Probe test seat applied to aging test

Abstract

The utility model relates to the technical field of chip aging test, and discloses a probe test seat applied to aging test, which comprises a lower pressing part, a base and a chip pressing claw arranged between the base and the lower pressing part, and is characterized in that the bottom of the base is provided with a probe test part; and the probe testing part comprises a basic probe station integrally arranged at the bottom of the base and an auxiliary limiting frame connected above the basic probe station through a first spring. According to the utility model, the auxiliary limiting frame for bearing the chip is connected to the basic probe station through the spring, can move up and down, and can play a buffering role when the chip is pressed down, so that the head of the probe is protected, and the chip can be in contact with the test probe only after becoming backward, so that the precision of the seating position of the chip is ensured, and the working efficiency is improved. And the contact accuracy of the chip and the probe is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip aging test, in particular to a probe test seat used for aging test. Background Art

[0002] The traditional aging test seat mainly consists of a base, an upper cover, a lower cover, a limit frame, etc. Its main working principle is: under the external force applied from the upper part of the test seat, the upper cover moves down; the upper cover and the pressure claw form a hinge structure, and the upper cover drives the pressure claw to rotate and open; the chip is placed in the chip placement slot of the limit frame; the external force is slowly removed, the upper cover moves up to drive the pressure claw to rotate in the opposite direction, press the chip to fix the chip position, and wait for the next test, etc. Among them, the limit frame is the main component for placing the chip, and its upper part contains the chip fixing slot for the placed chip, the avoidance slot for the pressure claw, and the chip placement avoidance slot design.

[0003] In a Chinese patent with publication number CN 219625539 U, an aging test socket compatible with multiple chip aging tests is disclosed, including a loading test part and a pressing part, the loading test part includes a base and a chip pressing claw arranged between the base and the pressing part, and a probe test part is provided at the bottom of the base, the probe test part includes a basic probe station integrally arranged at the bottom of the base and an auxiliary limit frame detachably connected to the top of the basic probe station. The advantage of the utility model is that a single test socket corresponds to test chips of various sizes, and the quick replacement of a single component can achieve rapid switching of the test product type, saving time for changing the test product type, avoiding the problem of a large number of products in actual production and difficult operation for personnel, integrating product components, making full use of product components, avoiding waste, and providing a one-to-two or one-to-many direction for test socket product testing, thereby expanding the scope of application of a single test socket.

[0004] The existing basic probe station and the auxiliary limit frame are rigidly connected, and there is no buffer when the chip is pressed down, which may cause damage. Utility Model Content

[0005] The utility model aims to solve the problems existing in the prior art and proposes a probe test socket used for aging test.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] A probe test seat used for aging test comprises a pressing part, a base and a chip pressing claw arranged between the base and the pressing part. A probe test part is arranged at the bottom of the base. The probe test part comprises a basic probe platform integrally arranged at the bottom of the base and an auxiliary limiting frame connected to the top of the basic probe platform through a first spring.

[0008] Preferably, an auxiliary chip introduction groove is provided on the inner edge of the auxiliary limiting frame.

[0009] Preferably, the basic probe station comprises two probe plates which are arranged opposite to each other, and a receiving cavity is formed between the two probe plates for placing the probes, and the two probe plates are detachably connected by screws.

[0010] Preferably, the auxiliary limiting frame is a replaceable component and has a variety of optional sizes.

[0011] Preferably, the pressing portion is mounted on the base via a second spring, and both sides of the base are rotatably connected to the chip pressing claws via a rotating shaft.

[0012] Compared with the prior art, the beneficial effects of the utility model are:

[0013] The utility model connects the auxiliary limit frame carrying the chip to the basic probe platform through a spring, which can move up and down. When the chip is pressed down, it can play a buffering role, thereby protecting the probe head. The chip can contact the test probe only after it is backward, thereby ensuring the positioning accuracy of the chip and improving the accuracy of the contact between the chip and the probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a three-dimensional schematic diagram of a chip under pressure of a probe test socket for aging test proposed by the utility model;

[0015] Figure 2 This is a front view of a chip in a pressed-down state of a probe test socket for aging test proposed by the utility model;

[0016] Figure 3 This is a rear view of a chip in a pressed-down state of a probe test socket for aging test proposed by the utility model;

[0017] Figure 4 This is a left view of a chip in a pressed-down state of a probe test socket for aging test proposed by the utility model;

[0018] Figure 5 This is a right view of a chip in a pressed-down state of a probe test socket for aging test proposed by the utility model;

[0019] Figure 6 This is a top view of a chip in a pressed-down state of a probe test socket for aging testing proposed by the utility model;

[0020] Figure 7 This is a bottom view of a chip in a pressed-down state of a probe test socket for aging test proposed by the utility model;

[0021] Figure 8It is a three-dimensional schematic diagram of a chip pressing claw of a probe test seat applied to an aging test proposed by the utility model in a non-pressed state;

[0022] Fig. 9 This is a front view of a chip pressing claw of a probe test socket for aging test proposed by the utility model in a non-pressed state;

[0023] Fig.10 This is a rear view of a chip pressing claw of a probe test socket for aging test proposed by the utility model in a non-pressed state;

[0024] Fig.11 This is a left view of a chip pressing claw of a probe test socket for aging test proposed by the utility model in a non-pressed state;

[0025] Fig.12 It is a right view of a chip pressing claw of a probe test seat applied to an aging test proposed by the utility model in a non-pressed state;

[0026] Fig.13 A top view of a chip pressing claw of a probe test seat for aging test proposed by the utility model in a non-pressed state;

[0027] Fig.14 A bottom view of a chip pressing claw of a probe test seat for aging test proposed by the utility model in a non-pressed state;

[0028] Fig.15 This is a schematic diagram of connecting two probe boards of a probe test socket for aging testing proposed by the utility model;

[0029] Fig.16 The utility model is a schematic diagram of the connection between an auxiliary limit block and a probe plate of a probe test socket for aging test.

[0030] In the figure: 1. lower pressing part; 2. base; 3. chip pressing claw; 4. probe testing part; 5. basic probe station; 6. first spring; 7. auxiliary limiting frame; 8. probe plate; 9. second spring. DETAILED DESCRIPTION

[0031] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0032] Reference Figure 1-16A probe test seat used for aging test includes a pressing part 1, a base 2 and a chip pressing claw 3 arranged between the base 2 and the pressing part 1. A probe test part 4 is provided at the bottom of the base 2. The probe test part 4 includes a basic probe platform 5 integrally arranged at the bottom of the base 2 and an auxiliary limiting frame 7 connected to the top of the basic probe platform 5 through a first spring 6.

[0033] When the device is in use, the auxiliary limit frame 7 carrying the chip is connected to the basic probe platform 5 through a spring, which can move up and down. It can play a buffering role when the chip is pressed down, thereby protecting the probe head. The chip can contact the test probe only after it is backward, ensuring the accuracy of the chip's seating position and improving the accuracy of the chip-probe contact.

[0034] In this embodiment, an auxiliary chip introduction groove is provided on the inner edge of the auxiliary limiting frame 7 .

[0035] In this embodiment, the basic probe station 5 includes two probe plates 8 that are relatively arranged, and a receiving cavity is formed between the two probe plates 8 for placing probes. The two probe plates 8 are detachably connected by screws, and the upper and lower needle plates are the same part placed up and down, which has great interchangeability and is convenient for production and application. In terms of parts manufacturing, it saves mold manufacturing costs.

[0036] In this embodiment, the auxiliary limiting frame 7 is a replaceable component and has a variety of optional sizes.

[0037] In this embodiment, the pressing part 1 is installed on the base 2 through the second spring 9. Both sides of the base 2 are rotatably connected with the chip pressing claw 3 through a rotating shaft. The pressing part 1 is driven by external force to press the chip pressing claw 3 to make a rotational motion, and the end of the chip pressing claw 3 presses down the chip.

[0038] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A probe test socket for aging test, comprising a pressing portion, a base, and a chip pressing claw arranged between the base and the pressing portion, characterized in that: A probe testing part is provided at the bottom of the base, and the probe testing part comprises a basic probe platform integrally arranged at the bottom of the base and an auxiliary limiting frame connected above the basic probe platform through a first spring.

2. The probe test socket for aging test according to claim 1, characterized in that: An auxiliary chip introduction groove is provided on the inner edge of the auxiliary limiting frame.

3. The probe test socket for aging test according to claim 1, characterized in that: The basic probe station comprises two probe plates which are arranged opposite to each other, and a receiving cavity is formed between the two probe plates for placing probes, and the two probe plates are detachably connected by screws.

4. The probe test socket for aging test according to claim 2, characterized in that: The auxiliary limiting frame is a replaceable component and has a variety of optional sizes.

5. The probe test socket for aging test according to claim 1, characterized in that: The pressing part is mounted on the base through a second spring, and both sides of the base are rotatably connected with the chip pressing claws through a rotating shaft.

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