Adjustable integrated circuit chip test board

Abstract

The utility model relates to the technical field of integrated circuit chip testing, in particular to an adjustable integrated circuit chip testboard, which comprises a third box body and a placing box, the inner wall of the third box body is fixedly connected with the lower surface of the placing box, a plurality of chips are placed in the placing box, a support on the surface of the third box body is fixedly connected with a second motor, and the second motor is connected with the third box body. An output shaft of the second motor is fixedly connected with a threaded rod through a speed reducer, and the two ends of the threaded rod are rotationally connected with the inner wall of the third box body through bearings. According to the adjustable integrated circuit chip test bench, through cooperation of an integrated circuit chip adjusting structure and an integrated circuit chip clamping structure, an external power supply of a first motor is switched on, a square block drives two rubber plates to move relatively, and the two rubber plates move relatively to clamp a chip; workers do not need to manually take down and collect the chips and do not need to manually collect the chips when the chips are detected to be unqualified, so that the working efficiency is improved, and the manual labor force is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit chip testing, in particular to an adjustable integrated circuit chip testing platform. Background Technique

[0002] An integrated circuit is a microelectronic device or component. Using a certain process, components such as transistors, resistors, capacitors, and inductors required in a circuit, as well as the wiring, are interconnected and fabricated on a small piece or several small pieces of semiconductor wafers or dielectric substrates, and then encapsulated in a package to form a micro-structure with the required circuit functions. All components are integrated as a whole in structure, which has taken a big step forward in the miniaturization, low power consumption, intelligence, and high reliability of electronic components.

[0003] For example, an adjustable integrated circuit chip testing platform with the authorization announcement number of "CN220626441U". In this adjustable integrated circuit chip testing platform, the descending lifting rod in the lifting unit drives the rubber suction cup to move downward and contact the surface of the chip. When the lifting rod continues to move downward, an upward force is generated on the rubber suction cup, thereby squeezing out the air inside the rubber suction cup, so that the rubber suction cup can suck and hold the chip, making it more convenient to pick up. However, after the chip test is completed, the staff needs to manually move the chip to remove it, and for the chips that fail the test, the staff needs to manually collect them. This results in low work efficiency and increased manual labor. Content of the Utility Model

[0004] The purpose of the utility model is to solve the problem that the staff needs to manually move the chip to remove it, and for the chips that fail the test, the staff needs to manually collect them, resulting in low work efficiency and increased manual labor. Thus, an adjustable integrated circuit chip testing platform is proposed.

[0005] To achieve the above purpose, the utility model provides the following technical solution:

[0006] Design an adjustable integrated circuit chip testing platform, including a third box body and a placement box. The inner wall of the third box body is fixedly connected to the lower surface of the placement box. Multiple chips are placed in the placement box. A second motor is fixedly connected to the surface bracket of the third box body. The output shaft of the second motor is fixedly connected to a threaded rod through a speed reducer. Both ends of the threaded rod are rotatably connected to the inner wall of the third box body through bearings. The threaded rod is threadedly connected to a threaded seat. The threaded seat is slidably clamped to the slideway machined on the inner wall of the third box body through the protruding part on the surface. An integrated circuit chip adjustment structure is provided on the lower surface of the threaded seat, and an integrated circuit chip clamping structure is provided at the lower end of the integrated circuit chip adjustment structure.

[0007] Preferably, the integrated circuit chip adjusting structure includes a first box body. A first motor is fixedly connected to the surface of the first box body through a bracket. The output shaft of the first motor is fixedly connected to a worm through a speed reducer. Both ends of the worm are rotationally connected to the inner wall of the first box body through bearings. The worm is meshed with a worm gear. The protruding part of the surface of the worm gear is rotationally connected to the inner wall of the first box body through a bearing. A first gear is fixedly connected to the surface of the worm gear. The first gear is meshed with a second gear. The protruding parts of the surfaces of the first gear and the second gear are rotationally connected to the inner wall of the first box body through bearings. The first gear and the second gear are respectively meshed with a rack. The rack is slidably clamped with the slideway machined on the inner wall of the first box body through the protruding part on its surface. Both of the racks penetrate through the first box body and are slidably connected to the first box body.

[0008] Preferably, the upper surface of the first box body is fixedly connected to the lower surface of a threaded seat. A detection device is fixedly connected to the left end of the inner wall of the third box body.

[0009] Preferably, a storage box is placed in the middle of the inner wall of the third box body, and a waste box is placed at the right end of the inner wall of the third box body.

[0010] Preferably, the integrated circuit chip clamping structure includes a second box body. A hydraulic cylinder is fixedly connected to the inner wall of the second box body. The telescopic end of the hydraulic cylinder is fixedly connected to a cross plate. The surface of the cross plate is slidably connected to the slideways machined on both sides of the inner wall of the second box body. The cross plate is slidably connected to the chutes machined on the surfaces of two V-shaped plates through the protruding cylinders on its surface. The two V-shaped plates are slidably connected to the slideways machined on the inner wall of the second box body through the protruding parts on their surfaces. Blocks are fixedly connected to the surfaces of the two V-shaped plates. The two blocks penetrate through the openings machined on the surface of the second box body. Rubber plates are fixedly connected to the surfaces of the two blocks.

[0011] Preferably, the upper surface of the second box body is fixedly connected to the lower surfaces of the two racks. Bases extend out from the four corners of the lower surface of the third box body.

[0012] An adjustable integrated circuit chip test bench proposed by the present utility model has the beneficial effects that: through the cooperation of the integrated circuit chip adjustment structure and the integrated circuit chip clamping structure, when the external power supply of the first motor is connected, the first motor starts to drive the worm to rotate in the first box body through the bearing. The rotation of the worm drives the worm wheel to rotate in the first box body through the bearing. The rotation of the worm wheel drives the first gear to rotate in the first box body through the bearing. Thus, the first gear drives the second gear to rotate towards each other in the first box body through the bearing. The first gear and the second gear rotating towards each other respectively drive the racks to slide downwards in the slideways machined on the inner wall of the first box body. The hydraulic cylinder starts to drive the cross plate to slide downwards in the slideways machined on both sides of the inner wall of the second box body. The downward movement of the cross plate drives the two V-shaped plates to slide relatively in the slideways machined on the inner wall of the second box body through the cylinders protruding from the surface and the chutes machined on the surfaces of the two V-shaped plates. The relative sliding of the two V-shaped plates drives the blocks to move relatively in the second box body respectively. The blocks drive the two rubber plates to move relatively, and the two rubber plates moving relatively are used to clamp the chip. There is no need for the staff to manually remove and collect the chip, and when the chip detection is unqualified, there is also no need for the staff to manually collect it. Therefore, the work efficiency is improved and the manual labor is reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 is a schematic structural diagram of the present utility model;

[0014] Figure 2 is Figure 1 the front elevation sectional view of

[0015] Figure 3 is Figure 2 the front elevation sectional view of the integrated circuit chip adjustment structure in

[0016] Figure 4 is Figure 3 the top plan sectional view of

[0017] Figure 5 is Figure 2 the front elevation sectional view of the integrated circuit chip clamping structure in

[0018] Figure 6 is Figure 5 the left elevation sectional view of

[0019] In the figure: 1. Integrated circuit chip adjusting structure; 101. First box body; 102. First motor; 103. Worm; 104. Worm gear; 105. First gear; 106. Second gear; 107. Rack; 2. Integrated circuit chip clamping structure; 201. Second box body; 202. Hydraulic cylinder; 203. Horizontal plate; 204. V-shaped plate; 205. Square block; 206. Rubber plate; 3. Third box body; 4. Placing box; 5. Chip; 6. Detection device; 7. Storage box; 8. Waste box; 9. Second motor; 10. Threaded seat; 11. Threaded rod. Detailed implementation mode

[0020] The present utility model will be further described below with reference to the accompanying drawings:

[0021] Refer to the attached Figures 1-6 In this embodiment, an adjustable integrated circuit chip test bench includes a third box body 3 and a placing box 4. The inner wall of the third box body 3 is fixedly connected to the lower surface of the placing box 4. A plurality of chips 5 are placed in the placing box 4. A second motor 9 is fixedly connected to the surface bracket of the third box body 3. The second motor 9 is a servo motor. The output shaft of the second motor 9 is fixedly connected to a threaded rod 11 through a reducer. Both ends of the threaded rod 11 are rotationally connected to the inner wall of the third box body 3 through bearings. The second motor 9 can drive the threaded rod 11 to rotate in the third box body 3 through the bearings;

[0022] The threaded rod 11 is threadedly connected to the threaded seat 10. The threaded seat 10 is slidably clamped to the slideway machined on the inner wall of the third box body 3 through the protruding part on the surface. The rotation of the threaded rod 11 can drive the threaded seat 10 to slide in the slideway machined on the inner wall of the third box body 3. An integrated circuit chip adjusting structure 1 is provided on the lower surface of the threaded seat 10. An integrated circuit chip clamping structure 2 is provided at the lower end of the integrated circuit chip adjusting structure 1. The upper surface of the first box body 101 is fixedly connected to the lower surface of the threaded seat 10;

[0023] A detection device 6 is fixedly connected to the left end of the inner wall of the third box body 3. The working mode of the detection device 6 has been disclosed in an adjustable integrated circuit chip test bench with the authorization publication number of "CN220626441U", and will not be explained here. A storage box 7 is placed in the middle of the inner wall of the third box body 3. A waste box 8 is placed at the right end of the inner wall of the third box body 3. The upper surface of the second box body 201 is fixedly connected to the lower surfaces of two racks 107. The four corners of the lower surface of the third box body 3 extend out with bases.

[0024] Refer to the attached Figures 1-4: The integrated circuit chip adjustment structure 1 includes a first box body 101. A first motor 102 is fixedly connected to the surface of the first box body 101 through a bracket. The first motor 102 is a servo motor. The output shaft of the first motor 102 is fixedly connected to a worm 103 through a reducer. Both ends of the worm 103 are rotationally connected to the inner wall of the first box body 101 through bearings. The first motor 102 can drive the worm 103 to rotate through the bearings within the first box body 101;

[0025] The worm 103 is meshed and connected with a worm gear 104. The protruding part of the surface of the worm gear 104 is rotationally connected to the inner wall of the first box body 101 through a bearing. The rotation of the worm 103 can drive the worm gear 104 to rotate through the bearings within the first box body 101. A first gear 105 is fixedly connected to the surface of the worm gear 104. The rotation of the worm 104 can drive the first gear 105 to rotate synchronously. The first gear 105 is meshed and connected with a second gear 106. The rotation of the first gear 105 can drive the second gear 106 to rotate. The protruding parts of the surfaces of the first gear 105 and the second gear 106 are rotationally connected to the inner wall of the first box body 101 through bearings;

[0026] The first gear 105 and the second gear 106 can rotate through the bearings within the first box body 101. The first gear 105 and the second gear 106 are respectively meshed and connected with a rack 107. The rack 107 is slidably clamped through the protruding part of its surface with the slideway machined on the inner wall of the first box body 101. The rotation of the first gear 105 and the second gear 106 can respectively drive the rack 107 to slide in the slideway machined on the inner wall of the first box body 101. The two racks 107 penetrate the first box body 101 and are slidably connected to the first box body 101. The two racks 107 can slide within the first box body 101.

[0027] Refer to the appendix Figures 1-2 and 5 - 6: The integrated circuit chip clamping structure 2 includes a second box body 201. A hydraulic cylinder 202 is fixedly connected to the inner wall of the second box body 201. The hydraulic cylinder 202 can meet the working requirements according to actual needs. The telescopic end of the hydraulic cylinder 202 is fixedly connected to a cross - plate 203. The surface of the cross - plate 203 is slidably connected to the slideways machined on both sides of the inner wall of the second box body 201. The hydraulic cylinder 202 can drive the cross - plate 203 to slide in the slideways machined on both sides of the inner wall of the second box body 201;

[0028] The cross - plate 203 is slidably connected to the chutes machined on the surfaces of two V - shaped plates 204 through the protruding cylinders on its surface. The protruding cylinders on the surface of the cross - plate 203 can slide within the chutes machined on the surfaces of the two V - shaped plates 204. The two V - shaped plates 204 are slidably connected to the slideways machined on the inner wall of the second box body 201 through the protruding parts of their surfaces;

[0029] Two V-shaped plates 205 can slide in the slideways machined on the inner wall of the second box body 201 through the surface protruding parts. Square blocks 205 are fixedly connected to the surfaces of the two V-shaped plates 205. The two square blocks 205 penetrate through the openings machined on the surface of the second box body 201, and the two square blocks 205 can slide in the openings machined on the surface of the second box body 201. Rubber plates 206 are fixedly connected to the surfaces of the two square blocks 205, and the rubber plates 206 are made of natural rubber.

[0030] Working principle:

[0031] Adjustment, clamping and side view work of the integrated circuit chip:

[0032] When the integrated circuit chip needs to be adjusted, connect the external power supply of the first motor 102. The first motor 102 starts to drive the worm 103 to rotate in the first box body 101 through the bearing. The rotation of the worm 103 drives the worm wheel 104 to rotate in the first box body 101 through the bearing. The rotation of the worm wheel 104 drives the first gear 105 to rotate in the first box body 101 through the bearing. Thus, the second gear 106 is driven to rotate towards each other in the first box body 101 through the bearing by the first gear 105. The first gear 105 and the second gear 106 rotate towards each other and respectively drive the rack 107 to slide downward in the slideways machined on the inner wall of the first box body 101 (as Figure 3 );

[0033] The downward movement of the two racks 107 drives the second box body 201 to move downward, thereby driving the two rubber plates 206 to move downward. When the two rubber plates 206 move to be flush with the bottom of the chip 5 at the upper end of the placement box 4, the first motor 102 stops rotating. Subsequently, connect the external power supply of the hydraulic cylinder 202. The hydraulic cylinder 202 starts to drive the cross plate 203 to slide downward in the slideways machined on both sides of the inner wall of the second box body 201. The downward movement of the cross plate 203 drives the two V-shaped plates 204 to slide relatively in the slideways machined on the inner wall of the second box body 201 through the cylindrical protrusions on the surface and the chutes machined on the surfaces of the two V-shaped plates 204 (as Figure 5 ), and the relative sliding of the two V-shaped plates 204 drives the square blocks 205 to move relatively in the second box body 201 respectively. The two rubber plates 206 are driven to move relatively through the square blocks 205. When the surfaces of the two rubber plates 206 come into contact with and abut against the surface of the upper chip 5, the hydraulic cylinder 202 stops moving. In this way, the clamping work of the chip 5 can be carried out.

[0034] Subsequently, control the first motor 102 to reverse to reset the second box body 201. Then, connect the external power supply of the second motor 9. The second motor 9 starts to drive the threaded rod 11 to rotate in the third box body 3 through the bearing. The rotation of the threaded rod 11 drives the threaded seat 10 to slide rightward in the slideway machined on the inner wall of the third box body 3. The rightward sliding of the threaded seat 10 drives the first box body 101 to move rightward, thereby driving the chip 5 at the lower end to move rightward. Such movement can adjust the chip 5;

[0035] When the chip 5 moves above the detection device 6, the second motor 9 is notified to rotate. In the same movement as above, the first motor 102 rotates forward to drive the chip 5 at the lower end to move downward and fall into the detection device 6 (the detection device 6 is composed of a detection box, an alarm lamp, a placement box, and a storage box). When the chip is detected to be qualified, the alarm lamp flashes green, otherwise it flashes red. The above working method is the same as that of the detection device in an adjustable integrated circuit chip test bench with the authorization announcement number of "CN220626441U", and will not be described in detail. In this way, the detection of the chip 5 is realized. When the chip 5 is detected to be qualified, the chip 5 can be placed in the storage box 8 for collection through the above movement. Otherwise, the chip is placed in the waste bin 8 for collection.

[0036] Although the present utility model has been illustrated and described by referring to the preferred embodiments, those of ordinary skill in the art should understand that various changes in form and details can be made within the scope of the claims.

Claims

1. An adjustable integrated circuit chip test bench, comprising a third box (3) and a placement box (4), wherein the inner wall of the third box (3) is fixedly connected to the lower surface of the placement box (4), characterized in that: A plurality of chips (5) are placed in the placement box (4); a second motor (9) is fixedly connected to a bracket on the surface of the third box body (3); an output shaft of the second motor (9) is fixedly connected to a threaded rod (11) via a reducer; both ends of the threaded rod (11) are rotatably connected to the inner wall of the third box body (3) via bearings; the threaded rod (11) is threadedly connected to a threaded seat (10); the threaded seat (10) is slidably engaged with a slideway processed on the inner wall of the third box body (3) via a raised portion on the surface; an integrated circuit chip adjustment structure (1) is provided on the lower surface of the threaded seat (10); and an integrated circuit chip clamping structure (2) is provided at the lower end of the integrated circuit chip adjustment structure (1).

2. The adjustable integrated circuit chip test bench according to claim 1, characterized in that: The integrated circuit chip adjustment structure (1) comprises a first housing (101), a first motor (102) is fixedly connected to the surface of the first housing (101) via a bracket, an output shaft of the first motor (102) is fixedly connected to a worm (103) via a reducer, two ends of the worm (103) are rotatably connected to the inner wall of the first housing (101) via bearings, the worm (103) is meshedly connected to a worm wheel (104), a raised portion on the surface of the worm wheel (104) is rotatably connected to the inner wall of the first housing (101) via a bearing, and the surface of the worm wheel (104) is fixedly connected A first gear (105) is provided, the first gear (105) is meshedly connected with a second gear (106), the raised portions on the surfaces of the first gear (105) and the second gear (106) are rotatably connected to the inner wall of the first housing (101) via bearings, the first gear (105) and the second gear (106) are respectively meshedly connected with a rack (107), the rack (107) is slidably engaged with a slideway processed on the inner wall of the first housing (101) via the raised portions on the surfaces, and the two racks (107) penetrate the first housing (101) and are slidably connected to the first housing (101).

3. The adjustable integrated circuit chip test bench according to claim 2, characterized in that: The upper surface of the first box body (101) is fixedly connected to the lower surface of the threaded seat (10), and the left end of the inner wall of the third box body (3) is fixedly connected to a detection device (6).

4. The adjustable integrated circuit chip test bench according to claim 3, characterized in that: A storage box (7) is placed in the middle of the inner wall of the third box body (3), and a waste box (8) is placed at the right end of the inner wall of the third box body (3).

5. The adjustable integrated circuit chip test bench according to claim 2, characterized in that: The integrated circuit chip clamping structure (2) comprises a second box body (201), the inner wall of the second box body (201) is fixedly connected to a hydraulic cylinder (202), the telescopic end of the hydraulic cylinder (202) is fixedly connected to a transverse plate (203), the surface of the transverse plate (203) is slidably connected to slideways processed on both sides of the inner wall of the second box body (201), the transverse plate (203) is slidably connected to slideways processed on the surfaces of two V-shaped plates (204) through a raised cylinder on the surface, the two V-shaped plates (204) are slidably connected to the slideways processed on the inner wall of the second box body (201) through raised parts on the surface, the surfaces of the two V-shaped plates (205) are fixedly connected to blocks (205), the two blocks (205) pass through openings processed on the surface of the second box body (201), and the surfaces of the two blocks (205) are fixedly connected to rubber plates (206).

6. The adjustable integrated circuit chip test bench according to claim 5, characterized in that: The upper surface of the second box body (201) is fixedly connected to the lower surfaces of the two racks (107), and bases extend from the four corners of the lower surface of the third box body (3).

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