Probe structure for IV test of photovoltaic automatic assembly line

Abstract

The utility model relates to a probe structure for photovoltaic automatic assembly line IV test, and belongs to the technical field of photovoltaic automatic assembly line test. Comprising a substrate, a base column and a probe head, multiple groups of mounting holes are formed in the surface of the substrate in a penetrating mode, sleeves are movably connected into the mounting holes, and bases are fixedly connected to the lower surfaces of the sleeves. According to the utility model, the lower surface of the probe head is fixedly provided with a plurality of groups of bumps, and the bumps and the test tool form a plurality of contact points, so that the bumps can be ensured to be in good contact with the test tool under the action of the gravity of the assembly and the first pressure spring. Even if a certain group of bumps are abraded, other bumps can still be in contact with the test tool, so that the probability of test failure caused by poor contact is effectively reduced. In addition, the probe head and the base column are designed to be of a split type structure, so that after the probe head is abraded, only the probe head needs to be disassembled and replaced, the base column does not need to be disassembled, the disassembly process of the probe head is simple and convenient, and the replacement and shutdown time is greatly shortened.

Description

Technical Field

[0001] The utility model relates to the technical field of photovoltaic automatic assembly line testing, in particular to a probe structure for IV testing of a photovoltaic automatic assembly line. Background Art

[0002] In the photovoltaic module manufacturing process, IV testing is an essential manufacturing link. Photovoltaic modules must undergo IV testing before their electrical performance parameters such as power and current can be obtained.

[0003] In photovoltaic automatic production lines, flat probes and test fixtures are often used for contact detection.

[0004] Frequent contact between the flat probe and the test fixture will generate friction, resulting in serious poor contact of the flat probe, thus greatly shortening its service life. At the same time, because the flat probe and the test fixture adopt surface contact, the contact resistance of surface contact is unstable. When the contact surface is slightly damaged or improperly matched by the outside world, the contact resistance will increase greatly, resulting in test failure, which will invisibly reduce the overall speed of the assembly line and affect production output. Secondly, the flat probe adopts an integrated cylindrical design. When the probe head is worn and needs to be replaced, the flat probe needs to be completely removed from the substrate. This disassembly and assembly process is not only inconvenient, but also very time-consuming and labor-intensive. Utility Model Content

[0005] In order to solve the above technical problems, the utility model provides a probe structure for IV testing of photovoltaic automatic assembly line. The technical solution of the utility model is as follows:

[0006] A probe structure for IV testing of a photovoltaic automatic assembly line comprises a substrate, a base column and a probe head, wherein the surface of the substrate is penetrated with a plurality of mounting holes, the interior of the mounting holes is movably connected with a sleeve, the lower surface of the sleeve is fixedly connected with a base, the base column is slidably connected to the interior of the sleeve, the outer side of the base column is fixedly connected with a fixing ring, the upper surface of the fixing ring abuts with a compression spring 1, the compression spring is set on the outer side of the base column, the upper end of the compression spring 1 abuts with the lower surface of the base, a threaded buckle is fixedly provided at the upper end of the outer side of the base column, a fixing nut is provided on the outer thread of the threaded buckle, the fixing nut abuts against the upper surface of the substrate, an inner hole is formed on the upper surface of the base column, a top cover is movably connected above the inner hole, a lower hole is formed on the lower surface of the base column, the inner hole and the lower hole are connected through a connecting hole, a through hole is formed on the right side wall of the lower hole, the probe head is movably connected to the bottom of the base column, a plurality of groups of protrusions are fixedly provided on the lower surface of the probe head, the probe The upper surface of the head is fixedly connected with a connecting seat, the upper surface of the connecting seat is fixedly connected with a fixing column, the fixing column is detachably connected to the inside of the lower hole, a fixing hole is opened on the right side of the fixing column, the internal thread of the through hole is connected with a fixing bolt, the end of the fixing bolt passes through the through hole and abuts against the inner side of the fixing hole, the outer side of the base column and the outer side of the lower hole are connected with an elastic limiter for limiting the position of the fixing column, the inner side of the top cover is slidably connected with an inner rod, the bottom end of the inner rod passes through the inner hole and the connecting hole in sequence and extends to the inside of the lower hole, a matching hole is opened on the upper surface of the fixing column, the lower surface of the inner rod abuts against the inner surface of the matching hole, the outer side of the inner rod is fixedly connected with a ring seat, the upper surface of the ring seat abuts with a second compression spring, the upper end of the second compression spring abuts against the lower surface of the top cover, the ring seat and the second compression spring are both located inside the inner hole, the upper surface of the inner rod is fixedly connected with a threaded rod, and the outer side of the threaded rod is sleeved with two groups of limit nuts for fixing the test line.

[0007] Optionally, the sleeve and the mounting hole are threadedly connected.

[0008] Optionally, the inner wall of the sleeve is equidistantly provided with a plurality of guide grooves, the outer side of the base column is fixedly connected with a plurality of guide blocks having sizes matching the guide grooves, the guide blocks are located between the fixing ring and the threaded buckle, and the guide blocks are slidably connected inside the guide grooves at corresponding positions.

[0009] Optionally, the top cover is threadedly connected to the top of the inner hole, and a hexagonal knob is fixedly connected to the upper surface of the top cover.

[0010] Optionally, the left inner wall of the lower hole is provided with three groups of slots at equal intervals, and the left side of the fixing column is fixedly connected with three groups of plug blocks at equal intervals, and the plug blocks are inserted into the slots at corresponding positions.

[0011] Optionally, a movable groove is provided on the right side wall of the lower hole and at the upper and lower parts of the through hole, and the elastic limiting member includes two groups of fixed semicircular rings, the two groups of fixed semicircular rings are fixedly connected to the left outer wall of the base column and are respectively in the same horizontal plane as the two groups of movable grooves, the right side of the fixed semicircular ring is fixedly connected to a movable semicircular ring by a connecting bolt, an inner groove is provided inside the movable semicircular ring, and two groups of springs are fixedly connected to the inner side wall of the inner groove, one end of the spring away from the inner groove is fixedly connected to a limiting block, the limiting block is slidably connected to the inside of the movable groove, and a limiting groove is provided on the right side of the fixed column and at the upper and lower parts of the fixed hole, and the limit block elastically abuts against the inside of the limiting groove.

[0012] Optionally, the upper and lower surfaces of the movable groove are both provided with sliding grooves, the upper and lower surfaces of the limit block are both fixedly connected with sliding blocks, and the sliding blocks are slidably connected inside the sliding grooves on the corresponding side.

[0013] All the above optional technical solutions can be combined arbitrarily, and the present utility model does not provide detailed descriptions of the structures after the combinations.

[0014] By means of the above scheme, the beneficial effects of the utility model are as follows:

[0015] 1. The utility model fixes multiple groups of bumps on the lower surface of the probe head, and these bumps form multiple contact points with the test fixture. Since the contact points are small, the gravity of the assembly and the compression spring can ensure that the bumps are in good contact with the test fixture. Even if one group of bumps is worn, the other bumps can still maintain contact with the test fixture, effectively reducing the probability of test failure due to poor contact, which is of great help to improve the overall speed of the assembly line and increase production.

[0016] 2. The utility model designs the probe head and the base column as a split structure. Since the probe head is a component that is easily worn, this design allows only the probe head to be disassembled and replaced after the probe head is worn, without the need to disassemble the base column. The probe head disassembly process is simple and convenient, greatly shortening the replacement and downtime time.

[0017] The above description is only an overview of the technical solution of the utility model. In order to more clearly understand the technical means of the utility model and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the utility model in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the overall appearance of the probe structure for the photovoltaic automatic assembly line IV test provided by the utility model;

[0019] Figure 2 It is a schematic diagram of the exploded structure of the base plate, sleeve and base column in the utility model;

[0020] Figure 3 It is a structural schematic diagram of the sleeve in the utility model;

[0021] Figure 4 This is a front cross-sectional view of the cooperation between the base column, the probe head and the inner rod in the utility model;

[0022] Figure 5 This is a schematic diagram of the exploded structure of the base column, the probe head and the inner rod in the utility model;

[0023] Figure 6 It is a schematic diagram of the exploded structure of the base column and the elastic limiter in the utility model;

[0024] Figure 7 It is a structural schematic diagram of the probe head in the utility model;

[0025] Figure 8 It is a bottom plan view of the probe head in the utility model;

[0026] Fig. 9 It is a schematic diagram of the exploded structure of the movable semicircular ring, the spring and the limit block in the utility model;

[0027] Fig.10 It is a schematic diagram of the structure of the inner rod, the second compression spring and the top cover in the utility model.

[0028] Numbers in the figure: 1, base plate; 11, mounting hole; 2, sleeve; 21, base; 22, guide groove; 3, base column; 31, fixing ring; 32, compression spring 1; 33, guide block; 34, thread buckle; 35, fixing nut; 36, inner hole; 37, top cover; 371, hexagonal knob; 38, lower hole; 381, through hole; 382, ​​movable groove; 3821, slide groove; 383, slot; 39, connecting hole; 4, probe head; 41, Bump; 42, connecting seat; 43, fixing column; 431, fixing hole; 432, matching hole; 433, plug block; 434, limiting groove; 5, fixing bolt; 6, elastic limiting member; 61, fixed semicircular ring; 62, movable semicircular ring; 621, inner groove; 63, connecting bolt; 64, spring; 65, limiting block; 651, slider; 7, inner rod; 71, ring seat; 72, compression spring 2; 73, threaded rod; 74, limiting nut. DETAILED DESCRIPTION

[0029] The following is a further detailed description of the specific implementation of the present invention in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0030] See also Figure 1-10As shown, the utility model provides a probe structure for IV testing of a photovoltaic automatic assembly line, comprising a substrate 1, a base column 3 and a probe head 4. A plurality of mounting holes 11 are formed on the surface of the substrate 1. A sleeve 2 is movably connected inside the mounting hole 11. A base 21 is fixedly connected to the lower surface of the sleeve 2. The base column 3 is slidably connected inside the sleeve 2. A fixing ring 31 is fixedly connected to the outer side of the base column 3. A compression spring 32 is abutted on the upper surface of the fixing ring 31. The compression spring 32 is sleeved on the outer side of the base column 3. The upper end of the compression spring 32 abuts on the lower surface of the base 21. A threaded buckle 34 is fixedly provided at the upper end of the outer side of the base column 3, and a fixing nut 35 is provided on the outer thread sleeve of the threaded buckle 34. The fixing nut 35 abuts against the upper surface of the base plate 1. An inner hole 36 is provided on the upper surface of the base column 3, and a top cover 37 is movably connected above the inner hole 36. A lower hole 38 is provided on the lower surface of the base column 3, and the inner hole 36 and the lower hole 38 are connected through a connecting hole 39. A through hole 381 is penetrated through the right side wall of the lower hole 38. The probe head 4 is movably connected to the lower side of the base column 3. A plurality of groups of protrusions 41 are fixedly provided on the lower surface of the probe head 4. The upper surface is fixedly connected with a connecting seat 42, and the upper surface of the connecting seat 42 is fixedly connected with a fixing column 43, and the fixing column 43 is detachably connected to the inside of the lower hole 38. A fixing hole 431 is opened on the right side of the fixing column 43, and the internal thread of the through hole 381 is connected with a fixing bolt 5, and the end of the fixing bolt 5 passes through the through hole 381 and abuts against the inner side of the fixing hole 431. The outer side of the base column 3 and the outer side of the lower hole 38 are connected with an elastic limiter 6 for limiting the position of the fixing column 43, and the inner side of the top cover 37 is slidably connected with an inner rod 7, and the bottom end of the inner rod 7 passes through the through hole 381 in sequence. The fixing column 43 passes through the inner hole 36 and the connecting hole 39 and extends to the interior of the lower hole 38. A matching hole 432 is opened on the upper surface of the fixing column 43. The lower surface of the inner rod 7 abuts against the inner surface of the matching hole 432. The outer side of the inner rod 7 is fixedly connected with a ring seat 71. The upper surface of the ring seat 71 abuts with a second compression spring 72. The upper end of the second compression spring 72 abuts against the lower surface of the top cover 37. The ring seat 71 and the second compression spring 72 are both located inside the inner hole 36. A threaded rod 73 is fixedly connected to the upper surface of the inner rod 7. Two sets of limit nuts 74 for fixing the test line are sleeved on the outer side of the threaded rod 73.

[0031] The utility model fixes multiple groups of bumps 41 on the lower surface of the probe head 4, and these bumps 41 will form multiple contact points with the test fixture. Since the contact points are small, the gravity of the assembly and the compression spring 32 can ensure that the bumps 41 are in good contact with the test fixture. Even if a group of bumps 41 is worn, the other bumps 41 can still maintain contact with the test fixture, effectively reducing the probability of test failure due to poor contact, which is of great help to improve the overall speed of the assembly line and increase production. At the same time, these bumps 41 have a large unit pressure under the same contact pressure, and can provide a larger unit pressure, thereby effectively reducing the contact resistance. The small contact area of ​​the bump 41 ensures that the required contact mutual pressure is small, further improving the test success rate and the working reliability of the equipment.

[0032] Secondly, the utility model designs the probe head 4 and the base column 3 as a split structure. This design makes it only necessary to disassemble and replace the probe head 4 after the probe head 4 is worn, without disassembling the base column 3, thereby shortening the replacement and downtime. An elastic limiter 6 is used between the probe head 4 and the base column 3 for preliminary limiting, and then the position of the probe head 4 is locked by the fixing bolt 5. During the disassembly and assembly process, it is only necessary to loosen the fixing bolt 5, and then apply an upward or downward force to the probe head 4 to adjust the position of the probe head 4, thereby completing the disassembly and assembly of the probe head 4, which is simple and efficient to operate. In addition, the top of the fixed probe head 4 is elastically abutted with an inner rod 7, and the top of the inner rod 7 is connected to the test line. Under the elastic force of the compression spring 2 72, the bottom end of the inner rod 7 always abuts against the inner surface of the matching hole 432 opened at the top of the probe head 4, ensuring the stability and reliability of the connection, so that the test and production efficiency will not be affected by looseness or poor contact during the working process.

[0033] Furthermore, the sleeve 2 and the mounting hole 11 are threadedly connected.

[0034] The sleeve 2 and the mounting hole 11 are of a detachable structure, which is convenient for subsequent maintenance and replacement.

[0035] Furthermore, the inner wall of the sleeve 2 is equidistantly provided with a plurality of guide grooves 22, and the outer side of the base column 3 is fixedly connected with a plurality of guide blocks 33 whose sizes match the guide grooves 22, and the guide blocks 33 are located between the fixing ring 31 and the threaded buckle 34, and the guide blocks 33 are slidably connected to the inside of the guide grooves 22 at the corresponding positions.

[0036] During the test, the substrate 1 moves downward, compressing the compression spring 1 32, so that the protrusion 41 on the lower surface of the probe head 4 elastically abuts against the upper surface of the test fixture. After the substrate 1 moves downward and the protrusion 41 on the lower surface of the probe head 4 contacts the upper surface of the test fixture, the base column 3 slides relative to the sleeve 2. At this time, the guide block 33 slides inside the guide groove 22, and the guide groove 22 limits the sliding path of the guide block 33, ensuring the verticality and stability of the movement of the base column 3.

[0037] Furthermore, the top cover 37 is threadedly connected to the top of the inner hole 36 , and a hexagonal knob 371 is fixedly connected to the upper surface of the top cover 37 .

[0038] The top cover 37 and the base column 3 are in a detachable structure. When the compression spring 2 72 or the inner rod 7 needs to be replaced and maintained, the top cover 37 only needs to be unscrewed from the top of the inner hole 36. This detachable structure greatly simplifies the maintenance process, saves time and improves the convenience of operation.

[0039] Furthermore, three groups of slots 383 are equidistantly formed on the left inner wall of the lower hole 38 , and three groups of plug blocks 433 are equidistantly fixedly connected to the left side of the fixing column 43 , and the plug blocks 433 are inserted into the slots 383 at corresponding positions.

[0040] When installing the probe head 4, it is only necessary to align the three groups of plug blocks 433 on the left side of the fixing column 43 with the three groups of slots 383 to complete the installation and positioning of the probe head 4, ensuring that the probe head 4 can be accurately positioned at the required position, providing a solid foundation for subsequent work.

[0041] Further, a movable groove 382 is provided on the right side wall of the lower hole 38 and above and below the through hole 381. The elastic limit member 6 includes two groups of fixed semicircular rings 61. The two groups of fixed semicircular rings 61 are fixedly connected to the left outer wall of the base column 3 and are respectively in the same horizontal plane as the two groups of movable grooves 382. The right side of the fixed semicircular ring 61 is fixedly connected to the movable semicircular ring 62 by a connecting bolt 63. An inner groove 621 is provided inside the movable semicircular ring 62. Two groups of springs 64 are fixedly connected to the inner side wall of the inner groove 621. One end of the spring 64 away from the inner groove 621 is fixedly connected to a limiting block 65. The limiting block 65 is slidably connected to the inside of the movable groove 382. A limiting groove 434 is provided on the right side of the fixed column 43 and above and below the fixed hole 431. The limiting block 65 elastically abuts against the inside of the limiting groove 434.

[0042] When the fixing column 43 is inserted into the lower hole 38, the limit block 65 will be squeezed, and the spring 64 is in a compressed state. When the position of the limit block 65 is relatively aligned with the position of the limit groove 434, the limit block 65 loses its position restriction, and the spring 64 restores its elastic deformation, pushing the limit block 65 into the limit groove 434, thereby elastically fixing the probe head 4. When the operator uses the fixing bolt 5 to fix the fixing column 43, there is no need to apply external force to the probe head 4 for support. The advantage of the elastic limiter 6 is that it can ensure the precise positioning of the probe head 4. Once the fixing column 43 is correctly inserted and locked by the elastic limiter 6, the operator can confirm that it is in place. This design simplifies the fixing process and improves the efficiency and accuracy of the operation.

[0043] The fixed semicircular ring 61 and the movable semicircular ring 62 are connected by bolts, so that when it is necessary to maintain or replace some parts of the elastic limiter 6, the movable semicircular ring 62 can be easily separated and disassembled from the fixed semicircular ring 61.

[0044] Furthermore, the upper and lower surfaces of the movable groove 382 are both provided with sliding grooves 3821 , and the upper and lower surfaces of the limiting block 65 are both fixedly connected with sliding blocks 651 , and the sliding blocks 651 are slidably connected inside the sliding grooves 3821 on the corresponding side.

[0045] The limit block 65 drives the slider 651 to slide inside the slide groove 3821 , and the slide groove 3821 has the function of limiting and guiding the limit block 65 .

[0046] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. It should be pointed out that a person skilled in the art can make several improvements and modifications without departing from the technical principle of the present invention, and these improvements and modifications should also be regarded as within the protection scope of the present invention.

Claims

1. A probe structure for IV testing of photovoltaic automatic assembly line, characterized by: The probe head (4) comprises a base plate (1), a base column (3) and a probe head (4), wherein the surface of the base plate (1) is provided with a plurality of mounting holes (11), the interior of the mounting hole (11) is movably connected with a sleeve (2), the lower surface of the sleeve (2) is fixedly connected with a base (21), the base column (3) is slidably connected with the interior of the sleeve (2), the outer side of the base column (3) is fixedly connected with a fixing ring (31), the upper surface of the fixing ring (31) is abutted with a compression spring (32), the compression spring (32) is sleeved on the outer side of the base column (3), the upper end of the compression spring (32) is abutted with the lower surface of the base (21), the outer upper end of the base column (3) is fixedly provided with a threaded buckle (34), and the The outer thread sleeve of the threaded buckle (34) is provided with a fixing nut (35), and the fixing nut (35) abuts against the upper surface of the base plate (1). The upper surface of the base column (3) is provided with an inner hole (36), and a top cover (37) is movably connected above the inner hole (36). A lower hole (38) is provided on the lower surface of the base column (3), and the inner hole (36) and the lower hole (38) are connected through a connecting hole (39). A through hole (381) is provided through the right side wall of the lower hole (38). The probe head (4) is movably connected to the lower side of the base column (3), and a plurality of groups of protrusions (41) are fixedly provided on the lower surface of the probe head (4). A connecting member (39) is fixedly connected to the upper surface of the probe head (4). The connecting seat (42) is provided with a fixing column (43) on the upper surface of the connecting seat (42), and the fixing column (43) is detachably connected to the inside of the lower hole (38). A fixing hole (431) is provided on the right side of the fixing column (43), and a fixing bolt (5) is connected to the inner thread of the through hole (381). The end of the fixing bolt (5) passes through the through hole (381) and abuts against the inner side of the fixing hole (431). An elastic stopper (6) for limiting the position of the fixing column (43) is connected to the outer side of the base column (3) and located on the outer side of the lower hole (38). An inner rod (7) is slidably connected to the inside of the top cover (37), and the bottom end of the inner rod (7) passes through the inner hole (36) in sequence. ) and the connecting hole (39) and extend to the inside of the lower hole (38); the upper surface of the fixing column (43) is provided with a matching hole (432); the lower surface of the inner rod (7) abuts against the inner surface of the matching hole (432); the outer side of the inner rod (7) is fixedly connected with a ring seat (71); the upper surface of the ring seat (71) abuts against a second compression spring (72); the upper end of the second compression spring (72) abuts against the lower surface of the top cover (37); the ring seat (71) and the second compression spring (72) are both located inside the inner hole (36); the upper surface of the inner rod (7) is fixedly connected with a threaded rod (73); the outer side of the threaded rod (73) is sleeved with two sets of limit nuts (74) for fixing the test line.

2. A photovoltaic automatic assembly line IV test probe structure according to claim 1, characterized in that: The sleeve (2) and the mounting hole (11) are threadedly connected.

3. A photovoltaic automatic assembly line IV test probe structure according to claim 1 or 2, characterized in that: The inner wall of the sleeve (2) is provided with a plurality of guide grooves (22) at equal intervals, and the outer side of the base column (3) is fixedly connected with a plurality of guide blocks (33) whose sizes match the guide grooves (22), and the guide blocks (33) are located between the fixing ring (31) and the threaded buckle (34), and the guide blocks (33) are slidably connected inside the guide grooves (22) at corresponding positions.

4. A photovoltaic automatic assembly line IV test probe structure according to claim 1, characterized in that: The top cover (37) is threadedly connected to the top of the inner hole (36), and a hexagonal knob (371) is fixedly connected to the upper surface of the top cover (37).

5. A photovoltaic automatic assembly line IV test probe structure according to claim 1, characterized in that: The left inner wall of the lower hole (38) is provided with three groups of slots (383) at equal intervals, and the left side of the fixed column (43) is fixedly connected with three groups of plug blocks (433) at equal intervals, and the plug blocks (433) are inserted into the slots (383) at corresponding positions.

6. A photovoltaic automatic assembly line IV test probe structure according to claim 1, characterized in that: The right side wall of the lower hole (38) and the upper and lower parts of the through hole (381) are penetrated with movable grooves (382); the elastic stopper (6) comprises two groups of fixed semicircular rings (61); the two groups of fixed semicircular rings (61) are fixedly connected to the left outer wall of the base column (3) and are respectively in the same horizontal plane as the two groups of movable grooves (382); the right side of the fixed semicircular ring (61) is fixedly connected to the movable semicircular ring (62) by a connecting bolt (63); the movable semicircular ring (62) An inner groove (621) is provided inside, and two groups of springs (64) are fixedly connected to the inner side wall of the inner groove (621). One end of the spring (64) away from the inner groove (621) is fixedly connected to a limiting block (65), and the limiting block (65) is slidably connected to the inside of the movable groove (382). A limiting groove (434) is provided on the right side of the fixed column (43) and located above and below the fixed hole (431), and the limiting block (65) elastically abuts against the inside of the limiting groove (434).

7. A photovoltaic automatic assembly line IV test probe structure according to claim 6, characterized in that: The upper and lower surfaces of the movable groove (382) are both provided with a sliding groove (3821), and the upper and lower surfaces of the limit block (65) are both fixedly connected with a sliding block (651), and the sliding block (651) is slidably connected inside the sliding groove (3821) on the corresponding side.

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