Testing device for detecting performance of silicon carbide module

Abstract

The utility model provides a testing device for detecting the performance of a silicon carbide module, and the device comprises a tool connecting device which comprises a fixed outer wall, a limiting hole, an air cylinder group, a probe, and an electrode limiting hole. Two air cylinder groups are fixed on the fixed outer wall, a limiting hole is formed between the air cylinder groups, each air cylinder group comprises four air cylinders, the air cylinders are distributed on the two sides of the limiting hole of the electrode, and each air cylinder comprises a probe. Movement of the electrode is limited through the electrode limiting hole, then the electrode is crimped through the eight air cylinders, switching of the upper bridge arm and the lower bridge arm is achieved, a current signal and a voltage signal are more stable, and the whole testing device is more stable and longer in service life through the structure.

Description

Technical Field

[0001] The utility model relates to the technical field of detecting silicon carbide modules, and particularly relates to a test device for detecting the performance of silicon carbide modules. Background Technique

[0002] An insulated gate bipolar transistor (IGBT) module is a composite fully controlled voltage-driven power semiconductor device composed of a bipolar junction transistor (BJT) and an insulated gate field effect transistor (MOSFET), and has the advantages of the high input impedance of the MOSFET and the low on-state voltage drop of the power transistor (GTR). With the development of technology, the IGBT module cannot meet the needs of the public, so a silicon carbide module is designed. The silicon carbide module has a high energy conversion efficiency and will not decrease with the increase of frequency. The operating frequency of the silicon carbide device can reach 10 times that of the silicon-based device, and the total energy loss of the silicon carbide-based MOSFET with the same specifications is only 30% of that of the silicon-based IGBT. Silicon carbide materials will gradually replace silicon in the fields of high temperature, high frequency, and high frequency, and play an important role in the fields of 5G communication, aerospace, new energy vehicles, and smart grids.

[0003] During the research and development process, manufacturing process, and before application of the silicon carbide module, it is necessary to conduct reliability assessment on it. However, in the current technology, the testing machine cannot provide a large enough current for the silicon carbide module during testing, and has a short service life, is prone to failures, and has a large stray inductance. These problems will cause errors in the screening of silicon carbide devices. Therefore, a test device that can accurately detect the performance of silicon carbide modules is needed now. Summary of the Utility Model

[0004] The technical problem to be solved by the utility model is how to design a test device that can accurately detect the performance of silicon carbide modules.

[0005] The utility model solves the above technical problems through the following technical means:

[0006] The utility model provides a test device for detecting the performance of silicon carbide modules, including a fixture connection device, and the fixture connection device includes a fixed outer wall, a limiting hole, a cylinder group, a probe, and an electrode limiting hole; the fixed outer wall fixes 2 groups of cylinder groups, a limiting hole is arranged between the cylinder groups, there are 4 cylinders in the cylinder group, the cylinders are distributed on both sides of the electrode limiting hole, and each cylinder is provided with a probe.

[0007] Advantageous Effects: The movement of the electrode is restricted by the electrode limiting hole in this application, and then the switching of the upper and lower bridge arms is realized by pressing the electrode with 8 cylinders, making the current signal and voltage signal more stable. The structure of this application makes the entire test device more stable and has a longer service life.

[0008] Preferably, the cylinders are distributed relatively on the vertical sides of the electrode limiting holes, and the probes in the cylinders are distributed relatively staggeredly.

[0009] Preferably, it further includes a test fixture and a capacitor cell, and the test fixture and the capacitor cell are connected through a fixture connecting device.

[0010] Preferably, the test fixture includes a silicon carbide module, electrodes and pin headers. The silicon carbide module is fixedly connected to the electrodes. The electrodes are arranged on both sides of one side of the silicon carbide module, and pin headers are arranged in the middle.

[0011] Preferably, the capacitor cell includes a capacitor cell master electrode and a female header. The capacitor cell is fixedly connected to the capacitor cell master electrode. The capacitor cell master electrode is arranged on both sides of one side of the capacitor cell, and a female header is arranged therein.

[0012] Preferably, the test fixture and the capacitor cell are connected through the limiting holes and electrode limiting holes in the fixture connecting device.

[0013] Preferably, the electrodes and the capacitor cell master electrodes are arranged in one-to-one correspondence with the size, dimension and position of the electrode limiting holes, and the pin headers and the female headers are arranged in one-to-one correspondence with the size, dimension and position of the limiting holes.

[0014] Preferably, the lengths of the pin headers and the female headers are 2.54 mm.

[0015] Preferably, the fixture connecting device further includes a solenoid valve feedback board and a magnetic switch. The solenoid valve feedback board is fixed on both sides of the fixed outer wall, and the magnetic switch is fixed on both sides of the cylinder.

[0016] Preferably, the fixture connecting device further includes a fixing block for fixing adjacent cylinders.

[0017] The advantages of the present utility model are as follows:

[0018] 1. In this application, the existing relay structure is replaced by using cylinders. Since the relay has poor passing performance for large currents in use and has a relatively short service life and is prone to failure in use, the stability of the test device is increased and the service life of the test device is enhanced.

[0019] 2. In this application, by using the docking method of 2.54-mm pin headers and 2.54-mm female headers, it is more convenient to install the test fixture. The direct connection of the 2.54-mm pin headers and the 2.54-mm female headers can reduce the current loop, reduce the stray inductance of the test device, make the test effect of the whole device more accurate, and increase the test accuracy of the whole device.

[0020] 3. This application can achieve feedback on whether the cylinder has an action by using a magnetic switch. The magnetic switch can feedback the signal to the solenoid valve feedback board, and the solenoid valve feedback board will transmit the feedback signal to the test device. If the cylinder operates abnormally, the test device will interrupt its operation for protection, increasing the safety of the test device. Description of the Drawings

[0021] Figure 1 It is a schematic structural diagram of the fixture connection device in the embodiment;

[0022] Figure 2 It is a schematic structural diagram of the test fixture in the embodiment;

[0023] Figure 3 It is a schematic structural diagram of the capacitor cell in the embodiment;

[0024] Figure 4 It is a schematic structural diagram of the cylinder in the embodiment;

[0025] In the figure: 10 - fixture connection device; 11 - fixed outer wall; 12 - fixed block; 13 - limit hole; 14 - probe; 15 - electrode limit hole; 16 - solenoid valve feedback board; 17 - magnetic switch; 20 - test fixture; 21 - silicon carbide module; 22 - electrode; 23 - pin header; 30 - capacitor cell; 31 - capacitor cell master electrode; 32 - female header. Detailed Embodiment

[0026] To make the objectives, technical solutions, and advantages of the embodiments of the present utility model clearer, the technical solutions in the embodiments of the present utility model will be clearly and completely described below in conjunction with the embodiments of the present utility model. Obviously, the described embodiments are some, rather than all, of the embodiments of the present utility model. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present utility model.

[0027] In the description of the present utility model, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present utility model; in addition, the terms "installation", "connection", and "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.

[0028] Embodiment 1

[0029] Reference Figures 1-3 , the test device provided in this embodiment is a test device for detecting the performance of a silicon carbide module. The test device includes a fixture connection device 10, a test fixture 20, and a capacitor cell 30; the test fixture 20 and the capacitor cell 30 are connected through the fixture connection device 10.

[0030] As Figure 1 shown, the fixture connection device 10 includes a fixed outer wall 11, a fixed block 12, a limit hole 13, a cylinder group (not marked in the figure), a probe 14, and an electrode limit hole 15. The fixed outer wall 11 is fixedly connected to 2 groups of cylinder groups, and the connection method is welding or riveting. The cylinder groups are installed on both sides of the fixed outer wall 11, and a limit hole 13 is provided in the middle. The cylinder group contains 4 cylinders, and the 4 cylinders are respectively installed on the upper and lower sides of the electrode limit hole 15. Among them, 2 cylinders are installed above the electrode limit hole 15 and are fixed through the fixed block 12. The remaining 2 cylinders are installed below the electrode limit hole 15 and are also fixed through the fixed block 12. The cylinders on the upper and lower sides are arranged oppositely. Each cylinder contains a probe 14, and the probes 14 are staggered on both sides of the electrode limit hole 15.

[0031] As Figure 2 shown, the test fixture 20 includes a silicon carbide module 21, an electrode 22, and a pin header 23. The silicon carbide module 21 and the electrode 22 are integrally formed. The electrode 22 is provided on both sides of one side of the silicon carbide module 21, and a pin header 23 is fixedly connected in the middle. The connection method is welding or riveting. The length of the pin header 23 is 2.54 mm.

[0032] As Figure 3As shown, the capacitor bank 30 includes a capacitor bank master electrode 31 and a header 32. The capacitor bank master electrode 31 is fixed on both sides of one side of the capacitor bank 30 by welding. A header 32 is fixedly connected in the middle, and the connection method is welding or riveting. The length of the header 32 is 2.54 mm.

[0033] The electrode 22 and the capacitor bank master electrode 31 are arranged in one-to-one correspondence with the size, dimension, and position of the electrode limit hole 15. The pin header 23 and the header 32 are arranged in one-to-one correspondence with the size, dimension, and position of the limit hole 13.

[0034] The electrode 22 needs to be inserted into the electrode limit hole 15 for limiting. The pin header 23 needs to be inserted into the limit hole 13 for limiting. The capacitor bank master electrode 31 also needs to be inserted into the electrode limit hole 15 for limiting. The header 32 also needs to be inserted into the limit hole 13 for limiting. The electrode 22 and the capacitor bank master electrode 31 are not inserted on one side of the electrode limit hole 15, but on both sides, just connecting the electrode 22 and the capacitor bank master electrode 31. Similarly, the pin header 23 and the header 32 are connected, thus realizing the connection between the test fixture 20 and the capacitor bank 30.

[0035] The operation steps and working principle of this embodiment are as follows:

[0036] Insert the electrode 22 and the pin header 23 of the test fixture 20 into the electrode limit hole 15 and the limit hole 13 in the fixture connection device 10 on one side; insert the capacitor bank master electrode 31 and the header 32 of the capacitor bank 30 into the electrode limit hole 15 and the limit hole 13 in the fixture connection device 10 on the other side; at this time, the electrode 22 of the test fixture 20 and the capacitor bank master electrode 31 of the capacitor bank 30 are crimped by a cylinder, and the probe 14 on the cylinder presses on the electrode 22 and has a certain compression amount. At this time, the current passing through the inductor can flow through the test fixture 20 and be supplied to the silicon carbide module 21; the test fixture 20 and the capacitor bank 30 are plugged together by the 2.54 mm pin header 23 and the 2.54 mm header 32, and the test voltage is supplied to the silicon carbide module 21 through the 2.54 mm pin header 23 of the capacitor bank motherboard and the 2.54 mm header 32 of the test fixture 20, completing the performance test of the silicon carbide module 21.

[0037] This embodiment uses a cylinder to replace the existing relay structure, which can provide a large current sufficient for detecting the silicon carbide module 21 and improve the passing performance of the large current, thus improving the stability of detection.

[0038] In this embodiment, a female header and a male pin are used to dock the test fixture and the capacitor bank, making it more convenient to install the test fixture. Moreover, the direct connection using the female header and the male pin can reduce the current loop and the stray inductance during testing, making the test effect of the test device more accurate and increasing the test accuracy of the test device.

[0039] Embodiment 2

[0040] Reference Figures 1-4 , the test device provided in this embodiment is a test device for detecting the performance of a silicon carbide module. The difference between this embodiment and Embodiment 1 is that: the fixture connecting device 10 further includes a solenoid valve feedback board 16 and a magnetic switch 17. The solenoid valve feedback board 16 is fixed on both sides of the fixed outer wall 11. The solenoid valve feedback board 16 is fixed outside the two groups of cylinder sets, and the fixing method is welding or riveting. The magnetic switch 17 is fixed on both sides of the cylinder. As Figure 4 shown, each cylinder is provided with a magnetic switch 17, and the fixing method is welding or riveting.

[0041] In this embodiment, a magnetic switch 17 is installed on each of the left and right sides of each cylinder. The magnetic switch 17 on the left side of the cylinder feeds back the segmented signal, and the magnetic switch 17 on the right side of the cylinder feeds back the closed signal. The magnetic switches 17 on both sides of the cylinder transmit the signals to the solenoid valve feedback board 16, and the solenoid valve feedback board 16 transmits the signals to the DSP for judgment. If the feedback signal is normal, it proves that the cylinder stroke is in place. If the feedback signal is abnormal, it proves that the cylinder does not move or the stroke is not in place. At this time, the test device will interrupt the work, thereby realizing the monitoring of the cylinder movement.

[0042] In this embodiment, the magnetic switch 17 is used to feedback whether the cylinder has an action. The magnetic switch 17 can feedback the signal to the solenoid valve feedback board 16, and the solenoid valve feedback board 16 will transmit the feedback signal to the test device. If the cylinder action is abnormal, the test device will interrupt the work for protection, which can increase the safety of the test device.

[0043] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A testing device for detecting the performance of a silicon carbide module, characterized in that: The jig connection device (10) comprises a fixed outer wall (11), a limiting hole (13), a cylinder group, a probe (14) and an electrical limiting hole (15); the fixed outer wall (11) is fixedly connected to two cylinder groups, a limiting hole (13) is provided between the cylinder groups, the cylinder group contains four cylinders, the cylinders are distributed on both sides of the electrical limiting hole (15), and the cylinders all contain probes (14).

2. The testing device for detecting the performance of a silicon carbide module according to claim 1, characterized in that: The cylinders are relatively distributed on both sides of the electric limit hole (15) in the vertical direction, and the probes (14) in the cylinders are relatively staggered.

3. The testing device for detecting the performance of a silicon carbide module according to claim 2, characterized in that: It also comprises a test fixture (20) and a capacitor pool (30), wherein the test fixture (20) and the capacitor pool (30) are connected via a limiting hole (13) and a capacitor limiting hole (15) in the fixture connection device (10).

4. The testing device for detecting the performance of a silicon carbide module according to claim 3, characterized in that: The test fixture (20) comprises a silicon carbide module (21), an electrode (22) and a pin header (23); the silicon carbide module (21) and the electrode (22) are integrally formed; the electrode (22) is arranged on both sides of one side of the silicon carbide module (21), and the pin header (23) is fixedly connected in the middle.

5. The testing device for detecting the performance of a silicon carbide module according to claim 4, characterized in that: The capacitor pool (30) comprises a capacitor pool motherboard electrode (31) and a busbar (32); the capacitor pool (30) is fixedly connected to the capacitor pool motherboard electrode (31); the capacitor pool motherboard electrode (31) is fixed on two sides of one side of the capacitor pool (30), wherein the busbar (32) is fixedly connected.

6. The testing device for detecting the performance of a silicon carbide module according to claim 5, characterized in that: The size, size and position of the electrode (22) and the capacitor cell motherboard electrode (31) are arranged in one-to-one correspondence with the electrode limit hole (15).

7. The testing device for detecting the performance of a silicon carbide module according to claim 5, characterized in that: The pin row (23) and the socket row (32) are arranged in a one-to-one correspondence with the size, position and position of the limiting hole (13).

8. The testing device for detecting the performance of a silicon carbide module according to claim 7, characterized in that: The length of the pin header (23) and the female header (32) is 2.54 mm.

9. The testing device for detecting the performance of a silicon carbide module according to claim 1, characterized in that: The jig connection device (10) further comprises a solenoid valve feedback plate (16) and a magnetic switch (17), wherein the solenoid valve feedback plate (16) is fixed on both sides of the fixed outer wall (11), and the magnetic switch (17) is fixed on both sides of the cylinder.

10. The testing device for detecting the performance of a silicon carbide module according to claim 1, characterized in that: The jig connection device (10) also includes a fixing block (12) for fixing adjacent cylinders.

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