the specification and claims of the utility model and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.
[0031] The term "plurality" in the embodiments of the present invention refers to two or more than two, and other quantifiers are similar thereto.
[0032] In the present invention, unless otherwise specified, the directional words used, such as "up, down, top, bottom", usually refer to the directions shown in the drawings, or to the components themselves in the vertical, perpendicular or gravity directions; similarly, for ease of understanding and description, "inside and outside" refer to the inside and outside relative to the outline of each component itself, but the above-mentioned directional words are not used to limit the present invention.
[0033] In order to make the purpose, technical scheme and advantages of the embodiments of the utility model clearer, the embodiments of the utility model will be described in detail below in conjunction with the accompanying drawings. However, it can be understood by those skilled in the art that in the embodiments of the utility model, many technical details are proposed in order to enable readers to better understand the utility model. However, even without these technical details and various changes and modifications based on the following embodiments, the technical scheme claimed for protection of the utility model can also be implemented. The division of the following embodiments is for the convenience of description and should not constitute any limitation on the specific implementation of the utility model. The various embodiments can be combined and referenced with each other under the premise of no contradiction.
[0034] The utility model provides a test fixture for a flexible circuit board, such as Figures 1 to 3 As shown, the test fixture 100 for a flexible circuit board includes a support structure 1, a fixed structure 2, and a test probe 3. The support structure 1 includes an effective area 11 and a waste area 12 located outside the effective area 11, the effective area 11 is recessed downward, and the waste area 12 is provided with a supporting protrusion 121; the fixed structure 2 is arranged below the support structure 1 and fixed to the support structure 1 in the waste area 12, and a fixed area 21 is provided on the fixed structure 2 at a position corresponding to the effective area 11; the test probe 3 has a fixed end 31 and a test end 32 respectively located at both ends, the fixed end 31 is installed in the fixed area 21, the test end 32 extends upward to the support structure 1 and extends out of the effective area 11, and the test end 32 is spaced apart from the supporting protrusion 121; wherein the height of the test end 32 is higher than the height of the supporting protrusion 121.
[0035] The advantage of the test machine in the existing technology is that the test is fast and accurate, and it has preliminary automation functions; the disadvantage is that different flexible boards require different fixtures to be made for testing, which involves the importance of fixtures. Different fixtures are made according to different flexible board circuit materials and have different probe structures. They usually have a long service life and are easy to load and unload. However, foreign matter and existing probe materials limit the long-term reuse of the fixture. Once the number of pressing times is too many, the probe is easy to bend, causing the flexible board to be crushed. There are no visible signs of foreign particles and probe bending before the naked eye, and the crushing caused by this reason is more troublesome.
[0036] When the product to be tested 200 is placed on the test probe 3 for testing, since the effective area 11 is concave downward, the height of the test probe 3 is higher than the height of the supporting protrusion 121, and only the test probe 3 is in contact with the flexible circuit board. In this way, once the test probe 3 is bent due to external reasons or too many tests, when the height of the test probe 3 is lower than the supporting protrusion 121, even if the test probe 3 is not found to be bent, the flexible circuit board will not be crushed;
[0037] Furthermore, the support protrusion 121 is arranged in the waste area 12, and the effective area 11 has no support (all supports are arranged in the waste area 12), so even if foreign matter sticks to the support protrusion 121, it will not cause the product to be tested 200 to be crushed, and the foreign matter in the effective area 11 will not be pressed on the product to be tested 200 due to the effect of the support protrusion 121. The effective area 11 is arranged to be concave downward, so that the foreign matter in the effective area 11 will not be pressed on the product to be tested 200.
[0038] Furthermore, the waste area 12 is located outside the effective area 11, and the waste area 12 is separated from the effective area 11, which can limit foreign matter from entering the test area.
[0039] It should be noted that the product to be tested 200 includes an effective area 210 and a waste area 220, wherein the effective area 210 corresponds to the effective area 11 of the test fixture 100 for flexible circuit boards, and the waste area 220 corresponds to the waste area 12 of the test fixture 100 for flexible circuit boards.
[0040] The height of the test probe 3 is usually slightly higher than the supporting protrusion 121, so that the test probe 3 can be prevented from being easily bent without affecting the test. The height difference between the test end 32 and the supporting protrusion 121 is ΔH. If ΔH is too large, the test probe 3 is easily bent, and if ΔH is too small, it will not work. Therefore, in this embodiment, 0.02mm≤ΔH≤0.05mm. In this embodiment, ΔH is 0.02mm.
[0041] The depression depth of the effective area 11 is too small, and cannot limit the foreign matter in the effective area 11 from pressing on the product to be tested 200. The depression depth of the effective area 11 is H1, and the thickness of the support structure 1 is H, 0.6mm≤H1<H.
[0042] The test probe 3 is usually thin, so it is necessary to guide and adjust the extension direction of the test probe 3. The support structure 1 includes a plurality of support plates 13, which are stacked together in the up and down direction. Each support plate 13 is provided with a first guide hole for the test probe 3 to pass through. The multi-layer support plate 13 can move relatively in the lateral direction to adjust the extension direction of the test probe 3. When the test probe 3 passes through the first guide hole of the multi-layer support plate 13 in sequence, there is usually a certain slope. The inclination of the test probe 3 can be adjusted by setting the multi-layer support plate 13. The number of support plates 13 can be two, three, four, ... In this embodiment, in order to improve the accuracy, the number of layers of the multi-layer support plate 13 is N1, N1 ≥ 3.
[0043] The test probe 3 is usually thin, so it is necessary to guide and adjust the extension direction of the test probe 3. The fixed structure 2 includes a plurality of fixed plates 22, which are stacked together in the up and down direction. Each fixed plate 22 is provided with a second guide hole for the test probe 3 to pass through. The multi-layer fixed plate 22 can move relatively in the lateral direction to adjust the extension direction of the test probe 3. When the test probe 3 passes through the second guide hole of the multi-layer fixed plate 22 in sequence, there is usually a certain slope. The inclination of the test probe 3 can be adjusted by setting the multi-layer fixed plate 22. The number of fixed plates 22 can be two, three, four, ... In this embodiment, in order to improve the accuracy, the number of layers of the multi-layer fixed plate 22 is N2, N2 ≥ 3.
[0044] The fixed structure 2 is arranged below the support structure 1 and is fixed to the support structure 1 in the waste area 12. There are many ways of fixing, which are not specifically limited here. In this embodiment, the support structure 1 and the fixed structure 2 are fixed by a support column 4, and the support column 4 is extended in the up and down direction. The support column 4 can be a supporting copper column, and the support column 4 is at least arranged in the waste area 12 adjacent to the test probe 3, and at least one support column 4 can be arranged on both sides of each test probe 3. It should be noted that the support column 4 mainly plays a supporting role, but the height of the support column 4 does not exceed the effective area 11 to avoid affecting the test.
[0045] The utility model provides a mechanical device, which includes the above-mentioned test fixture 100 for a flexible circuit board. The embodiment of the mechanical device includes the embodiment of the above-mentioned test fixture 100 for a flexible circuit board. The beneficial effects of the above-mentioned test fixture 100 for a flexible circuit board can be applied to the mechanical device.
[0046] Obviously, the above described embodiments are only a part of the embodiments of the utility model, not all of them. Based on the embodiments of the utility model, ordinary technicians in this field can make other different forms of changes or modifications without creative work, which should fall within the scope of protection of the utility model.
Claims
1. A test fixture for a flexible circuit board, characterized in that: include: The support structure comprises an effective area and a waste area located outside the effective area, wherein the effective area is recessed downwards and the waste area is provided with a supporting convex portion; a fixed structure, disposed below the supporting structure and fixed to the supporting structure in the waste area, wherein a fixed area is provided on the fixed structure at a position corresponding to the effective area; and A test probe, having a fixed end and a test end respectively located at two ends, wherein the fixed end is installed in the fixed area, the test end extends upward to the support structure and extends out of the effective area, and the test end is spaced apart from the support protrusion; Wherein, the height of the test end is higher than the height of the supporting protrusion.
2. The test fixture for a flexible circuit board as claimed in claim 1, characterized in that: A height difference between the test end and the supporting protrusion is ΔH, and 0.02mm≤ΔH≤0.05mm.
3. The test fixture for a flexible circuit board as claimed in claim 2, characterized in that: ΔH is 0.02mm.
4. The test fixture for a flexible circuit board according to claim 1, characterized in that: The effective area is recessed downward to a depth of H1, the thickness of the support structure is H, and 0.6 mm ≤ H1 < H.
5. The test fixture for a flexible circuit board as claimed in claim 1, characterized in that: The support structure includes multiple layers of support plates, which are stacked together in the up and down directions. Each support plate is penetrated by a first guide hole for the test probe to pass through. The multiple layers of support plates can move relatively in the lateral direction to adjust the extension direction of the test probe.
6. The test fixture for a flexible circuit board as claimed in claim 5, characterized in that: The number of layers of the multi-layer support plate is N1, where N1≥3.
7. The test fixture for a flexible circuit board according to claim 1, characterized in that: The fixing structure includes multiple layers of fixing plates, which are stacked together in the up and down directions. Each fixing plate is penetrated by a second guide hole for the test probe to pass through. The multiple layers of fixing plates can move relatively in the lateral direction to adjust the extension direction of the test probe.
8. The test fixture for a flexible circuit board as claimed in claim 7, characterized in that: The number of layers of the multi-layer fixing plate is N2, where N2≥3.
9. The test fixture for a flexible circuit board as claimed in claim 1, characterized in that: The supporting structure and the fixing structure are fixed via a supporting column, and the supporting column is extended in an up-down direction.
10. A mechanical device, characterized in that: A test fixture for a flexible circuit board comprising the test fixture for a flexible circuit board as claimed in any one of claims 1 to 9.