Detection device of scanning device

Abstract

The utility model provides a detection device of a scanning device. The scanning device comprises at least one mounting surface for mounting a scanning mirror, and the detection device comprises a supporting device, a reflector assembly and an optical angle measurer. The support device is configured to support the scanning device. The reflector assembly comprises a movable frame and a reflector arranged on the movable frame, and the movable frame is configured to move relative to the supporting device so as to be close to the supporting device and enable the reflector to be attached to the installation face or away from the supporting device. The optical angle measurer is configured to emit a detection light beam, receive echoes generated when the detection light beam is reflected by the reflector, and determine the deviation between the mounting surface and the standard position according to the echoes. According to the embodiment of the invention, the reflector assembly can simulate the condition that the scanning device is provided with the scanning mirror, the scanning device can be quickly and automatically detected, the detection process is simplified, the labor cost is saved, the detection precision is high, and the high-precision detection of the scanning device at low cost is realized.

Description

Technical Field

[0001] The present disclosure relates to the technical field of product detection of optical components, and in particular to a detection device for a scanning device. Background Art

[0002] A scanning device is an optical component that changes the direction or position of light emission by changing the angle of a scanning mirror. It can be used in optical sensors such as laser radar. After a scanning mirror (such as a reflector) is fixedly installed on the scanning device, the scanning device can be controlled to move, such as rotating or swinging, to change the angle or position of light emission, so that light can be scanned within a certain angle range.

[0003] In practical applications, the quality of scanning devices affects the performance of the product. Taking the scanning device in the laser radar as an example, when there is a processing error in the scanning device, the installation angle or installation position of the scanning mirror will deviate from the standard position, thereby affecting the emission angle or emission position of the light, reducing the detection accuracy of the laser radar or reducing the strength of the received echo signal.

[0004] The contents of the background technology section are merely the technologies known to the inventors and do not necessarily represent the prior art in the field. Utility Model Content

[0005] In view of one or more deficiencies in the prior art, the present disclosure provides a detection device for a scanning device, wherein the scanning device comprises at least one mounting surface for mounting a scanning mirror, and the detection device comprises: a supporting device, a reflector assembly, and an optical angle measuring device;

[0006] The supporting device is configured to support the scanning device;

[0007] The reflector assembly comprises a reflector and a movable frame, the reflector is arranged on the movable frame, and the movable frame is configured to be movable relative to the support device, so as to approach the support device and affix the reflector to the mounting surface, or to move away from the support device;

[0008] The optical angle measuring device is configured to emit a detection light beam, receive an echo generated when the detection light beam is reflected by the reflector, and determine a deviation between the mounting surface and a standard position according to the echo.

[0009] Optionally, the deviation between the mounting surface and the standard position includes a pitch angle deviation of the mounting surface.

[0010] Optionally, the angular deviation between the mounting surface and the standard position includes a yaw angle deviation of the mounting surface.

[0011] Optionally, the reflector is elastically connected to the movable frame so that the reflector has at least one degree of freedom of movement in the following three directions relative to the movable frame:

[0012] freedom of movement along the optical axis of the detection beam;

[0013] Pitch rotational degree of freedom; and

[0014] Yaw angle rotational degree of freedom.

[0015] Optionally, the optical angle measuring device is configured to determine the angular deviation between the mounting surface and the standard position according to the offset of the position of the echo relative to the position of the echo reflected from the standard position;

[0016] The offset includes:

[0017] a displacement component in a first direction of the position of the echo relative to the position of the echo reflected from the standard position; and

[0018] The position of the echo is a displacement component in a second direction relative to the position of the echo reflected from the standard position; wherein the first direction and the second direction are perpendicular to each other.

[0019] Optionally, the scanning device includes a mounting surface, the detection device further includes a processing device, the processing device communicates with the optical angle measuring device to obtain the deviation between the mounting surface and the standard position, and the processing device is configured to: determine whether the scanning device meets the standard according to the deviation; when the following conditions are met, determine that the scanning device meets the standard:

[0020] The pitch angle deviation of the mounting surface is less than a first threshold; and / or

[0021] The yaw angle deviation of the mounting surface is less than a second threshold.

[0022] Optionally, the scanning device includes at least two mounting surfaces; the supporting device is configured to drive the scanning device to rotate so that the multiple mounting surfaces are sequentially oriented toward the optical angle meter, the reflector assembly enables the reflector to be sequentially attached to the multiple mounting surfaces, and the optical angle meter determines the deviations between the multiple mounting surfaces and the standard positions corresponding to the mounting surfaces.

[0023] Optionally, the detection device further includes:

[0024] A processing device, the processing device communicates with the optical angle measuring device to obtain angle deviations between multiple mounting surfaces and standard positions, the processing device is configured to: determine that the scanning device meets the standard when the following conditions are met:

[0025] The pitch angle deviations of the various mounting surfaces of the scanning device are all smaller than the third threshold; or the range of the pitch angle deviations of the various mounting surfaces of the scanning device is smaller than the fourth threshold; and

[0026] The yaw angle deviations of the various mounting surfaces of the scanning device are all smaller than a fifth threshold; or the extreme difference of the yaw angle deviations of the various mounting surfaces of the scanning device is smaller than a sixth threshold.

[0027] Optionally, the detection device further includes:

[0028] A base, the supporting device, the reflector assembly and the optical angle measuring device are all arranged on the base; a guide rail is arranged on the base, and the movable frame is configured to be movable along the guide rail relative to the supporting device.

[0029] Optionally, the reflector assembly further comprises a spring, and the reflector and the movable frame are elastically connected via the spring; when the movable frame approaches the supporting device, the spring presses the reflector to fit onto the mounting surface.

[0030] Optionally, the supporting device comprises a mounting seat and a fixing portion,

[0031] The scanning device is arranged on the mounting seat;

[0032] The fixing portion is configured to fix the scanning device on the mounting seat so that the scanning device maintains a fixed posture.

[0033] Compared with the prior art, the embodiment of the present disclosure provides a scanning device detection device, which can be used to detect whether the mounting surface of the scanning mirror installed in the scanning device meets the standard, wherein the reflector assembly can fit the reflector on the mounting surface, and use the optical angle measuring device to emit a detection beam to the reflector, and determine the deviation of the mounting surface according to the echo. In the embodiment of the present disclosure, the reflector assembly can simulate the situation of the scanning mirror installed on the scanning device, and the quality of the scanning device can be quickly and automatically detected, which simplifies the detection process, saves labor costs, and has high detection accuracy, so as to realize high-precision detection of the scanning device at low cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure, the following will provide an exemplary introduction to the drawings used in the description of the embodiments. The drawings described below are only embodiments of the present disclosure. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without creative work. The drawings are used to provide a further understanding of the present disclosure and constitute a part of the specification. They are used together with the embodiments of the present disclosure to explain the present disclosure and do not constitute a limitation on the present disclosure. In the drawings:

[0035] Figure 1 A schematic diagram showing the structure of a detection device of a scanning device in some embodiments of the present disclosure is shown;

[0036] Figure 2 A schematic diagram showing the standard position of the mounting surface in some embodiments of the present disclosure;

[0037] Figure 3 A schematic diagram of a reflector assembly in some embodiments of the present disclosure is shown;

[0038] Figure 4 A schematic diagram showing the detection beam and the echo position when the detection beam is incident perpendicularly to the standard position in some embodiments of the present disclosure;

[0039] Figure 5 A structural block diagram of a detection device in some embodiments of the present disclosure is shown;

[0040] Figure 6 A schematic diagram showing a reflector attached to a mounting surface in some embodiments of the present disclosure is shown;

[0041] Figure 7 Schematic diagrams showing support devices and reflector assemblies in some embodiments of the present disclosure;

[0042] Figure 8 A schematic diagram showing a flow chart of a method for detecting a scanning device in some embodiments of the present disclosure is shown;

[0043] Fig. 9 A schematic flow chart of a detection method including a process of determining an echo position offset in some embodiments of the present disclosure is shown;

[0044] Fig.10 A schematic flow chart of a detection method when a scanning device includes multiple mounting surfaces in some embodiments of the present disclosure is shown. DETAILED DESCRIPTION

[0045] In the following, only certain exemplary embodiments are described by way of example. As will be appreciated by those skilled in the art, the described embodiments may be modified in various ways without departing from the spirit or scope of the present disclosure. Therefore, the drawings and descriptions are considered to be exemplary and non-restrictive in nature.

[0046] In the description of the present disclosure, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, which are only for the convenience of describing the present disclosure and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present disclosure. In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present disclosure, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0047] In the description of the present disclosure, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, an electrical connection, or can communicate with each other; it can be directly connected, or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present disclosure can be understood according to specific circumstances.

[0048] In the present disclosure, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0049] The disclosure below provides many different embodiments or examples to realize different structures of the present disclosure. In order to simplify the disclosure of the present disclosure, the parts and settings of specific examples are described below. Of course, they are only examples, and the purpose is not to limit the present disclosure. In addition, the present disclosure can repeat reference numbers and / or reference letters in different examples, and this repetition is for the purpose of simplicity and clarity, and does not itself indicate the relationship between the various embodiments and / or settings discussed. In addition, the present disclosure provides various specific examples of processes and materials, but those of ordinary skill in the art can be aware of the application of other processes and / or the use of other materials.

[0050] The embodiments of the present disclosure are described below in conjunction with the accompanying drawings. It should be understood that the embodiments described herein are only used to illustrate and explain the present disclosure, and are not used to limit the present disclosure.

[0051] The present disclosure provides a detection device for a scanning device. The scanning device includes at least one mounting surface for mounting a scanning mirror. The detection device includes: a support device, a reflector assembly and an optical angle meter. The support device is configured to support the scanning device. The reflector assembly includes a reflector and a movable frame, the reflector is arranged on the movable frame, and the movable frame is configured to be movable relative to the support device, so as to approach the support device and fit the reflector to the mounting surface, or move away from the support device. The optical angle meter is configured to emit a detection beam, receive an echo generated by the detection beam being reflected by the reflector, and determine the deviation between the mounting surface and the standard position based on the echo.

[0052] In the present disclosure, a support device is used to support and fix the scanning device, and the movable part in the reflector assembly can fit the reflector on the mounting surface of the scanning device. The position of the reflector on the mounting surface is close to the actual position of the scanning mirror installed on the mounting surface. The deviation of the reflector relative to the standard position can be detected by using an optical angle measuring device. The standard position can be set in advance, for example, the ideal position (or design position) of the mounting surface in the scanning device is used as the standard position. The embodiments of the present disclosure can simplify the detection process of the scanning device, reduce the detection cost, and improve the detection efficiency and detection accuracy.

[0053] Figure 1 The structure of the detection device 10 of the scanning device 20 according to some embodiments of the present disclosure is shown below. Figure 1 The detection device 10 will be described.

[0054] In this embodiment, the scanning device 20 includes at least one mounting surface 21 for mounting a scanning mirror. The number of mounting surfaces 21 may be, for example, 1, 2, 3, 4, 5, 6 or even more. The number of scanning mirrors may be the same as the number of mounting surfaces. For example, one scanning mirror may be mounted on one mounting surface 21. The scanning mirror may be mounted on the mounting surface 21 by gluing, welding, snapping, or the like. The scanning device 20 may be applied to optical sensors such as laser radars. For example, the scanning device 20 may deflect the detection light of the laser radar to different directions outside the laser radar, and deflect the echo of the detection light after being reflected by an object to the inside of the laser radar.

[0055] The scanning mirror can be a sheet or plate-like structure. The position of the scanning mirror installed on the mounting surface 21 is affected by the processing accuracy of the mounting surface 21. For example, the standard position of the mounting surface 21 is a plane in the vertical direction. In some processed scanning devices, the mounting surface 21 may have a certain angle of inclination or distance deviation relative to the standard position. When the scanning mirror is installed on the mounting surface 21, due to the processing error of the mounting surface 21, the posture of the scanning mirror will have a certain deviation relative to the preset posture (for example, the posture of the scanning mirror installed in the standard position), affecting the use accuracy of the scanning device 20. For example, when the scanning device 20 is applied to a laser radar, the detection light emitted by the scanning mirror will deviate from the preset emission path accordingly, and the echo scanned by the scanning mirror will also deviate from the preset echo propagation path. Therefore, the processing error of the scanning device 20 will affect the detection accuracy of the laser radar. It should be noted that the standard position of the mounting surface 21 described above as a plane in the vertical direction is only an exemplary description and does not limit the protection scope of the present disclosure. Those skilled in the art can understand that the standard position of the mounting surface 21 can also be a plane with a certain inclination angle. For the convenience of description, the following description is made by taking the standard position of the mounting surface 21 as a plane in the vertical direction as an example.

[0056] like Figure 1 As shown, the detection device 10 includes a supporting device 11 , a reflector assembly 12 and an optical angle measuring device 13 .

[0057] The support device 11 is, for example, a workbench, which can support the scanning device 20. For example, the support device 11 can be configured to keep the scanning device 20 fixed during the detection process by means of snap-on, crimping, releasable pasting, magnetic attraction, vacuum adsorption, etc. The structure of the support device 11 is illustrated by examples in the subsequent embodiments. The support device 11 is configured to enable the scanning device 20 to maintain a preset posture to improve the accuracy of the detection. For example, in some embodiments, when performing the detection, the mounting surface 21 is controlled to face the optical angle measuring device 13 (for example, perpendicular to the optical axis of the optical angle measuring device 13). According to some embodiments of the present disclosure, the support device 11 can be configured to be able to drive the scanning device 20 rotatably so that the mounting surface 21 on the scanning device 20 faces the optical angle measuring device 13.

[0058] The reflector assembly 12 includes a reflector 121 and a movable frame 122. The reflector 121 is disposed on the movable frame 122, and the movable frame 122 is disposed on the support device 11 and can move relative to the support device 11 to approach or move away from the support device 11. When the movable frame 122 approaches the support device 11, the reflector 121 can be attached to the mounting surface 21.

[0059] The reflector 121 can be arranged to be movably connected with respect to the movable frame 122, and have a certain range of motion. This can improve the fit between the reflector 121 and the mounting surface 21. For example, the reflector 121 and the movable frame 122 are elastically connected, connected by a spherical joint, or connected by a magnetic member, so that the reflector 121 fits more accurately on the mounting surface 21. Figure 1 In the embodiment of FIG. 1 , the movable frame 122 moves from the right side to the left side, gradually approaching the scanning device 20 and the mounting surface 21. After the reflector 121 initially contacts the mounting surface 21, the movable frame 122 continues to move to the left to approach the scanning device 20. Due to the movable connection between the reflector 121 and the movable frame 122, the reflector 121 will automatically fine-tune its angle and position so as to fit more fully onto the mounting surface 21.

[0060] The optical angle measuring device 13 is configured to emit a detection beam. For example, the detection beam is a collimated laser, or other short waves with good collimation. In the present disclosure, the optical angle measuring device 13 can also receive the echo generated by the detection beam being reflected by the reflector 121, and can determine the deviation between the mounting surface 21 and the standard position based on the echo, wherein the standard position represents the design position of the mounting surface 21 or the scanning mirror mounted on the mounting surface 21. The optical angle measuring device 13 can, for example, include a light transmitter and a light receiver, and determine the deviation between the mounting surface 21 and the standard position based on the position of the echo or the flight time of the detection beam and the echo. Optionally, the optical angle measuring device 13 can include an optical sensor or a photoelectric sensor, such as a laser radar, an autocollimator, a circular induction synchronizer, a position sensitive detector (PSD), etc.

[0061] In the embodiment of the present disclosure, the reflector 121 is arranged to be attached to the mounting surface 21 of the scanning device 20, and the position (position and / or posture) of the reflector 121 is detected by the optical angle measuring device 13. The position of the reflector 121 can reflect the deviation of the mounting surface 21 from the standard position. The embodiment of the present disclosure can simplify the detection process of the scanning device 20, reduce the detection cost, improve the detection efficiency, and have a high degree of accuracy.

[0062] According to some embodiments of the present disclosure, the deviation between the mounting surface 21 and the standard position includes a pitch angle deviation of the mounting surface 21. For example, the standard position is a vertical plane (in some embodiments, the standard position of the mounting surface 21 can also be set to have a certain inclination angle relative to the vertical plane). Figure 2 As shown, the angular deviation caused by the mounting surface 21 rotating about the X direction relative to the standard position represents the pitch angle deviation.

[0063] In some embodiments, the deviation between the mounting surface 21 and the standard position includes a yaw angle deviation of the mounting surface 21. Figure 2 The standard position shown in FIG. 1 is taken in a vertical plane as an example, and the angle deviation caused by the installation surface 21 rotating about the Y direction relative to the standard position represents the yaw angle deviation.

[0064] According to some embodiments of the present disclosure, the deviation between the mounting surface 21 and the standard position includes a deviation in the distance between the mounting surface 21 and the rotation axis of the scanning device 20. For example, the scanning device 20 is configured to swing or rotate around its rotation axis, and the ideal distance between the mounting surface 21 and the rotation axis is 5 cm, but due to processing errors, the distance between the mounting surface 21 and the rotation axis of some scanning devices 20 may be 5.01 cm.

[0065] According to different application scenarios of the scanning device 20, there are different sensitivities for different deviations of the mounting surface 21 in the scanning device 20 relative to the standard position. For example, in some application scenarios, the yaw angle deviation of the mounting surface 21 has little impact on the application of the scanning device 20, or can be corrected by other means. In this case, the yaw angle deviation of the mounting surface 21 may not be detected, or a larger allowable threshold may be set for the yaw angle deviation of the mounting surface 21. Similarly, for the pitch angle deviation and the deviation of the distance between the mounting surface 21 and the rotation axis of the scanning device 20, it can be determined whether to detect the deviation or set a larger allowable threshold for the deviation according to actual needs.

[0066] like Figure 3 As shown, according to some embodiments of the present disclosure, the reflector 121 and the movable frame 122 are elastically connected, for example, a spring 123 is provided between the reflector 121 and the movable frame 122, or the reflector 121 and the movable frame 121 are connected by an elastic adhesive, or an elastic component is provided between the reflector 121 and the movable frame 122, so that the reflector 121 has at least one of the following three degrees of freedom relative to the movable frame 122, and the three degrees of freedom are respectively the degree of freedom of movement along the optical axis direction of the detection light beam, the degree of freedom of pitch angle rotation, and the degree of freedom of yaw angle rotation. In this way, the reflector 121 can adapt to the possible deviation between the mounting surface 21 and the standard position and improve the fit between the reflector 121 and the mounting surface 21.

[0067] By setting the spring 123, when the reflector 121 gradually fits on the mounting surface 21, the spring 123 is elastically deformed along the optical axis direction, which can provide the freedom of movement along the detection optical axis direction. By having the freedom of movement along the detection optical axis direction, the movable frame 122 will not produce rigid extrusion on the scanning device 20 in the process of approaching the supporting device 11, thereby preventing damage to the scanning device 20 and the supporting device 11. For example, the pressure of the reflector 121 on the scanning device 20 can be controlled by the size of the elastic deformation or the size of the elastic force. In some embodiments, during the detection process, the pressure applied by the reflector 121 to the scanning device 20 along the optical axis direction can be set to a fixed value, such as 5N, 8N, etc. Applying a certain pressure can make the reflector 121 fit the mounting surface 21 tightly, thereby improving the detection accuracy of the scanning device 20.

[0068] A plurality of springs 123 may be provided between the reflector 121 and the movable frame 122. The plurality of springs 123 may be provided at different positions on the reflector 121. For example, four springs 123 may be provided around the reflector. When the reflector 121 gradually fits on the mounting surface 21, the springs 123 may be provided at different positions on the reflector 121. Figure 3The springs at the upper and lower parts of the middle part can undergo different elastic deformations to provide the reflector 121 with a pitch angle rotation degree of freedom. With the pitch angle rotation degree of freedom, the elastic connection between the reflector 121 and the movable frame 122 can enable the reflector 121 to generate a pitch angle rotation, so that the reflector 121 fits tightly on the mounting surface 21.

[0069] A plurality of springs 123 may be provided between the reflector 121 and the movable frame 122. Figure 3 The springs 123 on the inner and outer sides undergo different elastic deformations, which can provide the reflector 121 with a yaw rotation degree of freedom. With the yaw rotation degree of freedom, the elastic connection between the reflector 121 and the movable frame 122 can enable the reflector 121 to generate a yaw rotation, so that the reflector 121 fits tightly on the mounting surface 21.

[0070] In some embodiments, Figure 3 As shown, the reflector 121 can be set to be roughly rectangular. Optionally, the reflector can also be of other shapes. The shape of the reflector 121 can be selected according to the shape of the mounting surface 21 to at least match the portion of the mounting surface 21 on which the scanning mirror is assembled. An elastic structure can be set at at least three different positions of the reflector 121 to connect with the mounting frame 122, such as a spring 123. The reflector 121 and the movable frame 122 are elastically connected via the spring 123. When the movable frame 122 is close to the supporting device 11, the spring 123 is compressed so that the reflector 121 can achieve the above three degrees of freedom in the directions, and the reflector 121 can be pressed and fitted on the mounting surface 21.

[0071] According to some embodiments of the present disclosure, the optical goniometer 13 can determine the actual position between the mounting surface 21 and the optical goniometer according to the flight time of the echo, and determine the distance deviation between the mounting surface 21 and the standard position.

[0072] According to some embodiments of the present disclosure, the optical angle meter 13 can determine the angle deviation between the mounting surface 21 and the standard position according to the offset of the position of the echo relative to the position of the echo reflected from the standard position. The optical angle meter 13 emits a detection beam to the reflector 121, and the echo generated after the detection beam is reflected by the reflector 121 can be received by the optical angle meter 13, and the optical angle meter 13 determines the position of the echo. The position of the echo can indicate the position where the echo falls on the receiving surface of the optical angle meter 13.

[0073] "The echo position reflected from the standard position" can mean that when the mounting surface 21 is in the standard position, the reflector 121 is attached to the standard position, and the echo generated after the detection light beam is reflected by the reflector 121 falls on the receiving surface of the optical angle measuring device 13. Taking the standard position and the optical axis of the detection light beam being perpendicular as an example, when the detection light beam is incident perpendicularly to the reflector 121 in the standard position, the incident angle is 0, the echo returns along the original path, and the echo position reflected from the standard position and the exit position of the detection light beam basically coincide with each other. For ease of description, the following embodiments are described by taking the standard position and the optical axis of the detection light beam being perpendicular as an example. Those skilled in the art can understand that when the optical axis of the detection light beam is not perpendicular to the standard position, the echo position reflected from the standard position has a unique position, and can also be used to determine the angular deviation between the mounting surface 21 and the standard position based on the offset of the position of the echo relative to the position of the echo reflected from the standard position. When the mounting surface 21 has a certain angle deviation relative to the standard position (such as a pitch angle deviation or a yaw angle deviation), the echo generated after the light beam is reflected by the reflector 121 deviates, and the position where the echo is received in the optical angle measuring device 13 will also deviate from the echo position reflected from the standard position.

[0074] The offset of the position of the echo relative to the position of the echo reflected from the standard position includes: an offset component of the position of the echo relative to the position of the echo reflected from the standard position in a first direction, and an offset component of the position of the echo relative to the position of the echo reflected from the standard position in a second direction. The first direction and the second direction are perpendicular to each other. For convenience, the horizontal direction is defined as the first direction and the vertical direction is defined as the second direction as an example for explanation.

[0075] Take the example that the optical axis of the detection beam is perpendicular to the standard position. When the optical axis of the detection beam is perpendicular to the standard position, the echo position reflected from the standard position is, for example, Figure 4 In actual testing, when the mounting surface 21 has a deviation from the standard position, the echo deviates from Figure 4 The origin position shown in , for example, is Figure 4 The hollow circle position shown in .

[0076] In some embodiments, the offset of the position of the echo relative to the position of the echo reflected at the standard position includes an offset component of the position of the echo relative to the position of the echo reflected at the standard position in a first direction, and an offset component of the position of the echo relative to the position of the echo reflected at the standard position in a second direction, for example Figure 4 As shown in , the offset of the echo position relative to the echo position reflected from the standard position is decomposed into an offset component in a first direction and an offset component in a second direction, and the offset component in the first direction and the offset component in the second direction are represented by ΔX and ΔY, respectively.

[0077] According to the offset component ΔX in the first direction and the offset component ΔY in the second direction, the pitch angle deviation and the yaw angle deviation of the mounting surface 21 relative to the standard position may be determined.

[0078] In some embodiments, the scanning device 20 includes a mounting surface 21, such as Figure 5 As shown, the detection device 10 also includes a processing device 14, which communicates with the optical angle measuring device 13. The processing device 14 can obtain the deviation between the mounting surface 21 and the standard position from the optical angle measuring device 13, and the processing device 14 can be configured to determine whether the scanning device 20 meets the standard according to the deviation between the mounting surface 21 and the standard position. For example, when the pitch angle deviation of the mounting surface 21 is less than the first threshold, the scanning device 20 is determined to meet the standard; or when the yaw angle deviation of the mounting surface 21 is less than the second threshold, the scanning device 20 is determined to meet the standard; or when the pitch angle deviation of the mounting surface 21 is less than the first threshold, and the yaw angle deviation of the mounting surface 21 is less than the second threshold, the scanning device 20 is determined to meet the standard. The first threshold and the second threshold can be pre-set according to the application scenario and accuracy requirements of the scanning device 20, for example, the first threshold and the second threshold can both be set to 200".

[0079] like Figure 6 As shown, according to some embodiments of the present disclosure, the scanning device 20 may include one or more mounting surfaces 21, such as three, four, five, six or more mounting surfaces 21. The multiple mounting surfaces 21 may all be mounted with scanning mirrors, and the standard positions of the multiple mounting surfaces 21 may be set to be the same, such as all in the vertical plane, or may be set to be different, such as each of the multiple mounting surfaces 21 has a corresponding standard position. The support device 11 may drive the scanning device 20 to rotate so that the multiple mounting surfaces 21 are sequentially oriented toward the optical angle measuring device 13, and the reflector assembly 12 may enable the reflector 121 to sequentially fit on the multiple mounting surfaces 21, so as to facilitate the detection of the multiple mounting surfaces 21, and the deviation between the multiple mounting surfaces 21 and the standard positions corresponding to the mounting surfaces 21 may be determined by the optical angle measuring device 13.

[0080] In some embodiments, the scanning device 20 can be fixed on the supporting device 11, and the supporting device 11 can be controlled to drive the scanning device 20 to rotate, so that each mounting surface 21 faces the optical angle measuring device 13 in turn, and the reflector 121 is controlled to fit onto each mounting surface 21 in turn.

[0081] According to some embodiments, Figure 5As shown, the detection device 10 includes a processing device 14, and the processing device 14 communicates with the optical angle measuring device 13. Optionally, the processing device 14 can obtain the deviation between the mounting surface 21 and the standard position from the optical angle measuring device 13, or the processing device 14 can obtain measurement data from the optical angle measuring device 13 and generate the deviation between the mounting surface 21 and the standard position according to the measurement data. The processing device 14 can determine whether the scanning device 20 meets the standard according to the deviation between the mounting surface 21 and the standard position.

[0082] The processing device 14 can obtain the deviations of the plurality of mounting surfaces 21, such as the pitch angle deviation and the yaw angle deviation, and judge whether the scanning device 20 meets the standard according to the deviations. The scanning device 20 is judged to meet the standard when the following conditions are met:

[0083] The pitch angle deviations of the mounting surfaces 21 of the scanning device 20 are all smaller than the third threshold value; or the range of the pitch angle deviations of the mounting surfaces 21 of the scanning device 20 is smaller than the fourth threshold value; and

[0084] The yaw angle deviations of the mounting surfaces 21 of the scanning device 20 are all smaller than the fifth threshold; or the extreme difference of the yaw angle deviations of the mounting surfaces 21 of the scanning device 20 is smaller than the sixth threshold.

[0085] The pitch angle deviation of each mounting surface 21 of the scanning device 20 may represent the absolute deviation of the pitch angle deviation of each mounting surface 21. The yaw angle deviation of each mounting surface 21 of the scanning device 20 may represent the absolute deviation of the yaw angle deviation of each mounting surface 21. The third threshold and the fifth threshold may be pre-set according to the application scenario and accuracy requirements of the scanning device 20. Optionally, when the pitch angle deviations of all mounting surfaces 21 in the scanning device 20 are less than the third threshold, and the yaw angle deviations of all mounting surfaces 21 are less than the fifth threshold, it can be determined that the scanning device 20 meets the standard.

[0086] In other embodiments of the present disclosure, the relative deviation of each mounting surface 21 in the scanning device 20 can also be determined based on whether the range of the pitch angle deviation of each mounting surface 21 of the scanning device 20 is less than the fourth threshold value, and whether the range of the yaw angle deviation of each mounting surface 21 of the scanning device 20 is less than the sixth threshold value. The relative deviation can indicate the degree of consistency of each mounting surface 21 in the scanning device 20. The range of the pitch angle indicates the difference between the maximum and minimum values ​​of the pitch angle deviation of each mounting surface 21. The range of the yaw angle can indicate the difference between the maximum and minimum values ​​of the yaw angle deviation. The relative deviation of each mounting surface 21 can also be indicated by variance, standard deviation, etc.

[0087] When the range of the pitch angle deviation of each mounting surface 21 of the scanning device 20 is less than the fourth threshold value, and the range of the yaw angle deviation of each mounting surface 21 of the scanning device 20 is less than the sixth threshold value, it indicates that the consistency of the multiple mounting surfaces 21 in the scanning device 20 is high, for example, there is no deviation, or the deviation is basically the same. When there are basically consistent deviations between the multiple mounting surfaces 21 and their corresponding standard positions, other methods can also be used to correct the deviations. For example, when the scanning device 20 is used in a laser radar, the detection data of the laser radar can be compensated to reduce the influence of the deviation of the mounting surface 21 in the scanning device 20 on the detection data, wherein the compensation for the detection data can be determined based on the deviation of the mounting surface 21 obtained by actual measurement.

[0088] In other embodiments, it is also possible to comprehensively evaluate whether the scanning device 20 meets the standard based on the absolute deviation and relative deviation of the mounting surface 21. For example, when the pitch angle deviations of each mounting surface 21 of the scanning device 20 are all less than the third threshold, and the range of the yaw angle deviations of each mounting surface 21 of the scanning device 20 is less than the sixth threshold, it is determined that the scanning device 20 meets the standard. For another example, when the range of the pitch angle deviations of each mounting surface 21 of the scanning device 20 is less than the fourth threshold, and the yaw angle deviations of each mounting surface 21 of the scanning device 20 are all less than the fifth threshold, it is determined that the scanning device 20 meets the standard.

[0089] like Figure 1 As shown, according to some embodiments of the present disclosure, the detection device 10 further includes a base 15, and the support device 11, the reflector assembly 12, and the optical angle measuring device 13 can be arranged on the base 15. The base 15 can improve the stability of the detection device 10, so that the distance between the optical angle measuring device 13 and the support device 11 remains stable. A guide rail 151 can also be arranged on the base 15, and the movable frame 122 can be arranged to move relative to the support device 11 along the guide rail 151.

[0090] like Figure 1 As shown, in some embodiments, the support device 11 includes a mounting seat 111 and a fixing portion 112. The mounting seat 111 can support the scanning device 20. In some embodiments, the mounting seat 111 can also drive the scanning device 20 to rotate. The structure of the mounting seat 111 is as shown in FIG. Figure 7 As shown, it can be set on the movement path of the reflector assembly 12, the shape of the top surface matches the scanning device 20, and the scanning device 20 is installed on the top surface of the mounting seat 111. The top surface of the mounting seat 111 can be a finely processed surface, which is beneficial to improve the detection accuracy of the scanning device 20.

[0091] The fixing portion 112 can fix the scanning device 20 on the mounting seat 111 so that the scanning device 20 maintains a fixed position. The fixing portion 112 can be arranged above the mounting seat 111. After the scanning device 20 is arranged on the mounting seat 111, the fixing portion 112 can be controlled to press against the scanning device 20 to prevent the scanning device 20 from moving during the detection process, resulting in inaccurate detection results. In some embodiments, the fixing portion 112 can rotate, and when the fixing portion 112 rotates, the scanning device 20 can be driven to rotate, and the scanning device 20 is rotated to a preset position so that the scanning device 20 faces the optical angle measuring device 13.

[0092] The present disclosure also relates to a method for detecting a scanning device. Figure 8 The process of the detection method 100 of the scanning device according to some embodiments of the present disclosure is shown below. Figure 8 A method 100 for inspecting a scanning device will be described.

[0093] The scanning device in this embodiment includes at least one mounting surface for mounting a scanning mirror, and the scanning device in this embodiment includes, for example, the scanning device 20 in the foregoing embodiment. In some embodiments, the scanning device 20 can be inspected by using the inspection device 10 in the foregoing embodiment.

[0094] like Figure 8 As shown, in step S101, the scanning device is fixed in a preset posture, for example, by clamping, adsorption, etc. to keep the scanning device in the preset posture, so as to detect at least one mounting surface on the scanning device. In some embodiments, the scanning device can be set on a supporting device.

[0095] In step S102, the reflector is attached to the mounting surface. For example, the reflector is pressed against the mounting surface, or the reflector is attached to the mounting surface, wherein the reflective surface of the reflector faces the outside of the scanning device, and the position of the reflector on the mounting surface of the scanning device is substantially consistent with the position of the scanning mirror on the mounting surface of the scanning device. By detecting the posture of the reflector, it can be used to determine whether the scanning device meets the standard.

[0096] In step S103, a detection beam is emitted to the reflector, wherein the detection beam may be a beam with good directivity, such as a laser. The detection beam is reflected after being incident on the reflector, and in step S104, an echo generated by the detection beam reflected by the reflector is received. In some embodiments, the optical angle measuring device may emit a detection beam and receive an echo.

[0097] In step S105, the deviation between the mounting surface and the standard position is determined based on the echo. The theoretical position of the echo indicates the position of the echo after the detection light beam is irradiated on the reflector and reflected when the reflector is attached to the standard position of the mounting surface. The theoretical position of the echo can be measured in advance or obtained based on theoretical calculation. When performing the detection, the reflector is attached to the mounting surface, and the measured position of the echo reflected by the reflector can be obtained by actual measurement. According to the deviation between the measured position of the echo and the theoretical position, the deviation between the mounting surface and the standard position can be determined.

[0098] The detection method 100 in this embodiment has a simple process and can quickly and accurately obtain the deviation of the mounting surface relative to the standard position, thereby determining whether the scanning device meets the standard.

[0099] Fig. 9 The flow of a detection method 200 for a scanning device according to some embodiments of the present disclosure is shown. This embodiment includes a process for determining an echo position offset. In the detection method 200, steps S201, S202, S203, and S204 may be implemented in a manner that is the same as or similar to steps S101, S102, S103, and S104 in the detection method 100 for a scanning device in the aforementioned embodiment, and are not described in detail herein.

[0100] In step S205, the offset between the position of the echo and the position of the echo reflected from the standard position is determined. The "position of the echo reflected from the standard position" may mean that when the mounting surface is in the standard position, the reflector is attached to the standard position, and the position of the echo generated after the detection beam is reflected by the reflector falls on the receiving surface (e.g., the receiving surface of the optical goniometer). The offset may be, for example, a comparison of the planar distance between the position of the measured echo and the position of the echo reflected from the standard position in the same plane, for ease of comparison and simplified calculation. The plane may be, for example, a plane perpendicular to the detection optical axis, such as the exit surface or the receiving surface of the optical goniometer. In some embodiments, the offset may also be represented by an angle offset, for example, determining the angle difference between the echo and the detection beam.

[0101] In a subsequent step, the angular deviation between the mounting surface and the standard position can be determined based on the offset between the position of the echo and the position of the echo reflected from the standard position. Fig. 9 As shown, in step S206, the offset is decomposed into offset components along the first direction and the second direction.

[0102] In some embodiments, the angle deviation between the mounting surface and the standard position may include the pitch angle deviation of the mounting surface and the yaw angle deviation of the mounting surface. The offset between the position of the echo and the position of the echo reflected from the standard position may be decomposed into offset components in two directions to determine, for example, the pitch angle deviation and the yaw angle deviation. In some embodiments, the first direction may be set to the horizontal direction, for example, and the second direction may be set to the vertical direction, for example. In step S207, the pitch angle deviation of the mounting surface may be determined according to the offset component in the second direction of the offset of the position of the echo and the position of the echo reflected from the standard position. In step S207, the yaw angle deviation of the mounting surface may be determined according to the offset component in the first direction of the offset of the position of the echo and the position of the echo reflected from the standard position. The relationship between the first direction and the second direction and the yaw angle deviation and the pitch angle deviation may refer to the aforementioned embodiment.

[0103] According to some embodiments of the present disclosure, whether the scanning device complies with the standard may be determined based on the pitch angle deviation and / or the yaw angle deviation of the installation surface.

[0104] For example Figure 8 As shown in , in step S208, it is determined whether the pitch angle deviation of the installation surface is less than a first threshold value, and / or it is determined whether the yaw angle deviation of the installation surface is less than a second threshold value. According to different application scenarios of the scanning device and different accuracy requirements of the scanning device, the sizes of the first threshold value and the second threshold value can be preset, and it can also be preset to only judge the pitch angle deviation, only judge the yaw angle deviation, or judge the pitch angle deviation and the yaw angle deviation at the same time. When the judgment conditions are met, in step S209, it is determined that the scanning device meets the standard. Otherwise, it is determined that the scanning device does not meet the standard.

[0105] Fig.10 The process of the detection method 300 of the scanning device according to some embodiments of the present disclosure is shown below. Fig.10 The detection method 300 is described.

[0106] The scanning device may include at least two mounting surfaces, and the detection method 300 includes sequentially detecting the multiple mounting surfaces. For example, in step S301, the scanning device is fixed in a preset posture, and for one of the mounting surfaces, one mounting surface in the scanning device (the mounting surface to be detected) is controlled to face the detection beam, so that the detection beam can be irradiated on the reflector attached to the mounting surface. And perform subsequent steps, wherein steps S302, S303, S304 and S305 are substantially the same or similar to steps S102, S103, S104 and S105 in the detection method 100 in the aforementioned embodiment, and are not repeated here.

[0107] After detecting one mounting surface, another mounting surface in the scanning device is controlled to face the detection beam to detect the mounting surface. In this way, the deviations of all mounting surfaces in the scanning device relative to the corresponding standard positions can be determined in sequence.

[0108] In step S306, whether the scanning device meets the standard is determined based on the deviation between one mounting surface and the corresponding standard position; or whether the scanning device meets the standard is determined based on the deviation between multiple mounting surfaces and the corresponding standard positions. For example, the scanning device is determined to meet the standard when the following conditions are met:

[0109] When the pitch angle deviation of all mounting surfaces in the scanning device is less than a third threshold value and / or the yaw angle deviation of all mounting surfaces in the scanning device is less than a fifth threshold value; or

[0110] When the pitch angle deviation of all mounting surfaces in the scanning device is less than the third threshold, or the range of the pitch angle deviation of all mounting surfaces in the scanning device is less than the fourth threshold, and the range of the second angle deviation of all mounting surfaces in the scanning device is less than the sixth threshold.

[0111] For scanning devices used in different scenarios, different conditions for judging whether the scanning device meets the standard can be set. For example, referring to the above embodiment, the relationship between the absolute deviation, the relative deviation, or the combination of the absolute deviation and the relative deviation and the corresponding threshold value can be used to judge whether the scanning device meets the standard. When the judgment condition is met, the scanning device is judged to meet the standard, and when the judgment condition is not met, the scanning device is judged to not meet the standard.

[0112] In some embodiments of the present disclosure, the aforementioned scanning device detection method can be performed using the detection device 10 of the scanning device 20 in the aforementioned embodiment. The aforementioned scanning device detection method can be performed by controlling the detection device 10 through a controller. The controller can, for example, communicate with the support device, the reflector assembly, and the optical angle measuring device to control the movement of the support device and the reflector assembly, and obtain the measurement data of the optical angle measuring device. The processing device can be set in the controller or independently of the controller. In this way, fully automated scanning device detection can be achieved, manpower input can be reduced, and detection accuracy and efficiency can be improved.

[0113] Finally, it should be noted that the above is only an embodiment of the present disclosure and is not intended to limit the present disclosure. Although the present disclosure is described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present disclosure shall be included in the protection scope of the present disclosure.

Claims

1. A detection device for a scanning device, wherein the scanning device comprises at least one mounting surface for mounting a scanning mirror, characterized in that: The detection device comprises: a supporting device, a reflector assembly and an optical angle measuring device; The supporting device is configured to support the scanning device; The reflector assembly comprises a reflector and a movable frame, the reflector is arranged on the movable frame, and the movable frame is configured to be movable relative to the support device, so as to approach the support device and affix the reflector to the mounting surface, or to move away from the support device; The optical angle measuring device is configured to emit a detection light beam, receive an echo generated when the detection light beam is reflected by the reflector, and determine a deviation between the mounting surface and a standard position according to the echo.

2. The detection device according to claim 1, characterized in that: The deviation between the mounting surface and the standard position includes a pitch angle deviation of the mounting surface.

3. The detection device according to claim 2, characterized in that: The angular deviation between the mounting surface and the standard position includes a yaw angle deviation of the mounting surface.

4. The detection device according to claim 3, characterized in that: The reflector is elastically connected to the movable frame, so that the reflector has at least one degree of freedom of movement in the following three directions relative to the movable frame: freedom of movement along the optical axis of the detection beam; Pitch angle rotational freedom; and Yaw angle rotational degree of freedom.

5. The detection device according to claim 3, characterized in that: wherein the optical angle measuring device is configured to determine the angular deviation between the mounting surface and the standard position based on the offset of the position of the echo relative to the position of the echo reflected from the standard position; The offset includes: a displacement component in a first direction of the position of the echo relative to the position of the echo reflected from the standard position; and The position of the echo is a displacement component in a second direction relative to the position of the echo reflected from the standard position; wherein the first direction and the second direction are perpendicular to each other.

6. The detection device according to any one of claims 3 to 5, characterized in that: The scanning device includes a mounting surface, the detection device also includes a processing device, the processing device communicates with the optical angle measuring device to obtain the deviation between the mounting surface and the standard position, and the processing device is configured to: determine whether the scanning device meets the standard according to the deviation; when the following conditions are met, determine that the scanning device meets the standard: The pitch angle deviation of the mounting surface is less than a first threshold; and / or The yaw angle deviation of the mounting surface is less than a second threshold.

7. The detection device according to any one of claims 3 to 5, characterized in that: The scanning device comprises at least two mounting surfaces; the supporting device is configured to drive the scanning device to rotate so that the plurality of mounting surfaces are sequentially oriented toward the optical angle measuring device; the reflector assembly enables the reflector to be sequentially attached to the plurality of mounting surfaces; and the optical angle measuring device determines the deviation between the plurality of mounting surfaces and the standard positions corresponding to the mounting surfaces.

8. The detection device according to claim 7, characterized in that: Also includes: A processing device, the processing device communicates with the optical angle measuring device to obtain angle deviations between multiple mounting surfaces and standard positions, the processing device is configured to: determine that the scanning device meets the standard when the following conditions are met: The pitch angle deviations of the various mounting surfaces of the scanning device are all smaller than the third threshold; or the range of the pitch angle deviations of the various mounting surfaces of the scanning device is smaller than the fourth threshold; and The yaw angle deviations of the various mounting surfaces of the scanning device are all smaller than a fifth threshold; or the extreme difference of the yaw angle deviations of the various mounting surfaces of the scanning device is smaller than a sixth threshold.

9. The detection device according to any one of claims 1 to 5, characterized in that: Also includes: A base, on which the supporting device, the reflector assembly and the optical angle measuring device are all arranged; A guide rail is arranged on the base, and the movable frame is configured to be movable along the guide rail relative to the supporting device.

10. The detection device according to any one of claims 1 to 5, characterized in that: The reflector assembly further comprises a spring, and the reflector and the movable frame are elastically connected via the spring; when the movable frame approaches the supporting device, the spring presses the reflector to fit onto the mounting surface.

11. The detection device according to any one of claims 1 to 5, characterized in that: The supporting device comprises a mounting seat and a fixing portion. The scanning device is arranged on the mounting seat; The fixing portion is configured to fix the scanning device on the mounting seat so that the scanning device maintains a fixed posture.

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