Visually adjusted chip test station base
By introducing Z-axis, Y-axis and X-axis adjustment components into the chip test station base, the problem of inaccurate chip testing in the existing technology is solved, and fine-tuning and visual adjustment of the XYZ-axis direction of the PCB test board is realized, which improves the accuracy and stability of the test.
Patent Information
- Application Number
- CN202421830338.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-31
- Publication Date
- 2025-07-18
- Estimated Expiration
- 2034-07-31
AI Technical Summary
Existing chip testing devices cannot achieve accurate fine-tuning during chip testing, resulting in insufficient precision in the test.
A visually adjusted chip test station base is designed, including Z-axis, Y-axis and X-axis adjustment components, through which the upper and lower, front and rear, and left and right of the test bench is fine-tuned, and is equipped with PCB test board fixing components to ensure stable fixation of the chip test board.
The XYZ axis direction fine-tuning of the PCB test board is realized, ensuring the accuracy and visual adjustment of chip testing, and improving the accuracy and stability of the test.
Smart Images
Figure CN223123068U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of chip testing, in particular to a base of a chip testing station with visual adjustment. Background Technique
[0002] A chip testing device presses a chip into a groove of a socket on a PCB test board through a testing machine, so that the contacts on the chip are connected to the pins of the socket, and the pins on the socket are connected to the contacts of the PCB test board. At this time, a circuit is formed, and then a certain voltage is input on the PCB test board to check the output situation. Different voltages will generate different circuits and thus different outputs. If the output conforms to the required parameters, it is a qualified product.
[0003] However, the existing socket and the PCB test board are fixed by screws and are relatively static. The PCB test board and the test base are fixed by screws and are relatively static. The testing machine can only place the chip at a specific position. Therefore, the existing device cannot achieve the function of precise fine-tuning during chip testing. In view of the above defects, it is necessary to design a base of a chip testing station with visual adjustment. Summary of the Utility Model
[0004] The purpose of the utility model is to provide a base of a chip testing station with visual adjustment to solve the problems raised in the above background technique.
[0005] To achieve the above purpose, the utility model provides the following technical solution: A base of a chip testing station with visual adjustment, including a bottom plate. One end of the bottom plate is provided with a Z-axis adjustment component. A Y-axis adjustment component is installed on the Z-axis adjustment component. An X-axis adjustment component is installed on the Y-axis adjustment component. A connection block is installed on the X-axis adjustment component. A test bench support is installed on the connection block. A test bench is installed on the test bench support. An observation port is opened on the test bench. A PCB test board carrier is installed on the test bench. A PCB test board fixing component is installed on the PCB test board carrier. A bracket is installed at the other end of the bottom plate.
[0006] Preferably, the Z-axis adjustment component includes a fixed seat and an adjustment block slidably arranged on the fixed seat. The fixed seat includes an integrally arranged first support plate and a base. The first support plate is vertically installed on the base. A first fixing block is installed in the middle of the first support plate. Two spaced first kidney-shaped holes are opened at the upper end of the first support plate. An upward extending first limiting groove is opened at the bottom of the adjustment block. Two limiting pins are arranged in the first limiting groove. The upper end of the first support plate extends into the first limiting groove.
[0007] Preferably, a limiting hole is further formed in the bottom of the adjusting block. A nut is installed on the outer periphery of the limiting hole on the adjusting block. A screw rod is screwed on the nut. The head of the screw rod abuts against the base. The rod part of the screw rod extends into the limiting hole. A baffle is installed on one side of the adjusting block close to the first limiting groove. A first differential head mounting seat is installed on the other side of the adjusting block close to the first limiting groove. A first differential head is installed on the first differential head mounting seat. The measuring rod of the first differential head is connected to the first fixing block through a flat thrust ball bearing.
[0008] Preferably, the X-axis adjustment assembly includes a second dovetail slide rail and a third differential head. A second dovetail slider is slidably arranged on the second dovetail slide rail. The second dovetail slide rail is installed on the first dovetail slider. A second fixing block is installed at one end of the second dovetail slide rail. The third differential head is installed on a third differential head mounting seat. The third differential head mounting seat is installed on a connecting block. The connecting block is installed on the second dovetail slider.
[0009] Preferably, the measuring rod of the third differential head is connected to the second fixing block through a flat thrust ball bearing. A limiting plate is installed on one side of the second dovetail slide rail. A waist-shaped hole is formed in the limiting plate. A second limiting rod is inserted into the waist-shaped hole. The second limiting rod is fixedly connected to the second dovetail slider.
[0010] Preferably, a PCB test board placement groove is formed in the middle of the PCB test board carrier. A first electrode piece and a second electrode piece are arranged at the bottom of the PCB test board placement groove. Slide grooves are formed on both sides of the PCB test board carrier. Accommodating cavities are formed on both sides of the PCB test board carrier. The accommodating cavities are communicated with the slide grooves through strip-shaped holes.
[0011] Preferably, the PCB test board fixing assembly includes a clamping plate. Second limiting grooves are formed on both sides of the clamping plate. A slider is installed at the bottom of the clamping plate. A lead screw nut is installed on the slider. The lead screw nut is sleeved on a lead screw. The lead screw is movably installed in the accommodating cavity. One end of the lead screw is fixedly connected to a hand wheel.
[0012] Preferably, the bracket includes a second support plate and a support plate. Two spaced third waist-shaped holes are formed at the upper end of the second support plate. Bolts are arranged on the third waist-shaped holes. The bolts pass through the third waist-shaped holes and are screwed to the support plate. The second support plate is connected to the support plate.
[0013] Compared with the prior art, the technical solution provided by the present utility model has at least the following technical effects or advantages:
[0014] The present utility model is provided with a Z-axis adjustment assembly, a Y-axis adjustment assembly and an X-axis adjustment assembly. The left and right fine adjustment of the test bench can be realized through the X-axis adjustment assembly. The front and back fine adjustment of the test bench can be realized through the Y-axis adjustment assembly. The up and down fine adjustment of the test bench is realized through the Z-axis adjustment assembly. Thus, the XYZ-axis direction fine adjustment of the PCB test board can be realized.
[0015] The utility model is provided with a PCB test board fixing component. By rotating two handwheels, the handwheels drive the screw rods to rotate, the screw rods drive the screw nuts to move, and the sliders and the clamping plates also move accordingly, so that the two clamping plates clamp and fix the PCB test board, thereby realizing the fixation of the PCB test board.
[0016] By observing the values of the differential heads on the X-axis adjustment component, Y-axis adjustment component and Z-axis adjustment component through the observation port, the utility model can accurately fine-tune the PCB test board in the XYZ-axis directions, realizing the visual adjustment of the PCB test board. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] The drawings are used to provide a further understanding of the utility model and constitute a part of the specification. Together with the embodiments of the utility model, they are used to explain the utility model and do not constitute a limitation to the utility model. In the drawings:
[0018] Figure 1 is a schematic structural diagram of the utility model;
[0019] Figure 2 is a perspective view of the utility model;
[0020] Figure 3 is a schematic structural diagram of the PCB test board carrier in the utility model;
[0021] Figure 4 is a schematic structural diagram of the clamping plate in the utility model.
[0022] In the drawings:
[0023] Base plate; 2. Z-axis adjustment component; 201. Adjusting block; 202. First support plate; 203. Base; 204. First fixing block; 205. First waist-shaped hole; 206. First limiting groove; 207. Nut; 208. Screw rod; 209. Baffle; 210. First differential head mounting seat; 211. First differential head; 3. Y-axis adjustment component; 301. First dovetail slide rail; 302. First dovetail slider; 303. Second differential head mounting seat; 304. Second differential head; 305. Limiting plate; 306. Second waist-shaped hole; 307. Second limiting rod; 4. X-axis adjustment component; 401. Second dovetail slide rail; 402. Second dovetail slider; 403. Second fixing block; 404. Third differential head mounting seat; 405. Third differential head; 406. Limiting plate; 407. Second limiting rod; 5. Connecting block; 6. Test bench support; 7. Test bench; 8. PCB test board carrier; 801. PCB test board placement groove; 802. Chute; 803. Accommodation cavity; 804. Strip-shaped hole; 9. Observation port; 10. PCB test board fixing component; 1001. Clamping plate; 1002. Limiting groove; 1003. Slide block; 1004. Screw nut; 1005. Screw rod; 1006. Handwheel; 11. Bracket; 1101. Second support plate; 1102. Third waist-shaped hole; 1103. Support plate. Detailed implementation mode
[0024] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0025] Please refer to Figures 1-4 As shown in the figure, the present invention provides a technical solution: a base of a chip test station with visual adjustment, including a base plate 1, a Z-axis adjustment component 2 is installed at one end of the base plate 1, a Y-axis adjustment component 3 is installed on the Z-axis adjustment component 2, an X-axis adjustment component 4 is installed on the Y-axis adjustment component 3, a connecting block 5 is installed on the X-axis adjustment component 4, a test bench support 6 is installed on the connecting block 5, a test bench 7 is installed on the test bench support 6, an observation port 9 is opened on the test bench 7, a PCB test board carrier 8 is installed on the test bench 7, a PCB test board fixing component 10 is installed on the PCB test board carrier 8, and a bracket 11 is installed at the other end of the base plate 1. By observing the values of the differential heads on the X-axis adjustment component 4, Y-axis adjustment component 3, and Z-axis adjustment component 2 through the observation port 9, the PCB test board can be accurately fine-tuned in the XYZ-axis directions, realizing the visual adjustment of the PCB test board.
[0026] The Z-axis adjustment assembly 2 in this embodiment includes a fixed seat and an adjustment block 201 slidably disposed on the fixed seat. The fixed seat includes an integrally provided first support plate 202 and a base 203. The first support plate 202 is vertically installed on the base 203. A first fixing block 204 is installed in the middle of the first support plate 202. Two spaced first kidney-shaped holes 205 are provided at the upper end of the first support plate 202. An upwardly extending first limiting groove 206 is provided at the bottom of the adjustment block 201. Two limiting pins are provided in the first limiting groove 206. The upper end of the first support plate 202 extends into the first limiting groove 206. A limiting hole is also provided at the bottom of the adjustment block 201. A nut 207 is installed on the adjustment block 201 around the limiting hole. A screw 208 is screwed onto the nut 207. The head of the screw 208 abuts against the base 203. The rod portion of the screw 208 extends into the limiting hole. A baffle 209 is installed on one side of the adjustment block 201 close to the first limiting groove 206. The baffle 209 is used to block the first support plate 202. A first differential head mounting seat 210 is installed on the other side of the adjustment block 201 close to the first limiting groove 206. A first differential head 211 is installed on the first differential head mounting seat 210. The measuring rod of the first differential head 211 is connected to the first fixing block 204 through a flat thrust ball bearing. When the adjustment block 201 moves, it drives the limiting pins to move in the first kidney-shaped holes 205. The travel of the limiting pins can be restricted through the first kidney-shaped holes 205, so that the maximum travel of the adjustment block 201 can be restricted.
[0027] The Y-axis adjustment assembly 3 in this embodiment includes a first dovetail slide rail 301 and a second differential head 304. A first dovetail slider 302 is slidably disposed on the first dovetail slide rail 301. The first dovetail slide rail 301 is installed on the adjustment block 201. A second differential head mounting seat 303 is installed at one end of the first dovetail slide rail 301. A second differential head 304 is installed on the second differential head mounting seat 303. The measuring rod of the second differential head 304 is connected to the first dovetail slider 302 through a flat thrust ball bearing. A limiting plate 305 is installed on one side of the first dovetail slide rail 301. A second kidney-shaped hole 306 is provided in the limiting plate 305. A second limiting rod 307 is inserted through the second kidney-shaped hole 306. The second limiting rod 307 is fixedly connected to the first dovetail slider 302. When the first dovetail slider 302 moves, it drives the second limiting rod 307 to move in the second kidney-shaped hole 306. The travel of the second limiting rod 307 can be restricted through the second kidney-shaped hole 306, so that the maximum travel of the first dovetail slider 302 can be restricted.
[0028] The X-axis adjustment assembly 4 in this embodiment includes a second dovetail slide rail 401 and a third differential head 405. A second dovetail slider 402 is slidably arranged on the second dovetail slide rail 401. The second dovetail slide rail 401 is installed on the first dovetail slider 302. A second fixing block 403 is installed at one end of the second dovetail slide rail 401. The third differential head 405 is installed on a third differential head mounting seat 404. The third differential head mounting seat 404 is installed on the connecting block 5. The connecting block 5 is installed on the second dovetail slider 402. The measuring rod of the third differential head 405 is connected to the second fixing block 403 through a flat thrust ball bearing. A limiting plate 406 is installed on one side of the second dovetail slide rail 401. A waist-shaped hole is formed in the limiting plate 406, and a second limiting rod 407 is inserted through the waist-shaped hole. The second limiting rod 407 is fixedly connected to the second dovetail slider 402.
[0029] A PCB test board placement groove 801 is formed in the middle of the PCB test board carrier 8 in this embodiment. A first electrode piece and a second electrode piece are arranged at the bottom of the PCB test board placement groove 801. The first electrode piece and the second electrode piece cooperate with the PCB test board and are electrically connected. The PCB test board carrier 8 is used to fix the PCB test board and supply power to the PCB test board. Chute grooves 802 are formed on both sides of the PCB test board carrier 8. Accommodating cavities 803 are formed on both sides of the PCB test board carrier 8. The accommodating cavities 803 are communicated with the chute grooves 802 through strip-shaped holes 804.
[0030] Two PCB test board fixing assemblies 10 are provided in this embodiment. The two PCB test board fixing assemblies 10 are located on both sides of the PCB test board placement groove 801. The PCB test board fixing assembly 10 includes a clamping plate 1001. The clamping plate 1001 is of an L-shaped structure. Second limiting grooves 1002 are formed on both sides of the clamping plate 1001. A slider 1003 is installed at the bottom of the clamping plate 1001. A lead screw nut 1004 is installed on the slider 1003. The lead screw nut 1004 is sleeved on a lead screw 1005. The lead screw 1005 is movably installed in the accommodating cavity 803. One end of the lead screw 1005 is fixedly connected to a handwheel 1006.
[0031] The bracket 11 in this embodiment includes a second support plate 1101 and a support plate 1103. The second support plate 1101 is vertically installed on the bottom plate 1. Two spaced third waist-shaped holes 1102 are formed at the upper end of the second support plate 1101. Bolts are arranged on the third waist-shaped holes 1102. The bolts pass through the third waist-shaped holes 1102 and are screwed to the support plate 1103. The second support plate 1101 is connected to the support plate 1103. The support plate 1103 is of an L-shaped structure. By loosening the bolts and moving the support plate 1103 up and down, the height of the support plate 1103 is adjusted so that the support plate 1103 abuts against one end of the test bench 7 and supports one end of the test bench 7 to prevent the test bench 7 from tilting.
[0032] Working principle of the utility model:
[0033] During use, place the PCB test board in the PCB test board placement groove 801, and make the positive terminal and negative terminal of the PCB test board contact the first electrode plate and the second electrode plate of the PCB test board placement groove 801 respectively. Rotate the two handwheels 1006. The handwheels 1006 drive the lead screw 1005 to rotate. The lead screw 1005 drives the lead screw nut 1004 to move. The slider 1003 and the clamping plate 1001 also move accordingly, so that the two clamping plates 1001 clamp and fix the PCB test board, thus realizing the fixation of the PCB test board.
[0034] When fine-tuning up and down, rotate the first differential head 211 clockwise. The first differential head 211 will rotate and extend relative to the first fixed block 204. Since the first fixed block 204 is fixed on the first support plate 202 and the first fixed block 204 is in a static state, the extension of the first differential head 211 will force the adjustment block 210 to move upward, driving the adjustment block 201 to move upward, and the Y-axis adjustment assembly 3, the X-axis adjustment assembly 4, the test bench 7 and the PCB test board carrier 8 will move upward with the adjustment block 201. On the contrary, rotate the first differential head 211 counterclockwise to realize the downward movement of the adjustment block 201, thereby realizing the up and down fine-tuning of the test bench 7. After the up and down fine-tuning is completed, rotate the screw 208 so that the head of the screw 208 abuts against the base 203, and the screw 208 supports the adjustment block 201 to ensure the stability of the device;
[0035] When fine-tuning back and forth, rotate the second differential head 304 clockwise. The second differential head 304 will rotate and extend relative to the second differential head mounting seat 303. Since the second differential head mounting seat 303 is fixed on the first dovetail slide rail 301 and the first dovetail slide rail 301 is in a static state, the extension of the second differential head 304 will force the first dovetail slider 302 to move backward, driving the first dovetail slider 302 to move backward along the first dovetail slide rail 301, and the X-axis adjustment assembly 4, the test bench 7 and the PCB test board carrier 8 will move backward with the first dovetail slider 302. On the contrary, rotate the second differential head 304 counterclockwise to realize the forward movement of the first dovetail slider 302, thereby realizing the back and forth fine-tuning of the test bench 7;
[0036] When making fine adjustments left and right, rotate the third differential head 405 clockwise. The third differential head 405 will rotate and extend relative to the second fixed block 403. Since the second fixed block 403 is fixed on the second dovetail slide rail 401 and is in a relatively stationary state, the extension of the third differential head 405 will force the second dovetail slider 402 to move leftward, thereby driving the connecting block 5 to move leftward, and the test bench 7 and the PCB test board carrier 8 will move leftward along with the second dovetail slider 402. On the contrary, rotate the third differential head 405 counterclockwise to enable the second dovetail slider 402 to move rightward, thus achieving fine left and right adjustments of the test bench 7.
[0037] Although the embodiments of the present invention have been shown and described, for those of ordinary skill in the art, it can be understood that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principle and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.
Claims
1. A chip test station base with visual adjustment, characterized in that: It includes a bottom plate (1). One end of the bottom plate (1) is equipped with a Z-axis adjustment component (2). A Y-axis adjustment component (3) is installed on the Z-axis adjustment component (2). An X-axis adjustment component (4) is installed on the Y-axis adjustment component (3). A connecting block (5) is installed on the X-axis adjustment component (4). A test bench support (6) is installed on the connecting block (5). A test bench (7) is installed on the test bench support (6). An observation port (9) is provided on the test bench (7). A PCB test board carrier (8) is installed on the test bench (7). A PCB test board fixing component (10) is installed on the PCB test board carrier (8). A bracket (11) is installed at the other end of the bottom plate (1).
2. The base of a chip test station with visual adjustment according to claim 1, characterized in that: The Z-axis adjustment component (2) includes a fixed seat and an adjustment block (201) slidably arranged on the fixed seat. The fixed seat includes an integrally arranged first support plate (202) and a base (203). The first support plate (202) is vertically installed on the base (203). A first fixing block (204) is installed in the middle of the first support plate (202). Two spaced first waist-shaped holes (205) are provided at the upper end of the first support plate (202). An upwardly extending first limiting groove (206) is provided at the bottom of the adjustment block (201). Two limiting pins are arranged in the first limiting groove (206). The upper end of the first support plate (202) extends into the first limiting groove (206).
3. The base of a chip test station with visual adjustment according to claim 2, characterized in that: A limiting hole is also provided at the bottom of the adjustment block (201). A nut (207) is installed on the adjustment block (201) around the limiting hole. A screw (208) is screwed on the nut (207). The head of the screw (208) abuts against the base (203). The rod part of the screw (208) extends into the limiting hole. A baffle (209) is installed on one side of the adjustment block (201) close to the first limiting groove (206). A first differential head mounting seat (210) is installed on the other side of the adjustment block (201) close to the first limiting groove (206). A first differential head (211) is installed on the first differential head mounting seat (210). The measuring rod of the first differential head (211) is connected to the first fixing block (204) through a flat thrust ball bearing.
4. A base of a chip test station with visual adjustment according to claim 1, characterized in that: The X-axis adjustment component (4) includes a second dovetail slide rail (401) and a third differential head (405). A second dovetail slider (402) is slidably arranged on the second dovetail slide rail (401). The second dovetail slide rail (401) is installed on the first dovetail slider (302). A second fixing block (403) is installed at one end of the second dovetail slide rail (401). The third differential head (405) is installed on the third differential head mounting seat (404). The third differential head mounting seat (404) is installed on the connecting block (5). The connecting block (5) is installed on the second dovetail slider (402).
5. A base of a chip test station with visual adjustment according to claim 4, characterized in that: The measuring rod of the third differential head (405) is connected to the second fixed block (403) through a flat thrust ball bearing. A limit plate (406) is installed on one side of the second dovetail slide rail (401). A waist-shaped hole is formed in the limit plate (406), and a second limit rod (407) is inserted through the waist-shaped hole. The second limit rod (407) is fixedly connected to the second dovetail slider (402).
6. The base of a chip test station with visual adjustment according to claim 1, characterized in that: A PCB test board placement groove (801) is formed in the middle of the PCB test board carrier (8). A first electrode plate and a second electrode plate are arranged at the bottom of the PCB test board placement groove (801). Slide grooves (802) are formed on both sides of the PCB test board carrier (8). Accommodation cavities (803) are formed on both sides of the PCB test board carrier (8). The accommodation cavities (803) communicate with the slide grooves (802) through strip-shaped holes (804).
7. A base of a chip test station with visual adjustment according to claim 1, characterized in that: The PCB test board fixing assembly (10) includes a clamping plate (1001). Second limit grooves (1002) are formed on both sides of the clamping plate (1001). A slider (1003) is installed at the bottom of the clamping plate (1001). A lead screw nut (1004) is installed on the slider (1003). The lead screw nut (1004) is sleeved on a lead screw (1005). The lead screw (1005) is movably installed in the accommodation cavity (803). One end of the lead screw (1005) is fixedly connected to a handwheel (1006).
8. A base of a chip test station with visual adjustment according to claim 1, characterized in that: The bracket (11) includes a second support plate (1101) and a support plate (1103). Two spaced third waist-shaped holes (1102) are formed at the upper end of the second support plate (1101). Bolts are arranged on the third waist-shaped holes (1102). The bolts pass through the third waist-shaped holes (1102) and are screwed to the support plate (1103). The second support plate (1101) is connected to the support plate (1103).