Output current testing device based on aging test power supply
By designing an output current testing device based on an aging test power supply, using the interface connection between the test substrate and the slot, the rapid detection of the current values of multiple test channels is achieved, and the problem of low detection efficiency in the prior art is solved and the detection efficiency and accuracy are improved.
Patent Information
- Application Number
- CN202421253124.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-04
- Publication Date
- 2025-05-30
- Estimated Expiration
- 2034-06-04
AI Technical Summary
In the prior art, the current value detection efficiency of multiple test channels in the aging test power slot is low, and it takes a lot of time and manpower.
A output current testing device based on an aging test power supply is designed, through the interface between the test substrate and the slot, and the series structure of conductive lines, LED lamp beads and ammeters is used to realize the rapid detection of the current values of multiple test channels.
The device can quickly and accurately read the current values of multiple test channels in the slot, improve detection efficiency, reduce labor costs, and intuitively reflect the line status through LED lamp beads, which facilitates fault identification.
Smart Images

Figure CN222926777U_ABST
Abstract
Claims
1. An output current test device based on an aging test power supply, characterized in that: The aging test power supply is configured with a plurality of slots connected in parallel, and each slot includes a plurality of test channels connected in parallel with each other; The output current testing device comprises: A test substrate, wherein the surface of the test substrate is integrated with conductive circuits that match the test channels one by one, and the side of the test substrate is provided with an interface portion that is conductively connected to one end of each conductive circuit, the interface portion can be adaptably inserted into the slot, and each conductive circuit is conductively connected to the corresponding test channel in the aging test power supply through the slot; and The LED lamp beads and the ammeter are connected in series to each other at the other end of each conductive circuit.
2. The output current testing device according to claim 1, characterized in that: The slot in the aging test power supply includes a plurality of first negative electrode pins and at least one first positive electrode pin that match the test channels one by one, and the interface portion of the test substrate is configured with a plurality of second negative electrode pins and at least one second positive electrode pin that match the slot, and one end of each conductive line in the test substrate is connected to one of the second negative electrode pins, and the other end is connected in series with an LED lamp bead and an ammeter and then connected to the second positive electrode pin; after the interface portion is inserted into the slot, the first negative electrode pin and the second negative electrode pin are conductively connected one by one, and the first positive electrode pin and the second positive electrode pin are conductively connected.
3. The output current testing device according to claim 2, characterized in that: In the slot, the first positive pin is located in the middle position, and the first negative pins are symmetrically arranged on both sides of the first positive pin; in the interface part, the second positive pin is located in the middle position, and the second negative pins are symmetrically arranged on both sides of the second positive pin.
4. The output current testing device according to claim 2 or 3, characterized in that: Two rows of pins are symmetrically arranged on two opposite sides of the slot, and both rows of pins are arranged with a plurality of first negative electrode pins and at least one first positive electrode pin; Both side surfaces of the test substrate interface portion are provided with pins adapted to the slot, and conductive connection between the pins is achieved by inserting the interface portion into the middle position of two rows of pins in the slot.