Display analysis tool and automobile

Abstract

The utility model relates to the technical field of vehicle-mounted displays, in particular to a display analysis tool and an automobile. The display analysis tool comprises a probe, a probe head, a fixing body, a circuit board, a chip integrated on the circuit board and an interface integrated on the circuit board, the chip is provided with a protocol circuit; one end of the probe is electrically connected with the circuit board, and the other end of the probe is provided with the probe head; the probe is embedded in the fixed body; the probe can be in contact with a to-be-detected circuit board in the display, and the fixing body can be fixed in a mounting hole of a display screen on the display. According to the displayer analysis tool and the automobile, the problems that an existing displayer analysis tool is troublesome in operation, and data cannot be analyzed possibly in the face of on-site accidental problems are solved.

Description

Technical Field

[0001] This application relates to the technical field of in-vehicle displays, and in particular to a display analysis tool and an automobile. Background Art

[0002] When a fault occurs in an in-vehicle display, it is necessary to perform a fault analysis on the PCB of the display.

[0003] Existing analysis tools can only analyze data after removing the metal protective case of the display screen and need to use a soldering iron to fly wires on the PCB.

[0004] However, the above operations must first remove the metal protective case of the display screen and can only use a soldering iron to fly wires after the display screen is powered off. This is not only troublesome to operate, but also when facing occasional problems on-site, the problem may disappear after powering on and off again, resulting in the destruction of the fault site and the loss of the analysis direction. Utility Model Content

[0005] The purpose of this application is to provide a display analysis tool and an automobile, thereby solving the problems of existing display analysis tools, which are not only troublesome to operate, but also may not be able to analyze data when facing occasional problems on-site.

[0006] According to the first aspect of this application, a display analysis tool is provided. The display analysis tool includes a probe, a probe head, a fixing body, a circuit board, a chip integrated on the circuit board, and an interface integrated on the circuit board; the chip is provided with a protocol circuit; one end of the probe is electrically connected to the circuit board, and the other end of the probe is provided with the probe head; the probe is embedded in the fixing body; the probe head can contact the circuit board to be detected in the display, and the fixing body can be fixed to the mounting hole of the display screen on the display.

[0007] In any of the above technical solutions, further, the chip is provided with a first protocol circuit and a second protocol circuit; the first protocol circuit includes a first pin and a second pin, and the second protocol circuit includes a third pin and a fourth pin; the display analysis tool includes a first probe and a second probe; in the first state, the first pin and the second pin are respectively connected to the first probe and the second probe; in the second state, the third pin and the fourth pin are respectively connected to the first probe and the second probe.

[0008] In any of the above technical solutions, further, the display analysis tool further includes a switch and two contact bodies disposed on the circuit board; the switch is connected to the two contact bodies and can drive the two contact bodies to move; in the first state, the switch drives the two contact bodies to move so that one contact body connects the first pin and the first probe, and the other contact body connects the second pin and the second probe; in the second state, the switch drives the two contact bodies to move so that one contact body connects the third pin and the first probe, and the other contact body connects the fourth pin and the second probe.

[0009] In any of the above technical solutions, further, the display analysis tool further includes two first probe leads, two second probe leads, a first pin lead, a second pin lead, a third pin lead, and a fourth pin lead disposed on the circuit board; the two first probe leads are led out by the first probe, the two second probe leads are led out by the second probe, the first pin lead is led out by the first pin, the second pin lead is led out by the second pin, the third pin lead is led out by the third pin, and the fourth pin lead is led out by the fourth pin; in the first state, the switch drives the two contact bodies to move so that the two ends of one contact body respectively contact one of the first probe leads and the first pin lead, and the two ends of the other contact body respectively contact one of the second probe leads and the second pin lead; in the second state, the switch drives the two contact bodies to move so that the two ends of one contact body respectively contact the other first probe lead and the third pin lead, and the two ends of the other contact body respectively contact the other second probe lead and the fourth pin lead.

[0010] In any of the above technical solutions, further, the display analysis tool further includes a spring; the probe includes a first section and a second section connected to each other; a first annular groove is provided at one end of the outer shell of the first section facing the second section, and a second annular groove is provided at one end of the outer shell of the second section facing the first section, and the two ends of the spring are respectively fixed to the first annular groove and the second annular groove.

[0011] In any of the above technical solutions, further, the display analysis tool further includes a sleeve; the spring expands and contracts in a first direction; the sleeve is sleeved on the first section and the second section; a chute extending in the first direction is provided on the inner side of the sleeve, and sliding blocks cooperating with the chute are provided on the outer sides of the first section and the second section.

[0012] In any of the above technical solutions, further, the interface is a USB interface, and the probe head is V-shaped.

[0013] In any of the above technical solutions, further, the fixing body is a wedge-shaped cylindrical rubber plug.

[0014] In any of the above technical solutions, further, the chip is further provided with a third protocol circuit; the third protocol circuit includes an extended solder joint disposed on the circuit board.

[0015] According to a second aspect of the present application, there is provided an automobile, including the display analysis tool as described above.

[0016] Further, the automobile further includes a display, the display includes a display screen and a circuit board to be detected disposed inside the display screen, the display screen is provided with a mounting hole; the probe can contact the circuit board to be detected, and the fixing body can be fixed to the mounting hole of the display screen.

[0017] According to the present application, there is provided a display analysis tool, which includes a probe, a probe head, a fixing body, a circuit board, a chip integrated on the circuit board, and an interface integrated on the circuit board. Among them, the chip is provided with a protocol circuit; one end of the probe is electrically connected to the circuit board, and the other end of the probe is provided with a probe head; the probe is embedded in the fixing body; the probe head can contact the circuit board to be detected inside the display, and the fixing body can be fixed to the mounting hole of the display screen on the display.

[0018] Based on the above technical features, the beneficial effects of the present application are as follows:

[0019] When the display analysis tool of the present application specifically analyzes the circuit board to be detected inside the display, the probe is passed through the mounting hole reserved on the display screen, and the probe head is fully contacted with the circuit board to be detected. At this time, the fixing body can be fixed in the mounting hole of the display screen to provide support, ensuring the stable connection of the probe head. Then, communication connection is achieved with an external terminal through the interface on the circuit board, and the fault data is detected and analyzed through the terminal.

[0020] In summary, when the display analysis tool of the present application performs fault analysis, it can be analyzed by directly contacting with the probe head. Compared with the prior art, it is not necessary to remove the display screen, and there is no need for a soldering iron or jumper wire. The operation of the present application is simple, and there will be no problem that the fault site is damaged and the analysis direction is lost.

[0021] To make the above objects, features, and advantages of the present application more obvious and understandable, the following specific preferred embodiments are given, and detailed descriptions are made in conjunction with the accompanying drawings as follows. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] To more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the accompanying drawings required for use in the embodiments. It should be understood that the following drawings only show some embodiments of the present application and should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0023] Figure 1 Shows a schematic diagram of the overall structure of a display analysis tool according to an embodiment of the present application;

[0024] Figure 2 Shows a schematic diagram of a probe lead and a pin lead according to an embodiment of the present application;

[0025] Figure 3 Shows a wiring schematic diagram of a probe and a pin according to an embodiment of the present application.

[0026] Icons: 11 - First probe; 12 - Second probe; 103 - Probe head; 101 - First section; 102 - Second section; 20 - Circuit board; 21 - Chip; 30 - Fixing body; 40 - Interface; 111 - First probe lead point; 121 - Second probe lead point; 122 - Probe lead; 51 - First pin; 52 - Second pin; 53 - Third pin; 54 - Fourth pin; 55 - Pin lead; 511 - First pin lead point; 521 - Second pin lead point; 531 - Third pin lead point; 541 - Fourth pin lead point; 60 - Sleeve; 70 - Switch; 71 - Contact body; 80 - Extended solder joint; L1 - First direction. Detailed implementation manners

[0027] The following detailed implementation manners are provided to help readers obtain a comprehensive understanding of the methods, devices, and / or systems described herein. However, after understanding the disclosure of the present application, various changes, modifications, and equivalents of the methods, devices, and / or systems described herein will be obvious. For example, the order of operations described herein is only an example and is not limited to the order set forth herein. Rather, changes that will be obvious after understanding the disclosure of the present application can be made, except for operations that must occur in a specific order. In addition, descriptions of features known in the art may be omitted for the sake of clarity and conciseness.

[0028] The features described herein may be implemented in different forms and should not be construed as limited to the examples described herein. Rather, the examples described herein are provided only to illustrate some of the many possible ways of implementing the methods, devices, and / or systems described herein that will be obvious after understanding the disclosure of the present application.

[0029] Throughout the specification, when an element (such as, a layer, a region, or a substrate) is described as being "on" another element, "connected to" another element, "coupled to" another element, "above" another element, or "covering" another element, it can be directly "on" another element, "connected to" another element, "coupled to" another element, "above" another element, or "covering" another element, or there can be one or more other elements intervening therebetween. In contrast, when an element is described as being "directly on" another element, "directly connected to" another element, "directly coupled to" another element, "directly above" another element, or "directly covering" another element, there can be no other elements intervening therebetween.

[0030] As used herein, the term "and / or" includes any one of the listed related items and any combination of any two or more of them.

[0031] Although terms such as "first", "second", and "third" may be used herein to describe various components, elements, regions, layers, or parts, these components, elements, regions, layers, or parts are not limited by these terms. Rather, these terms are only used to distinguish one component, element, region, layer, or part from another. Thus, a first component, element, region, layer, or part described in the examples herein may also be referred to as a second component, element, region, layer, or part without departing from the teachings of the examples.

[0032] For ease of description, spatial relationship terms such as "above", "upper", "below", and "lower" may be used herein to describe the relationship of one element to another as shown in the figures. Such spatial relationship terms are intended to include different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, an element described as "above" or "upper" relative to another element will then be "below" or "lower" relative to the other element. Thus, the term "above" includes both the orientation of "above" and "below" depending on the spatial orientation of the device. The device may also be positioned in other ways (e.g., rotated 90 degrees or in other orientations), and the spatial relationship terms used herein will be interpreted accordingly.

[0033] The terms used herein are for describing various examples only and are not intended to limit the present disclosure. Unless the context clearly indicates otherwise, the singular forms are also intended to include the plural forms. The terms "comprising", "including" and "having" enumerate the stated features, quantities, operations, components, elements and / or combinations thereof that exist, but do not preclude the existence or addition of one or more other features, quantities, operations, components, elements and / or combinations thereof.

[0034] Due to manufacturing techniques and / or tolerances, variations in the shapes shown in the drawings may occur. Therefore, the examples described herein are not limited to the specific shapes shown in the drawings, but include changes in shape that occur during manufacturing.

[0035] The features of the examples described herein can be combined in various ways that will be apparent after understanding the disclosure of the present application. In addition, although the examples described herein have various configurations, other configurations are possible as will be apparent after understanding the disclosure of the present application.

[0036] The first aspect of the present application provides a display analysis tool, thus solving the problems of the existing display analysis tools, which are not only troublesome to operate, but may also be unable to analyze data in the face of occasional problems on site.

[0037] Hereinafter, reference will be made to Figures 1 to 3 Describe in detail the display analysis tool according to some embodiments of the present application.

[0038] As Figure 1 shown, the display analysis tool of the present application includes a probe, a probe head 103, a fixing body 30, a circuit board 20, a chip 21 integrated on the circuit board 20, and an interface 40 integrated on the circuit board 20. Among them, the chip 21 is provided with a protocol circuit; one end of the probe is electrically connected to the circuit board 20, and the other end of the probe is provided with the probe head 103; the probe is embedded in the fixing body 30; the probe head 103 can contact the circuit board to be detected in the display, and the fixing body 30 can be fixed in the mounting hole of the display screen on the display.

[0039] When the display analysis tool of the present application specifically analyzes the circuit board to be detected in the display, the probe is passed through the mounting hole reserved on the display screen, and the probe head 103 is fully contacted with the circuit board to be detected. At this time, the fixing body 30 can be fixed in the mounting hole of the display screen to provide support, ensuring the stable connection of the probe head 103. Then, a communication connection is established with an external terminal through the interface 40 on the circuit board 20, and the fault data is detected and analyzed through the terminal.

[0040] In summary, when the display analysis tool of the present application performs fault analysis, it can be analyzed by directly contacting with the probe 103. Compared with the prior art, there is no need to remove the display screen, let alone a soldering iron or jumper wire. The operation of the present application is simple, and there will be no problem of the fault site being damaged and losing the analysis direction.

[0041] In addition, it is worth mentioning that the existing analysis tools only support on-site analysis of the UART communication protocol and do not support the IIC communication protocol commonly used for display screens.

[0042] In view of this, the display analysis tool of the present application can support both UART and IIC communication protocols, as follows.

[0043] In an embodiment of the present application, as Figure 3 shown, the chip 21 is provided with a first protocol circuit (such as an IIC communication protocol circuit) and a second protocol circuit (such as a UART communication protocol circuit). Among them, the first protocol circuit includes a first pin 51 (such as an SDA pin) and a second pin 52 (such as an SCL pin), and the second protocol circuit includes a third pin 53 (such as a TX pin) and a fourth pin 54 (such as an RX pin).

[0044] The display analysis tool includes a first probe 11 and a second probe 12. In the first state, the first pin 51 and the second pin 52 of the first protocol circuit are respectively connected to the first probe 11 and the second probe 12, that is, the display analysis tool implements the IIC communication protocol. In the second state, the third pin 53 and the fourth pin 54 of the second protocol circuit are respectively connected to the first probe 11 and the second probe 12, that is, the display analysis tool implements the UART communication protocol.

[0045] In summary, the present application can select one of the protocols according to the demand for data analysis through the terminal.

[0046] As an example, in an embodiment of the present application, as Figure 1 and Figure 2 shown, the display analysis tool of the present application may further include a switch 70 and two contact bodies 71 (such as metal strips) provided on the circuit board 20. Among them, the switch 70 connects the two contact bodies 71 and can drive the two contact bodies 71 to move.

[0047] In the first state, the switch 70 drives the two contact bodies 71 to move so that one of the contact bodies 71 connects the first pin 51 and the first probe 11 (realizing electrical connection), and the other contact body 71 connects the second pin 52 and the second probe 12. In the second state, the switch 70 drives the two contact bodies 71 to move so that one of the contact bodies 71 connects the third pin 53 and the first probe 11, and the other contact body 71 connects the fourth pin 54 and the second probe 12.

[0048] See below for Figure 2 and Figure 3 , describes in detail how the probes and pins are wired.

[0049] like Figure 3 The display analysis tool of the present application further includes two first probe points 111 , two second probe points 121 , a first pin point 511 , a second pin point 521 , a third pin point 531 and a fourth pin point 541 arranged on the circuit board 20 .

[0050] Combination Figure 2 and Figure 3 , wherein two first probe lead points 111 are led out from the first probe 11 (for example, a probe lead 122 is led out from the end of the first probe 11, and the end of the probe lead 122 serves as the first probe lead point 111), two second probe lead points 121 are led out from the second probe (for example, a probe lead 122 is led out from the end of the second probe 12, and the end of the probe lead 122 serves as the second probe lead point 121), and a first pin lead point 511 is led out from the first pin (for example, a pin lead 55 is led out from the end of the first pin 51, and the end of the pin lead 55 serves as the first pin lead The first pin lead 511 is led out from the second pin (for example, the pin lead 55 is led out from the end of the second pin 52, and the end of the pin lead 55 serves as the second pin lead 521), the second pin lead 531 is led out from the third pin 53 (for example, the pin lead 55 is led out from the end of the third pin 53, and the end of the pin lead 55 serves as the third pin lead 531), and the fourth pin lead 541 is led out from the fourth pin (for example, the pin lead 55 is led out from the end of the fourth pin 54, and the end of the pin lead 55 serves as the fourth pin lead 541).

[0051] like Figure 3 As shown, in the first state, the switch 70 drives the two contact bodies 71 to move, so that the two ends of one of the contact bodies 71 respectively contact one of the first probe leads 111 and the first pin lead 511, and the two ends of the other contact body 71 respectively contact one of the second probe leads 121 and the second pin lead 521; that is, the display analysis tool implements the IIC communication protocol.

[0052] In the second state, the switch 70 drives the two contact bodies 71 to move so that the two ends of one of the contact bodies 71 respectively contact the other first probe lead 111 and the third pin lead 531, and the two ends of the other contact body 71 respectively contact the other second probe lead 121 and the fourth pin lead 541; that is, the display analysis tool implements the UART communication protocol.

[0053] In summary, the switch 70 is toggled left and right to achieve protocol conversion, such as Figure 3As shown in the figure, the following four pins are the SDA, SCL, TX, and RX pins of the chip 21 respectively. The two contacts 71 on the switch 70 are responsible for connecting the probe to the pins of the chip 21. When the switch 70 is on the left, the pins of the IIC are connected to the probe, and at this time, it can be used to analyze the data of the IIC protocol. Similarly, when the switch 70 is on the right, the pins of the UART are connected to the probe, and at this time, it can be used to analyze the data of the UART protocol.

[0054] Preferably, each pin lead can be led to the vicinity of the switch 70, and each probe lead can also be led to the vicinity of the switch 70. In this way, it is convenient for the switch 70 to move and connect. That is, on the circuit board 20 is a USB to IIC and UART chip, which is mainly used for the conversion of levels and communication protocols. The IIC and UART input and output pins of this chip 21 are respectively led out and converge at the switch 70. Similarly, each probe is respectively led out and converges at the switch 70. The switch 70 can be used to select whether to use the IIC protocol or the UART protocol. When dialed to the left, the IIC pins of the chip 21 will be connected to the front probe. When dialed to the right, the UART pins of the chip 21 will be connected to the front probe. This design perfectly solves problems such as limited protocol support and too many leads of the probe.

[0055] In addition, as Figure 1 shown, the display analysis tool further includes a third probe, and the third probe can be shared for grounding.

[0056] Optionally, the chip 21 of the present application can also be provided with a third protocol circuit. As Figure 1 shown, the third protocol circuit includes an extended solder joint 80 provided on the circuit board 20. That is, the solder joints led out from the edge of the circuit board 20 are the extended pins of other protocols of the chip, such as SPI, RS485, RS432, etc. Because other protocols require more and non-uniform wire harnesses and cannot share the same number of pins, for other protocols using this tool in the future, only the special probe needs to be soldered on, which increases the expandability of the tool.

[0057] Optionally, as Figure 1 shown, the interface 40 can be a USB interface, and the data cable connecting to the PC side is a type-B to type-A data cable. For the use of the IIC protocol, only need to dial the switch 70 to the left, and the front probe 103 will be connected to the IIC pins of the chip 21. The IIC is mainly used to capture the data of the deserializer at the display screen end, display it through the Tools software on the PC side, and different values can be filled in the registers of the deserializer, which provides convenience for on-site calibration and problem troubleshooting. The UART protocol transmits the basic data of the display screen to the PC side, and the Tools software receives the data and displays the relevant data. The display process is as follows.

[0058] S1, Power on the display screen and open the serial port on the PC side.

[0059] S2, Determine whether the display screen sends a power-on success flag. If not, wait until the power-on success flag is sent.

[0060] S3, Print the sent version information.

[0061] S4, Print the voltage information of each sampling point.

[0062] S5, Determine whether the voltage is abnormal. If it is abnormal, set the voltage display box to red. If it is not abnormal, receive the sent IFC information, update the IFC table, and set the columns with transmission errors to "1".

[0063] Optionally, in the embodiments of the present application, as Figure 1 described, the display analysis tool may further include a spring and a sleeve 60. Each probe includes a first section 101 and a second section 102 connected to each other; a first annular groove is provided at one end of the outer shell of the first section 101 facing the second section 102, and a second annular groove is provided at one end of the outer shell of the second section 102 facing the first section 101. Both ends of the spring are respectively fixed to the first annular groove and the second annular groove, and the spring expands and contracts along the first direction L1.

[0064] The sleeve 60 is sleeved on the first section 101 and the second section 102; a sliding groove extending along the first direction L1 is provided on the inner side of the sleeve 60, and sliding blocks matching the sliding groove are provided on the outer sides of the first section 101 and the second section 102. Here, the sliding groove can limit the sliding range of the sliding block, that is, limit the maximum elongation of the spring, so as to prevent the wires inside the probe from being overstretched as the spring elongates, thereby causing the wires to break.

[0065] The setting of the spring can first realize the soft connection of the two sections of the probe, prevent poor contact or accidental bending of the probe head 103 caused by accidentally moving the circuit board 20 during debugging. Secondly, it is used in cooperation with the fixing body 30. The friction between the probe and the fixing body 30 is relatively fixed. When using, just press the spring behind the probe. The spring will first bounce slightly and finally remain stationary with a certain elastic force. This elastic force is equal to the friction between the probe and the fixing body 30. In this way, each time the probe head 103 has a certain pressure on the test point to ensure full contact with the circuit board to be detected, and it will not cause excessive pressure to damage the circuit board to be detected.

[0066] Optionally, as Figure 1 described, the fixing body 30 can be a wedge-shaped cylindrical rubber plug. The cylindrical rubber plug can match the installation hole positions reserved on the rear shell of the display screen. Due to the wedge-shaped design, it can ensure more stable contact with the rear shell, avoid the random shaking of the middle probe, and cause short circuit or damage to the sample.

[0067] Optionally, asFigure 1 As described above, the probe 103 is V-shaped. Since the test points reserved on the circuit board to be detected are slightly protruding V-shaped, the V-shaped probe 103 can ensure sufficient contact with the test points.

[0068] The second aspect of the present application provides an automobile, including the display analysis tool as described above.

[0069] Furthermore, the automobile further includes a display, the display includes a display screen and a circuit board to be detected arranged inside the display screen, and the display screen is provided with a mounting hole. The probe 103 can contact the circuit board to be detected, and the fixing body 30 can be fixed to the mounting hole of the display screen.

[0070] When the display analysis tool of the present application specifically analyzes the faults of the circuit to be detected in the display, the probe is passed through the reserved mounting hole of the display screen, and the probe is fully contacted with the circuit board to be detected. At this time, the fixing body can be fixed in the mounting hole of the display screen to provide support, ensuring the stable connection of the probe. Then, communication connection is realized with an external terminal through the interface on the circuit board, and the fault data is detected and analyzed through the terminal.

[0071] In summary, when the display analysis tool of the present application performs fault analysis, it can be analyzed by directly contacting with the probe. Compared with the prior art, there is no need to remove the display screen, let alone a soldering iron and jumper wires. The operation of the present application is simple, and there will be no problem of the fault site being damaged and losing the analysis direction.

[0072] On this basis, both IIC and UART communication protocols are supported, and switching is performed through the switch on the circuit board, eliminating the need to frequently replace tools.

[0073] On this basis, the cylindrical rubber plug and the V-shaped probe can ensure stable contact with the test points, avoiding problems such as short circuit and poor contact.

[0074] On this basis, the combined use of the cylindrical rubber plug and the spring not only ensures sufficient contact but also prevents damage to the circuit board due to excessive pressure.

[0075] Finally, it should be noted that the above-described embodiments are only specific implementation manners of the present application, used to illustrate the technical solutions of the present application, rather than limiting it. The protection scope of the present application is not limited thereto. Although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that any person skilled in the art within the technical scope disclosed by the present application can still modify the technical solutions recorded in the foregoing embodiments or can easily think of changes, or perform equivalent replacements for some of the technical features; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be covered within the protection scope of the present application.

Claims

1. A display analysis tool, characterized in that: The display analysis tool includes a probe, a probe head, a fixing body, a circuit board, a chip integrated on the circuit board, and an interface integrated on the circuit board; The chip is provided with a protocol circuit; One end of the probe is electrically connected to the circuit board, and the other end of the probe is provided with the probe head; The probe is embedded in the fixed body; The probe can contact the circuit board to be detected in the display, and the fixing body can be fixed to the mounting hole of the display screen on the display.

2. The display analysis tool according to claim 1, characterized in that: The chip is provided with a first protocol circuit and a second protocol circuit; The first protocol circuit includes a first pin and a second pin, and the second protocol circuit includes a third pin and a fourth pin; The display analysis tool includes a first probe and a second probe; In a first state, the first pin and the second pin are connected to the first probe and the second probe respectively; In the second state, the third pin and the fourth pin are connected to the first probe and the second probe, respectively.

3. The display analysis tool according to claim 2, characterized in that: The display analysis tool also includes a switch and two contacts disposed on the circuit board; The switch connects the two contact bodies and can drive the two contact bodies to move; In the first state, the switch drives the two contact bodies to move, so that one of the contact bodies connects the first pin and the first probe, and the other contact body connects the second pin and the second probe; In the second state, the switch drives the two contact bodies to move, so that one of the contact bodies connects the third pin and the first probe, and the other contact body connects the fourth pin and the second probe.

4. The display analysis tool according to claim 3, characterized in that: The display analysis tool also includes two first probe leads, two second probe leads, a first pin lead, a second pin lead, a third pin lead, and a fourth pin lead disposed on the circuit board; The two first probe lead points are led out from the first probe, the two second probe lead points are led out from the second probe, the first pin lead point is led out from the first pin, the second pin lead point is led out from the second pin, the third pin lead point is led out from the third pin, and the fourth pin lead point is led out from the fourth pin; In the first state, the switch drives the two contact bodies to move, so that two ends of one of the contact bodies respectively contact one of the first probe lead points and the first pin lead point, and two ends of the other contact body respectively contact one of the second probe lead points and the second pin lead point; In the second state, the switch drives the two contact bodies to move so that two ends of one contact body respectively contact another first probe lead point and the third pin lead point, and two ends of another contact body respectively contact another second probe lead point and the fourth pin lead point.

5. The display analysis tool according to claim 1, characterized in that: The display analysis tool also includes a spring; The probe comprises a first section and a second section connected to each other; A first annular groove is disposed at one end of the shell of the first section facing the second section, and a second annular groove is disposed at one end of the shell of the second section facing the first section. Two ends of the spring are respectively fixed to the first annular groove and the second annular groove.

6. The display analysis tool according to claim 5, characterized in that: The display analysis tool also includes a sleeve; The spring expands and contracts along a first direction; The sleeve is sleeved on the first section and the second section; A slide groove extending along the first direction is arranged on the inner side of the sleeve, and sliding blocks cooperating with the slide groove are arranged on the outer sides of the first section and the second section.

7. The display analysis tool according to claim 1, characterized in that: The interface is a USB interface, and the probe is V-shaped.

8. The display analysis tool according to claim 1, characterized in that: The fixing body is a wedge-shaped cylindrical rubber plug.

9. The display analysis tool according to claim 1, characterized in that: The chip is also provided with a third protocol circuit; The third protocol circuit includes an extended solder joint arranged on the circuit board.

10. An automobile, characterized in that: comprising a display analysis tool as described in any one of claims 1 to 9; The automobile further comprises a display, the display comprising a display screen and a circuit board to be detected arranged inside the display screen, the display screen being provided with a mounting hole; The probe can contact the circuit board to be detected, and the fixing body can be fixed to the mounting hole of the display screen.

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