Photovoltaic silicon wafer test equipment convenient to operate

Abstract

The utility model discloses a photovoltaic silicon wafer testing device convenient to operate, which relates to the technical field of photovoltaic silicon wafer testing and comprises a working table, a photovoltaic silicon wafer placing mold is arranged in the middle of the top surface of the working table, and a plurality of photovoltaic silicon wafers are arranged on the photovoltaic silicon wafer placing mold. The top surface of the workbench is provided with two thickness testing mechanisms matched with the photovoltaic silicon wafer placing mold; the utility model discloses photovoltaic silicon wafer testing equipment convenient to operate, which is provided with a measuring clamping groove capable of clamping and placing a photovoltaic silicon wafer, two measuring long strips can be swung, and if the measuring long strip on the right side can swing to be right above the photovoltaic silicon wafer and the measuring long strip on the left side cannot swing to be right above the photovoltaic silicon wafer, the photovoltaic silicon wafer can be tested. The thickness detection device for the photovoltaic silicon wafer is simple and convenient to operate, suitable for being quickly mastered by workers, large in thickness detection area and good in detection effect, and the thickness detection device for the photovoltaic silicon wafer is simple and convenient to operate and suitable for being quickly mastered by the workers.

Description

Technical Field

[0001] The utility model relates to the technical field of photovoltaic silicon wafer testing, and specifically relates to a photovoltaic silicon wafer testing device with convenient operation. Background Technique

[0002] Photovoltaic silicon wafers are the core components of solar photovoltaic cells, which are thin wafers made of high-purity silicon materials. Common types include single-crystalline silicon wafers and polycrystalline silicon wafers, etc. Photovoltaic silicon wafers can generate electron-hole pairs by absorbing solar energy and form an internal electric field, thereby converting light energy into electrical energy. Therefore, the quality and performance of silicon wafers play a key role in the conversion efficiency and stability of photovoltaic cells.

[0003] After the production of photovoltaic silicon wafers, a series of tests are required, such as appearance inspection, size measurement, resistivity test, impurity content test, etc. Among them, the size measurement of photovoltaic silicon wafers is currently mainly carried out with a vernier caliper. When measuring the thickness of a photovoltaic silicon wafer with a vernier caliper, in order to ensure the accuracy of the measurement, the staff needs to measure the thickness of multiple parts of the photovoltaic silicon wafer, and also needs to analyze whether it is within the thickness error range, and needs to be used in a standardized manner. The operation will not only cause measurement errors, but also be still relatively inconvenient to use. Content of the Utility Model

[0004] The utility model provides a photovoltaic silicon wafer testing device with convenient operation, which has the advantages of convenient use and rapid detection, so as to solve the problems put forward in the background technique.

[0005] To solve the defect of inconvenient use of the existing photovoltaic silicon wafer testing device with convenient operation, the utility model provides the following technical solution: a photovoltaic silicon wafer testing device with convenient operation, including a workbench, a photovoltaic silicon wafer placement mold is arranged in the middle of the top surface of the workbench, and two thickness testing mechanisms matching the photovoltaic silicon wafer placement mold are arranged on the top surface of the workbench;

[0006] The thickness testing mechanism includes a lifting seat, a measuring strip is rotatably connected to the top surface of the lifting seat, a screw rod is rotatably connected to the bottom end of the lifting seat, a knob is arranged on the top surface of the lifting seat and is screwed and fixed to the top of the screw rod, and four guide columns are integrally connected to the bottom end of the lifting seat.

[0007] As a preferred technical solution of the utility model, the bottom of the screw rod is threadedly connected to the workbench, four pairs of guide holes are opened on the top surface of the workbench, and the guide columns are slidably connected up and down with the guide holes.

[0008] As a preferred technical solution of the utility model, a hexagonal groove is opened on the top surface of the knob, and the thickness of the knob is greater than the thickness of the measuring strip.

[0009] As a preferred technical solution of the present utility model, four mounting holes are provided on the top surface of the workbench, and the depth of the mounting hole is one-third of the thickness of the workbench.

[0010] As a preferred technical solution of the present utility model, two measuring columns are fixedly connected to the top surface of the workbench by glue, and measuring arrows matching the measuring columns are welded to the mutually remote sides of the two lifting seats.

[0011] As a preferred technical solution of the present utility model, the photovoltaic silicon wafer placement mold includes a mounting plate, a mold body is integrally connected to the top surface of the mounting plate, a measuring card slot is provided on the top surface of the mold body, a first through slot is provided on one side of the measuring card slot, and a second through slot is provided at the rear of the measuring card slot.

[0012] As a preferred technical solution of the present utility model, the depth of the measuring card slot is 240 μm, and the depth of the second through slot is 40 μm.

[0013] Compared with the prior art, the present utility model provides a photovoltaic silicon wafer testing device with convenient operation, and has the following beneficial effects:

[0014] 1. For the photovoltaic silicon wafer testing device with convenient operation, a measuring card slot for clamping and placing the photovoltaic silicon wafer is provided. Swing the two measuring strips. If the right measuring strip can swing directly above the photovoltaic silicon wafer while the left measuring strip cannot swing directly above the photovoltaic silicon wafer, it means that the thickness of the photovoltaic silicon wafer is qualified. Any other situation means that the thickness of the photovoltaic silicon wafer is unqualified. The operation is simple and convenient, suitable for quick mastery by the staff. At the same time, the detection area of the thickness is relatively large, and the detection effect is good.

[0015] 2. For the photovoltaic silicon wafer testing device with convenient operation, the size of the measuring card slot is set to the maximum qualified length and maximum qualified width of the photovoltaic silicon wafer, which is convenient for placing the photovoltaic silicon wafer. If the photovoltaic silicon wafer cannot be placed, it means that the length or width is greater than the error range, and the photovoltaic silicon wafer is unqualified. There is no need to perform subsequent thickness detection, which can reduce the subsequent detection quantity and play a good auxiliary role. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 is a schematic structural view of the present utility model;

[0017] Figure 2 is a top view of the present utility model;

[0018] Figure 3 is a schematic structural view of the thickness testing mechanism of the present utility model;

[0019] Figure 4This is a schematic structural view of the photovoltaic silicon wafer placement mold of the present utility model.

[0020] In the figure:

[0021] 10, workbench; 20, photovoltaic silicon wafer placement mold; 21, mounting plate; 22, mold body; 23, measurement slot; 24, first through slot; 25, second through slot; 30, thickness testing mechanism; 31, lifting seat; 32, measurement strip; 33, screw; 34, knob; 35, guide post; 40, mounting hole; 50, measurement column; 60, measurement arrow. Specific embodiments

[0022] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.

[0023] Please refer to Figures 1-4 , the present utility model discloses a photovoltaic silicon wafer testing device with convenient operation, including a workbench 10. In the middle of the top surface of the workbench 10, there is a photovoltaic silicon wafer placement mold 20, and on the top surface of the workbench 10, there are two thickness testing mechanisms 30 that match the photovoltaic silicon wafer placement mold 20;

[0024] The thickness testing mechanism 30 includes a lifting seat 31. A measurement strip 32 is rotatably connected to the top surface of the lifting seat 31. A screw 33 is rotatably connected to the bottom end of the lifting seat 31. A knob 34 is screw-fixed to the top of the screw 33 on the top surface of the lifting seat 31. Four guide posts 35 are integrally connected to the bottom end of the lifting seat 31.

[0025] Specifically, the bottom of the screw 33 is threadedly connected to the workbench 10. Four pairs of guide holes are opened on the top surface of the workbench 10. The guide posts 35 are slidably connected to the guide holes up and down. A hexagonal groove is opened on the top surface of the knob 34. The thickness of the knob 34 is greater than the thickness of the measurement strip 32.

[0026] In this implementation scheme, the connection method of the screw 33 and the guide post 35 is introduced in detail. By setting the hexagonal groove, it can play an auxiliary role, facilitating the staff to drive the screw 33 to rotate by borrowing an internal hexagonal wrench.

[0027] Specifically, four mounting holes 40 are opened on the top surface of the workbench 10, and the depth of the mounting holes 40 is one-third of the thickness of the workbench 10.

[0028] In this embodiment, it plays a role in bolt - fixing and installing the workbench 10, and its thickness is set relatively shallow, so there is no need to use bolts with a long length, which can save costs.

[0029] Specifically, two measuring columns 50 are fixedly connected to the top surface of the workbench 10 by glue, and measuring arrows 60 that match the measuring columns 50 are welded to the mutually - remote sides of the two lifting seats 31.

[0030] In this embodiment, it is convenient for the staff to master the horizontal height of the measuring strip 32.

[0031] Specifically, the photovoltaic silicon - wafer placement mold 20 includes a mounting plate 21. A mold body 22 is integrally connected to the top surface of the mounting plate 21. A measuring card slot 23 is opened on the top surface of the mold body 22. A first through - slot 24 is opened on one side of the measuring card slot 23, and a second through - slot 25 is opened at the rear of the measuring card slot 23. The depth of the measuring card slot 23 is 240 μm, and the depth of the second through - slot 25 is 40 μm.

[0032] In this embodiment, the qualified thickness of the photovoltaic silicon wafer is 220 ± 20 μm, and it can be used in cooperation with the thickness - testing mechanism 30. If the measuring strip 32 on the right can swing to directly above the photovoltaic silicon wafer, while the measuring strip 32 on the left cannot swing to directly above the photovoltaic silicon wafer, it means that the thickness of the photovoltaic silicon wafer is qualified. Any other situation means that the thickness of the photovoltaic silicon wafer is unqualified.

[0033] The working principle and usage process of the present utility model: The photovoltaic silicon wafer is adsorbed by a suction cup, and then the photovoltaic silicon wafer is placed on the measuring card slot 23. If it cannot be completely placed, it means that the length or width of the photovoltaic silicon wafer is not within the error range, and at this time, it is already unqualified and there is no need for subsequent thickness measurement. If it can be placed, subsequent thickness measurement can be carried out. At this time, the two measuring strips 32 can be swung. If the measuring strip 32 on the right can swing to directly above the photovoltaic silicon wafer and the measuring strip 32 on the left cannot swing to directly above the photovoltaic silicon wafer, it means that the thickness of the photovoltaic silicon wafer is qualified (within the error range). If it is any other situation, it means that the thickness of the photovoltaic silicon wafer is unqualified. After the thickness is qualified, subsequent length and width detection can be carried out.

[0034] It should be noted that in this article, terms such as "including", "comprising" or any other variant thereof are intended to cover non - exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements but also includes other elements not explicitly listed, or further includes elements inherent to such a process, method, article or device. Without further limitations, an element defined by the statement "including one..." does not exclude the existence of another identical element in the process, method, article or device including the said element.

[0035] Although embodiments of the present utility model have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present utility model. The scope of the present utility model is defined by the appended claims and their equivalents.

Claims

1. A photovoltaic silicon wafer testing device with convenient operation, characterized in that: It includes a workbench (10), in the middle of the top surface of the workbench (10), there is a photovoltaic silicon wafer placement mold (20), and on the top surface of the workbench (10), there are two thickness testing mechanisms (30) that match the photovoltaic silicon wafer placement mold (20). The thickness testing mechanism (30) includes a lifting seat (31), a measuring strip (32) rotatably connected to the top surface of the lifting seat (31), a screw rod (33) rotatably connected to the bottom end of the lifting seat (31), a knob (34) screwed and fixed to the top of the screw rod (33) on the top surface of the lifting seat (31), and four guide posts (35) integrally connected to the bottom end of the lifting seat (31).

2. The operationally convenient photovoltaic silicon wafer testing device according to claim 1, wherein: The bottom of the screw rod (33) is threadedly connected to the workbench (10), four pairs of guide holes are opened on the top surface of the workbench (10), and the guide posts (35) are slidably connected to the guide holes up and down.

3. The operationally convenient photovoltaic silicon wafer testing device according to claim 1, wherein: A hexagonal groove is opened on the top surface of the knob (34), and the thickness of the knob (34) is greater than the thickness of the measuring strip (32).

4. The operationally convenient photovoltaic silicon wafer testing device according to claim 1, characterized in that: Four mounting holes (40) are opened on the top surface of the workbench (10), and the depth of the mounting holes (40) is one-third of the thickness of the workbench (10).

5. The operationally convenient photovoltaic silicon wafer testing device according to claim 1, wherein: Two measuring columns (50) are fixedly connected to the top surface of the workbench (10) by glue, and on one side of each of the two lifting seats (31) away from each other, there is a measuring arrow (60) welded to match the measuring column (50).

6. The operationally convenient photovoltaic silicon wafer testing device according to claim 1, wherein: The photovoltaic silicon wafer placement mold (20) includes a mounting plate (21), a mold body (22) integrally connected to the top surface of the mounting plate (21), a measuring card slot (23) opened on the top surface of the mold body (22), a first through groove (24) opened on one side of the measuring card slot (23), and a second through groove (25) opened at the rear of the measuring card slot (23).

7. The operationally convenient photovoltaic silicon wafer testing device according to claim 6, characterized in that: The depth of the measuring card slot (23) is 240 μm, and the depth of the second through groove (25) is 40 μm.

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