Probe aging degree test circuit

Abstract

The utility model relates to a probe aging degree test circuit, which relates to the field of probe detection, and comprises an input end and an output end, and also comprises a temperature detection device, a control device and a switch device, the temperature detection device is used for detecting the temperature physical quantity of the circuit and converting the temperature physical quantity into a temperature signal; the control device is connected with the temperature detection device to receive a temperature signal and output a control signal, and the switch device is connected with the control signal to receive the control signal and respond to the control signal to control the conduction state of a path between the input end and the output end. The probe aging degree tester provided by the utility model has the effects of improving the use stability of the probe aging degree tester and reducing the damage of components.

Description

Technical Field

[0001] The utility model relates to the field of probe detection, in particular to a probe aging degree test circuit. Background Art

[0002] The probe aging degree test refers to testing the relationship between the probe's detection force and compression stroke, as well as the relationship between the contact resistance and compression stroke, to determine the probe's aging degree.

[0003] In the prior art, the product specification of the metal probe only provides data on the degree of aging at room temperature. The aging degree of the probe at high temperature needs to be tested. Generally, the aging degree of the probe at high temperature is tested by a probe aging degree tester. During the test, the pressure probe on the tester needs to press against the metal probe to be tested.

[0004] When testing a metal probe at high temperature, the heat on the metal probe is easily transferred to the tester when it collides with the pressure probe, thereby causing the temperature on the tester to rise, and further causing the circuit components in the tester to burn out. Utility Model Content

[0005] In order to improve the stability of the use of the probe aging degree tester and reduce the damage of components, the utility model provides a probe aging degree test circuit.

[0006] A probe aging degree test circuit comprises an input end and an output end, and also comprises a temperature detection device, a control device and a switch device, wherein the temperature detection device is used to detect the temperature physical quantity of the circuit and convert it into a temperature signal, the control device is connected with the temperature detection device to receive the temperature signal and output a control signal, and the switch device is connected with the control signal to receive the control signal and respond to the control signal to control the conduction state of the path between the input end and the output end;

[0007] When the temperature exceeds the preset value, the temperature detection device outputs a low-level temperature signal, the control device receives the low-level temperature signal and outputs a low-level control signal, and the switch device receives the low-level control signal and controls the path between the input end and the output end to be disconnected; when the temperature does not exceed the preset value, the temperature detection device outputs a high-level temperature signal, the control device receives the high-level temperature signal and outputs a high-level control signal, and the switch device receives the high-level control signal and controls the path between the input end and the output end to be connected.

[0008] By adopting the above technical solution, the temperature of the circuit is detected by a temperature detection device, and when the temperature is too high, the control device controls the switch device to disconnect the path between the input end and the output end, so that the components stop working to reduce the heating of the circuit, thereby reducing the burning of components.

[0009] Preferably, it further comprises a direction detection device, wherein the direction detection device is used to detect the flow direction of the input signal and convert it into a direction signal to output to the control device;

[0010] When the input signal flows from the input end to the output end, the direction detection device outputs a high-level direction signal; when the input signal flows from the output end to the input end, the direction detection device outputs a low-level direction signal; only when the direction detection device outputs a high-level direction signal and the temperature detection device outputs a high-level temperature signal, the control device receives the high-level temperature signal and the high-level direction signal and outputs a high-level control signal, the switch device receives the high-level control signal and controls the path between the input end and the output end to be connected, otherwise the control device outputs a low-level control signal, the switch device receives the low-level control signal and controls the path between the input end and the output end to be disconnected.

[0011] By adopting the above technical solution, the current direction of the input signal is detected by the direction detection device. When backflow occurs, the control device controls the switch device to disconnect the path between the input end and the output end, thereby reducing the situation where the backflow causes damage to components.

[0012] Preferably, the device further comprises a reference device, wherein the reference device is used to provide a reference signal.

[0013] By adopting the above technical solution, a stable reference signal is provided to the circuit through the reference device, so that a preset value of the temperature is set through the reference device, thereby facilitating comparison between the control device and the temperature detection device.

[0014] Preferably, the control device comprises a comparison module, a latch module and a logic module, the comparison module is connected with the reference device and the direction detection module to receive the reference signal and the direction signal and output the comparison signal, the latch module is connected with the comparison module and the input end to receive the input signal and the comparison signal and output the latch signal, and the logic module is connected with the latch module and the temperature control device to receive the latch signal and the temperature signal and output the control signal;

[0015] When the direction detection device outputs a high-level direction signal, the comparison module receives the reference signal and the high-level direction signal and outputs a low-level comparison signal, and the latch module receives the low-level comparison signal and the high-level input signal and outputs a high-level latch signal; when the direction detection device outputs a low-level direction signal, the comparison module receives the reference signal and the low-level direction signal and outputs a high-level comparison signal, and the latch module receives the high-level comparison signal and the low-level input signal and outputs a low-level latch signal;

[0016] Only when the logic module receives a high-level latch signal and a high-level temperature signal, the logic module outputs a high-level control signal; otherwise, the logic module outputs a low-level control signal.

[0017] By adopting the above technical solution, the direction signal is identified by the comparison module, and the comparison signal is converted into a latch signal by the latch module and transmitted to the logic module. The logic module controls the switch module according to the latch signal and the direction detection signal, thereby disconnecting the path between the input end and the output end when the temperature is too high or backflow occurs, thereby protecting the circuit.

[0018] Preferably, the latch module comprises a trigger unit and a loop unit, the trigger unit is connected to the comparison module and the input end to receive an input signal and a comparison signal and output a latch signal, and the loop unit inputs the latch signal into the trigger unit to form a feedback loop.

[0019] By adopting the above technical solution, the comparison signal is converted into a latch signal through the trigger unit, and the latch signal is input into the trigger unit through the loop unit, thereby forming a feedback loop, thereby improving the stability of the latch module.

[0020] Preferably, the temperature detection device comprises a temperature control module and an output module, the temperature control module is used to detect the temperature physical quantity and convert it into a temperature control signal, and the output module is connected to the reference device and the temperature control module to receive the reference signal and the temperature control signal and output the temperature signal;

[0021] When the reference signal is greater than the temperature control signal, the output module outputs a high-level temperature signal, and when the reference signal is less than the temperature control signal, the output module outputs a low-level temperature signal.

[0022] By adopting the above technical solution, the output module compares the reference signal with the temperature control signal, thereby controlling the size of the temperature signal with the reference signal as a preset value, and then controlling the opening and closing of the switch device according to the temperature.

[0023] Preferably, the temperature detection device further comprises a comparison module, which is connected to the reference device to receive a reference signal and output a comparison signal to the output module;

[0024] When the comparison signal is greater than the temperature control signal, the output module outputs a high-level temperature signal, and when the comparison signal is less than the temperature control signal, the output module outputs a low-level temperature signal.

[0025] By adopting the above technical solution, the preset value can be adjusted to a lower limit of zero and an upper limit of the reference signal through the comparison module, thereby adjusting the preset value of the temperature according to actual conditions and improving the convenience of using the temperature detection device.

[0026] Preferably, the temperature control module comprises a thermistor and a fixing unit, and the thermistor is a thermistor with a positive temperature coefficient.

[0027] By adopting the above technical solution, the temperature physical quantity is converted into a temperature control signal through the thermistor unit. When the temperature rises, the resistance of the thermistor unit increases, thereby increasing the temperature control signal, and then causing the output module to output a low-level temperature signal.

[0028] Preferably, it further comprises a voltage stabilizing device, which is connected to the output end for overvoltage protection.

[0029] By adopting the above technical solution, when a voltage surge occurs in the circuit causing a voltage mutation, the voltage is stabilized by the voltage stabilizing device, thereby reducing the situation where the circuit components are damaged by the sudden voltage, and improving the stability of the anti-backflow circuit.

[0030] Preferably, a protection device is further included, and the protection device is connected to the output end to reduce the situation of sudden current change.

[0031] By adopting the above technical solution, when a current surge occurs in the circuit causing a current mutation, the current is stabilized by the protection device, the damage to circuit components caused by the mutation current is reduced, and the stability of the use of the anti-backflow circuit is improved.

[0032] In summary, the present invention has at least one of the following beneficial technical effects:

[0033] 1. The temperature of the circuit is detected by the temperature detection device, and when the temperature is too high, the control device controls the switch device to disconnect the path between the input end and the output end, so that the components stop working to reduce the heating of the circuit, thereby reducing the burning of components;

[0034] 2. The direction of the current of the input signal is detected by the direction detection device. When backflow occurs, the control device controls the switch device to disconnect the path between the input end and the output end, thereby reducing the situation where the backflow causes damage to components;

[0035] 3. Through the comparison module, the preset value can be adjusted to a lower limit of zero and an upper limit of the reference signal size, thereby adjusting the preset value of the temperature according to actual conditions and improving the convenience of using the temperature detection device. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 It is a circuit schematic diagram of a probe aging degree test circuit in this practical embodiment.

[0037] Figure 2 is the circuit schematic of the reference device.

[0038] Explanation of the accompanying drawings: 1. Input end; 2. Output end; 3. Temperature detection device; 31. Temperature control module; 311. Thermistor unit; 312. Fixing unit; 32. Output module; 33. Comparison module; 4. Control device; 41. Comparison module; 42. Latch module; 421. Trigger unit; 422. Loop unit; 43. Logic module; 5. Switch device; 6. Direction detection device; 7. Reference device; 8. Voltage stabilizing device; 9. Protection device. DETAILED DESCRIPTION

[0039] The following is combined with Figure 1-2 This utility is described in further detail.

[0040] Reference Figure 1 The present practical embodiment discloses a probe aging degree test circuit, including an input terminal 1, an output terminal 2, a temperature detection device 3, a direction detection device 6, a reference device 7, a control device 4, a switch device 5, a voltage stabilizing device 8 and a protection device 9. The input terminal 1 is used to receive an input signal, the output terminal 2 is used to receive an input signal from the input terminal 1 and output it, the temperature detection device 3 is used to detect the temperature physical quantity in the circuit and convert it into a temperature signal, the direction detection device 6 is used to detect the flow direction of the input signal and convert it into a direction signal, the reference device 7 is used to provide a reference signal, the control device 4 is used to receive the direction signal and the temperature signal and output a control signal, the switch device 5 is used to receive the control signal and control the opening and closing of the path between the input terminal 1 and the output terminal 2, the voltage stabilizing device 8 is used to reduce the voltage overvoltage situation, and the protection device 9 is used to reduce the current overcurrent situation.

[0041] The temperature detection device 3 includes a temperature control module 31, a comparison module 33 and an output module 32. The temperature control module 31 is used to convert the temperature physical quantity into a temperature control signal, the comparison module 33 is used to convert the reference signal into a comparison signal, and the output module 32 is used to receive the temperature control signal and the comparison signal and output the temperature signal.

[0042] The temperature control module 31 includes a thermistor 311 and a fixed unit 312. The thermistor 311 uses a thermistor RT with a positive temperature coefficient, and the fixed unit 312 uses a resistor R5. The comparison module 33 includes a resistor R3 and a resistor R4. The output module 32 includes a chip U2 with a model number of TLV1701AIDCLKR. The chip U2 is used to compare the comparison signal and the temperature control signal and output the temperature signal. When the temperature rises, the resistance value of the thermistor RT increases, thereby increasing the temperature control signal. When the temperature control signal is greater than the comparison signal, the output module 32 outputs a low-level temperature signal.

[0043] One end of resistor R3 is connected to reference device 7 and then to one end of resistor R5, the other end of resistor R3 is connected to pin 1 of chip U2 and then to one end of resistor R4, the other end of resistor R5 is connected to pin 3 of chip U2 and then to one end of the thermistor RT, the other end of resistor R4 is connected to the other end of the thermistor RT and then to ground GND, pin 2 of chip U2 is connected to ground GND, and pin 5 of chip U2 is connected to input terminal 1VIN.

[0044] The direction detection device 6 includes a resistor R6 and a chip U4 of model INA190-Q1. The chip U4 is used to detect the voltage across the resistor R6, thereby determining the flow direction of the input signal and outputting a direction signal.

[0045] One end of the resistor R6 is connected to pin 4 of the chip U4, the other end of the resistor R6 is connected to pin 5 of the chip U4, pins 1 and 2 of the chip U4 are both connected to the ground GND, and pin 3 of the chip U4 is connected to the input terminal 1VIN.

[0046] The control device 4 includes a comparison module 33, a latch module 42 and a logic module 43. The comparison module 33 receives the direction signal and the reference signal and outputs a comparison signal. The latch module 42 receives the comparison signal and outputs a latch signal. The logic module 43 receives the latch signal and the temperature signal and outputs a logic signal.

[0047] The comparison module 33 includes resistors R7, resistor R8 and chip U5. Chip U5 uses a comparator chip with model number TLV1701AIDCLKR. Chip U5 is used to compare the reference signal and the direction signal; the latch module 42 includes a trigger unit 421 and a loop unit 422. The trigger unit 421 includes a chip U6 and a resistor R8. Chip U6 uses a latch chip with model number SN74LVC1G373. The loop unit 422 includes a resistor R9. The loop unit 422 is used to form a feedback loop; the logic module 43 includes an AND gate chip U3 with model number TC7SET08FU.

[0048] Pin 6 of chip U4 is connected to pin 3 of chip U5, one end of resistor R7 is connected to reference device 7, the other end of resistor R7 is connected to one end of resistor R8 and then to pin 1 of chip U5, the other end of resistor R8 is connected to ground GND, pin 2 of chip U5 is connected to ground GND, pin 5 of chip U5 is connected to input terminal 1VIN, pin 4 of chip U5 is connected to pin 3 of chip U6, one end of resistor R8 is connected to input terminal 1VIN, the other end of resistor R8 is connected to pin 1 of chip U6 and then to one end of resistor R9, the other end of resistor R9 is connected to pin 4 of chip U6 and then to pin 2 of chip U3, pin 5 of chip U6 is connected to input terminal 1VIN, pins 6 and 2 of chip U6 are both connected to ground GND, pin 3 of chip U3 is connected to ground GND, pin 1 of chip U3 is connected to pin 4 of chip U2, and pin 5 of chip U3 is connected to input terminal 1VIN.

[0049] The switch device 5 includes a resistor R1, a resistor R2, a field effect transistor Q1, a diode D1 and a chip U1. The field effect transistor Q1 adopts an N-channel field effect transistor of model 2N7002LT1, the diode D1 adopts a voltage-stabilizing diode, and the chip U1 adopts an integrated chip of model CSD25402Q3A that integrates a voltage-stabilizing diode and a P-channel field effect transistor.

[0050] Pins 5, 6, 7 and 8 of chip U1 are connected to one end of resistor R1, one end of R2 and the input terminal 1VIN. The other end of resistor R1 is connected to pin 4 of chip U3 and the gate of field effect transistor Q1. The other end of resistor R2 is connected to pin 4 of chip U1, the drain of field effect transistor Q1 and the cathode of diode D1. The anode of diode D1 is connected to the source of field effect transistor Q1 and the ground GND. Pins 1, 2 and 3 of chip U1 are connected to one end of resistor R6.

[0051] The voltage stabilizing device 8 includes a diode D2, which is a voltage stabilizing diode; the protection device 9 includes an inductor L1.

[0052] The cathode of the diode D2 is connected to the other end of the resistor R6 and then to one end of the inductor L1 . The anode of the diode D2 is connected to the ground GND. The other end of the inductor L1 is connected to the output end 2VOUT.

[0053] Reference Figure 2 The reference device 7 includes a resistor R10, a capacitor C1 and a chip U7. The chip U7 is a voltage regulator chip of model ZXRE125.

[0054] One end of the resistor R10 is connected to the input terminal 1VIN, the other end of the resistor R10 is connected to the 3rd pin of the chip U7 and then to one end of the capacitor C1 7, the 2nd pin of the chip U5 is connected to the ground GND, and the other end of the capacitor C1 is connected to the ground GND.

[0055] Working principle:

[0056] When the temperature exceeds the preset value, the temperature detection device 3 outputs a low-level temperature signal; when the temperature does not exceed the preset value, the temperature detection device 3 outputs a high-level temperature signal; when the input signal flows from the input terminal 1 to the output terminal 2, the direction detection device 6 outputs a high-level direction signal; when the input signal flows from the output terminal 2 to the input terminal 1, the direction detection device 6 outputs a low-level direction signal; only when the direction detection device 6 outputs a high-level direction signal and the temperature detection device 3 outputs a high-level temperature signal, the control device 4 receives the high-level temperature signal and the high-level direction signal and outputs a high-level control signal, the switch device 5 receives the high-level control signal and controls the path between the input terminal 1 and the output terminal 2 to be connected, otherwise the control device 4 outputs a low-level control signal, the switch device 5 receives the low-level control signal and controls the path between the input terminal 1 and the output terminal 2 to be disconnected.

[0057] The above are all preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Therefore, any equivalent changes made based on the structure, shape, and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A probe aging degree test circuit, comprising an input end (1) and an output end (2), characterized in that: The circuit also comprises a temperature detection device (3), a control device (4) and a switch device (5), wherein the temperature detection device (3) is used to detect the temperature physical quantity of the circuit and convert it into a temperature signal, the control device (4) is connected to the temperature detection device (3) to receive the temperature signal and output a control signal, and the switch device (5) is connected to the control signal to receive the control signal and respond to the control signal to control the conduction state of the path between the input end (1) and the output end (2); When the temperature exceeds a preset value, the temperature detection device (3) outputs a low-level temperature signal, the control device (4) receives the low-level temperature signal and outputs a low-level control signal, and the switch device (5) receives the low-level control signal and controls the path between the input end (1) and the output end (2) to be disconnected; when the temperature does not exceed the preset value, the temperature detection device (3) outputs a high-level temperature signal, the control device (4) receives the high-level temperature signal and outputs a high-level control signal, and the switch device (5) receives the high-level control signal and controls the path between the input end (1) and the output end (2) to be connected.

2. The probe aging degree test circuit according to claim 1, characterized in that: It also includes a direction detection device (6), which is used to detect the flow direction of the input signal and convert it into a direction signal to output to the control device (4); When the input signal flows from the input end (1) to the output end (2), the direction detection device (6) outputs a high-level direction signal; when the input signal flows from the output end (2) to the input end (1), the direction detection device (6) outputs a low-level direction signal; only when the direction detection device (6) outputs a high-level direction signal and the temperature detection device (3) outputs a high-level temperature signal, the control device (4) receives the high-level temperature signal and the high-level direction signal and outputs a high-level control signal, the switch device (5) receives the high-level control signal and controls the path between the input end (1) and the output end (2) to be connected; otherwise, the control device (4) outputs a low-level control signal, the switch device (5) receives the low-level control signal and controls the path between the input end (1) and the output end (2) to be disconnected.

3. The probe aging degree test circuit according to claim 2, characterized in that: It also comprises a reference device (7), wherein the reference device (7) is used to provide a reference signal.

4. The probe aging degree test circuit according to claim 3, characterized in that: The control device (4) comprises a comparison module (41), a latch module (42) and a logic module (43); the comparison module (41) is connected to the reference device (7) and the direction detection module to receive a reference signal and a direction signal and output a comparison signal; the latch module (42) is connected to the comparison module (41) and the input end (1) to receive an input signal and a comparison signal and output a latch signal; and the logic module (43) is connected to the latch module (42) and the temperature control device (4) to receive a latch signal and a temperature signal and output a control signal; When the direction detection device (6) outputs a high-level direction signal, the comparison module (41) receives the reference signal and the high-level direction signal and outputs a low-level comparison signal, and the latch module (42) receives the low-level comparison signal and the high-level input signal and outputs a high-level latch signal; when the direction detection device (6) outputs a low-level direction signal, the comparison module (41) receives the reference signal and the low-level direction signal and outputs a high-level comparison signal, and the latch module (42) receives the high-level comparison signal and the low-level input signal and outputs a low-level latch signal; Only when the logic module (43) receives a high-level latch signal and a high-level temperature signal, the logic module (43) outputs a high-level control signal; otherwise, the logic module (43) outputs a low-level control signal.

5. The probe aging degree test circuit according to claim 4, characterized in that: The latch module (42) comprises a trigger unit (421) and a loop unit (422); the trigger unit (421) is connected to the comparison module (41) and the input end (1) to receive an input signal and a comparison signal and output a latch signal; the loop unit (422) inputs the latch signal into the trigger unit (421) to form a feedback loop.

6. The probe aging degree test circuit according to claim 4, characterized in that: The temperature detection device (3) comprises a temperature control module (31) and an output module (32), the temperature control module (31) is used to detect a temperature physical quantity and convert it into a temperature control signal, and the output module (32) is connected to the reference device (7) and the temperature control module (31) to receive the reference signal and the temperature control signal and output the temperature signal; When the reference signal is greater than the temperature control signal, the output module (32) outputs a high-level temperature signal; when the reference signal is less than the temperature control signal, the output module (32) outputs a low-level temperature signal.

7. The probe aging degree test circuit according to claim 6, characterized in that: The temperature detection device (3) further comprises a comparison module (33), wherein the comparison module (33) is connected to the reference device (7) to receive a reference signal and output a comparison signal to the output module (32); When the comparison signal is greater than the temperature control signal, the output module (32) outputs a high-level temperature signal; when the comparison signal is less than the temperature control signal, the output module (32) outputs a low-level temperature signal.

8. The probe aging degree test circuit according to claim 6, characterized in that: The temperature control module (31) comprises a thermistor (311) and a fixing unit (312), and the thermistor (311) is a thermistor with a positive temperature coefficient.

9. The probe aging degree test circuit according to claim 1, characterized in that: It also includes a voltage stabilizing device (8), which is connected to the output end (2) to perform overvoltage protection.

10. The probe aging degree test circuit according to claim 1, characterized in that: It also includes a protection device (9), which is connected to the output terminal (2) to reduce the situation of sudden current changes.

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