Chip test protection device

Abstract

The utility model relates to the technical field of chip testing, and discloses a chip testing protection device, which comprises a chip testing board used for matching a workpiece to carry out chip testing, the chip testing board is at least provided with a first card slot and a second card slot, the first card slot and the second card slot are located on the same surface, and the chip testing board is provided with a first chip and a second chip; the first clamping groove and the second clamping groove are located in the same horizontal position. The protection switch is arranged between the first clamping groove and the second clamping groove, the protection switch is provided with a detector, when a work piece is inserted into the first clamping groove and the second clamping groove, an action magnetic column connected to the work piece closes the protection switch, the protection switch generates a closing parameter, and the detector is used for detecting the closing parameter of the work piece. And if the closing parameter is greater than a preset threshold value of the detector, the detector sends an abnormal signal. The reliability of chip testing is improved.

Description

Technical Field

[0001] This application relates to the technical field of chip testing, and particularly to a chip testing protection device. Background Art

[0002] Chip testing is a crucial step to ensure the reliable operation of integrated circuits during their life cycle. When a chip testing device conducts tests, various test signals and electrical stresses are applied to the chip to accelerate its aging process, thereby detecting potential faults in advance.

[0003] Currently, the working parts of integrated chips can be matched to a chip testing device for chip testing operations. During the process of inserting the working parts into the chip testing device, if the insertion of the working parts is poor or incomplete due to some reasons, it is very easy to cause damage to the working parts, affecting the reliability of the device and resulting in the impact on the test efficiency and accuracy. Utility Model Content

[0004] In view of this, this application provides a chip testing protection device to improve the reliability of chip testing.

[0005] To achieve the above object, the technical solution adopted is as follows:

[0006] A chip testing protection device, comprising:

[0007] A chip testing board, the chip testing board is provided with at least a first card slot and a second card slot, the first card slot and the second card slot are located on the same surface, and the first card slot and the second card slot are located at the same horizontal position;

[0008] A protection switch, which is arranged between the first card slot and the second card slot. The protection switch is provided with a detector. When the working part is inserted into the first card slot and the second card slot, the action magnetic column connected to the working part closes the protection switch, and the protection switch generates a closing parameter. If the closing parameter is greater than the preset threshold of the detector, it is determined that the insertion of the working part is abnormal.

[0009] This application is further provided as: The chip testing board is provided with a third card slot. The third card slot is located on the same surface as the first card slot and the second card slot, and the third card slot is located at the same horizontal position as the first card slot and the second card slot. The protection switch is also arranged between the second card slot and the third card slot.

[0010] This application is further provided as: The protection switch includes a reed switch. The action magnetic column controls the opening and closing of the reed switch. The reed switch is arranged between the first card slot and the second card slot, and between the second card slot and the third card slot.

[0011] This application is further configured such that: accommodation grooves are provided between the first card slot and the second card slot and between the second card slot and the third card slot, and the reed switch is connected within the accommodation groove.

[0012] This application is further configured such that: a buffer magnetic strip is provided at one end of the actuating magnetic post facing the reed switch.

[0013] This application is further configured such that: the protection switch further includes a self-locking member provided on the actuating magnetic post. When the workpiece is inserted into the first card slot, the second card slot, and the third card slot, the self-locking member locks the reed switch and the actuating magnetic post.

[0014] This application is further configured such that: the self-locking member includes an arc-shaped elastic piece connected to the side of the actuating magnetic post, and a first locking groove is provided on the groove wall of the accommodation groove. When the workpiece is inserted into the first card slot, the second card slot, and the third card slot, the arc-shaped elastic piece is fitted within the first locking groove.

[0015] This application is further configured such that: the self-locking member includes an accommodation cavity, a round-head slider, an elastic member, and a fixing groove. A second locking groove is provided on the groove wall of the accommodation groove. The accommodation cavity is provided on the side of the actuating magnetic post. The first end face of the round-head slider is arranged within the accommodation cavity. The second end face of the round-head slider is higher than the accommodation cavity. The fixing groove is provided on the first end face. The elastic member is provided within the fixing groove, and at least one end of the elastic member abuts against the accommodation cavity. When the workpiece is inserted into the first card slot, the second card slot, and the third card slot, the round-head slider is fitted within the second locking groove.

[0016] This application is further configured such that: when the workpiece is inserted into the first card slot, the second card slot, and the third card slot, the two protection switches are closed and two closing parameters are generated. If the two closing parameters are greater than the preset threshold of the detector, the detector emits an abnormal signal.

[0017] This application is further configured such that: the abnormal signal includes a buzzer alarm signal or a test circuit disconnection signal.

[0018] In summary, compared with the prior art, the present application discloses a chip test protection device, including a chip test board and a protection switch. The first card slot and the second card slot of the chip test board are located on the same surface and at the same horizontal position. Among them, the protection switch is arranged between the first card slot and the second card slot. The protection switch is provided with a detector. When the workpiece is inserted into the first card slot and the second card slot, the action magnetic post connected to the workpiece closes the protection switch, and the protection switch generates a closing parameter. If the closing parameter is greater than the preset threshold of the detector, it is determined that the insertion of the workpiece is abnormal. That is, through the above settings, the present application improves the test efficiency, accuracy and reliability of chip testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present application. For those skilled in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0020] Figure 1 is a schematic structural diagram of the chip test protection device of this embodiment;

[0021] Figure 2 is a schematic structural diagram of the first protection switch of this embodiment;

[0022] Figure 3 is a schematic structural diagram of the second protection switch of this embodiment;

[0023] Figure 4 is an electrical schematic diagram of the detector of this embodiment.

[0024] Reference numerals: 1, chip test board; 11, accommodation groove; 12, first locking groove; 13, second locking groove; 2, workpiece; 21, first metallized contact pad; 22, second metallized contact pad; 23, third metallized contact pad; 31, first card slot; 32, second card slot; 33, third card slot; 4, protection switch; 5, detector; 6, reed switch; 7, action magnetic post; 71, buffer magnetic strip; 8, self-locking member; 81, accommodation cavity; 82, round head slider; 83, elastic member; 84, fixed groove; 9, arc-shaped elastic piece. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0025] Exemplary embodiments will be described in detail herein, and examples thereof are shown in the accompanying drawings. When the following description refers to the accompanying drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims.

[0026] It should be noted that in this document, the term "including", "comprising" or any other variation thereof is intended to cover non-exclusive inclusion, such that a process, method, article or device including a series of elements not only includes those elements but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including one..." does not exclude the presence of additional identical elements in the process, method, article or device including that element. In addition, components, features, and elements with the same name in different embodiments of the present application may have the same meaning or may have different meanings, and their specific meanings need to be determined based on their explanations in the specific embodiments or further in combination with the context of the specific embodiments.

[0027] It should be understood that the specific embodiments described herein are merely used to explain the present application and are not used to limit the present application.

[0028] In the following description, the suffixes such as "module", "component" or "unit" used to represent elements are only for the convenience of the description of the present application, and they have no specific meaning in themselves. Therefore, "module", "component" or "unit" can be used interchangeably.

[0029] In the description of the present application, it should be noted that the orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", "inner", "outer", etc. is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present application. In addition, the terms "first", "second", "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0030] The technical solutions shown in the present application will be described in detail below through specific embodiments. It should be noted that the order of description of the following embodiments does not limit the priority order of the embodiments.

[0031] Please refer to Figure 1, the chip test protection device of the present application includes a chip test board 1 and a protection switch 4. The chip test board 1 is matched with a workpiece 2 for chip testing, and at least has a first card slot 31 and a second card slot 32. Among them, the first card slot 31 and the second card slot 32 are located on the same surface, and the first card slot 31 and the second card slot 32 are located at the same horizontal position.

[0032] In the specific implementation process, the protection switch 4 is arranged between the first card slot 31 and the second card slot 32. The protection switch 4 is provided with a detector 5. When the workpiece 2 is inserted into the first card slot 31 and the second card slot 32, the action magnetic column 7 connected to the workpiece 2 closes the protection switch 4, and then the protection switch 4 generates a closing parameter. If the closing parameter is greater than the preset threshold of the detector 5, it is determined that the insertion of the workpiece 2 is abnormal. Thus, during the process of inserting the workpiece 2 into the chip test board 1 for testing, it can prevent the workpiece 2 from having an insertion failure or not being fully inserted, avoid damaging the workpiece 2, and improve the test efficiency, accuracy and reliability of the chip test protection device.

[0033] It can be understood that the action magnetic column 7 is arranged at one end of the workpiece 2 facing the chip test board 1, that is, during the process of inserting the workpiece 2 into the first card slot 31 and the second card slot 32, the action magnetic column 7 gradually approaches and abuts against the protection switch 4, that is, the action magnetic column 7 corresponds to the protection switch 4 in terms of positional relationship.

[0034] Furthermore, the workpiece 2 in this embodiment can be a circuit board integrated with a chip. Then, one end of the workpiece 2 facing the chip test board 1 can be correspondingly provided with a first metallized contact pad 21 and a second metallized contact pad 22. The first metallized contact pad 21 is inserted into the first card slot 31, and the second metallized contact pad 22 is inserted into the second card slot 32. Then, the action magnetic column 7 can be located between the first metallized contact pad 21 and the second metallized contact pad 22.

[0035] Optionally, the workpiece 2 can be a BIB (Bare Integrated Board) circuit board integrated with a chip. The BIB circuit board directly integrates the chip onto the circuit board without using a package. While greatly reducing the volume and weight of the circuit, it can also better transfer heat and dissipate heat, achieving a more compact layout, thereby improving the circuit integration. Then, the chip test board 1 can be a BIOven slot test board. Among them, BI (Bare Integrated) defines that the chip test board 1 is designed for bare die integrated circuits without a package, and Oven defines that this chip test board 1 can perform heat treatment. Thus, the chip test protection device of this embodiment can be applied to a UFS (Universal Flash Storage) BIB Power storage device to pass the chip test and ensure the high performance and reliability of the UFS storage device.

[0036] Of course, the chip test protection device of this embodiment is not limited to this, and it can also be applied to the test of working parts of other integrated chips, which will not be elaborated here.

[0037] In one embodiment, the chip test board 1 may be provided with a third card slot 33. The third card slot 33 is on the same surface as the first card slot 31 and the second card slot 32, and the third card slot 33 is at the same horizontal position as the first card slot 31 and the second card slot 32. Among them, the protection switch 4 may also be arranged between the second card slot 32 and the third card slot 33.

[0038] Furthermore, one end of the working part 2 facing the chip test board 1 may be correspondingly provided with a third metallized contact pad 23. Then the third metallized contact pad 23 is inserted into the third card slot 33, and the action magnetic column 7 is also located between the second metallized contact pad 22 and the third metallized contact pad 23.

[0039] During the test of the working part 2, when the working part 2 is inserted into the first card slot 31, the second card slot 32 and the third card slot 33, the two action magnetic columns 7 connected to the working part 2 synchronously close the two protection switches 4. The two protection switches 4 generate two closing parameters. If the two closing parameters are greater than the preset threshold of the detector 5, it is determined that the insertion of the working part 2 is abnormal. At the same time, the detector 5 can also send out an abnormal signal, thereby further preventing the working part 2 from being inserted malfunctionally or not being fully inserted, and thus avoiding damage to the working part 2, improving the test efficiency, accuracy and reliability of the chip test protection device.

[0040] It can be understood that the detector 5 is electrically connected to the protection switch 4 for detecting the closing parameters of the protection switch 4. Optionally, the closing parameter can be an impedance value, and the preset threshold of the detector 5 can be 5Ω. That is, after the working part 2 is inserted into the chip test board 1, the action magnetic column 7 closes the protection switch 4. Under normal conditions, the metallized contact pad of the working part 2 is well connected to the test socket of the chip test board 1 and is inserted in place, then the impedance value after the protection switch 4 is normally closed is less than 5Ω. However, when the working part 2 is inserted malfunctionally, such as not being inserted in place or not being fully inserted, the protection switch 4 is not closed smoothly or not closed, then the impedance value of the protection switch 4 is greater than 5Ω. In this case, the insertion of the working part 2 is abnormal, and the detector 5 can send out an abnormal signal, thereby improving the test efficiency, accuracy and reliability of the chip test.

[0041] Optionally, the abnormal signal sent by the detector 5 may include a buzzer alarm signal or a test circuit disconnection signal.

[0042] Reference Figure 4, the input voltage of the detector 5 can be 5V. After the workpiece 2 is normally inserted into the first card slot 31 and the second card slot 32, the moving magnetic column 7 normally closes the protection switch 4 and the protection switch 4 generates a closing parameter. If the closing parameter does not reach the preset threshold of the detector 5, the detector 5 outputs a normal signal of 5V, and the chip test board 1 matches the workpiece 2 to perform a chip test. If the closing parameter is greater than the preset threshold of the detector 5, the detector 5 emits an abnormal signal of 12V. This abnormal signal can be transmitted to the buzzer 51 to give an abnormal alarm, or can be used as a test circuit disconnection signal to disconnect the chip test of the chip test board 1.

[0043] In the specific implementation process, refer to Figure 2 or Figure 3 , the protection switch 4 can include a reed switch 6, then the moving magnetic column 7 controls the opening and closing of the reed switch 6. The detector 5 is electrically connected to the reed switch 6 and detects the closing parameter of the reed switch 6. The reed switch 6 is arranged between the first card slot 31 and the second card slot 32, and between the second card slot 32 and the third card slot 33. The moving magnetic column 7 is correspondingly connected to the workpiece 2. Then, during the process of inserting the workpiece 2 into the chip test board 1, the moving magnetic column 7 approaches and finally abuts against the reed switch 6, thereby closing the protection switch 4.

[0044] Furthermore, accommodation grooves 11 are provided between the first card slot 31 and the second card slot 32 and between the second card slot 32 and the third card slot 33. The reed switch 6 is connected in the accommodation groove 11. Thus, on the one hand, it provides protection for the accommodation groove 11, and on the other hand, it can provide a structural path guide for the moving magnetic column 7 during the process of inserting the workpiece 2 into the chip test board 1.

[0045] It can be understood that a reed switch (also known as a magnetic sensor switch, reed relay or magnetron) is a small switch device that operates using a magnetic field. In the absence of an external magnetic field, its reed contacts are separated, so the circuit is open. When a strong enough external magnetic field approaches, the reed contacts will be attracted and closed, allowing current to pass through and forming a closed circuit. The specific function of the reed switch 6 in this embodiment can be obtained by those skilled in the art according to the prior art, and the structure and working principle of the reed switch 6 will not be elaborated here.

[0046] In one embodiment, in order to avoid hard contact between the reed switch 6 and the moving magnetic column 7, a buffer magnetic strip 71 can be provided at one end of the moving magnetic column 7 facing the reed switch 6 to improve the structural reliability.

[0047] The protection switch 4 of this embodiment further includes a self-locking member 8. The self-locking member 8 is arranged on the moving magnetic column 7. After the workpiece 2 is inserted into the first card slot 31, the second card slot 32 and the third card slot 33, the self-locking member 8 locks the reed switch 6 and the moving magnetic column 7. Specifically, refer to Figure 2, the self-locking member 8 may include an arc-shaped elastic piece 9 connected to the side of the actuating magnetic post 7. A first locking groove 12 is provided on the groove wall of the accommodating groove 11. When the workpiece 2 is inserted into the first card slot 31, the second card slot 32, and the third card slot 33, the arc-shaped elastic piece 9 is fitted into the first locking groove 12, thereby ensuring the stable connection between the reed switch 6 and the actuating magnetic post 7.

[0048] On the other hand, referring to Figure 3 , the self-locking member 8 may further include an accommodating cavity 81, a round-head slider 82, an elastic member 83, and a fixing groove 84. Among them, a second locking groove 13 is provided on the groove wall of the accommodating groove 11.

[0049] Furthermore, the accommodating cavity 81 is provided on the side of the actuating magnetic post 7. The first end face of the round-head slider 82 is arranged in the accommodating cavity 81. The second end face of the round-head slider 82 is higher than the accommodating cavity 81. The fixing groove 84 is provided on the first end face. The elastic member 83 is arranged in the fixing groove 84, and at least one end of the elastic member 83 abuts against the accommodating cavity 81. During the process of the workpiece 2 being inserted into the first card slot 31, the second card slot 32, and the third card slot 33, the workpiece 2 forces the round-head slider 82 to compress the elastic member 83 and contract into the accommodating cavity 81 on the actuating magnetic post 7. After the workpiece 2 is inserted into the first card slot 31, the second card slot 32, and the third card slot 33, the round-head slider 82 protrudes and is fitted into the second locking groove 13 under the action of the elastic member 83, thereby ensuring the stable connection between the reed switch 6 and the actuating magnetic post 7.

[0050] In summary, this embodiment discloses a chip test protection device, including a chip test board 1 and a protection switch 4. The first card slot 31 and the second card slot position 12 of the chip test board 1 are on the same surface and at the same horizontal position. Among them, the protection switch 4 is arranged between the first card slot 31 and the second card slot 32. The protection switch 4 is provided with a detector 5. When the workpiece 2 is inserted into the first card slot 31 and the second card slot 32, the actuating magnetic post 7 connected to the workpiece 2 closes the protection switch 4, and then the protection switch 4 generates a closing parameter. If the closing parameter is greater than the preset threshold of the detector 5, it is determined that the insertion of the workpiece 2 is abnormal. Thus, the test efficiency, accuracy, and reliability of chip testing are improved.

[0051] The above has introduced the present application in detail. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the core idea of the present application; at the same time, for those skilled in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. A chip testing protection device, characterized in that: include: A chip testing board, wherein the chip testing board is provided with at least a first card slot and a second card slot, wherein the first card slot and the second card slot are located on the same surface, and the first card slot and the second card slot are located at the same horizontal position; A protective switch is arranged between the first card slot and the second card slot. The protective switch is provided with a detector. When the workpiece is inserted into the first card slot and the second card slot, the action magnetic column connected to the workpiece closes the protective switch, and the protective switch generates a closing parameter. If the closing parameter is greater than a preset threshold value of the detector, it is determined that the insertion of the workpiece is abnormal.

2. The chip testing protection device according to claim 1, characterized in that: The chip testing board is provided with a third card slot, the third card slot is located on the same surface as the first card slot and the second card slot, and the third card slot is located at the same horizontal position as the first card slot and the second card slot, and the protection switch is also provided between the second card slot and the third card slot.

3. The chip testing protection device according to claim 2, characterized in that: The protection switch includes a reed switch. The action magnetic column controls the opening and closing of the reed switch. The reed switch is arranged between the first card slot and the second card slot, and between the second card slot and the third card slot.

4. The chip testing protection device according to claim 3, characterized in that: An accommodating slot is provided between the first card slot and the second card slot and between the second card slot and the third card slot, and the reed switch is connected in the accommodating slot.

5. The chip testing protection device according to claim 3, characterized in that: A buffer magnetic strip is provided at one end of the action magnetic column facing the reed switch.

6. The chip testing protection device according to claim 4, characterized in that: The protection switch also includes a self-locking part, which is arranged on the action magnetic column. When the working part is inserted into the first slot, the second slot and the third slot, the self-locking part locks the reed switch and the action magnetic column.

7. The chip testing protection device according to claim 6, characterized in that: The self-locking part includes an arc-shaped spring piece connected to the side of the action magnetic column, and the groove wall of the accommodating groove is provided with a first locking groove. When the working part is inserted into the first slot, the second slot and the third slot, the arc-shaped spring piece is matched in the first locking groove.

8. The chip testing protection device according to claim 6, characterized in that: The self-locking component includes a accommodating cavity, a round-head slider, an elastic component and a fixing groove. The groove wall of the accommodating groove is provided with a second locking groove. The accommodating cavity is arranged on the side of the actuating magnetic column. The first end face of the round-head slider is arranged in the accommodating cavity. The second end face of the round-head slider is higher than the accommodating cavity. The fixing groove is arranged on the first end face. The elastic component is arranged in the fixing groove, and at least one end of the elastic component abuts against the accommodating cavity. When the working component is inserted into the first card slot, the second card slot and the third card slot, the round-head slider is matched in the second locking groove.

9. The chip testing protection device according to claim 2, characterized in that: When the workpiece is inserted into the first slot, the second slot and the third slot, the two protection switches generate two closing parameters. If the two closing parameters are greater than the preset thresholds of the detector, the detector sends an abnormal signal.

10. The chip testing protection device according to claim 9, characterized in that: The abnormal signal includes a buzzer alarm signal or a test circuit disconnection signal.

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