Photoelectric detection module and test system
The optical signal is converted into an electrical signal through the photodetection module, and time measurement is carried out in combination with a high-speed real-time oscilloscope, which solves the problem that the existing optical testing system cannot be tested and costly due to clock out of synchronization, and achieves higher accuracy and lower cost burst mode time measurement.
Patent Information
- Application Number
- CN202422233589.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-11
- Publication Date
- 2025-07-01
- Estimated Expiration
- 2034-09-11
AI Technical Summary
When performing burst mode time testing, existing optical testing systems cannot test or have high testing costs due to clock synchronization.
The photoelectric detection module is used to convert the optical signal into an electrical signal, and the corresponding time measurement is performed through the time test module to avoid the need for clock synchronization, and a high-speed real-time oscilloscope is used to replace the real-time oscilloscope, increasing the freedom of equipment selection and reducing costs.
It realizes more accurate burst mode time measurement, has higher waveform clarity and stronger measurability, saves debugging time and equipment upgrade costs, and reduces delays and costs.
Smart Images
Figure CN223053032U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of optical testing, in particular to an optoelectronic detection module and a testing system. Background Art
[0002] With the popularization of Ethernet technology in metropolitan area networks and the development of broadband access technology, the current broadband PON (Passive Optical Network) technology generally has reached a rate of more than 1 Gbit / s, and the next step will gradually upgrade to rates of 25 Gbit / s, 50 Gbit / s, and 100 Gbit / s.
[0003] In the optical testing of the TX end of an ONU (Optical Network Unit) chip, it is necessary to test the burst mode time, which is an important index of the system. In practical applications, a real-time oscilloscope is usually used to test the burst mode time. The specific testing system is as Figure 1 shown. The burst mode error code tester provides a test signal and a control signal to the ONU chip. The ONU chip controls whether to output the received test signal through the control signal. The TOSA (Optical Transmitter Module) converts the test signal output by the ONU chip into an optical signal and transmits it to the real-time oscilloscope through an optical fiber. The real-time oscilloscope tests the burst mode time according to the received optical signal.
[0004] Figure 1 Although the system shown can test the burst mode time, it has the following disadvantages: First, the burst mode error code tester and the real-time oscilloscope need to be clock-synchronized. If the clocks are not synchronized, the real-time oscilloscope may not capture the optical signal, resulting in the inability to perform time-related measurements. Second, most of the oscilloscopes on the market are optical sampling oscilloscopes, and there are few real-time oscilloscopes that meet the testing requirements. With the subsequent increase in the rate, the cost of purchasing and upgrading a higher-rate real-time oscilloscope will inevitably increase significantly. Therefore, how to complete the test of the burst mode time without using a real-time oscilloscope is a technical problem that those skilled in the art urgently want to solve.
[0005] It should be noted that the above introduction of the technical background is only for the convenience of clearly and completely explaining the technical solutions of the present application and facilitating the understanding of those skilled in the art. It cannot be considered that the above technical solutions are well-known to those skilled in the art just because these solutions are described in the background art part of the present application. Summary of the Utility Model
[0006] In view of the above-mentioned disadvantages of the prior art, the purpose of the present utility model is to provide an optoelectronic detection module and a testing system, which solve the problems of inability to test or high testing cost caused by clock asynchronization in the existing system for testing the burst mode time.
[0007] To achieve the above and other related objectives, the present utility model provides an optoelectronic detection module, which includes:
[0008] An optoelectronic part, configured to convert the received optical signal into a current signal for output;
[0009] An output part, connected to the optoelectronic part, configured to convert the current signal into a voltage signal for output.
[0010] Optionally, the optoelectronic part includes a photodiode or a photomultiplier tube.
[0011] Optionally, the optoelectronic part includes a photodiode.
[0012] Optionally, the output part includes a first resistor, a second resistor and a capacitor. Among them, the first end of the first resistor is connected to the first end of the optoelectronic part and the first end of the capacitor, the second ends of the first resistor and the capacitor are connected to the reference ground, the first end of the second resistor is connected to the second end of the optoelectronic part and outputs the voltage signal, and the second end of the second resistor is connected to the second end of the capacitor.
[0013] Optionally, the optoelectronic detection module further includes a bias part, configured to provide a bias voltage for the optoelectronic part.
[0014] Optionally, the bias part includes a voltage source. When the output part includes a first resistor, a second resistor and a capacitor, the voltage source is connected between the first resistor and the reference ground.
[0015] The present invention also provides a test system, which includes:
[0016] A test control module, configured to provide a test signal and a control signal;
[0017] An optical network unit module, connected to the test control module, and configured to control whether to output the received test signal through the control signal;
[0018] An optical transmission module, connected to the optical network unit module, and configured to convert the received test signal into an optical signal for output;
[0019] The optoelectronic detection module as described in any one of the above, connected to the optical transmission module through an optical fiber, and configured to convert the optical signal into a voltage signal for output;
[0020] A time test module, connected to the optoelectronic detection module, and configured to measure the burst mode time according to the voltage signal.
[0021] Optionally, the time test module includes a high-speed real-time oscilloscope.
[0022] Optionally, the test control module includes a burst mode error detector.
[0023] Optionally, the test signal is transmitted in a differential form among the test control module, the optical network unit module, and the optical transmission module.
[0024] As described above, an optoelectronic detection module and a test system of the present utility model have the following beneficial effects: After the test system converts an optical signal into an electrical signal through the optoelectronic detection module, the corresponding time measurement is performed through a time test module (for example, a high-speed real-time oscilloscope). The measurement is more accurate, the waveform clarity is higher, and the measurability is also higher. The time test module does not need to be clock-synchronized with the test control module, saving the debugging time cost and avoiding the problem of inability to test caused by clock asynchronization. After replacing the existing real-time oscilloscope with a high-speed real-time oscilloscope, the degree of freedom in equipment selection is increased, and the cost of subsequent equipment rate upgrade can be saved. The optoelectronic detection module realizes optoelectronic conversion without relying on a transimpedance amplifier, having the advantages of lower delay and lower cost. Description of the Drawings
[0025] Figure 1 Shows a schematic structural diagram of an existing test system.
[0026] Figure 2 Shows a schematic structural diagram of the optoelectronic detection module in an embodiment of the present utility model.
[0027] Figure 3 Shows a schematic structural diagram of the test system in an embodiment of the present utility model.
[0028] Figure 4 Shows based on Figure 1 A schematic diagram of the result of testing the burst enable time by the shown test system.
[0029] Figure 5 Shows based on Figure 3 A schematic diagram of the result of testing the burst enable time by the shown test system.
[0030] Description of Component Labels
[0031] 10 Test system
[0032] 100 Optoelectronic detection module
[0033] 101 Optoelectronic part
[0034] 102 Output part
[0035] 103 Bias part
[0036] 200 Test control module
[0037] 300 Optical network unit module
[0038] 400 Optical emission module
[0039] 500 Optical fiber
[0040] 600 Time test module Specific implementation manners
[0041] The following uses specific specific examples to illustrate the implementation manners of the present utility model. Those skilled in the art can easily understand other advantages and effects of the present utility model from the content disclosed in this specification. The present utility model can also be implemented or applied through other different specific implementation manners. Various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present utility model.
[0042] Please refer to Figures 1 to 5 . It should be noted that the structures, ratios, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for those familiar with this technology to understand and read, and are not used to limit the limiting conditions under which the present utility model can be implemented. Therefore, they do not have technical essential significance. Any modification of the structure, change of the proportional relationship, or adjustment of the size, without affecting the effects that the present utility model can produce and the purposes that can be achieved, should still fall within the scope that can be covered by the technical content disclosed in the present utility model. At the same time, the terms such as "upper", "lower", "left", "right", "middle", and "one" cited in this specification are only for the convenience of clear narration and are not used to limit the scope under which the present utility model can be implemented. The change or adjustment of their relative relationships, without substantial change in the technical content, should also be regarded as the scope under which the present utility model can be implemented.
[0043] Embodiment 1
[0044] As Figure 2 shown, this embodiment provides an optoelectronic detection module 100, including an optoelectronic part 101 and an output part 102; further, it also includes a bias part 103.
[0045] The optoelectronic part 101 is used to receive an optical signal and convert the optical signal into an electrical current signal for output. In one example, the optoelectronic part 101 includes a photodiode or a photomultiplier tube. Of course, other optoelectronic conversion devices that can convert an optical signal into an electrical current signal are also applicable to this embodiment, and no limitation is made thereto; in practical applications, usually a photodiode is selected to implement the function of the optoelectronic part 101 considering factors such as response speed, sensitivity, linearity, etc.
[0046] The output unit 102 is connected to the optoelectronic unit 101 and is used to convert the current signal into a voltage signal OUT for output. In one example, the output unit 102 includes a first resistor R1, a second resistor R2, and a capacitor C; wherein, the first end of the first resistor R1 is connected to the first end of the optoelectronic unit 101 (for example, the cathode end of the photodiode), the second end of the first resistor R1 is connected to the reference ground; the first end of the capacitor C is connected to the first end of the first resistor R1, and the second end of the capacitor C is connected to the reference ground; the first end of the second resistor R2 is connected to the second end of the optoelectronic unit (for example, the anode end of the photodiode) and outputs the voltage signal OUT, and the second end of the second resistor R2 is connected to the second end of the capacitor C.
[0047] The bias unit 103 is used to provide a bias voltage for the optoelectronic unit 101. In one example, the bias unit 103 includes a voltage source; wherein, the positive terminal of the voltage source is connected to the second end of the first resistor R1, and the negative terminal of the voltage source is connected to the reference ground, that is, the voltage source is connected between the first resistor R1 and the reference ground.
[0048] The optoelectronic detection module 100 of this embodiment is a brand-new optoelectronic conversion solution that does not use a transimpedance amplifier. Through the design of the optoelectronic unit 101, the output unit 102, and the bias unit 103, it can not only convert optical signals into electrical signals, but also improve signal delay and reduce circuit costs, having the advantages of lower delay and lower cost.
[0049] Embodiment Two
[0050] As Figure 3 shown, this embodiment provides a test system 10, which includes a test control module 200, an optical network unit module 300, an optical emission module 400, an optoelectronic detection module 100, an optical fiber 500, and a time test module 600.
[0051] The test control module 200 is used to provide a test signal and a control signal; wherein, the test signal is usually a digital sequence signal, and the control signal is usually a square wave signal. In one example, the test control module 200 includes a burst mode error detector.
[0052] The optical network unit module 200 is connected to the test control module 100, that is, the control end of the optical network unit module 200 receives the control signal, the input end of the optical network unit module 200 receives the test signal, and the optical network unit module 200 controls the output or non-output of the test signal through the control signal; for example, when the control signal is at a high level, the optical network unit module 200 outputs the received test signal, and when the control signal is at a low level, the optical network unit module 200 stops outputting the test signal.
[0053] The optical emission module 300 is connected to the optical network unit module 200 and is used to convert the received test signal into an optical signal for output. In one example, the optical emission module 300 includes an optical transmitter module (TOSA).
[0054] The photoelectric detection module 100 is connected to the optical emission module 400 through the optical fiber 500 and is used to convert the optical signal into a voltage signal for output; wherein, the photoelectric detection module 100 is implemented by the structure described in Embodiment 1, and the relevant content can be found in Embodiment 1 in detail and will not be elaborated here.
[0055] The time test module 600 is connected to the photoelectric detection module 100 and is used to measure the burst mode time according to the voltage signal; wherein, the burst mode time includes at least one of the burst enable time, the burst disable time, the burst start time, and the burst stop time. In one example, the time test module 600 includes a high-speed real-time oscilloscope, also known as a high-speed real-time electrical oscilloscope; the high-speed real-time oscilloscope generates a signal waveform based on the received voltage signal and measures the burst mode time based on the signal waveform, wherein the high-speed real-time oscilloscope does not need to be clock-synchronized with the test control module 200; in addition, measuring the burst mode time based on the signal waveform is a well-known technique in the art and will not be elaborated here. It should be noted that the burst enable time refers to the time when the optical power gradually rises to stability (for example, reaches 90% of the optical power) after the burst mode is enabled, the burst disable time refers to the time when the optical power gradually drops to zero after the burst mode is disabled, the burst start time refers to the time when the signal is started in the burst mode, and the burst stop time refers to the time when the signal is stopped in the burst mode.
[0056] In the test system 10 of this embodiment, except that the optical emission module 400 and the photoelectric detection module 100 are connected through the optical fiber 500, the rest of the modules, for example, between the test control module 200 and the optical network unit module 300, between the optical network unit module 300 and the optical emission module 400, and between the photoelectric detection module 100 and the time test module 600, are all electrically connected. Specifically, the test control module 200 and the optical network unit module 300 and between the optical network unit module 300 and the optical emission module 400 are electrically connected through wires, and the photoelectric detection module 100 and the time test module 600 are electrically connected through probes. In addition, the test signal is transmitted in a differential form between the test control module 200, the optical network unit module 300, and the optical emission module 400, that is, the test signal is a differential signal.
[0057] Next, respectively, with Figure 1 and Figure 3 The test systems shown are used to test the burst enable time. Among them, Figure 1 The test result of the test system shown is as Figure 4 shown, Figure 3 The test result of the test system shown is asFigure 5 As shown; it can be seen from the figure that the test system of this embodiment can not only measure the burst enable time more precisely, but also has higher waveform clarity and higher measurability compared with the existing test system. When the test system 10 of this embodiment replaces the real-time oscilloscope of the existing test system through the cooperation of the photoelectric detection module 100 and the time test module 600 (for example, a high-speed real-time oscilloscope) to measure the burst mode time, the time test module 600 and the test control module 200 no longer need clock synchronization, avoiding the possibility of not being able to see the correct waveform due to clock asynchronization. Without using a real-time oscilloscope, it can not only increase the freedom of equipment selection, but also save the cost of subsequent equipment rate upgrade.
[0058] In summary, an optoelectronic detection module and a test system of the present utility model have the following beneficial effects: After the test system first converts the optical signal into an electrical signal through the optoelectronic detection module, the corresponding time measurement is then performed through the time test module (for example, a high-speed real-time oscilloscope), with more precise measurement, higher waveform clarity, and higher measurability; the time test module does not need to be clock-synchronized with the test control module, saving the debugging time cost and avoiding the problem of inability to test due to clock asynchronization; after replacing the existing real-time oscilloscope with a high-speed real-time oscilloscope, the freedom of equipment selection is increased, and the cost of subsequent equipment rate upgrade can be saved; the optoelectronic detection module realizes optoelectronic conversion without the aid of a transimpedance amplifier, having the advantages of lower delay and lower cost.
[0059] The above embodiments only illustrate the principles and effects of the present utility model by way of example, and are not intended to limit the present utility model. Any person familiar with this technology can modify or change the above embodiments without departing from the spirit and scope of the present utility model. Therefore, all equivalent modifications or changes made by those with ordinary knowledge in the technical field without departing from the spirit and technical idea disclosed by the present utility model should still be covered by the claims of the present utility model.
Claims
1. A photoelectric detection module, characterized in that: The photoelectric detection module comprises: The photoelectric part is used to convert the received optical signal into an electric current signal for output; The output part is connected to the photoelectric part and is used to convert the current signal into a voltage signal for output.
2. The photoelectric detection module according to claim 1, characterized in that: The photoelectric part includes a photodiode or a photomultiplier tube.
3. The photoelectric detection module according to claim 2, characterized in that: The photoelectric portion includes a photodiode.
4. The photoelectric detection module according to claim 1, characterized in that: The output unit includes a first resistor, a second resistor and a capacitor, wherein the first end of the first resistor is connected to the first end of the photoelectric unit and to the first end of the capacitor, the second ends of the first resistor and the capacitor are connected to a reference ground, the first end of the second resistor is connected to the second end of the photoelectric unit and outputs the voltage signal, and the second end of the second resistor is connected to the second end of the capacitor.
5. The photoelectric detection module according to any one of claims 1 to 4, characterized in that: The photoelectric detection module further includes a biasing unit for providing a bias voltage for the photoelectric unit.
6. The photoelectric detection module according to claim 5, characterized in that: The bias unit includes a voltage source, wherein when the output unit includes a first resistor, a second resistor and a capacitor, the voltage source is connected between the first resistor and a reference ground.
7. A testing system, characterized in that: The test system comprises: A test control module, used for providing test signals and control signals; An optical network unit module, connected to the test control module, controls whether to output the received test signal through the control signal; An optical transmission module, connected to the optical network unit module, and used to convert the received test signal into an optical signal output; The photoelectric detection module according to any one of claims 1 to 6, connected to the light transmitting module via an optical fiber, and used to convert the optical signal into a voltage signal output; A time testing module is connected to the photoelectric detection module and is used to measure the burst mode time according to the voltage signal.
8. The test system according to claim 7, characterized in that: The time test module includes a high-speed real-time oscilloscope.
9. The test system according to claim 7, characterized in that: The test control module includes a burst mode bit error tester.
10. The test system according to claim 7, characterized in that: The test signal is transmitted in a differential form between the test control module, the optical network unit module and the optical transmission module.