Space temperature gradient control device and analyzer temperature gradient test system

Abstract

The utility model relates to a space temperature gradient control device and an analyzer temperature gradient test system. An air inlet and an air outlet are respectively communicated with a test cavity; the air inlet is respectively communicated with a heat source for outputting constant-temperature hot gas and a cold source for outputting constant-temperature cold gas, so that the constant-temperature hot gas and the constant-temperature cold gas enter the test cavity through the air inlet; the space temperature gradient control device adjusts the volume of the constant-temperature hot gas and the volume of the constant-temperature cold gas entering the test cavity through the structure provided with the gas inlet, and is used for forming a temperature gradient in the space provided by the test cavity. By adjusting the input proportion of the constant-temperature hot gas and the constant-temperature cold gas, a space with a temperature gradient is formed in a certain area, the device can be applied to the space temperature gradient test of the analyzer, the actual use environment of the analyzer can be better and directly simulated, the temperature gradient test can be completed at a time, the test quantity is reduced, and the test efficiency is improved. Therefore, the test time of the analyzer is shortened, and the accuracy of the test result is further ensured.

Description

Technical Field

[0001] This application relates to the field of analytical testing, and particularly to a spatial temperature gradient control device and an analyzer temperature gradient test system. Background Art

[0002] Analyzers involved in the in vitro diagnostic product industry generally need to operate within a certain temperature range. For example, the operating temperature of a general biochemical analyzer is 20°C to 30°C. In a laboratory environment, the temperature can generally be well controlled within a relatively narrow range, such as 20°C ± 0.5°C. However, in the actual usage environment of the analyzer, such a narrow temperature range cannot be fully guaranteed, that is, the temperature range in the actual usage environment of the analyzer is relatively wide. However, when the temperature range is wide, there is a risk of instability in the test results of the analyzer. Therefore, in order to ensure the accuracy of the test results of the analyzer, a control device with a temperature gradient needs to be made to test the test results of the analyzer within different temperature ranges.

[0003] However, for general analyzers, considering their structures and implementation methods, they do not perform tests on different temperature gradients within the same space, but only perform performance tests at a single point temperature. Therefore, in order to simulate different ambient temperatures, the performance is often tested repeatedly in a cyclic manner according to a certain gradient of ambient temperature. For example, for a biochemical analyzer, the performance is tested in sequence at 20°C, 25°C, 30°C, or 20°C, 22°C, 24°C, 26°C, 28°C, 30°C, etc.; after the performance test at each point is qualified, it is considered that the analyzer is qualified in performance at temperatures from 20°C to 30°C.

[0004] However, performing the above tests takes a lot of time; after multiple rounds of temperature tests, the time consumed will be very long; moreover, performing the above tests cannot fully simulate the actual usage environment of the analyzer; for example, assuming that there is a temperature gradient in the actual usage environment of the analyzer, the single-point temperature test does not conform to the actual operating environment at all. Summary of the Utility Model

[0005] Based on this, it is necessary to provide a spatial temperature gradient control device and an analyzer temperature gradient test system.

[0006] In one embodiment, a spatial temperature gradient control device includes a main body;

[0007] The spatial temperature gradient control device is provided with a test chamber, an air inlet, and an air outlet on the main body, and the air inlet and the air outlet are respectively communicated with the test chamber;

[0008] The air inlet is used to be respectively communicated with a heat source that outputs a constant-temperature hot gas and a cold source that outputs a constant-temperature cold gas, so that the constant-temperature hot gas and the constant-temperature cold gas enter the test chamber through the air inlet;

[0009] The space temperature gradient control device forms a temperature gradient in the space provided by the test chamber by setting the structure of the air inlet and respectively adjusting the gas volumes of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber.

[0010] The above-mentioned space temperature gradient control device adjusts the input ratios of the constant-temperature hot gas and the constant-temperature cold gas through the design of the air inlet in cooperation with the heat source and the cold source, so as to form a space with a temperature gradient in a certain area. It can be applied to the space temperature gradient test of the analyzer, can better directly simulate the actual use environment of the analyzer, can complete the temperature gradient test at one time, reduce the test volume, thus reducing the test time of the analyzer, and further ensuring the accuracy of the test results.

[0011] In one embodiment, the space temperature gradient control device adjusts the gas volumes of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber respectively by setting the ratio of the ventilation surface of the air inlet.

[0012] In one embodiment, the space temperature gradient control device adjusts the gas volumes of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber respectively by setting the ratio of the heat source air inlet area to the cold source air inlet area of the air inlet.

[0013] In one embodiment, the air inlet includes a heat source air inlet and a cold source air inlet;

[0014] The heat source air inlet is used to communicate with the heat source, and the cold source air inlet is used to communicate with the cold source.

[0015] In one embodiment, the space temperature gradient control device adjusts the gas volumes of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber respectively by setting the ratio of the heat source air inlet to the cold source air inlet.

[0016] In one embodiment, the number of the heat source air inlet and the cold source air inlet is at least two; or,

[0017] The heat source air inlet and the cold source air inlet are arranged at intervals or symmetrically with respect to the test chamber.

[0018] In one embodiment, the number of the air inlets is at least two; or,

[0019] The number of the air outlets is at least two.

[0020] In one embodiment, an analyzer temperature gradient test system includes a heat source, a cold source, and the space temperature gradient control device described in any one of the embodiments;

[0021] The heat source and the cold source are respectively connected to the air inlet of the space temperature gradient control device;

[0022] The heat source is used to output a constant-temperature hot gas, which enters the test chamber of the space temperature gradient control device through the air inlet;

[0023] The cold source is used to output a constant-temperature cold gas, which enters the test chamber of the space temperature gradient control device through the air inlet.

[0024] In one embodiment, the analyzer temperature gradient test system further includes an air outlet device, which is connected to the air outlet of the space temperature gradient control device and is used to draw out the gas in the test chamber.

[0025] In one embodiment, the air outlet device is arranged in the test chamber or outside the space temperature gradient control device. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0027] Figure 1 It is a schematic structural diagram of an embodiment of the space temperature gradient control device described in the present application.

[0028] Figure 2 It is a schematic structural diagram of the first embodiment of the analyzer temperature gradient test system described in the present application.

[0029] Figure 3 It is a schematic structural diagram of the second embodiment of the analyzer temperature gradient test system described in the present application.

[0030] Figure 4 It is a schematic diagram of the proportional adjustment of the air inlet ventilation surface of the third embodiment of the analyzer temperature gradient test system described in the present application.

[0031] Figure 5 It is a schematic diagram of the proportional adjustment of the heat source air inlet area and the cold source air inlet area of the air inlet of the fourth embodiment of the analyzer temperature gradient test system described in the present application.

[0032] Figure 6It is a schematic structural diagram of the fourth embodiment of the analyzer temperature gradient test system described in this application.

[0033] Figure 7 It is a schematic structural diagram of the fifth embodiment of the analyzer temperature gradient test system described in this application.

[0034] Figure 8 It is a schematic diagram of the positional relationship among the heat source air inlet, the cold source air inlet, and the air outlet of the fifth embodiment of the analyzer temperature gradient test system described in this application.

[0035] Figure 9 It is a schematic structural diagram of the sixth embodiment of the analyzer temperature gradient test system described in this application.

[0036] Reference numerals: analyzer temperature gradient test system 100, heat source 200, heat source pipeline 210, cold source 300, cold source pipeline 310, space temperature gradient control device 400, main body 410, test chamber 420, air inlet 430, heat source air inlet area 421, cold source air inlet area 422, heat source air inlet 423, cold source air inlet 424, ventilation surface 425, air outlet 440, air flow direction 450, air inlet direction 460, air outlet direction 470, air outlet device 500. Detailed implementation manners

[0037] To make the above objects, features, and advantages of this application more obvious and understandable, the following will describe the detailed implementation manners of this application with reference to the accompanying drawings. Many specific details are set forth in the following description to fully understand this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of this application. Therefore, this application is not limited by the specific embodiments disclosed below.

[0038] It should be noted that when a component is referred to as being "fixed to" or "disposed on" another component, it can be directly on the other component or there may also be an intermediate component. When a component is considered to be "connected" to another component, it can be directly connected to the other component or there may be an intermediate component at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in the description of this application are only for the purpose of illustration and do not represent the only implementation manner.

[0039] In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of this application, "a plurality of" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0040] In this application, unless otherwise clearly defined and limited, the first feature being "on" or "under" the second feature may mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Moreover, the first feature being "above", "over" or "on top of" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply indicates that the first feature has a higher horizontal height than the second feature. The first feature being "under", "below" or "beneath" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply indicates that the first feature has a lower horizontal height than the second feature.

[0041] Unless otherwise defined, all technical and scientific terms used in the specification of this application have the same meaning as commonly understood by those skilled in the technical field to which this application belongs. The terms used in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application. The term "and / or" used in the specification of this application includes any and all combinations of one or more of the related listed items.

[0042] This application discloses a spatial temperature gradient control device and an analyzer temperature gradient test system, which include some or all of the technical features of the following embodiments; that is, the spatial temperature gradient control device and the analyzer temperature gradient test system include some or all of the following structures. In an embodiment of this application, a spatial temperature gradient control device includes a main body; the spatial temperature gradient control device is provided with a test chamber, an air inlet and an air outlet on the main body, and the air inlet and the air outlet are respectively communicated with the test chamber; the air inlet is used to be respectively communicated with a heat source that outputs a constant-temperature hot gas and a cold source that outputs a constant-temperature cold gas, so that the constant-temperature hot gas and the constant-temperature cold gas enter the test chamber through the air inlet; the spatial temperature gradient control device adjusts the gas volumes of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber respectively by setting the structure of the air inlet, so as to form a temperature gradient in the space provided by the test chamber. The above-mentioned spatial temperature gradient control device adjusts the input ratio of the constant-temperature hot gas and the constant-temperature cold gas through the design of the air inlet in cooperation with the heat source and the cold source, so as to form a space with a temperature gradient in a certain area, which can be applied to the spatial temperature gradient test of the analyzer, can better directly simulate the actual use environment of the analyzer, can complete the temperature gradient test at one time, reduce the test amount, so reduce the test time of the analyzer, and further ensure the accuracy of the test results. The following will be combined with Figures 1 to 9 , and the spatial temperature gradient control device and the analyzer temperature gradient test system will be described in detail.

[0043] Traditional analyzers perform performance tests in the laboratory. Exemplarily, traditional analyzers perform performance tests on a workbench or a certain test position. As mentioned above, this requires the traditional analyzer to repeatedly cycle tests according to a certain gradient of ambient temperature. In one embodiment, as Figure 1 shown, the present application provides a spatial temperature gradient control device 400, which includes a body 410; the spatial temperature gradient control device 400 is provided with a test chamber 420, an air inlet 430 and an air outlet 440 on the body 410, and the air inlet 430 and the air outlet 440 are respectively communicated with the test chamber 420; in this embodiment, external gas flows into the air inlet 430 along the intake direction 460, then enters the test chamber 420, flows into the air outlet 440 along the air flow direction 450, and then flows out of the air outlet 440 along the outlet direction 470, that is, flows out of the test chamber 420 through the air outlet 440. In practical applications, the body 410 can be a laboratory, that is, a test room, and the test chamber 420 is the indoor space. As an example, the air inlet 430 is an intake hole, that is, a small hole.

[0044] Combined with Figure 2 , the air inlet 430 is used to communicate with a heat source 200 that outputs a constant-temperature hot gas and a cold source 300 that outputs a constant-temperature cold gas respectively, so that the constant-temperature hot gas and the constant-temperature cold gas enter the test chamber 420 through the air inlet 430; the spatial temperature gradient control device 400 adjusts the gas volumes of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber 420 respectively by setting the structure of the air inlet 430, so as to form a temperature gradient in the space provided by the test chamber 420, that is, to form a space with a certain temperature gradient in the test chamber 420. Those skilled in the art can understand that by setting the structure of the air inlet 430, the amounts of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber 420 can be controlled. Taking the pressures of the constant-temperature hot gas and the constant-temperature cold gas being the same and constant as an example, only by setting the intake area of the air inlet 430 or the different intake area ratios of the air inlet 430 for the constant-temperature hot gas and the constant-temperature cold gas, a certain temperature gradient can be formed in the space provided by the test chamber 420, and such a temperature gradient can be set or adjusted according to actual needs, and the application is very flexible and convenient.

[0045] For the gas in the constant-temperature hot gas and the constant-temperature cold gas, the embodiments of the present application do not impose additional restrictions on this, and it can be nitrogen or an inert gas, etc.; if the analyzer has no special requirements for this, generally, the gas is air, the constant-temperature hot gas is constant-temperature hot air, and the constant-temperature cold gas is constant-temperature cold air, so as to save the application cost.

[0046] In one embodiment, the number of the air inlets 430 is at least two; or, the number of the air outlets 440 is at least two. Figure 2 In the illustrated embodiment, the number of the air inlets 430 is three, and the number of the air outlets 440 is also three; in other embodiments, the number of the air inlets 430 and the number of the air outlets 440 may be set to be the same or different. In one embodiment, the air outlets 440 may be integrally arranged. As Figure 3 shown, the air outlets 440 are integrally arranged, presenting only one air outlet 440 as a whole. Figure 2 And Figure 3 in the illustrated embodiment, the heat source 200 is connected to the air inlet 430 through a heat source pipeline 210, and the cold source 300 is connected to the air inlet 430 through a cold source pipeline 310. Exemplarily, in practical applications, the on-off or switch ratio of the heat source pipeline 210 or the cold source pipeline 310 may also be adjusted through a valve to respectively adjust the gas volume of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber 420, so as to form a space with a temperature gradient in a certain area to better directly simulate the actual use environment of the analyzer, enabling the analyzer to complete the temperature gradient test at one time, thereby reducing the test volume of the analyzer and thus reducing the test time of the analyzer.

[0047] Regardless of whether the air pressures of the constant-temperature hot gas and the constant-temperature cold gas are the same or whether the air pressures of the constant-temperature hot gas and the constant-temperature cold gas remain constant, in one embodiment, as Figure 4 shown, the space temperature gradient control device 400 is used to respectively adjust the gas volume of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber 420 by setting the ratio of the ventilation surface 425 of the air inlet 430. Figure 4 shows the state where the ratio of the ventilation surface 425 of the air inlet 430 changes from large to small. It should be noted that this is only an example and does not limit the setting or change of the ratio of the ventilation surface 425. The space temperature gradient control device 400 can overall control the gas volume of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber 420 by setting the ratio of the ventilation surface 425 of the air inlet 430. Exemplarily, some of the air inlets 430 are opened for the constant-temperature hot gas, that is, opened for the heat source 200, to supply the constant-temperature hot gas into the test chamber 420; some of the air inlets 430 are opened for the constant-temperature cold gas, that is, opened for the cold source 300, to supply the constant-temperature cold gas into the test chamber 420.

[0048] In contrast, it is easier to directly set the air inlet 430 to adjust the volume of the constant temperature hot gas and the constant temperature cold gas entering the test chamber 420. In one embodiment, as Figure 5 and Figure 6 As shown, the spatial temperature gradient control device 400 is used to adjust the gas volume of the constant temperature hot gas and the constant temperature cold gas entering the test chamber 420 by setting the ratio of the heat source air inlet area 421 and the cold source air inlet area 422 of the air inlet 430. Figure 4 In the illustrated embodiment, the air inlet 430 is only partially opened, illustratively, Figure 5 In the illustrated embodiment, the air inlet 430 is always kept fully open, and the air inlet 430 may be provided with a baffle to adjust the ratio of the heat source air inlet area 421 to the cold source air inlet area 422, or by providing separate air inlet pipes and valves for the heat source air inlet area 421 and the cold source air inlet area 422, the ratio of the heat source air inlet area 421 to the cold source air inlet area 422 may be adjusted. The rest of the embodiments are similar and will not be described in detail.

[0049] Figure 2 In the embodiment shown, the heat source 200 and the cold source 300 are respectively connected to the same air inlet 430. In order to form a space with a more obvious temperature gradient, the heat source 200 and the cold source 300 can also be respectively connected to different air inlets 430. In one embodiment, Figure 7 and Figure 8 As shown, the air inlet 430 includes a heat source air inlet 423 and a cold source air inlet 424; the heat source air inlet 423 is used to connect the heat source 200, and the cold source air inlet 424 is used to connect the cold source 300. Exemplarily, the heat source air inlet 423 and the cold source air inlet 424 are respectively located on both sides of the test chamber 420; the heat source air inlet 423 and the cold source air inlet 424 are arranged at intervals or symmetrically relative to the test chamber 420. In one embodiment, the spatial temperature gradient control device 400 is used to adjust the gas volume of the constant temperature hot gas and the constant temperature cold gas entering the test chamber 420 by setting the ratio of the heat source air inlet 423 and the cold source air inlet 424. Such a design is conducive to forming a space with a more obvious temperature gradient on the one hand, and is conducive to saving energy consumption of the heat source 200 and the cold source 300 on the other hand.

[0050] In one embodiment, the number of the heat source air inlet 423 and the cold source air inlet 424 are at least two; Figure 8As shown, the number of the heat source air inlets 423 and the cold source air inlets 424 is three, and each of the heat source air inlets 423 and each of the cold source air inlets 424 are symmetrically arranged with respect to the test chamber 420. Exemplarily, in one embodiment, each of the heat source air inlets 423 and each of the cold source air inlets 424 are axially symmetrically arranged with respect to the central axis of the test chamber 420.

[0051] In one embodiment, an analyzer temperature gradient test system 100 is as Figure 2 shown, which includes a heat source 200, a cold source 300 and the space temperature gradient control device 400 of any one of the embodiments; the heat source 200 and the cold source 300 are respectively connected to the air inlet 430 of the space temperature gradient control device 400; the heat source 200 is used to output a constant-temperature hot gas, which enters the test chamber 420 of the space temperature gradient control device 400 through the air inlet 430; the cold source 300 is used to output a constant-temperature cold gas, which enters the test chamber 420 of the space temperature gradient control device 400 through the air inlet 430. Those skilled in the art can understand that since the analyzer temperature gradient test system 100 adopts the space temperature gradient control device 400 of any one of the embodiments, the analyzer temperature gradient test system 100 also has the corresponding beneficial technical effects of the space temperature gradient control device 400, which will not be elaborated here.

[0052] In one embodiment, the analyzer temperature gradient test system 100 includes a heat source 200, a cold source 300, and a spatial temperature gradient control device 400. The spatial temperature gradient control device 400 includes a main body 410. The spatial temperature gradient control device 400 is provided with a test chamber 420, an air inlet 430, and an air outlet 440 on the main body 410. The air inlet 430 and the air outlet 440 are respectively communicated with the test chamber 420. The air inlet 430 is used to communicate with the heat source 200 that outputs a constant-temperature hot gas and the cold source 300 that outputs a constant-temperature cold gas respectively, so that the constant-temperature hot gas and the constant-temperature cold gas enter the test chamber 420 through the air inlet 430. The spatial temperature gradient control device 400 adjusts the gas volumes of the constant-temperature hot gas and the constant-temperature cold gas entering the test chamber 420 respectively by setting the structure of the air inlet 430, so as to form a temperature gradient in the space provided by the test chamber 420. Moreover, the heat source 200 and the cold source 300 are respectively communicated with the air inlet 430. The heat source 200 is used to output a constant-temperature hot gas, which enters the test chamber 420 through the air inlet 430. The cold source 300 is used to output a constant-temperature cold gas, which enters the test chamber 420 through the air inlet 430. With such a design, the input ratio of the constant-temperature hot gas and the constant-temperature cold gas is adjusted through the air inlet 430 in cooperation with the heat source 200 and the cold source 300, so as to form a space with a temperature gradient in a certain area. It can be applied to the spatial temperature gradient test of the analyzer, can better directly simulate the actual use environment of the analyzer, can complete the temperature gradient test at one time, reduce the test volume, thus reducing the test time of the analyzer, and further ensuring the accuracy of the test results.

[0053] Exemplarily, the heat source 200 and the cold source 300 are respectively communicated with the air inlet 430. The heat source 200 is used to output a constant-temperature hot gas, which enters the test chamber 420 through the air inlet 430. The cold source 300 is used to output a constant-temperature cold gas, which enters the test chamber 420 through the air inlet 430. The spatial temperature gradient control device 400 adjusts the gas volumes of the constant-temperature hot gas of the heat source 200 and the constant-temperature cold gas of the cold source 300 entering the test chamber 420 respectively through the air inlet 430, so as to provide a temperature gradient in the test chamber 420.

[0054] Exemplarily, the spatial temperature gradient control device 400 adjusts the gas volumes of the constant-temperature hot gas of the heat source 200 and the constant-temperature cold gas of the cold source 300 entering the test chamber 420 respectively by adjusting the ratio of the ventilation surface 425 of the air inlet 430.

[0055] Exemplarily, the spatial temperature gradient control device 400 adjusts the gas volumes of the constant-temperature hot gas of the heat source 200 and the constant-temperature cold gas of the cold source 300 entering the test chamber 420 by adjusting the ratio between the heat-source air inlet area 421 and the cold-source air inlet area 422 of the air inlet 430.

[0056] Exemplarily, the air inlet 430 includes a heat-source air inlet 423 and a cold-source air inlet 424; the heat source 200 is connected to the heat-source air inlet 423, and the cold source 300 is connected to the cold-source air inlet 424.

[0057] Exemplarily, the spatial temperature gradient control device 400 adjusts the gas volumes of the constant-temperature hot gas of the heat source 200 and the constant-temperature cold gas of the cold source 300 entering the test chamber 420 by adjusting the ratio between the heat-source air inlet 423 and the cold-source air inlet 424.

[0058] In one embodiment, as Figure 9 shown, the analyzer temperature gradient test system 100 further includes an air outlet device 500, which is connected to the air outlet 440 of the spatial temperature gradient control device 400 and is used to draw out the gas in the test chamber 420. In this embodiment, the air outlet device 500 is arranged in the test chamber 420; in other embodiments, the air outlet device 500 can also be arranged outside the spatial temperature gradient control device 400. Exemplarily, the air outlet device 500 is a fan.

[0059] Next, continue to exemplify the analyzer temperature gradient test system 100 and its spatial temperature gradient control device 400. The analyzer temperature gradient test system 100 and its spatial temperature gradient control device 400 provide a space for analyzer testing; in this space, by controlling the ratio of the cold source 300 and the heat source 200 entering the test space, i.e., the test chamber 420, an environment with a temperature gradient is created, directly simulating the actual use environment of the analyzer, thereby reducing the test time of the analyzer and further ensuring the accuracy of the test results.

[0060] As an example, the analyzer temperature gradient test system 100 includes a heat source 200, a cold source 300, a spatial temperature gradient control device 400, and an air outlet device 500; wherein, the function of the heat source 200 is to provide constant-temperature hot air, the function of the cold source 300 is to provide constant-temperature cold air, the test chamber 420 of the spatial temperature gradient control device 400 is the controlled object, the air inlet 430 is for air to enter the test chamber 420, and the air outlet device 500 is to draw out the room air, thereby controlling the air flow direction 450 of the entire test chamber 420, such as the test room.

[0061] Based onFigure 2 , Figure 3 or Figure 4 In the illustrated embodiment, by controlling or adjusting the opening size of the air inlet 430, or by controlling or adjusting the opening and closing of the air inlet 430, especially the opening and closing ratio of the air inlet 430, different ratios of the constant-temperature hot gas output by the heat source 200 and the constant-temperature cold gas output by the cold source 300 in the test chamber 420 are achieved, and thus different temperature controls at different positions in the test chamber 420 are realized.

[0062] Based on Figure 5 or Figure 6 In the illustrated embodiment, it is also possible not to adjust the opening and closing ratio of the air inlet 430, but to change the opening and closing ratio of the heat source pipeline 210 and the cold source pipeline 310 at the position of the air inlet 430 to enable different-temperature gases to enter the test chamber 420. Exemplarily, by controlling or adjusting the heat source pipeline 210 and the cold source pipeline 310, different ratios of the constant-temperature hot gas and the constant-temperature cold gas are adjusted, so as to form a temperature gradient in the space provided by the test chamber 420. Or, by controlling or adjusting the opening size of the pipelines, where the pipelines include the heat source pipeline 210 and the cold source pipeline 310, that is, by respectively controlling or adjusting the opening sizes of the heat source pipeline 210 and the cold source pipeline 310, different ratios of the constant-temperature hot gas and the constant-temperature cold gas are formed, so as to form a temperature gradient in the space provided by the test chamber 420.

[0063] Based on Figure 7 or Figure 8 In the illustrated embodiment, the heat source 200 and the cold source 300 are arranged separately, and different temperature gradients are achieved by controlling or adjusting the ratios of the heat source pipeline 210 and the cold source pipeline 310 at their respective small holes.

[0064] Such a structural design can better simulate the actual use environment of the instrument; the temperature gradient test of the analyzer can be completed in one test, which is beneficial to reducing the test volume.

[0065] It should be noted that other embodiments of the present application further include a space temperature gradient control device and an analyzer temperature gradient test system formed by combining the technical features in the above embodiments, which can be implemented.

[0066] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0067] The above-described embodiments merely represent several implementation manners of the present application. The description thereof is relatively specific and detailed, but it should not be construed as a limitation on the scope of the patented application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all fall within the protection scope of the present application. Therefore, the patent protection scope of the present application shall be subject to the appended claims.

Claims

1. A spatial temperature gradient control device (400), characterized in that: including the body (410); The spatial temperature gradient control device (400) is provided with a test cavity (420), an air inlet (430) and an air outlet (440) on the body (410); the air inlet (430) and the air outlet (440) are respectively connected to the test cavity (420); The air inlet (430) is used to respectively connect to a heat source (200) that outputs constant-temperature hot gas and a cold source (300) that outputs constant-temperature cold gas, so that the constant-temperature hot gas and the constant-temperature cold gas enter the test chamber (420) through the air inlet (430); The spatial temperature gradient control device (400) adjusts the gas volumes of the constant temperature hot gas and the constant temperature cold gas entering the test chamber (420) by setting the structure of the air inlet (430), so as to form a temperature gradient in the space provided by the test chamber (420).

2. The spatial temperature gradient control device (400) according to claim 1, characterized in that: The spatial temperature gradient control device (400) is used to respectively adjust the gas volumes of the constant temperature hot gas and the constant temperature cold gas entering the test chamber (420) by setting the ratio of the ventilation surface (425) of the air inlet (430).

3. The spatial temperature gradient control device (400) according to claim 1, characterized in that: The spatial temperature gradient control device (400) is used to respectively adjust the gas volumes of the constant temperature hot gas and the constant temperature cold gas entering the test chamber (420) by setting the ratio of the heat source air inlet area (421) and the cold source air inlet area (422) of the air inlet (430).

4. The spatial temperature gradient control device (400) according to claim 1, characterized in that: The air inlet (430) comprises a heat source air inlet (423) and a cold source air inlet (424); The heat source air inlet (423) is used to connect to the heat source (200), and the cold source air inlet (424) is used to connect to the cold source (300).

5. The spatial temperature gradient control device (400) according to claim 4, characterized in that: The spatial temperature gradient control device (400) is used to respectively adjust the gas volumes of the constant temperature hot gas and the constant temperature cold gas entering the test chamber (420) by setting the ratio of the heat source air inlet (423) to the cold source air inlet (424).

6. The spatial temperature gradient control device (400) according to claim 4, characterized in that: The number of the heat source air inlet (423) and the number of the cold source air inlet (424) are both at least two; or, The heat source air inlet (423) and the cold source air inlet (424) are arranged at intervals or symmetrically relative to the test cavity (420).

7. The spatial temperature gradient control device (400) according to any one of claims 1 to 6, characterized in that: The number of the air inlets (430) is at least two; or, The number of the air outlets (440) is at least two.

8. An analyzer temperature gradient testing system (100), characterized in that: It comprises a heat source (200), a cold source (300) and a spatial temperature gradient control device (400) as claimed in any one of claims 1 to 7; The heat source (200) and the cold source (300) are respectively connected to the air inlet (430) of the spatial temperature gradient control device (400); The heat source (200) is used to output constant-temperature hot gas, which enters the test chamber (420) of the spatial temperature gradient control device (400) through the air inlet (430); The cold source (300) is used to output constant-temperature cold gas, which enters the test cavity (420) of the spatial temperature gradient control device (400) through the air inlet (430).

9. The analyzer temperature gradient testing system (100) according to claim 8, characterized in that: The analyzer temperature gradient test system (100) further comprises a gas outlet device (500), wherein the gas outlet device (500) is connected to the gas outlet (440) of the spatial temperature gradient control device (400) and is used to draw out the gas in the test chamber (420).

10. The analyzer temperature gradient testing system (100) according to claim 9, characterized in that: The gas outlet device (500) is arranged in the test cavity (420), or is arranged outside the spatial temperature gradient control device (400).

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