Integrated circuit aging test device

Abstract

The utility model discloses an integrated circuit aging test device, which relates to the technical field of integrated circuit test and specifically comprises a box body, a plurality of first aging test boards are arranged in the box body in a sliding manner in the left-right direction, and a second aging test board is arranged on the right side surface of each first aging test board. And each second aging test board is positioned on the right side of the box body. When the aging test box is used, when the integrated circuit on the first aging test board in the box body is subjected to an aging test, the integrated circuit is inserted into the test seat on the second aging test board, and when the integrated circuit on the first aging test board in the box body is subjected to the aging test, the second aging test board is pushed; the second aging test board enters the box body, at the moment, the integrated circuit on the second aging test board in the box body is subjected to aging test, meanwhile, the integrated circuit on the first aging test board can be taken down, and a new integrated circuit to be tested is inserted, so that the test efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit testing, and particularly relates to an integrated circuit aging test device. Background Art

[0002] An integrated circuit is a microelectronic device or component. Using a certain process, components such as transistors, resistors, capacitors, and inductors required in a circuit, as well as the wiring, are interconnected and fabricated on a small piece or a few small pieces of semiconductor wafers or dielectric substrates, and then encapsulated in a package to form a micro-structure with the required circuit functions.

[0003] Aging test means that the integrated circuit operates normally for a set time in a high-temperature environment. During the test, if the integrated circuit has no abnormal operation, it is a qualified product; if there is an abnormality, it is an unqualified product. The existing aging test method is to install a test socket on an aging test board, insert the integrated circuit into the test socket, and then place the aging test board in a box. Through the electrical connection between the aging test board and the test socket, and the electrical connection between the test socket and the integrated circuit, it can be realized that the integrated circuit is in a normal working state through the aging test board. Then, the box is heated by a heating device to create a high-temperature environment in the box, so that the integrated circuit operates for a set time in the high-temperature environment in the box. During the test time, the integrated circuit with an abnormality is an unqualified product, and the integrated circuit without abnormal operation is a qualified product. In the operation, it is necessary to put the aging test board into the box, take it out of the box after the test, and also insert or take out the integrated circuit into or from the test socket. The operation is cumbersome, time-consuming, and reduces the efficiency of the aging test process. Content of the Utility Model

[0004] Aiming at the deficiencies and defects in the existing technology during the integrated circuit aging test, such as cumbersome operation and low efficiency.

[0005] An integrated circuit aging test device disclosed by the utility model includes a box body. A plurality of first aging test boards are slidably arranged in the box body in the left-right direction. A second aging test board is arranged on the right side surface of each first aging test board. Each second aging test board is located on the right side of the box body. A test socket is arranged on the upper surface of each first aging test board and second aging test board. The test socket is electrically connected to the first aging test board or the second aging test board.

[0006] Furthermore, a baffle is arranged between the first aging test board and the second aging test board. The height of the baffle is greater than or equal to the height of the test socket. Accommodation through holes for the baffle are opened at positions corresponding to the baffle on the left side wall and the right side wall of the box body. End plates are arranged on the side surfaces of the first aging test board and the second aging test board away from each other.

[0007] Further, it includes a right pull rod that integrally connects each end plate on the right side and a left pull rod that connects each end plate on the left side.

[0008] Further, back plates are provided on the rear sides of the left and right sides of the box body. Each first aging test board is slidably connected to the left back plate in the left-right direction, and each second aging test board is slidably connected to the right back plate in the left-right direction.

[0009] Further, bottom plates are provided on both the left side and the right side of the box body. When the first aging test board moves to the left side of the box body, the upper end surface of the bottom plate on the left side of the box body is in sliding contact with the lower end surface of the lowermost first aging test board; when the second aging test board moves to the right side of the box body, the upper end surface of the bottom plate on the right side of the box body is in sliding contact with the lower end surface of the lowermost second aging test board.

[0010] Further, positioning strips are provided on the outer sides of the upper end surfaces of each bottom plate; when the left pull rod is pushed to make the first aging test board enter the box body and the second aging test board moves to the right side of the box body and abuts against the positioning strip on the right side, each baffle is located in the corresponding accommodation through hole on the right side wall of the box body, and each left end plate is located in the corresponding accommodation through hole on the left side wall of the box body; when the right pull rod is pushed to make the second aging test board enter the box body and the first aging test board moves to the left side of the box body and abuts against the positioning strip on the left side, each baffle is located in the corresponding accommodation through hole on the left side wall of the box body, and each right end plate is located in the corresponding accommodation through hole on the right side wall of the box body.

[0011] Further, guide rails are provided on the rear sides of each first aging test board and the second aging test board. Guide grooves are provided at positions corresponding to the guide rails on the front side of the back plate and the rear side wall of the box body, and the guide grooves on the rear side wall of the box body are communicated with the corresponding guide grooves on each back plate.

[0012] Compared with the prior art, the beneficial effects of the present utility model are as follows:

[0013] 1. By providing a box body, a first aging test board, a second aging test board, and a test seat, when the integrated circuit in the test seat on the first aging test board located in the box body is subjected to aging test during the use of the present device, an integrated circuit is inserted into the test seat on the second aging test board. When the integrated circuit in the test seat on the first aging test board located in the box body completes the aging test, the second aging test board is pushed to make the second aging test board enter the box body, and the first aging test board moves to the left side of the box body. At this time, the integrated circuit on the second aging test board in the box body is subjected to aging test, and at the same time, the integrated circuit on the first aging test board can be removed and a new integrated circuit to be tested can be inserted, effectively reducing the time of the entire test process and improving the test efficiency.

[0014] 2. The utility model is provided with a box body, a baffle plate, an end plate, a first aging test plate and a second aging test plate. When the device is in use, when the second aging test plate is pushed to move leftward, the first aging test plate will move leftward synchronously. When the second aging test plate is located inside the box body, the first aging test plate is located on the left side of the box body. At this time, the baffle plate is located in the accommodation through hole on the left side wall of the box body, and the end plate on the right side is located in the accommodation through hole on the right side wall of the box body, achieving the purpose of sealing the accommodation through hole. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The drawings described herein are used to provide a further understanding of the present application and form a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation of the present application. In the drawings:

[0016] Figure 1 is a three-dimensional structure schematic diagram of the whole utility model;

[0017] Figure 2 is a three-dimensional structure schematic diagram of the interior of the box body of the utility model (omitting the first aging test plate and the second aging test plate);

[0018] Figure 3 is a three-dimensional structure schematic diagram of the test seat and the integrated circuit of the utility model;

[0019] Figure 4 is a three-dimensional structure schematic diagram of the guide rail of the utility model.

[0020] In the figures: 1. Box body; 2. First aging test plate; 3. Second aging test plate; 4. Test seat; 5. Integrated circuit; 6. Accommodation through hole; 7. Baffle plate; 8. End plate; 9. Right pull rod; 10. Left pull rod; 11. Back plate; 12. Bottom plate; 13. Positioning strip; 14. Guide rail; 15. Guide groove. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0021] The following will disclose multiple embodiments of the present utility model in the form of illustrations. For the sake of clarity, many physical details will be described in the following narrative. However, it should be understood that these physical details are not used to limit the present utility model. That is to say, in some embodiments of the present utility model, these physical details are not necessary. In addition, for the purpose of simplifying the illustrations, some conventional structures and components will be shown in a simple schematic manner in the illustrations.

[0022] Please refer to Figures 1-4, the integrated circuit aging test device of the present utility model includes a box body 1. A plurality of first aging test boards 2 are slidably arranged in the box body 1 in the left-right direction. A second aging test board 3 is arranged on the right side surface of each first aging test board 2. Each second aging test board 3 is located on the right side of the box body 1. A test seat 4 is arranged on the upper surface of each first aging test board 2 and the second aging test board 3. The test seat 4 is electrically connected to the first aging test board 2 or the second aging test board 3.

[0023] When it is necessary to perform an aging test on the integrated circuit 5, insert the integrated circuit 5 into the test seat 4 on the second aging test board 3, so that the integrated circuit 5 is electrically connected to the test seat 4, and the integrated circuit 5 is electrically connected to the second aging test board 3 through the test seat 4. Then push the second aging test board 3 to move leftward, so that the first aging test board 2 is completely located on the left side of the box body 1, and the second aging test board 3 is located inside the box body 1. Then, through the second aging test board 3, the integrated circuit 5 in the test seat 4 operates normally. Heat the inside of the box body 1 through a heating device, so that the integrated circuit 5 inside the box body 1 operates for a set time in a high-temperature environment. The integrated circuit 5 without abnormal operation is a good product, and the integrated circuit 5 with abnormal operation is a defective product; when performing an aging test on the integrated circuit 5 on the second aging test board 3, the integrated circuit 5 in the test seat 4 on the first aging test board 2 can be removed at the same time, and a new integrated circuit 5 to be tested can be inserted into the test seat 4. When the aging test of the integrated circuit 5 on the second aging test board 3 is completed, push the first aging test board 2 into the box body 1 for testing, while the second aging test board 3 is pushed to the right side of the box body 1 at the same time, and the integrated circuit 5 on the second aging test board 3 can be removed. Since the first aging test board 2 and the second aging test board 3 can be replaced with each other, the time of the entire test process is effectively reduced during the test, and the test efficiency is improved.

[0024] Please refer to Figure 1 , 2, 3, and 4. Since the test socket 4 is protrudingly provided on the upper end surface of the first aging test board 2 or the second aging test board 3, when performing the replacement work between the first aging test board 2 and the second aging test board 3, a receiving through hole 6 for the test socket 4 needs to be opened on the side wall of the box body 1. To solve the problem of sealing the receiving through hole 6, in this embodiment, a baffle 7 is provided between the first aging test board 2 and the second aging test board 3. The height of the baffle 7 is greater than or equal to the height of the test socket 4. Receiving through holes 6 for the baffle 7 are opened at positions corresponding to the baffle 7 on the left side wall and the right side wall of the box body 1; end plates 8 are provided on the sides of the first aging test board 2 and the second aging test board 3 that are away from each other; during use, when the integrated circuit 5 on the first aging test board 2 located in the box body 1 is subjected to aging test, the baffle 7 is located in the receiving through hole 6 on the right side wall of the box body 1, and the left end plate 8 is located in the receiving through hole 6 on the left side wall of the box body 1; when the aging test of the integrated circuit 5 on the first aging test board 2 located in the box body 1 is completed, the second aging test board 3 is pushed to move leftward, and at the same time, the baffle 7 and the end plate 8 move synchronously. When the first aging test board 2 moves to the left side of the box body 1 and the second aging test board 3 is located in the box body 1, the baffle 7 is then located in the receiving through hole 6 on the left side wall of the box body 1 to achieve the sealing effect, and the right end plate 8 is located in the receiving through hole 6 on the right side wall of the box body 1 to achieve the sealing effect; at this time, the aging test of the integrated circuit 5 on the second aging test board 3 can be performed, and at the same time, the integrated circuit 5 can be inserted into the test socket 4 of the first aging test board 2 and wait for testing.

[0025] Please refer to Figure 1 , 3 , 4. To achieve the purpose that several first aging test boards 2 can move synchronously, in this embodiment, it further includes a right pull rod 9 that connects each of the right end plates 8 into one body and a left pull rod 10 that connects each of the left end plates 8 into one body. By pushing the right pull rod 9 or the left pull rod 10, the synchronous movement of the first aging test board 2 and the second aging test board 3 is achieved, making the replacement between the first aging test board 2 and the second aging test board 3 simpler and faster.

[0026] Please refer to Figure 1 , 2, when the first aging test board 2 moves to the left side of the box body 1 or the second aging test board 3 moves to the right side of the box body 1, a suspended state will occur, making the left - right movement unstable. To solve this problem, in this embodiment, back plates 11 are provided at the rear sides of the left and right side surfaces of the box body 1. Each first aging test board 2 is slidably connected to the left back plate 11 in the left - right direction, and each second aging test board 3 is slidably connected to the right back plate 11 in the left - right direction; when the first aging test board 2 moves to the left side of the box body 1, by slidingly connecting with the left back plate 11, the movement of the first aging test board 2 becomes more stable, and when the second aging test board 3 moves to the right side of the box body 1, by slidingly connecting with the right back plate 11, the movement of the second aging test board 3 becomes more stable.

[0027] Please refer to Figure 1 , 2 , to further enhance the stability when the first aging test board 2 moves to the left side of the box body 1 or the second aging test board 3 moves to the right side of the box body 1, in this embodiment, bottom plates 12 are provided on both the left side surface and the right side surface of the box body 1. When the first aging test board 2 moves to the left side of the box body 1, the upper end surface of the bottom plate 12 on the left side of the box body 1 is in sliding contact with the lower end surface of the lowermost first aging test board 2; when the second aging test board 3 moves to the right side of the box body 1, the upper end surface of the bottom plate 12 on the right side of the box body 1 is in sliding contact with the lower end surface of the lowermost second aging test board 3; by providing the bottom plates 12, an additional supporting force is applied to the lowermost first aging test board 2 and the second aging test board 3, increasing the stability of the movement.

[0028] Please refer to Figure 1 , 2 , to achieve precise positioning of the left - right movement of the first aging test board 2 and the second aging test board 3, so that the accommodation through - holes 6 on the left and right side walls of the box body 1 can be ensured to be sealed. In this embodiment, positioning strips 13 are provided on the outer sides of the upper end surfaces of each bottom plate 12; when pushing the left pull rod 10 to make the first aging test board 2 enter the box body 1 and the second aging test board 3 moves to the right side of the box body 1 and abuts against the right positioning strip 13, each baffle 7 is located in the corresponding accommodation through - hole 6 on the right side wall of the box body 1, and each left end plate 8 is located in the corresponding accommodation through - hole 6 on the left side wall of the box body 1; when pushing the right pull rod 9 to make the second aging test board 3 enter the box body 1 and the first aging test board 2 moves to the left side of the box body 1 and abuts against the left positioning strip 13, each baffle 7 is located in the corresponding accommodation through - hole 6 on the left side wall of the box body 1, and each right end plate 8 is located in the corresponding accommodation through - hole 6 on the right side wall of the box body 1. The setting of the positioning strips 13 ensures the precise sealing of each accommodation through - hole 6.

[0029] Please refer to Figure 2 , 4, guide rails 14 are provided on the rear sides of each of the first aging test board 2 and the second aging test board 3, and guide grooves 15 are formed at positions corresponding to the guide rails 14 on the front side of the back plate 11 and the rear side wall of the box body 1. The guide grooves 15 on the rear side wall of the box body 1 communicate with the corresponding guide grooves 15 on each back plate 11; when the first aging test board 2 and the second aging test board 3 move left and right, they slide in the guide grooves 15 through the guide rails 14, which improves the smoothness of the movement of the first aging test board 2 and the second aging test board 3.

[0030] When using the present utility model: when the integrated circuit 5 on the first aging test board 2 inside the box body 1 is undergoing aging test, during the waiting time, the integrated circuit 5 to be tested is inserted into the test sockets 4 of each second aging test board 3 and waits for testing. When the integrated circuit 5 on the first aging test board 2 inside the box body 1 completes the aging test, the right pull rod 9 is pushed to make each second aging test board 3 move to the left, so that each first aging test board 2 moves to the left, and then each baffle 7 and end plate 8 move to the left synchronously. When the first aging test board 2 moves to abut against the positioning strip 13 on the left, each baffle 7 is located in the corresponding accommodation through hole 6 on the left side wall of the box body 1 to achieve sealing, and each right end plate 8 is located in the corresponding accommodation through hole 6 on the left side surface of the box body 1 to achieve sealing. At this time, the integrated circuit 5 on the second aging test board 3 inside the box body 1 can be subjected to aging test. At the same time, the integrated circuit 5 can be inserted into the test socket 4 on the first aging test board 2 located on the left side of the box body 1 and wait for testing. When the integrated circuit 5 on the second aging test board 3 inside the box body 1 is tested, the left pull rod 10 is pushed to make the first aging test board 2 move inside the box body 1. In this way, reciprocatingly, the testing is carried out, saving time.

[0031] The above is only the embodiment of the present utility model and is not used to limit the present utility model. For those skilled in the art, the present utility model can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model shall be included within the scope of the claims of the present utility model.

Claims

1. An integrated circuit aging test device, comprising a box, characterized in that: A number of first aging test boards are slidably arranged in the left and right directions in the box, a second aging test board is arranged on the right side of each first aging test board, each second aging test board is located on the right side of the box, and a test seat is arranged on the upper surface of each first aging test board and the second aging test board, and the test seat is electrically connected to the first aging test board or the second aging test board.

2. The integrated circuit aging test device according to claim 1, characterized in that: A baffle is arranged between the first aging test board and the second aging test board, and the height of the baffle is greater than or equal to the height of the test seat. The left side wall and the right side wall of the box body are provided with accommodating through holes for the baffle at positions corresponding to the baffle; the first aging test board and the second aging test board are both provided with end plates on the side away from each other.

3. The integrated circuit aging test device according to claim 2, characterized in that: It comprises a right pull rod which connects each end plate on the right side into one piece and a left pull rod which connects each end plate on the left side.

4. The integrated circuit aging test device according to claim 3, characterized in that: Backboards are provided on the rear sides of the left and right sides of the box body, each first aging test board is slidably connected to the left backboard, and each second aging test board is slidably connected to the right backboard.

5. The integrated circuit aging test device according to claim 4, characterized in that: The left and right sides of the box are both provided with bottom plates. When the first aging test board moves to the left side of the box, the upper end surface of the bottom plate on the left side of the box slides in contact with the lower end surface of the first aging test board at the bottom layer; when the second aging test board moves to the right side of the box, the upper end surface of the bottom plate on the right side of the box slides in contact with the lower end surface of the second aging test board at the bottom layer.

6. The integrated circuit aging test device according to claim 5, characterized in that: A positioning strip is provided on the outer side of the upper end surface of each bottom plate; when the left pull rod is pushed to make the first aging test board enter into the box body, the second aging test board moves to the right side of the box body and conflicts with the positioning strip on the right side, each baffle is located in the corresponding accommodating through hole on the right side wall of the box body, and each left end plate is located in the corresponding accommodating through hole on the left side wall of the box body; when the right pull rod is pushed to make the second aging test board enter into the box body, the first aging test board moves to the left side of the box body and conflicts with the positioning strip on the left side, each baffle is located in the corresponding accommodating through hole on the left side wall of the box body, and each right end plate is located in the corresponding accommodating through hole on the right side wall of the box body.

7. The integrated circuit aging test device according to claim 1, characterized in that: The rear side of each first aging test board and the second aging test board is provided with a guide rail, the front side of the back plate and the rear side wall of the box body corresponding to the guide rail are provided with guide grooves, and the guide grooves on the rear side wall of the box body are connected to the corresponding guide grooves on each back plate.

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