Integrated circuit test socket

Abstract

The utility model discloses an integrated circuit test seat, comprising a test seat main body, the top of the test seat main body is provided with a sealing plate, the bottom of the sealing plate is provided with a pressing seat, the inner wall of the test seat main body is provided with a plurality of groups of grooves, and the inner cavity of each groove is provided with two groups of toothed plates and gears. The top of the toothed plate on the right side is provided with a probe, and the bottom of the inner cavity of the test seat main body is provided with a groove hole. According to the integrated circuit test seat, an integrated circuit board is placed on the toothed plate in the test seat main body to press up and down, the toothed plate is matched with the gear to drive the probe to extend out of the slotted hole for detection, the air pump is started to inject air into the groove from the exhaust pipe and finally exhaust through the slotted hole until the integrated circuit is detected and taken out, and the probe is withdrawn by matching with the limiting rod and the spring. Dust and water vapor are prevented from entering the groove from the groove hole during testing, the purpose of probe protection is achieved, and the problem that a testing probe in an existing testing seat is prone to being contaminated by impurities to be damaged is solved.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing socket. Background Art

[0002] Any integrated circuit is a monolithic module designed to complete certain electrical characteristics and functions. IC testing is the testing of integrated circuits. If there are defect-free products, there is no need for integrated circuit testing. Due to the defects brought about by the actual manufacturing process and the defects of the materials themselves, no matter how perfect the product is, there will be defective individuals. Therefore, testing has become one of the indispensable projects in integrated circuit manufacturing, and integrated circuit test sockets have also become a more commonly used testing equipment.

[0003] At present, most integrated circuit test sockets have the problem that the test probes are easily contaminated by impurities and damaged. For example, in the prior art: CN 217954502 U, an integrated circuit test socket comprises: a test socket, a cover plate is hingedly connected to the surface of the test socket, a pressure block is fixedly installed on the bottom wall of the cover plate, a placement groove is opened on the surface of the test socket, a plurality of placement cavities are opened in the test socket, a plurality of test probes are arranged in the placement cavity, and a through hole connected to the placement cavity is opened inwardly on the bottom wall of the placement groove.

[0004] There are other existing technologies:

[0005] CN 210199154 ​​U, an integrated circuit chip test socket;

[0006] CN 218213141 U, an integrated circuit test socket.

[0007] Although the above-mentioned prior art solutions all use various design methods to achieve the purpose of protecting the test probes, they all have or are similar problems: when using this integrated circuit test socket, the test probe is placed in the placement cavity and sealed and protected with a sealing plate. When testing is required, the sealing plate is removed to allow the test probe to extend. However, the test probe will still be contaminated with external dust and water vapor during the test in the placement cavity, which will result in dust or water vapor moving into the placement cavity with the test probe during the process of retracting the test probe after the test is completed, thereby causing damage to the test probe and affecting subsequent integrated circuit testing. Utility Model Content

[0008] The purpose of the utility model is to provide an integrated circuit test socket to solve the problems raised in the above background technology.

[0009] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: an integrated circuit test socket, comprising a test socket main body, a sealing plate is arranged on the top of the test socket main body, a pressure seat is arranged on the bottom of the sealing plate, a plurality of groups of grooves are opened on the inner wall of the test socket main body, two groups of tooth plates and gears are arranged in the inner cavity of the grooves, a probe is arranged on the top of the tooth plate on the right side, a slot is opened on the bottom of the inner cavity of the test socket main body, a spring and a limit rod are arranged in the inner cavity of the test socket main body, an exhaust duct is arranged on the inner wall of the test socket main body, a second groove is opened on the back of the test socket main body, an air pump and a filter are arranged in the inner cavity of the second groove, a third groove is opened on the top of the test socket main body, an electric push rod is arranged in the inner cavity of the third groove and the top is connected to the sealing plate.

[0010] Preferably, the left tooth plate in the left groove penetrates the inner cavity of the groove and is movable, and the teeth on the two groups of tooth plates are meshed with the gear.

[0011] Preferably, the diameter of the slot hole is larger than that of the probe, the slot hole is communicated with the groove, the exhaust pipe is communicated with the inner cavity of the groove, and the air pump is communicated with the exhaust pipe.

[0012] Preferably, the limiting rod passes through the inner cavity of the tooth plate, the tooth plate on the left side in the groove on the left side can move up and down on the outer ring of the limiting rod, and the spring is located on the tooth plate and arranged on the outer ring of the limiting rod.

[0013] Preferably, a cushion block is provided in the inner cavity of the test seat body, and the cushion block is fixedly connected to the tooth plate on the left side.

[0014] Preferably, a buffer groove is provided at the bottom of the pressure seat, a buffer spring is provided in the inner cavity of the buffer groove, and the bottom of the buffer spring is fixedly connected to the buffer seat.

[0015] Preferably, the outer ring of the pressure seat is provided with a slide groove, the inner cavity of the slide groove is provided with a slider, and the slider is fixedly connected to the buffer seat.

[0016] Preferably, a stabilizing groove is provided on the top of the test seat body, a stabilizing rod is provided in the inner cavity of the stabilizing groove, and the stabilizing rod is fixedly connected to the sealing plate.

[0017] Compared with the prior art, the beneficial effects of the utility model are:

[0018] 1. The integrated circuit test socket uses a groove, a tooth plate, a gear, a probe, a slot hole, an air pump, and an exhaust pipe. The integrated circuit board is placed on the tooth plate in the test socket body and pressed up and down. The gear drives the probe to extend from the slot hole for detection. At the same time, the air pump is turned on to inject air from the exhaust pipe into the groove and finally exhaust it from the slot hole until the integrated circuit is taken out after detection. The probe is retracted with the help of a limit rod and a spring to prevent dust and water vapor from entering the groove from the slot hole during testing, thereby achieving the purpose of probe protection and solving the problem that the test probe in the existing test socket is easily contaminated with impurities and damaged.

[0019] 2. The integrated circuit test seat uses a cushion block, a buffer seat, a buffer groove, a buffer spring, a slide groove, and a slider. When the pressure seat presses the integrated circuit, the buffer seat contacts the integrated circuit first, and cooperates with the buffer spring, the slider in the slide groove, and the cushion block on the tooth plate to achieve the purpose of buffering the integrated circuit and avoiding damage to the integrated circuit caused by hard contact. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a schematic diagram of the structure of the utility model;

[0021] Figure 2 This is a cross-sectional view of the structure of the utility model;

[0022] Figure 3 This is a cross-sectional view of the structure of the utility model;

[0023] Figure 4 It is a schematic diagram of the structure of the utility model.

[0024] In the figure: 1. Test seat body; 2. Sealing plate; 3. Pressure seat; 4. Groove; 5. Tooth plate; 6. Gear; 7. Probe; 8. Slot; 9. Spring; 10. Limit rod; 11. Exhaust duct; 12. Second groove; 13. Air pump; 14. Filter; 15. Pad; 16. Stabilizing groove; 17. Stabilizing rod; 18. Third groove; 19. Electric push rod; 20. Buffer groove; 21. Buffer spring; 22. Buffer seat; 23. Slide groove; 24. Slider. DETAILED DESCRIPTION

[0025] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0026] See also Figure 1-4The utility model provides a technical solution: an integrated circuit test socket, comprising a test socket main body 1, a sealing plate 2 is arranged on the top of the test socket main body 1, a pressure seat 3 is arranged on the bottom of the sealing plate 2, a plurality of groups of grooves 4 are opened on the inner wall of the test socket main body 1, two groups of tooth plates 5 and gears 6 are arranged in the inner cavity of the groove 4, a probe 7 is arranged on the top of the right tooth plate 5, a slot 8 is opened on the bottom of the inner cavity of the test socket main body 1, a spring 9 and a limit rod 10 are arranged in the inner cavity of the test socket main body 1, an exhaust pipe 11 is arranged on the inner wall of the test socket main body 1, a second groove 12 is opened on the back of the test socket main body 1, an air pump 13 and a filter 14 are arranged in the inner cavity of the second groove 12, a third groove 18 is opened on the top of the test socket main body 1, an electric push rod 19 is arranged in the inner cavity of the third groove 18 and the top is connected to the sealing plate 2.

[0027] The left tooth plate 5 in the left groove 4 penetrates the inner cavity of the groove 4 and can move, and the teeth on the two groups of tooth plates 5 are meshed with the gear 6.

[0028] The diameter of the slot hole 8 is larger than that of the probe 7 , the slot hole 8 is communicated with the groove 4 , the exhaust pipe 11 is communicated with the inner cavity of the groove 4 , and the air pump 13 is communicated with the exhaust pipe 11 .

[0029] The limiting rod 10 passes through the inner cavity of the tooth plate 5 , and the tooth plate 5 in the left groove 4 can move up and down on the outer ring of the limiting rod 10 . The spring 9 is located on the tooth plate 5 and is arranged on the outer ring of the limiting rod 10 .

[0030] In this embodiment, the integrated circuit board is placed on the toothed plate 5 in the test socket body 1 and pressed up and down, and the gear 6 drives the probe 7 on the right toothed plate 5 to extend from the slot 8 for detection. At the same time, the air pump 13 is turned on, and the air is filtered by the filter plate 14 and then injected into the groove 4 from the exhaust pipe 11 and finally exhausted from the slot 8 until the integrated circuit is taken out after the detection is completed. The probe 7 is retracted in cooperation with the limit rod 10 and the spring 9, thereby preventing dust and water vapor from entering the groove 4 from the slot 8, thereby achieving the purpose of probe protection.

[0031] The inner cavity of the test seat body 1 is provided with a cushion block 15 , and the cushion block 15 is fixedly connected to the tooth plate 5 on the left side.

[0032] A buffer groove 20 is provided at the bottom of the pressure seat 3 , a buffer spring 21 is provided in the inner cavity of the buffer groove 20 , and a buffer seat 22 is fixedly connected to the bottom of the buffer spring 21 .

[0033] The outer ring of the pressure seat 3 is provided with a slide groove 23 , the inner cavity of the slide groove 23 is provided with a slider 24 , and the slider 24 is fixedly connected to the buffer seat 22 .

[0034] In this embodiment, when the integrated circuit is pressed by the pressure seat 3, the buffer seat 22 contacts the integrated circuit first, cooperates with the buffer spring 21 and the slider 24 in the slide groove 23 and the pad 15 on the tooth plate 5, thereby achieving the purpose of buffering the downward pressure test of the integrated circuit and avoiding damage to the integrated circuit caused by hard contact.

[0035] A stabilizing groove 16 is provided on the top of the test seat body 1 , and a stabilizing rod 17 is provided in the inner cavity of the stabilizing groove 16 . The stabilizing rod 17 is fixedly connected to the sealing plate 2 .

[0036] In this embodiment, when the electric push rod 19 is used to move the sealing plate 2 up and down, the stabilizing rod 17 in the stabilizing groove 16 improves the stability of the sealing plate 2 during movement, that is, improves the stability of the integrated circuit during the press test.

[0037] Working principle: When it is necessary to use this integrated circuit test socket, the electric push rod 19 in the third groove 18 is used to drive the sealing plate 2 to move up, and then the integrated circuit to be tested is placed on the tooth plate 5, and the pressure seat 3 is used to press the integrated circuit and move the left tooth plate 5 down, and the gear 6 drives the probe 7 on the right tooth plate 5 to extend out of the slot 8 for testing. At the same time, the air pump 13 is turned on, and the air is filtered by the filter plate 14 and then injected into the groove 4 from the exhaust pipe 11 and finally exhausted from the slot 8 until the integrated circuit is taken out after the test is completed. With the limit rod 10 and the spring 9, the probe 7 is retracted to prevent dust and water vapor from entering the groove. The hole 8 enters the groove 4, achieving the purpose of probe protection and solving the problem that the test probe in the existing test seat is easily contaminated by impurities and damaged; when the sealing plate 2 is moved up and down by the electric push rod 19, the stability of the sealing plate 2 during movement is improved under the action of the stabilizing rod 17 in the stabilizing groove 16; at the same time, when the integrated circuit is pressed by the pressure seat 3, the buffer seat 22 contacts the integrated circuit first, and cooperates with the buffer spring 21 and the slider 24 in the slide groove 23 and the pad 15 on the tooth plate 5 to achieve the purpose of buffering the downward pressure test of the integrated circuit and avoid damage to the integrated circuit caused by hard contact.

[0038] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An integrated circuit test socket, comprising a test socket body (1), characterized in that: A sealing plate (2) is arranged at the top of the test seat body (1), a pressure seat (3) is arranged at the bottom of the sealing plate (2), a plurality of groups of grooves (4) are arranged on the inner wall of the test seat body (1), two groups of tooth plates (5) and gears (6) are arranged in the inner cavity of the grooves (4), a probe (7) is arranged on the top of the right tooth plate (5), a slot (8) is arranged at the bottom of the inner cavity of the test seat body (1), a spring (9) and a limit rod (10) are arranged in the inner cavity of the test seat body (1), an exhaust pipe (11) is arranged on the inner wall of the test seat body (1), a second groove (12) is arranged on the back of the test seat body (1), an air pump (13) and a filter (14) are arranged in the inner cavity of the second groove (12), a third groove (18) is arranged on the top of the test seat body (1), an electric push rod (19) is arranged in the inner cavity of the third groove (18), and the top is connected to the sealing plate (2).

2. An integrated circuit test socket according to claim 1, characterized in that: The left tooth plate (5) in the left groove (4) penetrates the inner cavity of the groove (4) and is movable, and the teeth on the two groups of tooth plates (5) are meshed with the gear (6).

3. The integrated circuit test socket according to claim 1, characterized in that: The diameter of the slot hole (8) is larger than that of the probe (7); the slot hole (8) is in communication with the groove (4); the exhaust pipe (11) is in communication with the inner cavity of the groove (4); and the air pump (13) is in communication with the exhaust pipe (11).

4. The integrated circuit test socket according to claim 1, characterized in that: The limiting rod (10) passes through the inner cavity of the tooth plate (5); the tooth plate (5) on the left side in the groove (4) on the left side can move up and down on the outer ring of the limiting rod (10); the spring (9) is located on the tooth plate (5) and is arranged on the outer ring of the limiting rod (10).

5. The integrated circuit test socket according to claim 1, characterized in that: The inner cavity of the test seat body (1) is provided with a cushion block (15), and the cushion block (15) is fixedly connected to the tooth plate (5) on the left side.

6. The integrated circuit test socket according to claim 1, characterized in that: A buffer groove (20) is provided at the bottom of the pressure seat (3), a buffer spring (21) is provided in the inner cavity of the buffer groove (20), and a buffer seat (22) is fixedly connected to the bottom of the buffer spring (21).

7. The integrated circuit test socket according to claim 1, characterized in that: The outer ring of the pressure seat (3) is provided with a slide groove (23), the inner cavity of the slide groove (23) is provided with a slider (24), and the slider (24) is fixedly connected to the buffer seat (22).

8. The integrated circuit test socket according to claim 1, characterized in that: A stabilizing groove (16) is provided on the top of the test seat body (1), a stabilizing rod (17) is provided in the inner cavity of the stabilizing groove (16), and the stabilizing rod (17) is fixedly connected to the sealing plate (2).

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